AS91L1001S10F100CG - Alliance Semiconductor

AS91L1006BU

July 2004

6-Port JTAG Gateway

Description

The AS91L1006BU is a one to 6-port

JTAG gateway. It partitions a single JTAG chain

into six separate chains. These separate chains

can be optionally configured to operate as a single

chain.

The AS91L1006BU device is used to

provide enhanced capabilities to the standard

IEEE1149.1. It enables the IEEE1149.1 interface

to be used in a true Multi-Drop environment without

any additional signals. This Multi-Drop capability

enables the standard IEEE1149.1 interface to be

used not just for stand alone PCB (Printed Circuit

Board) testing, but also for complete system

testing including all PCBs within a system back

plane environment.

The AS91L1006BU provides the capability

of partitioning the PCB, into multiple smaller

IEEE1149.1 scan chains totally under software

control. Partitioning the IEEE1149.1 chains on the

PCB has several benefits which include easier

fault diagnostics capabilities as a fault on one of

the IEEE1149.1 Local Scan Ports (LSPs) does

not render the PCB untestable, faster flash

programming on the PCBs, and removal of

IEEE1149.1 signal loading issues.

All of the protocols required for

addressing the AS91L1006BU device via the

Multi-Drop capability and the protocols for

configuring which of the six IEEE1149.1 LSPs on

the AS91L1006BU are to be used, is handled via

3rd party ATPG tools from vendors like Asset-

Intertech and JTAG Technologies. In a Multi-Drop

environment it is also possible to perform

interconnect tests between multiple PCBs within a

system thus extending the interconnect tests to

the back plane itself.

Key Features

 Device Multi-Drop addressable via the IEEE

1149.1 protocol

 Support for 6 local scan chains addressable via

the IEEE 1149.1 interface

 Support for Pass-Through™

 Support for the IEEE 1149.1 USERCODE

instruction

 Support for Status instruction enabling non-

intrusive monitoring of the system card

 Local Scan Port (LSP) enable signal provides the

ability to use non IEEE 1149.1 compliant devices

that require JTAG enable signal

 Provides the ability to initiate Self-Test on a

remote PCB via a standard IEEE 1149.1

command

 Support for JTAG Technologies AutoWR™

feature

 Pinout and feature set compatible (complete

second source) with the Firecron JTS06BU

device

 Available in a 100-pin LQFP or a 100-pin

FPBGA lead free package

Device Block Diagram

Device

Selection

Logic

Local Scan Port

Park/Un-park

Sync Logic

1149.1 TA P Controller

and

Boundary Register S election Logic Pa ss Through

Logic & Local

Scan Port

Connection/

Config

logic

LSP1

LSP2

LSP3

LSP4

LSP5

LSP6

Sta tu s D a ta

Usercode

Data

Device

address

Pass Through Enable

Prim ary 1149.1

J T AG In te rfac e

Figure 1 - AS91L1006BU Device Block Diagram

Alliance Semiconductor

2575 Augustine Drive • Santa Clara, CA 95054 • T: 408-855-4900 • F: 408-855-4999 • www.alsc.com

July 2004 AS91L1006BU

AS91L1006BU Gateway Functional Description

The basic structure of the AS91L1006BU

device is shown in Figure-1. The core of the device

is the 16-state IEEE1149.1 TAP controller state

machine. All accesses to the internal registers of

the AS91L1006BU device are controlled via this

state machine during normal operation as per the

IEEE1149.1 standard. The address selection logic

enables the AS91L1006BU to operate in a Multi-

Drop environment within system backplane.

The address selection logic compares the

scanned address to the slot address value

presented on the I/O of the AS91L1006BU device.

The LSP park/unpark logic provides control

through instructions scanned in under the

IEEE1149.1 protocol, to select, which LSP will be

placed into the active, scan chain. The pass-

through and LSP connection logic selects the

signal paths for the LSP IEEE1149.1 signals. The

device also supports a Pass-Through mode which

enables the primary IEEE1149.1 signals to be

routed to any of the LSPs. This signal routing is

selectable via I/O pins on the AS91L1006BU

device.

Figure-2 shows the device selection state

machine. The AS91L1006BU will perform an

address compare on the slot address presented

at its I/O and the value scanned in via the

IEEE1149.1. If the value matches then the

AS91L1006BU becomes selected and is ready for

normal access via IEEE1149.1 commands. If the

address does not match then the device will

proceed to the unselected mode, where it will

remain until the AS91L1006BU is issued a

GOTOWAIT instruction or a reset occurs via

TRST or the LSP_RESET pin.

Selected Single

Device Device

Unselected

Select Group

of Devices Select All

Devices

Wait for

Selection

Parked-TLR

Parked-RTI

Parked-

PauseIR

UnParked

Parked-

PauseDR

Figure 2 - AS91L1006BU

Selection Logic State machine Figure 3 - The LSP

Park/Unpark State Machi ne

The LSP Park/Unpark State Machine controls the insertion of the LSPs into the current active scan

chain. The ability to park the LSP in certain IEEE1149.1 states, enable the AS91L1006BU to perform

several functions including backplane interconnect testing and IC BIST.

www.alsc.com Alliance Semiconductor 2

July 2004 AS91L1006BU

AS91L1006BU Detailed Mode of Operation

Addressing the AS91L1006BU device

After a Test-Logic-Reset or power-up, the

AS91L1006BU device will be in its Wait-for-

Selection state with its TDO pin tri-stated, thus

avoiding contention in a Multi-Drop environment.

The AS91L1006BU device will respond to a

device-select sequence for a particular address

that is auto generated by third party test tools with

respect to the address that is pre-loaded on its

S(5..0). Once this sequence has been completed,

the AS91L1006BU device will respond to normal

IEEE 1149.1 instructions. Note that addresses 60-

63 have been reserved and the AS91L1006BU

device will not respond if the user selects these

addresses.

The AS91L1006BU device should be in

the Wait-for-Selection mode, which can be

entered into by issuing an asynchronous reset

(through the deassertion of TRST) or by issuing a

synchronous reset (through the assertion of TMS

for five cycles of TCK). After the device has been

selected, it can be issued a GOTOWAIT

instruction.

The internal IEEE1149.1 state machine of

the AS91L1006BU device is taken to the Shift-IR

phase and the required Device-ID is shifted into

the Instruction register. As the IEEE1149.1 state

machine passes through the Update-IR phase,

the address is matched to the value on the S(5-0)

pins on the AS91L1006BU device; if the values

match, then the AS91L1006BU device is sele cted

and is ready to receive any normal IEEE1149.1

command.

S(5-0) value IR (7 – 0) value

< 3A hex or 60

decimal XXVVVVVV

Table 1 - AS91L1006BU Device Selection Table

www.alsc.com Alliance Semiconductor 3

July 2004 AS91L1006BU

Table 2 - AS91L1006BU Multi Cast Group

Selection Table Table 3 - AS91L1006BU Device

Selection

Mode Binary

Address Function

Single

Address

Mode

XX000000 to

XX111010 Single AS91L1006BU

selected the TDO of

the device will be

active

Broad

Cast Mode XX111011 All accessible

AS91L1006BU

devices are selected

for operation. TDO on

all devices will be in

HighZ

Multi-Cast

Group 0 XX111100 Access all

AS91L1006BU

devices that have

been placed in GRP0

by their MCGR

contents

Multi-Cast

Group 1 XX111101 Access all

AS91L1006BU

devices that have

been placed in GRP1

by their MCGR

contents

Multi-Cast

Group 2 XX111110 Access all

AS91L1006BU

devices that have

been placed in GRP2

by their MCGR

contents

Multi-Cast

Group 3 XX111111 Access all

AS91L1006BU

devices that have

been placed in GRP3

by their MCGR

contents

Name Description

Instruction

addressing and instruction-

decode

IEEE Std. 1149.1 required

Boundary-

Scan

IEEE Std. 1149.1 required

Bypass

Device

Identification

IEEE Std. 1149.1 optional

User Code

Status

intrusive 8-bit register pre load

able from the I/O pins

Self Test

single bit register for initiating

self testing on a PCB

Mode

configuration and control bits

Auto Write

Write feature enable register

LSP Async

Reset

AS91L1006BU device Async

reset register for the LSPs

www.alsc.com Alliance Semiconductor 4

July 2004 AS91L1006BU

Table 4 - AS91L1006BU Device Instruction Register OpCodes

 Note: All instructions act on a single selected AS 91L1006BU device only.

* This instruction causes the AS91L1006BU to become unselected and revert to the Wait-for-

Selection state.

Instructions Hex Op-

Code Binary Op-

Code Data Register

BYPASS FF 11111111 Bypass Register

EXTEST 00 00000000 Boundary-Scan Register

SAMPLE/PRELOAD 81 10000001 Boundary-Scan Register

IDCODE AA 10101010 Device Identification Register

UNPARK E7 11100111 Device Identification Register

PARKTLR C5 11000101 Device Identification Register

PARKRTI 84 10000100 Device Identification Register

PARKPAUSE C6 11000110 Device Identification Register

GOTOWAIT* C3 11000011 Device Identification Register

MODESELECT 8E 10001110 Mode Register

MCGRSELECT 03 00000011 Multi-Cast Group Register.

SOFTRESET 88 10001000 Device Identification Register

USERCODE 97 10010111 User Programmable 32 Bit Identification Register

AUTOWR 98 10011000 Auto Write Feature Enable Register

STEST_PCB 99 10011001 Single bit low pulse, used to initiate function on PCB

(SELF_TEST pin)

STATUS_BYTE 9A 10011010 User programmable status byte (USER_S TATUS_DATA

pins)

LSP_ASYNC_RESET 9B 10011011 Toggles LSP TRST while maintaining the AS91L1006BU

in the selected state.

Other Undefined TBD TBD Device Identification Register

www.alsc.com Alliance Semiconductor 5

July 2004 AS91L1006BU

AS91L1006BU device Register descriptions

Bypass Register

It is a mandatory single bit register that can

be connected between PRIM_TDI and PRIM_TDO

of the AS91L1006BU device.

Multi-Cast Group Register

This 2-bit data register enables the host

system to place the AS91L1006BU into one of

four distinct addressabl e groups.

MCGR Register Bits

[1..0] Binary Selection Address MCGR GROUP

00 XX111100 GRP0

01 XX111101 GRP1

10 XX111110 GRP2

11 XX111111 GRP3

Table 5 - Multicast Group Register Mapping

 Note: The MCGR is reset to 00 upon receiving TRST or the entering of the Test-Logic-Reset

state.

IDCODE Register

It is an optional 32-bit register that can be

connected between PRIM_TDI and PRIM_TDO of

the AS91L1006BU device. The contents of the

IDCODE register will be loaded with the following

data when the AS91L1006BU enters Test-Logic-

Reset or passes through Capture-IR:

"00000000000000001000001101101111"

Bits 0 to 11 indicate ALSC Jedec ID value of:

“001101101111”

Bits 12 to 27 indicate the part number of the

device: “0000000000010000”

Bits 28 to 31 indicate the revision of the device:

“0000”

USERCODE Register

The USERCODE is an 8-bit register that can

be addressed via standard IEEE1149.1

commands, which are automatically generated by

third party test tools. AS91L1006BU returns all

zeroes if read from this registerUSERUSER and

does have the ability to write into this register.



* The AS91L1006BU is a complete se cond source and pin for pin replacement of the

Firecron JTS06BU device.

www.alsc.com Alliance Semiconductor 6

July 2004 AS91L1006BU

SELF_TEST Register

The AS91L1006BU device supports a

single output pin that can be controlled via the

IEEE1149.1 interface. When the instruction is

loaded into the AS91L1006BU instruction register,

a single bit data register is connected which is

always reset to logic zero when the TAP state

machine enters Capture-DR. This will cause the

SELF_TEST pin to pulse low for one cycle of TCK,

during the Update-DR phase. This low going pulse

can be used to initiate self-tests on PCB’s in a rack

via the JTAG interface.

LSP_ASYNC_RST Register

The AS91L1006BU device supports async

reset tests on the devices connected to the LSPs.

The standard method of performing these tests by

utilizing the primary TRST pin cannot be used as it

will cause the AS91L1006BU to deselect and its

internal registers to be reset. In order to enable

async reset tests on LSPs, the test tool should

instruct the device to toggle the LSP reset pins

while maintaining the set up information in the

AS91L1006BU. When the instruction is loaded

into the AS91L1006BU instruction register, a

single bit data register is connected as the data

the TAP state machine enters Capture-DR. This

will cause the LSP TRST pins to pulse low for one

TCK cycle, during the Update-DR phase.

AUTOWR Register

This is a 6-bit register that controls the pass-

through of the JTAG Technologies AutoWR™

signal to any LSP. The register is reset to all

zeros when entering the Test-Logic-Reset state.

 Note: The MCGR is reset to 00 upon receiving TRST or the entering of the

Test-Logic-Reset state

AutoWr

(Bit 2 –

Bit 0)

LSP 3

AutoWr

Signal

LSP 2

AutoWr

Signal

LSP 1

AutoWr

Signal

000 High Z High Z High Z

001 High Z High Z Active

011 High Z Active Active

100 Active High Z High Z

101 Active High Z Active

110 Active Active High Z

111 Active Active Active

AutoWr

(Bit 5 – Bit

LSP 6

AutoWr

Signal

LSP 5

AutoWr

Signal

LSP 4

AutoWr

Signal

000 High Z High Z High Z

001 High Z High Z Active

011 High Z Active Active

100 Active High Z High Z

101 Active High Z Active

110 Active Active High Z

111 Active Active Active

Table 6 - AUTOWR Register Mapping

www.alsc.com Alliance Semiconductor 7

July 2004 AS91L1006BU

MODE_SELECT Register

The Mode_Select register allows the LSP

of the AS91L1006BU to be connected in various

different configurations. A LSP is selected for

connection within the scan chain by the contents of

the Mode_Select registe r.

If the LSP is not parked in a stable state,

i.e.: Pause-DR, Pause-IR, Run-Test-Idle or Test-

Logic-Reset, it will be connected into the active

scan chain. If all LSPs are parked in a stable

state, then the AS91L1006BU will perform a

bypass of the 6-LSP chain section. In this way if

both sections are in the bypass mode then the

AS91L1006BU is performing a loopback of TDI-

>Register->TDO to the host device.

Mode_Select

-> Bit 8)

LSP Configuration (If Port

Unparked)

XXX0X000 TDI ->Register->LSP_Data

XXX0X001 TDI ->Register->LSP1->PAD->

LSP_Data

XXX0X010 TDI ->Register->LSP2->PAD->

LSP_Data

XXX0X011 TDI ->Register->LSP1->PAD-

>LSP2->PAD-> LSP_Data

XXX0X100 TDI ->Register->LSP3->PAD->

LSP_Data

XXX0X101 TDI ->Register->LSP1->PAD-

>LSP3->PAD-> LSP_Data

XXX0X110 TDI ->Register->LSP2->PAD-

>LSP3->PAD-> LSP_Data

XXX0X111 TDI ->Register->LSP1->PAD-

>LSP2->PAD->LSP3->PAD->

LSP_Data

Mode_Select

Bit 0)

LSP Configuration (If Port

Unparked)

XXX0X000 LSP_Data ->TDO

XXX0X001 LSP_Data ->LSP4->PAD-

>TDO

XXX0X010 LSP_Data ->LSP5->PAD-

>TDO

XXX0X011 LSP_Data ->LSP4->PAD-

>LSP5->PAD->TDO

XXX0X100 LSP_Data ->LSP6->PAD-

>TDO

XXX0X101 LSP_Data ->LSP4->PAD-

>LSP6->PAD->TDO

XXX0X110 LSP_Data ->LSP5->PAD-

>LSP6->PAD->TDO

XXX0X111 LSP_Data ->LSP4->PAD-

>LSP5->PAD->LSP6->PAD-

>TDO

Table 7 - Mode Select Register Mapping

X = Don’t care

data registers.

PAD = Insertion of a 1-bit register for data synchro nization.

Upon entering Test-Logi c-Reset, the register bits will be loaded with “0000000”.

www.alsc.com Alliance Semiconductor 8

July 2004 AS91L1006BU

Pass Through Support within the AS91L1006BU Device

The AS91L1006BU device supports a

Pass-Through mode where the primary or master

IEEE1149.1 JTAG signals can be routed to any

one of the LSPs. When this mode is activated, the

“Debug Enable” signal for that LSP will go active,

which can be used to place a processor such as

the MPC8260 into BDM (Background Debug

mode), if required. If no processors are present in

the LSP, the Pass-Through mode can be used to

assist in the generation of the test vectors or

memory tests for the devices that are linked into

the selected LSP. The pass-through feature has

the effect of simplifying the test vector generation

for the LSP, as it also has the effect of removing

the AS91L1006BU device from the test vector

generation proces s.

PASS_THRU_Enable PASS_THRU_SEL(2) PASS_THRU_SEL(1) PASS_THRU_SEL(0) Active LSP

High X X X Normal

Operation

Low Low Low Low LSP1

Low Low Low High LSP2

Low Low High Low LSP3

Low Low High High LSP4

Low High Low Low LSP5

Low High Low High LSP6

Table 8 - Pass through mode in AS91L1006BU

 Note: When PASS_THRU_ENABLE is deasserted (logic “1”), then the LSPs are under

control of the AS91L1006BU device logic. When PASS_THRU_ENABLE is asserted (logic

“0”) and if an invalid combination is presented on the PASS_THRU_SEL lines, then all LSPs

are tri-stated.

www.alsc.com Alliance Semiconductor 9

July 2004 AS91L1006BU

Signal Description

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP1_TCK OUT 31 H4 IEEE1149.1 Test Clock on LSP 1

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

LSP1_TMS OUT 32 J4 IEEE1149.1 Test Mode Select on

LSP 1 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP1_TDO OUT 35 H5 IEEE1149.1 Test Data Out on LSP 1

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP1_TDI IN 33 K4 IEEE1149.1 Test Data In on LSP 1

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

LSP1_TRST OUT 29 K3 IEEE1149.1 Test Reset on LSP 1

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

www.alsc.com Alliance Semiconductor 10

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP1_AutoWR OUT 30 J3 Flash, Memory Auto-Write on LSP 1

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP1_DE OUT 28 J2 Pass-Through Debug Enable Output

on Local Scan Port 1.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 000.

This pin is high for all other

combinations.

Logic '1'

LSP2_TCK OUT 41 J6 IEEE1149.1 Test Clock on LSP 2

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

LSP2_TMS OUT 42 H6 IEEE1149.1 Test Mode Select on

LSP 2 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP2_TDO OUT 45 J7 IEEE1149.1 Test Data Out on LSP 2

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

This pin is tri-stated for all other

combinations.

Logic '1'

www.alsc.com Alliance Semiconductor 11

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP2_TDI IN 44 K7 IEEE1149.1 Test Data In on LSP 2

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

LSP2_TRST OUT 37 K5 IEEE1149.1 Test Reset on LSP 2

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

LSP2_AutoWR OUT 40 K6 Flash, Memory Auto-Write on LSP 2

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP2_DE OUT 36 J5 PASS_THRU Debug Enable Output

on LSP 2.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 001.

This pin is high for all other

combinations.

Logic '1'

LSP3_TCK OUT 49 K9 IEEE1149.1 Test Clock on LSP 3

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

www.alsc.com Alliance Semiconductor 12

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP3_TMS OUT 50 K10 IEEE1149.1 Test Mode Select on

LSP 3 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP3_TDO OUT 53 H10 IEEE1149.1 Test Data Out on LSP 3

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP3_TDI IN 52 J10 IEEE1149.1 Test Data In on LSP 3

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

LSP3_TRST OUT 47 J8 IEEE1149.1 Test Reset on LSP 3

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

LSP3_LSP_

AutoWR OUT 48 K8 Flash, Memory Auto-Write on LSP 3

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

www.alsc.com Alliance Semiconductor 13

www.alsc.com Alliance Semiconductor 14

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP3_DE OUT 46 H7 PASS_THRU Debug Enable Output

on LSP 3.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 010.

This pin is high for all other

combinations.

Logic '1'

LSP4_TCK OUT 79 A8 IEEE1149.1 Test Clock on LSP 4

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

LSP4_TMS OUT 78 A9 IEEE1149.1 Test Mode Select on

LSP 4 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP4_TDO OUT 76 B10 IEEE1149.1 Test Data Out on LSP 4

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP4_TDI IN 77 B9 IEEE1149.1 Test Data In on LSP 4

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP4_TRST OUT 81 A7 IEEE1149.1 Test Reset on LSP 4

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

LSP4_AutoWR OUT 80 B8 Flash, Memory Auto-Write on LSP 4

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP4_DE OUT 83 B7 PASS_THRU Debug Enable Output

on LSP 4.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 011.

This pin is high for all other

combinations.

Logic '1'

LSP5_TCK OUT 70 D10 IEEE1149.1 Test Clock on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

LSP5_TMS OUT 69 D9 IEEE1149.1 Test Mode Select on

LSP 5 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

This pin is tri-stated for all other

combinations.

Logic '1'

www.alsc.com Alliance Semiconductor 15

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP5_TDO OUT 67 E8 IEEE1149.1 Test Data Out on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP5_TDI IN 68 E7 IEEE1149.1 Test Data In on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

LSP5_TRST OUT 72 C9 IEEE1149.1 Test Reset on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

LSP5_AutoWR OUT 71 D8 Flash, Memory Auto-Write on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP5_DE 75 C10 PASS_THRU Debug Enable Output

on LSP 5.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 100.

This pin is high for all other

combinations.

Logic '1'

www.alsc.com Alliance Semiconductor 16

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP6_TCK OUT 61 F10 IEEE1149.1 Test Clock on LSP 6

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TCK

LSP6_TMS OUT 60 F9 IEEE1149.1 Test Mode Select on

LSP 6 when PASS_THRU_ENABLE

is HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP6_TDO OUT 57 G10 IEEE1149.1 Test Data Out on LSP 6

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP6_TDI IN 58 G8 IEEE1149.1 Test Data In on LSP 6

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

LSP6_TRST OUT 64 E9 IEEE1149.1 Test Reset on LSP 5

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

This pin is tri-stated for all other

combinations.

Buffered version

of signal present

on primary TRST

www.alsc.com Alliance Semiconductor 17

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP6_AutoWR OUT 63 F7 Flash, Memory Auto-Write on LSP 6

when PASS_THRU_ENABLE is

HIGH.

Pin is in Pass-Through mode when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101;

PRIM_AutoWR is routed to output.

This pin is tri-stated for all other

combinations.

Logic '1'

LSP6_DE OUT 65 E10 PASS_THRU Debug Enable Output

on LSP 6.

Active low output when

PASS_THRU_ENABLE = 0 and

PASS_THRU_SEL[2:0] = 101.

This pin is high for all other

combinations.

Logic '1'

PRIM_TCK IN 87 A6

IEEE1149.1 Primary Test Clock

Input.

PRIM_TMS IN 21 G2 IEEE1149.1 Primary Test Mode

Select Input.

PRIM_TDO OUT 20 G1 IEEE1149.1 Primary Test Data

Output. This pin is tri-stated when

AS91L1006BUis not sele cted.

HighZ

PRIM_TDI IN 19 G3 IEEE1149.1 Primary Test Data Input

PRIM_TRST IN 22 H2 IEEE1149.1 Primary Test Reset

Input.

This active low asynchronous reset

input signal places AS91L1 006U in

Wait-for-Selection state.

PRIM_AutoWR IN 16 F1 Primary Auto-Write Input controlled

by test equipment to shorten Flash

memory programming.

S[5:0] IN 8,7,6,5,100,

99 D2,D1,D3,C

2,B2,A2 AS91L1006BU Slot Address[5:0]

Inputs.

Used to set address at which

AS91L1006BU will resp ond; typically

set by hardwired connection on the

backplane.

*TOE IN 88 B6 Test Output Enable Input.

Tri-states all LSPs, when asserted

low.

www.alsc.com Alliance Semiconductor 18

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

LSP_RESET_n IN 14 F4 LSP Reset Input.

Active low resets AS91L1006BU to

“Wait-for-Selection” state and pulses

all LSP TRST output pins to low.

This resets all devices with TRST

function; typically this signal would be

connected to a power-on-reset

function.

AS91L1006BU_

SELECTED OUT 25 K1 AS91L1006BU_Selected Output.

Active low when AS91L1006BU is

selected; typically used to control off

board buffering.

Logic '1'

LSP_ENABLE OUT 24 J1 LSP Enabled Output.

Active low when AS91L1006BU is

selected; typically used to set

IEEE1149.1 compliance enable pins

on devices.

Logic '1'

USER_STATUS

BYTE[7:0] IN 84, 85, 92,

93, 94, 96,

97, 98

(MSB-LSB)

C7,C6,C5,C

4,B4,A4,B3,

A3(MSB-

LSB)

AS91L1006BU Status_Byte Inputs.

Used to provide status information of

the PCB under test back to the test

master via the IEEE1149.1 bus. Eight

signals levels can be monitored and

then reported via the IEEE1149.1 bus

in a non intrusive manner.

SELF_TEST OUT 27 K2 Provides a low going output pulse

under command from the

IEEE1149.1 bus, which can be used

to start self-test functions on a PCB.

Logic '1'

PASS_THRU_

ENABLE IN 9 E4 PASS_THRU Enable Input.

Active high disables Pass-Through

mode.

Active low enables Pass-Through

mode.

PASS_THRU_

SEL12:0] IN 13,12,10

(MSB-LSB) E2,E1,E3

(MSB-LSB) PASS_THRU Select Inputs.

Used to select active routing of Pass-

Through ports ena bled by active low

on PASS_THRU_ENABLE pin.

000 = LSP1

001 = LSP2

010 = LSP3

011 = LSP4

100 = LSP5

101 = LSP6

www.alsc.com Alliance Semiconductor 19

July 2004 AS91L1006BU

PIN NAME PIN

TYPE

NUMBER

LQFP

NUMBER

FPBGA DESCRIPTION Stable state

after port/reset

GND POWER 38, 86, 11,

26, 43, 59,

74, 95, 2,

17, 54, 55

D6, G5, C3,

D7, E5, F6,

G4,H8, H9,

J9,B1, A5,

Ground pins.

VCC POWER 39, 91, 3,

18, 34, 51,

66,

82,23,56

D5, G6, C8,

D4, E6, F5,

G7,

H3,G9,H1

VCC pins.

ASIC_TEST_

EN IN 89 B5 Factory Test_Enable Input.

This pin should be left unconnected.

ASIC_TCK IN 62 F8 IEEE1149.1 ASIC Test Clock Input.

ASIC_TMS IN 15 F3 IEEE1149.1 ASIC Test Mode Select.

Input

ASIC_TDO OUT 73 A10 IEEE1149.1 ASIC Test Clock Output.

ASIC_TDI IN 4 A1 IEEE1149.1 ASIC Test Clock Input.

No Connects 1 C1

Table 9 - AS91L0006BU Signal Description

Absolute Maximum Ratings

Parameter Maximum Range

Supply Voltage (Vcc) -0.3V to 5.5V

DC Input Voltage (Vi) -0.5V to Vcc +0.5V

Max sink current when Vi = -0.5V -20mA

Max source current when Vi = Vcc + 0.5V +20mA

Max Junction Temperature with power applied Tj +125 degrees C

Max Storage temperature -55 to +150 degree C

Table 10 - Absolute Maximum Ratings

 Note: Stress above the stated maximum values may cause irreparable damage to the device.

Correct operation of the device at these values is not guaranteed.

Recommended Operating Conditions

www.alsc.com Alliance Semiconductor 20

July 2004 AS91L1006BU

Parameter Operating Range

Supply Voltage (Vcc) 3.0V to 3.6V

Input Voltage (Vi) 0V to Vcc

Output Voltage (Vo) 0V to Vcc

Operating Temperature (Ta)

Commercial 0 C to 70 C

Industrial (Ta) -40 deg C to +85 deg C, 3.00V to 3.6V

Table 11 - Recommended Operating Conditio ns

www.alsc.com Alliance Semiconductor 21

July 2004 AS91L1006BU

AC Electrical Characteristics

Lsp Signal

Tpd

Tco

Toe

Tcl TcwTch

TCK

TDO

TDI

TMS

High ZHigh Z

Tsu

Figure 4 - AS91L1006BU AC Timing Diagram

SYMBOL Parameter MIN MAX UNITS

Tcw TCK clock pulse width 100 - ns

Tch TCK pulse width high 50 - ns

Tcl TCK pulse width low 50 - ns

Tsu TCK Setup time 30 - ns

Th TCK Hold time 40 - ns

Toe Neg Edge TCK to valid data enable 20 - ns

Tco Neg Edge TCK to valid data 15 - ns

Tpd Pass through Mode Primar y/Lsp Delay - 10 ns

Table 12 - AS91L1006BU AC Timing Information

www.alsc.com Alliance Semiconductor 22

July 2004 AS91L1006BU

DC Electrical Characteristics

Symbol Parameter Max Min Condition

VIH Minimum High Input

Voltage 5.25 2.0

VIL Maximum Low Input

Voltage 0.8V -0.3V

Symbol Parameter Value Condition

VOH Minimum High Output

Voltage 2.4V Ioh=24mA or 8mA as defined

by pin

VOL Minimum LowOutput

Voltage 0.4V Iol=24mA or 8mA as defined

by pin

Ioz Tristate output leakage -10 or 10 mA

Icc Maximum quiecennt

supply current 2mA

Iccd Maximum dynamic

supply current 80mA TCK freq equal to 10 MHz

Table 13 - AS91L1006BU DC Electrical Characteristics

Packaging Information

The AS91L1006BU is available in a 100-pin LQFP o r a 100-pin FPBGA lead free package.

Square

D1BASIC 14.00

DBASIC 18.00

L0.15 0.60

A2MIN NOM MAX 1.35 1.40 1.45

L1 REF 1.00

AMAX. 1.60

bMIN MAX 0 .1 7 0 .2 7

A10.05 0.15

eBASIC 0.50

JEDEC REF # MS-026

ccc MAX 0.08

ddd NOM 0.08

SYMBOL 100 LEA D

TOL. LEADS

MIN MAX

NOTES:

1. A L L LINE A R D IME NS IO NS A RE IN MIL L IM ET E R S.

2. PLASTIC BODY D IMENSIONS DO N OT INCLUDE FLASH O R PROTUSION.

MAX ALLOWABLE 0.25 PER SIDE.

3. LEAD COUN T ON D RAW ING NOT RE PRESENTATIVE OF ACTUAL PACKAGE.

0.25

0.09/0.20 TYP

0 - 7

TYP

LL1 b

- C -

CCC

LEAD COPLAN A R ITY

al al al A-B S D S

A2 A

12 NOM

Figure 5 - LQFP-100

www.alsc.com Alliance Semiconductor 21

July 2004 AS91L1006BU

Revisions

REV. DESCRIPTION ECN DATE

A Initial document release. 91253 12-04-01

B Updated ball coplanarity limits from

0.20mm to 0.15mm.

0.15 C

1 2 3 4 5 6 7 8 9 10

b 0.25 M C

0.25 M C A B

DIMENSIONS

SYMBOL MIN. NOM. MAX.

A -- -- 1.70

A1 0.30 -- --

A2 0.25 -- 1.10

b 0.50 0.60 0.70

D 11.00 BSC

D1 9.00 BSC

E 11.00 BSC

E1 9.00 BSC

e 1.00

PACKAGE NUMBER FBGA0100-11F

JEDEC REF # MO-192 VAR. AAC-1

Figure 6 - FPBGA-100

www.alsc.com Alliance Semiconductor 22

July 2004 AS91L1006BU

Device Selector Guide and Ordering Information

AS91L XXXX UU - CC PP - TEMP - L

Aliance Semiconductor

system solution

Device family

1001

1002

1003

1006

Product version

S = standard

U = 16-bit user code

BU = 8-bit status/user code

E = enhanced

C = Commercial (0 to 70 degrees C)

I = Industrial (-40 to 85 degrees C)

Package

L100 = 100 pin LQFP

F100 = 100 pin FP BGA

Clock speed

10 = 10 MHz TCK

40 = 40 MHz TCK

Blank = le aded

F = lead free

G = green

Figure 7 - Part Numbering Guide

www.alsc.com Alliance Semiconductor 23

July 2004 AS91L1006BU

Part Number Description

AS91L1006BU – 10L100 -C

JTAG 6-Port Gateway, 100-pin LQFP

package, commercial

AS91L1006BU – 10L100-CF JTAG 6-Port Gateway, 100-pin LQFP

package, commercial, lead free

AS91L1006BU – 10L100 -I

JTAG 6-Port Gateway, 100-pin LQFP

package, industrial

AS91L1006BU – 10L100-IF JTAG 6-Port Gateway, 100-pin LQFP

package, industrial, lead free

AS91L1006BU – 10F100 -C

JTAG 6-Port Gateway 100-pin FPBGA

package, commercial

AS91L1006BU – 10F100- CG JTAG 6-Port Gateway 100-pin FPBGA,

commercial, green package

AS91L1006BU – 10F100-I

JTAG 6-Port Gateway 100-pin FPBGA

package, industrial

AS91L1006BU – 10F100-IG JTAG 6-Port Gateway 100-pin FPBGA,

industrial, green package

AS91L1006BU – 40L100-CF JTAG 6-Port Gateway, 100-pin LQFP

package, commercial, lead free, 40 MHz

TCK

AS91L1006BU – 40L100-IF JTAG 6-Port Gateway, 100-pin LQFP

package, industrial, lead free, 40 MHz

TCK

AS91L1006BU – 40F100- CG JTAG 6-Port Gateway 100-pin FPBGA,

commercial, green package, 40 MHz TCK

AS91L1006BU – 40F100-IG JTAG 6-Port Gateway 100-pin FPBGA,

industrial, green package, 40 MHz TCK

Table 14 - Valid Part Number Combinations

www.alsc.com Alliance Semiconductor 24

July 2004 AS91L1006BU

Package Options

Device

Master Description

FPBGA-100

(1mm pitch) LQFP-100

AS91L1001 JTAG Test Controller x x

AS91L1002 JTAG Test Sequencer x x

AS91L1003U 3-Port Gateway x x

AS91L1006BU 6-Port Gateway x x

Table 15 - JTAG Controller Product Family

www.alsc.com Alliance Semiconductor 25

July 2004 AS91L1006BU

www.alsc.com Alliance Semiconductor 26