NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM 184pin One Bank Unbuffered DDR SDRAM MODULE Based on DDR333 32Mx8 SDRAM Features * 184-Pin Unbuffered 8-Byte Dual In-Line Memory Module * DRAM DLL aligns DQ and DQS transitions with clock * 32Mx64 Double Data Rate (DDR) SDRAM DIMM transitions. * Performance: * Address and control signals are fully synchronous to positive clock edge PC2700 Speed Sort DIMM CAS Latency f CK Clock Frequency 2.5 f DQ DQ Burst Frequency - DIMM CAS Latency: 2, 2.5 2 166 133 MHz 6 7.5 ns 333 266 MHz t CK Clock Cycle * Programmable Operation: Unit -6 - Burst Type: Sequential or Interleave - Burst Length: 2, 4, 8 - Operation: Burst Read and Write * Auto-Refresh (CBR) and Self-Refresh Modes * Intended for 100 MHz and 133 MHz applications * Automatic and controlled precharge commands * Inputs and outputs are SSTL-2 compatible * 13/10/1 Addressing (row/column/bank) * VDD = 2.5Volt 0.2, VDDQ = 2.5Volt 0.2 * 7.8 s Max. Average Periodic Refresh Interval * SDRAMs have 4 internal banks for concurrent operation * Serial Presence Detect * Module has one physical bank * Gold contacts * Differential clock inputs * SDRAMs in 66-pin TSOP Type II Package * Data is read or written on both clock edges Description NT256D64S88ABG is an unbuffered 184-Pin Double Data Rate (DDR) Synchronous DRAM Dual In-Line Memory Module (DIMM), organized as a one-bank high-speed memory array. The 32Mx64 module is a single-bank DIMM that uses eight 32Mx8 DDR SDRAMs in 400 mil TSOP packages. The DIMM achieves high-speed data transfer rates of up to 333MHz. The DIMM is intended for use in applications operating from 133 MHz to 166 MHz clock speeds with data rates of 266 to 333 MHz. Clock enable CKE0 controls all devices on the DIMM. Prior to any access operation, the device CAS latency and burst type/ length/operation type must be programmed into the DIMM by address inputs A0-A12 and I/O inputs BA0 and BA1 using the mode register set cycle. These DIMMs are manufactured using raw cards developed for broad industry use as reference designs. The use of these common design files minimizes electrical variation between suppliers. The DIMM uses serial presence detects implemented via a serial EEPROM using the two-pin IIC protocol. The first 128 bytes of serial PD data are programmed and locked during module assembly. The last 128 bytes are available to the customer. All NANYA 184 DDR SDRAM DIMMs provide a high-performance, flexible 8-byte interface in a 5.25" long space-saving footprint. Ordering Information Part Number NT256D64S88ABG-6 REV 1.1 08/2002 Speed 166MHz (6ns @ CL = 2.5) PC2700 133MHz (7.5ns @ CL= 2) Organization Leads Power 32Mx64 Gold 2.5V 1 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Pin Description CK0, CK1, CK2 Differential Clock Inputs CK0, CK1, CK2 DQ0-DQ63 Data input/output CKE0 Clock Enable DQS0-DQS7, RAS Row Address Strobe DQS9-DQS16 CAS Column Address Strobe VDD Power (2.5V) WE Write Enable VDDQ Supply voltage for DQs (2.5V) Bi-directional data strobes S0 Chip Selects VSS Ground A0-A9, A11, A12 Address Inputs NC No Connect A10/AP Address Input/Auto-precharge SCL Serial Presence Detect Clock Input BA0, BA1 SDRAM Bank Address Inputs SDA Serial Presence Detect Data input/output VREF Ref. Voltage for SSTL_2 inputs SA0-2 Serial Presence Detect Address Inputs VDDID VDD Identification flag. VDDSPD Serial EEPROM positive power supply (2.5V) Pinout Pin Front Pin Back Pin Front Pin Back Pin Front Pin 1 VREF 93 VSS 32 A5 124 VSS 62 VDDQ 154 Back RAS 2 DQ0 94 DQ4 33 DQ24 125 A6 63 WE 155 DQ45 3 VSS 95 DQ5 34 VSS 126 DQ28 64 DQ41 156 VDDQ 4 DQ1 96 VDDQ 35 DQ25 127 DQ29 65 CAS 157 S0 5 DQS0 97 DQS9 36 DQS3 128 VDDQ 66 VSS 158 NC 6 DQ2 98 DQ6 37 A4 129 DQS12 67 DQS5 159 DQS14 7 VDD 99 DQ7 38 VDD 130 A3 68 DQ42 160 VSS 8 DQ3 100 VSS 39 DQ26 131 DQ30 69 DQ43 161 DQ46 DQ47 9 NC 101 NC 40 DQ27 132 VSS 70 VDD 162 10 NC 102 NC 41 A2 133 DQ31 71 NC 163 NC 11 VSS 103 NC 42 VSS 134 NC 72 DQ48 164 VDDQ 12 DQ8 104 VDDQ 43 A1 135 NC 73 DQ49 165 DQ52 13 DQ9 105 DQ12 44 NC 136 VDDQ 74 VSS 166 DQ53 14 DQS1 106 DQ13 45 NC 137 CK0 75 CK2 167 NC 15 VDDQ 107 DQS10 46 VDD 138 CK0 76 CK2 168 VDD 16 CK1 108 VDD 47 NC 139 VSS 77 VDDQ 169 DQS15 17 CK1 109 DQ14 48 A0 140 NC 78 DQS6 170 DQ54 18 VSS 110 DQ15 49 NC 141 A10 79 DQ50 171 DQ55 19 DQ10 111 NC 50 VSS 142 NC 80 DQ51 172 VDDQ 20 DQ11 112 VDDQ 51 NC 143 VDDQ 81 VSS 173 NC 21 CKE0 113 NC 52 BA1 144 NC 82 VDDID 174 DQ60 22 VDDQ 114 DQ20 83 DQ56 175 DQ61 KEY KEY 23 DQ16 115 A12 53 DQ32 145 VSS 84 DQ57 176 VSS 24 DQ17 116 VSS 54 VDDQ 146 DQ36 85 VDD 177 DQS16 25 DQS2 117 DQ21 55 DQ33 147 DQ37 86 DQS7 178 DQ62 26 VSS 118 A11 56 DQS4 148 VDD 87 DQ58 179 DQ63 27 A9 119 DQS11 57 DQ34 149 DQS13 88 DQ59 180 VDDQ 28 DQ18 120 VDD 58 VSS 150 DQ38 89 VSS 181 SA0 29 A7 121 DQ22 59 BA0 151 DQ39 90 NC 182 SA1 30 VDDQ 122 A8 60 DQ35 152 VSS 91 SDA 183 SA2 31 DQ19 123 DQ23 61 DQ40 153 DQ44 92 SCL 184 VDDSPD Note: All pin assignments are consistent for all 8-byte unbuffered versions. REV 1.1 08/2002 2 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Input/Output Functional Description Symbol Type CK0, CK1, CK2 (SSTL) CK0, CK1, CK2 (SSTL) CKE0 (SSTL) Positive The positive line of the differential pair of system clock inputs. All the DDR SDRAM Edge Negative Edge Active High (SSTL) Active Low RAS, CAS, WE (SSTL) Active Low VREF Supply VDDQ Supply BA0, BA1 (SSTL) S0 Function Polarity address and control inputs are sampled on the rising edge of their associated clocks. The negative line of the differential pair of system clock inputs. Activates the SDRAM CK signal when high and deactivates the CK signal when low. By deactivating the clocks, CKE low initiates the Power Down mode, or the Self-Refresh mode. Enables the associated SDRAM command decoder when low and disables the command decoder when high. When the command decoder is disabled, new commands are ignored but previous operations continue. When sampled at the positive rising edge of the clock, RAS, CAS, WE define the operation to be executed by the SDRAM. Reference voltage for SSTL-2 inputs Isolated power supply for the DDR SDRAM output buffers to provide improved noise immunity - Selects which SDRAM bank is to be active. During a Bank Activate command cycle, A0-A12 defines the row address (RA0-RA12) when sampled at the rising clock edge. During a Read or Write command cycle, A0-A9 defines the column address (CA0-CA9) A0 - A9 A10/AP A11, A12 when sampled at the rising clock edge. In addition to the column address, AP is used to (SSTL) - invoke Auto-precharge operation at the end of the Burst Read or Write cycle. If AP is high, auto-precharge is selected and BA0/BA1 define the bank to be precharged. If AP is low, auto-precharge is disabled. During a Precharge command cycle, AP is used in conjunction with BA0/BA1 to control which bank(s) to precharge. If AP is high all 4 banks will be precharged regardless of the state of BA0/BA1. If AP is low, then BA0/BA1 are used to define which bank to pre-charge. DQ0 - DQ63 (SSTL) - DQS0 - DQS7 DQS9 - DQS16 (SSTL) Active High VDD, VSS Supply - SDA - SCL - REV 1.1 08/2002 Supply DRAMs. Data strobes: Output with read data, input with write data. Edge aligned with read data, centered on write data. Used to capture write data. Power and ground for the DDR SDRAM input buffers and core logic SA0 - SA2 VDDSPD Data and Check Bit input/output pins operate in the same manner as on conventional Address inputs. Connected to either VDD or VSS on the system board to configure the Serial Presence Detect EEPROM address. This bi-directional pin is used to transfer data into or out of the SPD EEPROM. A resistor must be connected from the SDA bus line to VDD to act as a pullup. This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected from the SCL bus time to VDD to act as a pullup. Serial EEPROM positive power supply. 3 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Functional Block Diagram (1 Bank, 32Mx8 DDR SDRAMs) S0 DQS0 DQS9 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 DQS4 DQS13 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 D0 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 D1 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 D2 DQS3 DQS12 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 D3 RAS RAS : SDRAMs D0-D7 CAS CAS : SDRAMs D0-D7 CKE0 CKE : SDRAMs D0-D7 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS D6 DQS D7 * Wire per Clock Loading Table/ Wiring Diagrams WE : SDRAMs D0-D7 VDDSPD VDD/VDDQ VREF VSS VDDID Serial PD 08/2002 CS D5 * Clock Wiring Clock Input SDRAMs *CK0/CK0 2 SDRAMs *CK1/CK1 3 SDRAMs *CK2/CK2 3 SDRAMs A0-A13 : SDRAMs D0-D7 WE REV 1.1 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQS BA0-BA1 : SDRAMs D0-D7 A0-A13 Notes : 1. 2. 3. 4. CS D4 DQS7 DQS16 BA0-BA1 SCL WP DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQS DQS6 DQS15 DQS2 DQS11 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 CS DQS5 DQS14 DQS1 DQS10 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 A0 A1 A2 SA0 SA1 SA2 SDA SPD D0-D7 D0-D7 D0-D7 Strap: see Note 4 DQ-to-I/O wiring is shown as recommended but may be changed. DQ/DQS/DM/CKE/S relationships must be maintained as shown. DQ, DQS, DM/DQS resistors: 22 Ohms. VDDID strap connections (for memory device VDD, VDDQ): STRAP OUT (OPEN): VDD = VDDQ STRAP IN (VSS): VDD is not equal to VDDQ. 4 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Serial Presence Detect -- Part 1 of 2 32Mx64 SDRAM DIMM based on 32Mx8, 4Banks, 8K Refresh, 2.5V DDR SDRAMs with SPD SPD Entry Value Byte 0 Description Number of Serial PD Bytes Written during Production 1 Total Number of Bytes in Serial PD device 2 Fundamental Memory Type 3 Serial PD Data Entry (Hexadecimal) Note DDR333 DDR333 -6 -6 128 80 256 08 SDRAM DDR 07 Number of Row Addresses on Assembly 13 0D 4 Number of Column Addresses on Assembly 10 0A 5 Number of DIMM Bank 1 01 6 Data Width of Assembly X64 40 7 Data Width of Assembly (cont') 8 Voltage Interface Level of this Assembly 9 10 DDR SDRAM Device Cycle Time at CL=2.5 DDR SDRAM Device Access Time from Clock at CL=2.5 11 DIMM Configuration Type 12 Refresh Rate/Type X64 00 SSTL 2.5V 04 6ns 60 0.7ns 70 Non-Parity 00 SR/1x(7.8s) 82 13 Primary DDR SDRAM Width X8 08 14 Error Checking DDR SDRAM Device Width N/A 00 1 Clock 01 2,4,8 0E 4 04 2/2.5 0C 15 16 17 18 DDR SDRAM Device Attr: Min CLK Delay, Random Col Access DDR SDRAM Device Attributes: Burst Length Supported DDR SDRAM Device Attributes: Number of Device Banks DDR SDRAM Device Attributes: CAS Latencies Supported 19 DDR SDRAM Device Attributes: CS Latency 0 01 20 DDR SDRAM Device Attributes: WE Latency 1 02 Differential Clock 20 21 DDR SDRAM Device Attributes: 22 DDR SDRAM Device Attributes: General 23 Minimum Clock Cycle at CL=2 24 25 26 27 28 +/-0.2V Voltage Tolerance 00 7.5ns 75 0.7ns 70 N/A 00 N/A 00 18ns 48 12ns 30 Maximum Data Access Time from Clock at CL=2 Minimum Clock Cycle Time at CL=1 Maximum Data Access Time from Clock at CL=1 Minimum Row Precharge Time (tRP) Minimum Row Active to Row Active delay (tRRD) 29 Minimum RAS to CAS delay (tRCD) 18ns 48 30 Minimum RAS Pulse Width (tRAS) 42ns 2A 256MB 40 0.75ns 75 75 31 32 Module Bank Density Address and Command Setup Time Before Clock 33 Address and Command Hold Time After Clock 0.75ns 34 Data Input Setup Time Before Clock 0.45ns 45 35 Data Input Hold Time After Clock 0.45ns 45 36-61 Reserved 62 SPD Revision 63 Checksum Data REV 1.1 08/2002 Undefined 00 Initial 00 0A 5 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Serial Presence Detect -- Part 2 of 2 32Mx64 SDRAM DIMM based on 32Mx8, 4Banks, 8K Refresh, 2.5V DDR SDRAMs with SPD Byte SPD Entry Value Serial PD Data Entry (Hexadecimal) DDR333 DDR333 -6 -6 Description 64-71 Manufacturer's JEDEC ID Code 0B 7F7F7F0B00000000 72 00 Module Manufacturing Location N/A 73-90 Module Part number N/A 00 91-92 Module Revision Code N/A 00 93-94 Module Manufacturing Data Year/Week Code yy/ww 95-98 Module Serial Number Serial Number 00 Undefined 00 99-255 Reserved 1. yy= Binary coded decimal year code, 0-99(Decimal), 00-63(Hex) 2. ww= Binary coded decimal year code, 01-52(Decimal), 01-34(Hex) REV 1.1 08/2002 Note 1, 2 6 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Absolute Maximum Ratings Symbol VIN, VOUT Voltage on I/O pins relative to Vss Rating Units -0.5 to VDDQ+0.5 V VIN Voltage on Input relative to Vss -0.5 to +3.6 V VDD Voltage on VDD supply relative to Vss -0.5 to +3.6 V Voltage on VDDQ supply relative to Vss -0.5 to +3.6 V 0 to+70 C VDDQ TA TSTG PD IOUT Note: Parameter Operating Temperature (Ambient) Storage Temperature (Plastic) -55 to +150 C Power Dissipation 8 W Short Circuit Output Current 50 mA Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Capacitance Symbol Max. Units Notes Input Capacitance: CK0, CK0, CK1, CK1, CK2, CK2 CI1 12 pF 1 Input Capacitance: A0-A11, BA0, BA1, WE, RAS, CAS, CKE0, S0 CI2 30 pF 1 Input Capacitance: SA0-SA2, SCL CI4 9 pF 1 CIO1 7 pF 1, 2 Parameter Input/Output Capacitance DQ0-63; DQS0-7, 9-16 Input/Output Capacitance: SDA CIO3 11 pF 1. VDDQ = VDD = 2.5V 0.2V, f = 100 MHz, TA = 25 C, VOUT (DC) = VDDQ/2, VOUT (Peak to Peak) = 0.2V. 2. DQS inputs are grouped with I/O pins reflecting the fact that they are matched in loading to DQ and DQS to facilitate trace matching at the board level. REV 1.1 08/2002 7 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM DC Electrical Characteristics and Operating Conditions (TA = 0 C ~ 70 C; VDDQ = 2.5V 0.2V; VDD = 2.5V 0.2V, See AC Characteristics) Symbol Min Max Units Notes Supply Voltage 2.3 2.7 V 1 I/O Supply Voltage 2.3 2.7 V 1 0 0 V I/O Reference Voltage 0.49 x VDDQ 0.51 x VDDQ V 1, 2 I/O Termination Voltage (System) VREF - 0.04 VREF + 0.04 V 1, 3 VIH (DC) Input High (Logic1) Voltage VREF + 0.15 VDDQ + 0.3 V 1 VIL (DC) Input Low (Logic0) Voltage -0.3 VREF- 0.15 V 1 VIN (DC) Input Voltage Level, CK and CK Inputs -0.3 VDDQ + 0.3 V 1 VID (DC) Input Differential Voltage, CK and CK Inputs 0.30 V DDQ + 0.6 V 1, 4 -5 5 uA 1 -5 5 uA 1 -16.8 - mA 1 16.8 - mA 1 VDD VDDQ VSS, VSSQ VREF VTT II IOZ IOH IOL Parameter Supply Voltage, I/O Supply Voltage Input Leakage Current Any input 0V VIN VDD; (All other pins not under test = 0V) Output Leakage Current (DQs are disabled; 0V Vout VDDQ Output High Current (VOUT = VDDQ -0.373V, min VREF, min VTT) Output Low Current (VOUT = 0.373, max VREF, max VTT) 1. Inputs are not recognized as valid until VREF stabilizes. 2. VREF is expected to be equal to 0.5 VDDQ of the transmitting device, and to track variations in the DC level of the same. Peak-to-peak noise on VREF may not exceed 2% of the DC value. 3. VTT is not applied directly to the DIMM. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF, and must track variations in the DC level of VREF. 4. VID is the magnitude of the difference between the input level on CK and the input level on CK. REV 1.1 08/2002 8 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM AC Characteristics (Notes 1-5 apply to the following Tables; Electrical Characteristics and DC Operating Conditions, AC Operating Conditions, Operating, Standby, and Refresh Currents, and Electrical Characteristics and AC Timing.) 1. All voltages referenced to VSS. 2. Tests for AC timing, IDD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified. 3. Outputs measured with equivalent load. Refer to the AC Output Load Circuit below. 4. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5V in the test environment, but input timing is still referenced to VREF (or to the crossing point for CK, CK), and parameter specifications are guaranteed for the specified AC input levels under normal use conditions. The minimum slew rate for the input signals is 1V/ns in the range between VIL (AC) and VIH (AC) unless otherwise specified. 5. The AC and DC input level specifications are as defined in the SSTL_2 Standard (i.e. the receiver effectively switches as a result of the signal crossing the AC input level, and remains in that state as long as the signal does not ring back above (below) the DC input LOW (HIGH) level. AC Output Load Circuits VTT 50 ohms Output Timing Reference Point VOUT 30 pF AC Operating Conditions (TA = 0 C ~ 70 C; VDDQ = 2.5V 0.2V; VDD = 2.5V 0.2V, See AC Characteristics) Symbol Parameter/Condition Min VIH (AC) Input High (Logic 1) Voltage. VIL (AC) Input Low (Logic 0) Voltage. VID (AC) Input Differential Voltage, CK and CK Inputs VIX (AC) Input Differential Pair Cross Point Voltage, CK and CK Inputs Max Unit Notes V 1, 2 V REF - 0.31 V 1, 2 0.62 V DDQ + 0.6 V 1-3 (0.5*VDDQ) - 0.2 (0.5*VDDQ) + 0.2 V 1, 2, 4 V REF + 0.31 1. Input slew rate = 1V/ ns. 2. Inputs are not recognized as valid until V REF stabilizes. 3. VID is the magnitude of the difference between the input level on CK and the input level on CK. 4. The value of VIX is expected to equal 0.5*V DDQ of the transmitting device and must track variations in the DC level of the same. REV 1.1 08/2002 9 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Operating, Standby, and Refresh Currents (TA = 0 C ~ 70 C; VDDQ = 2.5V 0.2V; VDD = 2.5V 0.2V, See AC Characteristics) Symbol Parameter/Condition PC2700 Unit Notes 680 mA 1, 2 TBD mA 1, 2 200 mA 1, 2 280 mA 1, 2 200 mA 1, 2 480 mA 1, 2 1320 mA 1, 2 1200 mA 1, 2 Operating Current : one bank; active / precharge; tRC = tRC (MIN) ; I DD0 tCK = tCK (MIN) ; DQ, DM, and DQS inputs changing twice per clock cycle; address and control inputs changing once per clock cycle Operating Current : one bank; active / read / precharge; Burst = 2; I DD1 tRC = tRC (MIN) ; CL=2.5; tCK = tCK (MIN) ; IOUT = 0mA; address and control inputs changing once per clock cycle I DD2P I DD2N I DD3P Precharge Power-Down Standby Current : all banks idle; power-down mode; CKE VIL (MAX) ; tCK = tCK (MIN) Idle Standby Current : CS VIH (MIN) ; all banks idle; CKE VIH(MIN) ; tCK = tCK (MIN) ; address and control inputs changing once per clock cycle Active Power-Down Standby Current : one bank active; power-down mode; CKE VIL (MAX) ; tCK = tCK (MIN) Active Standby Current : one bank; active / precharge; CS VIH (MIN) ; I DD3N CKE VIH (MIN) ; tRC = tRAS (MAX) ; tCK = tCK (MIN) ; DQ, DM, and DQS inputs changing twice per clock cycle; address and control inputs changing once per clock cycle Operating Current : one bank; Burst = 2; reads; continuous burst; I DD4R address and control inputs changing once per clock cycle; DQ and DQS outputs changing twice per clock cycle; CL = 2.5; tCK = tCK (MIN) ; IOUT = 0mA Operating Current : one bank; Burst = 2; writes; continuous burst; I DD4W address and control inputs changing once per clock cycle; DQ and DQS inputs changing twice per clock cycle; CL=2.5; tCK = tCK (MIN) I DD5 Auto-Refresh Current : t RC = t RFC (MIN) 1360 mA 1, 2 t RC = 7.8 s 132 mA 1, 2, 4 24 mA 1-3 TBD mA 1 Self-Refresh Current : CKE 0.2V Operating Current: four bank; four bank interleaving with BL = 4, address and control inputs randomly changing; 50% of data changing at every I DD7 transfer; tRC = tRC (min); IOUT = 0mA. 1. I DD specifications are tested after the device is properly initialized. I DD6 2. Input slew rate = 1V/ ns. 3. Enables on-chip refresh and address counters. 4. Current at 7.8 s is time averaged value of IDD5 at tRFC (MIN) and IDD2P over 7.8 s. REV 1.1 08/2002 10 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM AC Timing Specifications for DDR SDRAM Devices Used on Module (TA = 0 C ~ 70 C; VDDQ = 2.5V 0.2V; VDD = 2.5V 0.2V, See AC Characteristics) (Part 1 of 2) Symbol -6 Parameter Min. Max. Unit Notes tAC DQ output access time from CK/CK -0.7 +0.7 ns 1-4 tDQSCK DQS output access time from CK/CK -0.7 +0.7 ns 1-4 tCH CK high-level width 0.45 0.55 tCK 1-4 tCL CK low-level width 0.45 0.55 tCK 1-4 tCK tCK Clock cycle time CL=2.5 6 12 ns 1-4 CL=2 7.5 12 ns 1-4 tDH DQ and DM input hold time 0.45 ns 1-4, 15, 16 tDS DQ and DM input setup time 0.45 ns 1-4, 15, 16 tDIPW DQ and DM input pulse width (each input) 1.75 ns 1-4 tHZ Data-out high-impedance time from CK/CK -0.7 +0.7 ns 1-5 tLZ Data-out low-impedance time from CK/CK -0.7 +0.7 ns 1-5 tDQSQ DQS-DQ skew (DQS & associated DQ signals) 0.4 ns 1-4 0.4 ns 1-4 tCK 1-4 tDQSQA tHP DQS-DQ skew (DQS & all DQ signals) min Minimum half clk period for any given cycle; defined by clk high (tCH ) or clk low (tCL ) time (tCH, tCL) tQHS Data Hold Skew Factor tQH Data output hold time from DQS 0.55 Ns tHP - tQHS tCK tDQSS Write command to 1st DQS latching transition 0.75 1-4 tCK tDQSL,H DQS input low (high) pulse width (write cycle) 1-4 0.35 tCK tDSS 1-4 DQS falling edge to CK setup time (write cycle) 0.2 tCK 1-4 tDSH DQS falling edge hold time from CK (write cycle) 0.2 tCK 1-4 tMRD Mode register set command cycle time 12 ns 1-4 tWPRES Write preamble setup time 0 ns 1-4, 7 tCK 1-4, 6 tWPST Write postamble 0.40 tWPRE Write preamble 0.25 tIH tIS tIH tIS REV 1.1 08/2002 Address and control input hold time (fast slew 0.75 rate) Address and control input setup time (fast slew 0.75 rate) Address and control input hold time (slow slew 0.8 rate) Address and control input setup time (slow slew 0.8 rate) 1.25 0.60 tCK ns ns ns ns 1-4 2-4, 9, 11, 12 2-4, 9, 11, 12 2-4, 10-12, 14 2-4, 10-12, 14 11 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM AC Timing Specifications for DDR SDRAM Devices Used on Module (TA = 0 C ~ 70 C; VDDQ = 2.5V 0.2V; VDD = 2.5V 0.2V, See AC Characteristics) (Part 2 of 2) Symbol -6 Parameter Min. Max. Unit Notes tIPW Input pulse width 2.2 ns 2-4, 12 tRPRE Read preamble 0.9 1.1 tCK 1-4 tRPST Read postamble 0.40 0.60 tCK 1-4 tRAS Active to Precharge command 42 120,000 ns 1-4 Active to Active/Auto-refresh command period 60 ns 1-4 72 ns 1-4 tRC tRFC Auto-refresh to Active/Auto-refresh command period tRCD Active to Read or Write delay 18 ns 1-4 tRAP Active to Read Command with Auto-precharge 18 ns 1-4 tRP Precharge command period 18 ns 1-4 tRRD Active bank A to Active bank B command 12 ns 1-4 tWR Write recovery time 15 ns 1-4 tCK 1-4, 13 tDAL Auto precharge write recovery + recharge time (tWR/tCK) + (tRP/tCK) tWTR Internal write to read command delay 1 tCK 1-4 tXSNR Exit self-refresh to non-read command 75 ns 1-4 tXSRD Exit self-refresh to read command 200 tREFI Average Periodic Refresh Interval REV 1.1 08/2002 7.8 tCK 1-4 s 1-4, 8 12 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM AC Timing Specification Notes 1. Input slew rate = 1V/ns. 2. The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference level for signals other than CK/CK is VREF. 3. Inputs are not recognized as valid until VREF stabilizes. 4. The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (Note 3) is VTT. 5. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ). 6. The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but system performance (bus turnaround) degrades accordingly. 7. The specific requirement is that DQS be valid (high, low, or some point on a valid transition) on or before this CK edge. A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from high to low at this time, depending on tDQSS. 8. A maximum of eight Auto refresh commands can be posted to any given DDR SDRAM device. 9. For command/address input slew rate >= 1.0 V/ns. Slew rate is measured between VOH (AC) and VOL (AC). 10. For command/address input slew rate >= 0.5 V/ns and < 1.0 V/ns. Slew rate is measured between VOH (AC) and VOL (AC). 11. CK/CK slew rates are >= 1.0 V/ns. 12. These parameters guarantee device timing, but they are not necessarily tested on each device, and they may be guaranteed by design or tester characterization. 13. For each of the terms in parentheses, if not already an integer, round to the next highest integer. t CK is equal to the actual system clock cycle time. For example, for PC2100 at CL= 2.5, t DAL = (15ns/7.5ns) +(20ns/7.0ns) = 2 + 3 = 5. 14. An input setup and hold time derating table is used to increase t IS and t IH in the case where the input slew rate is below 0.5 V/ns. Input Slew Rate Delta (tIS) Delta (tIH) Unit Note 0.5 V/ns 0 0 ps 1, 2 0.4 V/ns +50 0 ps 1, 2 0.3 V/ns +100 0 ps 1, 2 1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC), similarly for rising transitions. 2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. 15. An input setup and hold time derating table is used to increase t DS and t DH in the case where the I/O slew rate is below 0.5 V/ns. Input Slew Rate Delta (tDS) Delta (tDH) Unit Note 0.5 V/ns 0 0 ps 1, 2 0.4 V/ns +75 +75 ps 1, 2 0.3 V/ns +150 +150 ps 1, 2 1. I/O slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC), similarly for rising transitions. 2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. 16. An I/O Delta Rise, Fall Derating table is used to increase t DS and t DH in the case where DQ, DM, and DQS slew rates differ. Delta Rise and Fall Rate Delta (tDS) Delta (tDH) Unit Note 0.0 ns/V 0 0 ps 1-4 0.25 ns/V +50 +50 ps 1-4 0.5 ns/V +100 +100 ps 1-4 1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC), similarly for rising transitions. 2. Input slew rate is based on the larger of AC to AC delta rise, fall rate and DC to DC delta rise, fall rate. 3. The delta rise, fall rate is calculated as: [1/(slew rate 1)] - [1/(slew rate 2)] For example: slew rate 1 = 0.5 V/ns; slew rate 2 = 0.4 V/ns. Delta rise, fall = (1/0.5) - (1/0.4) [ns/V] = -0.5 ns/V Using the table above, this would result in an increase in t DS and t DH of 100 ps. 4. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. REV 1.1 08/2002 13 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Package Dimensions FRONT 133.35 5.250 17.80 0.700 31.75 1.250 10.0 0.394 (2x)4.00 0.157 128.93 5.076 Detail A 2.30 0.91 2.50 0.098 Detail B Side BACK 3.18 0.125 MAX Detail A 1.27+/- 0.10 0.050 +/- 0.004 3.80 0.150 4.00 0.157 Detail B 1.00 Width 0.039 6.35 0.250 1.27 Pitch 0.05 1.80 0.071 Note: All dimensions are typical with tolerances of +/- 0.15 (0.006) unless otherwise stated. Units: Millimeters (Inches) REV 1.1 08/2002 14 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S88ABG 256MB : 32M x 64 PC2700 Unbuffered DIMM Revision Log Rev Date 1.0 07/2002 Official Release 1.1 08/2002 Added tolerance specification of +/- 0.15 to Package Dimensions REV 1.1 08/2002 Modification 15 (c) NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.