POE International Corp
M01-00-E-07
SPECIFICATION OF GENERAL PURPOSE CHIP RESISTOR
Ver: 1
Page: 5 of 7
CATALOGUE NUMBERS
The resistors have a catalogue number starting with .
WR10 X 4702 J T _
Size code
WR10: 1210
Type code
X : Thick
film, 10R
~ 1M
W: < 10R ;
> 1M0
Resistance code
E96 +E24:
3 significant digits followed by no.
of zeros
102Ω =1020
37.4KΩ =3742
220Ω =2200
Tolerance
J: ± 5%
F: ± 1%
P: Jumper
Packaging code
T: 7” Reeled taping
Termination code
_ = SnPb base (“_”
means a blank)
L = Sn base (lead
free)
n Reeled tape packaging : 8mm width paper taping 5000pcs per 7” reel.
TEST AND REQUIREMENTS
Basic specification : JIS C 5202 / IEC 60115-1
The tests are carried out in accordance with IEC publication 68, "Recommended basic climatic and mechanical
robustness testing procedure for electronic components" and under standard atmospheric conditions according
to IEC 68-1, subclause 5.3, unless otherwise specified.
Temperature: 15ºC to 35ºC.
Relative humidity: 45% to 75%.
Air pressure: 86kPa to 106 kPa (860 mbar to 1060 mbar).
TEST PROCEDURE REQUIREMENT
Temperature
Coefficient of
Resistance (TCR )
Natural resistance change per change in degree centigrade.
( )
6
121
12 10×
−
ttR RR (ppm/°C)
R1 : Resistance at reference temperature
R2 : Resistance at test temperature
t1 : 25°C
Test temperature –55~+155°C
10R ~ 1M0, ≤ ± 100 ppm/°C
< 10R; > 1M0, ≤ ± 200 ppm/°C
Short time overload
(STOL ) Permanent resistance change after a 5second application of
a voltage 2.5 times RCWV or the maximum overload voltage
specified in the above list, whichever is less.
∆R/R max. ±(2%+0.1Ω)
Resistance to
soldering heat Unmounted chips 10±1 seconds, 260±5ºC no visible damage
∆ R/R max. ±(1%+0.05Ω)
Solderability Termination Sn base (lead free) : Unmounted chip
completely immersed in a lead free solder bath, 245°C±5°C,
3±1 sec
good tinning (>95% covered)
no visible damage
Temperature cycling
1. 30 minutes at -55°C±3°C,
2. 2~3 minutes at room temperature,
3. 30 minutes at +155°±3°C,
4. 2~3 minutes at room temperature,
Total 5 continuous cycles
no visible damage
∆R/R max. ±(1%+0.05Ω)