Products and specifications discussed herein are subject to change by Micron without notice.
Embedded USB Mass Storage Drive (e130)
Features
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eusb_130_embedded.fm - Rev. F 5/10 EN 1©2007 Micron Technology, Inc. All rights reserved.
RealSSD™ Embedded USB
Mass Storage Drive (e130)
MTFDCAE001SAF, MTFDCAE002SAF,
MTFDCAE004SAF, MTFDCAE008SAF
Features
•Micron
® NAND Flash
Interface: Universal Serial Bus (USB) Specification,
Revision 2.0
•USB support
USB Specification, Revisions 2.0, 1.1
USB Mass Storage Class Specification, Revision 1.0
•Performance
Sequential READ: 33 MB/s1
Sequential WRITE: 22 MB/s1
Reliability: 4 million operating hours mean time
between failures (MTBF)
Endurance: useful operating life of at least 5 years
under the following conditions:
8760 power-on hours per year
Active 100% of power-on hours
Typical operating conditio ns2
•1GB module8 GB/day
2GB module—16 GB/day
4GB module—32 GB/day
8GB module—64 GB/day
S tatic and dynamic wear-leveling
8-symbol error correction code (ECC)
Password protection
•Reliability reporting
Options
Capacity (unformatted): 1GB, 2GB, 4GB, or 8GB3
Form factor
Standard (36.9mm x 26.6mm x 9.6mm)
Voltage: 5V ±5%
Operating temper ature
Commercial (0°C to +70°C)
Industrial (–40°C to +8 C)
Notes: 1. Typical transfer rate measured with
H2BENCH 3.6.
2. Assumes that 70% of total usable drive
capacity contains static files.
3. 1GB = 1 billion bytes; formatted capaci ty is
less.
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eusb_130_embedded.fm - Rev. F 5/10 EN 2©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
Part Numbering Information
Part Numbering Information
Micron RealSSD embedded USB drives are available in sever al confi gur ations and densi-
ties. Visit micron.com for a list of valid part numbers.
Figure 1: Part Number Chart
MT FD C AE 002 S AF -1 B 1 IT ES
Micron Technology
Product Family
FD = Flash drive
Drive Interface
C = USB 2.0
Drive Form Factor
AE = Embedded USB: 36.9mm x 26.6mm x 9.6mm
Drive Density
001 = 1GB
002 = 2GB
004 = 4GB
008 = 8GB
NAND Flash Type
S = SLC
Product Family
AA = Option A
AB = Option B
AC = Option C
AD = Option D
AE = Option E
AF = Option F
Production Status
Blank = Production
ES = Engineering sample
MS = Mechanical sample
Operating Temperature Range
Blank = Commercial (0°C to +70°C)
IT = Industrial (–40°C to +85°C)
Revision
1 = 1st generation
2 = 2nd generation
3 = 3rd generation
NAND Component
B = 8Gb; x8; 3.3V
C = 16Gb; x8; 3.3V
D = 4Gb; x8; 3.3V
Firmware Revision
1 = 1st generation
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eusb_130_embedded.fm - Rev. F 5/10 EN 3©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
General Description
General Description
Microns RealSSD™ embedded universal serial bus (USB) mass storage drives provide
1GB, 2GB, 4GB, or 8GB of USB 2.0-compatible memory storage in a small form factor.
The embedded USB drive is an ideal solution for applications that require low cost and
high rel iab ility. Typical applications include PC caching and boot drives for embedded
computing, server, and networking systems.
High performance, reliability, and easy implementation make Mi crons RealSSD
embedded USBs an ideal storage solution. To consistently deliver the best possible
performance, the embedded USB uses only SLC NAND Flash, and all densities use two
x8 NAND channels to the controller. In addition to being fast, SLC NAND Flash offers
solid r eliabili ty, coupled with ECC and w ear -leveli ng. The USB system interface is widely
available in many system desi gns and is easy to implement, enabl ing rapid time to
market.
The embedded USB consists of two T SOP-packaged Micron NAND Flash components , a
USB controller, and a 10-pin USB connector on a PCB. Different densities are available
depending on the number of die in each package and the density of each NAND Flash
die (see Figure2). The drive operates at 5V ±5%. It uses industry-standard 10-pin
connectors and supports USB S pecification, R evi sion 2.0. It is also backwar d compatible
with Revision 1.1 and can be used with operati n g systems that support USB Mass
Storage Class Specification, Revision 1.0.
Figure 2: Functional Block Diagram
USB
controller
Channel 1
Channel 1
Channel 2
NAND data bus
NAND data bus
NAND command
USB
connector
Micron
NAND Flash
Micron
NAND Flash
USB protocol
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eusb_130_embedded.fm - Rev. F 5/10 EN 4©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
General Description
Figure 3: Pin Assignments: 2 x 5 Connector
Notes: 1. Diagram not to scale.
Table 1: Nominal Package Dimensions, Density, and Weight
Dimension Value Unit
Height 9.6 mm
Width 26.6 mm
Length 36.9 mm
Density 1, 2, 4, 8 GB
Maximum uni t weight 4.5 g
Table 2: Signal/Pin Descriptions
Symbol Type Function
USB data (+),
USB data (–) I/O Data inputs/outputs: The bidirectional I/Os transfer address, data, and instruction
information. Data is output only during READ operations; at other times the I/Os are inputs.
Vcc Supply Vcc power supply pin.
Vss Supply Vss ground connection.
NC No connect: NC pins are not internal ly connected. These pins can be driven or left floating .
NC GND USB USB Vcc
data data (+5V)
(+) (–)
NC NC NC NC NC
10 8 6 4 2
9 7 5 3 1
Top view (through PCB) Bottom view
Vcc USB USB GND NC
(+5V) data data
(–) (+)
NC NC NC NC NC
2 4 6 8 10
1 3 5 7 9
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eusb_130_embedded.fm - Rev. F 5/10 EN 5©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
Error Management
Error Management
The RealSSD embedded USB incorporates advanced technology for defect and error
management. It uses various combinations of hardware-based error correction algo-
rithms and firmware-based wear-leveling algorithms.
Over the life of the drive, uncorr ectable errors may occur. An uncorrectable error is
defined as data that is reported as successfully programmed to the drive , but when it is
read out of the drive , the data differs from what was programmed. See Table 4 for the
uncorrectable bit error rate.
The mean time between failures (MTBF) can be predicted based on component reli-
ability data obtained by following the methods referenced in the Telecordia SR-332 reli-
ability prediction procedures for electronic equipment.
Notes: 1. BER is measured with a WRITE-to-READ ratio of 1:1.
Electrical Characteristics
S tresses greater than those listed may cause permanent damage to the drive. This is a
stress rating only, and functional operation of the drive at these or any other conditions
above those indicate d in the operational sections of this spe c ification is not implie d.
Exposure to absolute maximum rating conditions for extended periods may affect reli-
ability.
Table 3: System Reliabilit y
Density MTBF (Operating Hours)
1GB 4.8 million
2GB 4.7 million
4GB 4.4 million
8GB 4.0 million
Table 4: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate (BER)1Operation
<1 bit error in 1015 bits READ
Table 5: Absolute Maximum Ratings
Parameter/Condition Symbol Min Max Unit
Vcc supply voltage Vcc –0.6 5.25 V
Table 6: DC and Operating Characteristics
Parameter Symbol Min Typ Max Unit Condition
Standby current Isb 50 60 mA Vcc = 5V
Active current Icc1 100 120 mA Vcc = 5V
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eusb_130_embedded.fm - Rev. F 5/10 EN 6©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
Compliance
Compliance Micron RealSSD embedded USB drives comply with the following requirements:
CE (Europe): EN55022, 2006 Class B and EN55024, 1998 + A1: 2001 + A2:2003
FCC: CFR Title 47, Part 15, ICES-003, all Class B
CSA (Canada): CSA 22.2 60950-1-07, 2nd Edition, 2007-03
UL (US): approval to UL-60950-1, 2nd Edition, 2007-03-27, IEC 60 950- 1:2005, 2nd
Edition
RoHS, “green” package
Mechanical Information
The 10-pin (2 x 5) female electrical connector has a height of 7.4mm, a pitch of 2.54 mm,
and supports the standard USB 2.0 interface. A mounting hole is also provided on the
PCB for a stable, r eliable connection to the mounting board.
The motherboard pin headers listed in Table 9 are compatible with Microns RealSSD
embedded USB drive s. Pin headers that are not listed may also be compatible.
Reference Documents
Reference documentation for the USB 2.0 standard (USB 2.0 specification, technical
documents, compliance tes t proce d ures, and other related documents) can be found at
www.usb.org/developers/docs.
Table 7: Recommended Operating Conditions
Parameter/Condition Symbol Min Typ Max Unit
Operating temperature Commercial TA0–70°C
Industrial –40 85 °C
Vcc supply voltage Vcc 4.75 5.00 5.25 V
Ground supply voltage Vss000V
Table 8: Shock and Vibration
Parameter/Condition Specification
Shock 500 G/1ms
Vibration 5–50Hz at 3.1G
Table 9: Compatible Pin Headers
Manufacturer Part Number Type
Pinrex 212-92-05GB01 SMT
210-92-05GB01 Straight
Amtek PHIFS25-205GB Press fit
PHIS25-205GB Straight
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
www.micron.com/productsupport Customer Comment Line: 800-932-4992
Micron, the Micron logo, and RealSSD are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein. Although
considered final, these specifications are subject to change, as further product development and data characterization sometimes occur.
Embedded USB Mass Storage Drive (e130)
Package Dimensions
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eusb_130_embedded.fm - Rev. F 5/10 EN 7©2007 Micron Technology, Inc. All rights reserved.
Package Dimensions
Figure 4: Embedded USB Package
Note: All dimensions are in millimeters.
3X Ø2.03 Ø3.2
2.87 4.9
2.95
2.45
1.2
1
7.4
1.2
9.6 ±0.1
2.54
2.54
20.7 ±0.25
36.9 ±0.25
31.16 ±0.25
25 ±0.25
27.5 ±0.25
26.6 ±0.25
20.7 ±0.25
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Embedded USB Mass Storage Drive (e130)
Revision History
Revision History
Rev. F, Production . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2/09
Updated “Compliance” section on page 6.
Added Max values to Table 5.
Rev. E, Production. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10/08
Re moved “Advance” from the document.
“Features” on page 1: added “Password Protecti onand “Reliability Reporting”.
“Noteon page 1: removed Note 2 and adjusted references to the other notes.
Rev. D, Advance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8/08
Updated Table 8 on page 6. Removed “Operating” from both shock and vibration
under the Parameter/Condition column. Changed shock specification from 500
G/2ms to 500 G/1ms.
Rev. C, Advance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5/08
•Figure1: Part Number Chart on page2: Updated NAND component section.
Rev. B, Advance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5/08
Updated part numbers.
“Features” on page 1: Updated typical operating conditions, performance,
endurance.
Figure1: Part Number Chart on page 2: Updated for part number change.
“Mechanical Information” on page 6: Added second paragraph and Table 9.
Rev. A, Advance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12/07
•Initial release