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eusb_130_embedded.fm - Rev. F 5/10 EN 5©2007 Micron Technology, Inc. All rights reserved.
Embedded USB Mass Storage Drive (e130)
Error Management
Error Management
The RealSSD embedded USB incorporates advanced technology for defect and error
management. It uses various combinations of hardware-based error correction algo-
rithms and firmware-based wear-leveling algorithms.
Over the life of the drive, uncorr ectable errors may occur. An uncorrectable error is
defined as data that is reported as successfully programmed to the drive , but when it is
read out of the drive , the data differs from what was programmed. See Table 4 for the
uncorrectable bit error rate.
The mean time between failures (MTBF) can be predicted based on component reli-
ability data obtained by following the methods referenced in the Telecordia SR-332 reli-
ability prediction procedures for electronic equipment.
Notes: 1. BER is measured with a WRITE-to-READ ratio of 1:1.
Electrical Characteristics
S tresses greater than those listed may cause permanent damage to the drive. This is a
stress rating only, and functional operation of the drive at these or any other conditions
above those indicate d in the operational sections of this spe c ification is not implie d.
Exposure to absolute maximum rating conditions for extended periods may affect reli-
ability.
Table 3: System Reliabilit y
Density MTBF (Operating Hours)
1GB 4.8 million
2GB 4.7 million
4GB 4.4 million
8GB 4.0 million
Table 4: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate (BER)1Operation
<1 bit error in 1015 bits READ
Table 5: Absolute Maximum Ratings
Parameter/Condition Symbol Min Max Unit
Vcc supply voltage Vcc –0.6 5.25 V
Table 6: DC and Operating Characteristics
Parameter Symbol Min Typ Max Unit Condition
Standby current Isb – 50 60 mA Vcc = 5V
Active current Icc1 – 100 120 mA Vcc = 5V