FN8085 Rev 8.00 Page 1 of 24
September 12, 2008
FN8085
Rev 8.00
September 12, 2008
ISL1208
I2C Real Time Clock/Calendar, Low Power RTC with Battery Backed SRAM
DATASHEET
The ISL1208 device is a low power real time clock with
timing and crystal compensation, clock/calendar, power fail
indicator, periodic or polled alarm, intelligent battery backup
switching and battery-backed user SRAM.
The oscillator uses an external, low-cost 32.768kHz crystal.
The real time clock tracks time with separate registers for
hours, minutes, and seconds. The device has calendar
registers for date, month, year and day of the week. The
calendar is accurate through 2099, with automatic leap year
correction.
Pinout
ISL1208
(8 LD MSOP, SOIC)
TOP VIEW
ISL1208
(8 LD TDFN)
TOP VIEW
Features
Real Time Clock/Calendar
- Tracks Time in Hours, Minutes, and Seconds
- Day of the Week, Day, Month, and Year
15 Selectable Frequency Outputs
Single Alarm
- Settable to the Second, Minute, Hour, Day of the Week,
Day, or Month
- Single Event or Pulse Interrupt Mode
Automatic Backup to Battery or Super Capacitor
Power Failure Detection
On-Chip Oscillator Compensation
2 Bytes Battery-Backed User SRAM
•I
2C Interface
- 400kHz Data Transfer Rate
400nA Battery Supply Current
Same Pin Out as ST M41Txx and Maxim DS13xx Devices
Small Package Options
- 8 Ld MSOP and SOIC Packages
- 8 Ld TDFN Package
Pb-Free Available (RoHS Compliant)
Applications
Utility Meters
HVAC Equipment
Audio/Video Components
Set-Top Box/Television
Modems
Network Routers, Hubs, Switches, Bridges
Cellular Infrastructure Equipment
Fixed Broadband Wireless Equipment
Pagers/PDA
POS Equipment
Test Meters/Fixtures
Office Automation (Copiers, Fax)
Home Appliances
Computer Products
Other Industrial/Medical/Automotive
1
2
3
4
8
7
X1
X2
VBAT
VDD
IRQ/FOUT
SCL
SDA
GND 5
6
2
3
4
1
7
6
5
8
X1
X2
VBAT
GND
VDD
IRQ/FOUT
SCL
SDA
ISL1208
FN8085 Rev 8.00 Page 2 of 24
September 12, 2008
.
Block Diagram
Ordering Information
PART NUMBER PART MARKING
VDD RANGE
(V)
TEMP. RANGE
(°C) PACKAGE PKG. DWG. #
ISL1208IU8 AGS 2.7 to 5.5 -40 to +85 8 Ld MSOP M8.118
ISL1208IU8-TK* AGS 2.7 to 5.5 -40 to +85 8 Ld MSOP Tape and
Reel
M8.118
ISL1208IU8Z (Note) ANW 2.7 to 5.5 -40 to +85 8 Ld MSOP (Pb-free) M8.118
ISL1208IU8Z-TK*
(Note)
ANW 2.7 to 5.5 -40 to +85 8 Ld MSOP
Tape and Reel
(Pb-free)
M8.118
ISL1208IB8 1208 I 2.7 to 5.5 -40 to +85 8 Ld SOIC MDP0027
ISL1208IB8-TK* 1208 I 2.7 to 5.5 -40 to +85 8 Ld SOIC Tape and Reel MDP0027
ISL1208IB8Z
(Note)
1208 ZI 2.7 to 5.5 -40 to +85 8 Ld SOIC (Pb-free) MDP0027
ISL1208IB8Z-TK*
(Note)
1208 ZI 2.7 to 5.5 -40 to +85 8 Ld SOIC
Tape andReel (Pb-free)
MDP0027
ISL1208IRT8Z
(Note)
08TZ 2.7 to 5.5 -40 to +85 8 Ld TDFN
(Pb-free)
L8.3x3A
ISL1208IRT8Z-TK*
(Note)
08TZ 2.7 to 5.5 -40 to +85 8 Ld TDFN
Tape and Reel (Pb-free)
L8.3x3A
*Please refer to TB347 for details on reel specifications.
NOTE: These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100%
matte tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil
Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
I2C
INTERFACE RTC
CONTROL
LOGIC
ALARM
FREQUENCY
OUT
RTC
DIVIDER
SDA
BUFFER
CRYSTAL
OSCILLATOR
POR
SWITCH
SCL
BUFFER
SDA
SCL
X1
X2
VDD
VBAT IRQ/
FOUT
INTERNAL
SUPPLY
VTRIP
SECONDS
MINUTES
HOURS
DAY OF WEEK
DATE
MONTH
YEAR
USER
SRAM
CONTROL
REGISTERS
ISL1208
FN8085 Rev 8.00 Page 3 of 24
September 12, 2008
Pin Descriptions
PIN
NUMBER SYMBOL DESCRIPTION
1 X1 The X1 pin is the input of an inverting amplifier and is intended to be connected to one pin of an external 32.768kHz quartz
crystal. X1 can also be driven directly from a 32.768kHz source.
2 X2 The X2 pin is the output of an inverting amplifier and is intended to be connected to one pin of an external 32.768kHz quartz
crystal.
3 VBAT This input provides a backup supply voltage to the device. VBAT supplies power to the device in the event that the VDD supply
fails. This pin should be tied to ground if not used.
4 GND Ground
5 SDA Serial Data (SDA) is a bidirectional pin used to transfer serial data into and out of the device. It has an open drain output and
may be wire OR’ed with other open drain or open collector outputs.
6 SCL The Serial Clock (SCL) input is used to clock all serial data into and out of the device.
7IRQ
/FOUT Interrupt Output/Frequency Output is a multi-functional pin that can be used as interrupt or frequency output pin. The function
is set via the configuration register.
8 VDD Power supply
ISL1208
FN8085 Rev 8.00 Page 4 of 24
September 12, 2008
Absolute Maximum Ratings Thermal Information
Voltage on VDD, VBAT
, SCL, SDA, and IRQ Pins (Note 3)
(respect to GND) . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7.0V
Voltage on X1 and X2 Pins
(respect to GND) . . . . . . . . . . . . .-0.5V to VDD + 0.5 (VDD Mode)
-0.5V to VBAT + 0.5 (VBAT Mode)
Latchup (Note 4) ................Class II, Level B @ +85°C
Thermal Resistance (Typical, Note 1) JA (°C/W) JC (°C/W)
SOIC Package . . . . . . . . . . . . . . . . . . . 95 N/A
MSOP Package . . . . . . . . . . . . . . . . . . 128 N/A
TDFN Package (Note 2). . . . . . . . . . . . 53.7 2.8
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Pb-free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTES:
1. JA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
Tech Brief TB379.
2. For JC, the “case temp” location is the center of the exposed metal pad on the package underside.
3. The VDD and SDA pins should not be subjected to negative voltage while the VBAT pin is biased, otherwise latchup can result. See the
Applications section.
4. Jedec Class II pulse conditions and failure criterion used. Level B exceptions are using a negative pulse limited to -0.5V.
DC Operating Characteristics – RTC Temperature = -40°C to +85°C, unless otherwise stated.
SYMBOL PARAMETER CONDITIONS NOTES
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9) UNITS
VDD Main Power Supply 2.7 5.5 V
VBAT Battery Supply Voltage 1.8 5.5 V
IDD1 Supply Current VDD = 5V 5, 6 2 6 µA
VDD = 3V 1.2 4 µA
IDD2 Supply Current With I2C Active VDD = 5V 5, 6 40 120 µA
IDD3 Supply Current (Low Power Mode) VDD = 5V, LPMODE = 1 5 1.4 5 µA
IBAT Battery Supply Current VBAT = 3V 5 400 950 nA
ILI Input Leakage Current on SCL 100 nA
ILO I/O Leakage Current on SDA 100 nA
VTRIP VBAT Mode Threshold 1.6 2.2 2.6 V
VTRIPHYS VTRIP Hysteresis 10 30 75 mV
VBATHYS VBAT Hysteresis 15 50 100 mV
IRQ/FOUT
VOL Output Low Voltage VDD = 5V
IOL = 3mA
0.4 V
VDD = 2.7V
IOL = 1mA
0.4 V
Power-Down Timing Temperature = -40°C to +85°C, unless otherwise stated.
SYMBOL PARAMETER CONDITIONS NOTES
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9) UNITS
VDD SR- VDD Negative Slewrate 7 10 V/ms
Serial Interface Specifications Over the recommended operating conditions unless otherwise specified.
SYMBOL PARAMETER TEST CONDITIONS NOTES
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9) UNITS
SERIAL INTERFACE SPECS
VIL SDA and SCL Input Buffer LOW
Voltage
-0.3 0.3 x
VDD
V
ISL1208
FN8085 Rev 8.00 Page 5 of 24
September 12, 2008
VIH SDA and SCL Input Buffer HIGH
Voltage
0.7 x
VDD
VDD +
0.3
V
Hysteresis SDA and SCL Input Buffer
Hysteresis
0.05 x
VDD
V
VOL SDA Output Buffer LOW Voltage,
Sinking 3mA
00.4V
CPIN SDA and SCL Pin Capacitance TA = +25°C, f = 1MHz, VDD = 5V, VIN =0V,
VOUT = 0V
10, 11 10 pF
fSCL SCL Frequency 400 kHz
tIN Pulse width Suppression Time at
SDA and SCL Inputs
Any pulse narrower than the max spec is
suppressed.
50 ns
tAA SCL Falling Edge to SDA Output
Data Valid
SCL falling edge crossing 30% of VDD, until
SDA exits the 30% to 70% of VDD window.
900 ns
tBUF Time the Bus Must Be Free Before
the Start of a New Transmission
SDA crossing 70% of VDD during a STOP
condition, to SDA crossing 70% of VDD
during the following START condition.
1300 ns
tLOW Clock LOW Time Measured at the 30% of VDD crossing. 1300 ns
tHIGH Clock HIGH Time Measured at the 70% of VDD crossing. 600 ns
tSU:STA START Condition Setup Time SCL rising edge to SDA falling edge. Both
crossing 70% of VDD.
600 ns
tHD:STA START Condition Hold Time From SDA falling edge crossing 30% of VDD
to SCL falling edge crossing 70% of VDD.
600 ns
tSU:DAT Input Data Setup Time From SDA exiting the 30% to 70% of VDD
window, to SCL rising edge crossing 30% of
VDD
100 ns
tHD:DAT Input Data Hold Time From SCL falling edge crossing 30% of VDD
to SDA entering the 30% to 70% of VDD
window.
20 900 ns
tSU:STO STOP Condition Setup Time From SCL rising edge crossing 70% of VDD,
to SDA rising edge crossing 30% of VDD.
600 ns
tHD:STO STOP Condition Hold Time From SDA rising edge to SCL falling edge.
Both crossing 70% of VDD.
600 ns
tDH Output Data Hold Time From SCL falling edge crossing 30% of VDD,
until SDA enters the 30% to 70% of VDD
window.
0ns
tRSDA and SCL Rise Time From 30% to 70% of VDD 10, 11 20 +
0.1 x Cb
300 ns
tFSDA and SCL Fall Time From 70% to 30% of VDD 10, 11 20 +
0.1 x Cb
300 ns
Cb Capacitive Loading of SDA or SCL Total on-chip and off-chip 10, 11 10 400 pF
Rpu SDA and SCL Bus Pull-Up
Resistor Off-Chip
Maximum is determined by tR and tF
.
For Cb = 400pF, max is about 2kto~2.5k.
For Cb = 40pF, max is about 15kto ~20k
10, 11 1 k
NOTES:
5. IRQ and FOUT Inactive.
6. LPMODE = 0 (default).
7. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
8. Typical values are for T = +25°C and 3.3V supply voltage.
9. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.
10. Parameter is not 100% tested.
11. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate specification.
Serial Interface Specifications Over the recommended operating conditions unless otherwise specified. (Continued)
SYMBOL PARAMETER TEST CONDITIONS NOTES
MIN
(Note 9)
TYP
(Note 8)
MAX
(Note 9) UNITS
ISL1208
FN8085 Rev 8.00 Page 6 of 24
September 12, 2008
SDA vs SCL Timing
Symbol Table
tSU:STO
tDH
tHIGH
tSU:STA
tHD:STA
tHD:DAT
tSU:DAT
SCL
SDA
(INPUT TIMING)
SDA
(OUTPUT TIMING)
tFtLOW
tBUF
tAA
tR
WAVEFORM INPUTS OUTPUTS
Must be steady Will be steady
May change
from LOW
to HIGH
Will change
from LOW
to HIGH
May change
from HIGH
to LOW
Will change
from HIGH
to LOW
Don’t Care:
Changes Allowed
Changing:
State Not Known
N/A Center Line is
High Impedance
ISL1208
FN8085 Rev 8.00 Page 7 of 24
September 12, 2008
Typical Performance Curves Temperature is +25°C unless otherwise specified
FIGURE 1. IBAT vs VBAT FIGURE 2. IBAT vs TEMPERATURE AT VBAT = 3V
FIGURE 3. IDD1 vs TEMPERATURE FIGURE 4. IDD1 vs VCC WITH LPMODE ON AND OFF
FIGURE 5. IDD1 vs FOUT AT VDD = 3.3V FIGURE 6. IDD1 vs FOUT AT VDD = 5V
000E+0
100E-9
200E-9
300E-9
400E-9
500E-9
600E-9
700E-9
800E-9
900E-9
1E-6
1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
VBAT (V)
IBAT (A)
000E+0
200E-9
400E-9
600E-9
800E-9
1E-6
-40-200 20406080
TEMPERATURE (°C)
IBAT (A)
1.0E-06
1.2E-06
1.4E-06
1.6E-06
1.8E-06
2.0E-06
2.2E-06
2.4E-06
-40-200 20406080
TEMPERATURE (°C)
IDD1 (A)
VCC = 5V
VCC = 3.3V
400.0E-9
600.0E-9
800.0E-9
1.0E-6
1.2E-6
1.4E-6
1.6E-6
1.8E-6
2.0E-6
2.2E-6
2.4E-6
2.5 3.0 3.5 4.0 4.5 5.0 5.5
VCC (V)
LPMODE = 0
LPMODE = 1
IDD1 (A)
1.2E-6
1.3E-6
1.4E-6
1.5E-6
1.6E-6
1.7E-6
1.8E-6
1.9E-6
2.0E-6
2.1E-6
FOUT (Hz)
1/8
2
8
32
1024
32768
1/2
1/32
1/16
1/4
1
4
16
64
4096
IDD1 (A)
1.8E-6
1.9E-6
2.0E-6
2.1E-6
2.2E-6
2.3E-6
2.4E-6
2.5E-6
2.6E-6
2.7E-6
2.8E-6
2.9E-6
3.0E-6
FOUT (Hz)
1/8
2
8
32
1024
32768
1/2
1/32
1/16
1/4
1
4
16
64
4096
IDD1 (A)
ISL1208
FN8085 Rev 8.00 Page 8 of 24
September 12, 2008
General Description
The ISL1208 device is a low power real time clock with timing
and crystal compensation, clock/calendar, power fail indicator,
periodic or polled alarm, intelligent battery backup switching,
and battery-backed user SRAM.
The oscillator uses an external, low-cost 32.768kHz crystal.
The real time clock tracks time with separate registers for
hours, minutes, and seconds. The device has calendar
registers for date, month, year and day of the week. The
calendar is accurate through 2099, with automatic leap year
correction.
The ISL1208's powerful alarm can be set to any clock/calendar
value for a match. For example, every minute, every Tuesday
or at 5:23 AM on March 21. The alarm status is available by
checking the Status Register, or the device can be configured
to provide a hardware interrupt via the IRQ pin. There is a
repeat mode for the alarm allowing a periodic interrupt every
minute, every hour, every day, etc.
The device also offers a backup power input pin. This VBAT pin
allows the device to be backed up by battery or Super
Capacitor with automatic switchover from VDD to VBAT
. The
entire ISL1208 device is fully operational from 2.0V to 5.5V and
the clock/calendar portion of the device remains fully
operational down to 1.8V (Standby Mode).
Pin Description
X1, X2
The X1 and X2 pins are the input and output, respectively, of
an inverting amplifier. An external 32.768kHz quartz crystal is
used with the ISL1208 to supply a timebase for the real time
clock. Internal compensation circuitry provides high accuracy
over the operating temperature range from -40°C to +85°C.
This oscillator compensation network can be used to calibrate
the crystal timing accuracy over temperature either during
manufacturing or with an external temperature sensor and
microcontroller for active compensation. The device can also
be driven directly from a 32.768kHz source at pin X1.
VBAT
This input provides a backup supply voltage to the device.
VBAT supplies power to the device in the event that the VDD
supply fails. This pin can be connected to a battery, a Super
Cap or tied to ground if not used.
IRQ/fOUT (Interrupt Output/Frequency Output)
This dual function pin can be used as an interrupt or frequency
output pin. The IRQ/FOUT mode is selected via the frequency
out control bits of the control/status register.
Interrupt Mode. The pin provides an interrupt signal output.
This signal notifies a host processor that an alarm has
occurred and requests action. It is an open drain active low
output.
Frequency Output Mode. The pin outputs a clock signal
which is related to the crystal frequency. The frequency
output is user selectable and enabled via the I2C bus. It is an
open drain active low output.
Serial Clock (SCL)
The SCL input is used to clock all serial data into and out of the
device. The input buffer on this pin is always active (not gated).
It is disabled when the backup power supply on the VBAT pin is
activated to minimize power consumption.
Serial Data (SDA)
SDA is a bidirectional pin used to transfer data into and out of
the device. It has an open drain output and may be ORed with
other open drain or open collector outputs. The input buffer is
always active (not gated) in normal mode.
An open drain output requires the use of a pull-up resistor. The
output circuitry controls the fall time of the output signal with
the use of a slope controlled pull-down. The circuit is designed
for 400kHz I2C interface speeds. It is disabled when the
backup power supply on the VBAT pin is activated.
VDD, GND
Chip power supply and ground pins. The device will operate
with a power supply from 2.0V to 5.5VDC. A 0.1µF capacitor is
recommended on the VDD pin to ground.
Functional Description
Power Control Operation
The power control circuit accepts a VDD and a VBAT input.
Many types of batteries can be used with Intersil RTC
products. For example, 3.0V or 3.6V Lithium batteries are
appropriate, and battery sizes are available that can power the
FIGURE 7. STANDARD OUTPUT LOAD FOR TESTING THE
DEVICE WITH VDD = 5.0V
SDA
AND
IRQ/fOUT
1533
100pF
5.0V
FOR VOL= 0.4V
AND IOL = 3mA
EQUIVALENT AC OUTPUT LOAD CIRCUIT FOR VDD = 5V
FIGURE 8. RECOMMENDED CRYSTAL CONNECTION
X1
X2
ISL1208
FN8085 Rev 8.00 Page 9 of 24
September 12, 2008
ISL1208 for up to 10 years. Another option is to use a Super
Cap for applications where VDD is interrupted for up to a
month. See the “Application Section” on page 18 for more
information.
Normal Mode (VDD) to Battery Backup Mode (VBAT)
To transition from the VDD to VBAT mode, both of the following
conditions must be met:
Condition 1:
VDD < VBAT - VBATHYS
where VBATHYS 50mV
Condition 2:
VDD < VTRIP
where VTRIP 2.2V
Battery Backup Mode (VBAT) to Normal Mode (VDD)
The ISL1208 device will switch from the VBAT to VDD mode
when one of the following conditions occurs:
Condition 1:
VDD > VBAT + VBATHYS
where VBATHYS 50mV
Condition 2:
VDD > VTRIP + VTRIPHYS
where VTRIPHYS 30mV
These power control situations are illustrated in Figures 9 and
10.
The I2C bus is deactivated in battery backup mode to provide
lower power. Aside from this, all RTC functions are operational
during battery backup mode. Except for SCL and SDA, all the
inputs and outputs of the ISL1208 are active during battery
backup mode unless disabled via the control register. The User
SRAM is operational in battery backup mode down to 2V.
Power Failure Detection
The ISL1208 provides a Real Time Clock Failure Bit (RTCF) to
detect total power failure. It allows users to determine if the
device has powered up after having lost all power to the device
(both VDD and VBAT).
Low Power Mode
The normal power switching of the ISL1208 is designed to
switch into battery backup mode only if the VDD power is lost.
This will ensure that the device can accept a wide range of
backup voltages from many types of sources while reliably
switching into backup mode. Another mode, called Low Power
Mode, is available to allow direct switching from VDD to VBAT
without requiring VDD to drop below VTRIP
. Since the
additional monitoring of VDD vs VTRIP is no longer needed,
that circuitry is shut down and less power is used while
operating from VDD. Power savings are typically 600nA at VDD
= 5V. Low Power Mode is activated via the LPMODE bit in the
control and status registers.
Low Power Mode is useful in systems where VDD is normally
higher than VBAT at all times. The device will switch from VDD
to VBAT when VDD drops below VBAT
, with about 50mV of
hysteresis to prevent any switchback of VDD after switchover.
In a system with a VDD = 5V and backup lithium battery of
VBAT = 3V, Low Power Mode can be used. However, it is not
recommended to use Low Power Mode in a system with VDD =
3.3V ±10%, VBAT 3.0V, and when there is a finite I-R voltage
drop in the VDD line.
InterSeal™ Battery Saver
The ISL1208 has the InterSeal™ Battery Saver which prevents
initial battery current drain before it is first used. For example,
battery-backed RTCs are commonly packaged on a board with
a battery connected. In order to preserve battery life, the
ISL1208 will not draw any power from the battery source until
after the device is first powered up from the VDD source.
Thereafter, the device will switchover to battery backup mode
whenever VDD power is lost.
Real T ime Clock Operation
The Real Time Clock (RTC) uses an external 32.768kHz quartz
crystal to maintain an accurate internal representation of second,
minute, hour, day of week, date, month, and year. The RTC also
has leap-year correction. The clock also corrects for months
having fewer than 31 days and has a bit that controls 24-hour or
AM/PM format. When the ISL1208 powers up after the loss of
both VDD and VBAT
, the clock will not begin incrementing until at
least one byte is written to the clock register.
VBAT - VBATHYS
VBAT
VBAT + VBATHYS
BATTERY BACKUP
MODE
VDD
VTRIP 2.2V
1.8V
FIGURE 9. BATTERY SWITCHOVER WHEN VBAT < VTRIP
FIGURE 10. BATTERY SWITCHOVER WHEN VBAT > VTRIP
VTRIP
VBAT
VTRIP + VTRIPHYS
BATTERY BACKUP
MODE
VDD
VTRIP
3.0V
2.2V
ISL1208
FN8085 Rev 8.00 Page 10 of 24
September 12, 2008
Accuracy of the Real Time Clock
The accuracy of the Real Time Clock depends on the
frequency of the quartz crystal that is used as the time base for
the RTC. Since the resonant frequency of a crystal is
temperature dependent, the RTC performance will also be
dependent upon temperature. The frequency deviation of the
crystal is a function of the turnover temperature of the crystal
from the crystal’s nominal frequency. For example, a ~20ppm
frequency deviation translates into an accuracy of ~1 minute
per month. These parameters are available from the crystal
manufacturer. The ISL1208 provides on-chip crystal
compensation networks to adjust load capacitance to tune
oscillator frequency from -94ppm to +140ppm. For more
detailed information. See “Application Section” on page 18.
Single Event and Interrupt
The alarm mode is enabled via the ALME bit. Choosing single
event or interrupt alarm mode is selected via the IM bit. Note
that when the frequency output function is enabled, the alarm
function is disabled.
The standard alarm allows for alarms of time, date, day of the
week, month, and year. When a time alarm occurs in single
event mode, an IRQ pin will be pulled low and the alarm
status bit (ALM) will be set to “1”.
The pulsed interrupt mode allows for repetitive or recurring
alarm functionality. Hence, once the alarm is set, the device
will continue to alarm for each occurring match of the alarm
and present time. Thus, it will alarm as often as every minute (if
only the nth second is set) or as infrequently as once a year (if
at least the nth month is set). During pulsed interrupt mode, the
IRQ pin will be pulled low for 250ms and the alarm status bit
(ALM) will be set to “1”.
NOTE: The ALM bit can be reset by the user or cleared automatically
using the auto reset mode (see ARST bit).
The alarm function can be enabled/disabled during battery
backup mode using the FOBATB bit. For more information on
the alarm, See “Alarm Registers” on page 14.
Frequency Output Mode
The ISL1208 has the option to provide a frequency output
signal using the IRQ/FOUT pin. The frequency output mode is
set by using the FO bits to select 15 possible output frequency
values from 0kHz to 32kHz. The frequency output can be
enabled/disabled during battery backup mode using the
FOBATB bit.
General Purpose User SRAM
The ISL1208 provides 2 bytes of user SRAM. The SRAM will
continue to operate in battery backup mode. However, it
should be noted that the I2C bus is disabled in battery backup
mode.
I2C Serial Interface
The ISL1208 has an I2C serial bus interface that provides
access to the control and status registers and the user SRAM.
The I2C serial interface is compatible with other industry I2C
serial bus protocols using a bidirectional data signal (SDA) and
a clock signal (SCL).
Oscillator Comp en sat io n
The ISL1208 provides the option of timing correction due to
temperature variation of the crystal oscillator for either
manufacturing calibration or active calibration. The total
possible compensation is typically -94ppm to +140ppm. Two
compensation mechanisms that are available are as follows:
1. An analog trimming (ATR) register that can be used to
adjust individual on-chip digital capacitors for oscillator
capacitance trimming. The individual digital capacitor is
selectable from a range of 9pF to 40.5pF (based upon
32.758kHz). This translates to a calculated compensation
of approximately -34ppm to +80ppm. (See ATR description
on page 18).
2. A digital trimming register (DTR) that can be used to adjust
the timing counter by ±60ppm. (See DTR description on
page 18).
Also provided is the ability to adjust the crystal capacitance
when the ISL1208 switches from VDD to battery backup mode.
See “Battery Backup Mode (VBAT) to Normal Mode (VDD)” on
page 9.
Register Descriptions
The battery-backed registers are accessible following a slave
byte of “1101111x” and reads or writes to addresses [00h:13h].
The defined addresses and default values are described in
Table 1. Address 09h is not used. Reads or writes to 09h will
not affect operation of the device but should be avoided.
REGISTER ACCESS
The contents of the registers can be modified by performing a
byte or a page write operation directly to any register address.
The registers are divided into 4 sections. These are:
1. Real Time Clock (7 bytes): Address 00h to 06h.
2. Control and Status (5 bytes): Address 07h to 0Bh.
3. Alarm (6 bytes): Address 0Ch to 11h.
4. User SRAM (2 bytes): Address 12h to 13h.
There are no addresses above 13h.
ISL1208
FN8085 Rev 8.00 Page 11 of 24
September 12, 2008
Write capability is allowable into the RTC registers (00h to 06h)
only when the WRTC bit (bit 4 of address 07h) is set to “1”. A
multi-byte read or write operation is limited to one section
per operation. Access to another section requires a new
operation. A read or write can begin at any address within the
section.
A register can be read by performing a random read at any
address at any time. This returns the contents of that register
location. Additional registers are read by performing a
sequential read. For the RTC and Alarm registers, the read
instruction latches all clock registers into a buffer, so an update
of the clock does not change the time being read. A sequential
read will not result in the output of data from the memory array.
At the end of a read, the master supplies a stop condition to
end the operation and free the bus. After a read, the address
remains at the previous address +1 so the user can execute a
current address read and continue reading the next register.
It is not necessary to set the WRTC bit prior to writing into the
control and status, alarm, and user SRAM registers.
TABLE 1. REGISTER MEMORY MAP
ADDR. SECTION
REG
NAME
BIT
RANGE DEFAULT 76543210
00h
RTC
SC 0 SC22 SC21 SC20 SC13 SC12 SC11 SC10 0 to 59 00h
01h MN 0 MN22 MN21 MN20 MN13 MN12 MN11 MN10 0 to 59 00h
02h HR MIL 0 HR21 HR20 HR13 HR12 HR11 HR10 0 to 23 00h
03h DT 0 0 DT21 DT20 DT13 DT12 DT11 DT10 1 to 31 00h
04h MO 0 0 0 MO20 MO13 MO12 MO11 MO10 1 to 12 00h
05h YR YR23 YR22 YR21 YR20 YR13 YR12 YR11 YR10 0 to 99 00h
06h DW00000DW2DW1DW00 to 600h
07h
Control
and
Status
SR ARST XTOSCB Reserved WRTC Reserved ALM BAT RTCF N/A 01h
08h INT IM ALME LPMODE FOBATB FO3 FO2 FO1 FO0 N/A 00h
09h Reserved N/A 00h
0Ah ATR BMATR1 BMATR0 ATR5 ATR4 ATR3 ATR2 ATR1 ATR0 N/A 00h
0Bh DTR Reserved DTR2 DTR1 DTR0 N/A 00h
0Ch
Alarm
SCA ESCA ASC22 ASC21 ASC20 ASC13 ASC12 ASC11 ASC10 00 to 59 00h
0Dh MNA EMNA AMN22 AMN21 AMN20 AMN13 AMN12 AMN11 AMN10 00 to 59 00h
0Eh HRA EHRA 0 AHR21 AHR20 AHR13 AHR12 AHR11 AHR10 0 to 23 00h
0Fh DTA EDTA 0 ADT21 ADT20 ADT13 ADT12 ADT11 ADT10 1 to 31 00h
10h MOA EMOA 0 0 AMO20 AMO13 AMO12 AMO11 AMO10 1 to 12 00h
11h DWAEDWA0000ADW12ADW11ADW100 to 600h
12h
User
USR1 USR17 USR16 USR15 USR14 USR13 USR12 USR11 USR10 N/A 00h
13h USR2 USR27 USR26 USR25 USR24 USR23 USR22 USR21 USR20 N/A 00h
ISL1208
FN8085 Rev 8.00 Page 12 of 24
September 12, 2008
Real Time Clock Registers
Addresses [00h to 06h]
RTC REGISTERS (SC, MN, HR, DT, MO, YR, DW)
These registers depict BCD representations of the time. As
such, SC (Seconds) and MN (Minutes) range from 0 to 59, HR
(Hour) can either be a 12-hour or 24-hour mode, DT (Date) is 1
to 31, MO (Month) is 1 to 12, YR (Year) is 0 to 99, and DW
(Day of the Week) is 0 to 6.
The DW register provides a Day of the Week status and uses
three bits DW2 to DW0 to represent the seven days of the week.
The counter advances in the cycle 0-1-2-3-4-5-6-0-1-2-…
The assignment of a numerical value to a specific day of the
week is arbitrary and may be decided by the system software
designer. The default value is defined as “0”.
24 HOUR TIME
If the MIL bit of the HR register is “1”, the RTC uses a 24-hour
format. If the MIL bit is “0”, the RTC uses a 12-hour format and
HR21 bit functions as an AM/PM indicator with a “1”
representing PM. The clock defaults to 12-hour format time
with HR21 = “0”.
LEAP YEARS
Leap years add the day February 29 and are defined as those
years that are divisible by 4. Years divisible by 100 are not leap
years, unless they are also divisible by 400. This means that the
year 2000 is a leap year, the year 2100 is not. The ISL1208 does
not correct for the leap year in the year 2100.
Control and Status Registers
Addresses [07h to 0Bh]
The Control and Status Registers consist of the Status
Register, Interrupt and Alarm Register, Analog Trimming and
Digital Trimming Registers.
Status Register (SR)
The Status Register is located in the memory map at address
07h. This is a volatile register that provides either control or
status of RTC failure, battery mode, alarm trigger, write
protection of clock counter, crystal oscillator enable and auto
reset of status bits.
REAL TIME CLOCK FAIL BIT (RTCF)
This bit is set to a “1” after a total power failure. This is a read
only bit that is set by hardware (ISL1208 internally) when the
device powers up after having lost all power to the device (both
VDD and VBAT go to 0V). The bit is set regardless of whether
VDD or VBAT is applied first. The loss of only one of the
supplies does not set the RTCF bit to “1”. On power-up after a
total power failure, all registers are set to their default states
and the clock will not increment until at least one byte is written
to the clock register. The first valid write to the RTC section
after a complete power failure resets the RTCF bit to “0”
(writing one byte is sufficient).
BATTERY BIT (BAT)
This bit is set to a “1” when the device enters battery backup
mode. This bit can be reset either manually by the user or
automatically reset by enabling the auto-reset bit (see ARST
bit). A write to this bit in the SR can only set it to “0”, not “1”.
ALARM BIT (ALM)
These bits announce if the alarm matches the real time clock. If
there is a match, the respective bit is set to “1”. This bit can be
manually reset to “0” by the user or automatically reset by
enabling the auto-reset bit (see ARST bit). A write to this bit in
the SR can only set it to “0”, not “1”.
NOTE: An alarm bit that is set by an alarm occurring during an SR read
operation will remain set after the read operation is complete.
WRITE RTC ENABLE BIT (WRTC)
The WRTC bit enables or disables write capability into the RTC
Timing Registers. The factory default setting of this bit is “0”.
Upon initialization or power-up, the WRTC must be set to “1” to
enable the RTC. Upon the completion of a valid write (STOP),
the RTC starts counting. The RTC internal 1Hz signal is
synchronized to the STOP condition during a valid write cycle.
CRYSTAL OSCILLATOR ENABLE BIT (XTOSCB)
This bit enables/disables the internal crystal oscillator. When
the XTOSCB is set to “1”, the oscillator is disabled, and the X1
pin allows for an external 32kHz signal to drive the RTC. The
XTOSCB bit is set to “0” on power-up.
AUTO RESET ENABLE BIT (ARST)
This bit enables/disables the automatic reset of the BAT and
ALM status bits only. When ARST bit is set to “1”, these status
bits are reset to “0” after a valid read of the respective status
register (with a valid STOP condition). When the ARST is
cleared to “0”, the user must manually reset the BAT and ALM
bits.
Interrupt Control Register (INT)
TABLE 2. STATUS REGISTER (SR)
ADDR 7 6 5 4 3 2 1 0
07h ARST XTOSCB reserved WRTC reserved ALM BAT RTCF
Default00 000000
TABLE 3. INTERRUPT CONTROL REGISTER (INT)
ADDR7 6 5 4 3210
08h IM ALME LPMODE FOBATB FO3 FO2 FO1 FO0
Default 0 0 0 0 0 0 0 0
ISL1208
FN8085 Rev 8.00 Page 13 of 24
September 12, 2008
FREQUENCY OUT CONTROL BITS (FO <3:0>)
These bits enable/disable the frequency output function and
select the output frequency at the IRQ/fOUT pin. See Table 4
for frequency selection. When the frequency mode is enabled,
it will override the alarm mode at the IRQ/fOUT pin.
FREQUENCY OUTPUT AND INTERRUPT BIT (FOBATB)
This bit enables/disables the fOUT/IRQ pin during battery
backup mode (i.e. VBAT power source active). When the
FOBATB is set to “1” the fOUT/IRQ pin is disabled during
battery backup mode. This means that both the frequency
output and alarm output functions are disabled. When the
FOBATB is cleared to “0”, the fOUT/IRQ pin is enabled during
battery backup mode.
LOW POWER MODE BIT (LPMODE)
This bit enables/disables low power mode. With
LPMODE = “0”, the device will be in normal mode and the
VBAT supply will be used when VDD < VBAT - VBATHYS and
VDD < VTRIP
. With LPMODE = “1”, the device will be in low
power mode and the VBAT supply will be used when
VDD < VBAT -V
BATHYS. There is a supply current saving of
about 600nA when using LPMODE = “1” with VDD = 5V. (See
Typical Performance Curves on page 7: IDD vs VCC with
LPMODE ON and OFF.) Avoid setting the device into low
power mode with VDD < VBAT
, the I2C communications will
stop permanently. The VBAT input must be lowered below VDD
to resume communications.
ALARM ENABLE BIT (ALME)
This bit enables/disables the alarm function. When the ALME bit
is set to “1”, the alarm function is enabled. When the ALME is
cleared to “0”, the alarm function is disabled. The alarm function
can operate in either a single event alarm or a periodic interrupt
alarm (see IM bit).
NOTE: When the frequency output mode is enabled, the alarm function is
disabled.
INTERRUPT/ALARM MODE BIT (IM)
This bit enables/disables the interrupt mode of the alarm
function. When the IM bit is set to “1”, the alarm will operate in
the interrupt mode, where an active low pulse width of 250ms
will appear at the IRQ/fOUT pin when the RTC is triggered by
the alarm as defined by the alarm registers (0Ch to 11h). When
the IM bit is cleared to “0”, the alarm will operate in standard
mode, where the IRQ/fOUT pin will be tied low until the ALM
status bit is cleared to “0”.
Analog Trimming Register
ANALOG TRIMMING REGISTER (ATR<5:0>)
Six analog trimming bits, ATR0 to ATR5, are provided in order
to adjust the on-chip load capacitance value for frequency
compensation of the RTC. Each bit has a different weight for
capacitance adjustment. For example, using a Citizen CFS-
206 crystal with different ATR bit combinations provides an
estimated ppm adjustment range from -34ppm to +80ppm to
the nominal frequency compensation. The combination of
analog and digital trimming can give up to -94ppm to +140ppm
of total adjustment.
The effective on-chip series load capacitance, CLOAD, ranges
from 4.5pF to 20.25pF with a mid-scale value of 12.5pF
(default). CLOAD is changed via two digitally controlled
capacitors, CX1 and CX2, connected from the X1 and X2 pins
to ground (see Figure 11). The value of CX1 and CX2 are given
in Equation 1:
TABLE 4. FREQUENCY SELECTION OF fOUT PIN
FREQUENCY,
fOUT UNITS FO3 FO2 FO1 FO0
0 Hz0 000
32768 Hz 0 0 0 1
4096 Hz 0 0 1 0
1024 Hz 0 0 1 1
64 Hz0 100
32 Hz0 101
16 Hz0 110
8 Hz0 111
4 Hz1 000
2 Hz1 001
1 Hz1 010
1/2 Hz1 011
1/4 Hz1 100
1/8 Hz1 101
1/16 Hz 1 1 1 0
1/32 Hz 1 1 1 1
IM BIT INTERRUPT/ALARM FREQUENCY
0 Single Time Event Set By Alarm
1 Repetitive/Recurring Time Event Set By Alarm
FIGURE 11. DIAGRAM OF ATR
CX1
X1
X2
CRYSTAL
OSCILLATOR
CX2
CX16 b58b4 4b3 2b2 1b1 0.5b0 9++++++pF=(EQ. 1)
ISL1208
FN8085 Rev 8.00 Page 14 of 24
September 12, 2008
The effective series load capacitance is the combination of CX1
and CX2 in Equation 2.:
For example, CLOAD (ATR = 00000) = 12.5pF, CLOAD (ATR =
100000) = 4.5pF, and CLOAD (ATR = 011111) = 20.25pF. The
entire range for the series combination of load capacitance goes
from 4.5pF to 20.25pF in 0.25pF steps. Note that these are typical
values.
BATTERY MODE ATR SELECTION (BMATR <1:0>)
Since the accuracy of the crystal oscillator is dependent on the
VDD/VBAT operation, the ISL1208 provides the capability to
adjust the capacitance between VDD and VBAT when the
device switches between power sources.
DIGITAL TRIMMING REGISTER (DTR <2:0>)
The digital trimming bits DTR0, DTR1, and DTR2 adjust the
average number of counts per second and average the ppm
error to achieve better accuracy.
DTR2 is a sign bit. DTR2 = “0” means frequency
compensation is >0. DTR2 = “1” means frequency
compensation is <0.
DTR1 and DTR0 are both scale bits. DTR1 gives 40ppm
adjustment and DTR0 gives 20ppm adjustment.
A range from -60ppm to +60ppm can be represented by using
these three bits (see Table 5).
Alarm Registers
Addresses [0Ch to 11h]
The alarm register bytes are set up identical to the RTC
register bytes, except that the MSB of each byte functions as
an enable bit (enable = “1”). These enable bits specify which
alarm registers (seconds, minutes, etc.) are used to make the
comparison. Note that there is no alarm byte for year.
The alarm function works as a comparison between the alarm
registers and the RTC registers. As the RTC advances, the
alarm will be triggered once a match occurs between the alarm
registers and the RTC registers. Any one alarm register,
multiple registers, or all registers can be enabled for a match.
There are two alarm operation modes: Single Event and
periodic Interrupt Mode:
Single Event Mode is enabled by setting the ALME bit to
“1”, the IM bit to “0”, and disabling the frequency output. This
mode permits a one-time match between the alarm registers
and the RTC registers. Once this match occurs, the ALM bit
is set to “1” and the IRQ output will be pulled low and will
remain low until the ALM bit is reset. This can be done
manually or by using the auto-reset feature.
Interrupt Mode is enabled by setting the ALME bit to “1”, the
IM bit to “1”, and disabling the frequency output. The IRQ
output will now be pulsed each time an alarm occurs. This
means that once the interrupt mode alarm is set, it will
continue to alarm for each occurring match of the alarm and
present time. This mode is convenient for hourly or daily
hardware interrupts in microcontroller applications such as
security cameras or utility meter reading.
To clear an alarm, the ALM bit in the status register must be set
to “0” with a write. Note that if the ARST bit is set to 1 (address
07h, bit 7), the ALM bit will automatically be cleared when the
status register is read.
BMATR1 BMATR0
DELTA
CAPACITANCE
(CBAT TO CVDD)
0 0 0pF
0 1 -0.5pF ( +2ppm)
1 0 +0.5pF ( -2ppm)
1 1 +1pF ( -4ppm)
CLOAD
1
1
CX1
-----------1
CX2
-----------
+


-----------------------------------
=
CLOAD
16 b5
8 b4 4 b3 2 b2 1 b1 0.5 b0 9++++++
2
-----------------------------------------------------------------------------------------------------------------------------


pF
=
(EQ. 2)
TABLE 5. DIGITAL TRIMMING REGISTERS
DTR REGISTER ESTIMATED
FREQUENCY
PPMDTR2 DTR1 DTR0
0 0 0 0 (default)
001 +20
010 +40
011 +60
100 0
101 -20
110 -40
111 -60
ISL1208
FN8085 Rev 8.00 Page 15 of 24
September 12, 2008
Below are examples of both Single Event and periodic
Interrupt Mode alarms.
Example 1 – Alarm set with single interrupt (IM=”0”)
A single alarm will occur on January 1 at 11:30am.
A. Set Alarm registers as follows:
B. Also the ALME bit must be set as follows:
xx indicate other control bits
After these registers are set, an alarm will be generated when
the RTC advances to exactly 11:30am on January 1 (after
seconds changes from 59 to 00) by setting the ALM bit in the
status register to “1” and also bringing the IRQ output low.
Example 2 – Pulsed interrupt once per minute (IM=”1”)
Interrupts at one minute intervals when the seconds register is
at 30 seconds.
A. Set Alarm registers as follows:
B. Set the Interrupt register as follows:
xx indicate other control bits
Once the registers are set, the following waveform will be seen
at IRQ-:
Note that the status register ALM bit will be set each time the
alarm is triggered, but does not need to be read or cleared.
User Registers
Addresses [12h to 13h]
These registers are 2 bytes of battery-backed user memory
storage.
I2C Serial Interface
The ISL1208 supports a bidirectional bus oriented protocol.
The protocol defines any device that sends data onto the bus
as a transmitter and the receiving device as the receiver. The
device controlling the transfer is the master and the device
being controlled is the slave. The master always initiates data
transfers and provides the clock for both transmit and receive
operations. Therefore, the ISL1208 operates as a slave device
in all applications.
All communication over the I2C interface is conducted by
sending the MSB of each byte of data first.
Protocol Conventions
Data states on the SDA line can change only during SCL LOW
periods. SDA state changes during SCL HIGH are reserved for
indicating START and STOP conditions (See Figure 12). On
power-up of the ISL1208, the SDA pin is in the input mode.
All I2C interface operations must begin with a START
condition, which is a HIGH to LOW transition of SDA while SCL
is HIGH. The ISL1208 continuously monitors the SDA and SCL
lines for the START condition and does not respond to any
command until this condition is met (See Figure 12). A START
condition is ignored during the power-up sequence.
All I2C interface operations must be terminated by a STOP
condition, which is a LOW to HIGH transition of SDA while SCL
is HIGH (See Figure 12). A STOP condition at the end of a
read operation or at the end of a write operation to memory
only places the device in its standby mode.
An acknowledge (ACK) is a software convention used to
indicate a successful data transfer. The transmitting device,
either master or slave, releases the SDA bus after transmitting
eight bits. During the ninth clock cycle, the receiver pulls the
SDA line LOW to acknowledge the reception of the eight bits of
data (See Figure 13).
ALARM
REGISTER
BIT
DESCRIPTION76543210HEX
SCA 00000000 00hSeconds disabled
MNA 10110000 B0hMinutes set to 30,
enabled
HRA 10010001 91hHours set to 11,
enabled
DTA 10000001 81hDate set to 1,
enabled
MOA 10000001 81hMonth set to 1,
enabled
DWA 00000000 00hDay of week
disabled
CONTROL
REGISTER
BIT
DESCRIPTION76543210HEX
INT 01xx0000 x0hEnable Alarm
ALARM
REGISTER
BIT
DESCRIPTION76543210HEX
SCA 10110000B0hSeconds set to 30,
enabled
MNA 00000000 00hMinutes disabled
HRA 00000000 00hHours disabled
DTA 00000000 00hDate disabled
MOA 0000000000hMonth disabled
DWA 0000000000hDay of week disabled
CONTROL
REGISTER
BIT
DESCRIPTION76543210HEX
INT 11xx0000 x0hEnable Alarm and Int
Mode
60s
RTC AND ALARM REGISTERS ARE BOTH “30”s
ISL1208
FN8085 Rev 8.00 Page 16 of 24
September 12, 2008
The ISL1208 responds with an ACK after recognition of a
START condition followed by a valid Identification Byte, and
once again after successful receipt of an Address Byte. The
ISL1208 also responds with an ACK after receiving a Data
Byte of a write operation. The master must respond with an
ACK after receiving a Data Byte of a read operation.
FIGURE 12. VALID DATA CHANGES, START, AND STOP CONDITIONS
FIGURE 13. ACKNOWLEDGE RESPONSE FROM RECEIVER
FIGURE 14. BYTE WRITE SEQUENCE
SDA
SCL
START DATA DATA STOP
STABLE CHANGE
DATA
STABLE
SDA OUTPUT FROM
TRANSMITTER
SDA OUTPUT FROM
RECEIVER
81 9
START ACK
SCL FROM
MASTER
HIGH IMPEDANCE
HIGH IMPEDANCE
S
T
A
R
T
S
T
O
P
IDENTIFICATION
BYTE
DATA
BYTE
A
C
K
SIGNALS FROM
THE MASTER
SIGNALS FROM
THE ISL1208
A
C
K
10011
A
C
K
WRITE
SIGNAL AT SDA 0000111
ADDRESS
BYTE
ISL1208
FN8085 Rev 8.00 Page 17 of 24
September 12, 2008
Device Addressing
Following a start condition, the master must output a Slave
Address Byte. The 7 MSBs are the device identifier. These bits
are “1101111”. Slave bits “1101” access the register. Slave bits
“111” specify the device select bits.
The last bit of the Slave Address Byte defines a read or write
operation to be performed. When this R/W bit is a “1”, then a
read operation is selected. A “0” selects a write operation
(Refer to Figure 15).
After loading the entire Slave Address Byte from the SDA bus,
the ISL1208 compares the device identifier and device select
bits with “1101111”. Upon a correct compare, the device
outputs an acknowledge on the SDA line.
Following the Slave Byte is a one byte word address. The word
address is either supplied by the master device or obtained
from an internal counter. On power-up the internal address
counter is set to address 0h, so a current address read of the
CCR array starts at address 0h. When required, as part of a
random read, the master must supply the 1 Word Address
Bytes as shown in Figure 16.
In a random read operation, the slave byte in the “dummy
write” portion must match the slave byte in the “read” section.
For a random read of the Clock/Control Registers, the slave
byte must be 1101111x in both places.
Write Operation
A Write operation requires a START condition, followed by a
valid Identification Byte, a valid Address Byte, a Data Byte, and
a STOP condition. After each of the three bytes, the ISL1208
responds with an ACK. At this time, the I2C interface enters a
standby state.
Read Operation
A Read operation consists of a three byte instruction followed
by one or more Data Bytes (See Figure 16). The master
initiates the operation issuing the following sequence: a
START, the Identification byte with the R/W bit set to “0”, an
Address Byte, a second START, and a second Identification
byte with the R/W bit set to “1”. After each of the three bytes,
the ISL1208 responds with an ACK. Then the ISL1208
transmits Data Bytes as long as the master responds with an
ACK during the SCL cycle following the eighth bit of each byte.
The master terminates the read operation (issuing a STOP
condition) following the last bit of the last Data Byte (See
Figure 16).
The Data Bytes are from the memory location indicated by an
internal pointer. This pointer initial value is determined by the
Address Byte in the Read operation instruction, and
increments by one during transmission of each Data Byte.
After reaching the memory location 13h the pointer “rolls over”
to 00h, and the device continues to output data for each ACK
received.
FIGURE 15. SLAVE ADDRESS, WORD ADDRESS, AND DATA
BYTES
SLAVE
ADDRESS BYTE
D7 D6 D5 D2D4 D3 D1 D0
A0A7 A2A4 A3 A1
DATA BYTE
A6 A5
110 1
11R/W
1
WORD ADDRESS
FIGURE 16. READ SEQUENCE
SIGNALS
FROM THE
MASTER
SIGNALS FROM
THE SLAVE
SIGNAL AT
SDA
S
T
A
R
T
IDENTIFICATION
BYTE WITH
R/W = 0
ADDRESS
BYTE
A
C
K
A
C
K
0
S
T
O
P
A
C
K
1
IDENTIFICATION
BYTE WITH
R/W = 1
A
C
K
S
T
A
R
T
LAST READ
DATA BYTE
FIRST READ
DATA BYTE
A
C
K
101 1111 1011111
ISL1208
FN8085 Rev 8.00 Page 18 of 24
September 12, 2008
Application Section
Oscillator Crystal Requirements
The ISL1208 uses a standard 32.768kHz crystal. Either
through hole or surface mount crystals can be used. Table 6
lists some recommended surface mount crystals and the
parameters of each. This list is not exhaustive and other
surface mount devices can be used with the ISL1208 if their
specifications are very similar to the devices listed. The
crystal should have a required parallel load capacitance of
12.5pF and an equivalent series resistance of less than 50k.
The crystal’s temperature range specification should match the
application. Many crystals are rated for -10°C to +60°C
(especially through hole and tuning fork types), so an
appropriate crystal should be selected if extended temperature
range is required.
Crystal Oscillator Frequency Adjustment
The ISL1208 device contains circuitry for adjusting the
frequency of the crystal oscillator. This circuitry can be used to
trim oscillator initial accuracy as well as adjust the frequency to
compensate for temperature changes.
The Analog Trimming Register (ATR) is used to adjust the load
capacitance seen by the crystal. There are six bits of ATR
control, with linear capacitance increments available for
adjustment. Since the ATR adjustment is essentially “pulling”
the frequency of the oscillator, the resulting frequency changes
will not be linear with incremental capacitance changes. The
equations which govern pulling show that lower capacitor
values of ATR adjustment will provide larger increments. Also,
the higher values of ATR adjustment will produce smaller
incremental frequency changes. These values typically vary
from 6ppm to 10 ppm/bit at the low end to <1ppm/bit at the
highest capacitance settings. The range afforded by the ATR
adjustment with a typical surface mount crystal is typically -
34ppm to +80ppm around the ATR=0 default setting because
of this property. The user should note this when using the ATR
for calibration. The temperature drift of the capacitance used in
the ATR control is extremely low, so this feature can be used
for temperature compensation with good accuracy.
In addition to the analog compensation afforded by the
adjustable load capacitance, a digital compensation feature is
available for the ISL1208. There are 3 bits known as the Digital
Trimming Register (DTR). The range provided is ±60ppm in
increments of 20ppm. DTR operates by adding or skipping
pulses in the clock counter. It is very useful for coarse
adjustments of frequency drift over temperature or extending
the adjustment range available with the ATR register.
Initial accuracy is best adjusted by enabling the frequency
output (using the INT register, address 08h), and monitoring
the ~IRQ/fOUT pin with a calibrated frequency counter. The
frequency used is unimportant, although 1Hz is the easiest to
monitor. The gating time should be set long enough to ensure
accuracy to at least 1ppm. The ATR should be set to the center
position, or 100000Bh, to begin with. Once the initial
measurement is made, then the ATR register can be changed
to adjust the frequency. Note that increasing the ATR register
for increased capacitance will lower the frequency, and vice-
versa. If the initial measurement shows the frequency is far off,
it will be necessary to use the DTR register to do a coarse
adjustment. Note that most all crystals will have tight enough
initial accuracy at room temperature so that a small ATR
register adjustment should be all that is needed.
Temperature Compensation
The ATR and DTR controls can be combined to provide crystal
drift temperature compensation. The typical 32.768kHz crystal
has a drift characteristic that is similar to that shown in Figure
17. There is a turnover temperature (T0) where the drift is very
near zero. The shape is parabolic as it varies with the square
of the difference between the actual temperature and the
turnover temperature.
If full industrial temperature compensation is desired in an
ISL1208 circuit, then both the DTR and ATR registers will need
to be utilized (total correction range = -94ppm to +140ppm).
A system to implement temperature compensation would
consist of the ISL1208, a temperature sensor, and a
microcontroller. These devices may already be in the system
so the function will just be a matter of implementing software
and performing some calculations. Fairly accurate temperature
compensation can be implemented just by using the crystal
TABLE 6. SUGGESTED SURFACE MOUNT CRYSTALS
MANUFACTURER PART NUMBER
Citizen CM200S
Epson MC-405, MC-406
Raltron RSM-200S
SaRonix 32S12
Ecliptek ECPSM29T-32.768K
ECS ECX-306
Fox FSM-327
TEMPERATURE (°C)
-160
-140
-120
-100
-80
-60
-40
-20
0
-40-30-20-100 1020304050607080
PPM
FIGURE 17. RTC CRYSTAL TEMPERATURE DRIFT
ISL1208
FN8085 Rev 8.00 Page 19 of 24
September 12, 2008
manufacturer’s specifications for the turnover temperature T0
and the drift coefficient (). The formula for calculating the
oscillator adjustment necessary is Equation 3:
Once the temperature curve for a crystal is established, then
the designer should decide at what discrete temperatures the
compensation will change. Since drift is higher at extreme
temperatures, the compensation may not be needed until the
temperature is greater than +20°C from T0.
A sample curve of the ATR setting vs Frequency Adjustment
for the ISL1208 and a typical RTC crystal is given in Figure 18.
This curve may vary with different crystals, so it is good
practice to evaluate a given crystal in an ISL1208 circuit before
establishing the adjustment values.
This curve is then used to figure what ATR and DTR settings
are used for compensation. The results would be placed in a
lookup table for the microcontroller to access.
Note that the ATR register affects the FOUT frequency directly.
Also, the DTR setting will affect the FOUT frequency for all but
the 32.768Khz setting, due to the clock correction in the divider
chain.
Layout Considerations
The crystal input at X1 has a very high impedance, and
oscillator circuits operating at low frequencies such as
32.768kHz are known to pick up noise very easily if layout
precautions are not followed. Most instances of erratic clocking
or large accuracy errors can be traced to the susceptibility of
the oscillator circuit to interference from adjacent high speed
clock or data lines. Careful layout of the RTC circuit will avoid
noise pickup and insure accurate clocking.
Figure 19 shows a suggested layout for the ISL1208 device
using a surface mount crystal. Two main precautions should be
followed:
1. Do not run the serial bus lines or any high speed logic lines
in the vicinity of the crystal. These logic level lines can
induce noise in the oscillator circuit to cause misclocking.
2. Add a ground trace around the crystal with one end
terminated at the chip ground. This will provide termination
for emitted noise in the vicinity of the RTC device.
In addition, it is a good idea to avoid a ground plane under the
X1 and X2 pins and the crystal, as this will affect the load
capacitance and therefore the oscillator accuracy of the circuit.
If the IRQ/FOUT pin is used as a clock, it should be routed
away from the RTC device as well. The traces for the VBAT
and VCC pins can be treated as a ground, and should be
routed around the crystal.
Battery Backup Considerations
The ISL1208 device provides a VBAT pin which is used for a
battery backup input. The battery voltage can vary from 1.8V
up to 5.5V, independent of the VDD supply voltage. An internal
switch automatically connects the VBAT supply to the to the
internal power node when VDD power goes away, and
switches back to VDD when power returns.
Since this battery switch draws power from the battery, it is
very low power and not very fast. If the VDD drops too quickly
to 0V, there is not enough time for the switch to connect the
VBAT source to the internal power node, and the SRAM
contents can be lost or corrupted. It is a good idea to keep
power-down ramps longer than 50us to insure data retention.
Battery drain can be minimized by using the LPMODE option.
Since normally the VBAT and VDD need to be monitored in
order to switch at the lower voltage, two comparator function
are needed during battery backup. LPMODE shuts off one of
the comparators and just compares VDD to VBAT to activate
switchover. This saves about 500nA of VBAT current at 3.0V.
Do not use LPMODE when VBAT VDD - 0.2V, to avoid
permanently placing the device in battery backup mode.
Another consideration is systems with either ground bounce or
power supply transients that cause the VDD pin to drop below
ground for more than a few nanoseconds. This type of power
glitch can override the VBAT backup and reset or corrupt the
SRAM. If these transient glitches are present in a system with
the ISL1208, or the device is experiencing unexplained loss of
data when returning from VBAT mode, a protection circuit
should be added. Figure 20 shows a circuit which effectively
isolates the VDD input from negative glitches. The Schottky
diode is needed to for low voltage drop and effective protection
from the negative transient. Note that this circuit will also help if
Adjustment(ppm) T T0

2
=(EQ. 3)
-40
-30
-20
-10
0
10
20
30
40
50
60
70
80
90
0 5 10 15 20 25 30 35 40 45 50 55 60
ATR SETTING
PPM ADJUSTMENT
FIGURE 18. ATR SETTING vs OSCILLATOR FREQUENCY
ADJUSTMENT
FIGURE 19. SUGGESTED LAYOUT FOR ISL1208 AND
CRYSTAL
ISL1208
FN8085 Rev 8.00 Page 20 of 24
September 12, 2008
the VDD fall time is less than 50us as CIN holds up the VDD pin
during the transient.
There is also a shunt shown between the battery and the VBAT
pin. This is for quick disconnect if there is a situation where a
transient has latched the device and it will not communicate on
the I2C bus. If ground bounce is a problem, then a second
Schottky diode should be added between the battery and the
VBAT pin.
Super Capacitor Backup
A Super Capacitor can be used as an alternative to a battery in
cases where shorter backup times are required. Since the
battery backup supply current required by the ISL1208 is
extremely low, it is possible to get months of backup operation
using a Super Capacitor. Typical capacitor values are a few µF
to 1F or more depending on the application.
If backup is only needed for a few minutes, then a small
inexpensive electrolytic capacitor can be used. For extended
periods, a low leakage, high capacity Super Capacitor is the
best choice. These devices are available from such vendors as
Panasonic and Murata. The main specifications include
working voltage and leakage current. If the application is for
charging the capacitor from a +5V ±5% supply with a signal
diode, then the voltage on the capacitor can vary from ~4.5V to
slightly over 5.0V. A capacitor with a rated WV of 5.0V may
have a reduced lifetime if the supply voltage is slightly high.
The leakage current should be as small as possible. For
example, a Super Capacitor should be specified with leakage
of well below 1µA. A standard electrolytic capacitor with DC
leakage current in the microamps will have a severely
shortened backup time.
Below are some examples with equations to assist with
calculating backup times and required capacitance for the
ISL1208 device. The backup supply current plays a major part
in these equations, and a typical value was chosen for
example purposes. For a robust design, a margin of 30%
should be included to cover supply current and capacitance
tolerances over the results of the calculations. Even more
margin should be included if periods of very warm temperature
operation are expected.
Example 1. Calculating Backup T ime Given V oltages
and Capacitor Value
In Figure 21, use CBAT = 0.47F and VCC = 5.0V. With
VCC = 5.0V, the voltage at VBAT will approach 4.7V as the
diode turns off completely. The ISL1208 is specified to operate
down to VBAT = 1.8V. The capacitance charge/discharge
equation (Equation 4) is used to estimate the total backup time:
Rearranging gives:
CBAT is the backup capacitance and dV is the change in
voltage from fully charged to loss of operation. Note that ITOT
is the total of the supply current of the ISL1208 (IBAT) plus the
leakage current of the capacitor and the diode, ILKG
. In these
calculations, ILKG is assumed to be extremely small and will be
ignored. If an application requires extended operation at
temperatures over +50°C, these leakages will increase and
hence reduce backup time.
Note that IBAT changes with VBAT almost linearly (see Typical
Performance Curves on page 7). This allows us to make an
approximation of IBAT, using a value midway between the two
endpoints. The typical linear equation for IBAT vs VBAT is in
Equation 6:
Using this equation to solve for the average current given 2
voltage points gives Equation 7:
Combining with Equation 5 gives the equation for backup time
in Equation 8:
FIGURE 20. POWER GLITCH PROTECTION CIRCUIT
2.7V TO 5.5V
VDD VBAT
GND
+
BAT54
ISL1208 CBAT
CIN
BT1
3.0V
TO
3.6V
0.1µF
0.1µF
SHUNT
DIN
FIGURE 21. SUPERCAPACITOR CHARGING CIRCUIT
2.7V TO 5.5V VDD VBAT
GND
1N4148
CBAT
I = CBAT * dV/dT (EQ. 4)
dT = CBAT * dV/ITOT to solve for backup time. (EQ. 5)
IBAT = 1.031E-7*(VBAT) + 1.036E-7 Amps (EQ. 6)
IBATAVG = 5.155E-8*(VBAT2 + VBAT1) + 1.036E-7 Amps
(EQ. 7)
TBACKUP = CBAT * (VBAT2 - VBAT1) / (IBATAVG + ILKG)
(EQ. 8)
seconds
ISL1208
FN8085 Rev 8.00 Page 21 of 24
September 12, 2008
where:
CBAT = 0.47F
VBAT2 = 4.7V
VBAT1 = 1.8V
ILKG = 0 (assumed minimal)
Solving Equation 7 for this example, IBATAVG = 4.387E-7 A
TBACKUP = 0.47 * (2.9) / 4.38E-7 = 3.107E6 sec
Since there are 86,400 seconds in a day, this corresponds to
35.96 days. If the 30% tolerance is included for capacitor and
supply current tolerances, then worst case backup time would
be:
CBAT = 0.70 * 35.96 = 25.2 days
Example 2. Calculating a Capacitor V alue fo r a Given
Backup Time
Referring to Figure 21 again, the capacitor value needs to be
calculated to give 2 months (60 days) of backup time, given
VCC = 5.0V. As in Example 1, the VBAT voltage will vary from
4.7V down to 1.8V. We will need to rearrange Equation 5 to
solve for capacitance in Equation 9:
Using the terms described above, this equation becomes
Equation 10:
where:
TBACKUP = 60 days * 86,400 sec/day = 5.18 E6 seconds
IBATAVG = 4.387 E-7 A (same as Example 1)
ILKG = 0 (assumed)
VBAT2 = 4.7V
VBAT1 = 1.8VSolving gives
CBAT = 5.18 E6 * (4.387 E-7)/(2.9) = 0.784F
If the 30% tolerance is included for tolerances, then worst
case capacitor value would be:
CBAT = dT*I/dV (EQ. 9)
CBAT = TBACKUP * (IBATAVG + ILKG)/(VBAT2 VBAT1)
(EQ. 10)
(EQ. 11)
CBAT 1.3 0.784 1.02F==
FN8085 Rev 8.00 Page 22 of 24
September 12, 2008
ISL1208
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
For additional products, see www.intersil.com/en/products.html
© Copyright Intersil Americas LLC 2004-2008. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective owners.
Thin Dual Flat No-Lead Plastic Package (TDFN)
//
NX (b)
SECTION "C-C"
5
(A1)
BOTTOM VIEW
A
6
AREA
INDEX
C
C
0.10
0.08
SIDE VIEW
0.15
2X
E
A
B
C0.15
D
TOP VIEW
CB
2X
6
8
AREA
INDEX
NX L
E2
E2/2
REF.
e
N
(Nd-1)Xe
(DATUM A)
(DATUM B)
5
0.10
87
D2
BA
MC
N-1
12
PLANE
SEATING
C
A
A3
NX b
D2/2
NX k
FOR EVEN TERMINAL/SIDE
e
C
L
TERMINAL TIP
L1
10 L
L8.3x3A
8 LEAD THIN DUAL FLAT NO-LEAD PLASTIC PACKAGE
SYMBOL
MILLIMETERS
NOTESMIN NOMINAL MAX
A 0.70 0.75 0.80 -
A1 - 0.02 0.05 -
A3 0.20 REF -
b 0.25 0.30 0.35 5, 8
D 3.00 BSC -
D2 2.20 2.30 2.40 7, 8, 9
E 3.00 BSC -
E2 1.40 1.50 1.60 7, 8, 9
e 0.65 BSC -
k0.25 - - -
L 0.20 0.30 0.40 8
N82
Nd 4 3
Rev. 3 11/04
NOTES:
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd refers to the number of terminals on D.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide
improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land
Pattern Design efforts, see Intersil Technical Brief TB389.
9. Compliant to JEDEC MO-WEEC-2 except for the “L” min
dimension.
ISL1208
FN8085 Rev 8.00 Page 23 of 24
September 12, 2008
Small Outline Package Family (SO)
GAUGE
PLANE
A2
A1 L
L1
DETAIL X
4° ±4°
SEATING
PLANE
eH
b
C
0.010 BMCA
0.004 C
0.010 BMCA
B
D
(N/2)
1
E1
E
NN (N/2)+1
A
PIN #1
I.D. MARK
h X 45°
A
SEE DETAIL “X”
c
0.010
MDP0027
SMALL OUTLINE PACKAGE FAMILY (SO)
SYMBOL
INCHES
TOLERANCE NOTESSO-8 SO-14
SO16
(0.150”)
SO16 (0.300”)
(SOL-16)
SO20
(SOL-20)
SO24
(SOL-24)
SO28
(SOL-28)
A 0.068 0.068 0.068 0.104 0.104 0.104 0.104 MAX -
A1 0.006 0.006 0.006 0.007 0.007 0.007 0.007 0.003 -
A2 0.057 0.057 0.057 0.092 0.092 0.092 0.092 0.002 -
b 0.017 0.017 0.017 0.017 0.017 0.017 0.017 0.003 -
c 0.009 0.009 0.009 0.011 0.011 0.011 0.011 0.001 -
D 0.193 0.341 0.390 0.406 0.504 0.606 0.704 0.004 1, 3
E 0.236 0.236 0.236 0.406 0.406 0.406 0.406 0.008 -
E1 0.154 0.154 0.154 0.295 0.295 0.295 0.295 0.004 2, 3
e 0.050 0.050 0.050 0.050 0.050 0.050 0.050 Basic -
L 0.025 0.025 0.025 0.030 0.030 0.030 0.030 0.009 -
L1 0.041 0.041 0.041 0.056 0.056 0.056 0.056 Basic -
h 0.013 0.013 0.013 0.020 0.020 0.020 0.020 Reference -
N 8 14 16 16 20 24 28 Reference -
Rev. M 2/07
NOTES:
1. Plastic or metal protrusions of 0.006” maximum per side are not included.
2. Plastic interlead protrusions of 0.010” maximum per side are not included.
3. Dimensions “D” and “E1” are measured at Datum Plane “H”.
4. Dimensioning and tolerancing per ASME Y14.5M-1994
ISL1208
FN8085 Rev 8.00 Page 24 of 24
September 12, 2008
Mini Small Outline Plastic Packages (MSOP)
NOTES:
1. These package dimensions are within allowable dimensions of
JEDEC MO-187BA.
2. Dimensioning and tolerancing per ANSI Y14.5M-1994.
3. Dimension “D” does not include mold flash, protrusions or gate
burrs and are measured at Datum Plane. Mold flash, protrusion
and gate burrs shall not exceed 0.15mm (0.006 inch) per side.
4. Dimension “E1” does not include interlead flash or protrusions
and are measured at Datum Plane. Interlead flash and
protrusions shall not exceed 0.15mm (0.006 inch) per side.
5. Formed leads shall be planar with respect to one another within
0.10mm (0.004) at seating Plane.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. Dimension “b” does not include dambar protrusion. Allowable
dambar protrusion shall be 0.08mm (0.003 inch) total in excess
of “b” dimension at maximum material condition. Minimum space
between protrusion and adjacent lead is 0.07mm (0.0027 inch).
10. Datums and to be determined at Datum plane
.
11. Controlling dimension: MILLIMETER. Converted inch dimen-
sions are for reference only.
- H -
-A -
- B -
- H -
M8.118 (JEDEC MO-187AA)
8 LEAD MINI SMALL OUTLINE PLASTIC PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A 0.037 0.043 0.94 1.10 -
A1 0.002 0.006 0.05 0.15 -
A2 0.030 0.037 0.75 0.95 -
b 0.010 0.014 0.25 0.36 9
c 0.004 0.008 0.09 0.20 -
D 0.116 0.120 2.95 3.05 3
E1 0.116 0.120 2.95 3.05 4
e 0.026 BSC 0.65 BSC -
E 0.187 0.199 4.75 5.05 -
L 0.016 0.028 0.40 0.70 6
L1 0.037 REF 0.95 REF -
N8 87
R 0.003 - 0.07 - -
R1 0.003 - 0.07 - -
05
o15o5o15o-
0o6o0o6o-
Rev. 2 01/03