Product Folder Sample & Buy Technical Documents Support & Community Tools & Software UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 UCC27524A-Q1 Dual 5-A, High-Speed, Low-Side Gate Driver With Negative Input Voltage Capability 1 Features 3 Description * * The UCC27524A-Q1 device is a dual-channel, highspeed, low-side, gate-driver device capable of effectively driving MOSFET and IGBT power switches. The UCC27524A-Q1 device is a variant of the UCC2752x family. The UCC27524A-Q1 device adds the ability to handle -5 V directly at the input pins for increased robustness. The UCC27524A-Q1 device is a dual, non-inverting driver. Using a design that inherently minimizes shoot-through current, the UCC27524A-Q1 device is capable of delivering highpeak current pulses of up to 5-A source and 5-A sink into capacitive loads along with rail-to-rail drive capability and extremely small propagation delay (typically 13 ns). In addition, the drivers feature matched, internal-propagation delays between the two channels which are very well suited for applications requiring dual-gate drives with critical timing, such as synchronous rectifiers. This also enables connecting two channels in parallel to effectively increase current-drive capability or driving two switches in parallel with a single input signal. The input pin thresholds are based on TTL and CMOS compatible low-voltage logic, which is fixed and independent of the VDD supply voltage. Wide hysteresis between the high and low thresholds offers excellent noise immunity. 1 * * * * * * * * * * * * * * * * * Qualified for Automotive Applications AEC-Q100 Qualified With the Following Results - Device Temperature Grade 1 - Device HBM ESD Classification Level H2 - Device CDM ESD Classification Level C4B Industry-Standard Pin Out Two Independent Gate-Drive Channels 5-A Peak Source and Sink-Drive Current Independent Enable Function for Each Output TTL and CMOS-Compatible Logic Threshold Independent of Supply Voltage Hysteretic-Logic Thresholds for High-Noise Immunity Ability to Handle Negative Voltages (-5 V) at Inputs Inputs and Enable Pin-Voltage Levels Not Restricted by VDD Pin Bias Supply Voltage 4.5-V to 18-V Single-Supply Range Outputs Held Low During VDD-UVLO, (ensures glitch-free operation at power-up and powerdown) Fast Propagation Delays (13-ns typical) Fast Rise and Fall Times (7-ns and 6-ns typical) 1-ns Typical Delay Matching Between 2-Channels Ability to Parallel Two Outputs for High-Drive Current Outputs Held in LOW When Inputs are Floating SOIC-8 and MSOP-8 PowerPadTM Package Options Operating Temperature Range of -40C to 140C Device Information(1) PART NUMBER UCC27524A-Q1 PACKAGE SOIC (8) 4.90 mm x 3.91 mm MSOP-PowerPAD (8) 3.00 mm x 3.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Product Matrix Dual Non-Inverting Inputs UCC27524A-Q1 2 Applications * * * * * Automotive Switch-Mode Power Supplies DC-to-DC Converters Motor Control, Solar Power Gate Drive for Emerging Wide Band-Gap Power Devices such as GaN BODY SIZE (NOM) ENA 1 8 ENB INA 2 7 OUTA GND 3 6 VDD INB 4 5 OUTB 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Description (continued)......................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 4 5 7.1 7.2 7.3 7.4 7.5 7.6 7.7 5 5 5 5 6 6 8 Absolute Maximum Ratings ...................................... ESD Ratings ............................................................ Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Switching Characteristics .......................................... Typical Characteristics .............................................. Detailed Description ............................................ 11 8.1 Overview ................................................................. 11 8.2 Functional Block Diagram ....................................... 12 8.3 Feature Description................................................. 12 8.4 Device Functional Modes........................................ 17 9 Application and Implementation ........................ 18 9.1 Application Information............................................ 18 9.2 Typical Application .................................................. 18 10 Power Supply Recommendations ..................... 22 11 Layout................................................................... 23 11.1 Layout Guidelines ................................................. 23 11.2 Layout Example .................................................... 24 11.3 Thermal Considerations ........................................ 24 12 Device and Documentation Support ................. 25 12.1 12.2 12.3 12.4 Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 25 25 25 25 13 Mechanical, Packaging, and Orderable Information ........................................................... 25 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision A (January 2014) to Revision B * Added ESD Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. ................................................................................................ 1 Changes from Original (November 2013) to Revision A * 2 Page Page Changed document status from Product Preview to Production Data ................................................................................... 1 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 5 Description (continued) For protection purposes, internal pull-up and pull-down resistors on the input pins of the UCC27524A-Q1 device ensure that outputs are held LOW when input pins are in floating condition. The UCC27524A-Q1 device features enable pins (ENA and ENB) to have better control of the operation of the driver applications. The pins are internally pulled up to VDD for active-high logic and are left open for standard operation. The UCC27524A-Q1 devices is available in SOIC-8 (D) and MSOP-PowerPAD-8 with exposed pad (DGN) packages. Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 3 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 6 Pin Configuration and Functions D and DGN Packages 8-Pin SOIC and MSOP-PowerPAD Top View ENA 1 8 ENB INA 2 7 OUTA GND 3 6 VDD INB 4 5 OUTB Pin Functions PIN NAME NO. I/O DESCRIPTION ENA 1 I Enable input for Channel A: ENA is biased LOW to disable the Channel A output regardless of the INA state. ENA is biased HIGH or left floating to enable the Channel A output. ENA is allowed to float; hence the pinto-pin compatibility with the UCC2732X N/C pin. ENB 8 I Enable input for Channel B: ENB is biased LOW to disables the Channel B output regardless of the INB state. ENB is biased HIGH or left floating to enable Channel B output. ENB is allowed to float hence; the pinto-pin compatibility with the UCC2752A N/C pin. GND 3 - Ground: All signals are referenced to this pin. INA 2 I Input to Channel A: INA is the non-inverting input in the UCC27524A-Q1 device. OUTA is held LOW if INA is unbiased or floating. INB 4 I Input to Channel B: INB is the non-inverting input in the UCC27524A-Q1 device. OUTB is held LOW if INB is unbiased or floating. OUTA 7 O Output of Channel A OUTB 5 O Output of Channel B VDD 6 I Bias supply input 4 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) Supply voltage OUTA, OUTB voltage MIN MAX UNIT VDD -0.3 20 V DC -0.3 VDD + 0.3 V -2 VDD + 0.3 V 0.3 A 5 A Repetitive pulse < 200 ns (2) Output continuous source/sink current IOUT_DC Output pulsed source/sink current (0.5 s) IOUT_pulsed INA, INB, ENA, ENB voltage (3) -5 20 V Operating virtual junction temperature, TJ -40 150 C Storage temperature, Tstg -65 150 C (1) (2) (3) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Values are verified by characterization on bench. The maximum voltage on the Input and Enable pins is not restricted by the voltage on the VDD pin. 7.2 ESD Ratings VALUE V(ESD) (1) Electrostatic discharge Human-body model (HBM), per AEC Q100-002 (1) 2000 Charged-device model (CDM), per AEC Q100-011 750 UNIT V AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX Supply voltage, VDD 4.5 12 18 UNIT V Operating junction temperature -40 140 C Input voltage, INA, INB -2 18 V Enable voltage, ENA and ENB -2 18 V 7.4 Thermal Information UCC27524A-Q1 UCC27524A-Q1 THERMAL METRIC (1) SOIC (D) HVSSOP (DGN) 8 PINS 8 PINS UNIT 130.9 71.8 C/W RJA Junction-to-ambient thermal resistance RJC(top) Junction-to-case (top) thermal resistance 80 65.6 C/W RJB Junction-to-board thermal resistance 71.4 7.4 C/W JT Junction-to-top characterization parameter 21.9 7.4 C/W JB Junction-to-board characterization parameter 70.9 31.5 C/W RJC(bot) Junction-to-case (bottom) thermal resistance n/a 19.6 C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 5 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 7.5 Electrical Characteristics VDD = 12 V, TA = TJ = -40 C to 140 C, 1-F capacitor from VDD to GND. Currents are positive into, negative out of the specified terminal (unless otherwise noted,) PARAMETER TEST CONDITIONS MIN TYP MAX VDD = 3.4 V, INA = VDD, INB = VDD 55 110 175 VDD = 3.4 V, INA = GND, INB = GND 25 75 145 3.91 4.2 4.5 3.7 4.2 4.65 UNIT BIAS CURRENTS Startup current, (based on UCC27524 Input configuration) IDD(off) A UNDER VOLTAGE LOCKOUT (UVLO) TJ = 25 C VON Supply start threshold VOFF Minimum operating voltage after supply start 3.4 3.9 4.4 V VDD_H Supply voltage hysteresis 0.2 0.3 0.5 V 1.9 2.1 2.3 V 1 1.2 1.4 V 0.7 0.9 1.1 V TJ = -40 C to 140 C V INPUTS (INA, INB, INA+, INA-, INB+, INB-), UCC27524A-Q1 (D, DGN) VIN_H Input signal high threshold Output high for non-inverting input pins Output low for inverting input pins VIN_L Input signal low threshold Output low for non-inverting input pins Output high for inverting input pins VIN_HYS Input hysteresis OUTPUTS (OUTA, OUTB) ISNK/SRC Sink/source peak current (1) CLOAD = 0.22 F, FSW = 1 kHz VDD-VOH High output voltage IOUT = -10 mA VOL Low output voltage IOUT = 10 mA 0.01 V ROH Output pullup resistance (2) IOUT = -10 mA 2.5 5 7.5 ROL Output pulldown resistance IOUT = 10 mA 0.15 0.5 1 (1) (2) 5 A 0.075 V Ensured by design. ROH represents on-resistance of only the P-Channel MOSFET device in the pullup structure of the UCC27524A-Q1 output stage. 7.6 Switching Characteristics over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS (1) MIN TYP MAX UNIT tR Rise time CLOAD = 1.8 nF 7 18 ns tF Fall time (1) CLOAD = 1.8 nF 6 10 ns tM Delay matching between 2 channels INA = INB, OUTA and OUTB at 50% transition point 1 4 ns tPW Minimum input pulse width that changes the output state 15 25 ns tD1, tD2 Input to output propagation delay (1) tD3, tD4 (1) 6 EN to output propagation delay (1) CLOAD = 1.8 nF, 5-V input pulse 6 13 23 ns CLOAD = 1.8 nF, 5-V enable pulse 6 13 23 ns See the timing diagrams in Figure 1 and Figure 2 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 High Input Low High Enable Low 90% Output 10% tD3 tD4 UDG-11217 Figure 1. Enable Function High Input Low High Enable Low 90% Output 10% tD1 tD2 UDG-11219 Figure 2. Input-Output Operation Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 7 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 7.7 Typical Characteristics 4 Operating Supply Current (mA) Startup Current (mA) 0.14 Input=VDD Input=GND 0.12 0.1 0.08 3.5 3 VDD = 12 V fSW = 500 kHz CL = 500 pF VDD=3.4V 0.06 -50 0 50 Temperature (C) 100 2.5 -50 150 0 G001 Figure 3. Start-Up Current vs Temperature 0.5 UVLO Threshold (V) Supply Current (mA) 0.4 0.3 Enable=12 V VDD = 12 V 0 50 Temperature (C) 100 4.5 4 3.5 3 -50 150 0 G012 2.5 2.5 2 2 VDD = 12 V 1.5 1 50 Temperature (C) 100 150 G003 VDD = 12 V 1 Enable High Threshold Enable Low Threshold 150 0.5 -50 G004 Figure 7. Input Threshold vs Temperature 100 1.5 Input High Threshold Input Low Threshold 0 50 Temperature (C) Figure 6. UVLO Threshold vs Temperature Enable Threshold (V) Input Threshold (V) G002 UVLO Rising UVLO Falling Figure 5. Supply Current vs Temperature (Outputs In DC On/Off Condition) 8 150 5 Input=GND Input=VDD 0.5 -50 100 Figure 4. Operating Supply Current vs Temperature (Outputs Switching) 0.6 0.2 -50 50 Temperature (C) 0 50 Temperature (C) 100 150 G005 Figure 8. Enable Threshold vs Temperature Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 Typical Characteristics (continued) 1 VDD = 12 V IOUT = -10 mA Output Pull-down Resistance () Output Pull-up Resistance () 7 6 5 4 3 -50 0 50 Temperature (C) 100 VDD = 12 V IOUT = 10 mA 0.8 0.6 0.4 0.2 -50 150 Figure 9. Output Pullup Resistance vs Temperature G007 8 Fall Time (ns) Rise Time (ns) 150 VDD = 12 V CLOAD = 1.8 nF 9 8 7 7 6 6 0 50 Temperature (C) 100 5 -50 150 0 G008 Figure 11. Rise Time vs Temperature 50 Temperature (C) 100 150 G009 Figure 12. Fall Time vs Temperature 18 18 Turn-on Turn-off EN to Output Propagation Delay (ns) Input to Output Propagation Delay (ns) 100 9 VDD = 12 V CLOAD = 1.8 nF 16 14 12 10 VDD = 12 V CLOAD = 1.8 nF 8 -50 50 Temperature (C) Figure 10. Output Pulldown Resistance vs Temperature 10 5 -50 0 G006 0 50 Temperature (C) 100 150 EN to Output High EN to Output Low 16 14 12 10 VDD = 12 V CLOAD = 1.8 nF 8 -50 G010 Figure 13. Input to Output Propagation Delay vs Temperature 0 50 Temperature (C) 100 150 G011 Figure 14. En to Output Propagation Delay vs Temperature Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 9 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Typical Characteristics (continued) 22 VDD = 4.5 V VDD = 12 V VDD = 15 V 50 Propagation Delays (ns) Operating Supply Current (mA) 60 40 CLOAD = 1.8 nF Both channels switching 30 20 Input to Output On delay Input to Ouptut Off Delay EN to Output On Delay EN to Output Off Delay 18 14 10 10 0 CLOAD = 1.8 nF 0 6 100 200 300 400 500 600 700 800 900 1000 Frequency (kHz) G013 Figure 15. Operating Supply Current vs Frequency 4 8 12 Supply Voltage (V) G014 10 CLOAD = 1.8 nF CLOAD = 1.8 nF 14 Fall Time (ns) Rise Time (ns) 20 Figure 16. Propagation Delays vs Supply Voltage 18 10 6 16 4 8 12 Supply Voltage (V) 16 8 6 4 20 4 8 12 Supply Voltage (V) G015 Figure 17. Rise Time vs Supply Voltage 16 20 G016 Figure 18. Fall Time vs Supply Voltage 2.5 VDD = 4.5 V Enable Threshold (V) Enable High Threshold Enable Low Threshold 2 1.5 1 0.5 -50 0 50 Temperature (C) 100 150 G017 Figure 19. Enable Threshold vs Temperature 10 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 8 Detailed Description 8.1 Overview The UCC27524A-Q1 device represents Texas Instruments' latest generation of dual-channel, low-side, highspeed, gate-driver devices featuring a 5-A source and sink current capability, industry best-in-class switching characteristics, and a host of other features listed in Table 1 all of which combine to ensure efficient, robust and reliable operation in high-frequency switching power circuits. Table 1. UCC27524A-Q1 Features and Benefits FEATURE BENEFIT Best-in-class 13-ns (typ) propagation delay Extremely low-pulse transmission distortion 1-ns (typ) delay matching between channels Ease of paralleling outputs for higher (2 times) current capability, ease of driving parallel-power switches Expanded VDD Operating range of 4.5 to 18 V Flexibility in system design Expanded operating temperature range of -40 C to +140 C (See Electrical Characteristics table) Flexibility in system design VDD UVLO Protection Outputs are held Low in UVLO condition, which ensures predictable, glitch-free operation at power-up and power-down Outputs held Low when input pins (INx) in floating condition Protection feature, especially useful in passing abnormal condition tests during safety certification Outputs enable when enable pins (ENx) in floating condition Pin-to-pin compatibility with the UCC27324 device from Texas Instruments, in designs where Pin 1 and Pin 8 are in floating condition CMOS/TTL compatible input and enable threshold with wide hysteresis Enhanced noise immunity, while retaining compatibility with microcontroller logic-level input signals (3.3 V, 5 V) optimized for digital power Ability of input and enable pins to handle voltage levels not restricted System simplification, especially related to auxiliary bias supply by VDD pin bias voltage architecture Ability to handle -5 VDC (max) at input pins Increased robustness in noisy environments Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 11 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 8.2 Functional Block Diagram VDD VDD 200 kW ENA 200 kW 1 8 ENB VDD INA OUTA 2 7 400 kW VDD VDD VDD UVLO GND 6 3 VDD INB OUTB 4 5 400 kW 8.3 Feature Description 8.3.1 Operating Supply Current The UCC27524A-Q1 devices feature very low quiescent IDD currents. The typical operating-supply current in UVLO state and fully-on state (under static and switching conditions) are summarized in Figure 3, Figure 4 and Figure 5. The IDD current when the device is fully on and outputs are in a static state (DC high or DC low, see Figure 4) represents lowest quiescent IDD current when all the internal logic circuits of the device are fully operational. The total supply current is the sum of the quiescent IDD current, the average IOUT current because of switching, and finally any current related to pullup resistors on the enable pins (see Functional Block Diagram). Knowing the operating frequency (fSW) and the MOSFET gate (QG) charge at the drive voltage being used, the average IOUT current can be calculated as product of QG and fSW. A complete characterization of the IDD current as a function of switching frequency at different VDD bias voltages under 1.8-nF switching load in both channels is provided in Figure 15. The strikingly linear variation and close correlation with theoretical value of average IOUT indicates negligible shoot-through inside the gate-driver device attesting to its high-speed characteristics. 12 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 Feature Description (continued) 8.3.2 Input Stage The input pins of the UCC27524A-Q1 gate-driver devices are based on a TTL and CMOS compatible inputthreshold logic that is independent of the VDD supply voltage. With typically high threshold = 2.1 V and typically low threshold = 1.2 V, the logic level thresholds are conveniently driven with PWM control signals derived from 3.3-V and 5-V digital power-controller devices. Wider hysteresis (typ 0.9 V) offers enhanced noise immunity compared to traditional TTL logic implementations, where the hysteresis is typically less than 0.5 V. UCC27524A-Q1 devices also feature tight control of the input pin threshold voltage levels which eases system design considerations and ensures stable operation across temperature (refer to Figure 7). The very low input capacitance on these pins reduces loading and increases switching speed. The UCC27524A-Q1 device features an important protection feature that holds the output of a channel when the respective pin is in a floating condition. This is achieved using GND pulldown resistors on all of the non-inverting input pins (INA, INB), as shown in the device block diagrams. The input stage of each driver is driven by a signal with a short rise or fall time. This condition is satisfied in typical power supply applications, where the input signals are provided by a PWM controller or logic gates with fast transition times (<200 ns) with a slow changing input voltage, the output of the driver may switch repeatedly at a high frequency. While the wide hysteresis offered in UCC27524A-Q1 definitely alleviates this concern over most other TTL input threshold devices, extra care is necessary in these implementations. If limiting the rise or fall times to the power device is the primary goal, then an external resistance is highly recommended between the output of the driver and the power device. This external resistor has the additional benefit of reducing part of the gate-charge related power dissipation in the gate driver device package and transferring it into the external resistor itself. 8.3.3 Enable Function The enable function is an extremely beneficial feature in gate-driver devices, especially for certain applications such as synchronous rectification where the driver outputs disable in light-load conditions to prevent negative current circulation and to improve light-load efficiency. The UCC27524A-Q1 device is equipped with independent enable pins (ENx) for exclusive control of each driverchannel operation. The enable pins are based on a non-inverting configuration (active-high operation). Thus when ENx pins are driven high, the drivers are enabled and when ENx pins are driven low, the drivers are disabled. Like the input pins, the enable pins are also based on a TTL and CMOS compatible, input-threshold logic that is independent of the supply voltage and are effectively controlled using logic signals from 3.3-V and 5V microcontrollers. The UCC27524A-Q1 devices also feature tight control of the enable-function thresholdvoltage levels which eases system design considerations and ensures stable operation across temperature (refer to Figure 8). The ENx pins are internally pulled up to VDD using pullup resistors as a result of which the outputs of the device are enabled in the default state. Hence the ENx pins are left floating or Not Connected (N/C) for standard operation, where the enable feature is not needed. Essentially, this floating allows the UCC27524A-Q1 device to be pin-to-pin compatible with TI's previous generation of drivers (UCC27323, UCC27324, and UCC27325 respectively), where Pin 1 and Pin 8 are N/C pins. If the channel A and Channel B inputs and outputs are connected in parallel to increase the driver current capacity, ENA and ENB are connected and driven together. 8.3.4 Output Stage The UCC27524A-Q1 device output stage features a unique architecture on the pullup structure which delivers the highest peak-source current when it is most needed during the Miller plateau region of the power-switch turnon transition (when the power switch drain or collector voltage experiences dV/dt). The output stage pullup structure features a P-Channel MOSFET and an additional N-Channel MOSFET in parallel. The function of the N-Channel MOSFET is to provide a brief boost in the peak sourcing current enabling fast turnon. This is accomplished by briefly turning-on the N-Channel MOSFET during a narrow instant when the output is changing state from Low to High. Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 13 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Feature Description (continued) VCC ROH RNMOS, Pull Up Input Signal Anti ShootThrough Circuitry Gate Voltage Boost OUT Narrow Pulse at each Turn On R OL Figure 20. UCC27524A-Q1 Gate Driver Output Structure The ROH parameter (see Electrical Characteristics) is a DC measurement and it is representative of the onresistance of the P-Channel device only. This is because the N-Channel device is held in the off state in DC condition and is turned-on only for a narrow instant when output changes state from low to high. Note that effective resistance of the UCC27524A-Q1 pullup stage during the turnon instant is much lower than what is represented by ROH parameter. The pulldown structure in the UCC27524A-Q1 device is simply composed of a N-Channel MOSFET. The ROL parameter (see Electrical Characteristics), which is also a DC measurement, is representative of the impedance of the pulldown stage in the device. In the UCC27524A-Q1 device, the effective resistance of the hybrid pullup structure during turnon is estimated to be approximately 1.5 x ROL, estimated based on design considerations. Each output stage in the UCC27524A-Q1 device is capable of supplying 5-A peak source and 5-A peak sink current pulses. The output voltage swings between VDD and GND providing rail-to-rail operation, thanks to the MOS-output stage which delivers very low drop-out. The presence of the MOSFET-body diodes also offers low impedance to switching overshoots and undershoots which means that in many cases, external Schottky-diode clamps may be eliminated. The outputs of these drivers are designed to withstand 500-mA reverse current without either damage to the device or logic malfunction. The UCC27524A-Q1 device is particularly suited for dual-polarity, symmetrical drive-gate transformer applications where the primary winding of transformer driven by OUTA and OUTB, with inputs INA and INB being driven complementary to each other. This situation is because of the extremely low drop-out offered by the MOS output stage of these devices, both during high (VOH) and low (VOL) states along with the low impedance of the driver output stage, all of which allow alleviate concerns regarding transformer demagnetization and flux imbalance. The low propagation delays also ensure accurate reset for high-frequency applications. For applications that have zero voltage switching during power MOSFET turnon or turnoff interval, the driver supplies high-peak current for fast switching even though the miller plateau is not present. This situation often occurs in synchronous rectifier applications because the body diode is generally conducting before power MOSFET is switched on. 14 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 Feature Description (continued) 8.3.5 Low Propagation Delays And Tightly Matched Outputs The UCC27524A-Q1 driver device features a best in class, 13-ns (typical) propagation delay between input and output which goes to offer the lowest level of pulse-transmission distortion available in the industry for high frequency switching applications. For example in synchronous rectifier applications, the SR MOSFETs are driven with very low distortion when a single driver device is used to drive both the SR MOSFETs. Further, the driver devices also feature an extremely accurate, 1-ns (typical) matched internal-propagation delays between the two channels which is beneficial for applications requiring dual gate drives with critical timing. For example in a PFC application, a pair of paralleled MOSFETs can be driven independently using each output channel, which the inputs of both channels are driven by a common control signal from the PFC controller device. In this case the 1ns delay matching ensures that the paralleled MOSFETs are driven in a simultaneous fashion with the minimum of turnon delay difference. Yet another benefit of the tight matching between the two channels is that the two channels are connected together to effectively increase current drive capability, for example A and B channels may be combined into a single driver by connecting the INA and INB inputs together and the OUTA and OUTB outputs together. Then, a single signal controls the paralleled combination. Caution must be exercised when directly connecting OUTA and OUTB pins together because there is the possibility that any delay between the two channels during turnon or turnoff may result in shoot-through current conduction as shown in Figure 21. While the two channels are inherently very well matched (4-ns Max propagation delay), note that there may be differences in the input threshold voltage level between the two channels which causes the delay between the two outputs especially when slow dV/dt input signals are employed. The following guidelines are recommended whenever the two driver channels are paralleled using direct connections between OUTA and OUTB along with INA and INB: * Use very fast dV/dt input signals (20 V/s or greater) on INA and INB pins to minimize impact of differences in input thresholds causing delays between the channels. * INA and INB connections must be made as close to the device pins as possible. Wherever possible, a safe practice would be to add an option in the design to have gate resistors in series with OUTA and OUTB. This allows the option to use 0- resistors for paralleling outputs directly or to add appropriate series resistances to limit shoot-through current, should it become necessary. VDD VDD 200 kW ENA 200 kW 1 8 ISHOOT-THROUGH VDD Slow Input Signal INA 2 VIN_H (Channel B) 7 400 kW VIN_H (Channel A) VDD INB OUTA VDD UVLO GND ENB 3 VDD 6 VDD 4 5 OUTB 400 kW Figure 21. Slow Input Signal Can Cause Shoot-Through Between Channels During Paralleling (Recommended DV/DT is 20 V/s or Higher) Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 15 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Feature Description (continued) 16 Figure 22. Turnon Propagation Delay (CL = 1.8 nF, VDD = 12 V) Figure 23. Turnon Rise Time (CL = 1.8 nF, VDD = 12 V) Figure 24. . Turnoff Propagation Delay (CL = 1.8 nF, VDD = 12 V) Figure 25. Turnoff Fall Time (CL = 1.8 nF, VDD = 12 V) Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 8.4 Device Functional Modes Table 2. Device Logic Table ENA ENB INA INB H H L L H H L H H H H H L L OUTB L L H L H L H L H H H H Any Any L L (1) (1) L L Any Any x (1) x (1) L L L L x (1) x (1) L H L H x (1) x (1) H L H L (1) x (1) H H H H x (1) UCC27524A-Q1 OUTA x x Floating condition. Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 17 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI's customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information High-current gate-driver devices are required in switching power applications for a variety of reasons. In order to effect the fast switching of power devices and reduce associated switching-power losses, a powerful gate-driver device employs between the PWM output of control devices and the gates of the power semiconductor devices. Further, gate-driver devices are indispensable when it is not feasible for the PWM controller device to directly drive the gates of the switching devices. With the advent of digital power, this situation is often encountered because the PWM signal from the digital controller is often a 3.3-V logic signal which is not capable of effectively turning on a power switch. A level-shifting circuitry is required to boost the 3.3-V signal to the gate-drive voltage (such as 12 V) in order to fully turn on the power device and minimize conduction losses. Traditional buffer-drive circuits based on NPN/PNP bipolar transistors in a totem-pole arrangement, as emitter-follower configurations, prove inadequate with digital power because the traditional buffer-drive circuits lack level-shifting capability. Gate-driver devices effectively combine both the level-shifting and buffer-drive functions. Gate-driver devices also find other needs such as minimizing the effect of high-frequency switching noise by locating the high-current driver physically close to the power switch, driving gate-drive transformers and controlling floating power-device gates, reducing power dissipation and thermal stress in controller devices by moving gate-charge power losses into the controller. Finally, emerging wide band-gap power-device technologies such as GaN based switches, which are capable of supporting very high switching frequency operation, are driving special requirements in terms of gate-drive capability. These requirements include operation at low VDD voltages (5 V or lower), low propagation delays, tight delay matching and availability in compact, low-inductance packages with good thermal capability. In summary, gate-driver devices are an extremely important component in switching power combining benefits of high-performance, low-cost, component-count, board-space reduction, and simplified system design. 9.2 Typical Application ENB UCC27524A-Q1 ENA 1 ENA INA 2 INA 3 GND 4 INB ENB 8 OUTA 7 VDD 6 OUTB 5 V+ GND INB GND GND Figure 26. UCC27524A-Q1 Typical Application Diagram 18 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 Typical Application (continued) 9.2.1 Design Requirements When selecting the proper gate driver device for an end application, some desiring considerations must be evaluated first in order to make the most appropriate selection. Among these considerations are VDD, UVLO, Drive current and power dissipation. 9.2.2 Detailed Design Procedure 9.2.2.1 VDD and Undervoltage Lockout The UCC27524A-Q1 device has an internal undervoltage-lockout (UVLO) protection feature on the VDD pin supply circuit blocks. When VDD is rising and the level is still below UVLO threshold, this circuit holds the output low, regardless of the status of the inputs. The UVLO is typically 4.25 V with 350-mV typical hysteresis. This hysteresis prevents chatter when low VDD supply voltages have noise from the power supply and also when there are droops in the VDD bias voltage when the system commences switching and there is a sudden increase in IDD. The capability to operate at low voltage levels such as below 5 V, along with best in class switching characteristics, is especially suited for driving emerging GaN power semiconductor devices. For example, at power up, the UCC27524A-Q1 driver-device output remains low until the VDD voltage reaches the UVLO threshold if enable pin is active or floating. The magnitude of the OUT signal rises with VDD until steady-state VDD is reached. The operation in Figure 27 shows that the output remains low until the UVLO threshold is reached, and then the output is in-phase with the input. Because the device draws current from the VDD pin to bias all internal circuits, for the best high-speed circuit performance, two VDD bypass capacitors are recommended to prevent noise problems. The use of surface mount components is highly recommended. A 0.1-F ceramic capacitor must be located as close as possible to the VDD to GND pins of the gate-driver device. In addition, a larger capacitor (such as 1-F) with relatively low ESR must be connected in parallel and close proximity, in order to help deliver the high-current peaks required by the load. The parallel combination of capacitors presents a low impedance characteristic for the expected current levels and switching frequencies in the application. VDD Threshold VDD EN IN OUT UDG-11228 Figure 27. Power-Up Non-Inverting Driver 9.2.2.2 Drive Current and Power Dissipation The UCC27524A-Q1 driver is capable of delivering 5-A of current to a MOSFET gate for a period of severalhundred nanoseconds at VDD = 12 V. High peak current is required to turn the device ON quickly. Then, to turn the device OFF, the driver is required to sink a similar amount of current to ground which repeats at the operating frequency of the power device. The power dissipated in the gate driver device package depends on the following factors: * Gate charge required of the power MOSFET (usually a function of the drive voltage VGS, which is very close to input bias supply voltage VDD due to low VOH drop-out) * Switching frequency Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 19 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Typical Application (continued) * Use of external gate resistors Because UCC27524A-Q1 features very low quiescent currents and internal logic to eliminate any shoot-through in the output driver stage, their effect on the power dissipation within the gate driver can be safely assumed to be negligible. When a driver device is tested with a discrete, capacitive load calculating the power that is required from the bias supply is fairly simple. The energy that must be transferred from the bias supply to charge the capacitor is given by Equation 1. 1 EG = CLOAD VDD2 2 where * * 20 CLOAD is the load capacitor VDD2 is the bias voltage feeding the driver Submit Documentation Feedback (1) Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 Typical Application (continued) There is an equal amount of energy dissipated when the capacitor is charged. This leads to a total power loss given by Equation 2. PG = CLOAD VDD2 fSW where * fSW is the switching frequency (2) With VDD = 12 V, CLOAD = 10 nF and fSW = 300 kHz the power loss is calculated with Equation 3. PG = 10nF 12 V 2 300kHz = 0.432 W (3) The switching load presented by a power MOSFET is converted to an equivalent capacitance by examining the gate charge required to switch the device. This gate charge includes the effects of the input capacitance plus the added charge needed to swing the drain voltage of the power device as it switches between the ON and OFF states. Most manufacturers provide specifications that provide the typical and maximum gate charge, in nC, to switch the device under specified conditions. Using the gate charge Qg, the power that must be dissipated when charging a capacitor is determined which by using the equivalence Qg = CLOADVDD to provide Equation 4 for power: PG = CLOAD VDD2 fSW = Qg VDD fSW (4) Assuming that the UCC27524A-Q1 device is driving power MOSFET with 60 nC of gate charge (Qg = 60 nC at VDD = 12 V) on each output, the gate charge related power loss is calculated with Equation 5. PG = 2 x 60nC 12 V 300kHz = 0.432 W (5) This power PG is dissipated in the resistive elements of the circuit when the MOSFET turns on or turns off. Half of the total power is dissipated when the load capacitor is charged during turnon, and the other half is dissipated when the load capacitor is discharged during turnoff. When no external gate resistor is employed between the driver and MOSFET/IGBT, this power is completely dissipated inside the driver package. With the use of external gate drive resistors, the power dissipation is shared between the internal resistance of driver and external gate resistor in accordance to the ratio of the resistances (more power dissipated in the higher resistance component). Based on this simplified analysis, the driver power dissipation during switching is calculated as follows (see Equation 6): ae o ROFF RON PSW = 0.5 QG VDD fSW c + / e ROFF + RGATE RON + RGATE o where * * ROFF = ROL RON (effective resistance of pullup structure) = 1.5 x ROL (6) In addition to the above gate-charge related power dissipation, additional dissipation in the driver is related to the power associated with the quiescent bias current consumed by the device to bias all internal circuits such as input stage (with pullup and pulldown resistors), enable, and UVLO sections. As shown in Figure 4, the quiescent current is less than 0.6 mA even in the highest case. The quiescent power dissipation is calculated easily with Equation 7. PQ = IDD VDD (7) Assuming , IDD = 6 mA, the power loss is: PQ = 0.6 mA 12 V = 7.2mW (8) Clearly, this power loss is insignificant compared to gate charge related power dissipation calculated earlier. With a 12-V supply, the bias current is estimated as follows, with an additional 0.6-mA overhead for the quiescent consumption: P 0.432 W IDD ~ G = = 0.036 A VDD 12 V (9) Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 21 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com Typical Application (continued) 9.2.3 Application Curves Figure 28 and Figure 29 show the typical switching characteristics of the UCC27524A-Q1 device. CL = 1.8 nF, VDD = 12 V CL = 1.8 nF, VDD = 12 V Figure 28. Typical Turnon Waveform Figure 29. Typical Turnoff Waveform 10 Power Supply Recommendations The bias supply voltage range for which the UCC27524A-Q1 device is rated to operate is from 4.5 V to 18 V. The lower end of this range is governed by the internal undervoltage-lockout (UVLO) protection feature on the VDD pin supply circuit blocks. Whenever the driver is in UVLO condition when the VDD pin voltage is below the VON supply start threshold, this feature holds the output low, regardless of the status of the inputs. The upper end of this range is driven by the 20-V absolute maximum voltage rating of the VDD pin of the device (which is a stress rating). Keeping a 2-V margin to allow for transient voltage spikes, the maximum recommended voltage for the VDD pin is 18 V. The UVLO protection feature also involves a hysteresis function. This means that when the VDD pin bias voltage has exceeded the threshold voltage and device begins to operate, and if the voltage drops, then the device continues to deliver normal functionality unless the voltage drop exceeds the hysteresis specification VDD_H. Therefore, ensuring that, while operating at or near the 4.5-V range, the voltage ripple on the auxiliary power supply output is smaller than the hysteresis specification of the device is important to avoid triggering device shutdown. During system shutdown, the device operation continues until the VDD pin voltage has dropped below the VOFF threshold which must be accounted for while evaluating system shutdown timing design requirements. Likewise, at system startup, the device does not begin operation until the VDD pin voltage has exceeded above the VON threshold. The quiescent current consumed by the internal circuit blocks of the device is supplied through the VDD pin. Although this fact is well known, recognizing that the charge for source current pulses delivered by the OUTA/B pin is also supplied through the same VDD pin is important. As a result, every time a current is sourced out of the output pins, a corresponding current pulse is delivered into the device through the VDD pin. Thus ensuring that local bypass capacitors are provided between the VDD and GND pins and located as close to the device as possible for the purpose of decoupling is important. A low ESR, ceramic surface mount capacitor is a must. TI recommends having 2 capacitors; a 100-nF ceramic surface-mount capacitor which can be nudged very close to the pins of the device and another surface-mount capacitor of few microfarads added in parallel. 22 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 11 Layout 11.1 Layout Guidelines Proper PCB layout is extremely important in a high-current fast-switching circuit to provide appropriate device operation and design robustness. The UCC27524A-Q1 gate driver incorporates short propagation delays and powerful output stages capable of delivering large current peaks with very fast rise and fall times at the gate of power MOSFET to facilitate voltage transitions very quickly. At higher VDD voltages, the peak current capability is even higher (5-A peak current is at VDD = 12 V). Very high di/dt causes unacceptable ringing if the trace lengths and impedances are not well controlled. The following circuit layout guidelines are strongly recommended when designing with these high-speed drivers. * Locate the driver device as close as possible to power device in order to minimize the length of high-current traces between the output pins and the gate of the power device. * Locate the VDD bypass capacitors between VDD and GND as close as possible to the driver with minimal trace length to improve the noise filtering. These capacitors support high peak current being drawn from VDD during turnon of power MOSFET. The use of low inductance surface-mounted-device (SMD) components such as chip resistors and chip capacitors is highly recommended. * The turnon and turnoff current loop paths (driver device, power MOSFET and VDD bypass capacitor) must be minimized as much as possible in order to keep the stray inductance to a minimum. High di/dt is established in these loops at two instances during turnon and turnoff transients which induces significant voltage transients on the output pin of the driver device and Gate of the power MOSFET. * Wherever possible, parallel the source and return traces to take advantage of flux cancellation * Separate power traces and signal traces, such as output and input signals. * Star-point grounding is a good way to minimize noise coupling from one current loop to another. The GND of the driver is connected to the other circuit nodes such as source of power MOSFET and ground of PWM controller at one, single point. The connected paths must be as short as possible to reduce inductance and be as wide as possible to reduce resistance. * Use a ground plane to provide noise shielding. Fast rise and fall times at OUT may corrupt the input signals during transition. The ground plane must not be a conduction path for any current loop. Instead the ground plane must be connected to the star-point with one single trace to establish the ground potential. In addition to noise shielding, the ground plane can help in power dissipation as well * Exercise caution when replacing the UCC2732x/UCC2742x devices with the UCC27524A-Q1 device: - The UCC27524A-Q1 device is a much stronger gate driver (5-A peak current versus 4-A peak current). - The UCC27524A-Q1 device is a much faster gate driver (13-ns/13-ns rise and fall propagation delay versus 25-ns/35-ns rise and fall propagation delay). Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 23 UCC27524A-Q1 SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 www.ti.com 11.2 Layout Example Power stage current Output loop of driver bias loop (bypass capacitor) Figure 30. UCC27524A-Q1 Layout Example 11.3 Thermal Considerations The useful range of a driver is greatly affected by the drive power requirements of the load and the thermal characteristics of the device package. In order for a gate driver device to be useful over a particular temperature range the package must allow for the efficient removal of the heat produced while keeping the junction temperature within rated limits. For detailed information regarding the thermal information table, please refer to Application Note from Texas Instruments entitled, Semiconductor and IC Package Thermal Metrics (SPRA953). Among the different package options available for the UCC27524A-Q1 device, power dissipation capability of the DGN package is of particular mention. The HVSSOP-8 (DGN) package offers a means of removing the heat from the semiconductor junction through the bottom of the package. This package offers an exposed thermal pad at the base of the package. This pad is soldered to the copper on the printed circuit board directly underneath the device package, reducing the thermal resistance to a very low value. This allows a significant improvement in heat-sinking over that available in the D package. The printed circuit board must be designed with thermal lands and thermal vias to complete the heat removal subsystem. Note that the exposed pads in the HVSSOP-8 package are not directly connected to any leads of the package, however, the PowerPAD is electrically and thermally connected to the substrate of the device which is the ground of the device. TI recommends to externally connect the exposed pads to GND in PCB layout for better EMI immunity. 24 Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 UCC27524A-Q1 www.ti.com SLVSCC1B - NOVEMBER 2013 - REVISED SEPTEMBER 2015 12 Device and Documentation Support 12.1 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2ETM Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.2 Trademarks PowerPad, E2E are trademarks of Texas Instruments. All other trademarks are the property of their respective owners. 12.3 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 12.4 Glossary SLYZ022 -- TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Submit Documentation Feedback Copyright (c) 2013-2015, Texas Instruments Incorporated Product Folder Links: UCC27524A-Q1 25 PACKAGE OPTION ADDENDUM www.ti.com 4-May-2017 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (C) Device Marking (4/5) UCC27524AQDGNRQ1 NRND MSOPPowerPAD DGN 8 2500 Green (RoHS & no Sb/Br) CU NIPDAUAG Level-2-260C-1 YEAR -40 to 140 7524Q UCC27524AQDRQ1 ACTIVE SOIC D 8 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 140 524AQ (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 4-May-2017 OTHER QUALIFIED VERSIONS OF UCC27524A-Q1 : * Catalog: UCC27524A NOTE: Qualified Version Definitions: * Catalog - TI's standard catalog product Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 24-Jul-2015 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant UCC27524AQDGNRQ1 MSOPPower PAD DGN 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1 UCC27524AQDRQ1 SOIC D 8 3000 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 24-Jul-2015 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) UCC27524AQDGNRQ1 MSOP-PowerPAD DGN 8 2500 366.0 364.0 50.0 UCC27524AQDRQ1 SOIC D 8 3000 367.0 367.0 35.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated (TI) reserves the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. TI's published terms of sale for semiconductor products (http://www.ti.com/sc/docs/stdterms.htm) apply to the sale of packaged integrated circuit products that TI has qualified and released to market. Additional terms may apply to the use or sale of other types of TI products and services. Reproduction of significant portions of TI information in TI data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such reproduced documentation. Information of third parties may be subject to additional restrictions. Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Buyers and others who are developing systems that incorporate TI products (collectively, "Designers") understand and agree that Designers remain responsible for using their independent analysis, evaluation and judgment in designing their applications and that Designers have full and exclusive responsibility to assure the safety of Designers' applications and compliance of their applications (and of all TI products used in or for Designers' applications) with all applicable regulations, laws and other applicable requirements. Designer represents that, with respect to their applications, Designer has all the necessary expertise to create and implement safeguards that (1) anticipate dangerous consequences of failures, (2) monitor failures and their consequences, and (3) lessen the likelihood of failures that might cause harm and take appropriate actions. Designer agrees that prior to using or distributing any applications that include TI products, Designer will thoroughly test such applications and the functionality of such TI products as used in such applications. TI's provision of technical, application or other design advice, quality characterization, reliability data or other services or information, including, but not limited to, reference designs and materials relating to evaluation modules, (collectively, "TI Resources") are intended to assist designers who are developing applications that incorporate TI products; by downloading, accessing or using TI Resources in any way, Designer (individually or, if Designer is acting on behalf of a company, Designer's company) agrees to use any particular TI Resource solely for this purpose and subject to the terms of this Notice. TI's provision of TI Resources does not expand or otherwise alter TI's applicable published warranties or warranty disclaimers for TI products, and no additional obligations or liabilities arise from TI providing such TI Resources. TI reserves the right to make corrections, enhancements, improvements and other changes to its TI Resources. TI has not conducted any testing other than that specifically described in the published documentation for a particular TI Resource. Designer is authorized to use, copy and modify any individual TI Resource only in connection with the development of applications that include the TI product(s) identified in such TI Resource. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE TO ANY OTHER TI INTELLECTUAL PROPERTY RIGHT, AND NO LICENSE TO ANY TECHNOLOGY OR INTELLECTUAL PROPERTY RIGHT OF TI OR ANY THIRD PARTY IS GRANTED HEREIN, including but not limited to any patent right, copyright, mask work right, or other intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information regarding or referencing third-party products or services does not constitute a license to use such products or services, or a warranty or endorsement thereof. Use of TI Resources may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. TI RESOURCES ARE PROVIDED "AS IS" AND WITH ALL FAULTS. TI DISCLAIMS ALL OTHER WARRANTIES OR REPRESENTATIONS, EXPRESS OR IMPLIED, REGARDING RESOURCES OR USE THEREOF, INCLUDING BUT NOT LIMITED TO ACCURACY OR COMPLETENESS, TITLE, ANY EPIDEMIC FAILURE WARRANTY AND ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, AND NON-INFRINGEMENT OF ANY THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. TI SHALL NOT BE LIABLE FOR AND SHALL NOT DEFEND OR INDEMNIFY DESIGNER AGAINST ANY CLAIM, INCLUDING BUT NOT LIMITED TO ANY INFRINGEMENT CLAIM THAT RELATES TO OR IS BASED ON ANY COMBINATION OF PRODUCTS EVEN IF DESCRIBED IN TI RESOURCES OR OTHERWISE. IN NO EVENT SHALL TI BE LIABLE FOR ANY ACTUAL, DIRECT, SPECIAL, COLLATERAL, INDIRECT, PUNITIVE, INCIDENTAL, CONSEQUENTIAL OR EXEMPLARY DAMAGES IN CONNECTION WITH OR ARISING OUT OF TI RESOURCES OR USE THEREOF, AND REGARDLESS OF WHETHER TI HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Unless TI has explicitly designated an individual product as meeting the requirements of a particular industry standard (e.g., ISO/TS 16949 and ISO 26262), TI is not responsible for any failure to meet such industry standard requirements. Where TI specifically promotes products as facilitating functional safety or as compliant with industry functional safety standards, such products are intended to help enable customers to design and create their own applications that meet applicable functional safety standards and requirements. Using products in an application does not by itself establish any safety features in the application. Designers must ensure compliance with safety-related requirements and standards applicable to their applications. Designer may not use any TI products in life-critical medical equipment unless authorized officers of the parties have executed a special contract specifically governing such use. Life-critical medical equipment is medical equipment where failure of such equipment would cause serious bodily injury or death (e.g., life support, pacemakers, defibrillators, heart pumps, neurostimulators, and implantables). Such equipment includes, without limitation, all medical devices identified by the U.S. Food and Drug Administration as Class III devices and equivalent classifications outside the U.S. TI may expressly designate certain products as completing a particular qualification (e.g., Q100, Military Grade, or Enhanced Product). Designers agree that it has the necessary expertise to select the product with the appropriate qualification designation for their applications and that proper product selection is at Designers' own risk. Designers are solely responsible for compliance with all legal and regulatory requirements in connection with such selection. Designer will fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of Designer's noncompliance with the terms and provisions of this Notice. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright (c) 2017, Texas Instruments Incorporated Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: Texas Instruments: UCC27524AQDGNRQ1 UCC27524AQDRQ1 UCC27524A1QDGNRQ1