1N5223B thru 1N5271B
Zener Diode, 1/2 Watt
5% Tolerance
Features:
DZener Voltage 2.7 to 100V
DDO35 Package
Absolute Maximum Ratings: (TA = +25C unless otherwise specified)
Operating Junction Temperature Range, Topr −65 to +200C.................................
Storage Temperature Range, Tstg −65 to +200C..........................................
DC Power Dissipation, PD500mW.......................................................
Derate Above 75C 4.0mW/C.....................................................
Forward Voltage (IF = 200mA), VF1.1V...................................................
Electrical Characteristics: (TC = +25C, unless otherwise specified)
Device
Number
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
Zener
Test
Current
(Izt)
Maximum Dynamic
Impedance (Note 3) Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts mA Ohms Ohms A Volts %/C
1N5223B 2.7 20 30 1300 75 1.0 −0.080
1N5225B 3.0 20 29 1600 50 1.0 −0.075
1N5226B 3.3 20 28 1600 25 1.0 −0.070
1N5227B 3.6 20 24 1700 15 1.0 −0.065
1N5228B 3.9 20 23 1900 10 1.0 −0.060
1N5229B 4.3 20 22 2000 5 1.0 0.055
1N5230B 4.7 20 19 1900 5 2.0 0.030
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified)
Device
Numbe
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
Zener
Test
Current
(Izt)
Maximum Dynamic
Impedance (Note 3) Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts mA Ohms Ohms A Volts %/C
1N5231B 5.1 20 17 1600 5 2.0 0.030
1N5232B 5.6 20 11 1600 5 3.0 +0.038
1N5233B 6.0 20 7 1600 5 3.5 +0.038
1N5234B 6.2 20 7 1000 5 4.0 0.045
1N5235B 6.8 20 5 750 3 5.0 0.050
1N5236B 7.5 20 6 500 3 6.0 0.058
1N5237B 8.2 20 8 500 3 6.5 0.062
1B5238B 8.7 20 8 600 3 6.5 0.065
1N5239B 9.1 20 10 600 3 7.0 0.068
1N5240B 10 20 17 600 3 8.0 0.075
1N5241B 11 20 22 600 2 8.4 0.076
1N5242B 12 20 30 600 1 9.1 0.077
1N5243B 13 9.5 13 600 0.5 9.9 0.079
1N5244B 14 9.0 15 600 0.1 10 0.082
1N5245B 15 8.5 16 600 0.1 11 0.082
1N5246B 16 7.8 17 600 0.1 12 0.083
1N5247B 17 7.4 19 600 0.1 13 0.084
1N5248B 18 7.0 21 600 0.1 14 0.085
1N5249B 19 6.6 23 600 0.1 14 0.086
1N5250B 20 6.2 25 600 0.1 15 0.086
1N5251B 22 5.6 29 600 0.1 17 0.087
1N5252B 24 5.2 33 600 0.1 18 0.088
1N5253B 25 5.0 35 600 0.1 19 0.089
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified)
Device
Numbe
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
Zener
Test
Current
(Izt)
Maximum Dynamic
Impedance (Note 3) Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts mA Ohms Ohms A Volts %/C
1N5254B 27 4.6 41 600 0.1 21 0.090
1N5255B 28 4.5 44 600 0.1 21 0.091
1N5256B 30 4.2 49 600 0.1 23 0.091
1N5257B 33 3.8 58 700 0.1 25 0.092
1N5258B 36 3.4 70 700 0.1 27 0.093
1N5259B 39 3.2 80 800 0.1 30 0.094
1N5260B 43 3.0 93 900 0.1 33 0.095
1N5261B 47 2.7 105 1000 0.1 36 0.095
1N5262B 51 2.5 125 1100 0.1 39 0.096
1N5263B 56 2.2 150 1300 0.1 43 0.096
1N5266B 68 1.8 230 1600 0.1 52 0.097
1N5267B 75 1.7 270 1700 0.1 56 0.098
1N5270B 91 1.4 400 2300 0.1 69 0.099
1N5271B 100 1.3 500 2600 0.1 76 0.110
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
Color Band Denotes Cathode
1.000
(25.4)
Min
.200
(5.08)
Max
.090 (2.28)
Dia Max
.022 (.509) Dia Max
