18-Bit Registered Transceiver
fax id: 7056
CY74FCT163500
Cypress Semiconductor Corporation 39 01 North First Str e et Sa n Jo se CA 95134 408-943-2600
June 3, 1997
1CY74FCT1635 00
Features
5V tolerant Inputs and O utputs
24 mA balanced drive outputs
Low power, pin-compatible replacement for
LCX, LPT, LVC, LVCH & LVT families
FCT-C speed at 4.6 ns
Power-off disable outputs permits live insertion
Edge-rate control circuitry for significantly improved
noise c h aracteristics
Typical output skew < 250 ps
ESD > 2000V
TSSOP (19.6-mi l pi tch) a nd SSOP ( 2 5-mil pitch)
packages
Extended c ommerci al t emperatur e range of
–40°C to +85°C
•V
CC = 2.7V to 3.6V
Typical VOLP (grou nd bounce) <0.6V
at VCC = 3.3V, TA= 25°C
Functional Description
The CY74FCT163500 is an 18-bit universal bus transceiver
that can be operated in transparent, latched, or clock m od es
by combining D-type latches and D-type flip-flops. Data fl ow in
each direction is controlled by output-enable (OEAB and
OEBA), latch enable (LEAB and LEBA), and clock inputs
(CLKAB and CLKBA) inputs. For A-to-B data flow, the device
operates in transparent mode when LEAB is HIGH. When
LEAB is LOW , the A data i s latched if CLKAB is held at a HIGH
or LOW logic level . If LEAB is LOW, the A bus dat a is stored
in the latch/flip-flop on the HIGH-to-LOW transition of CLKAB.
OEAB performs the output enable function on the B port. Data
flow from B-to-A is similar to that of A-to-B and is controlled by
OEBA, LEBA, and C LKBA.
The CY74FCT163500 has 24-mA balanced output drivers with
curren t limiting resistors in the outputs. This reduces the need
for external term inating resistors and provides for minimal un-
dershoot and reduced ground bounce.The inputs and outputs
are capable of being driven by 5.0V busses, allowing them to
be used in mixed voltage systems as translators. The outputs
are also designed with a power off disable feature enabling
them to be used i n applications requiring live insertion.
GND
LogicBlockDiagram Pin Configuration
1
2
3
4
5
6
7
8
9
10
11
12
33
32
31
30
29
36
35
OEAB
34
SSOP/TSSOP
T op Vie w
13
14
15
16
17
18
19
20
21
22
23
24
45
44
43
42
41
37
38
39
40
48
47
46
LEAB
A1
A2
A3
B1
B2
B3
GND
GND
GND
VCC
A6
A7
A4
A5
B4
B5
B6
B7
VCC
GND
A10
A11
A8
A9
B8
B9
B11
B12
GND
A12
VCC
A16
GND
A14
VCC
A15
A17
TO 17 OTHER CHANNELS
LEAB
OEBA
LEBA
CLKAB
CLKBA
OEAB
C
D
C
D
C
D
C
D
A1B1
25
26
27
28
49
52
51
50
A13
OEBA
LEBA
GND
A18
CLKAB
53
56
55
54
B10
GND
B14
B15
B13
B16
B17
GND
B18
CLKBA
CY74FCT163500
2
Maximum Ratings[5, 6]
(Above which the useful life may be impaired. For user
guidelines, not t ested.)
Stora ge Temperature ................................ 55°C to +125°C
Ambient Temperature with
Power Applied.. ......... ...................... ................ 55°C to +125°C
Supply Voltage Range......................................0.5V to +4.6V
DC Input Volt age.................................................0. 5V to +7.0V
DC Output Volt a ge..............................................0.5V to +7.0V
DC Output Current
(M aximum Sink Current/Pin)...........................60 to +120 mA
Power Dissipation. .......... ............ ............ ....................... 1.0W
Static Discharge Voltage...........................................>2001V
(per MIL-STD-883, Method 3015 )
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance. = HIGH-to-LOW Transition.
2. A-to-B data flow is shown, B-to-A data flow is similar but uses OEBA, LEBA, and CLKBA.
3. Output level before the indicated steady-state input conditions were established.
4. Output level before the indicated steady-state input conditions were established, provided that CLKAB was LOW before LEAB went LOW.
5. Operation beyond the limits set forth may impair the useful life of the device. Unless noted, these limits are over the operating free-air temperature range.
6. Unused inputs must alway s be connected to an appropriate logic voltage level, preferably either VCC or groun d.
Pin Summary
Name Description
OEAB A-to-B Output Enable Input
OEBA B-to-A Out put Enable Input (Active LO W)
LEAB A-to-B Latch Enable Input
LEBA B-to-A Latch Enable Input
CLKAB A-to-B Clock Input (Active LOW)
CLKBA B-to-A Clock Input (Active LOW)
AA-to-B Data Inputs or B-to-A Th ree-State Outputs
B B-to-A Data Inputs or A-to-B Th ree-State Outputs
Function Table[1, 2]
Inputs Outputs
OEAB LEAB CLKAB A B
L X X X Z
H H X L L
H H X H H
H L L L
H L H H
H L H X B[3]
H L L X B[4]
Operating Range
Range Ambient
Temperature VCC
Commercial 40°C to +85°C 2.7V to 3.6V
CY74FCT163500
3
Electrical Characteristics Over the Operating Range VCC=2.7V to 3.6V
Parameter Description Test Conditions Min. Typ.[7] Max. Unit
VIH Input HIGH Voltage All Inputs 2.0 5.5 V
VIL Input LOW Voltage 4 0.8 V
VHInput Hysteresis[8] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=18 mA 0.7 1.2 V
IIH Input HIGH Current VCC=Max., VI=5.5V ±1µA
IIL Input LOW Current VCC=Max., VI=GND. ±1µA
IOZH High Impedance Out put Current
(T hree-State Output pins) VCC=Max., VOUT=5.5V ±1µA
IOZL High Impedance Out put Current
(T hree-State Output pins) VCC=Max., VOUT=GND ±1µA
IODL Output LOW Current[9] VCC=3.3V, VIN=VIH
or VIL, VOUT=1.5V 50 90 200 mA
IODH Output HIGH Current[9] VCC=3.3V, VIN=VIH
or VIL, VOUT=1.5V –36 –60 –110 mA
VOH Output HIGH Voltage VCC=Min., IOH= –0.1 mA VCC–0.2 V
VCC=3.0V, IOH= –8 mA 2.4 3.0 V
VCC=3.0V, IOH= –24 mA 2.0 3.0 V
VOL Output LOW Voltage VCC=Min., IOL= 0.1mA 0.2 V
VCC=Min. , IOL= 24 mA 0.3 0.5
IOS Short Circuit Current[9] VCC=Max., VOUT=GND –60 –135 –240 mA
IOFF Power-Off Disable VCC=0V, VOUT4.5V ±100 µA
Capacitance[8] (TA = +25°C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.[7] Max. Unit
CIN Input Capacitance VIN = 0V 4.5 6.0 pF
COUT Output C apacitance VOUT = 0V 5.5 8.0 pF
Notes:
7. Typical values are at VCC= 3 .3 V, TA= +25° C amb ie nt.
8. This parameter is guaranteed but not tested.
9. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of hi gh-sp eed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorti ng
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be per formed l ast.
CY74FCT163500
4
Power Supply Characteristics
Parameter Description Test Conditions Typ.[7] Max. Unit
ICC Quiescent Power Supply Cur-
rent VCC=Max. VIN0.2V,
VINVCC0.2V 0.1 10 µA
ICC Quiescent Power Supply Cur-
rent (TTL inputs HIGH) VCC=Max. VIN=VCC–0.6V[10] 2.0 30 µA
ICCD Dynam ic Power S upply
Current[11] VCC=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
OEAB=OEBA=VCC or GND
VIN=VCC or
VIN=GND 50 75 µA/MHz
ICTotal Power Supply Current[12] VCC=Max., f0=10 MHz
(CLKAB), f1=5 MHz, 50% Duty
Cycle, Outputs Open,
One Bit Toggling,
OEAB=OEBA=VCC
LEAB=GND
VIN=VCC or
VIN=GND 0.5 0.8 mA
VIN=VCC–0.6V or
VIN=GND 0.5 0.8 mA
VCC=Max., f0=10 MHz,
f1=2.5 M Hz, 5 0% Duty
Cycle, Outputs Open,
Eighteen Bits Toggling,
OEAB=OEBA=VCC
LEAB=GND
VIN=VCC or
VIN=GND 2.5 3.8[13] mA
VIN=VCC–0.6V or
VIN=GND 2.6 4.1[13] mA
Notes:
10. Per TTL driven input; all o ther inputs at V CC or GND.
11. This parameter is not directly testable, but is derived for us e in Total Power S uppl y calcul atio ns.
12. IC=I
QUIESCENT + IINPUTS + IDYNAMIC
IC=I
CC+ICCDHNT+ICCD(f0NC /2 + f1N1)
ICC = Quiescent Current with CMOS input levels
ICC = Power Supply Current for a TTL HIGH input (VIN=3.4V)
DH = Duty Cycle for TTL inputs HIGH
NT = Number of TTL inputs at DH
ICCD = Dynamic Current caused by an input tr ansition pair (HLH or LHL)
f0= Clock frequency for registered devices, otherwise zero
NC= Number of clock inputs changing at f1
f1= Input signal frequency
N1= Number of inputs changing at f1
All currents are in milliamps and all frequencies are in megahertz.
13. Values for these conditions are examples of the ICC formula. These limits are guar anteed but no t tested .
CY74FCT163500
5
Document #: 3800624
Switching Characteristics Over the Operating Range[14,17]
CY74FCT163500A CY74FCT163500C
Fig. No.[15]
Parameter Description Min. Max. Min. Max. Unit
fMAX CLKAB or CLKBA frequen cy 150 150 MHz
tPLH
tPHL Pr o pagation Delay
A to B or B to A 1.5 5.1 1.5 4.6 ns 1, 3
tPLH
tPHL Pr o pagation Delay
LEBA to A, LEAB to B 1.5 5.6 1.5 5.3 ns 1, 5
tPLH
tPHL Pr o pagation Delay
CLKBA to A , CLKAB to B 1.5 5.6 1.5 5.3 ns 1, 5
tPZH
tPZL Output Enable Time
OEBA to A , OEAB to B 1.5 6.0 1.5 5.4 ns 1, 7, 8
tPHZ
tPLZ Output Disable Time
OEBA to A , OEAB to B 1.5 5.6 1.5 5.2 ns 1, 7, 8
tSU Set-Up Time, HIGH or LOW
A to CLKAB, B t o C L KB A 3.0 3.0 ns 9
tHHold Time, HIGH or LOW
A to CLKAB, B t o C L KB A 0 0 ns 9
tSU Set-Up Time, HIGH or LOW
A to LEAB, B to LEBA Clock HIGH 3.0 3.0 ns 4
Clock LOW 1.5 1.5 ns 4
tHHold Time, HIGH or LOW
A to LEAB, B to LEBA 1.5 1.5 ns 4
tWLEAB or LEBA Pulse Width HIGH 3.0 2.5 ns 5
tWCLKAB or CLKBA Pul se Width HIGH or LOW 3.0 3.0 ns 5
tSK(O) Output Skew[16] 0.5 0.5 ns
Orderin g Inf ormation CY 74FCT163500
Speed
(ns) Order ing Code Package
Name Package Typ e Operating
Range
4.6 CY74FCT163500CPAC Z56 56-Lead (240-Mil) TSSOP Commercial
CY74FCT163500CPVC O56 5 6 -Lead (300-Mil) SSOP
5.1 CY74FCT163500APAC Z56 56-Lead (2 40-Mil) TSSOP Commercial
CY74FCT163500APVC O56 5 6 -Lead (300-Mil) SSOP
Notes:
14. Minimum limits are guaranteed but not tested on Propagation Delays.
15. See “Parameter Measurement Inform ationin the General Information section.
16. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
17. For VCC =2.7, propagation delay, output enable and output disable times should be degraded by 20%.
CY74FCT163500
© Cypress Semiconductor Corporation, 1997. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry othe r than circui try embodi ed in a Cypress Semicondu ctor product. Nor does it convey o r im ply any li cense under patent or other rights . Cypress Semicondu ctor does not authori ze
its products for use as critical components in life-support systems wher e a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusi on of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
Package Diagrams
56-Lead Shrunk Small Outline Package O56
56-Lead Thin Shrunk Small Outline Package Z56