1W POWER PHEMT
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
1
Datasheet v3.0
FPD1
500
FEATURES:
• 29 dBm Linear Output Power at 12 GHz
• 9 dB Power Gain at 12 GHz
• 12.5 dB Max Stable Gain at 12 GHz
• 41 dBm Output IP3
• 35% Power-Added Efficiency
GENERAL DESCRIPTION:
The FPD1500 is an AlGaAs/InGaAs
pseudomorphic High Electron Mobility
Transistor (PHEMT), featuring a 0.25 µm by
1500 µm Schottky barrier gate, defined by high
-resolution stepper-based photolithography.
The recessed gate structure minimizes
parasitics to optimize performance. The
epitaxial structure and processing have been
optimized for reliable high-power applications.
The FPD1500 is also available in the low cost
plastic SOT89 and DFN p ackages.
ELECTRICAL SPECIFICATIONS1:
LAYOUT:
TYPICAL APPLICATIONS:
• Narrowband and broadba nd high-
performance amplifiers
• SATCOM uplink transmitters
• PCS/Cellular low-voltage high-efficien cy
output amplifiers
• Medium-haul digital radio transmitters
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Power at 1dB Gain Compression P1dB VDS = 8 V; IDS = 50% IDSS 28.5 30.0 dBm
Maximum Stable Gain (S21/S12) MSG VDS = 8 V; IDS = 50% IDSS 11.5 12.5 dB
Power Gain at P1dB G1dB VDS = 8 V; IDS = 50% IDSS 8.0 9.0 dB
Power-Added Efficiency PAE VDS = 8 V; IDS = 50% IDSS; POUT = P1dB 45 %
Output Third-Order Intercept Point
(from 15 to 5 dB below P1dB)
IP3 VDS = 8V; IDS = 50% IDSS
Matched for optimal power; Tuned for best IP3
41
43
dBm
Saturated Drain-Source Current IDSS VDS = 1.3 V; VGS = 0 V 375 465 550 mA
Maximum Drain-Source Current IMAX VDS = 1.3 V; VGS ≅ +1 V 750 mA
Transconductance GM VDS = 1.3 V; VGS = 0 V 400 mS
Gate-Source Leakage Current IGSO VGS = -5 V 1 15 µA
Pinch-Off Voltage |VP| VDS = 1.3 V; IDS = 1.5 mA 0.7 1.0 1.3 V
Gate-Source Breakdown Voltage |VBDGS| IGS = 1.5 mA 12.0 14.0 V
Gate-Drain Breakdown Voltage |VBDGD| IGD = 1.5 mA 14.5 16.0 V
Thermal Resistivity (see Notes) θJC VDS > 6V 42 °C/W
Note:1 TAmbient = 22°C; RF specifications measured at f = 12 GHz using CW signal
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
2
Datasheet v3.0
FPD1
500
ABSOLUTE MAXIMUM RATING1:
PARAMETER SYMBOL TEST CONDITIONS ABSOLUTE MAXIMUM
Drain-Source Voltage VDS -3V < VGS < -0.5V 610V
Gate-Source Voltage VGS 0V < VDS < +8V -3V
Drain-Source Current IDS For VDS < 2V IDss
Gate Current IG Forward or reverse current 15mA
RF Input Power PIN Under any acceptable bias state 25dBm
Channel Operating Temperature TCH Under any acceptable bias state 175°C
Storage Temperature TSTG Non-Operating Storage -65°C to 150°C
Total Power Dissipation PTOT See De-Rating Note below 3.6W
Simultaneous Combination of Limits4 2 or more Max. Limits 80%
Notes:
1TAmbient = 22°C unless otherwise noted; exceeding any one of these absolute maximum ratings may caus e
permanent damage to the dev ice
2Total Power Dissipation defined as: PTOT ≡ (PDC + PIN) – POUT,
where PDC: DC Bias Power, PIN: RF Input Power, POUT: RF Output Power
3Total Power Dissipation to be de-rated as follows above 22°C:
PTOT= 3.6 - (0.024W/°C) x THS
where THS= heatsink or ambient temperature above 22°C
Example: For a 85°C carrier temperature: PTOT = 3.6 - (0.024 x (85 – 22)) = 2.09W
4Users should avoid exceedi ng 80% of 2 or more Limits simultaneously
5 Thermal Resitivity specification assum es a Au/Sn eutectic die attach onto a Au-plated copper heatsink or rib.
6 Operating at absolute maximum VD continuously is not recommended. If operation at 10V is conside red then
IDS must be reduced in order to keep the par t within it's thermal power dissipation limits. Therefore VGS is
restricted to < -0.5V.
PAD LAYOUT:
Note: Co-ordinates are referenced from the bottom left hand corner of the die to the centre of bond pad opening
PAD
DESCRIPTION
PIN
COORDINATES
(µm)
A1 Gate Pad 130, 330
A2 Gate Pad 130, 190
B1 Drain Pad 390, 330
B2 Drain Pad 390, 190
CSource Pad
DIE SIZE
B1
A1
B2
A2
C
(µm) DIE THICKNESS (µm) MIN. BOND PAD OPENING
(µm x µm )
470 x 530 75 60 x 60
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
3
Datasheet v3.0
FPD1
500
PREFERRED ASSEMBLY INSTRUCTIONS: PART NUMBER DESCRIPTION
FPD1500 Die
GaAs devices are fragile and should be
handled with great care. Specially designed
collets should be used where possible.
The recommended die attach is gold/tin
eutectic solder under a nitrogen atmosphere.
Stage temperature should be 280-290°C;
maximum time at temperature is one minute.
The recommended wire bond method is
thermo-compression wedge bonding with 0.7
or 1.0 mil (0.018 or 0.025 mm) gold wire.
Stage temperature should be 250-260°C.
HANDLING
PRECAUTIONS:
To avoid damage to the devices care should
be exercised during handling. Proper
Electrostatic Discharge (ESD) precautions
should be observed at all stages of storage,
handling, assembly, and testing. These
devices should be treated as Class 0 (0-0 V)
as defined in JEDEC Standard No. 22-A114.
Further information on ESD control measures
can be found in MIL-STD-1686 and MIL-
HDBK-263.
APPLICATION NOTES & DESIGN DATA:
Application Notes and design data including S-
parameters, noise parameters and device
model are available on request.
DISCLAIMERS:
This product is not designed for use in any
space based or life sustaining/supporting
equipment.
ORDERING INFORMATION:
