1
Features
Fast Read Access Time – 70 ns
5-volt Only Reprogramming
Sector Program Operation
Single Cycle Reprogram (Erase and Program)
1024 Sectors (128 Bytes/sector)
Internal Address and Data Latches for 128 Bytes
Two 8K Bytes Boot Blocks with Lockout
Internal Program Control and Timer
Hardware and Software Data Protection
Fast Sector Program Cycle Time – 10 ms
DATA Polling for End of Program Detection
Low Power Dissipation
50 mA Active Current
100 µA CMOS Standby Current
Typical Endurance > 10,000 Cycles
Single 5V ± 10% Supply
CMOS and TTL Compatible Inputs and Outputs
Commercial and Industrial Temperature Ranges
Description
The AT29C010A is a 5-volt-only in-system Flash programmable and erasable read
only memory (PEROM). Its 1 megabit of memory is organized as 131,072 words by
8 bits. Manufactured with Atmels advanced nonvolatile CMOS technology, the device
offers access times to 70 ns with power dissipation of just 275 mW over the commer-
cial temperature range. When the device is deselected, the CMOS standby current is
1-megabit
(128K x 8)
5-volt Only
Flash Memory
AT29C010A
Rev. 0394F–FLASH–02/03
Pin Configurations
Pin Name Function
A0 - A16 Addresses
CE Chip Enable
OE Output Enable
WE Write Enable
I/O0 - I/O7 Data Inputs/Outputs
NC No Connect
TSOP Top View
Type 1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A11
A9
A8
A13
A14
NC
WE
VCC
NC
A16
A15
A12
A7
A6
A5
A4
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
PLCC Top View
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
A14
A13
A8
A9
A11
OE
A10
CE
I/O7
4
3
2
1
32
31
30
14
15
16
17
18
19
20
I/O1
I/O2
GND
I/O3
I/O4
I/O5
I/O6
A12
A15
A16
NC
VCC
WE
NC
DIP Top View
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
NC
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
VCC
WE
NC
A14
A13
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
2AT29C010A
0394F–FLASH–02/03
less than 100 µA. The device endurance is such that any sector can typically be written
to in excess of 10,000 times.
To allow for simple in-system reprogrammability, the AT29C010A does not require high
input voltages for programming. Five-volt-only commands determine the operation of
the device. Reading data out of the device is similar to reading from an EPROM. Repro-
gramming the AT29C010A is performed on a sector basis; 128 bytes of data are loaded
into the device and then simultaneously programmed.
During a reprogram cycle, the address locations and 128 bytes of data are internally
latched, freeing the address and data bus for other operations. Following the initiation of
a program cycle, the device will automatically erase the sector and then program the
latched data using an internal control timer. The end of a program cycle can be detected
by DATA polling of I/O7. Once the end of a program cycle has been detected, a new
access for a read or program can begin.
Block Diagram
Device Operation READ: The AT29C010A is accessed like an EPROM. When CE and OE are low and
WE is high, the data stored at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high impedance state whenever CE
or OE is high. This dual-line control gives designers flexibility in preventing bus
contention.
BYTE LOAD: Byte loads are used to enter the 128 bytes of a sector to be programmed
or the software codes for data protection. A byte load is performed by applying a low
pulse on the WE or CE input with CE or WE low (respectively) and OE high. The
address is latched on the falling edge of CE or WE, whichever occurs last. The data is
latched by the first rising edge of CE or WE.
PROGRAM: The device is reprogrammed on a sector basis. If a byte of data within a
sector is to be changed, data for the entire sector must be loaded into the device. The
data in any byte that is not loaded during the programming of its sector will be indetermi-
nate. Once the bytes of a sector are loaded into the device, they are simultaneously
programmed during the internal programming period. After the first data byte has been
loaded into the device, successive bytes are entered in the same manner. Each new
byte to be programmed must have its high to low transition on WE (or CE) within 150 µs
of the low to high transition of WE (or CE) of the preceding byte. If a high to low transi-
tion is not detected within 150 µs of the last low to high transition, the load period will
end and the internal programming period will start. A7 to A16 specify the sector address.
3
AT29C010A
0394F–FLASH–02/03
The sector address must be valid during each high to low transition of WE (or CE). A0 to
A6 specify the byte address within the sector. The bytes may be loaded in any order;
sequential loading is not required. Once a programming operation has been initiated,
and for the duration of tWC, a read operation will effectively be a polling operation.
SOFTWARE DATA PROTECTION: A software controlled data protection feature is
available on the AT29C010A. Once the software protection is enabled a software algo-
rithm must be issued to the device before a program may be performed. The software
protection feature may be enabled or disabled by the user; when shipped from Atmel,
the software data protection feature is disabled. To enable the software data protection,
a series of three program commands to specific addresses with specific data must be
performed. After the software data protection is enabled the same three program com-
mands must begin each program cycle in order for the programs to occur. All software
program commands must obey the sector program timing specifications. Once set, the
software data protection feature remains active unless its disable command is issued.
Power transitions will not reset the software data protection feature, however the soft-
ware feature will guard against inadvertent program cycles during power transitions.
Once set, software data protection will remain active unless the disable command
sequence is issued.
After setting SDP, any attempt to write to the device without the 3-byte command
sequence will start the internal write timers. No data will be written to the device; how-
ever, for the duration of tWC, a read operation will effectively be a polling operation.
After the software data protection’s 3-byte command code is given, a byte load is per-
formed by applying a low pulse on the WE or CE input with CE or WE low (respectively)
and OE high. The address is latched on the falling edge of CE or WE, whichever occurs
last. The data is latched by the first rising edge of CE or WE. The 128 bytes of data must
be loaded into each sector by the same procedure as outlined in the program section
under device operation.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent pro-
grams to the AT29C010A in the following ways: (a) VCC sense – if VCC is below 3.8V
(typical), the program function is inhibited; (b) VCC power on delay – once VCC has
reached the VCC sense level, the device will automatically time out 5 ms (typical) before
programming; (c) Program inhibit – holding any one of OE low, CE high or WE high
inhibits program cycles; and (d) Noise filter—pulses of less than 15 ns (typical) on the
WE or CE inputs will not initiate a program cycle.
PRODUCT IDENTIFICATION: The product identification mode identifies the device and
manufacturer as Atmel. It may be accessed by hardware or software operation. The
hardware operation mode can be used by an external programmer to identify the correct
programming algorithm for the Atmel product. In addition, users may wish to use the
software product identification mode to identify the part (i.e. using the device code), and
have the system software use the appropriate sector size for program operations. In this
manner, the user can have a common board design for 256K to 4-megabit densities
and, with each density’s sector size in a memory map, have the system software apply
the appropriate sector size.
For details, see Operating Modes (for hardware operation) or Software Product Identifi-
cation. The manufacturer and device code is the same for both modes.
DATA POLLING: The AT29C010A features DATA polling to indicate the end of a pro-
gram cycle. During a program cycle an attempted read of the last byte loaded will result
in the complement of the loaded data on I/O7. Once the program cycle has been com-
pleted, true data is valid on all outputs and the next cycle may begin. DATA polling may
begin at any time during the program cycle.
4AT29C010A
0394F–FLASH–02/03
TOGGLE BIT: In addition to DATA polling the AT29C010A provides another method
for determining the end of a program or erase cycle. During a program or erase opera-
tion, successive attempts to read data from the device will result in I/O6 toggling
between one and zero. Once the program cycle has completed, I/O6 will stop toggling
and valid data will be read. Examining the toggle bit may begin at any time during a pro-
gram cycle.
OPTIONAL CHIP ERASE MODE: The entire device can be erased by using a 6-byte
software code. Please see Software Chip Erase application note for details.
BOOT BLOCK PROGRAMMING LOCKOUT: The AT29C010A has two designated
memory blocks that have a programming lockout feature. This feature prevents pro-
gramming of data in the designated block once the feature has been enabled. Each of
these blocks consists of 8K bytes; the programming lockout feature can be set indepen-
dently for either block. While the lockout feature does not have to be activated, it can be
activated for either or both blocks.
These two 8K memory sections are referred to as boot blocks. Secure code which will
bring up a system can be contained in a boot block. The AT29C010A blocks are located
in the first 8K bytes of memory and the last 8K bytes of memory. The boot block pro-
gramming lockout feature can therefore support systems that boot from the lower
addresses of memory or the higher addresses. Once the programming lockout feature
has been activated, the data in that block can no longer be erased or programmed; data
in other memory locations can still be changed through the regular programming meth-
ods. To activate the lockout feature, a series of seven program commands to specific
addresses with specific data must be performed. Please see Boot Block Lockout Fea-
ture Enable Algorithm.
If the boot block lockout feature has been activated on either block, the chip erase func-
tion will be disabled.
BOOT BLOCK LOCKOUT DETECTION: A software method is available to determine
whether programming of either boot block section is locked out. See Software Product
Identification Entry and Exit sections. When the device is in the software product identifi-
cation mode, a read from location 00002 will show if programming the lower address
boot block is locked out while reading location 1FFF2 will do so for the upper boot block.
If the data is FE, the corresponding block can be programmed; if the data is FF, the pro-
gram lockout feature has been activated and the corresponding block cannot be pro-
grammed. The software product identification exit mode should be used to return to
standard operation.
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V
5
AT29C010A
0394F–FLASH–02/03
Notes: 1. X can be VIL or VIH.
2. Refer to AC Programming Waveforms.
3. VH = 12.0V ± 0.5V.
4. Manufacturer Code: 1F, Device Code: D5.
5. See details under Software Product Identification Entry/Exit.
DC and AC Operating Range
AT29C010A-70 AT29C010A-90 AT29C010A-12 AT29C010A-15
Operating
Temperature (Case)
Com. 0°C - 70°C0°C - 70°C0°C - 70°C0°C - 70°C
Ind. -40°C - 85°C-40°C - 85°C-40°C - 85°C-40°C - 85°C
VCC Power Supply 5V ± 5% 5V ± 10% 5V ± 10% 5V ± 10%
Note: Not recommended for New Designs.
Operating Modes
Mode CE OE WE Ai I/O
Read VIL VIL VIH Ai DOUT
Program(2) VIL VIH VIL Ai DIN
5V Chip Erase VIL VIH VIL Ai
Standby/Write Inhibit VIH X(1) XXHigh Z
Program Inhibit X X VIH
Program Inhibit X VIL X
Output Disable X VIH XHigh Z
Product Identification
Hardware VIL VIL VIH A1 - A16 = VIL, A9 = VH,(3) A0 = VIL Manufacturer Code(4)
A1 - A16 = VIL, A9 = VH,(3) A0 = VIH Device Code(4)
Software(5) A0 = VIL Manufacturer Code(4)
A0 = VIH Device Code(4)
DC Characteristics
Symbol Parameter Condition Min Max Units
ILI Input Load Current VIN = 0V to VCC 10 µA
ILO Output Leakage Current VI/O = 0V to VCC 10 µA
ISB1 VCC Standby Current CMOS CE = VCC - 0.3V to VCC 0° - 40°C 30 µA
Com. 100 µA
Ind. 300 µA
ISB2 VCC Standby Current TTL CE = 2.0V to VCC 3mA
ICC VCC Active Current f = 5 MHz; IOUT = 0 mA 50 mA
VIL Input Low Voltage 0.8 V
VIH Input High Voltage 2.0 V
VOL Output Low Voltage IOL = 2.1 mA 0.45 V
VOH1 Output High Voltage IOH = -400 µA 2.4 V
VOH2 Output High Voltage CMOS IOH = -100 µA; VCC = 4.5V 4.2 V
6AT29C010A
0394F–FLASH–02/03
AC Read Waveforms(1)(2)(3)(4)
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
AC Read Characteristics
Symbol Parameter
AT29C010A-70 AT29C010A-90 AT29C010A-12 AT29C010A-15
UnitsMin Max Min Max Min Max Min Max
tACC Address to Output Delay 70 90 120 150 ns
tCE(1) CE to Output Delay 70 90 120 150 ns
tOE(2) OE to Output Delay 0 35 0 40 0 50 070 ns
tDF(3)(4) CE or OE to Output Float 0 25 0 25 0 30 040 ns
tOH Output Hold from OE, CE or
Address, whichever occurred first
0000ns
Note: Not recommended for New Designs.
7
AT29C010A
0394F–FLASH–02/03
Input Test Waveforms and Measurement Level
Output Test Load
Note: 1. This parameter is canharacterized and is not 100% tested.
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol Typ Max Units Conditions
CIN 46pFV
IN = 0V
COUT 812pFV
OUT = 0V
tR, tF < 5 ns
70 ns 90/120/150 ns
8AT29C010A
0394F–FLASH–02/03
AC Byte Load Waveforms
WE Controlled
CE Controlled
AC Byte Load Characteristics
Symbol Parameter Min Max Units
tAS, tOES Address, OE Set-up Time 0 ns
tAH Address Hold Time 50 ns
tCS Chip Select Set-up Time 0 ns
tCH Chip Select Hold Time 0 ns
tWP Write Pulse Width (WE or CE)90ns
tDS Data Set-up Time 35 ns
tDH, tOEH Data, OE Hold Time 0 ns
tWPH Write Pulse Width High 100 ns
9
AT29C010A
0394F–FLASH–02/03
Program Cycle Waveforms(1)(2)(3)
Notes: 1. A7 through A16 must specify the sector address during each high to low transition of WE (or CE).
2. OE must be high when WE and CE are both low.
3. All bytes that are not loaded within the sector being programmed will be indeterminate.
Program Cycle Characteristics
Symbol Parameter Min Max Units
tWC Write Cycle Time 10 ms
tAS Address Set-up Time 0 ns
tAH Address Hold Time 50 ns
tDS Data Set-up Time 35 ns
tDH Data Hold Time 0 ns
tWP Write Pulse Width 90 ns
tBLC Byte Load Cycle Time 150 µs
tWPH Write Pulse Width High 100 ns
10 AT29C010A
0394F–FLASH–02/03
Software Data Protection Enable
Algorithm(1)
Notes: 1. Data Format: I/O7 - I/O0 (Hex); Address Format:
A14 - A0 (Hex).
2. Data Protect state will be activated at end of pro-
gram cycle.
3. Data Protect state will be deactivated at end of pro-
gram period.
4. 128 bytes of data MUST BE loaded.
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA
TO
PAGE (128 BYTES)
(4)
WRITES ENABLED
ENTER DATA
PROTECT STATE
(2)
Software Data Protection Disable
Algorithm(1)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 80
TO
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 20
TO
ADDRESS 5555
LOAD DATA
TO
PAGE (128 BYTES)
(4)
EXIT DATA
PROTECT STATE
(3)
Software Protected Program Cycle Waveform(1)(2)(3)
Notes: 1. A7 through A16 must specify the sector address during each high to low transition of WE (or CE) after the software code
has been entered.
2. OE must be high when WE and CE are both low.
3. All bytes that are not loaded within the sector being programmed will be indeterminate.
11
AT29C010A
0394F–FLASH–02/03
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
Data Polling Waveforms
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
Toggle Bit Waveforms(1)(2)(3)
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
Data Polling Characteristics(1)
Symbol Parameter Min Typ Max Units
tDH Data Hold Time 10 ns
tOEH OE Hold Time 10 ns
tOE OE to Output Delay(2) ns
tWR Write Recovery Time 0 ns
Toggle Bit Characteristics(1)
Symbol Parameter Min Typ Max Units
tDH Data Hold Time 10 ns
tOEH OE Hold Time 10 ns
tOE OE to Output Delay(2) ns
tOEHP OE High Pulse 150 ns
tWR Write Recovery Time 0 ns
12 AT29C010A
0394F–FLASH–02/03
Software Product Identification
Entry(1)
Software Product Identification Exit(1)
Notes: 1. Data Format: I/O7 - I/O0 (Hex); Address Format:
A14 - A0 (Hex).
2. A1 - A15 = VIL.
Manufacturer Code is read for A0 = VIL; Device
Code is read for A0 = VIH.
3. The device does not remain in identification mode
if powered down.
4. The device returns to standard operation mode.
5. Manufacturer Code is 1F. The Device Code is D5.
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 90
TO
ADDRESS 5555
PAUSE 10 mS ENTER PRODUCT
IDENTIFICATION
MODE(2)(3)(5)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA F0
TO
ADDRESS 5555
PAUSE 10 mS EXIT PRODUCT
IDENTIFICATION
MODE(4)
Boot Block Lockout Feature Enable
Algorithm(1)
Notes: 1. Data Format: I/O7 - I/O0 (Hex); Address Format:
A14 - A0 (Hex).
2. Lockout feature set on lower address boot block.
3. Lockout feature set on higher address boot block.
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 80
TO
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 40
TO
ADDRESS 5555
LOAD DATA 00
TO
ADDRESS 00000H(2)
PAUSE 20 mS
LOAD DATA FF
TO
ADDRESS 1FFFFH(3)
PAUSE 20 mS
13
AT29C010A
0394F–FLASH–02/03
NORMALIZED SUPPLY CURRENT
vs. TEMPERATURE
TEMPERATURE (C)
-55
1.4
1.3
1.2
1.1
1.0
0.8
0.9
-25 5 35 65 95 125
N
O
R
M
A
L
I
Z
E
D
I
C
C
NORMALIZED SUPPLY CURRENT
vs. ADDRESS FREQUENCY
FREQUENCY (MHz)
0
1.1
1.0
0.9
0.8
0.7 1234567
N
O
R
M
A
L
I
Z
E
D
I
C
C
VCC = 5V
T = 25C
NORMALIZED SUPPLY CURRENT
vs. SUPPLY VOLTAGE
SUPPLY VOLTAGE (V)
4.50
1.4
1.2
1.0
0.8
0.6
4.75 5.00 5.25 5.50
N
O
R
M
A
L
I
Z
E
D
I
C
C
14 AT29C010A
0394F–FLASH–02/03
Ordering Information
tACC
(ns)
ICC (mA)
Ordering Code Package Operation RangeActive Standby
70 50 0.1 AT29C010A-70JC
AT29C010A-70PC
AT29C010A-70TC
32J
32P6
32T
Commercial
(0° to 70°C)
AT29C010A-70JI
AT29C010A-70PI
AT29C010A-70TI
32J
32P6
32T
Industrial
(-40° to 85°C)
90 50 0.1 AT29C010A-90JC
AT29C010A-90PC
AT29C010A-90TC
32J
32P6
32T
Commercial
(0° to 70°C)
50 0.3 AT29C010A-90JI
AT29C010A-90PI
AT29C010A-90TI
32J
32P6
32T
Industrial
(-40° to 85°C)
120 50 0.1 AT29C010A-12JC
AT29C010A-12PC
AT29C010A-12TC
32J
32P6
32T
Commercial
(0° to 70°C)
50 0.3 AT29C010A-12JI
AT29C010A-12PI
AT29C010A-12TI
32J
32P6
32T
Industrial
(-40° to 85°C)
150 50 0.1 AT29C010A-15JC
AT29C010A-15PC
AT29C010A-15TC
32J
32P6
32T
Commercial
(0° to 70°C)
50 0.3 AT29C010A-15JI
AT29C010A-15PI
AT29C010A-15TI
32J
32P6
32T
Industrial
(-40° to 85°C)
Note: Not recommended for New Designs.
Package Type
32J 32-lead, Plastic J-leaded Chip Carrier (PLCC)
32P6 32-lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)
32T 32-lead, Thin Small Outline Package (TSOP)
15
AT29C010A
0394F–FLASH–02/03
Packaging Information
32J – PLCC
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
R
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC) B
32J
10/04/01
1.14(0.045) X 45˚ PIN NO. 1
IDENTIFIER
1.14(0.045) X 45˚
0.51(0.020)MAX
0.318(0.0125)
0.191(0.0075)
A2
45˚ MAX (3X)
A
A1
B1 E2
B
e
E1 E
D1
D
D2
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
A 3.175 3.556
A1 1.524 2.413
A2 0.381
D 12.319 12.573
D1 11.354 11.506 Note 2
D2 9.906 10.922
E 14.859 15.113
E1 13.894 14.046 Note 2
E2 12.471 13.487
B 0.660 0.813
B1 0.330 0.533
e 1.270 TYP
16 AT29C010A
0394F–FLASH–02/03
32P6 – PDIP
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
32P6, 32-lead (0.600"/15.24 mm Wide) Plastic Dual
Inline Package (PDIP) B
32P6
09/28/01
PIN
1
E1
A1
B
REF
E
B1
C
L
SEATING PLANE
A
0º ~ 15º
D
e
eB
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 4.826
A1 0.381
D 41.783 42.291 Note 1
E 15.240 15.875
E1 13.462 13.970 Note 1
B 0.356 0.559
B1 1.041 1.651
L 3.048 3.556
C 0.203 0.381
eB 15.494 17.526
e 2.540 TYP
Note: 1. Dimensions D and E1 do not include mold Flash or Protrusion.
Mold Flash or Protrusion shall not exceed 0.25 mm (0.010").
17
AT29C010A
0394F–FLASH–02/03
32T – TSOP
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
32T, 32-lead (8 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP) B
32T
10/18/01
PIN 1
D1 D
Pin 1 Identifier
b
e
EA
A1
A2
0º ~ 8º c
L
GAGE PLANE
SEATING PLANE
L1
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This package conforms to JEDEC reference MO-142, Variation BD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
A 1.20
A1 0.05 0.15
A2 0.95 1.00 1.05
D 19.80 20.00 20.20
D1 18.30 18.40 18.50 Note 2
E 7.90 8.00 8.10 Note 2
L 0.50 0.60 0.70
L1 0.25 BASIC
b 0.17 0.22 0.27
c 0.10 0.21
e 0.50 BASIC
Printed on recycled paper.
0394F–FLASH–02/03 xM
© Atmel Corporation 2003.
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