APTM100H35FT3G
APTM100H35FT3G
Rev 2 July, 2006
www.microsemi
com 2
6
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VGS = 0V,VDS = 1000V Tj = 25°C 100
IDSS Zero Gate Voltage Drain Current VGS = 0V,VDS = 800V Tj = 125°C 500
µA
RDS(on) Drain – Source on Resistance VGS = 10V, ID = 11A 350 420
m
VGS(th) Gate Threshold Voltage VGS = VDS, ID = 2.5mA 3 5 V
IGS S Gate – Source Leakage Current VGS = ±30V, VDS = 0V ±100 nA
Dynamic Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Cis s Input Capacitance 5.2
Coss Output Capacitance 0.88
Crss Reverse Transfer Capacitance
VGS = 0V
VDS = 25V
f = 1MHz 0.16
nF
Qg Total gate Charge 186
Qgs Gate – Source Charge 24
Qgd Gate – Drain Charge
VGS = 10V
VBus = 500V
ID = 22A 122
nC
Td(on) Tur n-on Delay Ti me 18
Tr Rise Time 12
Td(off) Turn-off Delay Time 155
Tf Fall Time
Inductive switching @ 125°C
VGS = 15V
VBus = 670V
ID = 22A
RG = 5 40
ns
Eon Turn-on Switching Energy 900
Eoff Turn-off Switching Energy
Inductive switching @ 25°C
VGS = 15V, VBu s = 670V
ID = 22A, RG = 5Ω 623
µJ
Eon Turn-on Switching Energy 1423
Eoff Turn-off Switching Energy
Inductive switching @ 125°C
VGS = 15V, VBu s = 670V
ID = 22A, RG = 5Ω 779
µJ
Source - Drain diode ratings and characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Tc = 25°C 22 IS Continuo us Source current
(Body diode)
Tc = 80°C 17 A
VSD Diode Forward Voltage VGS = 0V, IS = - 22A 1.3 V
dv/dt Peak Diode Recovery X 18 V/ns
Tj = 25°C 320
trr Reverse Recovery Time Tj = 125°C 650 ns
Tj = 25°C 3.6
Qrr Reverse Recovery Charge
IS = - 22A
VR = 670V
diS/dt = 100A/µs
Tj = 125°C 9.72
µC
X dv/dt numbers reflect the limitations of the circuit rather than the device itself.
IS - 22A di/dt 700A/µs VR VDSS Tj 150°C