HI-SINCERITY
MICROELECTRONICS CORP.
Spec. No. : MOS200505
Issued Date : 2005.06.01
Revised Date : 2005. 06.08
Page No. : 2/4
HIRF840, HIRF840F HSMC Product Specification
ELectrical Characteristics (Tj=25°C, unless otherwise specified)
Symbol Characteristic Min. Typ. Max. Unit
V(BR)DSS Drain-S ourc e Br eakdown Vo ltage (VGS=0V, ID=250uA) 500 - - V
∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient (Reference to 25oC, ID=1mA) - 0.78 - V/oC
Drain-Source Leakage Current (VDS=500V, VGS=0V) - - 25 uA
IDSS Drain-Source Leakage Current (VDS=400V, VGS=0V, Tj=125°C) 250 uA
IGSSF Gate-Source Leakage Current-Forward (Vgsf=20V, VDS=0V) - - 100 nA
IGSSR Gate-Source Leakage Current-Reverse (Vgsr=-20V, VDS=0V) - - -100 nA
VGS(th) Gate Threshold V oltage (VDS=VGS, ID=250uA) 2 - 4 V
RDS(on) Static Drain-Source On-Resistance (VGS=10V, ID=4.8A)(*4) - - 0.85 Ω
gFS Forward Transconductance (VDS=50V, ID=4.8A)(*4) 4.9 - - S
Ciss Input Capacitance - 1300 -
Coss Output Capacitance - 310 -
Crss Reverse Transfer Capacitance VDS=25V, VGS=0V, f=1MHz - 120 - pF
td(on) Turn-on Delay Time - 14 -
trRise T i me - 23 -
td(off) Turn-off Delay Time - 49 -
tfFall Time
(VDD=250V, ID=8A, RG=9.1Ω,
RD=31Ω)(*4)
-20-
ns
QgTotal Gate Charge - - 63
Qgs Gate-Source Charge - - 9.3
Qgd Gate-Drain Charge
(VDS=400V, ID=8A, VGS=10V)
(*4) --32
nC
LDInternal Drain Inductance (Measured from the drain lead 0.25” from
package to center of die) -4.5-nH
LSInternal Source Inductance (Measured from the drain lead 0.25” from
package to source bond pad) -7.5-nH
*4: Pulse Test: Pulse Width≤300us, Duty Cycl e≤2%
Source-Drain Diode
Symbol Characteristic Min. Typ. Max. Units
Qrr Reverse Recovery Charge - 4.2 8.9 uC
ton Forward Turn-On Ti me - ** -
trr Reverse Recovery Time IF=8A, di/dt=100A/us, Tj=25°C (*4) - 460 970 ns
VSD Diode Forward Voltage IS=8A, VGS=0V, Tj=25°C (*4) --2V
**: Negligibl e, Dominated by circui t inductance