HCPL0600, HCPL0601, HCPL0611, HCPL0637, HCPL0638, HCPL0639
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3
SAFETY AND INSULATIONS RATING
As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data.
Compliance with the safety ratings shall be ensured by means of protective circuits.
Parameter Characteristics
Installation Classifications per DIN VDE 0110/1.89 Table 1,
For Rated Mains Voltage
< 150 VRMS I–IV
< 300 VRMS I–III
Climatic Classification 40/85/21
Pollution Degree (DIN VDE 0110/1.89) 2
Comparative Tracking Index 175
Symbol Parameter Value Unit
VPR Input−to−Output Test Voltage, Method A, VIORM x 1.6 = VPR,
Type and Sample Test with tm = 10 s, Partial Discharge < 5 pC
904 Vpeak
Input−to−Output Test Voltage, Method B, VIORM x 1.875 = VPR,
100% Production Test with tm = 1 s, Partial Discharge < 5 pC
1060 Vpeak
VIORM Maximum Working Insulation Voltage 565 Vpeak
VIOTM Highest Allowable Over−Voltage 4,000 Vpeak
External Creepage ≥ 4 mm
External Clearance ≥ 4 mm
DTI Distance Through Insulation (Insulation Thickness) ≥ 0.4 mm
TSCase Temperature (Note 1) 150 °C
IS,INPUT Input Current (Note 1) 200 mA
PS,OUTPUT Output Power (Note 1) 300 mW
RIO Insulation Resistance at TS, VIO = 500 V (Note 1) > 10
1. Safety limit values – maximum values allowed in the event of a failure.
ABSOLUTE MAXIMUM RATINGS (No Derating Required up to 85°C)
Symbol Parameter Value Units
TSTG Storage Temperature −40 to +125 °C
TOPR Operating Temperature −40 to +85 °C
TJJunction Temperature −40 to +125 °C
EMITTER
IFDC/Average Forward Input Current Each Channel 50 mA
VEEnable Input Voltage
Not to exceed VCC by more than 500 mV
Single Channel
Devices Only
5.5 V
VRReverse Input Voltage Each Channel 5.0 V
PIPower Dissipation Each Channel 45 mW
DETECTOR
VCC
(1 minute max)
Supply Voltage 7.0 V
IOOutput Current Each Channel 15 mA
VOOutput Voltage (each channel) Each Channel 7.0 V
POCollector Output Power Dissipation Each Channel 85 mW
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.