5 Revision 1.1
hbwhelp@micrel.com or (408) 955-1690
Absolute Maximum Ratings(2)
Supply Voltage (VDD, VDDOX) ........................................ +4.6V
Input Voltage (VIN) .................................. −0.5V to VDD+0.5V
Lead Temperature (soldering, 20s) ............................ 260°C
Case Temperature ..................................................... 115°C
Storage Temperature (Ts) ......................... −65°C to +150°C
Operating Ratings(3)
Supply Voltage (VDD, VDDOX) ................. +2.375V to +3.465V
Ambient Temperature (TA) .......................... –40°C to +85°C
Junction Thermal Resistance(4)
QFN (θJA)
Still-Air ......................................................... 24°C/W
QFN (ψJB)
Junction to Board .......................................... 8°C/W
DC Electrical Characteristics(5)
VDD = VDDO1/2 = 3.3V ±5% or 2.5V ±5%, VDD = 3.3V ±5%, VDDO1/2 = 3.3V ±5% or 2.5V ±5%, T A = −40°C to +85°C.
Symbol Parameter Condition Min. Typ. Max. Units
VDD, VDDO1/2
3.3V Operating Voltage VDDO1 = VDDO2 3.135 3.3 3.465 V
2.5V Operating Voltage VDDO1 = VDDO2 2.375 2.5 2.625 V
Outputs loaded 156. 25MHz 181 235 mA
Outputs loaded 312. 5MHz 216 280
LVCMOS Input (OE1, OE2, PLL_BYPASS) DC Electrical Characteristics(5)
VDD = 3.3V ±5%, or 2.5V ±5%, TA = −40°C to +85°C.
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input High Voltage 2 VDD + 0.3 V
VIL Input Low Voltage −0.3 0.8 V
IIH Input High Current VDD = VIN = 3.465V 150 µA
IIL Input Low Current VDD = 3.465V, VIN = 0V −150 µA
REF_IN DC Electrical Characteristics(5)
VDD = 3.3V ±5%, or 2.5V ±5%, TA = −40°C to +85°C.
Symbol Parameter Condition Min. Typ. Max. Units
VIH Input High Voltage 1.1 VDD + 0.3 V
VIL Input Low Voltage −0.3 0.6 V
IIN Input Current VIN = 0V to VDD −5 5 µA
Notes:
2. Permanent device dam age may occur if absolute maximum ratings are exceeded. This is a stress rating only and funct i onal operati on is not impli ed
at conditions other than those detailed in the operational sections of this datasheet. Exposure to absolute maximum rating conditions for extended
periods may affect device reliabil i ty.
3. The datas heet limits are not guaranteed i f the device is operated beyond the operating ratings.
4. Package t hermal resist ance assumes exposed pad is soldered (or equivalent) to the device’s most negative potential on the PCB.
5. The ci rcuit is designed to meet the AC and DC specifications shown in the above tables after thermal equilibrium has been established.