SN54HC00, SN74HC00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SCLS181D – DECEMBER 1982 – REVISED DECEMBER 2002
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
D
Wide Operating Voltage Range of 2 V to 6 V
D
Outputs Can Drive Up To 10 LSTTL Loads
D
Low Power Consumption, 20-µA Max ICC
D
Typical tpd = 8 ns
D
±4-mA Output Drive at 5 V
D
Low Input Current of 1 µA Max
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
SN54HC00 ...J OR W PACKAGE
SN74HC00 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
3212019
910111213
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
1B
1A
NC
3Y
3A V
4B
2Y
GND
NC
SN54HC00 . . . FK PACKAGE
(TOP VIEW)
CC
NC – No internal connection
description/ordering information
The ’HC00 devices contain four independent 2-input NAND gates. They perform the Boolean function
Y = A • B or Y = A + B in positive logic.
ORDERING INFORMATION
TAPACKAGE†ORDERABLE
PART NUMBER TOP-SIDE
MARKING
PDIP – N Tube SN74HC00N SN74HC00N
Tube SN74HC00D
–
Tape and reel SN74HC00DR
–40°C to 85°CSOP – NS Tape and reel SN74HC00NSR HC00
SSOP – DB Tape and reel SN74HC00DBR HC00
Tube SN74HC00PW
–
Tape and reel SN74HC00PWR
CDIP – J Tube SNJ54HC00J SNJ54HC00J
–55°C to 125°CCFP – W Tube SNJ54HC00W SNJ54HC00W
LCCC – FK Tube SNJ54HC00FK SNJ54HC00FK
†Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS OUTPUT
A B Y
H H L
LXH
X L H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2002, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.