CY74FCT16374T
CY74FCT162374T
2
Ma xi mu m R atings[2, 3]
(Above which the useful life may be impaired. For user
guidel ines, not tested .)
Storage Temperature ... .......... .. ..... .......... −55°C to +125°C
Ambient Temperature with
Powe r A p pl ie d....... .. ..... ... .... ... ..... .. ..... .. ... . −55°C to +125°C
DC Input Voltage..................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current /Pin) ...........................−60 to +120 mA
Powe r D is s ip a tio n . ..... .. ..... .. ..... ... ..... .. .. ..... ... ..... .. ..... .. ....1 .0 W
Static Discharge Voltage............................................>2001V
(per MIL -STD-883, Method 3015)
Function Table[1]
Inputs Outputs
FunctionDCLK OE O
X L H Z High-Z
X H H Z
L L L Load
Register
H L H
L H Z
H H Z
Pin Descripti on
Name Description
DData Inputs
CLK Clock Inputs
OE Three-St ate Output Enable Inputs (Active LOW)
OThree-State Outputs
Operating Rang e
Range Ambient
Temperature VCC
Industrial −40°C to +85°C 5V ± 10%
Elec tr ic al C h ar acte r is ti cs O ver the Operating Range
Parameter Description Test Conditions Min. Typ.[4] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHInput Hysteresis[5] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
IIH Input HIGH Current VCC= M a x ., V I=VCC ±1µA
IIL Input LOW Current VCC= M a x ., V I=GND ±1µA
IOZH High I mp edance Output Curr ent
(Three-State Output pins) VCC= M a x ., VOUT=2.7V ±1µA
IOZL High I mp edance Output Curr ent
(Three-State Output pins) VCC= M a x ., VOUT=0.5V ±1µA
IOS Short Circuit Current[6] VCC= Ma x., VOUT=GND −80 −140 −200 mA
IOOutput Drive Current[6] VCC=M a x ., VOUT=2.5V −50 −180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[7] ±1µA
Output Drive Characteris ti cs f or CY74FCT16374T
Parameter Description Test Conditions Min. Typ.[4] Max. Unit
VOH Output HIGH Voltage VCC=Min., IOH=−3 mA 2.5 3.5 V
VCC=Min., IOH=−15 mA 2.4 3.5 V
VCC=Min., IOH=−32 mA 2.0 3.0 V
VOL Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance. = LOW-to-HIGH Transition.
2. Operation beyond the limits set forth may impair the useful lif e of the de vice. Unless otherwise noted, these limits are over the operating free-air temperature
range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4. Typical values are at VCC= 5.0V, TA= +25°C a mbient.
5. This parameter is guaranteed but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not e xceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are pref erable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise pr olonged shorting of
a high output ma y raise the chip temperature well above normal and thereby cause inv alid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
7. Tested at +25°C.