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to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.
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Parameter Test Conditions Min. Typ. Max. Unit
V(BR)DSS Drain–Source Breakdown Voltage
VGS(th) Gate Thresshold Voltage
IGSS Gate–Body Leakage
IDSS Zero Gate Voltage Drain Current
rDS(on) Drain–Source On–Resistance1
gfsForward Transconductance1
Ciss Input Capacitance
Coss Output capacitance
Crss Reverse Transfer Capacitance
tdon Turn–On Delay Time
trRiseTime
td(of) Turn off Delay Time
tfFallTime
VSD Diode Forward Voltage1
ISContinues Current
ISM Pulsed Current2
trr Reverse Recovery Time
Qrr Reverse Recovered Charge
VGS = 0 ID= 1mA
VDS=VGS ID= 250μA
VDS = 0 VGS = ±20V
VDS =0.8 x V(BR)DSS
VGS = 0 Tj = 125°C
VGS = 10V ID= 3.5A
VDS = 15V ID= 3.5A
VDS = 25V VGS = 0
f = 1.0MHZ
VDD = 77V RL = 22Ω
ID= 3.5A VGEN = 10V
RG = 7.5 ohms
IF= 5.5A VGS = 0
IF= 5.5A VDD = 50V
dIF/DT = 100A/μS
200
2.0 4.0
±100
25
250
0.25 0.4
2.5 3.0
600
250
80
830
42 50
12 50
30 40
1.4
5.5
22
150 500
6
V
nA
μA
Ω
s( )
pF
ns
V
A
ns
μC
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Document Number 3096
Issue 3
ELECTRICAL CHARACTERISTICS (TJ= 25°C unless otherwise stated)
1) Pulse test : Pulse Width < 300μs ,Duty Cycle < 2%
2) Pulse width limited by maximum juction temperature
SOURCE DRAIN DIODE RATING CHARACTERISTICS
Ω
IRFF230
2N6798