19-2739; Rev 5; 6/11 Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces Features The MAX3202E/MAX3203E/MAX3204E/MAX3206E are low-capacitance 15kV ESD-protection diode arrays designed to protect sensitive electronics attached to communication lines. Each channel consists of a pair of diodes that steer ESD current pulses to VCC or GND. The MAX3202E/MAX3203E/MAX3204E/MAX3206E protect against ESD pulses up to 15kV Human Body Model, 8kV Contact Discharge, and 15kV Air-Gap Discharge, as specified in IEC 61000-4-2. These devices have a 5pF capacitance per channel, making them ideal for use on high-speed data I/O interfaces. High-Speed Data Line ESD Protection 15kV--Human Body Model 8kV--IEC 61000-4-2, Contact Discharge 15kV--IEC 61000-4-2, Air-Gap Discharge The MAX3202E is a two-channel device intended for USB and USB 2.0 applications. The MAX3203E is a triple-ESD structure intended for USB On-the-Go (OTG) and video applications. The MAX3204E is a quad-ESD structure designed for Ethernet and FireWire(R) applications, and the MAX3206E is a six-channel device designed for cell phone connectors and SVGA video connections. All devices are available in tiny 4-bump (1.05mm x 1.05mm) WLP, 6-bump (1.05mm x 1.57mm) WLP, 9-bump (1.52mm x 1.52mm) WLP, 6-pin (3mm x 3mm) TDFN, and 12-pin (4mm x 4mm) TQFN packages and are specified for -40C to +85C operation. 2-, 3-, 4-, or 6-Channel Devices Available Applications USB Video USB 2.0 Cell Phones Ethernet SVGA Video Connections Tiny WLP Package Available Low 5pF Input Capacitance Low 1nA (max) Leakage Current Low 1nA Supply Current +0.9V to +5.5V Supply Voltage Range Ordering Information PART PIN-PACKAGE MAX3202EEWS+T 4 WLP MAX3202EETT+T 6 TDFN-EP* MAX3203EEEWT+T 6 WLP MAX3203EETT+T 6 TDFN-EP* TOP MARK +AA +ADQ +BG +ADO MAX3204EEWT+T 6 WLP MAX3204EETT+T 6 TDFN-EP* +ADP +AL MAX3206EEWL+T 9 WLP +AQ MAX3206EETC+ 12 TQFN-EP* +AACA *EP = Exposed pad. Note: All devices operate over -40C to +85C temperature range. +Denotes a lead(Pb)-free/RoHS-compliant package. FireWire Selector Guide PART Typical Operating Circuit ESD-PROTECTED I/O PORTS MAX3202EEWS+T 2 MAX3202EETT-T 2 MAX3203EEWT+T 3 MAX3203EETT-T 3 MAX3204EEBT-T 4 MAX3204EETT-T 4 MAX3206EEBL-T 6 MAX3206EETC 6 VCC VCC 0.1F 0.1F PROTECTED CIRCUIT I/0 I/0_ MAX3202E MAX3204E MAX3206E MAX3208E Pin Configurations appear at end of data sheet. FireWire is a registered trademark of Apple Computer, Inc. ________________________________________________________________ Maxim Integrated Products For pricing, delivery, and ordering information, please contact Maxim Direct at 1-888-629-4642, or visit Maxim's website at www.maxim-ic.com. 1 MAX3202E/MAX3203E/MAX3204E/MAX3206E General Description MAX3202E/MAX3203E/MAX3204E/MAX3206E Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces ABSOLUTE MAXIMUM RATINGS VCC to GND ...........................................................-0.3V to +7.0V I/O_ to GND ................................................-0.3V to (VCC + 0.3V) Continuous Power Dissipation (TA = +70C) 2 x 2 WLP (derate 11.5mW/C above +70C)...............920mW 3 x 2 WLP (derate 12.3mW/C above +70C)...............984mW 3 x 3 WLP (derate 14.1mW/C above +70C).............1128mW 6-Pin TDFN (derate 24.4mW/C above +70C) ..........1951mW 12-Pin TQFN (derate 16.9mW/C above +70C) ........1349mW Operating Temperature Range ...........................-40C to +85C Storage Temperature Range .............................-65C to +150C Junction Temperature .....................................................+150C Lead Temperature (soldering, 10s) .................................+300C Soldering Temperature (reflow) .......................................+260C Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. PACKAGE THERMAL CHARACTERISTICS (Note 1) 6 TDFN Junction-to-Ambient Thermal Resistance (JA)....................42C/W Junction-to-Case Thermal Resistance (JC)...........................9C/W 12 TQFN Junction-to-Ambient Thermal Resistance (JA)....................41C/W Junction-to-Case Thermal Resistance (JC)...........................6C/W 4 WLP Junction-to-Ambient Thermal Resistance (JA)...............87C/W 6 WLP Junction-to-Ambient Thermal Resistance (JA)...............84C/W 9 WLP Junction-to-Ambient Thermal Resistance (JA)...............71C/W Note 1: Package thermal resistances were obtained using the method described in JEDEC specification JESD51-7, using a fourlayer board. For detailed information on package thermal considerations, refer to www.maxim-ic.com/thermal-tutorial. ELECTRICAL CHARACTERISTICS (VCC = +5V 5%, TA = TMIN to TMAX, unless otherwise noted. Typical values are at VCC = +5V and TA = +25C.) (Note 2) PARAMETER SYMBOL Supply Voltage VCC Supply Current ICC Diode Forward Voltage VF Channel Clamp Voltage (Note 3) VC CONDITIONS MIN TYP 0.9 1 IF = 10mA 0.65 MAX UNITS 5.5 V 100 nA 0.95 V TA = +25C, 15kV Human Body Model, IF = 10A Positive transients VCC + 25 Negative transients -25 TA = +25C, 8kV Contact Discharge (IEC 61000-4-2), IF = 24A Positive transients VCC + 60 Negative transients -60 TA = +25C, 15kV Air-Gap Discharge (IEC 61000-4-2), IF = 45A Positive transients VCC + 100 Negative transients -100 Channel Leakage Current TA = 0C to +50C (Note 4) Channel Input Capacitance VCC = 5V, bias of VCC/2 V -1 5 +1 nA 7 pF ESD PROTECTION Human Body Model 15 kV IEC 61000-4-2 Contact Discharge 8 kV IEC 61000-4-2 Air-Gap Discharge 15 kV Note 2: Limits over temperature are guaranteed by design, not production tested. Note 3: Idealized clamp voltages (L1 = L2 = L3 = 0) (Figure 1 ); see the Applications Information section for more information. Note 4: Guaranteed by design. Not production tested. 2 _______________________________________________________________________________________ Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces LEAKAGE CURRENT vs. TEMPERATURE LEAKAGE CURRENT (pA) 1.10 0.90 0.70 INPUT CAPACITANCE vs. INPUT VOLTAGE LEAKAGE CURRENT PER CHANNEL 100 10 MAX3202E toc03 12 INPUT CAPACITANCE (pF) MAX3202E toc01 1.30 CLAMP VOLTAGE (V) 1000 MAX3202E toc02 CLAMP VOLTAGE vs. DC CURRENT 1.50 10 8 VCC = 3.3V 6 VCC = 5.0V 4 0.50 1 0.30 30 50 70 90 110 130 150 25 35 45 55 2 65 75 85 0 TEMPERATURE (C) DC CURRENT (mA) 1 2 3 4 5 INPUT VOLTAGE (V) Pin/Bump Description PIN/BUMP MAX3202E MAX3203E MAX3204E MAX3206E NAME FUNCTION WLP TDFNEP WLP TDFNEP WLP TDFNEP WLP TQFNEP A1, B2 3, 6 A1, A2, B3 1, 2, 4 A1, A2, B2, B3 1, 2, 4, 5 A1, A3, B1, B3, C1, C3 1, 2, 3, 7, 8, 9 I/O_ A2 4 B1 3 B1 3 A2 5 GND Ground ESD-Protected Channel B1 1 A3 6 A3 6 C2 11 VCC Power-Supply Input. Bypass VCC to GND with a 0.1F ceramic capacitor. -- 2, 5 -- 5 -- -- -- 4, 6, 10, 12 N.C. No Connection. Not internally connected. -- -- -- -- -- -- -- -- EP Exposed Pad. Connect to GND. Only for TDFN and TQFN packages. _______________________________________________________________________________________ 3 MAX3202E/MAX3203E/MAX3204E/MAX3206E Typical Operating Characteristics (VCC = +5V, TA = +25C, unless otherwise noted.) MAX3202E/MAX3203E/MAX3204E/MAX3206E Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces Detailed Description The MAX3202E/MAX3203E/MAX3204E/MAX3206E are diode arrays designed to protect sensitive electronics against damage resulting from ESD conditions or transient voltages. The low input capacitance makes these devices ideal for high-speed data lines. The MAX3202E, MAX3203E, MAX3204E, and MAX3206E protect two, three, four, and six channels, respectively. The MAX3202E/MAX3203E/MAX3204E/MAX3206E are designed to work in conjunction with a device's intrinsic ESD protection. The MAX3202E/MAX3203E/MAX3204E/ MAX3206E limit the excursion of the ESD event to below 25V peak voltage when subjected to the Human Body Model waveform. When subjected to the IEC 61000-4-2 waveform, the peak voltage is limited to 60V when subjected to Contact Discharge and 100V when subjected to Air-Gap Discharge. The device that is being protected by the MAX3202E/MAX3203E/ MAX3204E/MAX3206E must be able to withstand these peak voltages plus any additional voltage generated by the parasitic board. d(IESD ) d(IESD ) + L2 x VC = VCC + VF( D1) + L1 x dt dt For negative ESD pulses: d(IESD ) d(IESD ) + L3 x VC = - VF( D2 ) + L1 x dt dt where IESD is the ESD current pulse. POSITIVE SUPPLY RAIL L2 D1 L1 I/O_ PROTECTED LINE Applications Information D2 Design Considerations Maximum protection against ESD damage results from proper board layout (see the Layout Recommendations section and Figure 2). A good layout reduces the parasitic series inductance on the ground line, supply line, and protected signal lines. The MAX3202E/MAX3203E/MAX3204E/MAX3206E ESD diodes clamp the voltage on the protected lines during an ESD event and shunt the current to GND or VCC. In an ideal circuit, the clamping voltage, VC, is defined as the forward voltage drop, VF, of the protection diode plus any supply voltage present on the cathode. For positive ESD pulses: VC = VCC + VF For negative ESD pulses: VC = -VF In reality, the effect of the parasitic series inductance on the lines must also be considered (Figure 1). For positive ESD pulses: L3 GROUND RAIL Figure 1. Parasitic Series Inductance L2 VCC L1 PROTECTED LINE NEGATIVE ESD CURRENT PULSE PATH TO GROUND D1 VC I/O_ D2 GND L3 Figure 2. Layout Considerations 4 _______________________________________________________________________________________ PROTECTED CIRCUIT Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces A low-ESR 0.1F capacitor must be used between VCC and GND. This bypass capacitor absorbs the charge transferred by an +8kV IEC-61000 Contact Discharge ESD event. Ideally, the supply rail (VCC) would absorb the charge caused by a positive ESD strike without changing its regulated value. In reality, all power supplies have an effective output impedance on their positive rails. If a power supply's effective output impedance is 1, then by using V = I x R, the clamping voltage of VC increases by the equation VC = IESD x ROUT. An +8kV IEC 61000-4-2 ESD event generates a current spike of 24A, so the clamping voltage increases by VC = 24A x 1, or V C = 24V. Again, a poor layout without proper bypassing increases the clamping voltage. A ceramic chip capacitor mounted as close to the MAX3202E/ MAX3203E/MAX3204E/MAX3206E VCC pin is the best choice for this application. A bypass capacitor should also be placed as close to the protected device as possible. * 15kV using the Human Body Model * 8kV using the Contact Discharge method specified in IEC 61000-4-2 * 15kV using the IEC 61000-4-2 Air-Gap Discharge method ESD Test Conditions ESD performance depends on a number of conditions. Contact Maxim for a reliability report that documents test setup, methodology, and results. Human Body Model Figure 4 shows the Human Body Model, and Figure 5 shows the current waveform it generates when discharged into a low impedance. This model consists of a 100pF capacitor charged to the ESD voltage of interest, which is then discharged into the device through a 1.5k resistor. RC 1M CHARGE-CURRENTLIMIT RESISTOR HIGHVOLTAGE DC SOURCE Cs 100pF RD 1.5k DISCHARGE RESISTANCE DEVICE UNDER TEST STORAGE CAPACITOR 15kV ESD Protection ESD protection can be tested in various ways; the MAX3202E/MAX3203E/MAX3204E/MAX3206E are characterized for protection to the following limits: I 100% 90% Figure 4. Human Body ESD Test Model IPEAK IP 100% 90% Ir PEAK-TO-PEAK RINGING (NOT DRAWN TO SCALE) AMPERES 36.8% 10% 0 10% tR = 0.7ns to 1ns t 30ns 60ns Figure 3. IEC 61000-4-2 ESD Generator Current Waveform 0 tRL TIME tDL CURRENT WAVEFORM Figure 5. Human Body Model Current Waveform _______________________________________________________________________________________ 5 MAX3202E/MAX3203E/MAX3204E/MAX3206E During an ESD event, the current pulse rises from zero to peak value in nanoseconds (Figure 3). For example, in a 15kV IEC-61000 Air-Gap Discharge ESD event, the pulse current rises to approximately 45A in 1ns (di/dt = 45 x 109). An inductance of only 10nH adds an additional 450V to the clamp voltage. An inductance of 10nH represents approximately 0.5in of board trace. Regardless of the device's specified diode clamp voltage, a poor layout with parasitic inductance significantly increases the effective clamp voltage at the protected signal line. MAX3202E/MAX3203E/MAX3204E/MAX3206E Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces RC 50 to 100 CHARGE-CURRENTLIMIT RESISTOR HIGHVOLTAGE DC SOURCE Cs 150pF The Air-Gap Discharge test involves approaching the device with a charged probe. The Contact Discharge method connects the probe to the device before the probe is energized. RD 330 DISCHARGE RESISTANCE STORAGE CAPACITOR Layout Recommendations DEVICE UNDER TEST Figure 6. IEC 61000-4-2 ESD Test Model IEC 61000-4-2 The IEC 61000-4-2 standard covers ESD testing and performance of finished equipment. The MAX3202E/ MAX3203E/MAX3204E/MAX3206E help users design equipment that meets Level 4 of IEC 61000-4-2. The main difference between tests done using the Human Body Model and IEC 61000-4-2 is higher peak current in IEC 61000-4-2. Because series resistance is lower in the IEC 61000-4-2 ESD test model (Figure 6) the ESD-withstand voltage measured to this standard is generally lower than that measured using the Human Body Model. Figure 3 shows the current waveform for the 8kV IEC 61000-4-2 Level 4 ESD Contact Discharge test. 6 Proper circuit-board layout is critical to suppress ESDinduced line transients. The MAX3202E/MAX3203E/ MAX3204E/MAX3206E clamp to 100V; however, with improper layout, the voltage spike at the device is much higher. A lead inductance of 10nH with a 45A current spike at a dv/dt of 1ns results in an ADDITIONAL 450V spike on the protected line. It is essential that the layout of the PC board follows these guidelines: 1) Minimize trace length between the connector or input terminal, I/O_, and the protected signal line. 2) Use separate planes for power and ground to reduce parasitic inductance and to reduce the impedance to the power rails for shunted ESD current. 3) Ensure short ESD transient return paths to GND and VCC. 4) Minimize conductive power and ground loops. 5) Do not place critical signals near the edge of the PC board. 6) Bypass VCC to GND with a low-ESR ceramic capacitor as close to VCC as possible. 7) Bypass the supply of the protected device to GND with a low-ESR ceramic capacitor as close to the supply pin as possible. _______________________________________________________________________________________ Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces TEST Temperature Cycle Operating Life Moisture Resistance CONDITIONS DURATION FAILURES PER SAMPLE SIZE -35C to +85C, -40C to +100C 150 cycles, 900 cycles 0/10, 0/200 TA = +70C 240hr 0/10 0/10 -20C to +60C, 90% RH 240hr Low-Temperature Storage -20C 240hr 0/10 Low-Temperature Operational -10C 24hr 0/10 0/15 Solderability ESD 8hr steam age -- 2000V, Human Body Model -- 0/5 TJ = +150C 168hr 0/45 High-Temperature Operating Life Functional Diagrams MAX3202E MAX3203E MAX3204E MAX3206E VCC VCC VCC VCC I/O1 I/O2 I/O1 GND I/O2 I/O3 GND I/O1 I/O3 I/O2 GND I/O4 I/O1 I/O2 I/O4 I/O3 I/O5 I/O6 GND Chip Information PROCESS: BiCMOS _______________________________________________________________________________________ 7 MAX3202E/MAX3203E/MAX3204E/MAX3206E Table 1. Reliability Test Data MAX3202E/MAX3203E/MAX3204E/MAX3206E Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces Pin Configurations TOP VIEW (BUMPS ON BOTTOM) GND I/O1 A1 A2 I/O3 I/O2 VCC I/O3 I/O2 VCC A1 A2 A3 A1 A2 A3 GND MAX3202E VCC B1 B2 MAX3203E I/O2 B1 GND WLP I/O3 A1 A2 A3 I/O4 I/O2 B1 MAX3206E B3 I/O5 I/O1 C1 C2 C3 I/O6 MAX3204E B3 B1 I/O1 GND WLP B2 B3 I/O4 I/O1 VCC WLP WLP + MAX3202E MAX3203E + + VCC 1 6 I/02 I/01 1 6 VCC I/01 1 6 VCC N.C. 2 5 N.C. I/02 2 5 N.C. I/02 2 5 I/04 I/01 3 4 GND TDFN GND 3 EP VCC N.C. 12 11 10 MAX3204E + EP N.C. 4 I/03 TDFN GND 3 I/01 1 I/02 2 I/03 3 MAX3206E 9 I/06 8 I/05 7 I/04 EP EP 4 I/03 TDFN 4 5 6 N.C. GND N.C. TQFN EP = EXPOSED PADDLE. CONNECT TO GND. Package Information For the latest package outline information and land patterns (footprints), go to www.maxim-ic.com/packages. Note that a "+", "#", or "-" in the package code indicates RoHS status only. Package drawings may show a different suffix character, but the drawing pertains to the package regardless of RoHS status. PACKAGE CODE OUTLINE NO. LAND PATTERN NO. 4 WLP W41A1+2 21-0455 Refer to Application Note 1891 6 WLP W61C1+2 21-0463 Refer to Application Note 1891 PACKAGE TYPE 8 9 WLP W91B1+5 21-0067 Refer to Application Note 1891 6 TDFN-EP T633+2 21-0137 90-0058 12 TQFN-EP T1244+4 21-0139 90-0068 _______________________________________________________________________________________ Low-Capacitance, 2/3/4/6-Channel, 15kV ESD Protection Arrays for High-Speed Data Interfaces REVISION NUMBER REVISION DATE 3 12/07 Added 3202EEWS+T TDFN and TQFN packages, updated Package Information 4 12/09 Corrected part numbers and pin packages in the Ordering Information table, Absolute Maximum Ratings, Selector Guide, Pin Description, and Pin Configurations. 5 6/11 Updated to show available packages as WLP, not UCSP DESCRIPTION PAGES CHANGED 1, 2, 3, 4, 6, 8, 12-15 1-3, 8-15 1, 2, 3, 6, 8 Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are implied. Maxim reserves the right to change the circuitry and specifications without notice at any time. Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600 _____________________ 9 (c) 2011 Maxim Integrated Products Maxim is a registered trademark of Maxim Integrated Products, Inc. MAX3202E/MAX3203E/MAX3204E/MAX3206E Revision History