DATA SHEET
ICS858S011AKI REVISION A OCTOBER 12, 2010 1 ©2010 Integrated Device Technology, Inc.
Low Skew, 1-To-2, Differential-To-CML
Fanout Buffer
ICS858S011I
General Description
The ICS858S011I is a high speed 1-to-2 Differential-to-CML Fanout
Buffer. The ICS858S011I is optimized for high speed and very low
output skew, making it suitable for use in demanding applications
such as SONET, 1 Gigabit and 10 Gigabit Ethernet, and Fibre
Channel. The internally terminated differential input and VREF_AC
pin allow other differential signal families such as LVDS, LVPECL,
SSTL and CML to be easily interfaced to the input with minimal use
of external components. The ICS858S011I is packaged in a small
3mm x 3mm 16-pin VFQFN package which makes it ideal for use in
space-constrained applications.
Features
Two differential CML outputs
IN/nIN pair can accept the following differential input levels:
LVPECL, LVDS, CML, SSTL
Maximum output frequency: 2GHz
Output skew: 25ps (maximum)
Part-to-part skew: 250ps (maximum)
Additive phase jitter, RMS: 0.042ps (typical)
Propagation delay: 525ps (maximum)
Operating voltage supply range:
VCC = 2.375V to 3.63V, VEE = 0V
-40°C to 85°C ambient operating temperature
Available in lead-free (RoHS 6) package
ICS858S011I
16-Lead VFQFN
3mm x 3mm x 0.925mm package body
K Package
Top View
Pin Assignment
Block Diagram
Q0
nQ0
Q1
nQ1
IN
nIN
VREF_AC
VT
RIN
RIN
5 6 7 8
16 15 14 13
1
2
3
4
12
11
10
9
IN
VT
VREF_AC
nIN
Q0
nQ0
nQ1
Q1
VCC
VEE
VEE
VCC
VEE
VEE
Vcc
VCC
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 2 ©2010 Integrated Device Technology, Inc.
Table 1. Pin Descriptions
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
DC Electrical Characteristics
Table 2A. Power Supply DC Characteristics, VCC = 2.375V to 3.63V, VEE = 0V, TA = -40°C to 85°C
Number Name Type Description
1 IN Input Non-inverting differential LVPECL clock input.
2V
TInput Termination input.
3V
REF_AC Output Reference voltage for AC-coupled applications.
4 nIN Input Inverting differential LVPECL clock input.
5, 8, 13, 16 VCC Power Power supply pins.
6, 7, 14, 15 VEE Power Negative supply pins.
9, 10 Q1, nQ1 Output Differential output pair. CML interface levels.
11, 12 nQ0, Q0 Output Differential output pair. CML interface levels.
Item Rating
Supply Voltage, VCC 4.6V (CML mode, VEE = 0V)
Inputs, VI-0.5V to VCC + 0.5V
Outputs, IO
Continuous Current
Surge Current
20mA
40mA
Input Current, IN/nIN +50mA
VT Current, IVT +100mA
Input Sink/Source, IREF_AC ±2mA
Operating Temperature Range, TA-40°C to 85°C
Storage Temperature, TSTG -65°C to 150°C
Package Thermal Impedance, θJA (Junction-to-Ambient) 74.7°C/W (0 mps)
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VCC Positive Supply Voltage 2.375 3.3 3.63 V
IEE Power Supply Current 57 mA
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 3 ©2010 Integrated Device Technology, Inc.
Table 2B. DC Characteristics, VCC = 2.375V to 3.63V, VEE = 0V, TA = -40°C to 85°C
NOTE 1: Refer to Parameter Measurement Information, Input Voltage Swing Diagram.
Table 2C. CML DC Characteristics, VCC = 2.375V to 3.63V, VEE = 0V, TA = -40°C to 85°C
NOTE 1: Outputs terminated with 50 to VCC.
AC Electrical Characteristics
Table 3. AC Characteristics, VCC = 2.375V to 3.63V, VEE = 0V, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. Device will meet specifications after thermal equilibrium has
been reached under these conditions.
All parameters characterized at 1.2GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage, same temperature, same frequency and with equal load conditions.
Measured at the output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
RIN Differential Input Resistance IN/nIN IN to VT
, nIN to VT40 50 60
VIH Input High Voltage IN/nIN 1.2 VCC V
VIL Input Low Voltage IN/nIN 0 VIH – 0.15 V
VIN Input Voltage Swing; NOTE 1 0.15 1.2 V
VDIFF_IN Differential Input Voltage Swing 0.3 V
IN to VTVoltage between IN and VTIN/nIN 1.28 V
VREF_AC Reference Voltage VCC – 1.4 VCC – 1.3 VCC – 1.2 V
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VOH Output High Voltage; NOTE 1 VCC – 0.020 VCC – 0.010 VCC V
VOUT Output Voltage Swing 325 400 mV
VDIFF_OUT Differential Output Voltage Swing 650 800 mV
ROUT Output Source Impedance 40 50 60
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fOUT Output Frequency 2GHz
tPD
Propagation Delay, Differential;
NOTE 1 275 525 ps
tsk(o) Output Skew; NOTE 2, 4 25 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 4 250 ps
tjit Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
155.52MHz @ 3.3V, Integration
Range: 12kHz – 20MHz 0.042 ps
tR / tFOutput Rise/Fall Time 20% to 80% 60 200 ps
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 4 ©2010 Integrated Device Technology, Inc.
Additive Phase Jitter
The spectral purity in a band at a specific offset from the fundamental
compared to the power of the fundamental is called the dBc Phase
Noise. This value is normally expressed using a Phase noise plot
and is most often the specified plot in many applications. Phase noise
is defined as the ratio of the noise power present in a 1Hz band at a
specified offset from the fundamental frequency to the power value of
the fundamental. This ratio is expressed in decibels (dBm) or a ratio
of the power in the 1Hz band to the power in the fundamental. When
the required offset is specified, the phase noise is called a dBc value,
which simply means dBm at a specified offset from the fundamental.
By investigating jitter in the frequency domain, we get a better
understanding of its effects on the desired application over the entire
time record of the signal. It is mathematically possible to calculate an
expected bit error rate given a phase noise plot.
As with most timing specifications, phase noise measurements has
issues relating to the limitations of the equipment. Often the noise
floor of the equipment is higher than the noise floor of the device. This
is illustrated above. The device meets the noise floor of what is
shown, but can actually be lower. The phase noise is dependent on
the input source and measurement equipment.
The source generator "Rohde & Schwarz SMA100A Low Noise
Signal Generator as external input to an Agilent 8133A 3GHz Pulse
Generator".
SSB Phase Noise dBc/Hz
Offset from Carrier Frequency (Hz)
Additive Phase Jitter @ 155.52MHz
12kHz to 20MHz = 0.042ps (typical)
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 5 ©2010 Integrated Device Technology, Inc.
Parameter Measurement Information
CML Output Load AC Test Circuit
Part-to-Part Skew
Single-ended & Differential Input Voltage Swing
Differential Input Level
Output Skew
Propagation Delay
SCOPE
Qx
Power
Supply
V
EE
V
CC
CML Driver
0V
-2.375V to -3.63V
tsk(pp)
Part 1
Part 2
Qx
nQx
Qy
nQy
VIN, VOUT
400mV
(typical)
VDIFF_IN, VDIFF_OUT
800mV
(typical)
V
IH
Cross Points
V
IN
V
IL
IN
nIN
VCC
VEE
tsk(o)
Qx
nQx
Qy
nQy
tPD
nQ0, nQ1
Q0, Q1
IN
nIN
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 6 ©2010 Integrated Device Technology, Inc.
Parameter Measurement Information, continued
Output Rise/Fall Time
Applications Information
Recommendations for Unused Output Pins
Outputs:
CML Outputs
All unused CML outputs can be left floating. We recommend that
there is no trace attached. Both sides of the differential output pair
should either be left floating or terminated.
20%
80% 80%
20%
t
R
t
F
V
SWING
nQ0, nQ1
Q0, Q1
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 7 ©2010 Integrated Device Technology, Inc.
3.3V LVPECL Input with Built-In 50 Termination Interface
The IN /nIN with built-in 50 terminations accept LVDS, LVPECL,
CML, SSTL and other differential signals. Both differential inputs
must meet the VPP and VCMR input requirements. Figures 1A to 1E
show interface examples for the IN /nIN input with built-in 50
terminations driven by the most common driver types. The input
interfaces suggested here are examples only. If the driver is from
another vendor, use their termination recommendation. Please
consult with the vendor of the driver component to confirm the driver
termination requirements.
Figure 1A. IN/nIN Input with Built-In 50
Driven by an LVDS Driver
Figure 1C. IN/nIN Input with Built-In 50
Driven by a CML Driver with Open Collector
Figure 1E. IN/nIN Input with Built-In 50
Driven by an SSTL Driver
Figure 1B. IN/nIN Input with Built-In 50
Driven by an LVPECL Driver
Figure 1D. IN/nIN Input with Built-In 50
Driven by a CML Driver with Built-In 50
Pullup
IN
nIN
VT
Receive
r
With
Built-In
50
LVDS
3.3V 3.3V
Zo = 50
Zo = 50
IN
nIN
VT
CML – Open Collector
Receiver
With
Built-In
50
3.3V3.3V
Zo = 50
Zo = 50
SSTL
R1 25
R2 25
IN
nIN
VT
Receive
r
With
Built-In
50
3.3V 3.3V
Zo = 50
Zo = 50
IN
nIN
VT
Receiver
With
Built-In
50
R1
50
LVPECL
3.3V3.3V
Zo = 50
Zo = 50
CML – Built-in 50 Pull-up
IN
nIN
VT
Receiver
With
Built-In
50
3.3V 3.3V
Zo = 50
Zo = 50
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 8 ©2010 Integrated Device Technology, Inc.
2.5V LVPECL Input with Built-In 50 Termination Interface
The IN /nIN with built-in 50 terminations accept LVDS, LVPECL,
CML, SSTL and other differential signals. Both differential inputs
must meet the VPP and VCMR input requirements. Figures 2A to 2E
show interface examples for the IN /nIN with built-in 50 termination
input driven by the most common driver types. The input interfaces
suggested here are examples only. If the driver is from another
vendor, use their termination recommendation. Please consult with
the vendor of the driver component to confirm the driver termination
requirements.
Figure 2A. IN/nIN Input with Built-In 50
Driven by an LVDS Driver
Figure 2C. IN/nIN Input with Built-In 50
Driven by a CML Driver
Figure 2E. IN/nIN Input with Built-In 50
Driven by an SSTL Driver
Figure 2B. IN/nIN Input with Built-In 50
Driven by an LVPECL Driver
Figure 2D. IN/nIN Input with Built-In 50 Driven by a
CML Driver with Built-In 50 Pullup
IN
nIN
VT
Receiver
With
Built-In
50
LVDS
3.3V or 2.5V 2.5V
Zo = 50
Zo = 50
IN
nIN
VT
CML
Receive
r
With
Built-In
50
2.5V2.5V
Zo = 50
Zo = 50
SSTL
R1 25
R2 25
IN
nIN
VT
Receiver
With
Built-In
50
2.5V 2.5V
Zo = 50
Zo = 50
IN
nIN
VT
Receiver
With
Built-In
50
R1
18
LVPECL
2.5V2.5V
Zo = 50
Zo = 50
CML - Built-in 50 Pull-up
IN
nIN
VT
Receive
r
With
Built-In
50
2.5V 2.5V
Zo = 50
Zo = 50
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 9 ©2010 Integrated Device Technology, Inc.
Schematic Example
Figure 3 shows a schematic example of the ICS858S011I. This
schematic provides examples of input and output handling. The
ICS858S011I input has built-in 50 termination resistors. The input
can directly accept various types of differential signal without AC
couple. If AC couple termination is used, the ICS858S011I also
provides VREF_AC pin for proper offset level after AC couple. This
example shows the ICS858S011I input driven by a 3.3V LVPECL
driver. The ICS858S011I outputs are CML driver with built-in 50
pullup resistors. In this example, we assume the traces are long
transmission line and the receiver is high input impedance without
built-in matched load. An external 100 resistor across the receiver
input is required.
Figure 3. ICS858S011I Application Schematic Example
Zo = 50
LVPECL
[U1,5]
Zo = 50
Q0
Zo = 50
R5
50
3.3V
3.3V
3.3V
Q1
C4
0.1u
100 Ohm Dif f erential
Zo = 50
nQ1
[U1,8]
R4
50
3.3V
C3
0.1u
Alternativ e Termination Example f or
CML Driv er with Built-in Internal Pull
Up Resistor
3.3V
Zo = 50
C2
0.1u
R7
100
3.3V
[U1,13]
3.3V
Q0
+
-
[U1,16]
U1
ICS858011
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
IN
VT
VREF_AC
nIN
VCC
VEE
VEE
VCC
Q1
nQ1
nQ0
Q0
VCC
VEE
VEE
VCC
+
-
R1
150
3.3V
C1
0.1u
nQ0
Zo = 50
+
-
3.3V
R3
50
nQ0
R6
50
R2
150
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 10 ©2010 Integrated Device Technology, Inc.
VFQFN EPAD Thermal Release Path
In order to maximize both the removal of heat from the package and
the electrical performance, a land pattern must be incorporated on
the Printed Circuit Board (PCB) within the footprint of the package
corresponding to the exposed metal pad or exposed heat slug on the
package, as shown in Figure 4. The solderable area on the PCB, as
defined by the solder mask, should be at least the same size/shape
as the exposed pad/slug area on the package to maximize the
thermal/electrical performance. Sufficient clearance should be
designed on the PCB between the outer edges of the land pattern
and the inner edges of pad pattern for the leads to avoid any shorts.
While the land pattern on the PCB provides a means of heat transfer
and electrical grounding from the package to the board through a
solder joint, thermal vias are necessary to effectively conduct from
the surface of the PCB to the ground plane(s). The land pattern must
be connected to ground through these vias. The vias act as “heat
pipes”. The number of vias (i.e. “heat pipes”) are application specific
and dependent upon the package power dissipation as well as
electrical conductivity requirements. Thus, thermal and electrical
analysis and/or testing are recommended to determine the minimum
number needed. Maximum thermal and electrical performance is
achieved when an array of vias is incorporated in the land pattern. It
is recommended to use as many vias connected to ground as
possible. It is also recommended that the via diameter should be 12
to 13mils (0.30 to 0.33mm) with 1oz copper via barrel plating. This is
desirable to avoid any solder wicking inside the via during the
soldering process which may result in voids in solder between the
exposed pad/slug and the thermal land. Precautions should be taken
to eliminate any solder voids between the exposed heat slug and the
land pattern. Note: These recommendations are to be used as a
guideline only. For further information, please refer to the Application
Note on the Surface Mount Assembly of Amkor’s Thermally/
Electrically Enhance Leadframe Base Package, Amkor Technology.
Figure 4. P.C. Assembly for Exposed Pad Thermal Release Path – Side View (drawing not to scale)
SOLDERSOLDER PINPIN EXPOSED HEAT SLUG
PIN PAD PIN PADGROUND PLANE LAND PATTERN
(GROUND PAD)
THERMAL VIA
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 11 ©2010 Integrated Device Technology, Inc.
Power Considerations
This section provides information on power dissipation and junction temperature for the ICS858S011I.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS858S011I is the sum of the core power plus the power dissipation in the load(s).
The following is the power dissipation for VDD = 3.3V + 10% = 3.63V, which gives worst case results.
NOTE: Please refer to Section 3 for details on calculating power dissipation in the load.
Power (core)MAX = VDD_MAX * IDD = 3.63V * 57mA = 206.9mW
Power Dissipation for internal termination RT
Power (RT)MAX = 4 * (VIN_MAX)2 / RT_MIN = (1.2V)2 / 80 = 72mW
Total Power_MAX = 206.9mW + 72mW = 278.9mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad, and directly affects the reliability of the device. The
maximum recommended junction temperature is 125°C. Limiting the internal transistor junction temperature, Tj, to 125°C ensures that the bond
wire and bond pad temperature remains below 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming no air flow and
a multi-layer board, the appropriate value is 74.7°C/W per Table 4 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.279W * 74.7°C/W = 105.8°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow and the type of
board (multi-layer).
Table 4. Thermal Resistance θJA for 16 Lead VFQFN, Forced Convection
θJA by Velocity
Meters per Second 012.5
Multi-Layer PCB, JEDEC Standard Test Boards 74.7°C/W 65.3°C/W 58.5°C/W
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 12 ©2010 Integrated Device Technology, Inc.
Reliability Information
Table 5. θJA vs. Air Flow Table for a 16 Lead VFQFN
Transistor Count
The transistor count for ICS858S011I is: 216
Pin Compatible with 858011
θJA vs. Air Flow
Meters per Second 012.5
Multi-Layer PCB, JEDEC Standard Test Boards 74.7°C/W 65.3°C/W 58.5°C/W
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 13 ©2010 Integrated Device Technology, Inc.
Package Outline and Package Dimensions
Package Outline - K Suffix for 16 Lead VFQFN
Table 6. K Package Dimensions for 16 Lead VFQFN
Reference Document: JEDEC Publication 95, MO-220
Top View
Index
A
rea
D
Chamfer 4x
0.6 x 0.6 max
OPTIONAL
A
0. 08 C
C
A3
A1
Seating Plan
e
E2
E2
2
L
(N
-1)x e
(R ef.)
(Ref.)
N & N
Even
N
e
D2
2
D2
(Ref.)
N& N
Odd
1
2
e
2
(Typ.)
If N & N
are Even
(N -1)x e
(Re f.)
b
Thermal
Base
N
DE
DDE
DE
E
Anvil
Singulation
or
Sawn
Singulation
N-1N
CHAMFER
1
2
N-1
1
2
N
RADIUS
N-1
1
2
N
AA
DD
CC
BB
4
4
4
4
4
4
Bottom View w/Type B ID Bottom View w/Type C IDBottom View w/Type A ID
There are 3 methods of indicating pin 1 corner
at the back of the VFQFN package are:
1. Type A: Chamfer on the paddle (near pin 1)
2. Type B: Dummy pad between pin 1 and N.
3. Type C: Mouse bite on the paddle (near pin 1)
All Dimensions in Millimeters
Symbol Minimum Maximum
N16
A0.80 1.0
A1 00.05
A3 0.25 Reference
b0.18 0.30
e0.50 Basic
D, E 3.0
D2, E2 1.00 1.80
L0.30 0.50
ND NE4.0
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
ICS858S011AKI REVISION A OCTOBER 12, 2010 14 ©2010 Integrated Device Technology, Inc.
Ordering Information
Table 7. Ordering Information
NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant.
Part/Order Number Marking Package Shipping Packaging Temperature
858S011AKILF 011A “Lead-Free” 16 Lead VFQFN Tube -40°C to 85°C
858S011AKILFT 011A “Lead-Free” 16 Lead VFQFN 2500 Tape & Reel -40°C to 85°C
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology (IDT) assumes no responsibility for either its use or for the
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal
commercial and industrial applications. Any other applications, such as those requiring high reliability or other extraordinary environmental requirements are not recommended without
additional processing by IDT. IDT reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support
devices or critical medical instruments.
ICS858S011I Data Sheet LOW SKEW, 1-TO-2, DIFFERENTIAL-TO-CML FANOUT BUFFER
DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT’s sole discretion. All information in this document,
including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined in the independent state and are not
guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the
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