CY7C271A
Document #: 38-04013 Rev. *B Page 2 of 10
Maximum Ratings[1]
(Above which the useful life may be impaired. For user guide-
lines, not tes ted .)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential...............–0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ...............................................–0.5V to +7.0V
DC Input Voltage............................................–3.0V to +7.0V
DC Program Voltage ....................................................13.0V
Static Discha rge Voltage..... ................. ...... ................>4001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.....................................................>200 mA
UV Exposure ................................................7258 Wsec/cm2
Selection Guide 7C271A-25 7C271A-30 7C271A-35 7C271A-45 Unit
Maxi mu m A cc es s Time 25 30 35 45 ns
Maximum Operat ing Curre nt Com’l 75 75 50 50 mA
Standby Current Com’l 15 15 15 15 mA
Operating Range
Range Ambient
Temperature VCC
Commercial 0°C to +700°C 5V ±10%
Electrical Characteristi cs Ov er the Operating Ran ge [2, 3]
Parameter Description Test Conditions
7C271A-25
7C271A-30 7C271A-35 7C271A-45
UnitMin. Max. Min. Max. Min. Max.
VOH Output HIGH
Voltage VCC = Min., IOH = –2.0 mA 2.4 2.4 2.4 V
VOL Output LOW Voltage VCC = Min., I OL = 8.0 mA 0.4 0.4 0.4 V
VIH Input HIGH Level Guaranteed Input Logical HIGH
Voltage for All Input s 2.0 VCC 2.0 VCC 2.0 VCC V
VIL Input LOW Level Guaranteed Input Logical LOW
Voltage for All Input s 0.8 0.8 0.8 V
IIX Input Leakage
Current GND < VIN < VCC –10 +10 –10 +10 –10 +10 µA
IOZ Output Leakage
Current GND < VOUT < VCC,
Output Disable –10 +10 –10 +10 –10 +10 µA
IOS Output Short Circuit
Current[4] VCC = Max., VOUT = GND –20 –90 –20 –90 –20 –90 mA
ICC Power Supply
Current VCC=Max., IOUT = 0 mA,
f = 10 MHz Com’l 75 50 50 mA
ISB Stand-By Current VCC=Max.,
CE = VIH Com’l 15 15 15 mA
Capacitance[3]
Parameter Description Test Conditions Max. Unit
CIN Input Capacitance TA = 25°C, f = 1 MHz,
VCC = 5.0V 10 pF
COUT Output Capacitance 10 pF
Notes:
1. The voltage on any input or I/O pin cannot exceed the power pin during power-up.
2. See the last page of this specification for Group A subgroup testing information.
3. See Introduction to CMOS PROMs in this Data Book for general information on testing.
4. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
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