MIL.S.19500/24D 18 March 1970 SUPERSEDING MI L-s.19500/24c 14 May 1963 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, POWER TYPE 2N 158 This specifimticm partmenls is mandatory nnd/lgcncics for use of the Department by .11 Ocof Dcfensc. 1. SCOPE 1.1 Scope. This specification 1.2 Physicaf dimetions. covers the detail rcquirermnts for a PNP, germanium, power transistor, See figure 1. 1.3 Maximum ratings. 3EEEEE ~ Derntc linearly 0.283 W~C {or TA >25" C. 1.4 Primary electrical characteristics. 2. APPLICABLE DOCUMENTS 2.1 The following documents, of the issue in effect on date of invitation form a pnrt of the specification to the extent specified herein. for bids or request for propowd, SPECIFICATION MILfTARY i }il L-S-l 9500. %nicond".tor Devices, Gcmral Sp.mificntio" for, FSC 5961 .$.".. L-a. . . ,Ymlu, . . . . . ... .. ." STANDARD ?, OLITARY' ?JII,.STD .750 (Copim Tc.qtVt.th.ds for !jernimnduct.r Dwiccs. of specifications, ~tmdards, drawir~s, and publication. specific proc.rernenl required by suppliers in c.nmction functions should k. obtained from the procuring .cti\ity with or m direcwt by tbc contracting 011,..,,) 3. REQUIREMENTS 3.1 Ge.mnl. I{cquircmmts 3.2 shall be i. mi.rda.w wilh !IIL-S.19500, Abbreviations, syrnbofs, md de finitimm `flw abbrrvialions, and .s .pccifiml hcrci., symbols, and definitions used herein arc defined in MIL-S. 19500. 3.3 Design, construction, physical dimnsi.n. how. z.d pbysicat dimensions. Trm,t.lots shc.tfbe .[ tbe design, w.structim, and on figure 1. 3.4 Performance chamcteristicm Prrformancr .Itaravtmistims haO be .s specified in tablm 1,11, and 01. 3.5 Marking. Ttw following transi40r at the optiw marking ,P.ci lied in NIL-S. 19S00 may ix omit ~.d from tbe body of & of th, rmnufmt.rm: (.) Country ./ origin. (b) Nmm(.cturcr's 4. QUALITY idcrttification. ASSURANCE PROVISIONS 4.1 Sampling and inspcctio.. SOmpti.g and inspection shall ht. in accordance wiib 3!IL.S. 19,500, and M specifi~'d b~r?in. 4.2 Qu.difimtio. impectio.. Qu.lificati.. i.sp-.ti.n shall ,romist .1 the ex.mirmti.m and t..sls tiprcificd in tables 1, 0, md 10. 4.3 Quality ccmformance inspection. Qtmlity wmforrnmrc i.,pmlim .hafl c.rwist of group A, B, and C inspection. 4.3.1 Croup .1 hsp.cf ion. Group A in,pc.t ion shall consist of ttw cx.tninali..s a"d twts spmified i. bible 1. 4.3.? croup B in~pcction. GCOIIP B iw~'~ti.rl 51330 ruvl+t of lhc r~amirlation~ and M, specified in tabl. u. 4.3.3 Group c fn$pc~tion. Croup c iw~~ti.:1 .hao <'<>rlsi*i ~~fih(" t'xaminati~na a:ld t=!a specified in table 01, Thu inspection hall b,, cmducted on 11,,,initi.1 1.( nml thm,afler ,WTy 6 months during production. 4.3.4 Iif..tmt, Group B md mtnpl.s .hdl C Iifc-tmt wmplm. %mpbw that haw bccu mbjcctcd t. ~o.p on lw1 to 1,000 Ito.m i" ,,rd.r b. prrdwignat.d, they have p.sncd lb. 340.ho.r group may be mnt inwd .nd shafl rcmair, mbjccted t{, the grmp c 1.BBO-h..r group D. 340.hmr test and during the s.b,wq.ml ..wpt..cc B, 340.ho.r to satisfy grtmp C fife-fcst rqukcmmts. criteria, The c.rn.lali.c Tbex acc.ptmnce wahmtion after total .f failtme~ found during i"tcmnl up to 1000 hours mhallbe computed for 1,MtO.ho.r .cceptance criicrim(m. 4.3.3). 4.4 MeOIoda of examination md Id. Methods of .xwnimti.. md 01. 2 and test shalt be as tipccikd in tablm I, O, MI L-s- 19500/24D `o 1 4 -28 ~"MIN l--;+ UNF-2B FULL THREAD +='=j `{ 7 c E DIA + SEE'NOTE 4 2 0 .Id $' r-l .4+' $% ~-- "y 0 I NOTES: 1. Metric equivalents (to the nearest .01 mm)are and are based upon 1 inch = 25.4 mm. 2. Three leads ewallyswced. 3. The lead arra&em-ent sballbe as follow% . . . Bfack Lead 1. . . . . . Collector... Lead 2 . . . . .. White . . . . . . . .. White Lead 3. . . . .. EmiRtir . . . . . ..Rti 4. Tbe collector shailbe electrically comectedto FIGURE 1. Pby6ical dimensions 3 given for general information the case. of transistorty pe 2N158. only I TABLE]. MSLS.1951WZ4D Gm.p,limpmlim AIIL-STD.750 Examination ., Subgroup ?iiual snd Sub,qmup exmmin,tion cofkctm to bw 3001 Mm mnd D, lc = .1.0 vdt~ .Ldlc,tor , 3@s1 to emitter cutoff -"t Mcctor to b- cutoff Currcnl Xfcctnr 3036 3036 3061 to k cu:mf Bim cmd. D, m,\dc 3imc.md C, VCE = .60 \,dc Svbpy Ilk rend. 40 Vdc BVCEO .30 Vdc D; B&ccmd, = 1.5 mAdc IC3D lcm "Ad. Ictlo 1.0 mddx D, 0.5 rddc ).85 Vdc 1.3 Vdc 0.75 Vdc lEBO .30 \,dc 5 3 (n.m,turmd) vdbgc emitter,dhge (mtura!ed) 3C66 T..: ccmd B: `BE 3066 Tat ccmd lB =.0,5 Ad, A, EfE(@ lB=-150m,idc: 3071 Fcmwrd.cwmnt transfer ratio 3076 \,cE = .2 Vdc: lc = .0.5 Ad, `FE ?mward-cwmn L wmafc, r, tio 3076 \,cE = .2 Vdc, Ic = .1.0 Ad. `m. Subgroup cutoff m,\dc; fc = .1.0 IX(4 ,\dc -. 21 10 13 10 J short.armit Fmwrd.cumm ID = -150 -- lc=-l.0,\dc :*,1O. to etitlm WJtq (,.huated) infl.dgml -- .60 Vd< \,c E -- . ~ . \,dc, k rfvcBo Icfs Lb! ccmd. D: VEB current emitter -- mAdc Ic = .2.50 VCB = -"1 kin=, -- VCB = .2 Vdc 10 k cutoff & 3011 10 mni:tm :Cdkctor Unil -- K. 5 2 wltq, lmtidmwn M.. S,mbd 10 ) UEchticd ]m*d.w !-imils .TPD test 3301 t trm,fcr.rati. \!cg =.2 Vdci Ic = .0.5 `h(e k![z 4 Ad. fre.umw TADLEU. Group BiIupTdrm. -- MIL-STD-750 ExmdmJ,ic.n hyicd (kmp.tllm -- `2026 1051 cycling) ffnil 15 2 chock M. x -- 2066 Cdl!erllq' Iwrtnd !ki. 10 I dilmtion, Subgroup S,mbd Detail, Mmhod Subgroup Limi,s .ITD O, I*SI Tc,t T ~x. cmd. B, cxccpt +lfwc 4 -- -- MIW193DW=D Croup TADLfifl. Bimpcli... tin1tcdcd -- -- Limit, M[L-STD-750 Examination or test De,oll, ,.,hd Hi. h. hit -- Subgroup ,c,md 2. Cuntinucd chock (~ass ntrmn) d (kA rare) 056 Test 071 Tat ted ohm mistzllcc con d. A omd. C m H (o, fine c-d. X107 Ids; ~ lab 021 omit him 1036 f3=umd.D; .tm dam A, C. l) m F fm .mditioning td pcinta: CL4kzctor m k cut off Emi :Qr mln.m 1 0S1 to_&c cutoff VCB = .bO Vdc Em cad. \,EB current Forwankment lmder mtio !076 D; cm 1,0 nAdc ESO 0,5 nAdc = .3D Vdc YCE = -2 Vdc, IFS 13 10 lc=.l.OAdc S"bgmup 15 3 2016 t.* Nmqcmdng 5@3 in cd 5 Uowa C, 1 me, Ori.nwi.m: xl.yl,~?.mdzt ibrn Lim, .mi*& Mlslmt fmqmmcy mcekr.ticm w,6 100to !X16 5000 X1. lcmo N% 10G G in ,,* Y1, .arkntid.m: Y2, mdZ1 nd @rim: (Sam as MJbg.aup S.bpql ermimf nhm@h 2) 20 4 (bad fatigx) 2036 Test cad. 1071 Tat cmd. lest cond. -- E nd points: *II (lm!.r.tr) ~ Subgrmy dl .Cmcapk=re "d painw (same li+.lcmp.ilm (n_wr~W fine ;Xlw' Id=: 20 (comma) lIX1 2) 7 6 life 1032 %=+ 'omc'`m =`oh""m (ccc 4.3.4) ma C&c Ida 5 =! `"bw.p Subgroup C m H for A, C, D or F for MIS,.S.i%WF3/24D TAB~.E 11. Croup R inqwtian ilmtinuad Limits MIL.STD-750 Exmnirmtior, or LTPD test Detc.il, Mtth.ad S+py 6. k. U"l t - .~o m4dc lEBO - 10 h FE B so Srmb.al Ml" 1(:RO Cunfinu,d nd ptinls: Ccdkctm to k CUt"fr ~mit!m 3336 cumnt t" k Bim V(:B CU(olr Curlrnt 306 I Mm \E. Fmmktmrr.1 bmifcr 3076 ratio wn,d. l), = .60 r-d. \dc D, mAd, =.30\dc V(:E,.2.\dr: - lc=.l,OAdc Snbp.p Ir.**tafr 10 7 op.tim I 02. life Tc = +(xT ,5%: t,,,, --14 . . . \dc: . PT=7R:tim'=3tOhoum (m $3.4) nd pcin!n (Sam w ,uhgwup 6) TAB1.E 111. Croup C in,pec. t,an .h, ch .) 1 111.. re th. t suit.b c product. can be pm.. red with i !r,,mm mm.aunt of .del,y mnd ,! the 1.,,, c s,. bents .n~ the re~.rn of thic }... .,11 b. .ppr.c,.d, Fold m ,.8 send to ~r,p.r,r,~ act,v,,y (.. ta,, z.,,d an ,,..,,, h,,ee f,. ,..on rerermc ,,de, s,,F.1o ,. corner, CC IF ICATION A TlON ~12 ml (0/ .ab. i,t. r) CITT NO. w AN TIWOF I w w AND STATE PRoOJ RED DOLLAR No UNT 1 hTw!l A1. HAS PRG.c" RELl UNDER A n Q,nEc~ ,0vC9NMCNT CONTRACT PART OF THE SPK I FICATION CREATEO ANY . . ., v, ..".. ,. ",,,..,.0 ".," ""..,, .,,,., . . . ,." .. O SUBCONTRACT pR0BLEM5 OR REWIRED !NTERPRE7AT10N IN PROCIJREMENT IJSE7 ,0,... ,0,",,,,". ,", ,,, ,,, ,".,,,. COWENT5 15 ON THE tiNY SPECIFICATION SPECIFICATION c1 CCU51DERED TOO RIGID RC5TR1CTIVE1 O ,,~ RETIREMENT `o IF `,CS-, IN .IIAT ..,1 RWARKS ,,...1 IWITTEO .".. (A II. P. P.,., (Pramt*d BY ,., . . ~, w'31*~'J Ch any .:1.. .rtincnf f O, t. f.,. t,ped d.t. .hich andplac< "... .nd ..y, b. of.. c i. both ," an . ..c1oP. ..11" i.vovi.6 addr<,, Ihi$ ed 117) REPLACES NAVSHIP5FORM,063, $P.. if.i.. 10 P.cP.. DATE .w,." ,, .. S"LLTE z.8. ,iq. clL" .If E1, th.r? J are .ddi -