SN54F10, SN74F10
TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A – MARCH 1987 – REVISED OCTOBER 1993
Copyright 1993, Texas Instruments Incorporated
2–1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
•Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
description
These devices contain three independent 3-input
NAND gates. They perform the Boolean functions
Y = A • B • C or Y = A + B + C in positive logic.
The SN54F10 is characterized for operation over
the full military temperature range of –55°C to
125°C. The SN74F10 is characterized for
operation from 0°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS OUTPUT
A B C Y
H H H L
LXX H
XLX H
XXL H
logic symbol†
&
Y
1
1A 2
1B 13
1C
1Y
12
3
2A 4
2B 5
2C
2Y
6
9
3A 10
3B 11
3C
3Y
8
A
B
C
logic diagram, each gate (positive logic)
†This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54F10 ...J PACKAGE
SN74F10 ...D OR N PACKAGE
(TOP VIEW)
SN54F10 . . . FK PACKAGE
(TOP VIEW)
3212019
910111213
4
5
6
7
8
18
17
16
15
14
1Y
NC
3C
NC
3B
2A
NC
2B
NC
2C
1B
1A
NC
3Y
3A V
1C
2Y
GND
NC CC
NC – No internal connection
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
2A
2B
2C
2Y
GND
VCC
1C
1Y
3C
3B
3A
3Y
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
SN54F10, SN74F10
TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A – MARCH 1987 – REVISED OCTOBER 1993
2–2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1) –1.2 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input current range –30 mA to 5 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the high state –0.5 V to VCC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Current into any output in the low state 40 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range: SN54F10 –55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74F10 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may af fect device reliability.
NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed.
recommended operating conditions
SN54F10 SN74F10
UNIT
MIN NOM MAX MIN NOM MAX
UNIT
VCC Supply voltage 4.5 5 5.5 4.5 5 5.5 V
VIH High-level input voltage 2 2 V
VIL Low-level input voltage 0.8 0.8 V
IIK Input clamp current –18 –18 mA
IOH High-level output current –1 –1 mA
IOL Low-level output current 20 20 mA
TAOperating free-air temperature –55 125 0 70 °C
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54F10 SN74F10
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP‡MAX MIN TYP‡MAX
UNIT
VIK VCC = 4.5 V, II = –18 mA –1.2 –1.2 V
VOH
VCC = 4.5 V, IOH = – 1 mA 2.5 3.4 2.5 3.4
V
V
OH VCC = 4.75 V, IOH = – 1 mA 2.7
V
VOL VCC = 4.5 V, IOL = 20 mA 0.3 0.5 0.3 0.5 V
IIVCC = 5.5 V, VI = 7 V 0.1 0.1 mA
IIH VCC = 5.5 V, VI = 2.7 V 20 20 µA
IIL VCC = 5.5 V, VI = 0.5 V – 0.6 – 0.6 mA
IOS§VCC = 5.5 V, VO = 0 –60 –150 –60 –150 mA
ICCH VCC = 5.5 V, VI = 0 1.4 2.1 1.4 2.1 mA
ICCL VCC = 5.5 V, VI = 4.5 V 5.1 7.7 5.1 7.7 mA
‡All typical values are at VCC = 5 V, TA = 25°C.
§Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.
SN54F10, SN74F10
TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A – MARCH 1987 – REVISED OCTOBER 1993
2–3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
switching characteristics (see Note 2)
PARAMETER FROM
(
INPUT
)
TO
(
OUTPUT
)
VCC = 5 V,
CL = 50 pF,
RL = 500 Ω,
TA = 25°C
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
RL = 500Ω,
TA = MIN to MAX†UNIT
(INPUT)
(OUTPUT)
′F10 SN54F10 SN74F10
MIN TYP MAX MIN MAX MIN MAX
tPLH
ABorC
Y
1.6 3.3 5 1.2 7 1.6 6
ns
tPHL
A
,
B
,
or
C
Y
1 2.8 4.3 1 6.5 1 5.3
ns
†For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
NOTE 2: Load circuits and waveforms are shown in Section 1.
SN54F10, SN74F10
TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A – MARCH 1987 – REVISED OCTOBER 1993
2–4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
