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©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
S
D
S
S
SO-8
D
D
D
G
DDDD
SSSG
Pin 1
SO-8
FDS2572
150V, 0.047 Ohms, 4.9A, N-Channel UltraFET® Trench MOSFET
General Description
UltraFET® devices combine characteristics that enable
benchmark efficiency in power conversion applications.
Optimized for Rds(on), low ESR, low total and Miller gate
charge, these devices are ideal for high frequency DC to
DC converters.
Applications
DC/DC converters
Telecom and Data-Com Distributed Power Architectures
48-volt I/P Half-Bridge/Full-Bridge
24-volt Forward and Push-Pull topologies
Features
RDS(ON) = 0.040 (Typ.), VGS = 10V
Qg(TOT) = 29nC (Typ.), VGS = 10V
Low QRR Body Diode
Maximized efficiency at high frequencies
UIS Rated
MOSFET Maximum Ratings TA=25°C unless otherwise noted
Thermal Characteristics
Package Marking and Ordering Information
Symbol Parameter Ratings Units
VDSS Drain to Source Voltage 150 V
VGS Gate to Source Voltage ±20 V
ID
Drain Current 4.9 A
Continuous (TC = 25oC, VGS = 10V, RθJA = 50 oC/W)
Continuous (TC = 100oC, VGS = 10V, RθJA = 50 o3.1 A
Pulsed Figure 4 A
PDPower dissipation
Derate above 25oC2.5
20 W
mW/oC
TJ, TSTG Operating and Storage Temperature -55 to 150 oC
RθJC Thermal Resistance Junction to Case (NOTE1) 25 oC/W
RθJA Thermal Resistance Junction to Case at 10 seconds (NOTE2) 50 oC/W
RθJA Thermal Resistance Junction to Case at steady state (NOTE2) 85 oC/W
Device Marking Device Reel Size Tape Width Quantity
FDS2572 FDS2572 330mm 12mm 2500units
4
3
2
1
5
6
7
8
July 2013
C/W)
©2001 Fairchild Semiconductor Corporation
FDS2572
Electrical Characteristics TA = 25°C unless otherwise noted
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal referance is defined as the solder mounting surface of the
drain pins. RθJC is guaranteed by design while RθCA is determined by the user’s board design.
2. RθJA is measured with 1.0in2 copper on FR-4 board
Symbol Parameter Test Conditions Min Typ Max Units
BVDSS Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 150 - - V
IDSS Zero Gate Voltage Drain Current VDS = 120V - - 1µA
VGS = 0V TC = 150o- - 250
IGSS Gate to Source Leakage Current VGS = ±20V - - ±100 nA
VGS(TH) Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
rDS(ON) Drain to Source On Resistance ID = 4.9A, VGS = 10V -0.040 0.047
rDS(ON) Drain to Source On Resistance ID = 4.9A, VGS = 6V -0.044 0.053
CISS Input Capacitance VDS = 25V, VGS = 0V,
f = 1MHz
-2050 2870 pF
COSS Output Capacitance -220 310 pF
CRSS Reverse Transfer Capacitance -48 80 pF
Qg(TOT) Total Gate Charge at 10V VGS= 0V to 10V VDD = 75V
ID = 4.9A
Ig = 1.0mA
-29 38 nC
Qg(TH) Threshold Gate Charge VGS = 0V to 2V -4 6 nC
Qgs Gate to Source Gate Charge -8-nC
Qgd Gate to Drain “Miller” Charge -6-nC
Qgs2 Gate Charge Threshold to Plateau -4-nC
tON Turn-On Time
VDD = 75V, ID = 4.9A
VGS = 10V, RG = 10
- - 27 ns
td(ON) Turn-On Delay Time -14 -ns
trRise Time -4-ns
td(OFF) Turn-Off Delay Time -44 -ns
tfFall Time -22 -ns
tOFF Turn-Off Time - - 100 ns
VSD Source to Drain Diode Voltage ISD = 4.9A - - 1.25 V
ISD = 3.1A - - 1.0 V
trr Reverse Recovery Time ISD = 4.9A, dISD/dt =100A/µs- - 72 ns
QRR Reverse Recovered Charge ISD = 4.9, dISD/dt =100A/µs- - 158 nC
FDS2572 Rev. C, July 2013
RgGate Resistance 0.1 1.3 3.0
C
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
Typical Characteristic
Figure 1. Normalized Power Dissipation vs
Ambient Temperature Figure 2. Maximum Continous Drain Current vs
Case Temperature
Figure 3. Normalized Maximum Transient Thermal Impedance
Figure 4. Peak Current Capability
TA, AMBIENT TEMPERATURE (oC)
POWER DISSIPATION MULTIPLIER
00 25 50 75 100 150
0.2
0.4
0.6
0.8
1.0
1.2
125 0
2
4
6
25 50 75 100 125 150
ID, DRAIN CURRENT (A)
TC, CASE TEMPERATURE (oC)
VGS = 10V
0.001
0.01
0.1
1
10-4 10-3 10-2 10-1 100101102103
10-5
2
t, RECTANGULAR PULSE DURATION (s)
ZθJA, NORMALIZED
THERMAL IMPEDANCE
SINGLE PULSE NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJA x RθJA + TA
PDM
t1t2
DUTY CYCLE - DESCENDING ORDER
0.5
0.2
0.1
0.05
0.01
0.02
1
10
100
600
IDM, PEAK CURRENT (A)
t, PULSE WIDTH (s)
VGS = 10V
TC = 25oC
I = I25 150 - TC
125
FOR TEMPERATURES
ABOVE 25oC DERATE PEAK
CURRENT AS FOLLOWS:
10-4 10-3 10-2 10-1 100101102103
10-5
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
Figure 5. Unclamped Inductive Switching
Capability Figure 6. Transfer Characteristics
Figure 7. Saturation Characteristics Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
Figure 9. Normalized Gate Threshold Voltage vs
Junction Temperature Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
Typical Characteristic (Continued)
0.1
1
10
0.001 0.1 1 10 100
IAS, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
STARTING TJ = 25oC
STARTING TJ = 150oC
tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD)
If R = 0
If R 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 0
10
20
30
3 4 5 6
ID, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDD = 15V
TJ = -55oC
TJ = 150oC
TJ = 25oC
0
10
20
30
00.5 1.0 1.5 2.0
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 10V
VGS = 5V
VGS = 6V
VGS = 4.5V
0
0.5
1.0
1.5
2.0
2.5
-80 -40 0 40 80 120 160
NORMALIZED DRAIN TO SOURCE
TJ, JUNCTION TEMPERATURE (oC)
ON RESISTANCE
VGS = 10V, ID = 4.9A
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0.4
0.6
0.8
1.0
1.2
1.4
-80 -40 0 40 80 120 160
NORMALIZED GATE
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
THRESHOLD VOLTAGE
0.9
1.0
1.1
1.2
-80 -40 0 40 80 120 160
TJ, JUNCTION TEMPERATURE (oC)
NORMALIZED DRAIN TO SOURCE
ID = 250µA
BREAKDOWN VOLTAGE
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
Figure 11. Capacitance vs Drain to Source
Voltage Figure 12. Gate Charge Waveforms for Constant
Gate Currents
Typical Characteristic (Continued)
10
100
1000
0.1 1 10 150
5000
C
,
C
A
P
A
C
I
T
A
N
C
E
(
p
F
)
VDS, DRAIN TO SOURCE VOLTAGE (V)
CISS = CGS + CGD
COSS CDS + CGD
CRSS = CGD
VGS = 0V, f = 1MHz
0
2
4
6
8
10
0 5 10 15 20 25 30 35
VGS, GATE TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
VDD = 75V
ID = 4.9A
ID = 1A
WAVEFORMS IN
DESCENDING ORDER:
Test Circuits and Waveforms
Figure 13. Unclamped Energy Test Circuit Figure 14. Unclamped Energy Waveforms
Figure 15. Gate Charge Test Circuit Figure 16. Gate Charge Waveforms
tP
VGS
0.01
L
IAS
+
-
VDS
VDD
RG
DUT
VARY tP TO OBTAIN
REQUIRED PEAK IAS
0V
VDD
VDS
BVDSS
tP
IAS
tAV
0
VGS +
-
VDS
VDD
DUT
Ig(REF)
L
D1 VDD
Qg(TH)
VGS = 2V
Qg(TOT)
VGS = 10V
VDS
VGS
Ig(REF)
0
0
Qgs Qgd
Qgs2
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
Figure 17. Switching Time Test Circuit Figure 18. Switching Time Waveforms
Test Circuits and Waveforms (Continued)
VGS
RL
RGS
DUT
+
-VDD
VDS
VGS
tON
td(ON)
tr
90%
10%
VDS 90%
10%
tf
td(OFF)
tOFF
90%
50%
50%
10% PULSE WIDTH
VGS
0
0
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path
determines the maximum allowable device power
dissipation, P
DM, in an application. Therefore the
application’s ambient temperature, TA (oC), and thermal
resistance RθJA (oC/W) must be reviewed to ensure that
TJM is never exceeded. Equation 1 mathematically
represents the relationship and serves as the basis for
establishing the rating of the part.
In using surface mount devices such as the SO8
package, the environment in which it is applied will have
a significant influence on the part’s current and maximum
power dissipation ratings. Precise determination of PDM
is complex and influenced by many factors:
1. Mounting pad area onto which the device is attached
and whether there is copper on one side or both sides
of the board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the
part, the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 19
defines the RθJA for the device as a function of the top
copper (component side) area. This is for a horizontally
positioned FR-4 board with 1oz copper after 1000
seconds of steady state power with no air flow. This
graph provides the necessary information for calculation
of the steady state junction temperature or power
dissipation. Pulse applications can be evaluated using
the Fairchild device Spice thermal model or manually
utilizing the normalized maximum transient thermal
impedance curve.
Thermal resistances corresponding to other copper
areas can be obtained from Figure 19 or by calculation
using Equation 2. The area, in square inches is the top
copper area including the gate and source pads.
The transient thermal impedance (ZθJA) is also effected
by varied top copper board area. Figure 20 shows the
effect of copper pad area on single pulse transient
thermal impedance. Each trace represents a copper pad
area in square inches corresponding to the descending
list in the graph. Spice and SABER thermal models are
provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient
thermal impedance for pulse widths less than 100ms.
For pulse widths less than 100ms the transient thermal
impedance is determined by the die and package.
Therefore, CTHERM1 through CTHERM5 and
RTHERM1 through RTHERM5 remain constant for each
of the thermal models. A listing of the model component
values is available in Table 1.
(EQ. 1)
PDM
TJM TA
()
RθJA
-----------------------------=
(EQ. 2)
RθJA 64 26
0.23 Area+
-----------------------------+=
Figure 19. Thermal Resistance vs Mounting
Pad Area
100
150
200
0.001 0.01 0.1 1 10
50
RθJA = 64 + 26/(0.23+Area)
RθJA (oC/W)
AREA, TOP COPPER AREA (in2)
Figure 20. Thermal Impedance vs Mounting Pad Area
30
60
90
120
150
0
10-1 100101102103
t, RECTANGULAR PULSE DURATION (s)
ZθJA, THERMAL
COPPER BOARD AREA - DESCENDING ORDER
0.04 in2
0.28 in2
0.52 in2
0.76 in2
1.00 in2
IMPEDANCE (oC/W)
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
PSPICE Electrical Model
.SUBCKT FDS2572 2 1 3 ;rev August 2001
CA 12 8 8e-10
Cb 15 14 8e-10
Cin 6 8 2e-9
Dbody 7 5 DbodyMOD
Dbreak 5 11 DbreakMOD
Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 157.4
Eds 14 8 5 8 1
Egs 13 8 6 8 1
Esg 6 10 6 8 1
Evthres 6 21 19 8 1
Evtemp 20 6 18 22 1
It 8 17 1
Lgate 1 9 5.61e-9
Ldrain 2 5 1.0e-9
Lsource 3 7 1.98e-9
RLgate 1 9 56.1
RLdrain 2 5 10
RLsource 3 7 19.8
Mstro 16 6 8 8 MstroMOD
Mmed 16 6 8 8 MmedMOD
Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1
Rdrain 50 16 RdrainMOD 2.1e-2
Rgate 9 20 1.47
RSLC1 5 51 RSLCMOD 1e-6
RSLC2 5 50 1e3
Rsource 8 7 RsourceMOD 1.5e-2
Rvthres 22 8 RvthresMOD 1
Rvtemp 18 19 RvtempMOD 1
S1a 6 12 13 8 S1AMOD
S1b 13 12 13 8 S1BMOD
S2a 6 15 14 13 S2AMOD
S2b 13 15 14 13 S2BMOD
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*65),3))}
.MODEL DbodyMOD D (IS=4e-11 N=1.131 RS=4.4e-3 TRS1=2e-3 TRS2=1e-6
+ CJO=1.44e-9 M=0.67 TT=7.4e-8 XTI=4.2)
.MODEL DbreakMOD D (RS=0.38 TRS1=2e-3 TRS2=-8.9e-6)
.MODEL DplcapMOD D (CJO=5e-10 IS=1e-30 N=10 M=0.7)
.MODEL MstroMOD NMOS (VTO=4.05 KP=85 IS=1e-30 N=10 TOX=1 L=1u W=1u)
.MODEL MmedMOD NMOS (VTO=3.35 KP=5 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.47)
.MODEL MweakMOD NMOS (VTO=2.76 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=14.7 RS=0.1)
.MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-3e-7)
.MODEL RdrainMOD RES (TC1=1e-2 TC2=3e-5)
.MODEL RSLCMOD RES (TC1=3e-3 TC2=1e-6)
.MODEL RsourceMOD RES (TC1=4.5e-3 TC2=1e-6)
.MODEL RvtempMOD RES (TC1=-5e-3 TC2=2e-6)
.MODEL RvthresMOD RES (TC1=-3e-3 TC2=-1.4e-5)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-10 VOFF=-2)
.MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-10)
.MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.8 VOFF=0.3)
.MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=0.3 VOFF=-0.8)
.ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank
Wheatley.
18
22
+-
6
8
+
-
5
51
+
-
19
8
+-
17
18
6
8
+
-
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
814
13
MWEAK
EBREAK DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ESLC
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG
LGATE
RLGATE 20
+
-
+
-
+
-
6
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
SABER Electrical Model
REV August 2001
template FDS2572 n2,n1,n3
electrical n2,n1,n3
{
var i iscl
dp..model dbodymod = (isl=4e-11,nl=1.131,rs=4.4e-3,trs1=2e-3,trs2=1e-6,cjo=1.44e-9,m=0.67,tt=7.4e-8,xti=4.2)
dp..model dbreakmod = (rs=0.38,trs1=2e-3,trs2=-8.9e-6)
dp..model dplcapmod = (cjo=5e-10,isl=10e-30,nl=10,m=0.7)
m..model mstrongmod = (type=_n,vto=4.05,kp=85,is=1e-30, tox=1)
m..model mmedmod = (type=_n,vto=3.35,kp=5,is=1e-30, tox=1)
m..model mweakmod = (type=_n,vto=2.76,kp=0.05,is=1e-30, tox=1,rs=0.1)
sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-10,voff=-2)
sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-2,voff=-10)
sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-0.8,voff=0.3)
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.8)
c.ca n12 n8 = 8e-10
c.cb n15 n14 = 8e-10
c.cin n6 n8 = 2e-9
dp.dbody n7 n5 = model=dbodymod
dp.dbreak n5 n11 = model=dbreakmod
dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 157.4
spe.eds n14 n8 n5 n8 = 1
spe.egs n13 n8 n6 n8 = 1
spe.esg n6 n10 n6 n8 = 1
spe.evthres n6 n21 n19 n8 = 1
spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
l.lgate n1 n9 = 5.61e-9
l.ldrain n2 n5 = 1.0e-9
l.lsource n3 n7 = 1.98e-9
res.rlgate n1 n9 = 56.1
res.rldrain n2 n5 = 10
res.rlsource n3 n7 = 19.8
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u
m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=1.1e-3,tc2=-3e-7
res.rdrain n50 n16 = 2.1e-2, tc1=1e-2,tc2=3e-5
res.rgate n9 n20 = 1.47
res.rslc1 n5 n51 = 1e-6, tc1=3e-3,tc2=1e-6
res.rslc2 n5 n50 = 1e3
res.rsource n8 n7 = 1.5e-2, tc1=4.5e-3,tc2=1e-6
res.rvthres n22 n8 = 1, tc1=-3e-3,tc2=-1.4e-5
res.rvtemp n18 n19 = 1, tc1=-5e-3,tc2=2e-6
sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod
sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod
sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod
sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1
equations {
i (n51->n50) +=iscl
iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/65))** 3))
}
18
22
+-
6
8
+
-
19
8
+-
17
18
6
8
+
-
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
814
13
MWEAK
EBREAK
DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ISCL
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG
LGATE
RLGATE 20
+
-
+
-
+
-
6
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
SPICE Thermal Model
REV August 2001
FDS2572
Copper Area = 1 in2
CTHERM1 TH 8 2.0e-3
CTHERM2 8 7 5.0e-3
CTHERM3 7 6 1.0e-2
CTHERM4 6 5 4.0e-2
CTHERM5 5 4 9.0e-2
CTHERM6 4 3 2.0e-1
CTHERM7 3 2 1
CTHERM8 2 TL 3
RTHERM1 TH 8 1.0e-1
RTHERM2 8 7 5.0e-1
RTHERM3 7 6 1
RTHERM4 6 5 5
RTHERM5 5 4 8
RTHERM6 4 3 12
RTHERM7 3 2 18
RTHERM8 2 TL 25
SABER Thermal Model
Copper Area = 1 in2
template thermal_model th tl
thermal_c th, tl
{
ctherm.ctherm1 th c2 =2.0e-3
ctherm.ctherm2 c2 c3 =5.0e-3
ctherm.ctherm3 c3 c4 =1.0e-2
ctherm.ctherm4 c4 c5 =4.0e-2
ctherm.ctherm5 c5 c6 =9.0e-2
ctherm.ctherm6 c6 c7 =2.0e-1
ctherm.ctherm7 c7 c8 =1
ctherm.ctherm8 c8 tl =3
rtherm.rtherm1 th c2 =1.0e-1
rtherm.rtherm2 c2 c3 =5.0e-1
rtherm.rtherm3 c3 c4 =1
rtherm.rtherm4 c4 c5 =5
rtherm.rtherm5 c5 c6 =8
rtherm.rtherm6 c6 c7 =12
rtherm.rtherm7 c7 c8 =18
rtherm.rtherm8 c8 tl =25
}
RTHERM6
RTHERM8
RTHERM7
RTHERM5
RTHERM4
RTHERM3
CTHERM4
CTHERM6
CTHERM5
CTHERM3
CTHERM2
CTHERM1
tl
2
3
4
5
6
7
JUNCTION
CASE
8
th
RTHERM2
RTHERM1
CTHERM7
CTHERM8
TABLE 1. THERMAL MODELS
COMPONANT 0.04 in20.28 in20.52 in20.76 in21.0 in2
CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1
CTHERM7 0.5 1.0 1.0 1.0 1.0
CTHERM8 1.3 2.8 3.0 3.0 3.0
RTHERM6 26 20 15 13 12
RTHERM7 39 24 21 19 18
RTHERM8 55 38.7 31.3 29.7 25
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. C, July 2013
FDS2572
MS-012AA
8 LEAD JEDEC MS-012AA SMALL OUTLINE PLASTIC PACKAGE
MS-012AA
12mm TAPE AND REEL
AA1
E
E1
e
b
D
L
h x 45o
2
0o-8o
c
0.004 IN
0.10 mm
5 6
0.155
4.0
0.275
7.0
0.050
1.27
0.024
0.6
0.060
1.52
MINIMUM RECOMMENDED FOOTPRINT FOR
SURFACE-MOUNTED APPLICATIONS
1
SYMBOL INCHES MILLIMETERS NOTES
MIN MAX MIN MAX
A0.0532 0.0688 1.35 1.75 -
A10.004 0.0098 0.10 0.25 -
b0.013 0.020 0.33 0.51 -
c0.0075 0.0098 0.19 0.25 -
D0.189 0.1968 4.80 5.00 2
E0.2284 0.244 5.80 6.20 -
E10.1497 0.1574 3.80 4.00 3
e0.050 BSC 1.27 BSC -
H0.0099 0.0196 0.25 0.50 -
L0.016 0.050 0.40 1.27 4
NOTES:
1.All dimensions are within allowable dimensions of
Rev. C of JEDEC MS-012AA outline dated 5-90.
2.Dimension “D” does not include mold flash, protru-
sions or gate burrs. Mold flash, protrusions or gate
burrs shall not exceed 0.006 inches (0.15mm) per
side.
3. Dimension “E1” does not include inter-lead flash or
protrusions. Inter-lead flash and protrusions shall
not exceed 0.010 inches (0.25mm) per side.
4.“L” is the length of terminal for soldering.
5.The chamfer on the body is optional. If it is not
present, a visual index feature must be located with-
in the crosshatched area.
6.Controlling dimension:Millimeter.
7.Revision 8 dated 5-99.
USER DIRECTION OF FEED
L
C
2.0mm
4.0mm
1.75mm
1.5mm
DIA. HOLE
8.0mm
12mm
COVER TAPE
GENERAL INFORMATION
1. 2500 PIECES PER REEL.
2. ORDER IN MULTIPLES OF FULL REELS ONLY.
3. MEETS EIA-481 REVISION “A” SPECIFICATIONS.
330mm 50mm
13mm
18.4mm
12.4mm
ACCESS HOLE
40mm MIN.
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