ADC121S101
January 14, 2010
Single Channel, 0.5 to 1 Msps, 12-Bit A/D Converter
General Description
The ADC121S101 is a low-power, single channel CMOS 12-
bit analog-to-digital converter with a high-speed serial inter-
face. Unlike the conventional practice of specifying perfor-
mance at a single sample rate only, the ADC121S101 is fully
specified over a sample rate range of 500 ksps to 1 Msps. The
converter is based upon a successive-approximation register
architecture with an internal track-and-hold circuit.
The output serial data is straight binary, and is compatible with
several standards, such as SPI™, QSPI™, MICROWIRE,
and many common DSP serial interfaces.
The ADC121S101 operates with a single supply that can
range from +2.7V to +5.25V. Normal power consumption us-
ing a +3V or +5V supply is 2.0 mW and 10 mW, respectively.
The power-down feature reduces the power consumption to
as low as 2.6 µW using a +5V supply.
The ADC121S101 is packaged in 6-lead LLP and SOT-23
packages. Operation over the industrial temperature range of
−40°C to +125 °C is guaranteed.
Features
Specified over a range of sample rates.
6-lead LLP and SOT-23 packages
Variable power management
Single power supply with 2.7V - 5.25V range
SPI™/QSPI™/MICROWIRE/DSP compatible
Key Specifications
DNL +0.5 / −0.3 LSB (typ)
INL ±0.40 LSB (typ)
SNR 72.5 dB (typ)
Power Consumption
3V Supply 2.0 mW (typ)
5V Supply 10 mW (typ)
Applications
Portable Systems
Remote Data Acquisition
Instrumentation and Control Systems
Pin-Compatible Alternatives by Resolution and Speed
All devices are fully pin and function compatible.
Resolution Specified for Sample Rate Range of:
50 to 200 ksps 200 to 500 ksps 500 ksps to 1 Msps
12-bit ADC121S021 ADC121S051 ADC121S101
10-bit ADC101S021 ADC101S051 ADC101S101
8-bit ADC081S021 ADC081S051 ADC081S101
Connection Diagram
20145005
Ordering Information
Order Code Temperature Range Description Top Mark
ADC121S101CISD −40°C to +125 °C 6-Lead LLP Package X1C
ADC121S101CISDX −40°C to +125 °C 6-Lead LLP Package, Tape & Reel X1C
ADC121S101CIMF −40°C to +125 °C 6-Lead SOT-23 Package X01C
ADC121S101CIMF −40°C to +125 °C 6-Lead SOT-23 Package, Tape & Reel X01C
ADC121S101EVAL Evaluation Board
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 2010 National Semiconductor Corporation 201450 www.national.com
ADC121S101 Single Channel, 0.5 to 1 Msps, 12-Bit A/D Converter
Block Diagram
20145007
Pin Descriptions and Equivalent Circuits
Pin No. Symbol Description
ANALOG I/O
3VIN Analog input. This signal can range from 0V to VA.
DIGITAL I/O
4 SCLK Digital clock input. This clock directly controls the conversion and readout processes.
5 SDATA Digital data output. The output samples are clocked out of this pin on falling edges of the SCLK pin.
6 CS Chip select. On the falling edge of CS, a conversion process begins.
POWER SUPPLY
1VA
Positive supply pin. This pin should be connected to a quiet +2.7V to +5.25V source and bypassed to
GND with a 1 µF capacitor and a 0.1 µF monolithic capacitor located within 1 cm of the power pin.
2 GND The ground return for the supply and signals.
PAD GND For package suffix CISD(X) only, it is recommended that the center pad should be connected to ground.
www.national.com 2
ADC121S101
Absolute Maximum Ratings (Note 1, Note
2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Analog Supply Voltage VA−0.3V to 6.5V
Voltage on Any Digital Pin to GND −0.3V to 6.5V
Voltage on Any Analog Pin to GND −0.3V to (VA +0.3V)
Input Current at Any Pin (Note 3) ±10 mA
Package Input Current (Note 3) ±20 mA
Power Consumption at TA = 25°C See (Note 4)
ESD Susceptibility (Note 5)
Human Body Model
Machine Model
3500V
300V
Junction Temperature +150°C
Storage Temperature −65°C to +150°C
Operating Ratings (Note 1, Note 2)
Operating Temperature Range −40°C TA +125°
C
VA Supply Voltage +2.7V to +5.25V
Digital Input Pins Voltage Range
(regardless of supply voltage) −0.3V to 5.25V
Analog Input Pins Voltage Range 0V to VA
Clock Frequency 25 kHz to 20 MHz
Sample Rate up to 1 Msps
Package Thermal Resistance
Package θJA
6-lead LLP 94°C / W
6-lead SOT-23 265°C / W
Soldering process must comply with National
Semiconductor's Reflow Temperature Profile specifications.
Refer to www.national.com/packaging. (Note 6)
ADC121S101 Converter Electrical Characteristics (Note 7, Note 9)
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 10 MHz to 20 MHz, CL = 15 pF,
fSAMPLE = 500 ksps to 1 Msps, unless otherwise noted. Boldface limits apply for TA = -40°C to +85°C: all other limits TA = 25°C
unless otherwise noted.
Symbol Parameter Conditions Typical Limits
(Note 9)Units
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes VA = +2.7v to +3.6V
−40°C TA 125°C 12 Bits
INL Integral Non-Linearity
−40°C TA +85°C
VA = +2.7V to +3.6V
SOT-23 +0.4 ±1.0 LSB (max)
-0.4 LSB (min)
LLP +0.4 +1.0 LSB (max)
-0.4 -1.2 LSB (min)
TA = 125°C
VA = +2.7v to +3.6V
SOT-23 +1.0 LSB (max)
-1.1 LSB (min)
LLP +1.0 LSB (max)
-1.3 LSB (min)
DNL Differential Non-Linearity
−40°C TA +85°C
VA = +2.7V to +3.6V
+0.5 +1.0 LSB (max)
−0.3 -0.9 LSB (min)
TA = 125°C
VA = +2.7v to +3.6V ±1.0 LSB (max)
VOFF Offset Error −40°C TA 125°C
VA = +2.7v to +3.6V ±0.1 ±1.2 LSB (max)
LSB (min)
GE Gain Error −40°C TA 125°C
VA = +2.7 to +3.6V
SOT-23 ±0.20 ±1.2 LSB (max)
LLP ±0.20 ±1.5 LSB (max)
DYNAMIC CONVERTER CHARACTERISTICS
SINAD Signal-to-Noise Plus Distortion Ratio
VA = +2.7 to 5.25V
−40°C TA 125°C
fIN = 100 kHz, −0.02 dBFS
72 70 dB (min)
SNR Signal-to-Noise Ratio
VA = +2.7 to 5.25V
−40°C TA +85°C
fIN = 100 kHz, −0.02 dBFS
72.5 70.8
dB (min)
VA = +2.7 to 5.25V
TA = +125°C
fIN = 100 kHz, −0.02 dBFS
70.6
3 www.national.com
ADC121S101
Symbol Parameter Conditions Typical Limits
(Note 9)Units
THD Total Harmonic Distortion VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS −80 dB (max)
SFDR Spurious-Free Dynamic Range VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS 82 dB (min)
ENOB Effective Number of Bits VA = +2.7 to 5.25V
fIN = 100 kHz, −0.02 dBFS 11.6 11.3 Bits (min)
IMD
Intermodulation Distortion, Second
Order Terms
VA = +5.25V
fa = 103.5 kHz, fb = 113.5 kHz −78 dB
Intermodulation Distortion, Third Order
Terms
VA = +5.25V
fa = 103.5 kHz, fb = 113.5 kHz −78 dB
FPBW -3 dB Full Power Bandwidth VA = +5V 11 MHz
VA = +3V 8 MHz
ANALOG INPUT CHARACTERISTICS
VIN Input Range 0 to VAV
IDCL DC Leakage Current ±1 µA (max)
CINA Input Capacitance Track Mode 30 pF
Hold Mode 4 pF
DIGITAL INPUT CHARACTERISTICS
VIH Input High Voltage VA = +5.25V 2.4 V (min)
VA = +3.6V 2.1 V (min)
VIL Input Low Voltage VA = +5V 0.8 V (max)
VA = +3V 0.4 V (max)
IIN Input Current VIN = 0V or VA±0.1 ±1 µA (max)
CIND Digital Input Capacitance 2 4pF (max)
DIGITAL OUTPUT CHARACTERISTICS
VOH Output High Voltage ISOURCE = 200 µA VA − 0.07 VA − 0.2 V (min)
ISOURCE = 1 mA VA − 0.1 V
VOL Output Low Voltage ISINK = 200 µA 0.03 0.4 V (max)
ISINK = 1 mA 0.1 V
IOZH, IOZL TRI-STATE® Leakage Current ±0.1 ±10 µA (max)
COUT TRI-STATE® Output Capacitance 2 4pF (max)
Output Coding Straight (Natural) Binary
POWER SUPPLY CHARACTERISTICS
VASupply Voltage 2.7 V (min)
5.25 V (max)
IA
Supply Current, Normal Mode
(Operational, CS low)
VA = +5.25V,
fSAMPLE = 1 Msps 2.0 3.2 mA (max)
VA = +3.6V,
fSAMPLE = 1 Msps 0.6 1.5 mA (max)
Supply Current, Shutdown (CS high)
fSCLK = 0 MHz, VA = +5V,
fSAMPLE = 0 ksps 500 nA
fSCLK = 20 MHz, VA = +5V,
fSAMPLE = 0 ksps 60 µA
www.national.com 4
ADC121S101
Symbol Parameter Conditions Typical Limits
(Note 9)Units
PD
Power Consumption, Normal Mode
(Operational, CS low)
VA = +5V 10 16 mW (max)
VA = +3V 2.0 4.5 mW (max)
Power Consumption, Shutdown (CS
high)
fSCLK = 0 MHz, VA = +5V
fSAMPLE = 0 ksps 2.5 µW
fSCLK = 20 MHz, VA = +5V,
fSAMPLE = 0 ksps 300 µW
AC ELECTRICAL CHARACTERISTICS
fSCLK Clock Frequency (Note 8) 10 MHz (min)
20 MHz (max)
fSSample Rate (Note 8) 500 ksps (min)
1Msps (max)
DC SCLK Duty Cycle fSCLK = 20 MHz 50 40 % (min)
60 % (max)
tACQ
Minimum Time Required for
Acquisition 350 ns (max)
tQUIET (Note 11) 50 ns (min)
tAD Aperture Delay 3 ns
tAJ Aperture Jitter 30 ps
ADC121S101 Timing Specifications
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 10.0 MHz to 20.0 MHz, CL = 25 pF,
fSAMPLE = 500 ksps to 1 Msps, Boldface limits apply for TA = -40°C to +85°C; all other limits TA = 25°C.
Symbol Parameter Conditions Typical Limits Units
tCS Minimum CS Pulse Width 10 ns (min)
tSU CS to SCLK Setup Time 10 ns (min)
tEN
Delay from CS Until SDATA TRI-STATE® Disabled
(Note 12) 20 ns (max)
tACC Data Access Time after SCLK Falling Edge (Note 13)VA = +2.7 to +3.6 40 ns (max)
VA = +4.75 to +5.25 20 ns (max)
tCL SCLK Low Pulse Width 0.4 x tSCLK ns (min)
tCH SCLK High Pulse Width 0.4 x tSCLK ns (min)
tHSCLK to Data Valid Hold Time VA = +2.7V to +3.6V 7ns (min)
VA = +4.75V to +5.25V 5ns (min)
tDIS
SCLK Falling Edge to SDATA High Impedance (Note
14)
VA = +2.7V to +3.6V 25 ns (max)
6ns (min)
VA = +4.75V to +5.25V 25 ns (max)
5ns (min)
tPOWER-UP Power-Up Time from Full Power-Down 1 µs
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND = 0V, unless otherwise specified.
Note 3: When the input voltage at any pin exceeds the power supply (that is, VIN < GND or VIN > VA), the current at that pin should be limited to 10 mA. The 20
mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 10 mA to two. The Absolute
Maximum Rating specification does not apply to the VA pin. The current into the VA pin is limited by the Analog Supply Voltage specification.
Note 4: The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by TJmax, the
junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDmax = (TJmax − TA) / θJA. The values
for maximum power dissipation listed above will be reached only when the device is operated in a severe fault condition (e.g. when input or output pins are driven
beyond the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5 k resistor. Machine model is 220 pF discharged through zero ohms.
Note 6: Reflow temperature profiles are different for lead-free and non-lead-free packages.
5 www.national.com
ADC121S101
Note 7: Tested limits are guaranteed to National's AOQL (Average Outgoing Quality Level).
Note 8: This is the frequency range over which the electrical performance is guaranteed. The device is functional over a wider range which is specified under
Operating Ratings.
Note 9: Data sheet min/max specification limits are guaranteed by design, test, or statistical analysis.
Note 10: This condition is for fSCLK = 20 MHz.
Note 11: Minimum Quiet Time required by bus relinquish and the start of the next conversion.
Note 12: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V.
Note 13: Measured with the timing test circuit shown in Figure 1 and defined as the time taken by the output signal to cross 1.0V or 2.0V.
Note 14: tDIS is derived from the time taken by the outputs to change by 0.5V with the timing test circuit shown in Figure 1. The measured number is then adjusted
to remove the effects of charging or discharging the output capacitance. This means that tDIS is the true bus relinquish time, independent of the bus loading.
www.national.com 6
ADC121S101
Timing Diagrams
20145008
FIGURE 1. Timing Test Circuit
20145006
FIGURE 2. ADC121S101 Serial Timing Diagram
7 www.national.com
ADC121S101
Specification Definitions
ACQUISITION TIME is the time required to acquire the input
voltage. That is, it is time required for the hold capacitor to
charge up to the input voltage. Acquisition time is measured
backwards from the falling edge of CS when the signal is
sampled and the part moves from Track to Hold. The start of
the time interval that contains tACQ is the 13th rising edge of
SCLK of the previous conversion when the part moves from
hold to track. The user must ensure that the time between the
13th rising edge of SCLK and the falling edge of the next
CS is not less than tACQ to meet performance specifications.
APERTURE DELAY is the time after the falling edge of CS
to when the input signal is acquired or held for conversion.
APERTURE JITTER (APERTURE UNCERTAINTY) is the
variation in aperture delay from sample to sample. Aperture
jitter manifests itself as noise in the output.
CONVERSION TIME is the time required, after the input volt-
age is acquired, for the ADC to convert the input voltage to a
digital word. This is from the falling edge of CS when the input
signal is sampled to the 16th falling edge of SCLK when the
SDATA output goes into TRI-STATE.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
DUTY CYCLE is the ratio of the time that a repetitive digital
waveform is high to the total time of one period. The specifi-
cation here refers to the SCLK.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion or SINAD. ENOB is defined as
(SINAD − 1.76) / 6.02 and says that the converter is equiva-
lent to a perfect ADC of this (ENOB) number of bits.
FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input.
GAIN ERROR is the deviation of the last code transition
(111...110) to (111...111) from the ideal (VREF − 1.5 LSB), af-
ter adjusting for offset error.
INTEGRAL NON-LINEARITY (INL) is a measure of the de-
viation of each individual code from a line drawn from negative
full scale (½ LSB below the first code transition) through pos-
itive full scale (½ LSB above the last code transition). The
deviation of any given code from this straight line is measured
from the center of that code value.
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
It is defined as the ratio of the power in the second and third
order intermodulation products to the sum of the power in both
of the original frequencies. IMD is usually expressed in dB.
MISSING CODES are those output codes that will never ap-
pear at the ADC outputs. The ADC121S101 is guaranteed not
to have any missing codes.
OFFSET ERROR is the deviation of the first code transition
(000...000) to (000...001) from the ideal (i.e. GND + 0.5 LSB).
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in
dB, of the rms value of the input signal to the rms value of the
sum of all other spectral components below one-half the sam-
pling frequency, not including harmonics or d.c.
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or
SINAD) Is the ratio, expressed in dB, of the rms value of the
input signal to the rms value of all of the other spectral com-
ponents below half the clock frequency, including harmonics
but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the differ-
ence, expressed in dB, between the desired signal amplitude
to the amplitude of the peak spurious spectral component,
where a spurious spectral component is any signal present in
the output spectrum that is not present at the input and may
or may not be a harmonic.
TOTAL HARMONIC DISTORTION (THD) is the ratio, ex-
pressed in dB or dBc, of the rms total of the first five harmonic
components at the output to the rms level of the input signal
frequency as seen at the output. THD is calculated as
where Af1 is the RMS power of the input frequency at the out-
put and Af2 through Af6 are the RMS power in the first 5
harmonic frequencies.
THROUGHPUT TIME is the minimum time required between
the start of two successive conversion. It is the acquisition
time plus the conversion time.
www.national.com 8
ADC121S101
Typical Performance Characteristics TA = +25°C, fSAMPLE = 500 ksps to 1 Msps,
fSCLK = 10 MHz to 20 MHz, fIN = 100 kHz unless otherwise stated.
DNL
fSCLK = 10 MHz
20145020
INL
fSCLK = 10 MHz
20145021
DNL
fSCLK = 20 MHz
20145060
INL
fSCLK = 20 MHz
20145061
DNL vs. Clock Frequency
20145065
INL vs. Clock Frequency
20145066
9 www.national.com
ADC121S101
SNR vs. Clock Frequency
20145063
SINAD vs. Clock Frequency
20145064
SFDR vs. Clock Frequency
20145067
THD vs. Clock Frequency
20145068
Spectral Response, VA = 5.25V
fSCLK = 10 MHz
20145069
Spectral Response, VA = 5.25V
fSCLK = 20 MHz
20145070
www.national.com 10
ADC121S101
Power Consumption vs. Throughput,
fSCLK = 20 MHz
20145055
11 www.national.com
ADC121S101
Applications Information
1.0 ADC121S101 OPERATION
The ADC121S101 is a successive-approximation analog-to-
digital converter designed around a charge-redistribution dig-
ital-to-analog converter core. Simplified schematics of the
ADC121S101 in both track and hold modes are shown in
Figure 3 and Figure 4, respectively. In Figure 3, the device is
in track mode: switch SW1 connects the sampling capacitor
to the input, and SW2 balances the comparator inputs. The
device is in this state until CS is brought low, at which point
the device moves to hold mode.
Figure 4 shows the device in hold mode: switch SW1 con-
nects the sampling capacitor to ground, maintaining the sam-
pled voltage, and switch SW2 unbalances the comparator.
The control logic then instructs the charge-redistribution DAC
to add or subtract fixed amounts of charge from the sampling
capacitor until the comparator is balanced. When the com-
parator is balanced, the digital word supplied to the DAC is
the digital representation of the analog input voltage. The de-
vice moves from hold mode to track mode on the 13th rising
edge of SCLK.
20145009
FIGURE 3. ADC121S101 in Track Mode
20145010
FIGURE 4. ADC121S101 in Hold Mode
2.0 USING THE ADC121S101
The serial interface timing diagram for the ADC is shown in
Figure 2. CS is chip select, which initiates conversions on the
ADC and frames the serial data transfers. SCLK (serial clock)
controls both the conversion process and the timing of serial
data. SDATA is the serial data out pin, where a conversion
result is found as a serial data stream.
Basic operation of the ADC begins with CS going low, which
initiates a conversion process and data transfer. Subsequent
rising and falling edges of SCLK will be labelled with reference
to the falling edge of CS; for example, "the third falling edge
of SCLK" shall refer to the third falling edge of SCLK after
CS goes low.
At the fall of CS, the SDATA pin comes out of TRI-STATE,
and the converter moves from track mode to hold mode. The
input signal is sampled and held for conversion on the falling
edge of CS. The converter moves from hold mode to track
mode on the 13th rising edge of SCLK (see Figure 2). It is at
this point that the interval for the tACQ specification begins. In
the worst case, 350ns must pass between the 13th rising
edge and the next falling edge of SCLK. The SDATA pin will
be placed back into TRI-STATE after the 16th falling edge of
SCLK, or at the rising edge of CS, whichever occurs first. After
a conversion is completed, the quiet time tQUIET must be sat-
isfied before bringing CS low again to begin another conver-
sion.
Sixteen SCLK cycles are required to read a complete sample
from the ADC. The sample bits (including leading zeroes) are
clocked out on falling edges of SCLK, and are intended to be
clocked in by a receiver on subsequent falling edges of SCLK.
The ADC will produce three leading zero bits on SDATA, fol-
lowed by twelve data bits, most significant first.
If CS goes low before the rising edge of SCLK, an additional
(fourth) zero bit may be captured by the next falling edge of
SCLK.
2.1 Determining Throughput
Throughput depends on the frequency of SCLK and how
much time is allowed to elapse between the end of one con-
version and the start of another. At the maximum specified
www.national.com 12
ADC121S101
SCLK frequency, the maximum guaranteed throughput is ob-
tained by using a 20 SCLK frame. As shown in Figure 2, the
minimum allowed time between CS falling edges is deter-
mined by 1) 12.5 SCLKs for Hold mode, 2) the larger of two
quantities: either the minimum required time for Track mode
(tACQ) or 2.5 SCLKs to finish reading the result and 3) 0, 1/2
or 1 SCLK padding to ensure an even number of SCLK cycles
so there is a falling SCLK edge when CS next falls.
For example, at the fastest rate for this family of parts, SCLK
is 20MHz and 2.5 SCLKs are 125ns, so the minimum time
between CS falling edges is calculated by
12.5*50ns + 350ns + 0.5*50ns = 1000ns
(12.5 SCLKs + tACQ + 1/2 SCLK) which corresponds to a
maximum throughput of 1MSPS. At the slowest rate for this
family, SCLK is 1MHz. Using a 20 cycle conversion frame as
shown in Figure 2 yields a 20µs time between CS falling
edges for a throughput of 50KSPS.
It is possible, however, to use fewer than 20 clock cycles pro-
vided the timing parameters are met. With a 1MHz SCLK,
there are 2500ns in 2.5 SCLK cycles, which is greater than
tACQ. After the last data bit has come out, the clock will need
one full cycle to return to a falling edge. Thus the total time
between falling edges of CS is 12.5*1µs +2.5*1µs
+1*1µs=16µs which is a throughput of 62.5KSPS.
3.0 ADC TRANSFER FUNCTION
The output format of the ADC is straight binary. Code transi-
tions occur midway between successive integer LSB values.
The LSB width for the ADC is VA/4096. The ideal transfer
characteristic is shown in Figure 5. The transition from an
output code of 0000 0000 0000 to a code of 0000 0000 0001
is at 1/2 LSB, or a voltage of VA/8192. Other code transitions
occur at steps of one LSB.
20145011
FIGURE 5. Ideal Transfer Characteristic
4.0 TYPICAL APPLICATION CIRCUIT
A typical application of the ADC is shown in Figure 6. Power
is provided in this example by the National Semiconductor
LP2950 low-dropout voltage regulator, available in a variety
of fixed and adjustable output voltages. The power supply pin
is bypassed with a capacitor network located close to the
ADC. Because the reference for the ADC is the supply volt-
age, any noise on the supply will degrade device noise per-
formance. To keep noise off the supply, use a dedicated linear
regulator for this device, or provide sufficient decoupling from
other circuitry to keep noise off the ADC supply pin. Because
of the ADC's low power requirements, it is also possible to
use a precision reference as a power supply to maximize per-
formance. The three-wire interface is shown connected to a
microprocessor or DSP.
13 www.national.com
ADC121S101
20145013
FIGURE 6. Typical Application Circuit
5.0 ANALOG INPUTS
An equivalent circuit for the ADC's input is shown in Figure
7. Diodes D1 and D2 provide ESD protection for the analog
inputs. At no time should the analog input go beyond (VA +
300 mV) or (GND − 300 mV), as these ESD diodes will begin
conducting, which could result in erratic operation. For this
reason, the ESD diodes should not be used to clamp the input
signal.
The capacitor C1 in Figure 7 has a typical value of 4 pF, and
is mainly the package pin capacitance. Resistor R1 is the on
resistance of the track / hold switch, and is typically 500.
Capacitor C2 is the ADC sampling capacitor and is typically
26 pF. The ADC will deliver best performance when driven by
a low-impedance source to eliminate distortion caused by the
charging of the sampling capacitance. This is especially im-
portant when using the ADC to sample AC signals. Also
important when sampling dynamic signals is an anti-aliasing
filter.
20145014
FIGURE 7. Equivalent Input Circuit
6.0 DIGITAL INPUTS AND OUTPUTS
The ADC digital inputs (SCLK and CS) are not limited by the
same maximum ratings as the analog inputs. The digital input
pins are instead limited to +5.25V with respect to GND, re-
gardless of VA, the supply voltage. This allows the ADC to be
interfaced with a wide range of logic levels, independent of
the supply voltage.
7.0 MODES OF OPERATION
The ADC has two possible modes of operation: normal mode,
and shutdown mode. The ADC enters normal mode (and a
conversion process is begun) when CS is pulled low. The de-
vice will enter shutdown mode if CS is pulled high before the
tenth falling edge of SCLK after CS is pulled low, or will stay
in normal mode if CS remains low. Once in shutdown mode,
the device will stay there until CS is brought low again. By
varying the ratio of time spent in the normal and shutdown
modes, a system may trade-off throughput for power con-
sumption, with a sample rate as low as zero.
7.1 Normal Mode
The fastest possible throughput is obtained by leaving the
ADC in normal mode at all times, so there are no power-up
delays. To keep the device in normal mode continuously,
CS must be kept low until after the 10th falling edge of SCLK
after the start of a conversion (remember that a conversion is
initiated by bringing CS low).
If CS is brought high after the 10th falling edge, but before the
16th falling edge, the device will remain in normal mode, but
the current conversion will be aborted, and SDATA will return
to TRI-STATE (truncating the output word).
Sixteen SCLK cycles are required to read all of a conversion
word from the device. After sixteen SCLK cycles have
elapsed, CS may be idled either high or low until the next
conversion. If CS is idled low, it must be brought high again
before the start of the next conversion, which begins when
CS is again brought low.
After sixteen SCLK cycles, SDATA returns to TRI-STATE.
Another conversion may be started, after tQUIET has elapsed,
by bringing CS low again.
7.2 Shutdown Mode
Shutdown mode is appropriate for applications that either do
not sample continuously, or it is acceptable to trade through-
put for power consumption. When the ADC is in shutdown
mode, all of the analog circuitry is turned off.
To enter shutdown mode, a conversion must be interrupted
by bringing CS high anytime between the second and tenth
falling edges of SCLK, as shown in Figure 8. Once CS has
been brought high in this manner, the device will enter shut-
down mode; the current conversion will be aborted and SDA-
TA will enter TRI-STATE. If CS is brought high before the
second falling edge of SCLK, the device will not change
mode; this is to avoid accidentally changing mode as a result
of noise on the CS line.
www.national.com 14
ADC121S101
20145016
FIGURE 8. Entering Shutdown Mode
20145017
FIGURE 9. Entering Normal Mode
To exit shutdown mode, bring CS back low. Upon bringing
CS low, the ADC will begin powering up (power-up time is
specified in the Timing Specifications table). This power-up
delay results in the first conversion result being unusable. The
second conversion performed after power-up, however, is
valid, as shown in Figure 9.
If CS is brought back high before the 10th falling edge of
SCLK, the device will return to shutdown mode. This is done
to avoid accidentally entering normal mode as a result of
noise on the CS line. To exit shutdown mode and remain in
normal mode, CS must be kept low until after the 10th falling
edge of SCLK. The ADC will be fully powered-up after 16
SCLK cycles.
8.0 POWER MANAGEMENT
The ADC takes time to power-up, either after first applying
VA, or after returning to normal mode from shutdown mode.
This corresponds to one "dummy" conversion for any SCLK
frequency within the specifications in this document. After this
first dummy conversion, the ADC will perform conversions
properly. Note that the tQUIET time must still be included be-
tween the first dummy conversion and the second valid con-
version.
When the VA supply is first applied, the ADC may power up
in either of the two modes: normal or shutdown. As such, one
dummy conversion should be performed after start-up, as de-
scribed in the previous paragraph. The part may then be
placed into either normal mode or the shutdown mode, as
described in Sections 7.1 and 7.2.
When the ADC is operated continuously in normal mode, the
maximum throughput is fSCLK / 20 at the maximum specified
fSCLK. Throughput may be traded for power consumption by
running fSCLK at its maximum specified rate and performing
fewer conversions per unit time, raising the ADC CS line after
the 10th and before the 15th fall of SCLK of each conversion.
A plot of typical power consumption versus throughput is
shown in the Typical Performance Curves section. To calcu-
late the power consumption for a given throughput, multiply
the fraction of time spent in the normal mode by the normal
mode power consumption and add the fraction of time spent
in shutdown mode multiplied by the shutdown mode power
consumption. Note that the curve of power consumption vs.
throughput is essentially linear. This is because the power
consumption in the shutdown mode is so small that it can be
ignored for all practical purposes.
9.0 POWER SUPPLY NOISE CONSIDERATIONS
The charging of any output load capacitance requires current
from the power supply, VA. The current pulses required from
the supply to charge the output capacitance will cause voltage
variations on the supply. If these variations are large enough,
they could degrade SNR and SINAD performance of the ADC.
Furthermore, discharging the output capacitance when the
digital output goes from a logic high to a logic low will dump
current into the die substrate, which is resistive. Load dis-
charge currents will cause "ground bounce" noise in the sub-
strate that will degrade noise performance if that current is
large enough. The larger the output capacitance, the more
current flows through the die substrate and the greater is the
noise coupled into the analog channel, degrading noise per-
formance.
To keep noise out of the power supply, keep the output load
capacitance as small as practical. It is good practice to use a
100 series resistor at the ADC output, located as close to
the ADC output pin as practical. This will limit the charge and
discharge current of the output capacitance and improve
noise performance.
15 www.national.com
ADC121S101
Physical Dimensions inches (millimeters) unless otherwise noted
6-Lead LLP
Order Number ADC121S101CISD or ADC121S101CISDX
NS Package Number SDB06A
6-Lead SOT-23
Order Number ADC121S101CIMF, ADC121S101CIMFX
NS Package Number MF06A
www.national.com 16
ADC121S101
Notes
17 www.national.com
ADC121S101
Notes
ADC121S101 Single Channel, 0.5 to 1 Msps, 12-Bit A/D Converter
For more National Semiconductor product information and proven design tools, visit the following Web sites at:
www.national.com
Products Design Support
Amplifiers www.national.com/amplifiers WEBENCH® Tools www.national.com/webench
Audio www.national.com/audio App Notes www.national.com/appnotes
Clock and Timing www.national.com/timing Reference Designs www.national.com/refdesigns
Data Converters www.national.com/adc Samples www.national.com/samples
Interface www.national.com/interface Eval Boards www.national.com/evalboards
LVDS www.national.com/lvds Packaging www.national.com/packaging
Power Management www.national.com/power Green Compliance www.national.com/quality/green
Switching Regulators www.national.com/switchers Distributors www.national.com/contacts
LDOs www.national.com/ldo Quality and Reliability www.national.com/quality
LED Lighting www.national.com/led Feedback/Support www.national.com/feedback
Voltage References www.national.com/vref Design Made Easy www.national.com/easy
PowerWise® Solutions www.national.com/powerwise Applications & Markets www.national.com/solutions
Serial Digital Interface (SDI) www.national.com/sdi Mil/Aero www.national.com/milaero
Temperature Sensors www.national.com/tempsensors SolarMagic™ www.national.com/solarmagic
PLL/VCO www.national.com/wireless PowerWise® Design
University
www.national.com/training
THE CONTENTS OF THIS DOCUMENT ARE PROVIDED IN CONNECTION WITH NATIONAL SEMICONDUCTOR CORPORATION
(“NATIONAL”) PRODUCTS. NATIONAL MAKES NO REPRESENTATIONS OR WARRANTIES WITH RESPECT TO THE ACCURACY
OR COMPLETENESS OF THE CONTENTS OF THIS PUBLICATION AND RESERVES THE RIGHT TO MAKE CHANGES TO
SPECIFICATIONS AND PRODUCT DESCRIPTIONS AT ANY TIME WITHOUT NOTICE. NO LICENSE, WHETHER EXPRESS,
IMPLIED, ARISING BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS
DOCUMENT.
TESTING AND OTHER QUALITY CONTROLS ARE USED TO THE EXTENT NATIONAL DEEMS NECESSARY TO SUPPORT
NATIONAL’S PRODUCT WARRANTY. EXCEPT WHERE MANDATED BY GOVERNMENT REQUIREMENTS, TESTING OF ALL
PARAMETERS OF EACH PRODUCT IS NOT NECESSARILY PERFORMED. NATIONAL ASSUMES NO LIABILITY FOR
APPLICATIONS ASSISTANCE OR BUYER PRODUCT DESIGN. BUYERS ARE RESPONSIBLE FOR THEIR PRODUCTS AND
APPLICATIONS USING NATIONAL COMPONENTS. PRIOR TO USING OR DISTRIBUTING ANY PRODUCTS THAT INCLUDE
NATIONAL COMPONENTS, BUYERS SHOULD PROVIDE ADEQUATE DESIGN, TESTING AND OPERATING SAFEGUARDS.
EXCEPT AS PROVIDED IN NATIONAL’S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NATIONAL ASSUMES NO
LIABILITY WHATSOEVER, AND NATIONAL DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY RELATING TO THE SALE
AND/OR USE OF NATIONAL PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR
PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY
RIGHT.
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE CHIEF EXECUTIVE OFFICER AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and
whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected
to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform
can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness.
National Semiconductor and the National Semiconductor logo are registered trademarks of National Semiconductor Corporation. All other
brand or product names may be trademarks or registered trademarks of their respective holders.
Copyright© 2010 National Semiconductor Corporation
For the most current product information visit us at www.national.com
National Semiconductor
Americas Technical
Support Center
Email: support@nsc.com
Tel: 1-800-272-9959
National Semiconductor Europe
Technical Support Center
Email: europe.support@nsc.com
National Semiconductor Asia
Pacific Technical Support Center
Email: ap.support@nsc.com
National Semiconductor Japan
Technical Support Center
Email: jpn.feedback@nsc.com
www.national.com