MIL SPECS o0o0 Mi 00001c5 0031012 3 MEMILS The documentation and process conversion measures necessary to comply with this revision shall be INCH-POUND completed by 15 February 1992 MIL-S-19500/4048 15 November 1991 SUPERSED ING MIL-S-19500/404A 6 April 1971 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON, RECTIFIER, MODULE HIGH VOLTAGE, 1N5597, 1N5600, 1N5603, JANTX AND JANTXV This specification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for silicon, high voltage, rectifier modules. Two levels of product assurance are provided for each device type as specified in MIL~S-19500. 4.2 Physical dimensions. See figure 1. 1.3. Maximum ratings. | | | | | | | | | | | Types [Vv | Vv | 1 | |t {l [T, and | Ie| | | BR(CEO) RUM IT. =75 Ite S752 l rr | RESUEg RD o Te46 l | | | L | | | i | L | | | | | | | | , | | | kV de [kV (pk) [| Ade | Ade | us | J [| S |A.de| | | | | | | | | f 4 {1N5597 | 10 | 10 { 1.0 4/ | 30 | 2 | 2 {-55 to +150 [1.0 | | 1N5600 | 5 | 5 | 2.0 2/ | 80 } 2 | 6 |-55 to +150 {2.0 | |1N5603 | 5 | 5 | 5.0 3/ { 200 | 2 | 12 {-55 to +150 {5.0 | | | | | | | | | {| 1/ Derate Linearly by 13.3 mA de/C from Ig = 1.0 Ade at T. = +#75C. Oerate to zero at T, = +#150C . c . 2/ Derate linearly by 26.7 mA de/C from I, = 2.0 Ade at T. = +75C. Derate to zero at T. = +150C. 3/ Drate linearly by 66.7 mA de/C from I, = 5.0 A de at T. = +75C. Derate to zero at Te = +150C. |Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be | fof use in improving this document should be addressed to: Rome Air Development Center, AFSC, | LRADC/RBE~2, Griffiss AFB, NY 13441-5700 by using the Standardization Document \ [Improvement Proposal (0D Form 1426) appearing at the end of this document or by letter. | | | AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.MIL SPECS ooo M 0000125 0031013 5 MEMILS MIL-S-19500/4048 1.4 Primary electrical characteristics. : i . | \ ; Types | Ve | Ta4 t lao i c : I, = rated I, [V_ = rated Voi 'V, = rated V [ Vp = 100 V de : | (see 1.3) : (see 1 BY | (see 1.3) Lf = 0.1 to 0.15 MHz { { : : | V_de I UA de ! HA dc | pe i I Min Max 1 Min Max i Min Max | Hin Max : i i i | i ' 4NSSO7 =F 13 19 | 1 | 7 $f 5 30 ' ; 1N5600 i 6 10 | 5 | 100 | 7 30 : i 1N5603__! 6 10 ! 5 i 100 a) 40 2, APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those Listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION FEDERAL QQ-N-290 - Nickel Plating, Electrodeposited. VV-1-530 ~ Insulation Oil, Electrical (for Transformers, Switches, and Circuit Breakers). MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. - MIL-C-26074 - Coatings, Electroless Nickel, Requirements for. STANDARDS MILITARY MIL-STD-750 ~ Test Methods for Semiconductor Devices. MIL-STD-1276 Leads for Electronic Component Parts. 2.2.2 Qther publications. The following document forms a part of this specification to the extent specified herein. Unless otherwise indicated, the issue in effect on the date of invitation for bids or request for proposal shall apply. AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) 01868 - Method of Corona Measurement. (Application for copies should be addressed to American Society for Testing and Materials, 1916 Race Street, Philadelphia, PA 19103.) (Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Standardization Documents Order Desk, Building 40, 700 Robbins Avenue, Philadelphia, PA 19111-5094, ) 2.2 Order of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.MIL SPECS ooo ME OO002S 0031014 7 MEMILS MIL-S-19500/404B8 7 3. REQUIREMENTS 3.1 Associated detail specification. The individual item requirements shall be in accordance with MIL-S-19500 and as specified herein. 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-S-19500. . 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-S-19500 and figure 1 herein. 3.3.1 External construction. Metal surfaces shall be nickel plated in accordance with QQ-N-290 (class 2; type I (DS), type V (FC), or type VIII (F2)) or MIL-C-26074 (class 3, grade A). Plastic surfaces shall be finished smooth, free of pits, cracks, and other imperfections. 3.3.2 Internal construction. The rectifier module shall contain an assembly of series-connected discrete controlled avalanche diodes (arbitrarily designated D-1, 0-2, and 0-3 in the tables). Each diode shall be in a glass-to-metal, ceramic-to-metal, or fused metal oxide-to-metal hermetically sealed non-cavity package. The completed assembly of diodes and other internal structures shall be encapsulated in a plastic material which polymerizes to a rigid condition by virtue of a chemical cross-linking mechanism. The rectifier module shall be free of voids either visible or as evidenced by failure to pass the environmental corona test specified. The rectifier module shall not internally include or utilize component capacitors and/or resistors for compensation. Only those discrete diodes which have passed the tests in 4.3 tables I and I! shall be used in the rectifier module. Discrete diodes shall be manufactured and tested by the rectifier module manufacturer. 3.4 Marking. Marking shall be in accordance with MIL-$-19500. As an option to the polarity marking requirements, the words cathode terminal" may be used. 4, QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500 and as specified herein. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500 and table IV herein. 4.3 Screening (JANTXV and JANTX levels only). Screening shall be in accordance with table I! of MIL-$-19500, and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the Limits of table I herein shall not be acceptable. Screening shall be conducted on 100 percent of the discrete diode lot prior to assembly and encapsulation into rectifier modules. :MIL SPECS o00 Mi 0000125 0031015 95 MEMILS OTe St a Ast Ol2 QUT 72 Cla: MAX Pi) MIL-S-19500/4048 a | I THREAD 4 RELIEF TC \ | { ! MINOR DIA i : : 7 TEAMINAL FROMLTO3 \i r * THO TERMINAL 2 \ 4 iy tS) aT PO $5, Ae tape / | 020 MIN45 CHAM Trlal o65] st e Ce \_p=erBcarace Sut 79 uA: MAX OE. i t \ t | i l i \ | rLtr : | Notes ! yitr ! ! | Notes | : | I | i i I i | i | Minimum I Maximum i i ' Minimum | Maximum | . i i t | I ! i t I i [ A! .970 (24,.64)11.020 (25.91) | 14 t CA 1 73 (18.54) + .83 (21.08) + 14 I { i | | i i i i i \ +B: ,050 (1.27) ' .080 (2.03) | I 8 | ,080 (2.03) _| _! | | | [ i | \ i | i 1c ! .307 (7,80) |! .317 (8.05) {| 7,12 | ' ' 240 (6.10) [| .264 (6,71) [6,12,10 {| | | | | i 1 i | | \ } Cy | .318 (8.08) | .400 (10.16) [9,12,11 | | Ca | .265 (6.73) | .400 (10.16) | 8,12 | | t ! L L | : | | k | | | [ | [ | { i ! 0 $3,450 (87.63)|3.650 (92.71) | l 1 D (1.85 (46.99) 41.95 (49.53) I L L | | | i | I \ : ty4| 95 (24.13) [1.250 (31.75) | 11,13 | i $4 | .57 (14,48) | .67 (17.02) | 13 f t r | f 1 i { i [ TYPE _1N5603 TYPES 1N5600 and 1N5597 1. Dimensions are in inches. 2. Metric equivalents are given for general information only and are in parentheses. 3. Surface roughness of all external metal surfaces except threaded areas shall not exceed 63 microinches rms. 4. Threaded portions of the assembly shall be in accordance with NBS handbook H28 (screw thread standards for federal services, 1957). The maximum pitch diameter of plated threads shail be the basic pitch diameter. 5, ALL marking shall be on cathode side of module. 6. Threaded stud .250-28UNF-2A. 7, Threaded stud .375-24UNF-2A. 8. Threaded insert .250-28UNF-28. 9. Threaded insert .375-26UNF-2B. 10. Cathode connected to terminal 2. 11. Cathode connected to terminal 1. 12. Full Length thread. 13, Metal terminal contact surface. 14, Module contour within dimension A is not specified. FIGURE 1. Semiconductor device, diode module.MIL SPECS 000 MB 0000125 0031016 O MMNILS MIL-S-19500/4048 Screen (see table [1 Measurement of MIL~S-19500) AVe, and Atay see table VII steps 3 and | [ | | | | | | | JANTX and JANTXV levels | | | | { 1/ [Surge, see 4.3.2. | | | | } 2/ | | { | | | | i | | | | 9 {Not applicable | | | { 11 IVa and Ip, | | | . I { 12 {see 4.3.1 | | | | | 13 | | | | | | | | 1/ Surge screening shall be performed anytime after screen 3 and before screen 10. 2/ See tables I and II. 4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: Ty = #125C, Vp at rated (dc), Ip = 0 4.3.2 Surge screening. See MIL-STD-750, method 4066. Vouy = 0, 15 = 0, ley apply 20 x Ip cated at T, = e . . +25C, 8.3 ms, 3 surges, Ts = 25C or rectangular pulse of equivalent lenge duty factor = 1 percent maximum. 4.3.3 Internal corona screening. This 100 percent test shall be performed in accordance with 4.5.4 herein on the finished module. 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-S-19500. 4.4.1 Group A_inspection. Group A inspections shall be conducted in accordance with MIL-S-19500, and table III herein.MIL SPECS 000 Mi 0000125 0031017 2 MMMILS MIL-S-19500/4048 4.4.2 Group 8 inspection. Group 8 inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVb (JANTX and JANTXV) of MIL-S-19500, and table IV herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table VII herein. 4.4.3 Group C inspection. Group inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-$-19500, and table IIIf herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of tabte VII herein. 4.4.4 Group inspection. Group E inspection shall be conducted in accordance with table VI herein. 4,5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows, 4.5.1. Pulse measurements. Conditions for pulse measurement shal\ be as specified in section 4 of TT MIL-STD-750. 4.5.2 Reverse recovery time. Reverse recovery time shall be measured in a circuit and with equipment as shown on figure 2. The pulse generator shall have a pulse repetition frequency of 1 kHz maximum, and a pulse width of 10 microseconds minimum. Recovery conditions: 0.5 ampere forward current to 1.0 ampere reverse current. Recovery time measured from the time the rectifier begins to conduct in the reverse direction (crosses I = 0) until the reverse current recovers to -0.25 ampere. 4.5.3 Peak transient reverse power. The circuit on figure 3 or a similar circuit, at the option of the supplier, shall be used to apply a single cycle reverse power surge to discrete diodes. The reverse power surge used to test discrete diodes may be applied in the form of a one-half sinusoidal pulse of 8.3 milliseconds duration. 4.5.4 Internal corona testing. Internal corona testing shall be conducted on all rectifier modules (see figure 4). The method of corona detection, measurement and display shall conform to the following requirements: The terminals shall be connected together and connected to the high potential side of the corona test _ equipment. A test voltage of 25 kV(rms) at 60 Hz shall be applied between the terminals and the ground plane which shall be no more than 2 inches from the major diameter of the rectifier module. The test potential shall be applied for not less than 20 seconds. The corona tester shall be a Biddle Company Catalog No. 661409 AC Corona Tester, or equivalent. The corona discharge as viewed on the Giddle tester display screen shall show no more than 50 discharges per cycle (whole ellipse). None of the 50 discharges shall exceed 5 picocoulombs. In order to minimize the masking of internal corona by any external corona, rounded terminal hardware of suitable design may be added to the connectors during the corona test. In addition, the test may be performed with the unit either entirely or partially immersed in a suitable dielectric fluid in order to reduce external corona. 4.5.5 xternal corona testing. The method of corona detection, measurement and display shall conform to the requirements of ASTM 01868. The apparatus shall consist of a corona-free high-voltage adjustable power supply, a corona-free pickup network consisting of a high-pass filter, a corona detector consisting of a high-gain amplifier/oscilloscope, and a calibrating means to make quantitative measurement of corona magnitude in picocoulombs. Using the scheme shown on figure 5, an external corona test shall be conducted on two diode modules of the same rating connected in opposition from 0 V to the required test voltage of: 20 kV(peak) = 14.14 kV. for diode module type 1N5597. 10 kV(peak) = 7.07 kV, for diode module types 1N5600 and 1N5603. With a corona detector sensitivity of 1 picocoulomb per O.1-inch minimum, no corona discharges exceeding 5 picacoulombs shall be visible for types 4N5597 and 1N5600 and no corona dischargs exceeding 15 picocoulombs shall be visible for type 1NS603. The number of detectable discharges shall not exceed 50 per cycle (whole ellipse).MIL SPECS 000 M@ 00001e5 0031016 4 MEMILS MIL-S~-19500/404B8 4.5.6 Avalanche (bulk-breakdown) characteristic. The reverse breakdown characteristics shall be viewed on an oscilloscope With display calibration factors of 5 to 20 pA/division and 50 to 100 V/division. Reverse current over the knee shall be at least 50 WA. Each device shall exhibit a sharp knee characteristic and any discontinuity or dynamic instability of the trace shall be cause for rejection. TABLE I. Discrete diode-process conditioning tests and measurements. OO fA de | 7 { | I | | i | Inspection | { MIL-STO-750 Symbol] Limits Unit =| | i i | { | | { | |Method | Conditions | t Min | Max} i | | | | | | | i [Peak transient reverse | [See 4.5.3 single cycle surge; | | { | | | power | lone-half sinusoidal wave | | [ | | | | [8.3 ms | | | | [ | | | | | | | | 0-1 | |Surge = .17 J | | | | | | 0-2 | [Surge = 1.00 J | | | | | | 0-3 | {Surge = 2.00 J I | | | | | | ! | | | I | TABLE Il. Discrete diodes-inspection test_to verify POA and LTPA. | | | | | | | | Inspection | [ MIL-STD-750 , Symbol{ Limits Unit | | | | | | | | | 1 I [Method j Conditions | [Min | Max} i | i | | | | i | Subgroup 1 | |100 percent test | | | | | | | | | [ | | \ i [Avalanche (bulk- | [See 4.5.6 | | | | | | breakdown { | | | | | | | characteristic | f | | | | | | | | | | | | | Subgroup 2 | [ | | | | | i [Forward voltage } 4011 | [Veo | | | | | 0-1 | 11, = 1.0 A de | | {1.1 -|Vde | [| D-2 | [Ip = 2.0 A de { I {1.0 [Vde i 1 D-3 | [Ip = 5.0 A de | | j; 1.0 |[Vde } 1 t | | | | | | | | | | | | | jReverse current | 4016 |DC method I1pq | { | i ' 4N5597 | [Vp = 600 V de | | |} 1 |pade | } 1N5600 | "|Vp = 600 V de | | [| 5 jpAde | | 1N5603 | [Vp = 600 V de | | {| 5 iA de | j | | | | | | | ;Breakdown voltage | 4021 [Ip = 10 pA de | Vegpy | 660 | |] Vide ; | { | | | | | i Breakdown voltage | 4021 [Ip = 50 WA de | Vepay | j1000 | Vide; | | | | | | : | Subgroup 3 | | l i | \ i | | | [ \ | ' iReverse recover time = | |See figure 2 and 4.5.2 i tap | | 2 | us : | | | | | : Reverse current | 4016 {OC method; T, = 100C, | Ips | | | \ | | [Vp = 600 V de | { | i : 1 pet | | | 75 {pA de 0-2 | | I | [ 100 {pA de 1 0-3 i | | | {1 | ! I | {ooo MIL SPECS MM 00001e5 0031019 & MEMILS MIL-S-19500/4048 Group A_inspection. TABLE III. wv _ c 1 x oO = n pl--- - = = c i _ = = 9 2 e > na j + oO! n nw c tN o - a = uv t Cc a) 9 I oO = Uv xo + o = c o - w eo a a n c per) 1 2 Subgrou Subgrou 1N5597 Forward voltage 1N5600 4N5603 oo 9 vu sD xq $354 crmuw c a 9 uO UO uu > x~> > o~~ 8 -OoO O : wr INN CY ew nn w oOo wm a >r>r> Oo = Oo wt v Cc o a t 3 On m 2x88 aun oO cmWN IN ezezz > cco a a ee i en Ee ee a ee roup 3 su operation et ee a tl A EH I A I SR OC method, Vp (see 1.3) i i ee eeHl q = O0004eS 0031020 2 MEMILS 000 MIL SPECS MIL-S-19500/4048 Group A inspection - Continued. TABLE III. ce ef a a et ee Nee ree ae ee i i ne ee ee cee v 9 S23 Lun a > > > x tan ooo Q acre mm = n f do) RS aed ee Re ee ee ee iad E c - | ~ hm SO: 0 nm w = - c aad 2 Ss nw my L > vo = gl a = i 1 uw - - Ee Fe : w 5 oO a Cc 9 V0 VU ovi o vuvTs wo = Ww e vo cc > 9 vi w" ooo oO wy . ON ' - AW - x = " von " -_ << wo wh - Ld Ce on] >O ug 3 = Ss - | oO 8 gv st ae = v ~ Oo! c 2 zy <q 9 c o wv wT ~ t a D o v a ou wn _ o mn Pies v 3 oO o oc a oO o on 7 o co co o 2 Y - > c 3 om c av weoMmM 2 0 x38 o ~ _ t Ew Baoo > v a oO a a oo ft uy SO 80 no in SO 50 a 2 - CTW Oo nw uw 2 3 Qa SzZzazse Q 2a2zz 3 n x 0 | Qa coe n v o % 9 al ns vo =zMIL SPECS 000 ; Me 00001325 0031021 4 MEMILS MIL-S-19500/4048 TABLE IV. Group B inspection for JANTX and JANTXV. (nonoperating) | | | Inspection 1/ | MIL-STD-750 | | | | [Met | Conditions | | | | Subgroup 1 [ | | | | lsolderability { 2026 | | | Resistance to solvents | 1022 | | | | Subgroup 2 | | | [ | Temperature cycling | 1051 | | | Surge current | 4066 |Vouy = OV, Ipcy = (see 1.3) ten surges, 8.3 ms | | [Ig = Ip rated at +75C | | | | | - Electrical measurements | |See table VII, steps 1 and 2 | | Subgroup 3 | | | [ Intermittent operation life | 1036 |Intermittent life test (Up to 6 modules may be series | | [connected and horizontally mounted in a dielectric | | |fluid such as 3M's FC40 or equivalent, or oil in | jaccordance with VV-I-530, controlled to maintain a | [case temperature of 75C minimum.) Time on = 50 min, | [time off = 10 min, duration = 340 cycles (340 | [hours). (For determining sample size, each module | | [shall be considered a test unit with resistive Load.) | | |Ig during time on: | 1N5597 | ] 1A sc | 14N5600 | } 2A | 1NS603 | | SA de | | | jElectrical measurements | [See table VII, steps 1 and 2 | | | | Subgroup 4 | | i 5 | | JNot applicable | | | | | | Subgroup 5 | | | | | [Thermal resistance | 3101 | | | | | Subgroup 6 | | | | | IHigh temperature Life | 1031 IT, = +150C | } | | { | | [Electrical measurements See table VII, steps 1 and 2 1/ For sampling plan, see MIL-S-19500. 40MIL SPECS TABLE V. 000 HIL-S-19500/4048 Group C inspection (all quality levels). = goodles 00310e2 & MMILS | Inspection 1/ | | Subgroup 1 Physical dimensions Subgroup 2 Temperature cycling Terminal strength 4N5597 1N5600 1N5603 Moisture resistance Electrical measurements Vibration, variable frequency Constant acceleration Electrical measurements Subgroup 4 Salt atmosphere (corrosion) 2066 1051 2036 1021 2016 2056 4041 MIL-STD-750 Conditions See figures 1 and 2 {Test condition F, |Test condition A; t= 3s ee ee ee ee Pee 10 cycles |Torque = 18 lb-in [Torque = 18 tb-in [Torque = 36 lb-in | | | | | See table VII, steps 1 and 2 Nonoperating See table VII, steps 1 and 2 | | | | | | | | | | | | | | | | | | { _t | | { | | | | | | | [ | | | | | | | | | | | | | | | | | | | | | | | | | | t See footnote at end of tabie. 11MIL SPECS 000 M@ 00001e5 0031023 6 MENMILS MIL-S$-19500/4048 TABLE V. Group C inspection (all quality levels) - Continued. I i Inspection 14/ | MIL-STD-750 t ! [ Method Conditions i ; 1 Subgroup 6 Intermittent operation 1036 | internittent life test (Up to 6 modules life 'may be series connected and horizontally! ;mounted in a dielectric fluid such as i 13 M's FC4O0 or equivalent, or oil in faccordance with VV-[-530, controlled jto maintain a case temperature of 75C [minimum.) Time on = 50 minutes, time joff = 10 minutes, duration 1,000 cycles '(1,000 hours). (For determining sample 1size, each module shall be considered la test unit with resistive load, ) Ig iduring time on: 1N5597 1N5600 4NS603 vw N > > > > aaa aa0g Electrical measurements { | | | | [See table VII, steps 1 and 2 | t [ i | | [ | | | | | 1/ For sampling plan, see MIL-S-19500. 12MIL SPECS o00 M@ 00001e5 0031024 T MENILS MIL~S-19500/4048 TABLE VI. Group inspection for (all quality levels) for qualification only. f Inspection MIL-STD-750 i Quality I conformance Method Conditions ] inspection | | Subgroup 1 j11 devices, = Thermal shock 1051 |500 cycles, condition F Electrical measurements See table VII, steps 1 and 2 ey ee ee be ee ee be i | | | i | I | I i | | | i | i { | | I | | | | Subgroup 2 | 11 devices, c = | | | |Steady-state de blocking life | 1038 [1,000 hours, condition A, except | | { Ty = 125C | | i | {Electrical measurements | See table VII, steps 1 and 2 t ( | i | Subgroup 3 | i | | | {Not applicable [ | | { | | Subgroup _4 | [11 devices, = | | { {External corona 1/ | See 4.5.5 | | | | | Flammability l [MIL-STD-202, method 111; allowable | | | jburning time = 5 $s. Point of | | | Jimpingement shall be midpoint of | | | Jone side. | | | | | | Subgroup 5 | | |11 devices, o = | | | ' | |Barometric pressure | 1001 |Pressure = 8.0 mmHg, t = 1 minute | (reduced) | | (minimum) | | | { | | | | | 1/ Subgroup 1 samples may be used for this test. 13MIL SPECS 000 MIL-S-19500/404B M 0000125 0031025 1 MMILS TABLE VII. Groups A, B, C, and E end-point electrical measurements. | | | | | [ | | |Step| Inspection | | MIL-STO-750 L Symbol Limits { Unit | | | | | [ | [ | nethod| Conditions | [Min | Max | ! | I | | [ | | | | | 1. [Forward voltage | 4011 |T, = 25C [Veq | | | { [ | 1N5597 | [Ip = 1.0 A de (pulsed) l | 13 | 19 |v (pk) i | | 1N5600 | |1, = 2.0 A de (pulsed) | | 6 | 10 |V (pk) | | | 1N5603 | jIp = 5.0 A de (pulsed) | | 6 [| 10 [Vv (pk) | | | | | | | | | | | 2. [Reverse current | 4016 {DC method [Tpq | | | | 1N5597 | [Vp = 10.0 kV de | | 4 ]MA de | | | 1N5600 | [Vp = 5.0 kV de | { 1 5 ]HA de | | | 1N5603 | [Vp = 5.0 kV de | | | \pA de | | | | | | | | | | | | | | | | 3. [Forward voltage | 4011 | [AVeq 1/ | -0.2 | +0.1 ! V de | | | | | | 4. [Reverse current | 4016 |DC method [Ala 4/ | [ | 4N5597, 1N5600 | | | 250 nA de or | | | | | 100 percent | | | | | | of initial | | | | | value, whichever = | | f | [ is greater | | | | | | | | | 1N5603 | | | | 500 nA dc or | | | | | 100 percent | | | | | of initial | | | | | | | value, | | | | | | | whichever is i | | | | - greater. | | | | | | | | | | l 4/ Devices that exceed group A limits for this test shall be rejected. 14MIL SPECS 000 @@ 0000125 00310eb 3 MEMILS MIL=S-19500/404B 509. 10 SL N.I. NI. WNW AA (-) (+) wo =" SOURCE oULSE 30 vot GENERATOR Tt CAPABILTY (=) TO NL OSCILLOSCOPE 0.5A 7 le ~0,.25A4 f \ -1.0A - WW e SET TIME 8ASE FOR Sias /CM NOTES: . 1. Oscilloscope-rise time < 7 ns; input impedance = 1 MQ; 22 pF. 2. Pulse generator ~ rise time < 10 ns; source impedance = 5@. 3. Recovery time shall be measured on the above circuit and with equipment as shown. The pulse generator shall have a pulse repetition frequency of 1 kHz and a pulse width of 200 ns recovery conditions 125 mA forward current to .250 mA reverse current. Recovery time measured when rectifier recovers to 63 mA, FIGURE 2. Reverse recovery time test circuit and characteristic nomograph. 15MIL SPECS 000 M@ oo001eS 0031027 5 MNILS MIL-S-19500/4048 _ + VOLTAGE BY-PASS ACROSS SERIES piope. = | CAPACITOR DIODE BACKSWING 0,U.T. DIODE BALANCING RESISTOR SAMPLING RESISTOR O CURRENT THROUGH DIODE SINE PULSE f i INPUT PULSE TRANSFORMER FIGURE 3. Peak transient reverse power test circuit. 16MIL SPECS FREON OR EQUAL t 4 ty 00 MM 00001e5 00310246 7? MEMILS MIL-S-19500/4048 p> ANTI-CORONA LEAD Lo CORONA TEST SET HIGH VOLTAGE PROBE 8 4 yi j i 3 CORONA BALLS ; DEVICE f | | | UNDER TEST i CYLINDRICAL CONOUCTING SURFACE AT GROUND POTENTIAL (ATTACH TO CORONA TEST SET GROUND RETURN) FIGURE 4. Internal corona test scheme. 7MIL SPECS ooo ME 0000125 0031029 9 MEMILS MIL-S-19500/4048 CYLINDRICAL CONDUCTING . SURFACE AT GROUND POTENTIAL 2.01 CORONA BALL 150(3840) (51.05) TO 2,00(50.80) DIA boy C~ | re | ANTI-CORONA LEAD | he food AC TEST [ ] [ | VOLTAGE AIR TEST VOLTAGE: 140 KV PEAK FOR 5 kV MODULE 20 kV PEAK FOR 10 kV MODULE SCHE MATIC NOTES: 4, Otmenstons are in inches. 2, Metric equivalents are in parentheses. 3. Metric equivalents are given for general information only. FIGURE 5. External corona test scheme. 18MIL SPECS 000 Mm 0000325 0031030 5 MEMILS MIL-S-19500/4048 5, PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-S-19500. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. ) 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents must specify the following: a. Title, number, and date of the specification. b. Issue of DODISS to be cited in the solicitation, and if required, the specific issue of individual documents referenced (see 2.1). c. Lead material and finish may be specified (see 3.3.1). 6.2.1 Substitution information. Devices covered by this specification are substitutable for the manufacturer's and user's Part or Identifying Numbers (PIN). This information in no way implies that manufacturer's PIN's are suitable as a substitute for the military PIN. 6.3 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. CONCLUDING MATERIAL Custodians: Preparing activity: Army - ER Air Force - 17 Navy = EC . Air Force - 17 Agent: OLA - ES Review activities: Air Force - 70, 80, 85 (Project 5961-1269) DLA - ES User activities: Navy - AS, CG, MC, OS 19