USE GAL DEVICES FOR NEW DESIGNS FINAL COM'L: H-7/10/15/20 IND: H-10/15/20 Lattice Semiconductor PALCE26V12 Family 28-Pin EE CMOS Versatile PAL Device DISTINCTIVE CHARACTERISTICS 28-pin versatile PAL programmable logic device architecture Electrically erasable CMOS technology provides half power (only 115 mA) at high speed (7.5 ns propagation delay) Two clock inputs for independent functions Global asynchronous reset and synchronous preset for initialization Register preload for testability and built-in register reset on power-up 14 dedicated inputs and 12 input/output macrocells for architectural flexibility Space-efficient 28-pin SKINNYDIP and PLCC packages Macrocells can be registered or combinatorial, and active high or active low Center VCC and GND pins to improve signal characteristics Varied product term distribution allows up to 16 product terms per output Extensive third-party software and programmer support through FusionPLD partners GENERAL DESCRIPTION The PALCE26V12 is a 28-pin version of the popular PAL22V10 architecture. Built with low-power, highspeed, electrically-erasable CMOS technology, the PALCE26V12 offers many unique advantages. Device logic is automatically configured according to the user's design specification. Design is simplified by design software, allowing automatic creation of a programming file based on Boolean or state equations. The software can also be used to verify the design and can provide test vectors for the programmed device. The product terms are connected to the fixed OR array with a varied distribution from 8 to 16 across the outputs (see Block Diagram). The OR sum of the products feeds the output macrocell. Each macrocell can be programmed as registered or combinatorial, active high or active low, with registered I/O possible. The flip-flop can be clocked by one of two clock inputs. The output configuration is determined by four bits controlling three multiplexers in each macrocell. The PALCE26V12 utilizes the familiar sum-of-products (AND/OR) architecture that allows users to implement complex logic functions easily and efficiently. Multiple levels of combinatorial logic can always be reduced to sum-of-products form, taking advantage of the very wide input gates available in PAL devices. The functions are programmed into the device through electrically-erasable floating-gate cells in the AND logic array and the macrocells. In the unprogrammed state, all AND product terms float HIGH. If both true and complement of any input are connected, the term will be permanently LOW. 2-306 Publication# 16072 Rev. E Issue Date: February 1996 Amendment /0 BLOCK DIAGRAM I CLK/I 2 12 PROGRAMMABLE AND ARRAY (52x150) SYNC. PRESET 8 8 10 12 14 16 ASYNC. RESET 16 14 12 10 MACRO MACRO MACRO MACRO MACRO MACRO MACRO MACRO MACRO MACRO I/O 0 I/O 1 I/O 2 I/O 3 I/O 4 I/O 5 I/O 6 I/O 7 I/O 8 I/O 9 8 8 MACRO MACRO I/O 10 I/O 11 16072E-1 CONNECTION DIAGRAMS Top View DIP I/O11 I2 3 26 I/O10 CLK2/I3 4 25 I/O9 4 3 2 1 28 27 26 I/O10 27 I/O11 2 I13 I1 CLK1/I0 I13 I1 28 I2 1 CLK2/I3 CLK1/I0 PLCC I4 5 24 I/O8 I4 I5 6 23 I/O7 I5 6 24 I/O8 VCC 7 22 I/O6 VCC 7 23 I/O7 I6 8 21 GND I6 8 22 I/O6 I7 9 20 I/O5 I7 9 21 GND I8 10 19 I/O4 10 20 11 I8 I/O5 I9 18 I/O3 I10 12 17 I/O2 I9 11 19 I/O4 I11 13 16 I/O1 I12 14 15 I/O0 Note: Pin 1 is marked for orientation. 5 25 I/O9 16072E-2 I/O3 I/O2 I/O1 I/O0 I12 I11 I10 12 13 14 15 16 17 18 16072E-3 PIN DESCRIPTION CLK GND I I/O VCC = = = = = Clock Ground Input Input/Output Supply Voltage PALCE26V12 Family 2-307 ORDERING INFORMATION Commercial and Industrial Products Commercial and industrial programmable logic products are available with several ordering options. The order number (Valid Combination) is formed by a combination of: PAL CE 26 V 12 H -7 P C /4 FAMILY TYPE PAL = Programmable Array Logic OPTIONAL PROCESSING Blank = Standard Processing TECHNOLOGY CE = CMOS Electrically Erasable PROGRAMMING DESIGNATOR /4 = First Revision (May require programmer update) NUMBER OF ARRAY INPUTS OPERATING CONDITIONS C = Commercial (0C to +75C) I = Industrial (-40C to +85C) OUTPUT TYPE V = Versatile NUMBER OF OUTPUTS PACKAGE TYPE P = 28-Pin 300 mil Plastic SKINNYDIP (PD3028) J = 28-Pin Plastic Leaded Chip Carrier (PL 028) POWER H= Half Power (115 mA ICC) SPEED -7 = 7.5 ns tPD -10 = 10 ns tPD -15 = 15 ns tPD -20 = 20 ns tPD Valid Combinations PALCE26V12H-7 PALCE26V12H-10 PALCE26V12H-15 PALCE26V12H-20 2-308 JC PC, JC, PI, JI /4 Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult your local sales office to confirm availability of specific valid combinations and to check on newly released combinations. PALCE26V12H-7/10/15/20 (Com'l), H-10/15/20 (Ind) FUNCTIONAL DESCRIPTION OE The PALCE26V12 has fourteen dedicated input lines, two of which can be used as clock inputs. Unused inputs should be tied directly to ground or VCC. Buffers for device inputs and feedbacks have both true and complementary outputs to provide user-selectable signal polarity. The inputs drive a programmable AND logic array, which feeds a fixed OR logic array. AR CLK 1 P1 Pn CLK 2 0 1 1 AR D Q 0 0 Q SP 0 1 1 0 n = 8,8,10,12,14,16 1 S2 S0 S1 0 SP 1 The OR gates feed the twelve I/O macrocells (see Figure 1). The macrocell allows one of eight potential output configurations; registered or combinatorial, active high or active low, with register or I/O pin feedback (see Figure 2). In addition, registered configurations can be clocked by either of the two clock inputs. The configuration choice is made according to the user's design specification and corresponding programming of the configuration bits S0-S3 (see Table 1). Multiplexer controls initially float to VCC (1) through a programmable cell, selecting the "1" path through the multiplexer. Programming the cell connects the control line to GND (0), selecting the "0" path. Table 1. Macrocell Configuration Table S3 S1 S0 1 0 0 Output Configuration Registered Output and Feedback, Active Low 1 0 1 Registered Output and Feedback, Active High 1 1 0 Combinatorial I/O, Active Low 1 1 1 Combinatorial I/O, Active High 0 0 0 Registered I/O, Active Low 0 0 1 Registered I/O, Active High 0 1 0 Combinatorial Output, Registered Feedback, Active Low 0 1 1 Combinatorial Output, Registered Feedback, Active High 1 = Unprogrammed EE bit 0 = Programmed EE bit S2 S3* * When S 3 = 1 (unprogrammed) the feedback is selected by S 1. When S 3 = 0 (programmed), the feedback is the opposite of that selected by S 1. 16072E-4 Figure 1. PALCE26V12 Macrocell Registered or Combinatorial Each macrocell of the PALCE26V12 includes a D-type flip-flop for data storage and synchronization. The flip-flop is loaded on the LOW-to-HIGH edge of the selected clock input. Any macrocell can be configured as combinatorial by selecting a multiplexer path that bypasses the flip-flop. Bypass is controlled by bit S1. Programmable Clock The clock input for any flip-flop can be selected to be from either pin 1 or pin 4. A 2:1 multiplexer controlled by bit S2 determines the clock input. Programmable Feedback A 2:1 multiplexer allows the user to determine whether the macrocell feedback comes from the flip-flop or from the I/O pin, independent of whether the output is registered or combinatorial. Thus, registered outputs may have internal register feedback for higher speed (fMAX internal), or I/O feedback for use of the pin as a direct input (fMAX external). Combinatorial outputs may have I/O feedback, either for use of the signal in other equations or for use as another direct input, or register feedback. Clock Input 1 CLK1/I0 0 CLK2/I3 PALCE26V12 Family 2-309 The feedback multiplexer is controlled by the same bit (S1) that controls whether the output is registered or combinatorial, as on the 22V10, with an additional control bit (S3) that allows the alternative feedback path to be selected. When S3 = 1, S1 selects register feedback for registered outputs (S1 = 0) and I/O feedback for combinatorial outputs (S1 = 1). When S3 = 0, the opposite is selected: I/O feedback for registered outputs and register feedback for combinatorial outputs. Power-Up Reset Programmable Enable and I/O The register on the PALCE26V12 can be preloaded from the output pins to facilitate functional testing of complex state machine designs. This feature allows direct loading of arbitrary states, thereby making it unnecessary to cycle through long test vector sequences to reach a desired state. In addition, transitions from illegal states can be verified by loading illegal states and observing proper recovery. Each macrocell has a three-state output buffer controlled by an individual product term. Enable and disable can be a function of any combination of device inputs or feedback. The macrocell provides a bidirectional I/O pin if I/O feedback is selected, and may be configured as a dedicated input if the buffer is always disabled. This is accomplished by connecting all inputs to the enable term, forcing the AND of the complemented inputs to be always LOW. To permanently enable the outputs, all inputs are left disconnected from the term (the unprogrammed state). Programmable Output Polarity The polarity of each macrocell output can be active high or active low, either to match output signal needs or to reduce product terms. Programmable polarity allows Boolean expressions to be written in their most compact form (true or inverted), and the output can still be of the desired polarity. It can also save "DeMorganizing" efforts. Selection is controlled by programmable bit S0 in the output macrocell, and affects both registered and combinatorial outputs. Selection is automatic, based on the design specification and pin definitions. If the pin definition and output equation have the same polarity, the output is programmed to be active high. Preset/Reset For initialization, the PALCE26V12 has additional Preset and Reset product terms. These terms are connected to all registered outputs. When the Synchronous Preset (SP) product term is asserted high, the output registers will be loaded with a HIGH or the next LOW-to-HIGH clock transition. When the Asynchronous Reset (AR) product term is asserted high, the output registers will be immediately loaded with a LOW independent of the clock. Note that preset and reset control the flip-flop, not the output pin. The output level is determined by the output polarity selected. 2-310 All flip-flops power up to a logic LOW for predictable system initialization. Outputs of the PALCE26V12 will be HIGH or LOW depending on whether the output is active low or active high, respectively. The VCC rise must be monotonic, and the reset delay time is 1000 ns maximum. Register Preload Security Bit After programming and verification, a PALCE26V12 design can be secured by programming the security bit. Once programmed, this bit defeats readback of the internal programmed pattern by a device programmer, securing proprietary designs from competitors. Programming the security bit disables preload, and the array will read as if every bit is disconnected. The security bit can only be erased in conjunction with erasure of the entire pattern. Programming and Erasing The PALCE26V12 can be programmed on standard logic programmers. It also may be erased to reset a previously configured device back to its virgin state. Erasure is automatically performed by the programming hardware. No special erase operation is required. Quality and Testability The PALCE26V12 offers a very high level of built-in quality. The erasability of the device provides a means of verifying performance of all AC and DC parameters. In addition, this verifies complete programmability and functionality of the device to provide the highest programming yields and post-programming functional yields in the industry. Technology The high-speed PALCE26V12 is fabricated with our advanced electrically erasable (EE) CMOS process. The array connections are formed with proven EE cells. Inputs and outputs are designed to be compatible with TTL devices. This technology provides strong input clamp diodes, output slew-rate control, and a grounded substrate for clean switching. PALCE26V12 Family D CLK AR Q D CLK SP Q CLK AR Q SP Q Registered Active-High Output, Register Feedback Registered Active-Low Output, Register Feedback D AR Q D CLK SP Q Registered Active-Low I/O AR Q SP Q Registered Active-High I/O Registered Outputs Combinatorial Active-Low I/O D CLK AR Combinatorial Active-High I/O Q D CLK SP Q Combinatorial Active-Low Output, Register Feedback AR Q SP Q Combinatorial Active-High Output, Register Feedback Combinatorial Outputs 16072E-5 Figure 2. PALCE26V12 Macrocell Configuration Options PALCE26V12 Family 2-311 LOGIC DIAGRAM PALCE26V12 0 4 8 12 16 20 24 28 32 36 40 44 48 ASYNCH. RESET 0 28 I 13 1 1 CLK 1 /I 0 10 D AR 1 9 11 Q 00 Q 01 SP 0 27 I/O 11 S0 S2 S1 0 2 I1 R 11 1 S3 * 10 10 11 D AR 01 1 Q 0 18 26 I/O 10 00 Q SP S0 S2 0 3 I2 R S1 10 1 S3 * 19 D ARQ 10 11 00 Q 01 1 0 29 SP S0 S2 4 0 1 CLK 2 /I 3 25 I/O 9 S1 R9 S3* 30 10 11 D ARQ 1 0 SP S0 S2 42 0 1 5 I4 24 I/O 8 00 01 Q S1 R8 S3 * 43 10 11 00 01 D ARQ 1 0 SP Q S0 S2 57 0 1 6 I5 23 I/O 7 S1 R7 S3 * 58 10 11 00 01 D ARQ 1 0 Q SP S0 S1 S2 74 8 I6 0 1 0 4 8 12 16 20 24 28 32 36 40 44 48 * When S 3 = 1 (unprogrammed) the feedback is selected by S1. When S 3 = 0 (programmed), the feedback is the opposite of that selected by S1. 2-312 PALCE26V12 Family AR CLK1 SP CLK 2 22 I/O 6 R6 S3 * 21 GND 16072E-6 LOGIC DIAGRAM (continued) PALCE26V12 0 4 8 12 16 20 24 28 32 36 40 44 AR CLK1 SP CLK 2 48 75 10 11 00 01 D ARQ 1 0 SP Q 20 I/O5 S0 S2 S1 91 0 1 9 I7 R5 S3* 92 10 11 00 01 D ARQ 1 0 SP Q S0 S2 106 0 1 10 I8 19 I/O4 S1 R4 S3* 107 10 11 00 01 D ARQ 1 0 SP Q S0 S2 119 0 1 11 I9 18 I/O3 S1 R3 S3* 120 10 11 00 01 D ARQ 1 0 130 SP Q S0 S2 0 1 12 I10 17 I/O2 S1 R2 S3* 131 10 11 00 01 D ARQ 1 0 139 SP Q 16 I/O1 S0 S2 13 I11 0 1 S1 R1 S3* 140 10 11 D ARQ 1 0 148 SP 15 I/O 0 00 01 Q S0 S2 14 I12 0 1 SYNCH PRESET 149 0 4 8 12 16 20 24 28 32 36 40 44 R0 S1 S3* 48 * When S 3 = 1 (unprogrammed) the feedback is selected by S1. When S 3 = 0 (programmed), the feedback is the opposite of that selected by S1. 16072E-6 (concluded) PALCE26V12 Family 2-313 ABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature . . . . . . . . . . . -65C to +150C Commercial (C) Devices Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . -55C to +125C Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . 0C to +75C Supply Voltage with Respect to Ground . . . . . . . . . . . . . -0.5 V to +7.0 V Supply Voltage (VCC) with Respect to Ground . . . . . . . . +4.75 V to +5.25 V DC Input Voltage . . . . . . . . . . . . . . . -0.6 V to +7.0 V Industrial (I) Devices DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . -40C to +85C Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . +4.5 V to +5.5 V Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ. Operating ranges define those limits between which the functionality of the device is guaranteed. DC CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges unless otherwise specified Parameter Symbol Parameter Description Test Conditions Min VOH Output HIGH Voltage IOH = -3.2 mA VIN = VIH or VIL VCC = Min VOL Output LOW Voltage IOL = 16 mA VIN = VIH or VIL VCC = Min VIH Input HIGH Voltage Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) VIL Input LOW Voltage Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) IIH IIL Max 2.4 Unit V 0.4 2.0 V V 0.8 V Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 2) 10 A Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) -10 A IOZH Off-State Output Leakage Current HIGH VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) 10 A IOZL Off-State Output Leakage Current LOW VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) -10 A ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) -170 mA VIN = 0 V, Outputs Open (IOUT = 0 mA) H-7/10 VCC = Max, f = 0 MHz 115 mA H-7/10 140 mA 150 mA ICC (Static) Commercial Supply Current ICC (Dynamic) ICC (Dynamic) Industrial Supply Current -30 VIN = 0 V, Outputs Open (IOUT = 0 mA) VCC = Max, f = 15 MHz H-10 Notes: 1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be tested at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 2-314 PALCE26V12H-7/10 (Com'l), H-10 (Ind) CAPACITANCE (Note 1) Parameter Symbol CIN COUT Parameter Description Test Conditions Typ Input Capacitance VIN = 0 V VCC = 5.0 V 5 Output Capacitance VOUT = 0 V TA = +25C f = 1 MHz 8 Unit pF Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected. SWITCHING CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges (Note 2) Parameter Symbol -7 Parameter Description Min -10 Max Min 7.5 Max Unit 10 ns tPD Input or Feedback to Combinatorial Output tS1 Setup Time from Input or Feedback 3.5 5 ns tS2 Setup Time from SP to Clock 4.5 5 ns tH Hold Time 0 0 ns tCO Clock to Output 6 9 ns tAR Asynchronous Reset to Registered Output 11 13 ns tARW Asynchronous Reset Width 6 8 ns tARR Asynchronous Reset Recovery Time 5 8 ns tSPR Synchronous Preset Recovery Time 5 8 ns LOW 3.5 4 ns HIGH 3.5 4 ns tWL Clock Width tWH fMAX Maximum Frequency (Notes 3 and 4) External Feedback 1/(tS + tCO) 105.3 71.4 MHz Internal Feedback (fCNT) 1/(tS + tCF) 125 105 MHz tEA Input to Output Enable Using Product Term Control 8 10 ns tER Input to Output Disable Using Product Term Control 7.5 10 ns Notes: 2. See Switching Test Circuit for test conditions. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS. PALCE26V12H-7/10 (Com'l), H-10 (Ind) 2-315 ABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature . . . . . . . . . . . -65C to +150C Commercial (C) Devices Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . -55C to +125C Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . . . 0C to +75C Supply Voltage with Respect to Ground . . . . . . . . . . . . . -0.5 V to +7.0 V Supply Voltage (VCC) with Respect to Ground . . . . . . . . +4.75 V to +5.25 V DC Input Voltage . . . . . . . . . . . . . . . -0.6 V to +7.0 V lndustrial (I) Devices DC Output or I/O Pin Voltage . . . . . . . . . . . . . . . -0.5 V to VCC + 0.5 V Ambient Temperature (TA) Operating in Free Air . . . . . . . . . . . . -40C to +85C Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Supply Voltage (VCC) with Respect to Ground . . . . . . . . . . +4.5 V to +5.5 V Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ. Operating ranges define those limits between which the functionality of the device is guaranteed. DC CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges unless otherwise specified Parameter Symbol Parameter Description Test Conditions VOH Output HIGH Voltage IOH = -3.2 mA VIN = VIH or VIL VCC = Min VOL Output LOW Voltage IOL = 16 mA VIN = VIH or VIL VCC = Min VIH Input HIGH Voltage Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) VIL Input LOW Voltage Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) 0.8 V IIH Input HIGH Leakage Current VIN = 5.25 V, VCC = Max (Note 2) 10 A IIL Input LOW Leakage Current VIN = 0 V, VCC = Max (Note 2) -10 A IOZH Off-State Output Leakage Current HIGH VOUT = 5.25 V, VCC = Max VIN = VIH or VIL (Note 2) 10 A IOZL Off-State Output Leakage Current LOW VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) -10 A ISC Output Short-Circuit Current VOUT = 0.5 V, VCC = Max (Note 3) -160 mA ICC (Static) Commerical Supply Current VIN = 0 V, Outputs Open (IOUT = 0 mA) H-15/20 VCC = Max, f = 0 MHz 105 mA VIN = 0 V, Outputs Open (IOUT = 0 mA) H-15 VCC = Max, f = 15 MHz 150 mA VIN = 0 V, Outputs Open (IOUT = 0 mA) H-20 VCC = Max 130 mA VIN = 0 V, Outputs Open (IOUT = 0 mA) H-20 VCC = Max, f = 15 MHz 150 mA ICC (Dynamic) ICC (Static) ICC (Dynamic) Industrial Supply Current Min Max 2.4 V 0.4 2.0 -30 Unit V V Notes: 1. These are absolute values with respect to device ground and all overshoots due to system and/or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be tested at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 2-316 PALCE26V12H-15/20 (Com'l, Ind) CAPACITANCE (Note 1) Parameter Symbol CIN Parameter Description Test Conditions Input Capacitance VIN = 0 V Typ VCC = 5.0 V Unit 5 TA = +25C COUT Output Capacitance VOUT = 0 V pF f = 1 MHz 8 Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected. SWITCHING CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges (Note 2) Parameter Symbol -15 Parameter Description Min -20 Max Min 15 Max Unit 20 ns tPD Input or Feedback to Combinatorial Output tS Setup Time from Input, Feedback, or SP to Clock 10 13 ns tH Hold Time 0 0 ns tCO Clock to Output 10 12 ns tAR Asynchronous Reset to Registered Output 20 25 ns tARW Asynchronous Reset Width 15 20 ns tARR Asynchronous Reset Recovery Time 15 20 ns tSPR Synchronous Preset Recovery Time 10 13 ns LOW 8 10 ns HIGH 8 10 ns tWL Clock Width tWH fMAX Maximum Frequency (Notes 3 and 4) External Feedback 1/(tS + tCO) 50 40 MHz Internal Feedback (fCNT) 1/(tS + tCF) 58.8 43 MHz tEA Input to Output Enable Using Product Term Control 15 20 ns tER Input to Output Disable Using Product Term Control 15 20 ns Notes: 2. See Switching Test Circuit for test conditions. 3. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency may be affected. 6. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS. PALCE26V12H-15/20 (Com'l, Ind) 2-317 SWITCHING WAVEFORMS Input or Feedback VT tS Input or Feedback tH VT VT Clock tCO tPD Combinatorial Output Registered Output VT VT 16072E-8 16072E-7 Combinatorial Output Registered Output VT Input tWH tER Clock VT tEA VOH - 0.5V Output VT VOL + 0.5V tWL 16072E-10 Clock Width Input to Output Disable/Enable 16072E-9 tARW Input Asserting Asynchronous Reset Input Asserting Synchronous Preset VT tAR Registered Outputs VT tS tSPR Clock VT tARR Clock tH VT VT tCO Registered Outputs VT 16072E-11 Asynchronous Reset Synchronous Preset Notes: 1. VT = 1.5 V 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns-5 ns typical. 2-318 16072E-12 PALCE26V12 Family KEY TO SWITCHING WAVEFORMS WAVEFORM INPUTS OUTPUTS Must be Steady Will be Steady May Change from H to L Will be Changing from H to L May Change from L to H Will be Changing from L to H Don't Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is HighImpedance "Off" State KS000010-PAL SWITCHING TEST CIRCUIT 5V S1 R1 Output Test Point R2 CL 16072E-13 Specification tPD, tCO tEA tER S1 CL R1 Closed Z H: Open Z L: Closed 50 pF H Z: Open L Z: Closed 5 pF 300 PALCE26V12 Family R2 Com'l: H-15/20 Ind: H-20 390 Com'l: H-7/10 Ind: H-10/15 300 Measured Output Value 1.5 V 1.5 V H Z: VOH - 0.5 V L Z: VOL + 0.5 V 2-319 TYPICAL ICC CHARACTERISTICS FOR THE PALCE26V12H-7/10 VCC = 5.0 V, TA = 25C 150 125 100 ICC (mA) 75 50 25 0 0 10 20 30 40 50 Frequency (MHz) 16072E-14 The selected "typical" pattern utilized 50% of the device resources. Half of the macrocells were programmed as registered, and the other half were programmed as combinatorial. Half of the available product terms were used for each macrocell. On any vector, half of the outputs were switching. By utilizing 50% of the device, a midpoint is defined for ICC. From this midpoint, a designer may scale the ICC graphs up or down to estimate the ICC requirements for a particular design. 2-320 PALCE26V12 Family ENDURANCE CHARACTERISTICS The PALCE26V12 is manufactured using our advanced Electrically Erasable process. This technology uses an EE cell to replace the fuse link used in bipolar Symbol tDR N Parameter Min Pattern Data Retention Time Min Reprogramming Cycles parts. As a result, the device can be erased and reprogrammed--a feature which allows 100% testing at the factory. Test Conditions Min Unit Max Storage Temperature 10 Years Max Operating Temperature 20 Years Normal Programming Conditions 100 Cycles PALCE26V12 Family 2-321 the state of the input and pulls the voltage away from the input threshold voltage where noise can cause oscillations. For an illustration of this configuration, see below. Bus-Friendly Inputs The PALCE26V12H-7/10 (Com'l) and H-10/15 (Ind) inputs and I/O loop back to the input after the second stage of the input buffer. This configuration reinforces INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR REV. C VERSION* VCC 100 k VCC ESD Protection Input VCC VCC VCC 100 k Preload Circuitry Feedback Input 16072E-15 Output * Device Rev. Letter PALCE26V12H-7 PALCE26V12H-10 PALCE26V12H-15 2-322 C Topside Marking: CMOS PLDs are marked on top of the package in the following manner: PALCE xxxx Datecode (4 numbers) LOT ID (3 characters) - - (Rev. Letter) The Lot ID and Rev. letter are separated by two spaces. PALCE26V12 Family ROBUSTNESS FEATURES The PALCE26V12 has some unique features that make it extremely robust, especially when operating in high speed design environments. Input clamping circuitry limits negative overshoot, eliminating the possibility of false clocking caused by subsequent ringing. A special noise filter makes the programming circuitry completely insensitive to any positive overshoot that has a pulse width of less than about 100 ns. INPUT/OUTPUT EQUIVALENT SCHEMATICS FOR REV. B VERSION* VCC VCC > 50 k ESD Protection and Clamping Programming Pins only Programming Voltage Detection Positive Overshoot Filter Programming Circuitry Typical Input VCC VCC > 50 k Provides ESD Protection and Clamping Preload Circuitry Typical Output * Device Rev. Letter PALCE26V12-15 PALCE26V12-20 B Feedback Input 16072E-16 Topside Marking: CMOS PLDs are marked on top of the package in the following manner: PALCE xxxx Datecode (4 numbers) LOT ID (3 characters) - - (Rev. Letter) The Lot ID and Rev. letter are separated by two spaces. PALCE26V12 Family 2-323 POWER-UP RESET The power-up reset feature ensures that all flip-flops will be reset to LOW after the device has been powered up. The output state will depend on the programmed configuration. This feature is valuable in simplifying state machine initialization. A timing diagram and parameter table are shown below. Due to the synchronous operation of the power-up reset and the wide Parameter Symbol range of ways VCC can rise to its steady state, two conditions are required to ensure a valid power-up reset. These conditions are: The VCC rise must be monotonic. Following reset, the clock input must not be driven from LOW to HIGH until all applicable input and feedback setup times are met. Parameter Description Max Unit tPR Power-Up Reset Time 1000 ns tS Input or Feedback Setup Time tWL Clock Width LOW See Switching Characteristics VCC 4V Power tPR Registered Active-Low Output tS Clock tWL Power-Up Reset Waveform 2-324 PALCE26V12 Family 16072E-17 TYPICAL THERMAL CHARACTERISTICS Measured at 25C ambient. These parameters are not tested. PALCE26V12 Parameter Symbol Typ Parameter Description SKINNYDIP PLCC Unit jc Thermal impedance, junction to case 19 18 C/W ja Thermal impedance, junction to ambient 65 55 C/W 200 lfpm air 59 48 C/W 400 lfpm air 54 44 C/W 600 lfpm air 50 39 C/W 800 lfpm air 50 37 C/W jma Thermal impedance, junction to ambient with air flow Plastic jc Considerations The data listed for plastic jc are for reference only and are not recommended for use in calculating junction temperatures. The heat-flow paths in plastic-encapsulated devices are complex, making the jc measurement relative to a specific location on the package surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package. Furthermore, jc tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant temperature. Therefore, the measurements can only be used in a similar environment. PALCE26V12H-15/20 2-325