Features
1 of 4
Optimum Technology
Matching® Applied
GaAs HBT
InGaP HBT
GaAs MESFET
SiGe BiCMOS
Si BiCMOS
SiGe HBT
GaAs pHEMT
Si CMOS
Si BJT
GaN HEMT
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Product Description
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
InP HBT
LDMOS
RF MEMS
FPD1500
1W POWER pHEMT
The FPD1500 is an AlGaAs/InGaAs pseudomorphic High Electron Mobility Transis-
tor (pHEMT), featuring a 0.25μmx1500μm Schottky barrier gate, defined by high -
resolution stepper-based photolithography. The recessed gate structure minimizes
parasitics to optimize performance. The epitaxial structure and processing have
been optimized for reliable high-power applications. The FPD1500 is also available
in the low-cost plastic SOT89 and DFN packages.
29dBm Linear Output Power
at 12GHz
9dB Power Gain at 12GHz
12.5dB Max Stable Gain at
12GHz
41 dBm OIP3
35% Power-Added Efficiency
Applications
Narrowband and Broadband
High-Performance Amplifiers
SATCOM Uplink Transmitters
PCS/Cellular Low-Voltage
High-Efficiency Output Ampli-
fiers
Medium-Haul Digital Radio
Transmitters
Rev A1 DS090612
9
Package Style: Bare Die
FPD15001W
Power pH EMT
Parameter Specification Unit Condition
Min. Typ. Max.
Power at P1dB Gain Compression 28.5 30.0 dBm VDS=8V, IDS=50% IDSS
Maximum Stable Gain (S21/S12) 11.5 12.5 dB VDS=8V, IDS=50% IDSS
Power Gain at P1dB 8.0 9.0 dB VDS=8V, IDS=50% IDSS
PAE 45 % VDS=8V, IDS =50% IDSS, POUT=P1dB
OIP3 from 15dB to 5dB below P1dB 41 dBm VDS=8V, IDS=50% IDSS
43 dBm Matched for optimal power, tuned for best IP3
Saturated Drain-Source Current (IDSS) 375 465 550 mA VDS=1.3V, VGS=0V
Maximum Drain-Source Current
(IMAX)750 mA VDS=1.3V, VGS+1V
Transconductance 400 ms VDS =1.3V, VGS=0 V
Gate-Source Leakage Current (IGSO)115μAV
GS=-5V
Pinch-Off Voltage (VP) |0.7| |1.0| |1.3| V VDS=1.3V, IDS =1.5mA
Gate-Source Breakdown Voltage
(VBDGS)|12.0| |14.0| V IGS=1.5mA
Gate-Drain Breakdown Voltage
(VBDGD)|14.5| |16.0| V IGD =1.5mA
Thermal Resistivity (θJC) * 42 °C/W VDS>6V
Note: TAMBIENT=22°C, RF specifications measured at f=12GHz using CW signal.
2 of 4 Rev A1 DS090612
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
FPD1500
Pad Layout
Note: Coordinates are referenced from the bottom left hand
corner of the die to the center of the bond pad opening.
Absolute Maximum Ratings1
Parameter Rating Unit
Drain-Source Voltage (VDS)
(-3V<VGS<-0.5V)2
10 V
Gate-Source Voltage (VGS)
(0V<VDS <+8V)
-3 V
Drain-Source Current (IDS)
(For VDS<2V)
IDSS
Gate Current
(Forward or reverse current) 15 mA
RF Input Power (PIN)
(Under any acceptable bias state)
25 dBm
Channel Operating Temperature (TCH)
(Under any acceptable bias state)
175 °C
Storage Temperature (TSTG)
(Non-Operating Storage)
-65 to 150 °C
Total Power Dissipation (PTOT)3, 4, 5 3.6 W
Simultaneous Combination of Limits6
(2 or more max. limits)
80 %
Notes:
1TAMBIENT =22°C unless otherwise noted; exceeding any one of these absolute max-
imum ratings may cause permanent damage to the device.
2Operating at absolute maximum VD continuously is not recommended. If operation
at 10V is considered then IDS must be reduced in order to keep the part within
its thermal power dissipation limits. Therefore VGS is restricted to <-0.5V.
3Total Power Dissipation to be de-rated as follows above 22°C: PTOT =3.6-
(0.024W/°C)xTHS, where THS =heatsink or ambient temperature above 22°C.
Example: For a 85°C carrier temperature: PTOT =3.6-(0.024x(85-22))=2.09W
4Total Power Dissipation (PTOT) defined as (PDC+PIN)–POUT, where PDC: DC Bias
Power, PIN: RF Input Power, POUT: RF Output Power.
5Users should avoid exceeding 80% of 2 or more Limits simultaneously.
6Thermal Resistivity specification assumes a Au/Sn eutectic die attach onto an Au-
plated copper heatsink or rib.
Pad Description Pin Coordinates (μm)
A1 Gate Pad 130, 330
A2 Gate Pad 130, 190
B1 Drain Pad 390, 330
B2 Drain Pad 390, 190
CSource Pad
Die Size (μm) Die Thickness (μm) Min. Bond Pad Opening (μmxμm)
470 x 530 75 64 x 77
Caution! ESD sensitive device.
Exceeding any one or a combination of the Absolute Maximum Rating conditions may
cause permanent damage to the device. Extended application of Absolute Maximum
Rating conditions to the device may reduce device reliability. Specified typical perfor-
mance or functional operation of the device under Absolute Maximum Rating condi-
tions is not implied.
RoHS status based on EUDirective2002/95/EC (at time of this document revision).
The information in this publication is believed to be accurate and reliable. However, no
responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any
infringement of patents, or other rights of third parties, resulting from its use. No
license is granted by implication or otherwise under any patent or patent rights of
RFMD. RFMD reserves the right to change component circuitry, recommended appli-
cation circuitry and specifications at any time without prior notice.
3 of 4Rev A1 DS090612
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
FPD1500
Preferred Assembly Instructions
GaAs devices are fragile and should be handled with great care. Specially designed collets should be used where possible.
The back of the die is metallized and the recommended mounting method is by the use of conductive epoxy. Epoxy should be
applied to the attachment surface uniformly and sparingly to avoid encroachment of epoxy onto the top face of the die. Ideally
it should not exceed half the chip height. For automated dispense Ablestick LMISR4 is recommended and for manual dispense
Ablestick 84-1 LMI or 84-1 LMIT are recommended. These should be cured at a temperature of 150°C for one hour in an oven
especially set aside for epoxy curing only. If possible the curing oven should be flushed with dry nitrogen. The gold-tin (80% Au
20% Sn) eutectic die attach has a melting point of approximately 280°C but the absolute temperature being used depends on
the leadframe material used and the particular application. The maximum time at used should be kept to a minimum.
This part has gold (Au) bond pads requiring the use of gold (99.99% pure) bondwire. It is recommended that 25.4mm diameter
gold wire be used. Recommended lead bond technique is thermocompression wedge bonding with 0.001” (25µm) diameter
wire. Bond force, time stage temperature and ultrasonics are all critical parameters and the settings are dependent on the
setup being used and application. Ultrasonic or thermosonic bonding is not recommended.
Bonds should be made from the die first and then to the mounting substrate or package. The physical length of the bondwires
should be minimized especially when making RF or ground connections.
Handling Precautions
To avoid damage to the devices, care should be exercised during handling. Proper Electro-
static Discharge (ESD) precautions should be observed at all stages of storage, handling,
assembly, and testing.
ESD/MSL Rating
These devices should be treated as Class 0 (0V to 250V) using the human body model as defined in JEDEC Standard No. 22-
A114. Further information on ESD control measures can be found in MIL-STD-1686 and MIL-HDBK-263. This is an unpackaged
part and therefore no MSL rating applies.
Application Notes and Design Data
Application Notes and design data including S-parameters, noise paramters, and device model are available on request from
www.rfmd.com.
Reliability
An MTTF of 4.2 million hours at a channel temperature of 150°C is achieved for the process used to manufacture this device.
Disclaimers
This product is not designed for use in any space-based or life-sustaining/supporting equipment.
Ordering Information
Delivery Quantity Ordering Code
Full Pack (100) FPD1500-000
Small Quantity (25) FPD1500-000SQ
Sample Quantity (3) FPD1500-000S3
4 of 4 Rev A1 DS090612
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
FPD1500