© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Section I. Stratix IV Device Datasheet
and Addendum
This section includes the following chapters:
Chapter 1, DC and Switching Characteristics
Chapter 2, Addendum to the Stratix IV Device Handbook
Revision History
Refer to each chapter for its own specific revision history. For information on when
each chapter was updated, refer to the Chapter Revision Dates section, which appears
in the full handbook.
I–2 Section I: Stratix IV Device Datasheet and Addendum
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
1. DC and Switching Characteristics
Electrical Characteristics
This chapter covers the electrical and switching characteristics for Stratix® IV devices.
Electrical characteristics include operating conditions and power consumption.
Switching characteristics include transceiver specifications, core, and periphery
performance. This chapter also describes I/O timing, including programmable I/O
element (IOE) delay and programmable output buffer delay.
fFor information regarding the densities and packages of devices in the Stratix IV
family, refer to Table 1-1 and Table 1-2 of the Stratix IV Device Family Overview chapter.
Operating Conditions
When you use Stratix IV devices, they are rated according to a set of defined
parameters. To maintain the highest possible performance and reliability of the
Stratix IV devices, you must consider the operating requirements described in this
chapter.
Stratix IV devices are offered in both commercial and industrial grades. Commercial
devices are offered in –2 (fastest), –2×, –3, and –4 speed grades. Industrial devices are
offered in –1, –2, –3, and –4 speed grades.
Absolute Maximum Ratings
Absolute maximum ratings define the maximum operating conditions for Stratix IV
devices. The values are based on experiments conducted with the devices and
theoretical modeling of breakdown and damage mechanisms. The functional
operation of the device is not implied for these conditions.
cConditions other than those listed in Table 1–1, Table 1–2, and Table 1–3 may cause
permanent damage to the device. Additionally, device operation at the absolute
maximum ratings for extended periods of time may have adverse effects on the
device.
Table 1 1 . Absolute Maximum Ratings for Stratix IV Devices (Part 1 of 2)
Symbol Description Minimum Maximum Unit
VCC Core voltage and periphery circuitry power supply -0.5 1.35 V
VCCPT Power supply for programmable power technology -0.5 1.8 V
VCCPGM Configuration pins power supply -0.5 3.75 V
VCCAUX Auxiliary supply for the programmable power technology -0.5 3.75 V
VCCBAT Battery back-up power supply for design security volatile key register -0.5 3.75 V
VCCPD I/O pre-driver power supply -0.5 3.75 V
VCCIO I/O power supply -0.5 3.9 V
VCC_CLKIN Differential clock input power supply -0.5 3.75 V
VCCD_PLL PLL digital power supply -0.5 1.35 V
SIV54001-4.1
1–2 Chapter 1: DC and Switching Characteristics
Electrical Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
VCCA_PLL PLL analog power supply -0.5 3.75 V
VIDC input voltage -0.5 4.0 V
IOUT DC output current per pin -25 40 mA
TJOperating junction temperature -55 125 °C
TSTG Storage temperature (No bias) -65 150 °C
Table 1 1 . Absolute Maximum Ratings for Stratix IV Devices (Part 2 of 2)
Symbol Description Minimum Maximum Unit
Table 1 2 . Transceiver Power Supply Absolute Maximum Ratings for Stratix IV GX Devices
Symbol Description Minimum Maximum Unit
VCCA_L Transceiver high voltage power (left side) -0.5 3.75 V
VCCA_R Transceiver high voltage power (right side) -0.5 3.75 V
VCCHIP_L Transceiver HIP digital power (left side) -0.5 1.35 V
VCCHIP_R Transceiver HIP digital power (right side) -0.5 1.35 V
VCCR_L Receiver power (left side) -0.5 1.35 V
VCCR_R Receiver power (right side) -0.5 1.35 V
VCCT_L Transmitter power (left side) -0.5 1.35 V
VCCT_R Transmitter power (right side) -0.5 1.35 V
VCCL_GXBLn (1) Transceiver clock power (left side) -0.5 1.35 V
VCCL_GXBRn (1) Transceiver clock power (right side) -0.5 1.35 V
VCCH_GXBLn (1) Transmitter output buffer power (left side) -0.5 1.8 V
VCCH_GXBRn (1) Transmitter output buffer power (right side) -0.5 1.8 V
Note to Tab l e 12:
(1) n = 0, 1, 2, or 3.
Table 1 3 . Transceiver Power Supply Absolute Maximum Ratings for Stratix IV GT Devices (Note 1) (Part 1 of 2)
Symbol Description Minimum Maximum Unit
VCCA_L Transceiver high voltage power (left side) -0.5 3.75 V
VCCA_R Transceiver high voltage power (right side) -0.5 3.75 V
VCCHIP_L Transceiver HIP digital power (left side) -0.5 1.35 V
VCCHIP_R Transceiver HIP digital power (right side) -0.5 1.35 V
VCCR_L Receiver power (left side) -0.5 1.35 V
VCCR_R Receiver power (right side) -0.5 1.35 V
VCCT_L Transmitter power (left side) -0.5 1.35 V
VCCT_R Transmitter power (right side) -0.5 1.35 V
VCCL_GXBLn (2) Transceiver clock power (left side) -0.5 1.35 V
VCCL_GXBRn (2) Transceiver clock power (right side) -0.5 1.35 V
VCCH_GXBLn
(2) Transmitter output buffer power (left side) -0.5 1.8 V
Chapter 1: DC and Switching Characteristics 1–3
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Maximum Allowed Overshoot and Undershoot Voltage
During transitions, input signals may overshoot to the voltage shown in Table 1–4 and
undershoot to -2.0 V for input currents less than 100 mA and periods shorter than
20 ns.
Table 1–4 lists the maximum allowed input overshoot voltage and the duration of the
overshoot voltage as a percentage of device lifetime. The maximum allowed
overshoot duration is specified as a percentage of high time over the lifetime of the
device. A DC signal is equivalent to 100% duty cycle. For example, a signal that
overshoots to 4.3 V can only be at 4.3 V for ~5% over the lifetime of the device; for a
device lifetime of 10 years, this amounts to half of a year.
Recommended Operating Conditions
This section lists the functional operation limits for AC and DC parameters for
Stratix IV devices. Table 1–5 shows the steady-state voltage and current values
expected from Stratix IV devices. Power supply ramps must all be strictly monotonic,
without plateaus.
VCCH_GXBRn (2) Transmitter output buffer power (right side) -0.5 1.8 V
Notes to Ta bl e 1 3 :
(1) For absolute maximum ratings for Stratix IV GT engineering sample (ES1) devices, contact your local Altera sales representative.
(2) n = 0, 1, 2, or 3.
Table 1 3 . Transceiver Power Supply Absolute Maximum Ratings for Stratix IV GT Devices (Note 1) (Part 2 of 2)
Symbol Description Minimum Maximum Unit
Table 1 4 . Maximum Allowed Overshoot During Transitions
Symbol Description Condition Overshoot Duration as % of
High Time Unit
Vi (AC) AC input voltage
4.0 V 100.000 %
4.05 V 79.330 %
4.1 V 46.270 %
4.15 V 27.030 %
4.2 V 15.800 %
4.25 V 9.240 %
4.3 V 5.410 %
4.35 V 3.160 %
4.4 V 1.850 %
4.45 V 1.080 %
4.5 V 0.630 %
4.55 V 0.370 %
4.6 V 0.220 %
Table 1 5 . Recommended Operating Conditions for Stratix IV Devices (Part 1 of 2)
Symbol Description Condition Minimum Typical Maximum Unit
VCC
(Stratix IV GX
and Stratix IV E)
Core voltage and periphery circuitry power
supply 0.870.900.93V
VCC
(Stratix IV GT)
Core voltage and periphery circuitry power
supply 0.920.950.98V
Chapter 1: DC and Switching Characteristics 1–4
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–6 shows the transceiver power supply recommended operating conditions for
Stratix IV GX devices.
VCCPT
Power supply for programmable power
technology 1.451.501.55V
VCCAUX
Auxiliary supply for the programmable
power technology 2.375 2.5 2.625 V
VCCPD
(2) I/O pre-driver (3.0 V) power supply 2.85 3.0 3.15 V
I/O pre-driver (2.5 V) power supply 2.375 2.5 2.625 V
VCCIO
I/O buffers (3.0 V) power supply 2.85 3.0 3.15 V
I/O buffers (2.5 V) power supply 2.375 2.5 2.625 V
I/O buffers (1.8 V) power supply 1.71 1.8 1.89 V
I/O buffers (1.5 V) power supply 1.425 1.5 1.575 V
I/O buffers (1.2 V) power supply 1.14 1.2 1.26 V
VCCPGM
Configuration pins (3.0 V) power supply 2.85 3.0 3.15 V
Configuration pins (2.5 V) power supply 2.375 2.5 2.625 V
Configuration pins (1.8 V) power supply 1.71 1.8 1.89 V
VCCA_PLL PLL analog voltage regulator power supply 2.375 2.5 2.625 V
VCCD_PLL
(Stratix IV GX
and Stratix IV E)
PLL digital voltage regulator power supply 0.870.900.93V
VCCD_PLL
(Stratix IV GT) PLL digital voltage regulator power supply 0.920.950.98V
VCC_CLKIN Differential clock input power supply 2.375 2.5 2.625 V
VCCBAT
(1) Battery back-up power supply (For design
security volatile key register) —1.23.3V
VIDC input voltage 0.5 3.6 V
VOOutput voltage —0V
CCIO V
TJ
(Stratix IV GX
and Stratix IV E) Operating junction temperature Commercial 0 85 °C
Industrial –40 100 °C
TJ (Stratix IV GT) Operating junction temperature Industrial 0 100 °C
tRAMP Power supply ramp time
Normal POR
(PORSEL=0) 0.05 100 ms
Fast POR
(PORSEL=1) 0.05 4 ms
Notes to Ta bl e 1 5 :
(1) Altera recommends a 3.0-V nominal battery voltage when connecting VCCBAT to a battery for volatile key backup. If you do not use the volatile
security key, you may connect the VCCBAT to either GND or a 3.0-V power supply.
(2) VCCPD must be 2.5 V when VCCIO is 2.5, 1.8, 1.5, or 1.2 V. VCCPD must be 3.0 V when VCCIO is 3.0 V.
Table 1 5 . Recommended Operating Conditions for Stratix IV Devices (Part 2 of 2)
Symbol Description Condition Minimum Typical Maximum Unit
Table 1 6 . Transceiver Power Supply Operating Conditions for Stratix IV GX Devices (Part 1 of 2) (Note 4)
Symbol Description Minimum Typical Maximum Unit
VCCA_L Transceiver high voltage power (left side) 2.85/2.375 3.0/2.5(2) 3.15/2.625 V
VCCA_R Transceiver high voltage power (right side)
Chapter 1: DC and Switching Characteristics 1–5
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–7 shows the recommended operating conditions for the Stratix IV GT
transceiver power supply.
VCCHIP_L Transceiver HIP digital power (left side) 0.87 0.9 0.93 V
VCCHIP_R Transceiver HIP digital power (right side) 0.87 0.9 0.93 V
VCCR_L Receiver power (left side) 1.05 1.1 1.15 V
VCCR_R Receiver power (right side) 1.05 1.1 1.15 V
VCCT_L Transmitter power (left side) 1.05 1.1 1.15 V
VCCT_R Transmitter power (right side) 1.05 1.1 1.15 V
VCCL_GXBLn (1) Transceiver clock power (left side) 1.05 1.1 1.15 V
VCCL_GXBRn (1) Transceiver clock power (right side) 1.05 1.1 1.15 V
VCCH_GXBLn (1) Transmitter output buffer power (left side) 1.33/1.425 1.4/1.5(3) 1.47/1.575 V
VCCH_GXBRn (1) Transmitter output buffer power (right side)
Notes to Ta bl e 1 6 :
(1) n = 0, 1, 2, or 3.
(2) VCCA_L/R must be connected to a 3.0-V supply if the CMU PLL, receiver CDR, or both, are configured at a base data rate > 4.25 Gbps. For data
rates up to 4.25 Gbps, you can connect VCCA_L/R to either 3.0 V or 2.5 V.
(3) VCCH_GXBL/R must be connected to a 1.4-V supply if the transmitter channel data rate is > 6.25 Gbps. For data rates up to 6.25 Gbps, you can
connect VCCH_GXBL/R to either 1.4 V or 1.5 V.
(4) Transceiver power supplies do not have power-on-reset (POR) circuitry. After initial power-up, violating the transceiver power supply operating
conditions could lead to unpredictable link behavior.
Table 1 6 . Transceiver Power Supply Operating Conditions for Stratix IV GX Devices (Part 2 of 2) (Note 4)
Symbol Description Minimum Typical Maximum Unit
Table 1 7 . Transceiver Power Supply Operating Conditions for Stratix IV GT Devices (Note 1), (3)
Symbol Description Minimum Typical Maximum Unit
VCCA_L Transceiver high voltage power (left side) 3.25 3.3 3.35 V
VCCA_R Transceiver high voltage power (right side) 3.25 3.3 3.35 V
VCCHIP_L Transceiver HIP digital power (left side) 0.92 0.95 0.98 V
VCCHIP_R Transceiver HIP digital power (right side) 0.92 0.95 0.98 V
VCCR_L Receiver power (left side) 1.15 1.2 1.25 V
VCCR_R Receiver power (right side) 1.15 1.2 1.25 V
VCCT_L Transmitter power (left side) 1.15 1.2 1.25 V
VCCT_R Transmitter power (right side) 1.15 1.2 1.25 V
VCCL_GXBLn (2) Transceiver clock power (left side) 1.15 1.2 1.25 V
VCCL_GXBRn
(2) Transceiver clock power (right side) 1.15 1.2 1.25 V
VCCH_GXBLn (2) Transmitter output buffer power (left side) 1.33 1.4 1.47 V
VCCH_GXBRn (2) Transmitter output buffer power (right side) 1.33 1.4 1.47 V
Notes to Ta bl e 1 7 :
(1) For recommended operating conditions for Stratix IV GT engineering sample (ES1) devices, contact your local Altera sales representative.
(2) n = 0, 1, 2, or 3.
(3) Transceiver power supplies do not have power-on-reset (POR) circuitry. After initial power-up, violating the transceiver power supply operating
conditions could lead to unpredictable link behavior.
Chapter 1: DC and Switching Characteristics 1–6
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
DC Characteristics
This section lists the supply current, I/O pin leakage current, input pin capacitance,
on-chip termination tolerance, and hot socketing specifications.
Supply Current
Standby current is the current drawn from the respective power rails used for power
budgeting. Use the Excel-based Early Power Estimator (EPE) to get supply current
estimates for your design because these currents vary greatly with the resources you
use.
fFor more information about power estimation tools, refer to the PowerPlay Early Power
Estimator User Guide and the PowerPlay Power Analysis chapter in the Quartus II
Handbook.
I/O Pin Leakage Current
Table 1–8 defines the Stratix IV I/O pin leakage current specifications.
Bus Hold Specifications
Table 1–9 shows the Stratix IV device family bus hold specifications.
Table 1 8 . I/O Pin Leakage Current for Stratix IV Devices
Symbol Description Conditions Min Typ Max Unit
IIInput pin VI = 0V to VCCIOMAX -20 20 µA
IOZ Tri-stated I/O pin VO = 0V to VCCIOMA X -20 20 µA
Table 1 9 . Bus Hold Parameters
Parameter Symbol Conditions
VCCIO
Unit
1.2 V 1.5 V 1.8 V 2.5 V 3.0 V
Min Max Min Max Min Max Min Max Min Max
Low
sustaining
current
ISUSL
VIN > VIL
(maximum) 22.5 25.0 30.0 50.0 70.0 µA
High
sustaining
current
ISUSH
VIN
< VIH
(minimum) -22.5—-25.0—-30.0—-50.0—-70.0— µA
Low
overdrive
current
IODL 0V < VIN < VCCIO —120—160—200—300—500µA
High
overdrive
current
IODH 0V < VIN < VCCIO -120 -160 -200 -300 -500 µA
Bus-hold trip
point VTRIP 0.45 0.95 0.50 1.00 0.68 1.07 0.70 1.70 0.80 2.00 V
Chapter 1: DC and Switching Characteristics 1–7
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
On-Chip Termination (OCT) Specifications
If you enable OCT calibration, calibration is automatically performed at power-up for
I/Os connected to the calibration block. Table 1–10 lists the Stratix IV OCT
termination calibration accuracy specifications.
The calibration accuracy for calibrated series and parallel OCTs are applicable at the
moment of calibration. When process, voltage, and temperature (PVT) conditions
change after calibration, the tolerance may change. Table 1–11 lists the Stratix IV OCT
without calibration resistance tolerance to PVT changes.
Table 1–10. Stratix IV On-Chip Termination Calibration Accuracy Specifications (Note 1)
Symbol Description Conditions Calibration Accuracy Unit
C2 C3,I3 C4,I4
25-Ω RS (2)
3.0, 2.5, 1.8, 1.5, 1.2
Internal series termination
with calibration (25-Ω setting)
VCCIO = 3.0, 2.5, 1.8,
1.5, 1.2 V ± 8 ± 8 ± 8 %
50-Ω RS
3.0, 2.5, 1.8, 1.5, 1.2
Internal series termination
with calibration (50-Ω setting)
VCCIO = 3.0, 2.5, 1.8,
1.5, 1.2 V ± 8 ± 8 ± 8 %
50-Ω RT
2.5, 1.8, 1.5, 1.2
Internal parallel termination
with calibration (50-Ω setting)
VCCIO = 2.5, 1.8, 1.5,
1.2 V ± 10 ± 10 ± 10 %
20-Ω, 40-Ω, and
60-Ω RS (3)
3.0, 2.5, 1.8, 1.5, 1.2
Expanded range for internal
series termination with
calibration (20-Ω, 40-Ω,
and 60-Ω RS setting)
VCCIO = 3.0, 2.5, 1.8,
1.5, 1.2 V ± 10 ± 10 ± 10 %
25-Ω RS_left_shift
3.0, 2.5, 1.8, 1.5, 1.2
Internal left shift series
termination with calibration
(25-Ω RS_left_shift setting)
VCCIO = 3.0, 2.5, 1.8,
1.5, 1.2 V ± 10 ± 10 ± 10 %
Notes to Ta bl e 1 10 :
(1) OCT calibration accuracy is valid at the time of calibration only.
(2) 25-Ω RS is not supported for 1.5 V and 1.2 V in Row I/O.
(3) 20-Ω RS is not supported for 1.5 V and 1.2 V in Row I/O.
Table 1–11. Stratix IV On-Chip Termination Without Calibration Resistance Tolerance Specifications (Part 1 of 2)
Symbol Description Conditions Resistance Tolerance Unit
C2 C3,I3 C4,I4
25-Ω RS
3.0 and 2.5
Internal series termination
without calibration (25-Ω
setting)
VCCIO = 3.0 and 2.5 V ± 30 ± 40 ± 40 %
25-Ω RS
1.8 and 1.5
Internal series termination
without calibration (25-Ω
setting)
VCCIO = 1.8 and 1.5 V ± 30 ± 40 ± 40 %
25-ΩRS
1.2
Internal series termination
without calibration (25-Ω
setting)
VCCIO = 1.2 V ± 35 ± 50 ± 50 %
50-Ω RS
3.0 and 2.5
Internal series termination
without calibration (50-Ω
setting)
VCCIO = 3.0 and 2.5 V ± 30 ± 40 ± 40 %
50-Ω RS
1.8 and 1.5
Internal series termination
without calibration (50-Ω
setting)
VCCIO = 1.8 and 1.5 V ± 30 ± 40 ± 40 %
Chapter 1: DC and Switching Characteristics 1–8
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
OCT calibration is automatically performed at power-up for OCT-enabled I/Os.
Table 1–12 lists OCT variation with temperature and voltage after power-up
calibration. Use Table 1–12 to determine the OCT variation after power-up calibration
and Equation 1–1 to determine the OCT variation without re-calibration.
Table 1–12 shows the on-chip termination variation after the power-up calibration.
50-Ω RS
1.2
Internal series termination
without calibration (50-Ω
setting)
VCCIO = 1.2 V ± 35 ± 50 ± 50 %
100-Ω RD
2.5
Internal differential
termination (100-Ω setting) VCCIO = 2.5 V ± 25 ± 25 ± 25 %
Table 1–11. Stratix IV On-Chip Termination Without Calibration Resistance Tolerance Specifications (Part 2 of 2)
Symbol Description Conditions Resistance Tolerance Unit
C2 C3,I3 C4,I4
Equation 1–1. OCT Variation Without Re-Calibration (Note 1), (2), (3), (4), (5), (6)
Notes to Equation 1–1:
(1) The ROC T value calculated from Equation 1–1 shows the range of OCT resistance with the variation of temperature
and VCCIO.
(2) RSCAL is the OCT resistance value at power-up.
(3) ΔT is the variation of temperature with respect to the temperature at power-up.
(4) ΔV is the variation of voltage with respect to the VCCIO at power-up.
(5) dR/dT is the percentage change of RSCAL with temperature.
(6) dR/dV is the percentage change of RSCAL with voltage.
Table 1–12. On-Chip Termination Variation after Power-Up Calibration (Note 1)
Symbol Description VCCIO
(V) Typical Unit
dR/dV OCT variation with voltage without
re-calibration
3.0 0.0297
%/mV
2.5 0.0344
1.8 0.0499
1.5 0.0744
1.2 0.1241
dR/dT OCT variation with temperature
without re-calibration
3.0 0.189
%/°C
2.5 0.208
1.8 0.266
1.5 0.273
1.2 0.317
Note to Tab l e 112:
(1) Valid for VCCIO range of ±5% and temperature range of 0° to 85°C.
ROCT RSCAL 1dR
dT
-------ΔT×〈〉
dR
dV
-------ΔV×〈〉±+
⎝⎠
⎛⎞
=
Chapter 1: DC and Switching Characteristics 1–9
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Pin Capacitance
Table 1–13 shows the Stratix IV device family pin capacitance.
Hot Socketing
Table 1–14 shows the hot socketing specifications for Stratix IV devices.
Internal Weak Pull-Up Resistor
Table 1–15 lists the weak pull-up resistor values for Stratix IV devices.
Table 1–13. Pin Capacitance for Stratix IV Devices
Symbol Description Typical Unit
CIOTB Input capacitance on top/bottom I/O pins 4pF
CIOLR Input capacitance on left/right I/O pins 4pF
CCLKTB Input capacitance on top/bottom non-dedicated clock input pins 4pF
CCLKLR Input capacitance on left/right non-dedicated clock input pins 4pF
COUTFB Input capacitance on dual-purpose clock output/feedback pins 5pF
CCLK1, CCLK3, CCLK8, and
CCLK10
Input capacitance for dedicated clock input pins 2pF
Table 1–14. Hot Socketing Specifications for Stratix IV Devices
Symbol Description Maximum
IIOPIN (DC) DC current per I/O pin 300 μA
IIOPIN (AC) AC current per I/O pin 8 mA (1)
IXCVR- TX (DC) (2) DC current per transceiver TX pin 100 mA
IXCVR- RX (DC) (2) DC current per transceiver RX pin 50 mA
Notes to Ta bl e 1 14 :
(1) The I/O ramp rate is 10 ns or more. For ramp rates faster than 10 ns, |IIOPIN | = C dv/dt, in which C is the I/O pin
capacitance and dv/dt is the slew rate.
(2) These specifications are preliminary.
Table 1–15. Stratix IV Internal Weak Pull-Up Resistor (Note 1), (3)
Symbol Description Conditions Min Typ Max Unit
RPU
Value of the I/O pin pull-up resistor before
and during configuration, as well as user
mode if the programmable pull-up resistor
option is enabled.
VCCIO = 3.0 V ±5% (2) —25
kΩ
VCCIO = 2.5 V ±5% (2) —25
kΩ
VCCIO = 1.8 V ±5% (2) —25
kΩ
VCCIO = 1.5 V ±5% (2) —25
kΩ
VCCIO = 1.2 V ±5% (2) —25
kΩ
Notes to Ta bl e 1 15 :
(1) All I/O pins have an option to enable weak pull-up except configuration, test, and JTAG pins.
(2) Pin pull-up resistance values may be lower if an external source drives the pin higher than VCCIO.
(3) The internal weak pull-down feature is only available for the JTAG TCK pin. The typical value for this internal weak pull-down resistor is
approximately 25 kΩ.
Chapter 1: DC and Switching Characteristics 1–10
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
I/O Standard Specifications
Table 1–16 through Table 1–21 list input voltage (VIH and VIL), output voltage (VOH and
VOL), and current drive characteristics (IOH and IOL) for various I/O standards
supported by Stratix IV devices. These tables also show the Stratix IV device family
I/O standard specifications. VOL and VOH values are valid at the corresponding IOH and
IOL, respectively.
For an explanation of terms used in Table 1–16 through Table 1–21, refer to “Glossary
on page 1–54.
Table 1–16. Single-Ended I/O Standards
I/O
Standard
VCCIO
(V) VIL (V) VIH (V) VOL
(V) VOH
(V) IOL
(mA) IOH (mA)
Min Typ Max Min Max Min Max Max Min
LVTTL 2.85 3 3.15 -0.3 0.8 1.7 3.6 0.4 2.4 2 -2
LVCMOS 2.85 3 3.15 -0.3 0.8 1.7 3.6 0.2 VCCIO - 0.2 0.1 -0.1
2.5 V 2.375 2.5 2.625 -0.3 0.7 1.7 3.6 0.4 2 1 -1
1.8 V 1.71 1.8 1.89 -0.3 0.35 *
VCCIO
0.65 *
VCCIO
VCCIO +
0.3 0.45 VCCIO - 0.45 2 -2
1.5 V 1.425 1.5 1.575 -0.3 0.35 *
VCCIO
0.65 *
VCCIO
VCCIO +
0.3
0.25 *
VCCIO
0.75 *
VCCIO
2-2
1.2 V 1.14 1.2 1.26 -0.3 0.35 *
VCCIO
0.65 *
VCCIO
VCCIO +
0.3
0.25 *
VCCIO
0.75 *
VCCIO
2-2
3.0-V PCI 2.85 3 3.15 0.3 *
VCCIO
0.5 *
VCCIO
3.6 0.1 *
VCCIO
0.9 * VCC IO 1.5 -0.5
3.0-V
PCI-X 2.85 3 3.15 0.35 *
VCCIO
0.5 *
VCCIO
0.1 *
VCCIO
0.9 * VCC IO 1.5 -0.5
Table 1–17. Single-Ended SSTL and HSTL I/O Reference Voltage Specifications
I/O Standard VCCIO(V) VREF(V) VTT(V)
Min Typ Max Min Typ Max Min Typ Max
SSTL-2
Class I, II 2.375 2.5 2.625 0.49 * VCCIO 0.5 * VCC IO
0.51 *
VCCIO
VREF - 0.04 VREF VREF + 0.04
SSTL-18
Class I, II 1.71 1.8 1.89 0.833 0.9 0.969 VREF - 0.04 VREF VREF + 0.04
SSTL-15
Class I, II 1.425 1.5 1.575 0.47 * VCCIO 0.5 * VCC IO
0.53 *
VCCIO
0.47 *
VCCIO
VREF
0.53 *
VCCIO
HSTL-18
Class I, II 1.71 1.8 1.89 0.85 0.9 0.95 VCC IO /2
HSTL-15
Class I, II 1.425 1.5 1.575 0.68 0.75 0.9 VCC IO /2
HSTL-12
Class I, II 1.14 1.2 1.26 0.47 * VCCIO 0.5 * VCC IO
0.53 *
VCCIO
—V
CCIO /2
Chapter 1: DC and Switching Characteristics 1–11
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–18. Single-Ended SSTL and HSTL I/O Standards Signal Specifications
I/O Standard VIL(DC)(V) VIH(DC)(V) VIL(AC)(V) VIH(AC)(V) VOL(V) VOH (V) Iol (mA) Ioh (mA)
Min Max Min Max Max Min Max Min
SSTL-2
Class I -0.3 VREF -
0.15
VREF +
0.15
VCCIO +
0.3 VREF - 0.31 VREF
+ 0.31 VTT -
0.57
VTT +
0.57 8.1 -8.1
SSTL-2
Class II -0.3 VREF -
0.15
VREF +
0.15
VCCIO +
0.3 VREF - 0.31 VREF
+ 0.31 VTT -
0.76
VTT +
0.76 16.2 -16.2
SSTL-18
Class I -0.3 VREF -
0.125
VREF +
0.125
VCCIO +
0.3 VREF - 0.25 VRE F + 0.25 VTT -
0.475
VTT +
0.475 6.7 -6.7
SSTL-18
Class II -0.3 VREF -
0.125
VREF +
0.125
VCCIO +
0.3 VREF - 0.25 VRE F + 0.25 0.28 VCCIO -
0.28 13.4 -13.4
SSTL-15
Class I VREF -
0.1
VREF +
0.1 VREF -
0.175 VREF + 0.175 0.2 *
VCCIO
0.8 *
VCCIO
8-8
SSTL-15
Class II VREF -
0.1
VREF +
0.1 VREF -
0.175 VREF + 0.175 0.2 *
VCCIO
0.8 *
VCCIO
16 -16
HSTL-18
Class I —V
REF -0.1 VREF +
0.1 —V
REF - 0.2 VREF + 0.2 0.4 VCCIO -
0.4 8-8
HSTL-18
Class II VREF -
0.1
VREF +
0.1 —V
REF - 0.2 VREF + 0.2 0.4 VCCIO -
0.4 16 -16
HSTL-15
Class I VREF -
0.1
VREF +
0.1 —V
REF - 0.2 VREF + 0.2 0.4 VCCIO -
0.4 8-8
HSTL-15
Class II VREF -
0.1
VREF +
0.1 —V
REF - 0.2 VREF + 0.2 0.4 VCCIO -
0.4 16 -16
HSTL-12
Class I -0.15 VREF -
0.08
VREF +
0.08
VCCIO +
0.15 VREF - 0.15 VREF
+ 0.15 0.25*
VCCIO
0.75*
VCCIO
8-8
HSTL-12
Class II -0.15 VREF -
0.08
VREF +
0.08
VCCIO +
0.15 VREF - 0.15 VREF
+ 0.15 0.25*
VCCIO
0.75*
VCCIO
16 -16
Table 1–19. Differential SSTL I/O Standards
I/O
Standard
VCCIO(V) VSWING(DC)(V) VX(AC)(V) VSWING(AC)(V) VOX(AC)(V)
Min Typ Max Min Max Min Typ Max Min Max Min Typ Max
SSTL-2
Class I, II 2.375 2.5 2.625 0.3 VCC IO +
0.6
VCCIO
/2
- 0.2 VCCIO/2 +
0.2 0.62 VCCIO +
0.6
VCCIO
/2
- 0.15 VCCIO/2
+ 0.15
SSTL-18
Class I, II 1.71 1.8 1.89 0.25 VCCIO +
0.6
VCCIO
/2
-
0.175
VCCIO/2 +
0.175 0.5 VCCIO +
0.6
VCCIO
/2
-
0.125
VCCIO/2
+
0.125
SSTL-15
Class I, II 1.425 1.5 1.575 0.2 VCC IO /2 0.35 VCCIO /2
Table 1–20. Differential HSTL I/O Standards (Part 1 of 2)
I/O
Standard
VCCIO(V) VDIF(DC)(V) VX(AC)(V) VCM(DC)
(V) VDIF(AC )(V)
Min Typ Max Min Max Min Typ Max Min Typ Max Min Max
HSTL-18
Class I 1.71 1.8 1.89 0.2 0.78 1.12 0.78 1.12 0.4
Chapter 1: DC and Switching Characteristics 1–12
Electrical Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
HSTL-15
Class I, II 1.425 1.5 1.575 0.2 0.68 0.9 0.68 0.9 0.4
HSTL-12
Class I, II 1.14 1.2 1.26 0.16 VCCIO +
0.3 0.5*
VCCIO
0.4*
VCCIO
0.5*
VCCIO
0.6*
VCCIO
0.3 VCCIO +
0.48
Table 1–20. Differential HSTL I/O Standards (Part 2 of 2)
I/O
Standard
VCCIO(V) VDIF(DC)(V) VX(AC)(V) VCM(DC)
(V) VDIF(AC )(V)
Min Typ Max Min Max Min Typ Max Min Typ Max Min Max
Table 1–21. Differential I/O Standard Specifications (Note 1), (2)
I/O
Standard
VCCIO(V) VID(mV) VICM(DC)(V) VOD(V) (3) VOCM(V) (3)
Min Typ Max Min Condition Max Min Condition Max Min Typ Max Min Typ Max
PCML Transmitter, receiver, and input reference clock pins of high-speed transceivers use PCML I/O standard. For transmitter, receiver, and
reference clock I/O pin specifications, refer to Table 1–22 on page 1–14 and Table 1–23 on page 1–21.
2.5 V
LVDS
(HIO)
2.375 2.5 2.625 100 VCM =
1.25 V
—0.05 DMAX
700 Mbps 1.8 0.247 0.6 1.125 1.25 1.375
—1.05 DMAX >
700 Mbps 1.55 0.247 0.6 1.125 1.25 1.375
2.5 V
LVDS
(VIO)
2.375 2.5 2.625 100 VCM =
1.25 V
—0.05 DMAX
700 Mbps 1.8 0.247 0.6 1 1.25 1.5
—1.05 DMAX>
700 Mbps 1.55 0.247 0.6 1 1.25 1.5
RSDS
(HIO) 2.375 2.5 2.625 100 VCM =
1.25 V 0.3 1.4 0.1 0.2 0.6 0.5 1.2 1.4
RSDS
(VIO) 2.375 2.5 2.625 100 VCM =
1.25 V 0.3 1.4 0.1 0.2 0.6 0.5 1.2 1.5
Mini-
LVDS
(HIO)
2.375 2.5 2.625 200 600 0.4 1.325 0.25 0.6 1 1.2 1.4
Mini-
LVDS
(VIO)
2.375 2.5 2.625 200 600 0.4 1.325 0.25 0.6 1 1.2 1.5
LVPECL
2.375 2.5 2.625 300 0.6 DMAX
700 Mbps
1.8
(4) ———
2.375 2.5 2.625 300 1 DMA X >
700 Mbps
1.6
(4) ———
Notes to Ta bl e 1 21 :
(1) Vertical (VIO) is top and bottom I/Os; horizontal I/O (HIO) is left and right I/Os.
(2) 1.4-V/1.5-V PCML transceiver I/O standard specifications are described in Transceiver Performance Specifications” on page 1–14.
(3) RL range: 90 RL 110 Ω.
(4) For DMAX > 700 Mbps, the minimum input voltage is 0.85 V; the maximum input voltage is 1.75 V. For FMAX 700 Mbps, the minimum input voltage is 0.45
V; the maximum input voltage is 1.95 V.
Chapter 1: DC and Switching Characteristics 1–13
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Power Consumption
Altera offers two ways to estimate power consumption for a design: the Excel-based
Early Power Estimator and the Quartus® II PowerPlay Power Analyzer feature.
1You typically use the interactive Excel-based Early Power Estimator before designing
the FPGA to get a magnitude estimate of the device power. The Quartus II PowerPlay
Power Analyzer provides better quality estimates based on the specifics of the design
after you complete place-and-route. The PowerPlay Power Analyzer can apply a
combination of user-entered, simulation-derived, and estimated signal activities that,
combined with detailed circuit models, yields very accurate power estimates.
fFor more information about power estimation tools, refer to the PowerPlay Early Power
Estimator User Guide for Stratix III and Stratix IV FPGAs and the PowerPlay Power
Analysis chapter in the Quartus II Handbook.
Switching Characteristics
This section provides performance characteristics of Stratix IV core and periphery
blocks for commercial grade devices.
These characteristics can be designated as Preliminary or Final.
Preliminary characteristics are created using simulation results, process data, and
other known parameters. The title of these tables show the designation as
“Preliminary”.
Final numbers are based on actual silicon characterization and testing. The
numbers reflect the actual performance of the device under worst-case silicon
process, voltage, and junction temperature conditions. There are no designations
on finalized tables.
Chapter 1: DC and Switching Characteristics 1–14
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Transceiver Performance Specifications
This section describes transceiver performance specifications.
Table 1–22 lists the Stratix IV GX transceiver specifications.
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 1 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Reference Clock
Supported I/O Standards 1.2 V PCML, 1.5 V PCML, 2.5 V PCML, Differential LVPECL, LVDS, HCSL
Input frequency from
REFCLK input pins 50— 69750— 69750637.5MHz
Phase frequency detector
(CMU PLL and receiver
CDR)
50— 42550— 32550325MHz
Absolute VMAX for a
REFCLK pin ——1.61.61.6V
Operational VMAX for a
REFCLK pin ——1.51.51.5V
Absolute VMIN for a
REFCLK pin -0.4— -0.4— -0.4 V
Rise/fall time (19) ——0.20.20.2UI
Duty cycle 45 55 45 55 45 55 %
Peak-to-peak differential
input voltage 200 — 1600 200 1600 200 1600 mV
Spread-spectrum
modulating clock
frequency
PCI Express 30 33 30 33 30 33 kHz
Spread-spectrum
downspread PCI Express 0 to
-0.5% ——
0 to
-0.5% ——
0 to
-0.5% ——
On-chip termination
resistors 100 100 100 Ω
VICM (AC coupled) 1100 ± 10% 1100 ± 10% 1100 ± 10% mV
VICM (DC coupled)
HCSL I/O
standard for
PCI Express
reference clock
250 550 250 550 250 550 mV
Transmitter REFCLK Phase
Noise
10 Hz -50 -50 -50 dBc/Hz
100 Hz -80 -80 -80 dBc/Hz
1 KHz -110 -110 -110 dBc/Hz
10 KHz ——-120——-120-120dBc/Hz
100 KHz ——-120——-120-120dBc/Hz
1 MHz -130 -130 -130 dBc/Hz
RREF ——
2000
±1% ——
2000
± 1% ——
2000
± 1% Ω
Chapter 1: DC and Switching Characteristics 1–15
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Transceiver Clocks
Calibration block clock
frequency 10— 12510— 12510125MHz
fixedclk clock
frequency
PCI Express
Receiver Detect 125 125 125 MHz
reconfig_clk clock
frequency
Dynamic
reconfiguration
clock frequency
2.5/
37.5
(2)
—50
2.5/
37.5
(2)
—50
2.5/
37.5
(2)
—50
Delta time between
reconfig_clks (17) ——222ms
Transceiver block
minimum power-down
(gxb_powerdown)
pulse width
—111µs
Receiver
Supported I/O Standards 1.4 V PCML, 1.5 V PCML, 2.5 V PCML, LVPECL, LVDS
Data rate (Single width,
non-PMA Direct) 600 3750 600 3750 600 3750 Mbps
Data rate (Double width,
non-PMA Direct) 1000 8500 1000 6500 1000 6375
(20) Mbps
Data rate (Single width,
PMA Direct) 600 3250 600 3250 600 3250 Mbps
Data rate (Double width,
PMA Direct) 1000 6500 1000 6500 1000 6375 Mbps
Absolute VMAX for a
receiver pin (3) ——1.61.61.6V
Operational VMAX for a
receiver pin ——1.51.51.5V
Absolute VMIN for a
receiver pin -0.4— -0.4— -0.4 V
Maximum peak-to-peak
differential input voltage
VID (diff p-p) before device
configuration
——1.61.61.6V
Maximum peak-to-peak
differential input voltage
VID (diff p-p) after device
configuration
VICM = 0.82 V
setting —— 2.7 —— 2.7 2.7 V
VICM =1.1 V
setting (4) —— 1.6 —— 1.6 1.6 V
Minimum peak-to-peak
differential input voltage
VID (diff p-p) (18)
Data Rate =
600 Mbps to
5Gbps
100 — 100 165 mV
Data Rate
>5Gbps 165 165 165 mV
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 2 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–16
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
VICM
VICM = 0.82 V
setting 820 ± 10% 820 ± 10% 820 ± 10% mV
VICM = 1.1 V
setting (4) 1100 ± 10% 1100 ± 10% 1100 ± 10% mV
Receiver DC Coupling
Support For more information about receiver DC coupling support, refer to the DC-Coupled Links” section
in the Stratix IV Transceiver Architecture chapter.
Differential on-chip
termination resistors
85Ω setting 85 ± 20% 85 ± 20% 85 ± 20% Ω
100Ω setting 100 ± 20% 100 ± 20% 100 ± 20% Ω
120Ω setting 120 ± 20% 120 ± 20% 120 ± 20% Ω
150-Ω setting 150 ± 20% 150 ± 20% 150 ± 20% Ω
Differential and common
mode return loss
PCI Express
(PIPE) (Gen 1
and Gen 2),
XAUI,
HiGig+,
CEI SR/LR,
Serial RapidIO
SR/LR,
CPRI LV/HV,
OBSAI,
SATA
Compliant
Programmable PPM
detector (5) ± 62.5, 100, 125, 200,
250, 300, 500, 1000 ppm
Run length 200 200 200 UI
Programmable
equalization (16) 16— 16——16 dB
tLTR (6) 75— 75——75 µs
tLTR_LTD_Manual (7) 15— 15— 15 µs
tLTD_Manual (8) 4000 4000 4000 ns
tLTD_Auto (9) —4000—40004000ns
Receiver CDR
3 dB Bandwidth in
lock-to-data (LTD) mode
PCI Express
(PIPE) Gen1 20 - 35 MHz
PCI Express
(PIPE) Gen2 40 - 65 MHz
(OIF) CEI PHY at
6.375 Gbps 20 - 35 MHz
XAUI 10 - 18 MHz
Serial RapidIO
1.25 Gbps 10 - 18 MHz
Serial RapidIO
2.5 Gbps 10 - 18 MHz
Serial RapidIO
3.125 Gbps 6 - 10 MHz
GIGE 6 - 10 MHz
SONET OC12 3 - 6 MHz
SONET OC48 14 - 19 MHz
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 3 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–17
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Receiver buffer and CDR
offset cancellation time
(per channel)
17000 17000 17000
recon
fig_
clk
cycles
Programmable DC gain
DC Gain Setting
= 0 —0 —0 0 dB
DC Gain Setting
= 1 —3 —3 3 dB
DC Gain Setting
= 2 —6 —6 6 dB
DC Gain Setting
= 3 —9 —9 9 dB
DC Gain Setting
= 4 —12 —12 12 dB
EyeQ Max Data Rate 600 3250 600 3250 600 3250 Mbps
Transmitter
Supported I/O Standards 1.4 V PCML, 1.5 V PCML
Data rate (Single width,
non-PMA Direct) 600 3750 600 3750 600 3750 Mbps
Data rate (Double width,
non-PMA Direct) 1000 8500 1000 6500 1000 6375
(20) Mbps
Data rate (Single width,
PMA Direct) 600 3250 600 3250 600 3250 Mbps
Data rate (Double width,
PMA Direct) (10) 1000 6500 1000 6500 1000 6375 Mbps
VOCM 0.65 V setting 650 650 650 mV
Differential on-chip
termination resistors
85Ω setting 85 ± 15% 85 ± 15% 85 ± 15% Ω
100Ω setting 100 ± 15% 100 ± 15% 100 ± 15% Ω
120Ω setting 120 ± 15% 120 ± 15% 120 ± 15% Ω
150-Ω setting 150 ± 15% 150 ± 15% 150 ± 15% Ω
Differential and common
mode return loss
PCI Express
(PIPE) Gen1 and
Gen2 (TX VOD=4),
XAUI (TX VOD=6),
HiGig+
(TX VOD =6),
CEI SR/LR
(TX VOD =8),
Serial RapidIO
SR (VOD=6),
Serial RapidIO
LR (VOD=8),
CPRI LV (VOD=6),
CPRI HV
(VOD=2),
OBSAI (VOD=6),
SATA (VOD=4),
Compliant
Rise time (11) 50— 20050— 20050—200 ps
Fall time (11) 50— 20050— 20050—200 ps
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 4 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–18
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Intra-differential pair skew 15 15 15 ps
Intra-transceiver block
transmitter
channel-to-channel skew
×4 PMA and PCS
bonded mode
Example: XAUI,
PCI EXpress
(PIPE), ×4,
Basic ×4
120 120 120 ps
Inter-transceiver block
transmitter
channel-to-channel skew
×8 PMA and PCS
bonded mode
Example:
PCI Express
(PIPE) ×8,
Basic ×8
500 500 500 ps
Inter-transceiver block
skew in Basic (PMA
Direct) ×N mode (12)
N < 18 channels
located across
three transceiver
blocks with the
source CMU PLL
located in the
center
transceiver block
400 400 400 ps
N 18 channels
located across
four transceiver
blocks with the
source CMU PLL
located in one of
the two center
transceiver
blocks
650 650 650 ps
CMU PLL0 and CMU PLL1
Supported Data Range 600 8500 600 6500 600 6375 Mbps
pll_powerdown
minimum pulse width
(tpll_powerdown)
—1μs
CMU PLL lock time from
pll_powerdown
de-assertion
100 100 100 μs
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 5 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–19
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
-3 dB Bandwidth
PCI Express
(PIPE) Gen1 2.5 - 3.5 MHz
PCI Express
(PIPE) Gen2 6 - 8 MHz
(OIF) CEI PHY at
4.976 Gbps 7 - 11 MHz
(OIF) CEI PHY at
6.375 Gbps 5 - 10 MHz
XAUI 2 - 4 MHz
Serial RapidIO
1.25 Gbps 3 - 5.5 MHz
Serial RapidIO
2.5 Gbps 3 - 5.5 MHz
Serial RapidIO
3.125 Gbps 2 - 4 MHz
GIGE 2.5 - 4.5 MHz
SONET OC12 1.5 - 2.5 MHz
SONET OC48 3.5 - 6 MHz
ATX PLL (6G)
Supported Data Range
(14)
/L = 1 4800-5400 and
6000-6500
4800-5400 and
6000-6500 —Mbps
/L = 2 2400-2700 and
3000-3250
2400-2700 and
3000-3250 —Mbps
/L = 4 1200-1350 and
1500-1625
1200-1350 and
1500-1625 —Mbps
-3 dB Bandwidth
PCI Express
(PIPE) Gen 2 1.5 1.5 allows LC MHz
(OIF) CEI PHY at
6.375 Gbps 3 - 4.5 3 - 4.5 allows LC MHz
Transceiver-FPGA Fabric Interface
Interface speed
(non-PMA Direct)
25 265.625 25 250 25 250 MHz
Interface speed
(PMA Direct)
50— 32550— 32550325MHz
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 6 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–20
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Digital reset pulse width Minimum is two parallel clock cycles
Notes to Ta bl e 1 22 :
(1) The 2× speed grade is the fastest speed grade offered in the following Stratix IV GX devices: EP4SGX70DF29, EP4SGX110DF29, EP4SGX110FF35,
EP4SGX230DF29, EP4SGX110FF35, EP4SGX230DF29, EP4SGX230FF35, EP4SGX290FF35, EP4SGX290FH29, EP4SGX360FF35, and EPSGX360FH29.
(2) The minimum reconfig_clk frequency is 2.5 MHz if the transceiver channel is configured in transmitter only mode. The minimum reconfig_clk
frequency is 37.5 MHz if the transceiver channel is configured in receiver only or receiver and transmitter mode. For more information, refer to the Stratix IV
Dynamic Reconfiguration chapter in volume 2 of the Stratix IV Device Handbook.
(3) The device cannot tolerate prolonged operation at this absolute maximum.
(4) You must use the 1.1-V RX VICM setting if the input serial data standard is LVDS.
(5) The rate matcher supports only up to ±300 ppm.
(6) Time taken to rx_pll_locked goes high from rx_analogreset de-assertion. Refer to Figure 1–2 on page 1–28.
(7) Time for which the CDR must be kept in lock-to-reference mode after rx_pll_locked goes high and before rx_locktodata is asserted in manual
mode. Refer to Figure 1–2 on page 1–28.
(8) Time taken to recover valid data after the rx_locktodata signal is asserted in manual mode. Refer to Figure 1–2 on page 1–28.
(9) Time taken to recover valid data after the rx_freqlocked signal goes high in automatic mode. Refer to Figure 1–3 on page 1–28.
(10) A GPLL may be required to meet PMA-FPGA fabric interface timing above certain data rates. Refer to the "Left/Right PLL Requirements in Basic (PMA Direct)
Mode" section in the Stratix IV GX Transceiver Clocking chapter in volume 2 of the Stratix IV Device Handbook.
(11) The Quartus II software automatically selects the appropriate slew rate depending on the configured data rate or functional mode.
(12) For applications that require low transmit lane-to-lane skew, use Basic (PMA Direct) xN to achieve PMA-Only bonding across all channels in the link. You
can bond all channels on one side of the device by configuring them in Basic (PMA Direct) xN mode. For more information about clocking requirements in
this mode, refer to the “Basic (PMA Direct) Mode Clocking” section in the Stratix IV GX Transceiver Clocking chapter in volume 2 of the Stratix IV Device
Handbook.
(13) Pending Characterization.
(14) The Quartus II software automatically selects the appropriate /L divider depending upon the configured data.
(15) The maximum Transceiver-FPGA Fabric interface speed of 265.625 MHz is allowed only in Basic Low-Latency PCS mode with a 32-bit interface width. For
more information, refer to the “Basic Double-Width Mode Configurations” section in the Stratix IV Transceiver Architecture chapter in volume 2 of the
Stratix IV Device Handbook.
(16) Figure 1–1 shows the AC gain curves for each of the 16 available equalization settings.
(17) If your design uses more than one dynamic reconfiguration controller (altgx_reconfig) instances to control the transceiver (altgx) channels
physically located on the same side of the device AND if you use different reconfig_clk sources for these altgx_reconfig instances, the delta
time between any two of these reconfig_clk sources becoming stable must not exceed the maximum specification listed.
(18) The outer envelope of the eye diagram measured at the receiver input pins must meet the minimum VID specifications if RX equalization is enabled. The
inner envelope of the eye diagram measured at the receiver input pins must meet the minimum VID specifications if RX equalization is not enabled.
(19) The rise and fall time transition is specified from 20% to 80%.
(20) Stratix IV GX devices in -4 speed grade support Basic mode and Deterministic Latency mode transceiver configurations up to 6375 Mbps. These
configurations are shown in the figures 1-90, 1-92, 1-94, 1-96, and 1-101 in the Stratix IV Transceiver Architecture chapter.
Table 1–22. Transceiver Specifications for Stratix IV GX Devices (Part 7 of 7)
Symbol/
Description Conditions
–2 Commercial
Speed Grade
3 Commercial/Industrial
and
Commercial
Speed Grade (1)
–4 Commercial/Industrial
Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–21
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Figure 1–1 shows the top-to-bottom AC gain curve for equalization settings 0 to 15.
Table 1–23 lists the Stratix IV GT transceiver specifications.
Figure 1–1. AC Gain Curves for Equalization Settings 0 to 15 (Bottom to Top)
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 1 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Reference Clock
Supported I/O Standards 1.2 V PCML, 1.5 V PCML, 2.5 V PCML, Differential LVPECL, LVDS
Input frequency from
REFCLK input pins 50 706.25 50 706.25 50 706.25 MHz
Phase frequency
detector (CMU PLL and
receiver CDR)
50 425 50 425 50 425 MHz
Absolute VMAX for a
REFCLK pin 1.6 1.6 1.6 V
Operational VMAX for a
REFCLK pin 1.5 1.5 1.5 V
Absolute VMIN for a
REFCLK pin -0.3 -0.3 -0.3 V
Rise/fall time 0.2 0.2 0.2 UI
Duty cycle 45 55 45 55 45 55 %
Chapter 1: DC and Switching Characteristics 1–22
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Peak-to-peak differential
input voltage after device
configuration
200 1600 200 1600 200 1600 mV
Max peak-to-peak
differential input voltage
before device
configuration
900 900 900 mV
On-chip termination
resistors 100 100 100 Ω
VICM 1200 ± 10% 1200 ± 10% 1200 ± 10% mV
RREF ——
2000 ±
1% 2000 ±
1% ——
2000
± 1% Ω
Transceiver Clocks
Calibration block clock
frequency 10 125 10 125 10 125 MHz
reconfig_clk clock
frequency
Dynamic
reconfigura
tion clock
frequency
2.5/
37.5
(1)
——
2.5/
37.5
(1)
—50
2.5/
37.5
(1)
—50MHz
fixedclk clock
frequency
PCI
Express
Receiver
Detect
125 125 125 MHz
Delta time between
reconfig_clks
(13)
——222ms
Transceiver block
minimum
(gxb_powerdown)
power-down pulse width
——111µs
Receiver
Supported I/O
Standards 1.4 V PCML, 1.5 V PCML, 2.5 V PCML, LVPECL, LVDS
Data rate (Single width,
non-PMA Direct) 600 3750 600 3750 600 3750 Mbps
Data rate (Double width,
non-PMA Direct) 1000 11300 1000 - 10312.5 1000 8500 Mbps
Data rate (Single width,
PMA Direct) 600 - 3250 600 - 3250 600 3250 Mbps
Data rate (Double width,
PMA Direct) 1000 - 6500 1000 - 6500 1000 6500 Mbps
Absolute VMAX for a
receiver pin (2) 1.6 1.6 1.6 V
Operational VMAX for a
receiver pin 1.5 1.5 1.5 V
Absolute VMIN for a
receiver pin -0.4 -0.4— -0.4— V
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 2 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–23
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Maximum peak-to-peak
differential input voltage
VID (diff p-p) before
device configuration
1.6 1.6 1.6 V
Maximum peak-to-peak
differential input voltage
VID (diff p-p) after device
configuration
VICM = 0.82
V setting 2.7 2.7 2.7 V
VICM = 1.2 V
setting (3) 1.2 1.2 1.2 V
Minimum peak-to-peak
differential input voltage
VID (diff p-p)
Data Rate =
2488 Mbps
to 5 Gbps
100 — 100 100 mV
Data Rate >
5Gbps 165 165 165 mV
VICM
VICM = 0.82
V setting 820 ± 10% 820 ± 10% 820 ± 10% mV
VICM = 1.2 V
setting (3) 1200 ± 10% 1200 ± 10% 1200 ± 10% mV
Differential on-chip
termination resistors
85Ω
setting 85 ± 20% 85 ± 20% 85 ± 20% Ω
100Ω
setting 100 ± 20% 100 ± 20% 100 ± 20% Ω
120Ω
setting 120 ± 20% 120 ± 20% 120 ± 20% Ω
150-Ω
setting 150 ± 20% 150 ± 20% 150 ± 20% Ω
Differential and common
mode return loss
PCI
Express
(PIPE)
(Gen 1 and
Gen 2),
XAUI,
HiGig+,
CEI SR/LR,
Serial
RapidIO
SR/LR,
CPRI
LV/HV,
OBSAI,
SATA
Compliant
Programmable PPM
detector (4) —— ± 62.5, 100, 125, 200,
250, 300, 500, 1000 ppm
Run length 200 200 200 UI
Programmable
equalization ——161616dB
tLTR (5) ——757575µs
tLTR_LTD_Manual
(6) 15 15— 15— µs
tLTD_Manual (7) 4000 4000 4000 ns
tLTD_Auto (8) 4000 4000 4000 ns
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 3 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–24
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Receiver buffer and CDR
offset cancellation time
(per channel)
17000 17000 17000
recon
fig_c
lk
cycles
Programmable DC gain
DC Gain
Setting = 0 —0 0 0 dB
DC Gain
Setting = 1 —3 3 3 dB
DC Gain
Setting = 2 —6 6 6 dB
DC Gain
Setting = 3 —9 9 9 dB
DC Gain
Setting = 4 12 —12 —12 dB
EyeQ Max Data Rate 4.0 4.0 4.0 Gbps
Transmitter
Supported I/O Standards 1.4 V PCML
Data rate (Single width,
non-PMA Direct) 600 3750 600 3750 600 3750 Mbps
Data rate (Double width,
non-PMA Direct) 1000 11300 1000 10312.5 1000 8500 Mbps
Data rate (Single width,
PMA Direct) 600 3250 600 3250 600 3250 Mbps
Data rate (Double width,
PMA Direct) (9) 1000 6500 1000 6500 1000 6500 Mbps
VOCM
0.65 V
setting 650 650 650 mV
Differential on-chip
termination resistors
85Ω
setting 85 ± 15% 85 ± 15% 85 ± 15% Ω
100Ω
setting 100 ± 15% 100 ± 15% 100 ± 15% Ω
120Ω
setting 120 ± 15% 120 ± 15% 120 ± 15% Ω
150-Ω
setting 150 ± 15% 150 ± 15% 150 ± 15% Ω
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 4 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–25
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Differential and common
mode return loss
PCI
Express
(PIPE)
Gen1 and
Gen2 (TX
VOD =4),
XAUI (TX
VOD =6),
HiGig+
(TX VOD=6),
CEI SR/LR
(TX VOD=8),
Serial
RapidIO SR
(VOD=6),
Serial
RapidIO LR
(VOD=8),
CPRI LV
(VOD=6),
CPRI HV
(VOD=2),
OBSAI
(VOD=6),
SATA
(VOD=4),
Compliant
Rise time (10) 50 200 50 200 50 200 ps
Fall time (10) 50 200 50 200 50 200 ps
Intra-differential pair
skew ——151515ps
Intra-transceiver block
transmitter
channel-to-channel skew
×4 PMA
and PCS
bonded
mode
Example:
XAUI, PCI
EXpress
(PIPE), ×4,
Basic ×4
——120—120—120ps
Inter-transceiver block
transmitter
channel-to-channel skew
×8 PMA
and PCS
bonded
mode
Example:
PCI Expres
s (PIPE) ×8,
Basic ×8
——500—500—500ps
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 5 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–26
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Inter-transceiver block
skew in Basic (PMA
Direct) ×N mode (11)
N < 18
channels
located
across
three
transceiver
blocks with
the source
CMU PLL
located in
the center
transceiver
block
——400—400—400ps
N 18
channels
located
across four
transceiver
blocks with
the source
CMU PLL
located in
one of the
two center
transceiver
blocks
——650—650—650ps
CMU PLL0 and CMU PLL1
Supported data range 600 600 600 Mbps
CMU PLL lock time from
pll_powerdown
de-assertion
100 100 100 μs
ATX PLL (6G)
Supported Data Range
/L = 1 4800-5400 and
6000-6500
4800-5400 and
6000-6500 —Mbps
/L = 2 2400-2700 and
3000-3250
2400-2700 and
3000-3250 —Mbps
/L = 4 1200-1350 and
1500-1625
1200-1350 and
1500-1625 —Mbps
ATX PLL (10G)
Supported Data Range 9900 11300 9900 10312.5 Mbps
Transceiver-FPGA Fabric Interface
Interface speed
(non-PMA Direct)
62.2 62.2 265.625 62.2 265.625 MHz
Interface speed
(PMA Direct)
124.4 124.4 325 124.4 325 MHz
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 6 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–27
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Digital reset pulse width Minimum is two parallel clock cycles
Notes to Ta bl e 1 23 :
(1) The minimum reconfig_clk frequency is 2.5 MHz if the transceiver channel is configured in transmitter only mode. The minimum
reconfig_clk frequency is 37.5 MHz if the transceiver channel is configured in receiver only or receiver and transmitter mode. For more
information, refer to the Stratix IV Dynamic Reconfiguration chapter in volume 1 of the Stratix IV Device Handbook.
(2) The device cannot tolerate prolonged operation at this absolute maximum.
(3) You must use the 1.2-V RXVICM setting if the input serial data standard is LVDS.
(4) The rate matcher supports only up to ±300 ppm.
(5) Time taken to rx_pll_locked goes high from rx_analogreset de-assertion. Refer to Figure 1–2 on page 1–28.
(6) Time for which the CDR must be kept in lock-to-reference mode after rx_pll_locked goes high and before rx_locktodata is asserted in
manual mode. Refer to Figure 1–2 on page 1–28.
(7) Time taken to recover valid data after the rx_locktodata signal is asserted in manual mode. Refer to Figure 1–2 on page 1–28.
(8) Time taken to recover valid data after the rx_freqlocked signal goes high in automatic mode. Refer to Figure 1–3 on page 1–28.
(9) A GPLL may be required to meet PMA-FPGA fabric interface timing above certain data rates. Refer to the "Left/Right PLL Requirements in Basic (PMA
Direct) Mode" section in the Stratix IV GX Transceiver Clocking chapter in volume 2 of the Stratix IV Device Handbook.
(10) The Quartus II software automatically selects the appropriate slew rate depending on the configured data rate or functional mode.
(11) For applications that require low transmit lane-to-lane skew, use Basic (PMA Direct) xN to achieve PMA-Only bonding across all channels in the link.
You can bond all channels on one side of the device by configuring them in Basic (PMA Direct) xN mode. For more information about clocking
requirements in this mode, refer to the “Basic (PMA Direct) Mode Clocking” section in the Stratix IV GX Transceiver Clocking chapter in volume 2 of
the Stratix IV Device Handbook.
(12) Pending Characterization.
(13) If your design uses more than one dynamic reconfiguration controller (altgx_reconfig) instances to control the transceiver (altgx) channels
physically located on the same side of the device AND if you use different reconfig_clk sources for these altgx_reconfig instances, the
delta time between any two of these reconfig_clk sources becoming stable must not exceed the maximum specification listed.
Table 1–23. Transceiver Specifications for Stratix IV GT Devices (Part 7 of 7)
Symbol/
Description Conditions –1 Industrial Speed Grade 2 Industrial Speed Grade 3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–28
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Figure 1–2 shows the lock time parameters in manual mode.
1LTD = Lock-To-Data; LTR = Lock-To-Reference
Figure 1–3 shows the lock time parameters in automatic mode.
Figure 1–2. Lock Time Parameters for Manual Mode
LTR LTD
Invalid Data
Valid data
r x_locktodata
LTD_Manual
CDR status
r x_dataout
rx_pll_locked
r x_analogreset
LTR
LTR_LTD_Manual
t
t
t
Figure 1–3. Lock Time Parameters for Automatic Mode
LTR LTD
Invalid data Valid data
r x_freqlocked
LTD_Auto
r x_dataout
CDR status
t
Chapter 1: DC and Switching Characteristics 1–29
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–24 through Table 1–27 show the typical differential VOD termination settings
for Stratix IV GX and GT devices.
Table 1–28 shows typical transmitter pre-emphasis levels in dB for the first post tap
under the following conditions (low-frequency data pattern [five 1s and five 0s] at
6.25 Gbps). The levels shown in Table 1–28 are a representation of possible
pre-emphasis levels under the specified conditions only and it should be noted that
the pre-emphasis levels may change with data pattern and data rate.
fTo predict the pre-emphasis level for your specific data rate and pattern, run
simulations using the Stratix IV HSSI HSPICE models.
Table 1–24. Typical VOD Setting, TX Term = 85 Ω
Symbol VOD Setting (mV)
01234567
VOD differential peak-peak
Typic al (mV)
170 ±
20%
340 ±
20%
510 ±
20%
595 ±
20%
680 ±
20%
765 ±
20%
850 ±
20%
1020
± 20%
Table 1–25. Typical VOD Setting, TX Term = 100 Ω
Symbol VOD
Setting (mV)
01234567
VOD differential peak-peak
Typic al (mV)
200 ±
20%
400 ±
20%
600 ±
20%
700 ±
20%
800 ±
20%
900 ±
20%
1000
± 20%
1200
± 20%
Table 1–26. Typical VOD Setting, TX Term = 120 Ω
Symbol VOD Setting (mV)
0123456
VOD differential peak-peak
Typic al (mV)
240 ±
20%
480 ±
20%
720 ±
20%
840 ±
20%
960 ±
20%
1080 ±
20%
1200 ±
20%
Table 1–27. Typical VOD Setting, TX Term = 150 Ω
Symbol VOD Setting (mV)
012345
VOD differential peak-peak
Typic al (mV)
300 ±
20%
600 ±
20%
900 ±
20%
1050 ±
20%
1200 ±
20%
1350 ±
20%
Table 1–28. Transmitter Pre-Emphasis Levels for Stratix IV Devices (Part 1 of 2)
Pre-
Emphasis
1st
Post-Tap
Setting
VOD Setting
01234567
000000000
1N/A0.7000000
2N/A10.300000
3N/A1.50.600000
4N/A20.70.30000
Chapter 1: DC and Switching Characteristics 1–30
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
5 N/A 2.7 1.2 0.5 0.3 0 0 0
6 N/A 3.1 1.3 0.8 0.5 0.2 0 0
7 N/A 3.7 1.8 1.1 0.7 0.4 0.2 0
8 N/A 4.2 2.1 1.3 0.9 0.6 0.3 0
9 N/A 4.9 2.4 1.6 1.2 0.8 0.5 0.2
10 N/A 5.4 2.8 1.9 1.4 1 0.7 0.3
11 N/A 6 3.2 2.2 1.7 1.2 0.9 0.4
12 N/A 6.8 3.5 2.6 1.9 1.4 1.1 0.6
13 N/A 7.5 3.8 2.8 2.1 1.6 1.2 0.6
14 N/A 8.1 4.2 3.1 2.3 1.7 1.3 0.7
15 N/A 8.8 4.5 3.4 2.6 1.9 1.5 0.8
16 N/A N/A 4.9 3.7 2.9 2.2 1.7 0.9
17 N/A N/A 5.3 4 3.1 2.4 1.8 1.1
18 N/A N/A 5.7 4.4 3.4 2.6 2 1.2
19 N/A N/A 6.1 4.7 3.6 2.8 2.2 1.4
20 N/A N/A 6.6 5.1 4 3.1 2.4 1.5
21 N/A N/A 7 5.4 4.3 3.3 2.7 1.7
22 N/A N/A 8 6.1 4.8 3.8 3 2
23 N/A N/A 9 6.8 5.4 4.3 3.4 2.3
24 N/A N/A 10 7.6 6 4.8 3.9 2.6
25 N/A N/A 11.4 8.4 6.8 5.4 4.4 3
26 N/A N/A 12.6 9.4 7.4 5.9 4.9 3.3
27 N/A N/A N/A 10.3 8.1 6.4 5.3 3.6
28 N/A N/A N/A 11.3 8.8 7.1 5.8 4
29 N/A N/A N/A 12.5 9.6 7.7 6.3 4.3
30N/AN/AN/AN/A11.4 9 7.4N/A
31N/AN/AN/AN/A12.910 8.2N/A
Table 1–28. Transmitter Pre-Emphasis Levels for Stratix IV Devices (Part 2 of 2)
Pre-
Emphasis
1st
Post-Tap
Setting
VOD Setting
01234567
Chapter 1: DC and Switching Characteristics 1–31
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–29 lists the Stratix IV GX transceiver jitter specifications for all supported
protocols. For protocols supported by Stratix IV GT industrial speed grade devices,
refer to the Stratix IV GX –2 commercial speed grade column in Table 1–29.
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 1 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
SONET/SDH Transmit Jitter Generation (3)
Peak-to-peak jitter at 622.08
Mbps Pattern = PRBS15 —— 0.1 0.1 0.1 UI
RMS jitter at 622.08 Mbps Pattern = PRBS15 0.01 0.01 0.01 UI
Peak-to-peak jitter at
2488.32 Mbps Pattern = PRBS15 —— 0.1 0.1 0.1 UI
RMS jitter at 2488.32 Mbps Pattern = PRBS15 0.01 0.01 0.01 UI
SONET/SDH Receiver Jitter Tolerance (3)
Jitter tolerance at
622.08 Mbps
Jitter frequency = 0.03 KHz
Pattern = PRBS15 > 15 > 15 > 15 UI
Jitter frequency = 25 KHZ
Pattern = PRBS15 > 1.5 > 1.5 > 1.5 UI
Jitter frequency = 250 KHz
Pattern = PRBS15 > 0.15 > 0.15 > 0.15 UI
Jitter tolerance at
2488.32 Mbps
Jitter frequency = 0.06 KHz
Pattern = PRBS15 > 15 > 15 > 15 UI
Jitter frequency = 100 KHZ
Pattern = PRBS15 > 1.5 > 1.5 > 1.5 UI
Jitter frequency = 1 MHz
Pattern = PRBS15 > 0.15 > 0.15 > 0.15 UI
Jitter frequency = 10 MHz
Pattern = PRBS15 > 0.15 > 0.15 > 0.15 UI
Fibre Channel Transmit Jitter Generation (4), (12)
Total jitter FC-1 Pattern = CRPAT 0.23 0.23 0.23 UI
Deterministic jitter FC-1 Pattern = CRPAT 0.11 0.11 0.11 UI
Total jitter FC-2 Pattern = CRPAT 0.33 0.33 0.33 UI
Deterministic jitter FC-2 Pattern = CRPAT —— 0.2 0.2 0.2 UI
Total jitter FC-4 Pattern = CRPAT 0.52 0.52 0.52 UI
Deterministic jitter FC-4 Pattern = CRPAT 0.33 0.33 0.33 UI
Fibre Channel Receiver Jitter Tolerance (4), (13)
Deterministic jitter FC-1 Pattern = CJTPAT > 0.37 > 0.37 > 0.37 UI
Random jitter FC-1 Pattern = CJTPAT > 0.31 > 0.31 > 0.31 UI
Sinusoidal jitter FC-1 Fc/25000 > 1.5 > 1.5 > 1.5 UI
Fc/1667 > 0.1 > 0.1 > 0.1 UI
Chapter 1: DC and Switching Characteristics 1–32
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Deterministic jitter FC-2 Pattern = CJTPAT > 0.33 > 0.33 > 0.33 UI
Random jitter FC-2 Pattern = CJTPAT > 0.29 > 0.29 > 0.29 UI
Sinusoidal jitter FC-2 Fc/25000 > 1.5 > 1.5 > 1.5 UI
Fc/1667 > 0.1 > 0.1 > 0.1 UI
Deterministic jitter FC-4 Pattern = CJTPAT > 0.33 > 0.33 > 0.33 UI
Random jitter FC-4 Pattern = CJTPAT > 0.29 > 0.29 > 0.29 UI
Sinusoidal jitter FC-4 Fc/25000 > 1.5 > 1.5 > 1.5 UI
Fc/1667 > 0.1 > 0.1 > 0.1 UI
XAUI Transmit Jitter Generation (5)
Total jitter at 3.125 Gbps Pattern = CJPAT —— 0.3 0.3 0.3 UI
Deterministic jitter at
3.125 Gbps Pattern = CJPAT 0.17 0.17 0.17 UI
XAUI Receiver Jitter Tolerance (5)
Total jitter > 0.65 > 0.65 > 0.65 UI
Deterministic jitter > 0.37 > 0.37 > 0.37 UI
Peak-to-peak jitter Jitter frequency = 22.1 KHz > 8.5 > 8.5 > 8.5 UI
Peak-to-peak jitter Jitter frequency = 1.875 MHz > 0.1 > 0.1 > 0.1 UI
Peak-to-peak jitter Jitter frequency = 20 MHz > 0.1 > 0.1 > 0.1 UI
PCI Express Transmit Jitter Generation (6)
Total jitter at 2.5 Gbps
(Gen1)×1, ×4, and ×8 Compliance pattern 0.25 0.25 0.25 UI
Total jitter at 5 Gbps
(Gen2)×1, ×4, and ×8 (14) Compliance pattern 0.25 0.25 UI
PCI Express Receiver Jitter Tolerance (6)
Total jitter at 2.5 Gbps
(Gen1) Compliance pattern > 0.6 > 0.6 UI
Total jitter at 5 Gbps (Gen2) Compliance pattern Compliant Compliant Compliant UI
PCI Express (Gen 1) Electrical Idle Detect Threshold
VRX-IDLE-DETDIFFp-p (15) Compliance pattern 65 175 65 175 65 175 UI
Serial RapidIO Transmit Jitter Generation (7)
Deterministic jitter
(peak-to-peak)
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
0.17 0.17 0.17 UI
Total jitter (peak-to-peak)
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
0.35 0.35 0.35 UI
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 2 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–33
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Serial RapidIO Receiver Jitter Tolerance (7)
Deterministic jitter tolerance
(peak-to-peak)
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
> 0.37 > 0.37 > 0.37 UI
Combined deterministic and
random jitter tolerance
(peak-to-peak)
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
> 0.55 > 0.55 > 0.55 UI
Sinusoidal jitter tolerance
(peak-to-peak)
Jitter Frequency = 22.1 KHz
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
> 8.5 > 8.5 > 8.5 UI
Jitter Frequency = 1.875 MHz
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
> 0.1 > 0.1 > 0.1 UI
Jitter Frequency = 20 MHz
Data Rate = 1.25, 2.5,
3.125 Gbps
Pattern = CJPAT
> 0.1 > 0.1 > 0.1 UI
GIGE Transmit Jitter Generation (8)
Deterministic jitter
(peak-to-peak) Pattern = CRPAT 0.14 0.14 0.14 UI
Total jitter (peak-to-peak) Pattern = CRPAT 0.279 0.279 0.279 UI
GIGE Receiver Jitter Tolerance (8)
Deterministic jitter tolerance
(peak-to-peak) Pattern = CJPAT > 0.4 > 0.4 > 0.4 UI
Combined deterministic and
random jitter tolerance
(peak-to-peak)
Pattern = CJPAT > 0.66 > 0.66 > 0.66 UI
HiGig Transmit Jitter Generation (9)
Deterministic jitter
(peak-to-peak)
Data Rate = 3.75 Gbps
Pattern = CJPAT ——0.17 UI
Total jitter (peak-to-peak) Data Rate = 3.75 Gbps
Pattern = CJPAT ——0.35 UI
HiGig Receiver Jitter Tolerance (9)
Deterministic jitter tolerance
(peak-to-peak)
Data Rate = 3.75 Gbps
Pattern = CJPAT > 0.37 UI
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 3 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–34
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Combined deterministic and
random jitter tolerance
(peak-to-peak)
Data Rate = 3.75 Gbps
Pattern = CJPAT > 0.65 UI
Sinusoidal jitter tolerance
(peak-to-peak)
Jitter Frequency = 22.1 KHz
Data Rate = 3.75 Gbps
Pattern = CJPAT
> 8.5 UI
Jitter Frequency = 1.875MHz
Data Rate = 3.75 Gbps
Pattern = CJPAT
> 0.1 UI
Jitter Frequency = 20 MHz
Data Rate = 3.75 Gbps
Pattern = CJPAT
> 0.1 UI
(OIF) CEI Transmitter Jitter Generation (10)
Total jitter (peak-to-peak) Data Rate = 6.375 Gbps
Pattern = PRBS15 BER = 10-12 —— 0.3 N/A N/A UI
(OIF) CEI Receiver Jitter Tolerance (10)
Deterministic jitter tolerance
(peak-to-peak)
Data Rate = 6.375 Gbps
Pattern = PRBS31 BER = 10-12 > 0.675 N/A N/A UI
Combined deterministic and
random jitter tolerance
(peak-to-peak)
Data Rate = 6.375 Gbps
Pattern=PRBS31
BER = 10-12
> 0.988 N/A N/A UI
Sinusoidal jitter tolerance
(peak-to-peak)
Jitter Frequency = 38.2 KHz
Data Rate = 6.375 Gbps
Pattern = PRBS31 BER = 10-12
> 5 N/A N/A UI
Jitter Frequency = 3.82 MHz
Data Rate = 6.375 Gbps
Pattern = PRBS31 BER = 10-12
> 0.05 N/A N/A UI
Jitter Frequency = 20 MHz
Data Rate= 6.375 Gbps
Pattern = PRBS31 BER = 10-12
> 0.05 N/A N/A UI
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 4 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–35
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
SDI Transmitter Jitter Generation (11)
Alignment jitter
(peak-to-peak)
Data Rate = 1.485 Gbps (HD)
Pattern = Color Bar
Low-Frequency Roll-Off =
100 KHz
0.2 0.2 0.2 UI
Data Rate = 2.97 Gbps (3G)
Pattern = Color Bar
Low-Frequency Roll-Off =
100 KHz
0.3 0.3 0.3 UI
SDI Receiver Jitter Tolerance (11)
Sinusoidal jitter tolerance
(peak-to-peak)
Jitter Frequency = 15 KHz
Data Rate = 2.97 Gbps (3G)
Pattern = Single Line
Scramble Color Bar
> 2 > 2 > 2 UI
Jitter Frequency = 100 KHz
Data Rate = 2.97 Gbps (3G)
Pattern = Single Line
Scramble Color Bar
> 0.3 > 0.3 > 0.3 UI
Jitter Frequency = 148.5 MHz
Data Rate = 2.97 Gbps (3G)
Pattern = Single Line
Scramble Color Bar
> 0.3 > 0.3 > 0.3 UI
Sinusoidal jitter tolerance
(peak-to-peak)
Jitter Frequency = 20 KHz
Data Rate = 1.485 Gbps (HD)
Pattern = 75% Color Bar
> 1 > 1 > 1 UI
Jitter Frequency = 100 KHz
Data Rate = 1.485 Gbps (HD)
Pattern = 75% Color Bar
> 0.2 > 0.2 > 0.2 UI
Jitter Frequency = 148.5 MHz
Data Rate = 1.485 Gbps (HD)
Pattern = 75% Color Bar
> 0.2 > 0.2 > 0.2 UI
SAS Transmit Jitter Generation (16)
To tal j it ter at 1.5 G bps (G1) Pattern = CJPAT 0.55 0.55 0.55 UI
Dete rminis tic j itt e r at
1. 5 Gbps (G1) Pattern = CJPAT 0.35 0.35 0.35 UI
To tal j it ter at 3.0 G bps (G2) Pattern = CJPAT 0.55 0.55 0.55 UI
Dete rminis tic j itt e r at
3. 0 Gbps (G2) Pattern = CJPAT 0.35 0.35 0.35 UI
SAS Receiver Jitter Tolerance (16)
Tot al Jit ter tolerance at
1. 5 Gbps (G1) Pattern = CJPAT > 0.65 > 0.65 > 0.65 UI
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 5 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–36
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Deterministic Jitter tolerance
at 1. 5 Gbps (G 1) Pattern = CJPAT > 0.35 > 0.35 > 0.35 UI
Sinusoidal Jit ter tolerance at
1. 5 Gbps (G1) Jitter Frequency = 900 KHz -
5MHz
Pattern = CJTPAT BER = 1E-12
> 0.1 > 0.1 > 0.1 UI
CPRI Transmit Jitter Generation (17)
Total Jitter
E.6.HV, E.12.HV
Pattern = CJPAT 0.279 0.279 0.279 UI
E.6.LV, E.12.LV, E.24.LV,
E.30.LV
Pattern = CJTPAT
0.35 0.35 0.35 UI
Deterministic Jitter
E.6.HV, E.12.HV
Pattern = CJPAT 0.14 0.14 0.14 UI
E.6.LV, E.12.LV, E.24.LV,
E.30.LV
Pattern = CJTPAT
0.17 0.17 0.17 UI
CPRI Receiver Jitter Tolerance (17)
Tot al ji tter t olerance E.6.HV, E.12.HV
Pattern = CJPAT > 0.66 > 0.66 > 0.66 UI
Determinis tic jitte r t olera n c e E.6.HV, E.12.HV
Pattern = CJPAT > 0.4 > 0.4 > 0.4 UI
Tot al ji tter t olerance E.6.LV, E.12.LV, E.24.LV,
E.30.LV
Pattern = CJTPAT
> 0.65 > 0.65 > 0.65 UI
Determinis tic jitte r t olera n c e E.6.LV, E.12.LV, E.24.LV,
E.30.LV
Pattern = CJTPAT
> 0.37 > 0.37 > 0.37 UI
C omb ined determini stic and
random ji tter t oleranc e E.6.LV, E.12.LV, E.24.LV,
E.30.LV
Pattern = CJTPAT
> 0.55 > 0.55 > 0.55 UI
OBSAI Transmit Jitter Generation (18)
To tal j it ter at 768 Mbps,
1536 Mbps, and 3072 Mbps REFCLK = 153.6MHz
Pattern = CJPAT 0.35 0.35 0.35 UI
Dete rminis tic j itt e r at
768 Mbps, 1536 Mbps, and
3072 Mbps
REFCLK = 153.6MHz
Pattern = CJPAT 0.17 0.17 0.17 UI
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 6 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–37
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
OBSAI Receiver Jitter Tolerance (18)
Determinis tic jitte r t olera n c e
at 768 Mbps, 1536 Mbps, and
3072 Mbps Pattern = CJPAT > 0.37 > 0.37 > 0.37 UI
C omb ined determini stic and
random ji tter t oleranc e at
768 Mbps, 1536 Mbps, and
3072 Mbps
Pattern = CJPAT > 0.55 > 0.55 > 0.55 UI
Sinusoidal Jitter tolerance at
768 Mbps
Jitter Frequency = 5.4 KHz
Pattern = CJPAT > 8.5 > 8.5 > 8.5 UI
Jitter Frequency = 460 MHz -
20 MHz
Pattern = CJPAT
> 0.1 > 0.1 > 0.1 UI
Sinusoidal Jitter tolerance at
1536 Mbps
Jitter Frequency = 10.9 KHz
Pattern = CJPAT > 8.5 > 8.5 > 8.5 UI
Jitter Frequency = 921.6 MHz
- 20 MHz
Pattern = CJPAT
> 0.1 > 0.1 > 0.1 UI
Sinusoidal Jitter tolerance at
3072 Mbps
Jitter Frequency = 21.8 KHz
Pattern = CJPAT > 8.5 > 8.5 > 8.5 UI
Jitter Frequency =
1843.2 MHz - 20 MHz
Pattern = CJPAT
> 0.1 > 0.1 > 0.1 UI
Notes to Ta bl e 1 29 :
(1) Dedicated refclk pins were used to drive the input reference clocks.
(2) The Jitter numbers are valid for the stated conditions only.
(3) The jitter numbers for SONET/SDH are compliant to the GR-253-CORE Issue 3 Specification.
(4) The jitter numbers for Fibre Channel are compliant to the FC-PI-4 Specification revision 6.10.
(5) The jitter numbers for XAUI are compliant to the IEEE802.3ae-2002 Specification.
(6) The jitter numbers for PCI Express are compliant to the PCIe Base Specification 2.0.
(7) The jitter numbers for Serial RapidIO are compliant to the RapidIO Specification 1.3.
(8) The jitter numbers for GIGE are compliant to the IEEE802.3-2002 Specification.
(9) The jitter numbers for HiGig are compliant to the IEEE802.3ae-2002 Specification.
(10) The jitter numbers for (OIF) CEI are compliant to the OIF-CEI-02.0 Specification.
(11) The HD-SDI and 3G-SDI jitter numbers are compliant to the SMPTE292M and SMPTE424M Specifications.
(12) The fibre channel transmitter jitter generation numbers are compliant to the specification at δT interoperability point.
(13) The fibre channel receiver jitter tolerance numbers are compliant to the specification at δR interoperability point.
(14) You must use the ATX PLL adjacent to the transceiver channels to meet the transmitter jitter generation compliance in PCI Express Gen2 ×8 modes.
(15) Stratix IV PCI Express receivers are compliant to this specification provided the VTX-CM-DC-ACTIVEIDLE-DELTA of the upstream transmitter is less than
50mV.
(16) The jitter numbers for Serial Attached SCSI (SAS) are compliant to the SAS-2.1 Specification.
(17) The jitter numbers for CPRI are compliant to the CPRI Specification V3.0.
(18) The jitter numbers for OBSAI are compliant to the OBSAI RP3 Specification V4.1.
Table 1–29. Transceiver Block Jitter Specifications for Stratix IV GX Devices (Note 1), (2) (Part 7 of 7)
Symbol/
Description Conditions
2 Commercial
Speed Grade
–3 Commercial/
Industrial and
–2× Commercial
Speed Grade
–4 Commercial/
Industrial Speed
Grade Unit
Min Typ Max Min Typ Max Min Typ Max
Chapter 1: DC and Switching Characteristics 1–38
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–30 lists transceiver jitter specifications for protocols supported by
Stratix IV GT devices.
Transceiver Datapath PCS Latency
fFor more information about:
Basic mode PCS latency, refer to Figure 1-90 through Figure 1-97 in the Stratix IV
Transceiver Architecture chapter.
PCI Express (PIPE) mode PCS latency, refer to Figure 1-102 in the Stratix IV
Transceiver Architecture chapter.
XAUI mode PCS latency, refer to Figure 1-119 in the Stratix IV Transceiver
Architecture chapter.
GIGE mode PCS latency, refer to Figure 1-128 in the Stratix IV Transceiver
Architecture chapter.
SONET/SDH mode PCS latency, refer to Figure 1-136 in the Stratix IV Transceiver
Architecture chapter.
SDI mode PCS latency, refer to Figure 1-141 in the Stratix IV Transceiver Architecture
chapter.
(OIF) CEI PHY mode PCS latency, refer to Figure 1-143 in the Stratix IV Transceiver
Architecture chapter.
Table 1–30. Transceiver Jitter Specifications for Protocols by Stratix IV GT Devices
Symbol/
Description Conditions
-1 Industrial Speed Grad -2 Industrial Speed Grade -3 Industrial Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
XLAUI/CAUI Transmit Jitter Generation (1)
Total Jitter Pattern = PRBS-
31 0.32 0.32 0.32 UI
Deterministic
Jitter
Pattern = PRBS-
31 0.17 0.17 0.17 UI
XLAUI/CAUI Receiver Jitter Tolerance (1)
Sinusoidal Jitter
tolerance
Jitter Frequency
= 40 KHz
Pattern = PRBS-
31 BER = 1E-12
> 5 > 5 UI
Jitter Frequency
= 4 MHz
Pattern = PRBS-
31
BER = 1E-12
> 0.05 > 0.05 UI
Note to Tab l e 130:
(1) The jitter numbers for XLAUI/CAUI are compliant to the IEEE P802.3ba specification.
Chapter 1: DC and Switching Characteristics 1–39
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Core Performance Specifications
This section describes the clock tree, phase-locked loop (PLL), digital signal
processing (DSP), TriMatrix, configuration, and JTAG specifications.
Clock Tree Specifications
Table 1–31 lists the clock tree specifications for Stratix IV devices.
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
PLL Specifications
Table 1–32 describes the Stratix IV PLL specifications when operating in both the
commercial junction temperature range (0° to 85°C) and the industrial junction
temperature range (-40° to 100°C).
Table 1–31. Clock Tree Performance for Stratix IV Devices—Preliminary
Performance Unit
Symbol 2/–2× Speed Grade 3 Speed Grade 4 Speed Grade
GCLK and RCLK 800 700 500 MHz
PCLK 550 500 450 MHz
Table 1–32. PLL Specifications for Stratix IV Devices (Part 1 of 3)—Preliminary
Symbol Parameter Min Typ Max Unit
fIN
Input clock frequency (–2/–2x speed grade) 5 800 (1) MHz
Input clock frequency (–3 speed grade) 5 717 (1) MHz
Input clock frequency (–4 speed grade) 5 717 (1) MHz
fINPFD Input frequency to the PFD 5— 325 MHz
fVCO
PLL VCO operating range (–2 speed grade) 600 1600 MHz
PLL VCO operating range (–3 speed grade) 600 1300 MHz
PLL VCO operating range (–4 speed grade) 600 1300 MHz
tEINDUTY Input clock or external feedback clock input duty cycle 40 60 %
fOUT
Output frequency for internal global or regional clock
(–2/–2x speed grade) ——800 (2) MHz
Output frequency for internal global or regional clock
(–3 speed grade) ——717 (2) MHz
Output frequency for internal global or regional clock
(–4 speed grade) ——717 (2) MHz
fOUT_EXT
Output frequency for external clock output (–2 speed grade) ——800 (2) MHz
Output frequency for external clock output (–3 speed grade) ——717 (2) MHz
Output frequency for external clock output (–4 speed grade) ——717 (2) MHz
tOUTDUTY Duty cycle for external clock output (when set to 50%) 45 50 55 %
tFCOMP External feedback clock compensation time 10 ns
tCONFIGPLL Time required to reconfigure scan chain —3.5 scanclk
cycles
1–40 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
tCONFIGPHASE Time required to reconfigure phase shift —1 scanclk
cycles
fSCANCLK scanclk frequency —— 100 MHz
tLOCK
Time required to lock from end-of-device configuration or
de-assertion of areset —— 1 ms
tDLOCK
Time required to lock dynamically (after switchover or
reconfiguring any non-post-scale counters/delays) —— 1 ms
fCLBW
PLL closed-loop low bandwidth —0.3 MHz
PLL closed-loop medium bandwidth —1.5 MHz
PLL closed-loop high bandwidth (6) —4 MHz
tPLL_PSERR Accuracy of PLL phase shift —— ±50 ps
tARESET Minimum pulse width on the areset signal 10 ns
tINCCJ (3) Input clock cycle to cycle jitter (FREF 100 MHz) 0.15 UI (p-p)
Input clock cycle to cycle jitter (FREF < 100 MHz) ±750 ps (p-p)
tOUTPJ_DC (4) Period Jitter for dedicated clock output (FOUT 100 MHz) —— 175 ps (p-p)
Period Jitter for dedicated clock output (FOUT < 100 MHz) 17.5 mUI (p-p)
tOUTCCJ_DC (4)
Cycle to Cycle Jitter for dedicated clock output
(FOUT 100 MHz) —— 175 ps (p-p)
Cycle to Cycle Jitter for dedicated clock output
(FOUT <100MHz) 17.5 mUI (p-p)
tOUTPJ_IO (4),
(7)
Period Jitter for clock output on regular I/O
(FOUT 100 MHz) —— 600 ps (p-p)
Period Jitter for clock output on regular I/O
(FOUT <100MHz) 60 mUI (p-p)
tOUTCCJ_IO (4),
(7)
Cycle to Cycle Jitter for clock output on regular I/O
(FOUT 100 MHz) —— 600 ps (p-p)
Cycle to Cycle Jitter for clock output on regular I/O
(FOUT <100MHz) 60 mUI (p-p)
tCASC_OUTPJ_DC
(4), (5)
Period Jitter for dedicated clock output in cascaded PLLs
(FOUT 100MHz) —— 250 ps (p-p)
Period Jitter for dedicated clock output in cascaded PLLs
(FOUT < 100MHz) 25 mUI (p-p)
Table 1–32. PLL Specifications for Stratix IV Devices (Part 2 of 3)—Preliminary
Symbol Parameter Min Typ Max Unit
Chapter 1: DC and Switching Characteristics 1–41
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
tCONFIGPHASE Time required to reconfigure phase shift —1 scanclk
cycles
fSCANCLK scanclk frequency —— 100 MHz
tLOCK
Time required to lock from end-of-device configuration or
de-assertion of areset —— 1 ms
tDLOCK
Time required to lock dynamically (after switchover or
reconfiguring any non-post-scale counters/delays) —— 1 ms
fCLBW
PLL closed-loop low bandwidth —0.3 MHz
PLL closed-loop medium bandwidth —1.5 MHz
PLL closed-loop high bandwidth (6) —4 MHz
tPLL_PSERR Accuracy of PLL phase shift —— ±50 ps
tARESET Minimum pulse width on the areset signal 10 ns
tINCCJ (3) Input clock cycle to cycle jitter (FREF 100 MHz) 0.15 UI (p-p)
Input clock cycle to cycle jitter (FREF < 100 MHz) ±750 ps (p-p)
tOUTPJ_DC (4) Period Jitter for dedicated clock output (FOUT 100 MHz) —— 175 ps (p-p)
Period Jitter for dedicated clock output (FOUT < 100 MHz) 17.5 mUI (p-p)
tOUTCCJ_DC (4)
Cycle to Cycle Jitter for dedicated clock output
(FOUT 100 MHz) —— 175 ps (p-p)
Cycle to Cycle Jitter for dedicated clock output
(FOUT <100MHz) 17.5 mUI (p-p)
tOUTPJ_IO (4),
(7)
Period Jitter for clock output on regular I/O
(FOUT 100 MHz) —— 600 ps (p-p)
Period Jitter for clock output on regular I/O
(FOUT <100MHz) 60 mUI (p-p)
tOUTCCJ_IO (4),
(7)
Cycle to Cycle Jitter for clock output on regular I/O
(FOUT 100 MHz) —— 600 ps (p-p)
Cycle to Cycle Jitter for clock output on regular I/O
(FOUT <100MHz) 60 mUI (p-p)
tCASC_OUTPJ_DC
(4), (5)
Period Jitter for dedicated clock output in cascaded PLLs
(FOUT 100MHz) —— 250 ps (p-p)
Period Jitter for dedicated clock output in cascaded PLLs
(FOUT < 100MHz) 25 mUI (p-p)
Table 1–32. PLL Specifications for Stratix IV Devices (Part 2 of 3)—Preliminary
Symbol Parameter Min Typ Max Unit
1–42 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
DSP Block Specifications
Table 1–33 shows the Stratix IV DSP block performance specifications.
fDRIFT
Frequency drift after PFDENA is disabled for duration of
100 us —— ±10 %
Notes to Ta bl e 1 32 :
(1) This specification is limited in the Quartus II software by the I/O maximum frequency. The maximum I/O frequency is different for each I/O
standard.
(2) This specification is limited by the lower of the two: I/O FMA X or FOUT of the PLL.
(3) A high input jitter directly affects the PLL output jitter. To have low PLL output clock jitter, you need to provide a clean clock source that is less
than 120 ps.
(4) Peak-to-peak jitter with a probability level of 10–12 (14 sigma, 99.99999999974404 % confidence level). The output jitter specification applies
to the intrinsic jitter of the PLL, when an input jitter of 30 ps is applied. The external memory interface clock output jitter specifications use a
different measurement method and are available in Table 1–47 on page 1–52.
(5) The cascaded PLL specification is only applicable with the following condition:
a. Upstream PLL: 0.59Mhz Upstream PLL BW < 1 MHz
b. Downstream PLL: Downstream PLL BW > 2 MHz
(6) High bandwidth PLL settings are not supported in external feedback mode.
(7) External memory interface clock output jitter specifications use a different measurement method, which is available in Table 1–45 on
page 1–52.
Table 1–32. PLL Specifications for Stratix IV Devices (Part 3 of 3)—Preliminary
Symbol Parameter Min Typ Max Unit
Table 1–33. Block Performance Specifications for Stratix IV DSP Devices (Note 1)—Preliminary
Mode
Resources
Used Performance
Unit
Number of
Multipliers
–2/
Speed Grade
–3
Speed Grade
–4
Speed Grade
9×9-bit multiplier 1 520 460 400 MHz
12×12-bit multiplier 1 540 500 440 MHz
18×18-bit multiplier 1 600 550 480 MHz
36×36-bit multiplier 1 480 440 380 MHz
18×18-bit multiply accumulator 4 490 440 380 MHz
18×18-bit multiply adder 4 510 470 410 MHz
18×18-bit multiply adder-signed full precision 2 490 450 390 MHz
18×18-bit multiply adder with loopback (2) 2 390 350 310 MHz
36-bit shift (32-bit data) 1 490 440 380 MHz
Double mode 1 480 440 380 MHz
Notes to Ta bl e 1 33 :
(1) Maximum is for fully pipelined block with Round and Saturation disabled.
(2) Maximum for loopback input registers disabled, Round and Saturation disabled, and pipeline and output registers enabled.
Chapter 1: DC and Switching Characteristics 1–43
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
TriMatrix Memory Block Specifications
Table 1–34 lists the Stratix IV TriMatrix memory block specifications.
Table 1–34. TriMatrix Memory Block Performance Specifications for Stratix IV Devices—Preliminary (Note 1) (Part 1 of 2)
Memory Mode
Resources Used Performance
ALUTs TriMatrix
Memory
2 /–
Commercial/
Industrial
Speed Grade
(MHz)
–3
Commercial/
Industrial
Speed Grade
(MHz)
–4
Commercial/
Industrial
Speed Grade
(MHz)
–3
Industrial
Speed Grade
(MHz) (2)
–4
Industrial
Speed Grade
(MHz) (2)
MLAB
(3)
Single port 64×10 0 1 600 500 450 500 450
Simple dual-port
32×20 0 1 600 500 450 500 450
Simple dual-port
64×10 0 1 600 500 450 500 450
ROM 64×10 0 1 600 500 450 500 450
ROM 32×20 0 1 600 500 450 500 450
M9K
Block (3)
Single-port 2536 0 1 600 540 475 540 475
Simple dual-port
2536 0 1 550 490 420 490 420
Simple dual-port
2536, with the
read-during-write
option set to Old Data
0 1 375 340 300 340 300
True dual port 5118 0 1 490 430 370 430 370
True dual-port 5118,
with the read-during-
write option set to Old
Data
0 1 375 335 290 335 290
ROM 1 Port 0 1 600 540 475 540 475
ROM 2 Port 0 1 600 540 475 540 475
Min Pulse Width (clock
high time) 750 800 850 800 850
Min Pulse Width (clock
low time) 500 625 690 625 690
1–44 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
Configuration and JTAG Specifications
Table 1–35 lists the Stratix IV configuration mode specifications.
M144K
(3)
Single-port 2K×72 0 1 475 440 380 400 350
Simple dual-port
2K×72 0 1 465 435 385 375 325
Simple dual-port
2K×72, with the
read-during-write
option set to Old Data
0 1 260 240 205 225 200
Simple dual-port
2K×64 (with ECC) 0 1 335 300 255 295 250
True dual-port 4K×36 0 1 400 375 330 350 310
True dual-port 4K×36,
with the read-during-
write option set to Old
Data
0 1 245 230 205 225 200
ROM 1 Port 0 1 540 500 435 450 420
ROM 2 Port 0 1 500 465 400 425 400
Min Pulse Width (clock
high time) 700 755 860 860 950
Min Pulse Width (clock
low time) 500 625 690 690 690
Notes to Ta bl e 1 34 :
(1) To achieve the maximum memory block performance, use a memory block clock that comes through global clock routing from an on-chip PLL
set to 50% output duty cycle. Use the Quartus II software to report timing for this and other memory block clocking schemes.
(2) This is only applicable to the Stratix IV E and GX devices.
(3) When you use the error detection CRC feature, there is no degradation in FMA X.
Table 1–34. TriMatrix Memory Block Performance Specifications for Stratix IV Devices—Preliminary (Note 1) (Part 2 of 2)
Memory Mode
Resources Used Performance
ALUTs TriMatrix
Memory
2 /–
Commercial/
Industrial
Speed Grade
(MHz)
–3
Commercial/
Industrial
Speed Grade
(MHz)
–4
Commercial/
Industrial
Speed Grade
(MHz)
–3
Industrial
Speed Grade
(MHz) (2)
–4
Industrial
Speed Grade
(MHz) (2)
Table 1–35. Configuration Mode Specifications for Stratix IV Devices—Preliminary
Programming Mode DCLK FMAX Unit
Passive serial 125 MHz
Fast passive parallel 125 MHz
Fast active serial 40 MHz
Remote update only in fast AS mode 10 MHz
Chapter 1: DC and Switching Characteristics 1–45
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–36 shows the JTAG timing parameters and values for Stratix IV devices.
Temperature Sensing Diode Specifications
Table 1–37 lists the specifications for the Stratix IV temperature sensing diode.
Periphery Performance
This section describes periphery performance, including high-speed I/O and external
memory interface.
I/O performance supports several system interfaces, such as the LVDS high-speed
I/O interface, external memory interface, and the PCI/PCI-X bus interface.
General-purpose I/O standards such as 3.3-, 2.5-, 1.8-, and 1.5-LVTTL/LVCMOS are
capable of typical 167 MHz and 1.2 LVCMOS at 100 MHz interfacing frequency with
10 pF load.
1Actual achievable frequency depends on design- and system-specific factors. You
need to perform HSPICE/IBIS simulations based on your specific design and system
setup to determine the maximum achievable frequency in your system.
Table 1–36. JTAG Timing Parameters and Values for Stratix IV Devices Preliminary
Symbol Description Min Max Unit
tJCP TCK clock period 30 ns
tJCH TCK clock high time 14 ns
tJCL TCK clock low time 14 ns
tJPSU (TDI) TDI JTAG port setup time 1—ns
tJPSU (TMS) TMS JTAG port setup time 3—ns
tJPH JTAG port hold time 5—ns
tJPCO JTAG port clock to output —11 (1) ns
tJPZX JTAG port high impedance to valid output —14 (1) ns
tJPXZ JTAG port valid output to high impedance —14 (1) ns
Note to Tab l e 136:
(1) A 1 ns adder is required for each VCC IO voltage step down from 3.0 V. For example, tJPC O = 12 ns if VCCIO
of the TDO
I/O bank = 2.5 V, or 13 ns if it equals 1.8 V.
Table 1–37. External Temperature Sensing Diode Specifications—Preliminary
Description Min Typ Max Unit
Ibias, diode source current 8 —500μA
Vbias, voltage across diode 0.3 —0.9V
Series resistance —< 5Ω
Diode ideality factor —1.030
1–46 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
High-Speed I/O Specification
Table 1–38 shows high-speed I/O timing for Stratix IV devices.
Table 1–38. High-Speed I/O Specifications (Note 1), (2), (10) (Part 1 of 2)—Preliminary
Symbol Conditions –2/ Speed Grade –3 Speed Grade –4 Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
fHSCLK_in
(input clock
frequency) True
Differential I/O
Standards
Clock boost factor W = 1 to 40
(3) 5 800 5 717 5 717 MHz
fHSCLK_in (input clock
frequency) Single
Ended I/O
Standards (9)
Clock boost factor W = 1 to 40
(3) 5 800 5 717 5 717 MHz
fHSCLK_in (input clock
frequency) Single
Ended I/O
Standards (9)
Clock boost factor W = 1 to 40
(3) 5 520 5 420 5 420 MHz
fHSCLK_OUT (output
clock frequency) 5—800
(7) 5—
717
(7) 5—717
(7) MHz
Transmitter
True Differential I/O
Standards - fHSDR
(data rate)
SERDES factor J = 3 to 10 (8) (4) —1600(4) —1250(4) 1250 Mbps
SERDES factor J = 2, Uses DDR
Registers (4) (4) (4) (4) (4) (4) Mbps
SERDES factor J = 1, Uses SDR
Register (4) (4) (4) (4) (4) (4) Mbps
Emulated
Differential I/O
Standards with
Three External
Output Resistor
Networks - fHSDR
(data rate) (5) SERDES factor J = 4 to 10
(4) —1250(4) —1152(4) —800Mbps
Emulated
Differential I/O
Standards with One
External Output
Resistor - fHSDR
(data rate)
(4) —311(4) —200(4) —200Mbps
tx Jitter - True
Differential I/O
Standards
Total Jitter for Data Rate,
600 Mbps - 1.6 Gbps 160 160 160 ps
Total Jitter for Data Rate,
< 600 Mbps —— 0.1 —— 0.1 —— 0.1 UI
tx Jitter - Emulated
Differential I/O
Standards with Three
External Output
Resistor Network
Total Jitter for Data Rate,
600 Mbps - 1.25 Gbps 300 300 325 ps
Total Jitter for Data Rate
< 600 Mbps —— 0.2 —— 0.2 ——0.25 UI
Chapter 1: DC and Switching Characteristics 1–47
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
tx Jitter - Emulated
Differential I/O
Standards with One
External Output
Resistor Network
0.125 0.15 0.15 UI
tDUTY
Tx output clock duty cycle for
both True and Emulated
Differential I/O Standards
45 50 55 45 50 55 45 50 55 %
tRISE & tFALL
True Differential I/O Standards 160 200 200 ps
Emulated Differential I/O
Standards with Three External
Output Resistor Networks
250 250 300 ps
Emulated Differential I/O
Standards with One External
Output Resistor
460 500 500 ps
TCCS
True Differential I/O Standards 100 100 100 ps
Emulated Differential I/o
Standards 250 250 250 ps
Receiver
True Differential I/O
Standards - fHSDRDPA
(data rate)
SERDES factor J = 3 to 10 150 1600 150 1250 150 1250 Mbps
fHSDR (data rate) SERDES factor J = 3 to 10 (4) (6) (4) (6) (4) (6) Mbps
DPA Mode
DPA run length 10000 10000 10000 UI
Soft CDR mode
Soft-CDR PPM
tolerance 300 300 300 ±
PPM
Non DPA Mode
Sampling Window 300 300 300 ps
Notes to Ta bl e 1 38 :
(1) When J = 3 to 10, use the SERDES block.
(2) When J = 1 or 2, bypass the SERDES block.
(3) Clock Boost Factor (W) is the ratio between input data rate to the input clock rate.
(4) The minimum specification depends on the clock source (for example, PLL and clock pin) and the clock routing resource (global, regional, or local) that
you use. The I/O differential buffer and input register do not have a minimum toggle rate.
(5) You must calculate the leftover timing margin in the receiver by performing link timing closure analysis. You must consider the board skew margin,
transmitter channel-to-channel skew, and receiver sampling margin to determine leftover timing margin.
(6) You can estimate the achievable maximum data rate for non-DPA mode by performing link timing closure analysis. You should consider the board skew
margin, transmitter delay margin, and the receiver sampling margin to determine the maximum data rate supported.
(7) This is achieved by using the LVDS and DPA clock network.
(8) If the receiver with DPA enabled and transmitter are using shared PLLs, the minimum data rate is 150 Mbps.
(9) This only applies to DPA and soft-CDR modes.
(10) This only applies to LVDS source synchronous mode.
Table 1–38. High-Speed I/O Specifications (Note 1), (2), (10) (Part 2 of 2)—Preliminary
Symbol Conditions –2/ Speed Grade –3 Speed Grade –4 Speed Grade Unit
Min Typ Max Min Typ Max Min Typ Max
1–48 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
Table 1–39 lists the DPA lock time specifications for Stratix IV ES devices.
Figure 1–4 shows the DPA lock time specifications with DPA PLL calibration enabled.
Table 1–39. DPA Lock Time Specifications—Stratix IV ES Devices Only (Note 1), (2), (3)
Standard Training Pattern
Number of Data
Transitions in one
repetition of
training pattern
Number of
repetitions
per 256
data
transitions
(4)
Condition Maximum
SPI-4 00000000001111111111 2 128
without DPA PLL
calibration 256 data transitions
with DPA PLL
calibration
3x256 data transitions +
2x96 slow clock cycles (5)
Parallel Rapid I/O
00001111 2 128
without DPA PLL
calibration 256 data transitions
with DPA PLL
calibration
3x256 data transitions +
2x96 slow clock cycles (5)
10010000 4 64
without DPA PLL
calibration 256 data transitions
with DPA PLL
calibration
3x256 data transitions +
2x96 slow clock cycles (5)
Miscellaneous
10101010 8 32
without DPA PLL
calibration 256 data transitions
with DPA PLL
calibration
3x256 data transitions +
2x96 slow clock cycles (5)
01010101 8 32
without DPA PLL
calibration 256 data transitions
with DPA PLL
calibration
3x256 data transitions +
2x96 slow clock cycles (5)
Notes to Ta bl e 1 39 :
(1) The DPA lock time is for one channel.
(2) One data transition is defined as a 0-to-1 or 1-to-0 transition.
(3) The DPA lock time applies to both commercial and industrial grade.
(4) This is the number of repetition for the stated training pattern to achieve 256 data transitions.
(5) Slow clock = Data rate (Mbps)/Deserialization factor.
Figure 1–4. DPA Lock Time Specification with DPA PLL Calibration Enabled
rx_dpa_locked
rx_reset
DPA Lock Time
256 data
transitions 96 slow
clock cycles 256 data
transitions 256 data
transitions
96 slow
clock cycles
Chapter 1: DC and Switching Characteristics 1–49
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Table 1–40 lists the DPA lock time specifications for Stratix IV GX adn GT devices.
Figure 1–5 shows the LVDS soft-CDR/DPA sinusoidal jitter tolerance specification for
a data rate equal to or higher than 1.25 Gbps. Table 1–41 lists this information in table
form.
Table 1–40. DPA Lock Time Specifications—Stratix IV GX and GT Devices Only (Note 1), (2), (3)
Standard Training Pattern
Number of Data
Transitions in One
Repetition of the
Training Pattern
Number of Repetitions
per 256 Data Transitions
(4)
Maximum
SPI-4 00000000001111111111 2 128 640 data transitions
Parallel Rapid I/O 00001111 2 128 640 data transitions
10010000 4 64 640 data transitions
Miscellaneous 10101010 8 32 640 data transitions
01010101 8 32 640 data transitions
Notes to Ta bl e 1 40 :
(1) The DPA lock time is for one channel.
(2) One data transition is defined as a 0-to-1 or 1-to-0 transition.
(3) The DPA lock time stated in the table applies to both commercial and industrial grade.
(4) This is the number of repetitions for the stated training pattern to achieve the 256 data transitions.
Figure 1–5. LVDS Soft-CDR/DPA Sinusoidal Jitter Tolerance Specification for a Data Rate Equal to or Higher Than 1.25 Gbps
LVDS Soft-CDR/DPA Sinusoidal Jitter Tolerance Specification
F1 F2 F3 F4
Jitter Frequency (Hz)
Jitter Amphlitude (UI)
0.1
0.35
8.5
25
1–50 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Table 1–41 lists the LVDS soft-CDR/DPA sinusoidal jitter tolerance specification for a
data rate equal to or higher than 1.25 Gbps.
Figure 1–6 shows the LVDS soft-CDR/DPA sinusoidal jitter tolerance specification for
a data rate less than 1.25 Gbps.
DLL and DQS Logic Block Specifications
Table 1–42 lists the DLL frequency range specifications for Stratix IV devices.
Table 1–41. LVDS Soft-CDR/DPA Sinusoidal Jitter Mask Values for a Data Rate Equal to or Higher
than 1.25 Gbps
Jitter Frequency (Hz) Sinusoidal Jitter (UI)
F1 10,000 25.000
F2 17,565 25.000
F3 1,493,000 0.350
F4 50,000,000 0.350
Figure 1–6. LVDS Soft-CDR/DPA Sinusoidal Jitter Tolerance Specification for a Data Rate Less than 1.25 Gbps
0.1 UI P-P
data rate/1667 20 MHz Frequency
Sinusoidal Jitter Amplitude
20db/dec
Table 1–42. DLL Frequency Range Specifications for Stratix IV DevicesPreliminary (Part 1 of 2)
Frequency
Mode
Frequency Range (MHz)
Available Phase Shift
DQS Delay
Buffer
Mode (1)
Number
of Delay
Chains
2/– Speed
Grade
–3 Speed
Grade
–4 Speed
Grade
0 90-140 90-130 90-120 22.5°, 45°, 67.5°, 9 Low 16
1 120-180 120-170 120-160 30°, 6, 90°, 12 Low 12
2 150-220 150-210 150-200 36°, 72°, 108°, 14 Low 10
3 180-280 180-260 180-240 45°, 90°,135°, 18 Low 8
4 240-350 240-320 240-290 30°, 6, 90°, 12 High 12
5 290-430 290-380 290-360 36°, 72°, 108°, 14 High 10
6 360-540 360-450 360-450 45°, 90°, 135°, 18 High 8
Chapter 1: DC and Switching Characteristics 1–51
Switching Characteristics
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
Table 1–43 describes the DQS phase offset delay per stage for Stratix IV devices.
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
Table 1–44 lists the DQS phase shift error for Stratix IV devices.
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
7 470-700 470-630 470-590 60°, 12, 180°, 240° High 6
Note to Tab l e 142:
(1) Low indicates a 6-bit DQS delay setting; high indicates a 5-bit DQS delay setting.
Table 1–42. DLL Frequency Range Specifications for Stratix IV DevicesPreliminary (Part 2 of 2)
Frequency
Mode
Frequency Range (MHz)
Available Phase Shift
DQS Delay
Buffer
Mode (1)
Number
of Delay
Chains
2/– Speed
Grade
–3 Speed
Grade
–4 Speed
Grade
Table 1–43. DQS Phase Offset Delay Per Setting for Stratix IV Devices (Note 1), (2), (3)
Speed Grade Min Max Unit
–2/–2× 7 13 ps
–3 7 15 ps
–4 7 16 ps
Notes to Ta bl e 1 43 :
(1) The valid settings for phase offset are -64 to +63 for frequency modes 0 to 3 and -32 to +31 for frequency modes
4 to 6.
(2) The typical value equals the average of the minimum and maximum values.
(3) The delay settings are linear, with a cumulative delay variation of 40 ps for all speed grades. For example, when
using a –2 speed grade and applying a 10 phase offset settings to a 90° phase shift at 400 MHz, the expected
average cumulative delay is [625 ps + (10 × 10.5 ps) ± 20 ps] = 730 ps ± 20 ps.
Table 1–44. DQS Phase Shift Error Specification for DLL-Delayed Clock (tDQS_PSERR) for Stratix IV
Devices (Note 1)
Number of DQS Delay Buffer 2/2X Speed Grade 3 Speed Grade –4 Speed Grade Unit
1262830ps
2525660ps
3788490ps
4 104 112 120 ps
Note to Tab l e 144:
(1) This error specification is the absolute maximum and minimum error. For example, skew on three DQS delay
buffers in a –2/–2x speed grade is ± 78 ps or ± 39 ps.
1–52 Chapter 1: DC and Switching Characteristics
Switching Characteristics
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Table 1–45 lists the memory output clock jitter specifcations for Stratix IV devices.
1For the Stratix IV GT –1 and –2 speed grade specifications, refer to the –2/–2× speed
grade column. For the Stratix IV GT –3 speed grade specifcation, refer to the –3 speed
grade column.
OCT Calibration Block Specifications
Table 1–46 lists the OCT calibration block specifications for Stratix IV devices.
Duty Cycle Distortion (DCD) Specifications
Table 1–47 lists the worst-case DCD for Stratix IV devices.
Table 1–45. Memory Output Clock Jitter Specification for Stratix IV Devices (Note 1), (2), (3)
Parameter Clock
Network Symbol
–2/–2X Speed Grade –3 Speed Grade –4 Speed Grade
Unit
Min Max Min Max Min Max
Clock period jitter Regional tJIT(per) -75 75 -85 85 -100 100 ps
Cycle-to-cycle period jitter Regional tJIT(cc) -150 150 -170 170 -190 190 ps
Duty cycle jitter Regional tJIT(duty) -80 80 -90 90 -100 100 ps
Clock period jitter Global tJIT(per) -113 113 -128 128 -150 150 ps
Cycle-to-cycle period jitter Global tJIT(cc) -225 225 -255 255 -285 285 ps
Duty cycle jitter Global tJIT(duty) -120 120 -135 135 -150 150 ps
Notes to Table 1 45 :
(1) The memory output clock jitter measurements are for 200 consecutive clock cycles, as specified in the JEDEC DDR2/DDR3 SDRAM standard.
(2) The clock jitter specification applies to memory output clock pins generated using differential signal-splitter and DDIO circuits clocked by a PLL
output routed on a regional or global clock network as specified. Altera recommends using regional clock networks whenever possible.
(3) The memory output clock jitter stated in Table 1–45 is applicable when an input jitter of 30 ps is applied.
Table 1–46. OCT Calibration Block Specifications for Stratix IV Devices
Symbol Description Min Typ Max Unit
OCTUSRCLK Clock required by OCT calibration blocks ——20MHz
TOCTCAL
Number of OCTUSRCLK clock cycles required for OCT RS/RT
calibration —1000Cycles
TOCTSHIFT
Number of OCTUSRCLK clock cycles required for OCT code
to shift out —28—Cycles
TRS_RT
Time required between the dyn_term_ctrl and oe signal
transitions in a bidirectional I/O buffer to dynamically switch
between OCT RS and RT
—2.5— ns
Table 1–47. Worst-Case DCD on Stratix IV I/O Pins
Symbol 2/–2× Speed Grade –3 Speed Grade –4 Speed Grade Unit
Min Max Min Max Min Max
Output Duty Cycle 45 55 45 55 45 55 %
Chapter 1: DC and Switching Characteristics 1–53
I/O Timing
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
I/O Timing
Altera offers two ways to determine I/O timing: the Excel-based I/O Timing and the
Quartus II Timing Analyzer.
Excel-based I/O Timing provides pin timing performance for each device density and
speed grade. The data is typically used prior to designing the FPGA to get an estimate
of the timing budget as part of the link timing analysis. The Quartus II Timing
Analyzer provides a more accurate and precise I/O timing data based on the specifics
of the design after you complete place-and-route.
fThe Excel-based I/O Timing spreadsheet is downloadable from the Stratix IV Devices
Literature webpage.
Programmable IOE Delay
Table 1–48 shows Stratix IV IOE programmable delay settings.
Programmable Output Buffer Delay
Table 1–49 lists the delay chain settings that control the rising and falling edge delays
of the output buffer. The default delay is 0 ps.
Table 1–48. IOE Programmable Delay for Stratix IV Devices
Parameter
(1)
Available
Settings
Min Offset
(2)
Fast Model Slow Model
Industrial Commercial
(3) C2 (3) C3 C4 I3 I4 Unit
D1 15 0 0.462 0.505 0.732 0.795 0.857 0.801 0.864 ps
D2 7 0 0.234 0.232 0.337 0.372 0.407 0.371 0.405 ps
D3 7 0 1.700 1.769 2.695 2.927 3.157 2.948 3.178 ps
D4 15 0 0.508 0.554 0.813 0.882 0.952 0.889 0.959 ps
D5 15 0 0.473 0.500 0.746 0.812 0.875 0.818 0.882 ps
D6 6 0 0.186 0.195 0.294 0.319 0.345 0.321 0.347 ps
Notes to Ta bl e 1 48 :
(1) You can set this value in the Quartus II software by selecting D1, D2, D3, D4, D5, and D6 in the Assignment Name column.
(2) Minimum offset does not include the intrinsic delay.
(3) For the EP4SGX530 device density, the IOE programmable delays have an additional 5% maximum offset.
Table 1–49. Programmable Output Buffer Delay (Note 1)
Symbol Parameter Typical Unit
DOUTBUF
Rising and/or falling edge
delay
0 (default) ps
50 ps
100 ps
150 ps
Note to Tab l e 149:
(1) You can set the programmable output buffer delay in the Quartus II software by setting the Output Buffer Delay
Control assignment to either positive, negative, or both edges, with the specific values stated here (in ps) for the
Output Buffer Delay assignment.
1–54 Chapter 1: DC and Switching Characteristics
Glossary
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Glossary
Table 1–50 shows the glossary for this chapter.
Table 1–50. Glossary Table (Part 1 of 4)
Letter Subject Definitions
A——
B——
C——
DDifferential I/O
Standards
Receiver Input Waveforms
Transmitter Output Waveforms
E——
F
fHSCLK Left/right PLL input clock frequency.
fHSDR
High-speed I/O block: Maximum/minimum LVDS data transfer rate
(fHSDR = 1/TUI), non-DPA.
fHSDRDPA
High-speed I/O block: Maximum/minimum LVDS data transfer rate
(fHSDRDPA = 1/TUI), DPA.
G——
H——
I——
Single-Ended W aveform
Differential W aveform
Positive Channel (p) = VIH
Negative Channel (n) = VIL
Ground
VID
VID
VID
p n = 0 V
VCM
Single-Ended W aveform
Differential W aveform
Positive Channel (p) = VOH
Negative Channel (n) = VOL
Ground
VOD
VOD
VOD
p n = 0 V
VCM
Chapter 1: DC and Switching Characteristics 1–55
Glossary
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
J
J High-speed I/O block: Deserialization factor (width of parallel data bus).
JTAG Timing
Specifications
JTAG Timing Specifications:
K——
L——
M——
N——
O——
PPLL
Specifications
Diagram of PLL Specifications (1)
Note:
(1) Core Clock can only be fed by dedicated clock input pins or PLL outputs.
Q——
RRLReceiver differential input discrete resistor (external to Stratix IV device).
Table 1–50. Glossary Table (Part 2 of 4)
Letter Subject Definitions
TDO
TCK
tJPZX tJPCO
tJPH
tJPXZ
tJCP tJPSU
tJCL
tJCH
TDI
TMS
1–56 Chapter 1: DC and Switching Characteristics
Glossary
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
S
SW (sampling
window)
Timing Diagram—the period of time during which the data must be valid in order to capture
it correctly. The setup and hold times determine the ideal strobe position within the sampling
window, as shown:
Single-ended
voltage
referenced I/O
standard
The JEDEC standard for SSTl and HSTL I/O defines both the AC and DC input signal values.
The AC values indicate the voltage levels at which the receiver must meet its timing
specifications. The DC values indicate the voltage levels at which the final logic state of the
receiver is unambiguously defined. After the receiver input has crossed the AC value, the
receiver changes to the new logic state.
The new logic state is then maintained as long as the input stays beyond the AC threshold.
This approach is intended to provide predictable receiver timing in the presence of input
waveform ringing, as shown:
Single-Ended Voltage Referenced I/O Standard
T
tCHigh-speed receiver/transmitter input and output clock period.
TCCS (channel-
to-channel-skew)
The timing difference between the fastest and slowest output edges, including tCO variation
and clock skew, across channels driven by the same PLL. The clock is included in the TCCS
measurement (refer to the Timing Diagram figure under SW in this table).
tDUTY
High-speed I/O block: Duty cycle on high-speed transmitter output clock.
Timing Unit Interval (TUI)
The timing budget allowed for skew, propagation delays, and data sampling window.
(TUI = 1/(Receiver Input Clock Frequency Multiplication Factor) = tC/w)
tFALL Signal high-to-low transition time (80-20%)
tINCCJ Cycle-to-cycle jitter tolerance on the PLL clock input
tOUTPJ_IO Period jitter on the general purpose I/O driven by a PLL
tOUTPJ_DC Period jitter on the dedicated clock output driven by a PLL
tRISE Signal low-to-high transition time (20-80%)
U——
Table 1–50. Glossary Table (Part 3 of 4)
Letter Subject Definitions
Bit Time
0.5 x TCCS RSKM Sampling Window
(SW) RSKM 0.5 x TCCS
V
IH(AC)
V
IH(DC)
V
REF V
IL(DC)
V
IL(AC)
V
OH
V
OL
V
CCIO
V
SS
Chapter 1: DC and Switching Characteristics 1–57
Glossary
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
V
VCM(DC) DC Common mode input voltage.
VIC M Input Common mode voltage—The common mode of the differential signal at the receiver.
VID
Input differential voltage swing—The difference in voltage between the positive and
complementary conductors of a differential transmission at the receiver.
VDIF(AC) AC differential input voltageMinimum AC input differential voltage required for switching.
VDIF(DC) DC differential input voltage Minimum DC input differential voltage required for switching.
VIH
Voltage input high—The minimum positive voltage applied to the input which is accepted by
the device as a logic high.
VIH ( AC ) High-level AC input voltage
VIH( D C) High-level DC input voltage
VIL
Voltage input low—The maximum positive voltage applied to the input which is accepted by
the device as a logic low.
VIL(AC) Low-level AC input voltage
VIL( D C) Low-level DC input voltage
VOCM
Output Common mode voltageThe common mode of the differential signal at the
transmitter.
VOD
Output differential voltage swing—The difference in voltage between the positive and
complementary conductors of a differential transmission at the transmitter.
VSWING Differential input voltage
VXInput differential cross point voltage
VOX Output differential cross point voltage
WW High-speed I/O block: Clock Boost Factor
X——
Y——
Z——
Table 1–50. Glossary Table (Part 4 of 4)
Letter Subject Definitions
1–58 Chapter 1: DC and Switching Characteristics
Document Revision History
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Document Revision History
Table 1–51 shows the revision history for this chapter.
Table 1–51. Document Revision History
Date Document Version Changes Made
February 2010 4.1
Updated Ta ble 111, Ta ble 1 22, Table 1–23, Table 124, Table 125,
Table 1–26, Table 1–27, Table 129, Table 131, Table 132, Table 1–33,
Table 1–34, Ta ble 1 38, Table 1–39, Table 142, Table 145, and
Table 1–48.
Added Stratix IV GT speed grade note to Ta ble 1 31 , Table 134,
Table 1–38, Ta ble 1 42, Table 1–43, Table 144, and Table 145.
Added Table 1–28 and Table 130.
Minor text edits.
November 2009 4.0
Added Table 1–9, Table 1–15, Table 1–38, and Table 1–39.
Added Figure 1–5 and Figure 1–6.
Added the “Transceiver Datapath PCS Latency section.
Updated theElectrical Characteristics”,Operating Conditions”, and
“I/O Timing sections.
All tables updated except Table 1–16, Table 1–24, Table 1–25,
Table 1–26, Table 1–27, Table 1–33, Table 1–34, and Table 1–45.
Updated Figure 1–2 and Figure 1–3.
Updated Equation 1–1.
Deleted Table 1-28, Table 1-29, Table 1-30, Table 1-42, Table 1-43, and
Table 1-44.
Minor text edits.
June 2009 3.1
Added “Preliminary Specifications” to the footer of each page.
Updated Table 1–1, Table 1–2, Table 1–7, Table 1–10, Table 1–11,
Table 1–12, Table 1–21, Table 1–22, Table 1–23, Table 1–25, Table 1–37,
Table 1–38, Table 1–39, Table 1–40, and Table 1–44.
Minor text edits.
March 2009 3.0
Replaced Table 1–31 and Table 1–37.
Updated Table 1–1, Table 1–2, Table 1–5, Table 1–19, Table 1–41,
Table 1–44, Table 1–45, Table 1–49, and Table 1–51.
Added Table 1–21, Table 1–46, and Table 1–47
Added Figure 1–3.
Removed “Timing Model”, “Preliminary and Final Timing”, I/O Timing
Measurement Methodology”, I/O Default Capacitive Loading”, and
Referenced Documents” sections.
December 2009 2.1 Minor changes.
November 2008 2.0
Minor text edits.
Updated Table 1–19, Table 1–32, Table 1–34 - Table 1–39.
Minor text edits.
Chapter 1: DC and Switching Characteristics 1–59
Document Revision History
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
August 2008 1.1
Updated Table 1–1, Table 1–2, Table 1–4, Table 1–5, and Table 1–26.
Removed figures from “Transceiver Performance Specifications” on
page 1–10 that are repeated in the glossary.
Minor text edits and an additional note to Table 1–26.
May 2008 1.0 Initial release.
Table 1–51. Document Revision History
Date Document Version Changes Made
1–60 Chapter 1: DC and Switching Characteristics
Document Revision History
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
2. Addendum to the Stratix IV Device
Handbook
This chapter describes changes to the published version of the Stratix IV Device
Handbook. It describes the following:
VCCAUX power supply setting for the power-on reset (POR) circuitry (including a
correction to the POR signal pulse width delay times)
Correct power-up sequence
On-chip termination (OCT) assignment summary
JTAG pull-up resistor value specification
Table 2–1 lists the changes and related chapters described in this addendum.
1Any information not contained in this addendum is considered the same as the
information contained in the published version of the Stratix IV Device Handbook.
Table 2 1 . Changes to the Stratix IV Handbook
Change Chapter
Power-On Reset Circuitry Hot Socketing and Power-On Reset in Stratix IV Devices
Power-On Reset Specifications Hot Socketing and Power-On Reset in Stratix IV Devices
Correct Power-Up Sequence for Production Devices Hot Socketing and Power-On Reset in Stratix IV Devices
Power-On Reset Circuit Configuration, Design Security, Remote System Upgrades
with Stratix IV Devices
Summary of OCT Assignments I/O Features in Stratix IV Devices
JTAG TMS and TDI Pin Pull-Up Resistor Value Specification Configuration, Design Security, Remote System Upgrades
with Stratix IV Devices
SIV54002-1.1
2–2 Chapter 2: Addendum to the Stratix IV Device Handbook
Power-On Reset Circuitry
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Power-On Reset Circuitry
Figure 2–1 shows the addition of the VCCAUX power supply to “Figure 9-2: Simplified
POR Diagram for Stratix IV Devices”.
Power-On Reset Specifications
Table 2–2 lists the addition of the VCCAUX power supply setting to “Table 9-1: Power
Supplies Monitored by the POR Circuitry”.
fAll power supply specifications not contained in this addendum remain the same as
in “Table 9-1: Power Supplies Monitored by the POR Circuitry” of the Hot Socketing
and Power-On Reset in Stratix IV Devices chapter.
Correction to POR Signal Pulse Width Delay Times
Table 2–3 lists the corrected POR signal pulse delay times (the changes are shown in
bold).
Figure 2–1. Simplified POR Diagram for Stratix IV Devices
Regulator POR
Satellite POR POR Pulse
Setting
PORSEL
POR
Main POR
VCCPGM
VCCPD
VCC
VCCPT
VCCAUX
Table 2 2 . Power Supplies Monitored by the POR Circuitry
Power Supply Description Setting (V)
VCCAUX Auxiliary supply for the programmable power technology 2.5
Table 2 3 . Corrections to Chapter 9: Hot Socketing and Power-On Reset in Stratix IV Devices
Page # Section Name Change
Page 5 Power-On Reset Specifications
Corrected: When the PORSEL pin is connected to GND, the POR delay time is
100 to 300 ms. When the PORSEL pin is set to high, the POR delay time is 4 to
12 ms.
Chapter 2: Addendum to the Stratix IV Device Handbook 2–3
Correct Power-Up Sequence for Production Devices
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Correct Power-Up Sequence for Production Devices
In order to successfully power-up and to exit POR on production Stratix IV devices,
you must fully power up VCC before VCCAUX begins to ramp. Table 2–4 lists the
corrections made to the Hot Socketing and Power-On Reset in Stratix IV Devices chapter
in order to record this new specification (the changes are shown in bold).
fAll the power-on reset sequence specifications not contained in this addendum
remain the same as in the Hot Socketing and Power-On Reset in Stratix IV Devices
chapter.
Table 2 4 . Corrections to Chapter 9: Hot Socketing and Power-On Reset in Stratix IV Devices
Page # Section Name Change
Page 1
Second Paragraph
Stratix IV devices offer hot socketing, also known as hot plug-in or hot swap,
and power sequencing support without the use of external devices (provided VCC
powers up fully before VCCAUX).
Third Paragraph Removed: With the Stratix IV hot-socketing feature, you no longer have to
ensure a proper power-up sequence for each device on the board.
Second bullet Support for any power-up sequence (with the exception that VCC must power up
fully before VCCAUX for all Stratix IV production devices).
Stratix IV Hot-Socketing
Specifications
Stratix IV devices are hot-socketing compliant (provided VCC powers up fully
before VCCAUX) without the need for external components or special design
requirements.
Page 2
Stratix IV Devices can be Driven
Before Power Up
Removed: Stratix IV devices support power-up or power-down of the VCCIO, VCC,
VCCPGM, and VCCPD power supplies in any sequence in order to simplify
system-level design.
Insertion or Removal of a
Stratix IV Device from a
Powered-up System
Added: To successfully power-up and exit POR on production devices, fully
power VCC before VCCAUX begins to ramp.
Removed: For more information about the hot-socketing specification, refer to
the DC and Switching Characteristics and the Hot Socketing and Power
Sequencing Feature and Testing for Altera Devices white paper.
Hot-Socketing Feature
Implementation in Stratix IV
Devices
The hot-socketing feature turns off the output buffer during power up and power
down of the VCC , VC CAUX, VCCIO, VCCPGM, or VCCPD
power supplies. The hot-socketing
circuitry generates an internal HOTSCKT signal when the VCC
, VCCAUX, VCCIO,
VCCPGM, or VCCPD power supplies are below the threshold voltage.
Page 3
The POR circuit monitors the voltage level of the power supplies (VCC, VC CAUX,
VCCIO, VCCPGM, or VCCPD) and keeps the I/O pins tri-stated until the device is in user
mode.
The 3.0-V tolerance control circuit permits the I/O pins to be driven by 3.0 V
before the VCC, VCCAUX, VCCIO, VCCPGM
, or VCCPD supplies are powered.
Added: To successfully power-up and exit POR on production devices, fully
power VCC before VCCAUX begins to ramp.
Page 4 Power-On Reset Circuitry Added: The satellite POR also monitors the VCCAUX power supply which is the
auxiliary supply for the programmable power technology.
2–4 Chapter 2: Addendum to the Stratix IV Device Handbook
Power-On Reset Circuit
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Power-On Reset Circuit
Table 2–5 lists the addition of VCCAUX to the power-on reset information (the change is
shown in bold).
fAll the power-on reset circuit information not contained in this addendum remains
the same as in the Configuration, Design Security, Remote System Upgrades with
Stratix IV Devices chapter.
Summary of OCT Assignments
Table 2–6 lists the OCT assignments for the Quartus II software version 9.1 and later.
fAll on-chip termination support and I/O termination schemes not contained in this
addendum remain the same as in the I/O Features in Stratix IV Devices chapter.
JTAG TMS and TDI Pin Pull-Up Resistor Value Specification
This correction changes the current JTAG TMS and TDI pin pull-up resistor value
specification from 10 kΩ to a range of from 1 k to 10 kΩ..
Figure 2–2 shows the addition of Note 5 to “Figure 10-16: JTAG Configuration of a
Single Device Using a Download Cable” found in the JTAG Configuration section of
the Configuration, Design Security, and Remote System Upgrades in Stratix IV Devices
chapter (the change is shown in bold).
Table 2 5 . Correction to Chapter 10: Configuration, Design Security, and Remote System Upgrades in Stratix IV Devices
Page # Section Name Change
Page 4 Power-On Reset Circuit
After power-up, the device does not release nSTATUS until VCC, VCCAUX, VCCPT
,
VCCPGM, and VCCPD are above the device’s POR trip point. On power down,
brown-out occurs if the VCC, VCCAUX, VCCPT
, VCCPGM, or VCCPD drops below the
threshold voltage.
Table 2 6 . Summary of OCT Assignments in the Quartus II Software
Assignment Name Value Applies To
Input Termination
Parallel 50 Ω with calibration Input buffers for single-ended and
differential HSTL/SSTL standards
Differential Input buffers for LVDS receivers on
row I/O banks (1)
Output Termination
Series 25 Ωwithout calibration
Output buffers for single-ended
LVTTL/LVCMOS and HSTL/SSTL
standards as well as differential
HSTL/SSTL standards
Series 50 Ωwithout calibration
Series 25 Ωwith calibration
Series 40 Ωwith calibration
Series 50 Ωwith calibration
Series 60 Ωwith calibration
Note to Tab l e 26:
(1) You can enable differential OCT RD in row I/O banks when both VCCIO and VCCPD are set to 2.5 V.
Chapter 2: Addendum to the Stratix IV Device Handbook 2–5
JTAG TMS and TDI Pin Pull-Up Resistor Value Specification
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Figure 2–2. JTAG Configuration of a Single Device Using a Download Cable
Notes to Figure 2–2:
(1) Connect the pull-up resistor to the same supply voltage as the USB Blaster, MasterBlaster (VIO pin), ByteBlaster II, ByteBlasterMV, or
EthernetBlaster cable. The voltage supply can be connected to the VCCPD of the device.
(2) Connect the nCONFIG and MSEL[2..0] pins to support a non-JTAG configuration scheme. If you only use the JTAG configuration, connect
nCONFIG to VCCPGM and MSEL[2..0] to GND. Pull DCLK either high or low, whichever is convenient on your board.
(3) Pin 6 of the header is a VIO reference voltage for the MasterBlaster output driver. VIO must match the device’s VCCP D. For more information about
this value, refer to the MasterBlaster Serial/USB Communications Cable User Guide. In the USB-Blaster, ByteBlaster II, and ByteBlasterMV cable,
this pin is a no connect.
(4) You must connect nCE to GND or driven low for successful JTAG configuration.
(5) The pull-up resistor value can vary from 1 k to 10 kΩ.
nCE (4)
MSEL[2..0]
nCONFIG
CONF_DONE
VCCPD (1)
GND
GND
(2)
(2)
VCCPD (1)
10 kΩ
10 kΩ
nSTATUS
Pin 1
Download Cable
10-Pin Male Header
(JTAG Mode)
(Top View)
GND
TCK
TDO
TMS
TDI
1 kΩ
GND
VIO (3)
Stratix IV Device
nCE0
N.C.
TRST
DCLK
(2)
VCCPGM
VCCPGM
VCCPD (1)
VCCPD (1)
(5)
(5)
2–6 Chapter 2: Addendum to the Stratix IV Device Handbook
JTAG TMS and TDI Pin Pull-Up Resistor Value Specification
Stratix IV Device Handbook Volume 4 © February 2010 Altera Corporation
Figure 2–3 shows the addition of Note 5 to “Figure 10-17: JTAG Configuration of
Multiple Devices Using a Download Cablefound in the JTAG Configuration section of
the Configuration, Design Security, and Remote System Upgrades in Stratix IV Devices
chapter (the change is shown in bold).
fAll other JTAG configuration specifications not contained in this addendum remain
the same as in the Configuration, Design Security, and Remote System Upgrades in
Stratix IV Devices chapter.
Figure 2–3. JTAG Configuration of Multiple Devices Using a Download Cable
Notes to Figure 2–3:
(1) Connect the pull-up resistor to the same supply voltage as the USB Blaster, MasterBlaster (VIO pin), ByteBlaster II, ByteBlasterMV, or
EthernetBlaster cable. Connect the voltage supply to VCCPD of the device.
(2) Connect the nCONFIG and MSEL[2..0] pins to support a non-JTAG configuration scheme. If you only use JTAG configuration, connect
nCONFIG to VCCPGM and MSEL[2..0] to GND. Pull DCLK either high or low, whichever is convenient on your board.
(3) Pin 6 of the header is a VIO reference voltage for the MasterBlaster output driver. VIO must match the device’s VCCP D. For more information about
this value, refer to the MasterBlaster Serial/USB Communications Cable User Guide. In the USB-Blaster, ByteBlaster II, and ByteBlasterMV cables,
this pin is a no connect.
(4) You must connect nCE to GND or drive it low for successful JTAG configuration.
(5) The pull-up resistor value can vary from 1 k to 10 kΩ.
TMS TCK
Download Cable
10-Pin Male Header
(JTAG Mode)
TDI TDO
VCCPD
VCCPD (1)
Pin 1
nSTATUS
nCONFIG
MSEL[2..0]
nCE (4)
VCCPGM
CONF_DONE
TMS TCK
TDI TDO
nSTATUS
nCONFIG
MSEL[2..0]
nCE (4)
CONF_DONE
TMS TCK
TDI TDO
nSTATUS
nCONFIG
MSEL[2..0]
nCE (4)
CONF_DONE
(1)
(2)
(2)
(2)
(2)
(2)
(2)
VIO
(3)
Stratix IV DeviceStratix IV Device Stratix II or Stratix II GX
Device
TRST TRST TRST
10 kΩ10 kΩ10 kΩ10 kΩ10 kΩ
1 kΩ
10 kΩ
DCLK DCLK DCLK
(2) (2) (2)
Stratix IV Device
VCCPD (1)
VCCPD (1) VCCPD (1) VCCPD (1)
VCCPGM VCCPGM VCCPGM VCCPGM VCCPGM
(5)
(5)
Chapter 2: Addendum to the Stratix IV Device Handbook 2–7
Document Revision History
© February 2010 Altera Corporation Stratix IV Device Handbook Volume 4
Document Revision History
Table 2–7 shows the revision history for this chapter.
Table 2 7 . Document Revision History
Date Document Version Changes Made
February 2010 1.1
Added the “Power-On Reset Circuitry”, “Power-On Reset Specifications”,
“Correction to POR Signal Pulse Width Delay Times, “Correct Power-Up
Sequence for Production Devices”, “Power-On Reset Circuit”, “Summary
of OCT Assignments”, and “JTAG TMS and TDI Pin Pull-Up Resistor Value
Specification” sections.
Minor text edits.
November 2009 1.0
Stratix IV GX enhanced transceiver data rate specifications in 4
commercial speed grade.
Initial release.