Regarding the change of names mentioned in the document, such as Hitachi
Electric and Hitachi XX, to Renesas Technology Corp.
The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas
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Renesas Technology Home Page: http://www.renesas.com
Renesas Technology Corp.
Customer Support Dept.
April 1, 2003
To all our customers
Cautions
Keep safety first in your circuit designs!
1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better
and more reliable, but th ere is always the possibility that trouble may occur with them. Trouble with
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Remember to give due consideration to safety when making your circuit designs, with appropriate
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Notes regar ding these materials
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HAT2029R
Silicon N Channel Power MOS FET
High Speed Power Switching
ADE-208-525D (Z)
5th. Edition
Feb. 1999
Features
Low on-resistance
Capable of 2.5 V gate drive
Low drive current
High density mounting
Outline
SOP–8
1234
5
6
7
8
G
D
S
D
G
D
S
D
MOS1 MOS2
1
2
78
4
56
3
1, 3 Source
2, 4 Gate
5, 6, 7, 8 Drain
HAT2029R
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage VDSS 28 V
Gate to source voltage VGSS ±12 V
Drain current ID7.5 A
Drain peak current ID(pulse)Note1 60 A
Body-drain diode reverse drain current IDR 7.5 A
Channel dissipation Pch Note2 2W
Channel dissipation Pch Note3 3W
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. 1 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW 10s
3. 2 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW 10s
HAT2029R
3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
voltage V(BR)DSS 28——V I
D = 10mA, VGS = 0
Gate to source breakdown
voltage V(BR)GSS ±12——V I
G = ±100µA, VDS = 0
Gate to source leak current IGSS ——±10 µAV
GS = ±10V, VDS = 0
Zero gate voltege drain current IDSS ——1 µAV
DS = 28 V, VGS = 0
Gate to source cutoff voltage VGS(off) 0.4 1.4 V VDS = 10V, I D = 1mA
Static drain to source on state RDS(on) 0.025 0.033 ID = 4A, VGS = 4V Note4
resistance RDS(on) 0.031 0.043 ID = 4A, VGS = 2.5V Note4
Forward transfer admittance |yfs| 9.5 15 S ID = 4A, VDS = 10V Note4
Input capacitance Ciss 780 pF VDS = 10V
Output capacitance Coss 470 pF VGS = 0
Reverse transfer capacitance Crss 190 pF f = 1MHz
Turn-on delay time td(on) 20 ns VGS = 4V, ID = 4A
Rise time tr 170 ns VDD 10V
Turn-off delay time td(off) 140 ns
Fall time tf 170 ns
Body–drain diode forward
voltage VDF 0.88 1.15 V IF = 7.5A, VGS = 0 Note4
Body–drain diode reverse
recovery time trr 65 ns IF = 7.5A, VGS = 0
diF/ dt =20A/µs
Note: 4. Pulse test
HAT2029R
4
Main Characteristics
Channel Dissipation Pch (W)
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Note 5 :
When using the glass epoxy board
(FR4 40x40x1.6 mm)
4.0
3.0
2.0
1.0
050 100 150 200
100
30
10
3
1
0.3
0.1
0.03
0.01
0.1 0.3 1 3 10 30 100
10 µs
1 ms
PW = 10 ms
50
40
30
20
10
0246810
10 V 6 V
3 V
3.5 V
V = 1.5 V
GS
4 V
5 V 50
40
30
20
10
012345
Tc = –25 °C
75 °C
25 °C
2 Drive Operation
1 Drive Operation
Operation in
this area is
limited by RDS(on)
Pulse Test V = 10 V
Pulse Test
DS
Test Condition :
When using the glass epoxy board
(FR4 40x40x1.6 mm), PW < 10 s
Note 5
DC Operation (PW < 10 s)
Ta = 25 °C
1 shot Pulse
1 Drive Operation
100 µs
2.5 V
2 V
HAT2029R
5
Gate to Source Voltage V (V)
GS
Drain to Source Voltage V (V)
DS(on)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Static Drain to Source on State Resistance
vs. Temperature
Forward Transfer Admittance |yfs| (S)
Drain Current I (A)
D
Forward Transfer Admittance vs.
Drain Current
0.5
0.4
0.3
0.2
0.1
0246810
2 A
1 A
I = 5 A
D
0.2 0.5 1251020
0.2
0.1
0.02
0.05
0.01
0.005
0.10
0.08
0.06
0.04
0.02
–40 0 40 80 120 160
0
I = 5 A
D
1 A, 2 A, 5 A
0.2 0.5 1 2 510
20
20
10
2
5
1
0.5
Pulse Test
Pulse Test
0.002
4 V
V = 2.5 V
GS
Pulse Test
4 V
V = 2.5 V
GS
2 A 1 A
50
25 °C
Tc = –25 °C
75 °C
DS
V = 10 V
Pulse Test
HAT2029R
6
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
0.2 0.5 1 2 5 10
500
200
100
20
50
10
50 10 20 30 40 50
10000
3000
1000
300
100
30
10
V = 0
f = 1 MHz
GS
50
40
30
20
10
0
10
8
6
4
2
4 8 12 16 20
0
0.1
di/dt = 20 A/µs
V = 0, Ta = 25°C
GS
Ciss
Coss
Crss
VGS
VDS
V = 5 V
10 V
20 V
DD
V = 20 V
10 V
5 V
DD
I = 7.5 A
D
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
0.2 0.5 1 2 5 10
500
200
100
20
50
10
5
0.1
tf
r
t
d(on)
t
d(off)
t
V = 4 V, V = 10 V
PW = 3 µs, duty < 1 %
GS DD
HAT2029R
7
Vin Monitor
D.U.T.
Vin
4 V
RL
V
= 10 V
DD
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
Vout
Monitor
50
90%
10%
tf
Switching Time Test Circuit Switching Time Waveform
50
40
30
20
10
00.4 0.8 1.2 1.6 2.0
V = 0, –5 V
GS
5 V
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Test
HAT2029R
8
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
10 µ100 µ1 m 10 m 100 m 1 10 100 1000 10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW
T
D = PW
T
ch – f(t) = s (t) • ch – f
ch – f = 125 °C/W, Ta = 25 °C
θ γ θ
θ
When using the glass epoxy board
(FR4 40x40x1.6 mm)
10 µ100 µ1 m 10 m 100 m 1 10 100 1000 10000
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
10 µ100 µ1 m 10 m 100 m 1 10 100 1000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW
T
D = PW
T
ch – f(t) = s (t) • ch – f
ch – f = 166 °C/W, Ta = 25 °C
θ γ θ
θ
When using the glass epoxy board
(FR4 40x40x1.6 mm)
HAT2029R
9
Package Dimensions
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
FP-8DA
Conforms
0.085 g
*Dimension including the plating thickness
Base material dimension
1.75 Max
4.90
0.25
0.15
0° – 8°
M
85
14
1.27
3.95
0.40 ± 0.06
*0.42 ± 0.08
5.3 Max
0.75 Max
0.14+ 0.11
– 0.04
0.20 ± 0.03
*0.22 ± 0.03
0.60+ 0.67
– 0.20
6.10+ 0.10
– 0.30 1.08
As of January, 2001
Unit: mm
HAT2029R
10
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
Copyright Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
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For further information write to:
Colophon 2.0