MDSL-00077-00 QUALITY SEMICONDUCTOR, INC. 3
MARCH 10, 1998
QS74FCT16652T, 162652T PRELIMINARY
Now an Company
Table 4. Function Table(2,3)
Inputs Data I/O(1)
xOEAB xOEBAOEBA
OEBAOEBA
OEBA xCLKAB xCLKBA xSAB xSBA xAx xBx Operation or Function
L H H or L H or L X X Input Input Isolation
LH ↑↑X X Store A and B Data
XH ↑H or L X X Input
Unspecified
(1) Store A, Hold B
HH ↑↑X(2) X Output Store A in both Registers
L X H or L ↑XX
Unspecified
(1) Input Hold A, Store B
LL ↑↑XX
(2) Output Store B in both Registers
L L X X X L Output Input Real Time B Data to A Bus
L L X H or L X H Stored B Data to A Bus
H H X X L X Input Output Real Time A Data to B Bus
H H H or L X H X Stored A Data to B Bus
H L H or L H or L H H Output Output Stored A Data to B Bus and
Stored B Data to A Bus
Notes:
1. The data output functions may be enabled or disabled by various signals at the xOEAB or xOEBA inputs. Data
input functions are always enabled; i.e., data at the bus pins will be stored on every LOW-to-HIGH transition on
the clock inputs.
2. Select control = L; clocks can occur simultaneously.
Select control = H; clocks must be staggered to load both registers.
3. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
↑ = LOW-to-HIGH Transition
Table 5. DC Electrical Characteristics Over Operating Range
Recommended Operating Ranges apply unless otherwise noted.
Symbol Parameter Test Conditions(1) Min Typ(2) Max Unit
VIH Input HIGH Voltage Logic HIGH for All Inputs 2.0 — — V
VIL Input LOW Voltage Logic LOW for All Inputs — — 0.8 V
∆VTInput Hysteresis VTLH – VTHL for All Inputs(4) — 100 — mV
| IIH | Input Current VCC = Max., 0 ≤ VIN < VCC —— 1µA
| IIL | Input HIGH or LOW
| IOZ | Off-State Output VCC = Max., 0 ≤ VOUT ≤ VCC —— 1µA
Current (Hi-Z)
| IOFF | Power off leakage VCC = 0V, VIN/OUT ≤ 4.5V(5) —— 1µA
IOS Short Circuit Current VCC = Max., VOUT = GND(3,4) –80 –140 –225 mA
VIK Input Clamp Voltage VCC = Min., IIN = –18mA – –0.7 –1.2 V
Notes:
1. For conditions shown as Min. or Max. use appropriate value specified under Recommended Operating Conditions
for the applicable device type.
2. Typical values indicate VCC = 5.0V and TA = 25°C.
3. Not more than one output should be tested at one time. Duration of test should not exceed one second.
4. These parameters are guaranteed by design but not tested.
5. The test limit for this parameter is ± 5µA at TA = –55°C