1. DATE NOTICE OF REVISION (NOR Form Approved ( ) CYYMMDD ) OMB No. 0704-0188 93-12-22 This revision described below has been authorized for the document listed. Public reporting burden for this collection is estimated to average 2 hours per response, including the time Por reviewin instructions, searching existing data sources, gathering and maintaining the 2. eR R NS AO data needed, and comp C . 0 r this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden, to Department of Defense, Washingtion Headquarters Services, Directorate ion Operations and eports, 1215 Jefferson Davis Highway, Suite 1204, Arlington for Informa 22202-4302, and_to the Office of Washington, DC 20503. RETURN COMPLETED FORM TO THE GOVERNMENT ISSUING CONTRACTING OFFICER FOR THE CONTRACT/ PROCURING ACTIVITY NUMBER LISTED IN ITEM 2 OF THIS FORM. fet ing and reviewing the collection of information, Send comments regarding VA anagement and Budget, Paperwork Reduction Project (O07! 4-0188), 3. DODAAC PLEASE DO NOT RETURN YOUR COMPLETED FORM TO EITHER OF THESE ADDRESSED. - i i . CAG 6. NOR NO. 4. ORIGINATOR b. ADDRESS (Street, City, State, Zip Code) 5. CAGE CODE Defense Electronics Supply Center 67268 5962-R069-94 1507 Wilmington Pike 7. CAGE CODE 8. DOCUMENT NO. a. TYPED NAME (First, Middle Initial, Last) Dayton, OH 45444-5270 67268 5962-89506 9. TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, a. CURRENT b. NEW MONOLITHIC SILICON 11. NO. 10. REVISION LETTER ECP N/A Initial A 12. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES ALL 13. DESCRIPTION OF REVISION Sheet 1: Revisions ltr column; add "A". Revisions description column; add "Changes in accordance with NOR 5962-R069-94". Revisions date column; add "93-12-22". Revision level block; add "A". Rev status of sheets; for sheets 1 and 6, add "A". Sheet 6: Table I, output disable time, OE to Yue tpyz and t PL? Cc, = 50 pF, device type 02; change maximum fimit from "7.0 ns" to "8.0 ns". = 5.0 pF, device type 01; change maximum Limit from "19.0 ns" to "9.0 ns". Cc L 5.0 pF, device type 02; change maximum Limit from "8.0 ns" to "7.0 ns". c L Revision level block; add "A". 14. THIS SECTION FOR GOVERNMENT USE ONLY a. (X one) X (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. (3) Custodian of master document shall make above revision and furnish revised document. b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT c. TYPED NAME (First, Middle Initial, Last) DESC-ECC Monica L. Poelking d. TITLE e. SIGNATURE f. DATE SIGNED CYYMMDD) Chief, Custom Microelectronics Monica L. Poelking 93-12-22 15a. ACTIVITY ACCOMPLISHING REVISION b. REVISION COMPLETED (Signature) c. DATE SIGNED CYYMMDD ) DESC-ECC Thanh V. Nguyen 93-12-22 DD Form 1695, APR 92 Previous editions are obsoleteREVISIONS DATE (YR-MO-DA) APPROVED DESCRIPTION REV SHEET REV SHEET REV STATUS OF SHEET: s 8] 9110] 11% 126 134 14 PMIC N/A E . DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZED | MILITARY MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, DRAWING MONOLITHIC SILICON THIS DRAWING IS AVAILABLE WING se ea FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE 18 MAY 1989 A 67268 5962-89506 DEPARTMENT OF DEFENSE TEVISION LEVEL AMSC NIA SHEET 1 OF 14 Dest poRM 193 U.S GOVERNMENT PRINTING OFFICE: 1987 748-129/60911 5962-E1175 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.1. SCOPE 1.1 Scope. This drawing describes device requirements for class B micracircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compl fant non-JAN devices". 1.2 Part number. The complete part number shall be as shown in the following example: Ty 01 | XxX Drawing number Device type Case outline Lead finish per (1.2.1) (1.2.2) MIL-M-38510 1.2.1 Device types. The device types shall identify the circuit function as follows: Device type Generic number Circuit function 01 54FCT827A 10-bit non-inverting bus driver 02 54FCT827B 10-bit non-inverting bus driver 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows: Outline letter Case outline K F-6 (24-lead, .640" x .420" X .090"), flat package L D-9 (24-lead, 1.280" x .310" X .200"), dual-in-line package 3 C-4 (28-terminal, .460" X .460" X .100"), square chip carrier package 1.3 Absolute maximum ratings. 1/ Supply voltage range - - - - -- 7 + et ttt tr tte -0.5 V de to +6.0 V de Input voltage range- - - ----- 7 tt ttt tt tte -0.5 V de to Voc + 0.5 Vide Output voltage range - ---- +--+ - 7 et ttre -0.5 V de to Vee +0.5 V de DC input diode current Cy?) a oe -20 m DC output diode current Cy) ttt tt rt te ee -50 mA DC output current- - -- -*- 7 ett ttt tte +100 mA Maximum power dissipation (Py? arr ttt te 500 md Thermal resistance, junction-to-case (8).) ee trees See MIL-M-38510, appendix C Storage temperature range- - --- -- - cc ct ttt te 65C to +150C Junction temperature (Type ttt te +175C Lead temperature (soldering, 10 seconds) - ------- - +300C 1/ ALL voltages referenced to GND. 2/ Must withstand the added Py due to short circuit test: e.g., los: STANDARDIZED Size 5062-89506 MILITARY DRAWING A | DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 2 DAYTON, OHIO 45444 DESC FORM 193A U. . GOVERNMENT PRINTING OFFICE: 1988550-547 SEP 871.4 Recommended operating conditions. Supply voltage range Wo) cette ee er tt te 44.5 V de to +5.5 V de Maximum low level input voltage Wi) rrr tt te 0.8 V de Minimum high level input voltage Wi corte tte tee 2.0 V de Case operating temperature range (T.) - - --- 7-7 > * -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government_specification and standard. Unless otherwise specified, the following specification and standard, of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be jin accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. STANDARDIZED SIZE 5962-89506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 3 DAYTON, OHIO 45444 DE sc FORM 1 i) 3A # U.S. GOVERNMENT PRINTING OFFICE: 1988--550-547 SEP 87TABLE 1. Electrical performance characteristics. Test Symbol Conditions Group A |Device/__ Limits | Unit -55C < T. < +125C subgroups] type | Min Max V_. = 5.0V de 210% unt &s otherwise specified High level output Vou Vee = 4.5 V, Ip = -300 yA 1,2,3 All 4.3 v vol tage ViL = 0.8 V, Vi = 2.0 V 1H I, = -12 ma 1,2,3 | alt | 2.4 Low level output Vv Van = 4.5 V, I, = 300 uA 1,2,3 ALL 0.2 voltage ot Vie = 0.8 Vv, 9 Vi, = 2.0 V tH ly = 32 mA 1,2,3 | alt 0.5 Input clamp vol tage ViK Voc = 4.5 V, ly = -18 mA 1 All 1.2 High level input I V.. = 5.5 V, VV, = 5.5 V 1,2,3 ALL 5.0 HA current I ce IN Low level input I V., = 5.5 V, V... = GND | 1,2,3 ALL -5.0 current HL ce IN Off-state output I V.. = 5.5 V, Vv. = 5.5 V 1,2,3 ALL 10 current o2H cc IN loz Vee = 5.5 V, Voy = GND -10 Short circuit I V.. 25.5 V, V = GND 1/ 1,2,3 ALL -75 m output current os ce our Quiescent power loca Vin < 0.2 Vor Vin > 5.3 V, 1,2,3 ALL 1.5 supply current Vee = 5.5 Vv, fy ="0.0 MHz (CMOS inputs) Quiescent power delta Vee ? 5.5 V, Vin = 3.4 V 2/ 1,2,3 All 2.0 supply current loc (TTL inputs) See footnotes at end of table. STANDARDIZED sve 5962-89506 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 4 DAYTON, OHIO 45444 DESC FORM ] 93A 0 U. &. GOVERNMENT PRINTING OFFICE: 1968--550-547 SEP 87TABLE I. Electrical performance characteristics - Continued. Test Symbol Condi tions Group A |Device Limits Unit , c< Tr. < +125C subgroups| type | Min Max 5.0V de +10% unt Ss otherwise specified Dynamic power lecp (Vee = 323 We OE = GND, 3/ ALL 0.25 | mA/ supply current Viy 2 5.3 Vor Vin < 0.2 Vv, MHz oltputs open, One bit toggling, 50% duty cycle Total power supply lee Vin 2 > 5.3 Vor "YIN, <0.2V 1,2,3 ALL 4.0 mA current 4/ Ve 5.5 Vv, f 17 2 MHz, offputs open, = GND, One bit toggling, 50% duty cycle V.. = 3.4 V or V,, = GND, 5.0 vin = 5.5 V, fy 1N10 Miz, offputs | open, OE = GND, One bit toggling, 50% duty cycle Functional tests See 4.3.1d 7,8 ALL Input capacitance CN See 4.3.1 4 All 10 pF Output capacitance Cour See 4.3.1c 4 All 12 Propagation delay tone a = 5000, C = 50 pF 9,10,11 | 01 10 ns time, DY to Yn toHL Se figure 3 02 6.5 c= 300 pF 5/| 9,10,11 | 01 17 02 14 See footnotes at end of table. STANDARDIZED SIZE MILITARY DRAWING A _a_ DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 5 DAYTON, OHIO 45444 DESC FORM 193A SEP 87 U.S GOVERNMENT PRINTING OFFICE: 1988550-547TABLE 1. Electrical performance characteristics - Continued. Test Symbol Condi tions Group A jDevice|_ Limits JUnit 55C < T. < #125C subgroups! type | Min Max Vin = 5.0V de #10% ynt her ifi Output enable time, toy al = 5000, C. = 50 pF 9,10,11 | 01 17 ns OE to Yn tot Se figure 3 02 9.0 c, = 300 pF 5/| 9,10,11 | 01 25 02 16 Output disable time,/t,.,, C, = 50 pF 9,10,11 | 01 10 OE to Y Pl t a PLZ 02 7.0 Cc = 5.0 pF 5/| 9,10,17 | 01 19 02 8.0 1/ Not more than one output should be shorted at one time, and the duration of the short circuit condition shall not exceed 1 second. 2/ TTL driven input, Vin = 3.4 V; all other inputs at Vee or GND. 3/ This parameter is not directly testable, but is derived for use in total power supply calculations. 4/ loc = Toca + (delta lec xO, x Ny) + Ceep * f, x ND) where Dy = Duty cycle for TTL inputs high Ny = Number of TTL inputs at Dy fy = Input frequency in MHz N = Number of inputs at fy 2/ This parameter is guaranteed, if not tested, to the limits as specified in table 1. STANDARDIZED SIZE MILITARY DRAWING A 3962-89506 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 6 DESC FORM 193A SEP 87 & U. &. GOVERNMENT PRINTING OFFICE: 1988550-847Device types 01 and 02 Case outlines K and L Terminal number Terminal symbol = DVOONAULRWD - NNN PWN DPD oo oe oo = or or os or ANAUEFWN =-OVODONOUEWD = ral = aosvuVT7TVcv o0 98 o ieoqnex~~e~~K~K<~ oO IBOFNWEUONDO MzoON OUR UNO mM Ao > RIS OO BOON OW OFF WN Oo ZzovuvvT7coeuzoceo9g o <x<<~<~<~zu~<~<~<~<< 9| QoenUr Gran wo m oa NC = No connection FIGURE 1. Terminal connections. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-89506 REVISION LEVEL SHEET 7 DESC FORM 193A SEP 87 t U. S. GOVERNMENT PRINTING OFFICE: 1988550-547Inputs Output Function OE, OES DA Ya L L L L Transparent L L H H Transparent H x x z Three-state x H x z Three-state H = High voltage level L = Low voltage level X = Irrelevant Z = High impedance state FIGURE 2. Truth table. STANDARDIZED - sz] , MILITARY DRAWING ALO DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON; OHIO 45444 cn ] tt DESC FORM 193A SEP 87 # U. . GOVERNMENT PRINTING OFFICE: 1986550-$47R VIN Vout L PULSE LI . GENERATOR DUT [~ Ry ey RL Switch position Test Switch t Closed tha Closed aut bthers Open NOTES: 1. oF includes jig and probe capacitance. 2. Re = 5000; c. = 50 pF; R OUT of pulse generators. 3. Pulse generator for all pulses: PRR < 1.0 MHz, Zout < 500, t. = ty < 2.5 ns. FIGURE 3. Test circuit and switching waveforms. STANDARDIZED A MILITARY DRAWING 3262-89506 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 9 DESC FORM 193A SEP 87 * U S. GOVERNMENT PRINTING OFFICE: 1988550-547PROPAGATION DELAY WAVEFORMS 3.0 V SAME PHASE INPUT TRANSITION tPLH w | t PHL \ VOoH LS V OUTPUT a \ Vov - t t _ PHL -* PLH 39 v OPPOSITE PHASE 1S V INPUT TRANSITION 0.0 V FIGURE 3. Test circuit and switching waveforms - Continued. SIZE STANDARDIZED R 5062-89506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 10 DAYTON, OHIO 45444 DESC FORM 193A SEP 87 wt U. S. GOVERNMENT PRINTING OFFICE: 1888-850-547ENABLE AND DISABLE TIMES pe 3.5 V } 7 03 V Vou 0.0 V VoOH ENABLE DISABLE \ oT 3.0 OV CONTROL L 15 Vv INPUT / e| tPZL bw wm| tPLZ 35 V QUTPUT \ NORMALLY SWITCH 15 Vv Low CLOSED \ a 7 w) tPZH pe e} tpyz je t V 1 QUTPUT SWITCH oO Vv NORMAN OPEN 7 03 V 00 Vv 0.0 Vv FIGURE 3. Test circuit and switching waveforms - Continued. SIZE STANDARDIZED z 5962-89506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 11 DESC FORM 193A SEP 87 U S. GOVERNMENT PRINTING OFFICE: 1968--550-5473.4 Marking. Marking shall be in accordance with MIL-STD-~883 (see 3.1 herein). The part shall be marked with the part number listed in 1.2 herein. In addition, the manufacturer's part number may also be marked as Listed in 6.4 herein : 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in 6.4. The certificate of compliance submitted to DESC-ECS prior to Listing as an approved source of supply shatl state that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.7 Notification of change. HMotification of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see 3.1 herein). 3.8 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The foltowing additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) Th = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shali be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (Cry and c T measurements ) shall be measured only for the initial test and after process or desi gh changes which may affect capacitance. Test all applicable pins on five devices with zero failures. d. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. STANDARDIZED SIZE 5962-89506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 5 DAYTON, OHIO 45444 , DESC FORM } g 3A @ U.S GOVERNMENT PRINTING OFFICE: 1988-550-547 SEP 87TABLE II. Electrical test requirements. Subgroups MIL-STD-883 test requirements (per method 5005, table I) Interim electrical parameters ce (method 5004) Final electrical test parameters 1* ,2,3,7,8,9, (method 5004) 10,11 Group A test requirements 1,2,3,4,7,8, (method 5005) 9,10,11 Groups C and D end-point 1,2,3 electrical parameters (method 5005) *PDA applies to subgroup 1. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) T, = +125C, minimum. A (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510, 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application. When a military specification exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be the preferred item for all applications. STANDARDIZED *~ 5962-89506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 43 DAYTON, OHIO 45444 DESC FORM 193A # U. . GOVERNMENT PRINTING OFFICE: 1988550-547 SEP 876.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Comments. Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telephone 513-296-5375. 6.4 Approved source of supply. An approved source of supply is listed herein. Additional sources will be added as they become available. The vendor listed herein has agreed to this drawing and certificate of compliance (see 3.5 herein) has been submitted to DESC-ECS. Vendor Vendor Military drawing CAGE similar part part number number number 1/ 5962 -8950601KX 61772 54FCT827AEB 5962 -8950601LX 61772 54FCT827ADB 5962 -89506013X 61772 54FCT827ALB 5962 -8950602KX 61772 54FCT827BEB 5962 -8950602LX 61772 54FCT82780B 5962 -89506023X 61772 54FCT827BLB A/ Caution. Do not use this number for item acquisition. Items acquired by this number may not satisfy the performance requirements of this drawing. Vendor CAGE Vendor name number and address 61772 Integrated Device Technology 3236 Scott Boulevard Santa Clara, CA 95052 STANDARDIZED sue sos2-a9506 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 4, DAYTON, OHIO 45444 DESC FORM 193A SEP 87 U. 8. GOVERNMENT PRINTING OFFICE: 1988--550-547