TL/L/10223
DM54LS469A/DM74LS469A 8-Bit Up/Down Counter
July 1989
DM54LS469A/DM74LS469A 8-Bit Up/Down Counter
General Description
The ’LS469A is an 8-bit synchronous up/down counter with
parallel load and hold capability. Three function-select in-
puts (LD,UD, CBI) provide one of four operations which
occur synchronously on the rising edge of the clock (CK).
The LOAD operation loads the inputs (D7D0) into the out-
put register (Q7Q0). The HOLD operation holds the previ-
ous value regardless of clock transitions. The INCREMENT
operation adds one to the output register when the carry-in
input is TRUE (CBI eLOW), otherwise the operation is a
HOLD. The carry-out (CBO) is True (CBO eLOW) when
the output register (Q7Q0) is all HIGHs, otherwise FALSE
(CBO eHIGH). The DECREMENT operation subtracts one
from the output register when the borrow-in input is TRUE
(CBI eLOW), otherwise the operation is a HOLD. The bor-
row-out (CBO) is true (CBO eLOW) when the output regis-
ter (Q7Q0) is all LOWs, otherwise FALSE (CBO eHIGH).
The output register (Q7Q0) is enabled when OE is LOW,
and disabled (HIZ) when OE is HIGH. The output drivers
will sink the 24 mA required for many bus-interface stan-
dards. Two or more ’LS469A octal up/down counters may
be cascaded to provide larger counters.
Features
YOctal Register for general purpose interfacing
applications
Y8 bits match byte boundaries
YLow current PNP inputs reduce loading
YBus-structured pinout
YTRI-STATEÉoutputs
Y24-pin SKINNYDIP saves space
Connection Diagram
Top View
TL/L/102231
Order Number DM54LS469AJ, DM74LS469AJ, DM74LS469AN or DM74LS469AV
See NS Package Number J24F, N24C or V28A
Function Table
OE CK LD UD CBI D7D0 Q7Q0 Operation
HXXX X X Z HIZ
L
u
L X X D D LOAD
L
u
H L H X Q HOLD
L
u
H L L X Q Plus 1 INCREMENT
L
u
H H H X Q HOLD
L
u
H H L X Q Minus 1 DECREMENT
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
C1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage (VCC)7V
Input Voltage 5.5V
Off-State Output Voltage 5.5V
Storage Temperature b65§Ctoa
150§C
ESD Tolerance l1000V
Czap e100 pF
Rzap e150X
Test Method: Human Body Model
Test Specification: NSC SOP 5-028
Recommended Operating Conditions
Symbol Parameter Military Commercial Units
Min Typ Max Min Typ Max
VCC Supply Voltage 4.5 5 5.5 4.75 5 5.25 V
TAOperating Free-Air Temperature b55 25 0 25 75 §C
TCOperating Case Temperature 125 §C
Electrical Characteristics Series 24A Over Recommended Operating Temperature Range
Symbol Parameter Test Conditions Min Typ Max Units
VIH High Level Input Voltage (Note 2) 2 V
VIL Low Level Input Voltage (Note 2) 0.8 V
VIC Input Clamp Voltage VCC eMin, II eb
18 mA b0.8 b1.5 V
VOH High Level Output Voltage VCC eMin IOH eb
2 mA MIL
VIL e0.8V 2.4 2.9 V
IOH eb
3.2 mA COM
VIH e2V
VOL Low Level Output Voltage VCC eMin IOL e12 mA MIL
VIL e0.8V 0.3 0.5 V
IOL e24 mA COM
VIH e2V
IOZH Off-State Output Current VCC eMax VOe2.4V 100 mA
VIL e0.8V
IOZL (Note 3) VOe0.4V b100 mA
VIH e2V
IIMaximum Input Current VCC eMax, VIe5.5V 1 mA
IIH High Level Input Current (Note 3) VCC eMax, VIe2.4V 25 mA
IIL Low Level Input Current (Note 3) VCC eMax, VIe0.4V b0.04 b0.25 mA
IOS Output Short-Circuit Current VCC e5V VOe0V (Note 4) b30 b70 b130 mA
ICC Supply Current VCC eMax 135 180 mA
Note 1: Absolute maximum ratings are those values beyond which the device may be permanently damaged. They do not mean that the device maybe operated at
these values.
Note 2: These are absolute voltages with respect to the ground pin on the device and include all overshoots due to system and/or tester noise. Do not attempt to
test these values without suitable equipment.
Note 3: I/O leakage as the worst case of IOZX or IIX, e.g., IIL and IOZL.
Note 4: During IOS measurement, only one output at a time should be grounded. Permanent damage otherwise may result.
2
Switching Characteristics Over Recommended Operating Conditions
Symbol Parameter Test Conditions Military Commercial Units
Min Typ Max Min Typ Max
tSSet-Up Time from Input 40 20 30 20 ns
tWWidth of Clock High 20 7 15 7 ns
Low 35 15 25 15 ns
tpd CBI to CBO Delay CLe50 pF 23 35 23 30 ns
tclk Clock to Output CLe50 pF 10 25 10 15 ns
tpzx Output Enable Delay CLe50 pF 19 35 19 30 ns
tpzx Output Disable Delay CLe5pF 15 35 15 30 ns
t
HHold Time 0 b15 0 b15 ns
fmax Maximum Frequency 15.3 32 22.2 32 MHz
Test Load
TL/L/10223 2
Test Waveforms
Set-Up and Hold
TL/L/10223 4
Propagation Delay
TL/L/10223 5
Note A: VT e1.5V.
Note B: CLincludes probe and jig capacitance.
Note C: In the examples above, the phase relationships between inputs and
outputs have been chosen arbitrarily.
MIL COM’L
R1 e390 R1 e200
R2 e750 R2 e390
Schematic of Inputs and Outputs
TL/L/10223 3
Pulse Width
TL/L/10223 6
Enable and Disable
TL/L/10223 7
3
Logic Diagram
8-Bit Up/Down Counter
TL/L/10223 8
4
Physical Dimensions inches (millimeters)
24-Pin Narrow Ceramic Dual-In-Line Package (J)
Order Number DM54LS469AJ or DM74LS469AJ
NS Package Number J24F
24-Pin Narrow Plastic Dual-In-Line Package (N)
Order Number DM74LS469AN
NS Package Number N24C
5
DM54LS469A/DM74LS469A 8-Bit Up/Down Counter
Physical Dimensions inches (millimeters) (Continued) Lit. Ý114386
28-Lead Plastic Chip Carrier (V)
Order Number DM74LS469AV
NS Package Number V28A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant support device or system whose failure to perform can
into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life
failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.
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