4:1, Single-Ended Multiplexer 83054
Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20151
GENERAL DESCRIPTION
The 83054 is a low skew, 4:1, Single-ended Multiplexer and a
member of the family of High Performance Clock Solutions from IDT.
The 83054 has four selectable single-ended clock inputs and one
single-ended clock output. The output has a VDDO pin which may be
set at 3.3V, 2.5V, or 1.8V, making the device ideal for use in voltage
translation applications. An output enable pin places the output in
a high impedance state which may be useful for testing or
debug purposes. The device operates up to 250MHz and is pack-
aged in a 16 TSSOP package.
BLOCK DIAGRAM PIN ASSIGNMENT
FEATURES
• 4:1 single-ended multiplexer
• Q nominal output impedance: 7Ω (VDDO = 3.3V)
• Maximum output frequency: 250MHz
• Propagation delay: 3ns (maximum), VDD = VDDO = 3.3V
• Input skew: 225ps (maximum), VDD = VDDO = 3.3V
• Part-to-part skew: 780ps (maximum), VDD = VDDO = 3.3V
• Additive phase jitter, RMS: 0.19ps (typical), 3.3V/3.3V
• Operating supply modes:
VDD/VDDO
3.3V/3.3V
3.3V/2.5V
3.3V/1.8V
2.5V/2.5V
2.5V/1.8V
• -40°C to 85°C ambient operating temperature
• Available in lead-free (RoHS 6) package
CLK0
CLK1
CLK2
CLK3
SEL1
SEL0
OE
Q
83054
16-Lead TSSOP
4.4mm x 5.0mm x 0.92mm package body
G Package
Top View
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20152
TABLE 1. PIN DESCRIPTIONS
TABLE 2. PIN CHARACTERISTICS
TABLE 3. CONTROL INPUT FUNCTION TABLE
Number Name Type Description
1 Q Output Single-ended clock output. LVCMOS/LVTTL interface levels.
3 OE Input Pullup Output enable. When LOW, outputs are in HIGH impedance state.
When HIGH, outputs are active. LVCMOS / LVTTL interface levels.
4, 8,
10, 14
CLK3, CLK2,
CLK1, CLK0 Input Pulldown Single-ended clock inputs. LVCMOS/LVTTL interface levels.
5 GND Power Power supply ground.
7, 9 SEL1, SEL0 Input Pulldown Clock select input. See Control Input Function Table.
LVCMOS / LVTTL interface levels.
2, 6, 11, 13, 15 nc Unused No connect.
12 VDD Power Power and input supply pin.
16 VDDO Power Output supply pin.
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
CIN Input Capacitance 4 pF
RPULLUP Input Pullup Resistor 51 kΩ
RPULLDOWN Input Pulldown Resistor 51 kΩ
CPD
Power Dissipation Capacitance
(per output)
VDDO = 3.465V 18 pF
VDDO = 2.625V 20 pF
VDDO = 1.89V 30 pF
ROUT Output Impedance
VDDO = 3.465V 7 Ω
VDDO = 2.625V 7 Ω
VDDO = 1.89V 10 Ω
Control Inputs Input Selected to Q
SEL1 SEL0
0 0 CLK0
0 1 CLK1
1 0 CLK2
1 1 CLK3
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20153
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V
DD 4.6V
Inputs, VI -0.5V to VDD + 0.5 V
Outputs, VO -0.5V to VDDO + 0.5V
Package Thermal Impedance, θ
JA 89°C/W (0 lfpm)
Storage Temperature, T
STG -65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifi cations only. Functional
operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDO = 3.3V±5%, TA = -40°C TO 85°C
TABLE 4D. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDO = 2.5V±5%, TA = -40°C TO 85°C
TABLE 4B. POWER SUPPLY DC CHARACTERISTICS, VDD = 3.3V±5%, VDDO = 2.5V±5%, TA = -40°C TO 85°C
TABLE 4C. POWER SUPPLY DC CHARACTERISTICS, VDD = 3.3V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
TABLE 4E. POWER SUPPLY DC CHARACTERISTICS, VDD = 2.5V±5%, VDDO = 1.8V±0.2V, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Power Supply Voltage 3.135 3.3 3.465 V
VDDO Output Supply Voltage 3.135 3.3 3.465 V
IDD Power Supply Current 40 mA
IDDO Output Supply Current 5mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Power Supply Voltage 3.135 3.3 3.465 V
VDDO Output Supply Voltage 2.375 2.5 2.625 V
IDD Power Supply Current 40 mA
IDDO Output Supply Current 5mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Power Supply Voltage 3.135 3.3 3.465 V
VDDO Output Supply Voltage 1.71 1.8 1.89 V
IDD Power Supply Current 40 mA
IDDO Output Supply Current 5mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Power Supply Voltage 2.375 2.5 2.625 V
VDDO Output Supply Voltage 2.375 2.5 2.625 V
IDD Power Supply Current 35 mA
IDDO Output Supply Current 5mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VDD Power Supply Voltage 2.375 2.5 2.625 V
VDDO Output Supply Voltage 1.71 1.8 1.89 V
IDD Power Supply Current 35 mA
IDDO Output Supply Current 5mA
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20154
TABLE 5A. AC CHARACTERISTICS, VDD = VDDO = 3.3V ± 5%, TA = -40°C TO 85°C
TABLE 4F. LVCMOS/LVTTL DC CHARACTERISTICS, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VIH Input High Voltage VDD = 3.3V ± 5% 2 VDD + 0.3 V
VDD = 2.5V ± 5% 1.7 VDD + 0.3 V
VIL Input Low Voltage VDD = 3.3V ± 5% -0.3 0.8 V
VDD = 2.5V ± 5% -0.3 0.7 V
IIH Input High Current
CLK0:CLK3,
SEL0, SEL1 VDD = 3.3V or 2.5V ± 5% 150 µA
OE VDD = 3.3V or 2.5V ± 5% 5 µA
IIL Input Low Current
CLK0:CLK3,
SEL0, SEL1 VDD = 3.3V or 2.5V ± 5% -5 µA
OE VDD = 3.3V or 2.5V ± 5% -150 µA
VOH Output HighVoltage
VDDO = 3.3V ± 5%; NOTE 1 2.6 V
VDDO = 2.5V ± 5%; NOTE 1 1.8 V
VDDO = 1.8V ± 5%; NOTE 1 VDD - 0.3 V
VOL Output Low Voltage
VDDO = 3.3V ± 5%; NOTE 1 0.5 V
VDDO = 2.5V ± 5%; NOTE 1 0.45 V
VDDO = 1.8V ± 5%; NOTE 1 0.35 V
NOTE 1: Outputs terminated with 50Ω to VDDO/2. See Parameter Measurement section, “Load Test Circuit” diagrams.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 250 MHz
tpLH Propagation Delay, Low to High; NOTE 1 2.4 2.7 3.0 ns
tpHL Propagation Delay, High to Low; NOTE 1 2.5 2.7 2.9 ns
tsk(i) Input Skew; NOTE 2 55 225 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section;
NOTE 3
155.52MHz,
(12kHz to 20MHz) 0.19 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 780 ps
tR / tFOutput Rise/Fall Time 20% to 80% 50 500 ps
odc Output Duty Cycle 45 55 %
MUXISOL MUX Isolation @ 100MHz 45 dB
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Driving only one input clock.
NOTE 4: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDDO/2.
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20155
TABLE 5B. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40°C TO 85°C
TABLE 5C. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 1.8V ± 5%, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 250 MHz
tpLH Propagation Delay, Low to High; NOTE 1 2.5 2.8 3.1 ns
tpHL Propagation Delay, High to Low; NOTE 1 2.6 2.8 3.0 ns
tsk(i) Input Skew; NOTE 2 45 150 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section;
NOTE 3
155.52MHz,
(12kHz to 20MHz) 0.14 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 780 ps
tR / tFOutput Rise/Fall Time 20% to 80% 50 500 ps
odc Output Duty Cycle 45 55 %
MUXISOL MUX Isolation @ 100MHz 45 dB
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Driving only one input clock.
NOTE 4: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDDO/2.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 250 MHz
tpLH Propagation Delay, Low to High; NOTE 1 2.7 3.2 3.8 ns
tpHL Propagation Delay, High to Low; NOTE 1 2.8 3.3 3.8 ns
tsk(i) Input Skew; NOTE 2 50 150 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section;
NOTE 3
155.52MHz,
(12kHz to 20MHz) 0.16 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 780 ps
tR / tFOutput Rise/Fall Time 20% to 80% 100 700 ps
odc Output Duty Cycle 45 55 %
MUXISOL MUX Isolation @ 100MHz 45 dB
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Driving only one input clock.
NOTE 4: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDDO/2.
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20156
TABLE 5D. AC CHARACTERISTICS, VDD = VDDO = 2.5V ± 5%, TA = -40°C TO 85°C
TABLE 5E. AC CHARACTERISTICS, VDD = 2.5V ± 5%, VDDO = 1.8V ± -5%, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 250 MHz
tpLH Propagation Delay, Low to High; NOTE 1 2.5 3.0 3.5 ns
tpHL Propagation Delay, High to Low; NOTE 1 2.5 2.9 3.4 ns
tsk(i) Input Skew; NOTE 2 60 175 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section;
NOTE 3
155.52MHz,
(12kHz to 20MHz) 0.21 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 780 ps
tR / tFOutput Rise/Fall Time 20% to 80% 100 500 ps
odc Output Duty Cycle 40 60 %
MUXISOL MUX Isolation @ 100MHz 45 dB
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Driving only one input clock.
NOTE 4: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDDO/2.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 250 MHz
tpLH Propagation Delay, Low to High; NOTE 1 2.6 3.3 4.0 ns
tpHL Propagation Delay, High to Low; NOTE 1 2.7 3.3 4.0 ns
tsk(i) Input Skew; NOTE 2 50 150 ps
tjit
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section;
NOTE 3
155.52MHz,
(12kHz to 20MHz) 0.17 ps
tsk(pp) Part-to-Part Skew; NOTE 2, 4 780 ps
tR / tFOutput Rise/Fall Time 20% to 80% 100 700 ps
odc Output Duty Cycle 40 60 %
MUXISOL MUX Isolation @ 100MHz 45 dB
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: This parameter is defi ned in accordance with JEDEC Standard 65.
NOTE 3: Driving only one input clock.
NOTE 4: Defi ned as skew between outputs on different devices operating a the same supply voltages and
with equal load conditions. Using the same type of input on each device, the output is measured at VDDO/2.
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20157
ADDITIVE PHASE JITTER
Additive Phase Jitter @ 155.52MHz
(12kHz to 20MHz) = 0.19ps typical
The spectral purity in a band at a specifi c offset from the fundamental
compared to the power of the fundamental is called the dBc Phase
Noise. This value is normally expressed using a Phase noise plot
and is most often the specifi ed plot in many applications. Phase
noise is defi ned as the ratio of the noise power present in a 1Hz
band at a specifi ed offset from the fundamental frequency to the
power value of the fundamental. This ratio is expressed in decibels
(dBm) or a ratio of the power in the 1Hz band to the power in the
As with most timing specifi cations, phase noise measurements has
issues relating to the limitations of the equipment. Often the noise
oor of the equipment is higher than the noise fl oor of the device.
fundamental. When the required offset is specifi ed, the phase noise
is called a dBc value, which simply means dBm at a specifi ed offset
from the fundamental. By investigating jitter in the frequency domain,
we get a better understanding of its effects on the desired application
over the entire time record of the signal. It is mathematically possible
to calculate an expected bit error rate given a phase noise plot.
This is illustrated above. The device meets the noise fl oor of what
is shown, but can actually be lower. The phase noise is dependent
on the input source and measurement equipment.
OFFSET FROM CARRIER FREQUENCY (HZ)
SSB PHASE NOISE dBc/HZ
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20158
PARAMETER MEASUREMENT INFORMATION
3.3V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT
2.5V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
3.3V CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT
2.5 CORE/1.8V OUTPUT LOAD AC TEST CIRCUIT PART-TO-PART SKEW
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 20159
20%
80% 80%
20%
tRtF
INPUT SKEW
OUTPUT RISE/FALL TIMEPROPAGATION DELAY
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
Q
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 201510
APPLICATION INFORMATION
INPUTS:
CLK INPUTS
For applications not requiring the use of a clock input, it can be left
oating. Though not required, but for additional protection, a 1kΩ
resistor can be tied from the CLK input to ground.
LVCMOS CONTROL PINS
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional protection.
A 1kΩ resistor can be used.
RECOMMENDATIONS FOR UNUSED INPUT PINS
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 201511
RELIABILITY INFORMATION
TRANSISTOR COUNT
The transistor count for 83054 is: 874
TABLE 6. θ
JAVS. AIR FLOW TABLE FOR 16 LEAD TSSOP
θJA by Velocity (Linear Feet per Minute)
0 200 500
Single-Layer PCB, JEDEC Standard Test Boards 137.1°C/W 118.2°C/W 106.8°C/W
Multi-Layer PCB, JEDEC Standard Test Boards 89.0°C/W 81.8°C/W 78.1°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
PACKAGE OUTLINE - G SUFFIX FOR 16 LEAD TSSOP
TABLE 7. PACKAGE DIMENSIONS
Reference Document: JEDEC Publication 95, MO-153
SYMBOL Millimeters
Minimum Maximum
N16
A -- 1.20
A1 0.05 0.15
A2 0.80 1.05
b 0.19 0.30
c 0.09 0.20
D 4.90 5.10
E 6.40 BASIC
E1 4.30 4.50
e 0.65 BASIC
L 0.45 0.75
α
aaa -- 0.10
PACKAGE OUTLINE AND PACKAGE DIMENSIONS
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 201512
TABLE 8. ORDERING INFORMATION
Part/Order Number Marking Package Shipping Packaging Temperature
83054AGILF 83054AIL 16 Lead “Lead-Free” TSSOP tube -40°C to 85°C
83054AGILFT 83054AIL 16 Lead “Lead-Free” TSSOP tape & reel -40°C to 85°C
83054 Data Sheet
©2015 Integrated Device Technology, Inc December 15, 201513
REVISION HISTORY SHEET
Rev Table Page Description of Change Date
A T8 12 Ordering Information Table - corrected Part/Order Numbers. 1/3/06
B T5A - T5E
1
4 - 6
7
Features Section - added Additive Phase Jitter bullet.
AC Characteristics Tables - added tjit row and spec.
Added Additive Phase Jitter section.
01/04/07
C T5A - T5E 4 - 6 AC Characteristics Tables - changed part-to-part skew specs. 03/07/08
CT8 12 Ordering Information - removed leaded devices.
Updated data sheet format. 3/20/15
CT8
1
12
General Description - Removed HiPerClockS.
Ordering Information - removed LF note below the table.
Updated header and footer.
12/15/15
83054 Data Sheet
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operating parameters of the described products are determined in an independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein is provided
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