FN8109 Rev 4.00 Page 1 of 18
June 27, 2016
FN8109
Rev 4.00
June 27, 2016
X28HC64
64k, 8k x 8-Bit 5 Volt, Byte Alterable EEPROM
DATASHEET
The X28HC64 is an 8k x 8 EEPROM, fabricated with Intersil’s
proprietary, high performance, floating gate CMOS technology.
Like all Intersil programmable nonvolatile memories, the
X28HC64 is a 5V only device. It features the JEDEC approved
pinout for byte-wide memories, compatible with industry
standard RAMs.
The X28HC64 supports a 64-byte page write operation, effectively
providing a 32µs/byte write cycle, and enabling the entire
memory to be typically written in 0.25 seconds. The X28HC64
also features DATA Polling and Toggle Bit Polling, two methods
providing early end of write detection. In addition, the X28HC64
includes a user-optional software data protection mode that
further enhances Intersil’s hardware write protect capability.
Intersil EEPROMs are designed and tested for applications
requiring extended endurance. Inherent data retention is
greater than 100 years.
Features
70ns access time
Simple byte and page write
-Single 5V supply
-No external high voltages or VP-P control circuits
-Self-timed
- No erase before write
- No complex programming algorithms
- No overerase problem
•Low power CMOS
- 40mA active current maximum
200µA standby current maximum
Fast write cycle times
- 64-byte page write operation
- Byte or page write cycle: 2ms typical
- Complete memory rewrite: 0.25s typical
- Effective byte write cycle time: 32µs typical
Software data protection
•End of write detection
- DATA polling
-Toggle bit
High reliability
- Endurance: 100,000 cycles
- Data retention: 100 years
•JEDEC approved byte-wide pinout
Pb-free available (RoHS compliant)
Pin Configurations
X28HC64
(28 LD PDIP, SOIC)
TOP VIEW
X28HC64
(32 LD PLCC)
TOP VIEW
NC
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
VSS
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
VCC
WE
NC
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
X28HC64
A6
A5
A4
A3
A2
A1
A0
NC
I/O0
A
8
A
9
A
11
NC
OE
A10
CE
I/O7
I/O6
4 3 2 1 32 31 30
14 15 16 17 18 19 20
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7
I/O1
I/O2
VSS
I/O3
I/O4
I/O5
A12
NC
VCC
WE
NC
X28HC64
NC
NC
X28HC64
FN8109 Rev 4.00 Page 2 of 18
June 27, 2016
Ordering Information
PART NUMBER PART MARKING
TEMPERATURE
RANGE (°C)
ACCESS TIME
(ns) PACKAGE
PKG.
DWG. #
X28HC64J-70 (Notes 1, 6)
(No longer available, recommended
replacement: X28HC64JZ-70)
X28HC64J-70 CY 0 to +70 70 32 Ld PLCC N32.45x55
X28HC64JIZ-70 (Notes 1, 4, 6) X28HC64JI-70 ZCY -40 to +85 32 Ld PLCC (RoHS Compliant) N32.45x55
X28HC64JZ-70 (Notes 1, 4, 6) X28HC64J-70 ZCY 0 to +70 32 Ld PLCC (RoHS Compliant) N32.45x55
X28HC64SIZ-70 (Notes 4, 6) X28HC64SI-70 CYZ -40 to +85 28 Ld SOIC (300 mil) (RoHS
Compliant)
M28.3
X28HC64SZ-70 (Notes 4, 6) X28HC64S-70 CYZ 0 to +70 28 Ld SOIC (300 mil) (RoHS
Compliant)
M28.3
X28HC64J-90 (Notes 1, 6)
(No longer available, recommended
replacement: X28HC64JIZ-90)
X28HC64J-90 CY 0 to +70 90 32 Ld PLCC N32.45x55
X28HC64JI-90 (Notes 1, 3, 6)
(No longer available, recommended
replacement: X28HC64JIZ-90)
X28HC64JI-90 CY -40 to +85 32 Ld PLCC N32.45x55
X28HC64JIZ-90 (Notes 1, 4, 6) X28HC64JI-90 ZCY -40 to +85 32 Ld PLCC (RoHS Compliant) N32.45x55
X28HC64PIZ-90 (Notes 4, 5) X28HC64PI-90 CYZ -40 to +85 28 Ld PDIP (RoHS Compliant) E28.6
X28HC64PZ-90 (Notes 4, 5) X28HC64P-90 CYZ 0 to +70 28 Ld PDIP (RoHS Compliant) E28.6
X28HC64J-12 (Notes 1, 6)
(No longer available, recommended
replacement: X28HC64JZ-12)
X28HC64J-12 CY 0 to +70 120 32 Ld PLCC N32.45x55
X28HC64JI-12 (Notes 1, 6)
(No longer available, recommended
replacement: X28HC64JIZ-12)
X28HC64JI-12 CY -40 to +85 32 Ld PLCC N32.45x55
X28HC64JIZ-12 (Notes 1, 4, 6) X28HC64JI-12 ZCY -40 to +85 32 Ld PLCC (RoHS Compliant) N32.45x55
X28HC64JZ-12* (Notes 1, 4, 6) X28HC64J-12 ZCY 0 to +70 32 Ld PLCC (RoHS Compliant) N32.45x55
X28HC64PIZ-12 (Notes 4, 5) X28HC64PI-12 CYZ -40 to +85 28 Ld PDIP (RoHS Compliant) E28.6
X28HC64PZ-12 (Notes 4, 5) X28HC64P-12 CYZ 0 to +70 28 Ld PDIP (RoHS Compliant) E28.6
X28HC64SIZ-12 (Notes 2, 4, 6) X28HC64SI-12 CYZ -40 to +85 28 Ld SOIC (300 mil) (RoHS
Compliant)
M28.3
X28HC64SZ-12 (Notes 4, 6) X28HC64S-12 CYZ 0 to +70 28 Ld SOIC (300 mil) (RoHS
Compliant)
M28.3
NOTES:
1. Add “T1” suffix for 750 unit tape and reel option.
2. Add “T1” suffix for 1000 unit tape and reel option.
3. Add “T2” suffix for 750 unit tape and reel option.
4. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte
tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil Pb-
free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
5. Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications.
6. For Moisture Sensitivity Level (MSL), please see product information page for X28HC64. For more information on MSL, please see tech brief TB363.
X28HC64
FN8109 Rev 4.00 Page 3 of 18
June 27, 2016
Device Operation
Read
Read operations are initiated by both OE and CE LOW. The read
operation is terminated by either CE or OE returning HIGH. This
two line control architecture eliminates bus contention in a
system environment. The data bus will be in a high impedance
state when either OE or CE is HIGH.
Write
Write operations are initiated when both CE and WE are LOW and
OE is HIGH. The X28HC64 supports both a CE and WE controlled
write cycle. That is, the address is latched by the falling edge of
either CE or WE, whichever occurs last. Similarly, the data is
latched internally by the rising edge of either CE or WE, whichever
occurs first. A byte write operation, once initiated, will
automatically continue to completion, typically within 2ms.
Page Write Operation
The page write feature of the X28HC64 allows the entire memory
to be written in 0.25 seconds. Page write allows two to sixty-four
bytes of data to be consecutively written to the X28HC64 prior to
the commencement of the internal programming cycle. The host
can fetch data from another device within the system during a
page write operation (change the source address), but the page
address (A6 through A12) for each subsequent valid write cycle to
the part during this operation must be the same as the initial page
address.
The page write mode can be initiated during any write operation.
Following the initial byte write cycle, the host can write an
additional one to sixty-three bytes in the same manner. Each
successive byte load cycle, started by the WE HIGH to LOW
transition, must begin within 100µs of the falling edge of the
preceding WE. If a subsequent WE HIGH to LOW transition is not
detected within 100µs, the internal automatic programming
cycle will commence. There is no page write window limitation.
Effectively the page write window is infinitely wide, so long as the
host continues to access the device within the byte load cycle
time of 100µs.
Write Operation Status Bits
The X28HC64 provides the user two write operation status bits.
These can be used to optimize a system write cycle time. The
status bits are mapped onto the I/O bus as shown in Figure 2.
Pin Descriptions
SYMBOL DESCRIPTION
A0-A12 Address Inputs. The Address inputs
select an 8-bit memory location
during a read or write operation.
I/O0-I/O7Data Input/Output. Data is written
to or read from the X28HC64
through the I/O pins.
WE Write Enable. The Write Enable
input controls the writing of data to
the X28HC64.
CE Chip Enable. The Chip Enable input
must be LOW to enable all
read/write operations. When CE is
HIGH, power consumption is
reduced.
OE Output Enable. The Output Enable
input controls the data output
buffers and is used to initiate read
operations.
VCC +5V
VSS Ground
NC No Connect
Block Diagram
FIGURE 1. BLOCK DIAGRAM
X BUFFERS
LATCHES AND
DECODER
I/O BUFFERS
AND LATCHES
Y BUFFERS
LATCHES
DECODER
CONTROL
LOGIC AND
TIMING
65,536-BIT
EEPROM
ARRAY
I/O0–I/O7
DATA INPUTS/OUTPUTS
CE
OE
VCC
VSS
A0–A12
WE
ADDRESS
INPUTS
AND
5TBDP 43210I/O
RESERVED
TOGGLE BIT
DATA POLLING
FIGURE 2. STATUS BIT ASSIGNMENT
X28HC64
FN8109 Rev 4.00 Page 4 of 18
June 27, 2016
DATA Polling (I/O7)
The X28HC64 features DATA Polling as a method to indicate to
the host system that the byte write or page write cycle has
completed. DATA Polling allows a simple bit test operation to
determine the status of the X28HC64, eliminating additional
interrupt inputs or external hardware. During the internal
programming cycle, any attempt to read the last byte written will
produce the complement of that data on I/O7 (i.e., write data =
0xxx xxxx, read data = 1xxx xxxx). Once the programming cycle is
complete, I/O7 will reflect true data.
DATA Polling can effectively reduce the time for writing to the
X28HC64. The timing diagram in Figure 3 illustrates the
sequence of events on the bus. The software flow diagram in
Figure 4 illustrates one method of implementing the routine.
FIGURE 3. DATA POLLING BUS SEQUENCE
FIGURE 4. DATA POLLING SOFTWARE FLOW
CE
OE
WE
I/O7
X28HC64
READY
LAST
WRITE
HIGH Z
VOL
VIH
A0–A12 An An An An An An
VOH
An
WRITE DATA
SAVE LAST DATA
AND ADDRESS
READ LAST
ADDRESS
IO7
COMPARE?
NO
YES
WRITES
COMPLETE?
NO
YES
READY
X28HC64
FN8109 Rev 4.00 Page 5 of 18
June 27, 2016
Toggle Bit (I/O6)
The X28HC64 also provides another method for determining
when the internal write cycle is complete. During the internal
programming cycle I/O6 will toggle from HIGH to LOW and LOW
to HIGH on subsequent attempts to read the device. When the
internal cycle is complete, the toggling will cease and the device
will be accessible for additional read or write operations.
The Toggle Bit can eliminate the chore of saving and fetching the
last address and data in order to implement DATA Polling. This
can be especially helpful in an array comprised of multiple
X28HC64 memories that is frequently updated. Toggle Bit Polling
can also provide a method for status checking in multiprocessor
applications. The timing diagram in Figure 5 illustrates the
sequence of events on the bus. The software flow diagram in
Figure 6 illustrates a method for polling the Toggle Bit.
FIGURE 5. TOGGLE BIT BUS SEQUENCE
FIGURE 6. TOGGLE BIT SOFTWARE FLOW
CE
OE
WE
X28HC64
LAST
WRITE
I/O6HIGH Z
**
VOH
VOL
READY
* BEGINNING AND ENDING STATE OF I/O6 WILL VARY.
COMPARE NO
YES
OK?
COMPARE
ACCUM WITH
ADDR N
LOAD ACCUM
FROM ADDR N
LAST WRITE
READY
YES
X28HC64
FN8109 Rev 4.00 Page 6 of 18
June 27, 2016
Hardware Data Protection
The X28HC64 provides two hardware features that protect
nonvolatile data from inadvertent writes.
•Default V
CC Sense—All write functions are inhibited when VCC is
3V typically.
Write Inhibit—Holding either OE LOW, WE HIGH, or CE HIGH will
prevent an inadvertent write cycle during power-up and
power-down, maintaining data integrity.
Software Data Protection
The X28HC64 offers a software controlled data protection feature.
The X28HC64 is shipped from Intersil with the software data
protection NOT ENABLED; that is, the device will be in the standard
operating mode. In this mode data should be protected during
power-up/power-down operations through the use of external
circuits. The host would then have open read and write access of the
device once VCC was stable.
The X28HC64 can be automatically protected during power-up
and power-down without the need for external circuits by
employing the software data protection feature. The internal
software data protection circuit is enabled after the first write
operation utilizing the software algorithm. This circuit is
nonvolatile and will remain set for the life of the device, unless
the reset command is issued.
Once the software protection is enabled, the X28HC64 is also
protected from inadvertent and accidental writes in the
powered-up state. That is, the software algorithm must be issued
prior to writing additional data to the device.
Software Algorithm
Selecting the software data protection mode requires the host
system to precede data write operations by a series of three write
operations to three specific addresses. Refer to Figures 7 and 8
for the sequence. The 3-byte sequence opens the page write
window, enabling the host to write from 1 to 64 bytes of data.
Once the page load cycle has been completed, the device will
automatically be returned to the data protected state.
Regardless of whether the device has previously been protected
or not, once the software data protection algorithm is used, the
X28HC64 will automatically disable further writes unless another
command is issued to deactivate it. If no further commands are
issued, the X28HC64 will be write protected during power-down
and after any subsequent power-up.
Note: Once initiated, the sequence of write operations should not
be interrupted.
FIGURE 7. TIMING SEQUENCE—BYTE OR PAGE WRITE
FIGURE 8. WRITE SEQUENCE FOR SOFTWARE DATA PROTECTION
CE
WE
(VCC)
WRITE
PROTECTED
VCC
0V
DATA
ADDR
AAA
1555
55
0AAA
A0
1555
≤tBLC MAX
WRITES
OK
BYTE
OR
PAGE
tWC
WRITE LAST
WRITE DATA XX
TO ANY
WRITE DATA A0
TO ADDRESS
1555
WRITE DATA 55
TO ADDRESS
0AAA
WRITE DATA AA
TO ADDRESS
1555
AFTER TWC
RE-ENTERS DATA
PROTECTED STATE
BYTE TO
LAST ADDRESS
ADDRESS OPTIONAL
BYTE/PAGE
LOAD OPERATION
BYTE/PAGE
LOAD ENABLED
X28HC64
FN8109 Rev 4.00 Page 7 of 18
June 27, 2016
In the event the user wants to deactivate the software data
protection feature for testing or reprogramming in an EEPROM
programmer, the following six step algorithm will reset the
internal protection circuit. After tWC, the X28HC64 will be in
standard operating mode.
Note: Once initiated, the sequence of write operations should not
be interrupted.
Resetting Software Data Protection
FIGURE 9. RESET SOFTWARE DATA PROTECTION TIMING SEQUENCE
FIGURE 10. SOFTWARE SEQUENCE TO DEACTIVATE SOFTWARE DATA PROTECTION
CE
WE
STANDARD
OPERATING
MODE
VCC
DATA
ADDR
AAA
1555
55
0AAA
80
1555 tWC
AA
1555
55
0AAA
20
1555
WRITE DATA 55
TO ADDRESS
0AAA
WRITE DATA 55
TO ADDRESS
0AAA
WRITE DATA 80
TO ADDRESS
1555
WRITE DATA AA
ADDRESS
1555
WRITE DATA 20
TO ADDRESS
1555
WRITE DATA AA
TO ADDRESS
1555
X28HC64
FN8109 Rev 4.00 Page 8 of 18
June 27, 2016
System Considerations
Because the X28HC64 is frequently used in large memory arrays,
it is provided with a two-line control architecture for both read
and write operations. Proper usage can provide the lowest
possible power dissipation, and eliminate the possibility of
contention where multiple I/O pins share the same bus.
To gain the most benefit, it is recommended that CE be decoded
from the address bus, and be used as the primary device
selection input. Both OE and WE would then be common among
all devices in the array. For a read operation, this assures that all
deselected devices are in their standby mode, and that only the
selected device(s) is/are outputting data on the bus.
Because the X28HC64 has two power modes, standby and
active, proper decoupling of the memory array is of prime
concern. Enabling CE will cause transient current spikes. The
magnitude of these spikes is dependent on the output capacitive
loading of the I/Os. Therefore, the larger the array sharing a
common bus, the larger the transient spikes. The voltage peaks
associated with the current transients can be suppressed by the
proper selection and placement of decoupling capacitors. As a
minimum, it is recommended that a 0.1µF high frequency
ceramic capacitor be used between VCC and VSS at each device.
Depending on the size of the array, the value of the capacitor
may have to be larger.
In addition, it is recommended that a 4.7µF electrolytic bulk
capacitor be placed between VCC and VSS for each eight devices
employed in the array. This bulk capacitor is employed to
overcome the voltage droop caused by the inductive effects of
the PC board traces.
FIGURE 11. NORMALIZED ICC(RD) BY TEMPERATURE
OVER FREQUENCY DATA PROTECTION
FIGURE 12. NORMALIZED ICC(RD) AT 25% OVER THE VCC RANGE
AND FREQUENCY
1.4
1.2
0.8
0.4
0.6
0.2
1.0
0M 10M 20M
- 55°C
+ 25°C
FREQUENCY (Hz)
+ 125°C
5.5VCC
ICCRD
NORMALIZED (mA)
4.5VCC
5.0VCC
5.5VCC
1.4
1.2
0.8
0.4
0.6
0.2
1.0
0M 10M 20M
FREQUENCY (Hz)
ICCRD
NORMALIZED (mA)
X28HC64
FN8109 Rev 4.00 Page 9 of 18
June 27, 2016
Absolute Maximum Ratings Thermal Information
Temperature Under Bias
X28HC64 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -10°C to +85°C
X28HC64I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Voltage on any Pin with Respect to VSS . . . . . . . . . . . . . . . . . . . . .-1V to +7V
DC Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA
Thermal Resistance (Typical) JA (°C/W) JC (°C/W)
32 Ld PLCC Package (Notes 7, 9) . . . . . . . 41 19
28 Ld SOIC Package (Notes 7, 9) . . . . . . . . 46 19
28 Ld PDIP Package (Notes 8, 9). . . . . . . . 53 21
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493
*Pb-free PDIPs can be used for through hole wave solder processing only.
They are not intended for use in Reflow solder processing applications.
Recommended Operating Conditions
Commercial Temperature Range . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Industrial Temperature Range . . . . . . . . . . . . . . . . . . . . . . . -40°C to +85°C
Supply Voltage Range
X28HC64 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5V ±10%
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
7. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
8. JA is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
9. For JC, the “case temp” location is taken at the package top center.
DC Electrical Specifications Over recommended operating conditions, unless otherwise specified.
PARAMETER SYMBOL TEST CONDITIONS
MIN
(Note 10)
TYP
(Note 11)
MAX
(Note 10)UNIT
VCC Current (Active) (TTL Inputs) ICC CE = OE = VIL, WE = VIH, All I/O’s = open, address
inputs = TTL levels at f = 10MHz
15 40 mA
VCC Current (Standby) (TTL Inputs) ISB1 CE = VIH, OE = VIL All I/O’s = open, other inputs = VIH 12mA
VCC Current (Standby) (CMOS Inputs) ISB2 CE = VCC - 0.3V, OE = GND, All I/O’s = open, other
inputs = VCC - 0.3V
100 200 µA
Input Leakage Current ILI VIN = VSS to VCC ±10 µA
Output Leakage Current ILO VOUT = VSS to VCC, CE = VIH ±10 µA
Input LOW Voltage (Note 12)V
lL -1 0.8 V
Input HIGH Voltage (Note 12)V
IH 2V
CC + 1 V
Output LOW Voltage VOL IOL = 5mA 0.4 V
Output HIGH Voltage VOH IOH = -5mA 2.4 V
NOTES:
10. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.
11. Typical values are for TA = +25°C and nominal supply voltage.
12. VIL minimum and VIH maximum are for reference only and are not tested.
Endurance and Data Retention The endurance and data retention specifications are established by characterization and are not
production tested.
PARAMETER MIN MAX UNIT
Minimum Endurance 100,000 Cycles
Data Retention 100 Years
X28HC64
FN8109 Rev 4.00 Page 10 of 18
June 27, 2016
Power-Up Timing
PARAMETER SYMBOL
TYP
(Note 11)UNIT
Power-Up to Read Operation (Note 13)t
PUR 100 µs
Power-Up to Write Operation (Note 13)t
PUW 5ms
Capacitance TA = +25°C, f = 1MHz, VCC = 5V
PARAMETER SYMBOL TEST CONDITIONS MAX UNIT
Input/output Capacitance (Note 13)C
I/O VI/O = 0V 10 pF
Input Capacitance (Note 13)C
IN VIN = 0V 6 pF
NOTE:
13. This parameter is periodically sampled and not 100% tested.
TABLE 1. AC CONDITIONS OF TEST
Input Pulse Levels 0V to 3V
Input Rise and Fall Times 5ns
Input and Output Timing Levels 1.5V
TABLE 2. MODE SELECTION
CE OE WE MODE I/O POWER
LLHRead D
OUT Active
LHLWrite D
IN Active
HXXStandby and write
inhibit
High Z Standby
XLXWrite inhibit --
XXHWrite inhibit - -
Equivalent AC Load Circuits
FIGURE 13. EQUIVALENT AC LOAD CIRCUITS
5V
1.92kΩ
30pF
OUTPUT
1.37kΩ
Symbol Table
WAVEFORM INPUTS OUTPUTS
Must be
steady
Will be
steady
Ma y change
from LOW
to HIGH
Will change
from LOW
to HIGH
Ma y change
from HIGH
to LOW
Will change
from HIGH
to LOW
Don’t Care:
Changes
Allowed
Changing:
State Not
Known
N/A Center Line
is High
Impedance
X28HC64
FN8109 Rev 4.00 Page 11 of 18
June 27, 2016
AC Electrical Specifications
Read Cycle Limits Over the recommended operating conditions unless otherwise specified.
PARAMETER SYMBOL
X28HC64-70 X28HC64-90 X28HC64-12
UNIT
MIN
(Note 10)
MAX
(Note 10)
MIN
(Note 10)
MAX
(Note 10)
MIN
(Note 10)
MAX
(Note 10)
Read Cycle Time tRC 70 90 120 ns
Chip Enable Access Time tCE 70 90 120 ns
Address Access Time tAA 70 90 120 ns
Output Enable Access Time tOE 35 40 50 ns
CE LOW to Active Output (Note 14)t
LZ 000 ns
OE LOW to Active Output (Note 14)t
OLZ 000 ns
CE HIGH to High Z Output (Note 14)t
HZ 30 30 30 ns
OE HIGH to High Z Output (Note 14)t
OHZ 30 30 30 ns
Output Hold from Address Change tOH 000ns
NOTE:
14. tLZ minimum, tHZ, tOLZ minimum, and tOHZ are periodically sampled and not 100% tested. tHZ maximum and tOHZ maximum are measured from the
point when CE or OE return HIGH (whichever occurs first) to the time when the outputs are no longer driven.
Read Cycle
FIGURE 14. READ CYCLE
tCE
tRC
ADDRESS
CE
OE
WE
DATA VALID
tOE
tLZ
tOLZ
tOH
tAA
tHZ
tOHZ
DATA I/O
VIH
HIGH Z
DATA VALID
X28HC64
FN8109 Rev 4.00 Page 12 of 18
June 27, 2016
Write Cycle Limits
PARAMETER SYMBOL
MIN
(Note 10)
TYP
(Note 11)
MAX
(Note 10)UNIT
Write Cycle Time (Note 15)t
WC 25ms
Address Set-Up Time tAS 0ns
Address Hold Time tAH 50 ns
Write Set-Up Time tCS 0ns
Write Hold Time tCH 0ns
CE Pulse Width tCW 50 ns
OE High Set-Up Time tOES 0ns
OE High Hold Time tOEH 0ns
WE Pulse Width tWP 50 ns
WE HIGH Recovery (Note 16)t
WPH 50 ns
Data Valid (Note 16)t
DV s
Data Setup tDS 50 ns
Data Hold tDH 0ns
Delay to Next Write (Note 16)t
DW 10 µs
Byte Load Cycle tBLC 0.15 100 µs
NOTES:
15. tWC is the minimum cycle time to be allowed from the system perspective unless polling techniques are used. It is the maximum time the device
requires to automatically complete the internal write operation.
16. tWPH and tDW are periodically sampled and not 100% tested.
WE Controlled Write Cycle
FIGURE 15. WE CONTROLLED WRITE CYCLE
ADDRESS
tAS
tWC
tAH
tOES
tDS tDH
tOEH
CE
WE
OE
DATA IN
DATA OUT
HIGH Z
tCS tCH
tWP
tDV
DATA VALID
X28HC64
FN8109 Rev 4.00 Page 13 of 18
June 27, 2016
FIGURE 16. CE CONTROLLED WRITE CYCLE
FIGURE 17. PAGE WRITE CYCLE
NOTES:
17. Between successive byte writes within a page write operation, OE can be strobed LOW: e.g. this can be done with CE and WE HIGH to fetch data from
another memory device within the system for the next write; or with WE HIGH and CE LOW effectively performing a polling operation.
18. The timings shown above are unique to page write operations. Individual byte load operations within the page write must conform to either the CE
or WE controlled write cycle timing.
ADDRESS
tAS
tOEH
tWC
tAH
tOES
tCS
tDS tDH
tCH
CE
WE
OE
DATA IN
DATA OUT HIGH Z
DATA VALID
tCW
tDV
WE
OE
LAST BYTE
Byte 0 Byte 1 Byte 2 Byte n Byte n+1 Byte n+2
tWP
tWPH
tBLC
tWC
CE
ADDRESS
I/O
*For each successive write within the page write operation, A6–A12 should be the same or
writes to an unknown address could occur.
Note 17
Note 18
X28HC64
FN8109 Rev 4.00 Page 14 of 18
June 27, 2016
FIGURE 18. DATA POLLING TIMING DIAGRAM (Note 19)
FIGURE 19. TOGGLE BIT TIMING DIAGRAM (Note 19)
NOTE:
19. Polling operations are by definition read cycles and are therefore subject to read cycle timings.
ADDRESS An
DIN = X DOUT = X
tOEH tOES
AnAn
CE
WE
OE
I/O7
tDW
DOUT = X
tWC
CE
OE
WE
I/O*6
tOES
tDW
tOEH
HIGH Z
*
*
* I/O6 beginning and ending state will vary, depending upon actual tWC.
tWC
X28HC64
FN8109 Rev 4.00 Page 15 of 18
June 27, 2016
About Intersil
Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products
address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets.
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product
information page found at www.intersil.com.
You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask.
Reliability reports are also available from our website at www.intersil.com/support.
Revision History The revision history provided is for informational purposes only and is believed to be accurate, but not warranted.
Please go to the web to make sure that you have the latest revision.
DATE REVISION CHANGE
June 27, 2016 FN8109.4 Updated entire datasheet applying Intersil’s new standards.
Updated the Ordering Information table by adding Note 2, updated other tape and reel notes, updated all of the
part marking and added Note 6.
Added Thermal Information (Theta JA, Theta JC, and applicable notes) on page 9.
Added “The endurance and data retention specifications are established by characterization and are not
production tested” to the “Endurance and Data Retention” table.
August 18, 2015 FN8109.3 - Updated Ordering Information Table on page 2.
- Added Revision History and About Intersil sections.
- Updated POD M28.3 to latest revision changes are as follow:
Added land pattern.
X28HC64
FN8109 Rev 4.00 Page 16 of 18
June 27, 2016
Plastic Leaded Chip Carrier Packages (PLCC)
A1
A
SEATING
PLANE
0.015 (0.38)
MIN
VIEW “A”
D2/E2
0.025 (0.64)
0.045 (1.14) R
0.042 (1.07)
0.056 (1.42)
0.050 (1.27) TP
E
E1
PIN (1)
C
L
D1
D
0.020 (0.51) MAX
3 PLCS
0.026 (0.66)
0.032 (0.81)
0.050 (1.27)
MIN
0.013 (0.33)
0.021 (0.53)
0.025 (0.64)
MIN
VIEW “A” TYP.
0.004 (0.10) C
-C-
D2/E2
C
L
NE
ND
IDENTIFIER
(0.12) MDS
- B SAS
0.042 (1.07)
0.048 (1.22)
0.005
N32.45x55 (JEDEC MS-016AE ISSUE A)
32 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A0.125 0.140 3.18 3.55 -
A1 0.060 0.095 1.53 2.41 -
D0.485 0.495 12.32 12.57 -
D1 0.447 0.453 11.36 11.50 3
D2 0.188 0.223 4.78 5.66 4, 5
E0.585 0.595 14.86 15.11 -
E1 0.547 0.553 13.90 14.04 3
E2 0.238 0.273 6.05 6.93 4, 5
N28 286
ND 7 7 7
NE 9 9 7
Rev. 0 7/98
NOTES:
1. Controlling dimension: INCH. Converted millimeter
dimensions are not necessarily exact.
2. Dimensions and tolerancing per ANSI Y14.5M-1982.
3. Dimensions D1 and E1 do not include mold protrusions.
Allowable mold protrusion is 0.010 inch (0.25mm) per side.
Dimensions D1 and E1 include mold mismatch and are
measured at the extreme material condition at the body
parting line.
4. To be measured at seating plane contact point.
5. Centerline to be determined where center leads exit plastic
body.
6. “N” is the number of terminal positions.
7. ND denotes the number of leads on the two shorts sides of the
package, one of which contains pin #1. NE denotes the
number of leads on the two long sides of the package.
X28HC64
FN8109 Rev 4.00 Page 17 of 18
June 27, 2016
Small Outline Plastic Packages (SOIC)
a
INDEX
AREA
E
D
N
123
-B-
0.25(0.010) C AMBS
e
-A-
L
B
M
-C-
A1
A
SEATING PLANE
0.10(0.004)
h x 45o
C
H0.25(0.010) BM M
(1.50mm)
(9.38mm)
(1.27mm TYP) (0.51mm TYP)
TYPICAL RECOMMENDED LAND PATTERN
M28.3 (JEDEC MS-013-AE ISSUE C)
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A0.0926 0.1043 2.35 2.65 -
A1 0.0040 0.0118 0.10 0.30 -
B0.013 0.0200 0.33 0.51 9
C0.0091 0.0125 0.23 0.32 -
D0.6969 0.7125 17.70 18.10 3
E0.2914 0.2992 7.40 7.60 4
e 0.05 BSC 1.27 BSC -
H0.394 0.419 10.00 10.65 -
h0.01 0.029 0.25 0.75 5
L0.016 0.050 0.40 1.27 6
N28 287
0o8o0o8o-
Rev. 1, 1/13
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above
the seating plane, shall not exceed a maximum value of 0.61mm (0.024
inch)
10. Controlling dimension: MILLIMETER. Converted inch dimensions are
not necessarily exact.
FN8109 Rev 4.00 Page 18 of 18
June 27, 2016
X28HC64
Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such
modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are
current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its
subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
For additional products, see www.intersil.com/en/products.html
© Copyright Intersil Americas LLC 2005-2016. All Rights Reserved.
All trademarks and registered trademarks are the property of their respective owners.
Dual-In-Line Plastic Packages (PDIP)
NOTES:
1. Controlling Dimensions: INCH. In case of conflict between English and
Metric dimensions, the inch dimensions control.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication No. 95.
4. Dimensions A, A1 and L are measured with the package seated in JEDEC
seating plane gauge GS-3.
5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold
flash or protrusions shall not exceed 0.010 inch (0.25mm).
6. E and are measured with the leads constrained to be
perpendicular to datum .
7. eB and eC are measured at the lead tips with the leads unconstrained. eC
must be zero or greater.
8. B1 maximum dimensions do not include dambar protrusions. Dambar
protrusions shall not exceed 0.010 inch (0.25mm).
9. N is the maximum number of terminal positions.
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).
eA
C
L
E
eA
C
eB
eC
-B-
E1
INDEX 12 3 N/2
N
AREA
SEATING
BASE
PLANE
PLANE
-C-
D1
B1
B
e
D
D1
A
A2
L
A1
-A-
0.010 (0.25) C AMBS
E28.6 (JEDEC MS-011-AB ISSUE B)
28 LEAD DUAL-IN-LINE PLASTIC PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A-0.250 -6.35 4
A1 0.015 -0.39 -4
A2 0.125 0.195 3.18 4.95 -
B0.014 0.022 0.356 0.558 -
B1 0.030 0.070 0.77 1.77 8
C0.008 0.015 0.204 0.381 -
D1.380 1.565 35.1 39.7 5
D1 0.005 -0.13 -5
E0.600 0.625 15.24 15.87 6
E1 0.485 0.580 12.32 14.73 5
e 0.100 BSC 2.54 BSC -
eA0.600 BSC 15.24 BSC 6
eB-0.700 -17.78 7
L0.115 0.200 2.93 5.08 4
N28 289
Rev. 1 12/00