1
Features
Low-voltage and Standard-voltage Operation
2.7 (VCC = 2.7V to 5.5V)
1.8 (VCC = 1.8V to 5.5V)
User-selectable Internal O rganization
1K: 128 x 8 or 64 x 16
2K: 256 x 8 or 128 x 16
4K: 512 x 8 or 256 x 16
3-w ire Serial Interface
2 MHz Clock Rate (5V)
Self-timed Wri te Cycle (10 ms max)
High Reliabilit y
Endurance: 1 Million Wr it e Cycles
Data Retention: 100 Years
A utomotive Grade, Exte nded Temperature and Lead-Fre e Devices Av ailable
8-lead PDIP, 8-lead JEDEC SOIC, 8-lead EIAJ SOIC, 8-lead MAP, 8-lead TSSOP
and 8-ball dBGA2 Packages
Description
The AT 93C 46/5 6/66 pr ovides 10 24/20 48/4 096 bi ts of se rial electr ical ly erasable p ro-
gramm able read only m emo ry (E EP ROM) org anize d as 64/ 128/2 56 wo rds of 16 b its
each, when the ORG pi n is co nnected to VCC and 128 /256/512 words of 8 bits each
when it is tied to ground. The device is optimized fo r use in many industri al and com-
mercial applications where low power and low voltage operations ar e essential. The
AT93C46/56 /66 is availabl e in sp ace-saving 8-lead P DI P, 8-lead J ED EC SO IC, 8-lead
EIAJ SOIC, 8-lead MAP, 8-lead TSSOP and 8-ball dBGA2™ packages.
3-wire Se rial
EEPROMs
1K (128 x 8 or 64 x 16)
2K (256 x 8 or 128 x 16)
4K (512 x 8 or 256 x 16)
AT93C46
AT93C56(1)
AT93C66(2)
Note: 1. This device is not recom-
mended for new designs.
Please refer to AT93C56A.
2. This device is not recom-
mended for new designs.
Please refer to AT93C66A.
Rev. 0172U–SEEPR–8/03
Pin Configurati ons
Pin Name Function
CS Chip Select
SK Seria l Data Cloc k
DI Seria l Dat a Input
DO Seria l Data Output
GND Ground
VCC Power Supply
ORG Internal Organization
DC Don’t Connect
8-l ead PDIP
1
2
3
4
8
7
6
5
CS
SK
DI
DO
VCC
DC
ORG
GND
8-lead SOI C
Rotated (R)
(1K JEDEC Only)
1
2
3
4
8
7
6
5
DC
VCC
CS
SK
ORG
GND
DO
DI
8-lead SOIC
1
2
3
4
8
7
6
5
CS
SK
DI
DO
VCC
DC
ORG
GND
8-le ad TSSO P
1
2
3
4
8
7
6
5
CS
SK
DI
DO
VCC
DC
ORG
GND
8-lead MAP
Bottom View
1
2
3
4
8
7
6
5
VCC
DC
ORG
GND
CS
SK
DI
DO
8-ball dBGA2
Bottom View
VCC
DC
ORG
GND
CS
SK
DI
DO
1
2
3
4
8
7
6
5
2AT93C46/56/66 0172U–SEEPR–8/03
The AT9 3C46/ 56/66 is ena bled throu gh the Chip Select p in (CS), an d accesse d via a 3-wire serial interface consistin g of
Data Input (DI), Dat a Ou tput (DO ), and S hift Clock (SK). Upon receiving a RE AD instruction at DI , the address is decod ed
and the data is clocked out serially on the data output pin DO. The WRITE cycle is completely s elf-timed and no sepa rate
ERASE cycle is required bef ore WRITE. The WRITE cycle is only enabled when the part is in the ERASE/WRITE ENABLE
state. When CS is brought “high” following the initiation of a W RITE cycle, the DO pin outputs the READY/BUSY status of
the part.
The AT93C46/56/66 is available in 2.7V to 5.5V and 1.8V to 5.5V versions.
Block Diagram
Note: 1. When t he OR G pin is connected to VCC, the x 16 organization is selected. When it is con nected to ground , the x 8 organiza-
tion is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the
internal 1 Meg ohm pullup, then the x 16 organi zation is selected. The feature is not available on the 1.8V devices.
2. For t he AT93C46, if x 16 organization is the mode of choice and Pin 6 (ORG) is left unconnected, Atmel recommends using
the AT93C46A device. For more details, see the AT93C46A datashee t.
Absolute Ma ximum Ratings*
Operating Temperature.................................. -55°C to +125°C*NOTICE: Stresses beyond those listed under “Absol ute
Maxim um Ratin gs” may cause permanent dam -
age to the de vice . This is a st ress rati ng only and
functional op eration of the de vice a t thes e or an y
other conditions beyond those indi cated in the
operational sections of this specifi cation is not
implied. Exposure to absol ute maxi m um rating
condit ions for extended periods may affect
device reliability
Storage Temperature.................... ................. -65°C to +150°C
Vol tage on An y Pin
wit h R e spe ct to Gr o und ........... ......... .......... .......-1.0V to +7.0 V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
3
AT93C46/56/66
0172U–SEEPR–8/03
Note: 1. This paramete r is characteriz ed and is not 100% tested.
Note: 1. VIL min and VIH max are reference only and ar e not tested.
Pin C apacitance(1)
Applicable over recomm ended operating range from TA = 25°C, f = 1 .0 MHz, VCC = +5.0V (unless otherwise noted).
Symbol Test Conditions Max Units Conditi ons
COUT Output Capacitance (DO) 5 pF VOUT = 0V
CIN Input Capacitance (CS , SK, DI) 5 pF VIN = 0 V
DC Characteristics
Applicable over recomm ended operating range from: TAI = -4 0°C to +85°C, VCC = +1.8V to +5.5V,
TAE = -40°C to +125°C, VCC = +1. 8V to +5.5V (unless otherwise noted).
Symbol P arameter Test Conditi on Min Typ Max Unit
VCC1 Supply Vol tage 1.8 5.5 V
VCC2 Supply Vol tage 2.7 5.5 V
VCC3 Supply Vol tage 4.5 5.5 V
ICC Supply Current VCC = 5.0V READ at 1.0 MHz 0.5 2.0 mA
WRITE at 1.0 MHz 0.5 2.0 mA
ISB1 Standby Current VCC = 1.8V CS = 0V 0 0.1 µA
ISB2 Standby Current VCC = 2.7V CS = 0V 6.0 10.0 µA
ISB3 Standby Current VCC = 5.0V CS = 0V 17 30 µA
IIL Input Leakage VIN = 0V to VCC 0.1 1.0 µA
IOL Output Leakage VIN = 0V to VCC 0.1 1.0 µA
VIL1(1)
VIH1(1) Input Low Voltage
Input High Vol tage 2.7V VCC 5.5 V -0.6
2.0 0.8
VCC + 1 V
VIL2(1)
VIH2(1) Input Low Voltage
Input High Vol tage 1.8V VCC 2.7V -0.6
VCC x 0.7 VCC x 0.3
VCC + 1 V
VOL1
VOH1
Output Lo w Vo ltage
Output High Voltage 2.7V VCC 5.5V IOL = 2.1 mA 0.4 V
IOH = -0.4 mA 2.4 V
VOL2
VOH2
Output Lo w Vo ltage
Output High Voltage 1.8V VCC 2.7V IOL = 0.15 mA 0.2 V
IOH = -100 µA VCC - 0.2 V
4AT93C46/56/66 0172U–SEEPR–8/03
Note: 1. This paramete r is characteriz ed and is not 100% tested.
AC Characteristics
Applicable over recomm ended operating range from TAI = -4 0°C to + 85°C, TAE = -40°C to + 1 2 5 °C, VCC = As Specified,
CL = 1 TTL Gate and 100 pF (unless otherwise noted).
Symbol Parameter Te st Condition Min Ty p Max Units
fSK SK Clock
Frequency
4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
0
0
0
2
1
0.25 MHz
tSKH SK High Time 4.5V VCC 5. 5 V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tSKL SK Low Time 4.5V VCC 5.5 V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tCS Minimum CS
Low Tim e
4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tCSS CS Setup Time Relative to SK 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
50
50
200 ns
tDIS DI Setup Time Relative to SK 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
100
100
400 ns
tCSH CS Hold Time Relative to SK 0 ns
tDIH DI Hold Time Relative to SK 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
100
100
400 ns
tPD1 Output Delay to ‘1’ AC Test 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tPD0 Output Delay to ‘0’ AC Test 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tSV CS to Status Valid AC Test 4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
250
250
1000 ns
tDF CS to DO in High
Impedance AC Test
CS = VIL
4.5V VCC 5.5V
2.7V VCC 5.5V
1.8V VCC 5.5V
100
100
400 ns
tWP Write Cycle Time 10 ms
4.5V VCC 5.5V 3 ms
Endurance(1) 5.0V, 25°C, Page Mo de 1M W ri t e Cycl es
5
AT93C46/56/66
0172U–SEEPR–8/03
Note: Th e X’s in the address field r epresent don’t care values and m ust be clock ed.
Notes: 1. This device i s not re com m ended f or new designs. Please refer to AT93C56A.
2. This device i s not re com m ended f or new designs. Please refer to AT93C66A.
3. The X’s in the address fi eld represent don’t care values and must be cl ocked .
Instruction Set for the AT93C46
Instruction SB Op
Code
Address Data
Commentsx 8 x 16 x 8 x 16
READ 1 10 A6 - A0A5 - A0Reads data stored in memory, at
specif ied address.
EWEN 1 00 11XXXXX 11XXXX Write enable must precede all
programming modes .
ERASE 1 11 A6 - A0A5 - A 0Erase memory location An - A0.
WRITE 1 01 A6 - A0A5 - A0D7 - D0D15 - D0Writes memo ry locat ion An - A0.
ERAL 1 00 10XXXXX 10XXXX Erases all memory locations. Valid
only at VCC = 4.5V to 5.5V.
WRAL 1 00 01XXXXX 01XXXX D7 - D0D15 - D0Writ es all memory locati ons. Val id
only at VCC = 4.5V to 5.5V.
EWDS 1 00 00XXXXX 00XXXX Disab les all pro grammi ng instructions .
Instruction Set for the AT93C56(1) and AT93C66(2)
Instruction SB Op
Code
Address(3) Data
Commentsx 8 x 16 x 8 x 16
READ 1 10 A8 - A0A7 - A0Rea ds data stored in memory, at
specified address.
EWEN 1 00 11XXXXXXX 11XXXXXX Write enable m ust precede all
programming modes .
ERASE 1 11 A8 - A 0A7 - A0Erase memory location An - A0.
WRITE 1 01 A8 - A0A7 - A0D7 - D0D15 - D0Writes memory location An - A0.
ERAL 1 00 10XXXXXXX 10XXXXXX Erases all memory locations. Valid
only at VCC = 4.5V to 5.5V.
WRAL 1 00 01XXXXXXX 01XXXXXX D7 - D0D15 - D0
Wr it e s a ll me m o r y lo catio n s. Va lid
only at V CC = 5.0V ±10% and Disable
Regist e r cleared.
EWDS 1 00 00XXXXXX X 00XXXXXX Disab les al l prog ramming i nstruct ions .
6AT93C46/56/66 0172U–SEEPR–8/03
Functional
Description The A T93C4 6/56 /66 is accessed via a simple and v ersatile 3-wire serial commun ication
interface. Device operation is controlled by seven instructions issued by the host pro-
cessor. A valid instruction starts w ith a rising ed ge of CS and cons ist s of a Sta rt Bit
(logic “1”) followed by the appropriate Op Code and the desired memory Address
location.
REA D (READ): The Read (READ ) instruction cont ains the Ad dress code for the m em-
ory location to be read. After the inst ruction and address are decoded, data from the
selec ted m em ory location i s avai labl e at the serial output pi n DO. O ut put data changes
are synchron ized with the rising edges of serial clock SK. It should be noted that a
dumm y bit (logic “0”) prece des the 8- or 16-bit data output string.
ERASE/WRITE (EWEN): To assure data integrity, the part automatically goes into the
Era se/W rite D isable (EWD S) stat e when pow er is first appl ied. An E rase/ Write E nabl e
(EWEN) instruc tion must be executed f irst before any program ming instructions can be
carried out. Please note that once in the Erase/Write Enable state, programming
remains enabled until an Erase/Write Disable (EWDS) instruc tion is executed or VCC
power is removed from the part.
ERASE (ERASE): The Erase (ERASE) instruction programs all bits in the specified
memory location to the logical “1” state. The self-timed erase cycle starts once the
ERASE instruction and address are decoded. The DO pin outputs the READY /BUSY
status of the part if CS i s brought high after being kept low for a mini mum of 250 ns (tCS).
A logic “1” at pi n DO ind icate s th at the select ed mem ory l ocation has been eras ed, and
the part is ready for another instruction.
WRI TE (WRITE): The Write (W RITE) instruct ion contain s the 8 or 16 b its of d ata to be
written into the specified memory location. The self-timed programming cycle, tWP, starts
after the last bit of data is received at serial data input pin DI. The DO pin outputs the
READY/BUSY status of the part if CS is brought high after being kept low for a minimum
of 250 ns (tCS). A logic “0” at DO indica tes that progra mming is still in progress . A lo gic
“1” indicates that the memory location at the specified address has been written with the
data pattern contain ed in the inst ruc tion and the part is ready f or further instruct ions. A
READY/ BUSY status can not be ob tained if the CS is brought high after the end of
the self-timed programm ing cycle, tWP.
ERASE AL L (ERAL): The Erase A ll (E RA L) instruc tion prog rams every bit i n the m em -
ory array to the logic “1” state and is primarily used for testing purposes. The DO pin
outputs the READY/BUSY status of the part if CS is brought high after being kept l ow for
a minimum of 250 ns (tCS). The ERAL instruction is valid only at VCC = 5.0V ± 10%.
WRITE AL L (WRAL): The Write All (WRA L) instruction progra ms all mem ory locations
with the data patterns specified in the instruction. The DO pin outputs the READY/BUSY
status of the part if CS i s brought high after being kept low for a mini mum of 250 ns (tCS).
The WRA L instruction is valid only at VCC = 5.0V ± 10% .
ERASE/WRITE DISABLE (EWDS): To protect against accidental data disturb, the
Erase/Write Disable (EWDS) instruction disables all programming modes and should be
executed after all programming operations . The operation of the READ instruction is
independent of both the EWEN and EWDS instructions and can be executed at any
time.
7
AT93C46/56/66
0172U–SEEPR–8/03
Timing Diagrams
Synchronous Data Timing
Note: 1. This is the mini m um SK period .
Notes: 1. This device i s not r ecom m ended f or new des igns. Please refer to AT93C56A.
2. This device i s not r ecom m ended for new des igns. Ple ase refer to AT93C66A.
3. A8 is a DON’T CARE val ue, but the extra cloc k is require d.
4. A7 is a DON’T CARE val ue, but the extra cloc k is require d.
READ Timing
Organization Key for Timing Diagrams
I/O
AT93C46 (1K) AT93C56 (2K)(1) AT93C66 (4K)(2)
x 8 x 16 x 8 x 16 x 8 x 16
ANA6A5A8(3) A7(4) A8A7
DND7D15 D7D15 D7D15
High Impedance
tCS
8AT93C46/56/66 0172U–SEEPR–8/03
EWE N Timing
EWDS Timing
WRITE Timing
CS
11 ...
001
SK
DI
tCS
CS tCS
SK
DI 1 0 000 ...
SK
CS tCS
tWP
11
ANDN
0A0D0
... ...
DI
DO HIGH IMPEDANCE BUSY READY
9
AT93C46/56/66
0172U–SEEPR–8/03
WRAL Timing(1)
Note: 1. Valid only at VCC = 4.5V to 5.5V.
ERASE Timing
CS
SK
DI
DO HIGH IMPEDANCE BUSY
READY
1 0 0 1 ... DN
tCS
tWP
... D00
SK
1 1 ...1
CS
DI AN
tCS
tSV tDF
tWP
AN-1 AN-2 A0
CHECK
STATUS STANDBY
READY
BUSY
DO HIGH IMPEDANCE HIGH IMPEDANCE
10 AT93C46/56/66 0172U–SEEPR–8/03
ERAL Timing (1)
Note: 1. Valid only at VCC = 4.5V to 5.5V.
SK
CS
DI 1 1000
DO
HIGH IMPEDANCE HIGH IMPEDANCE
READY
BUSY
CHECK
STATUS STANDBY
tWP
tCS
tSV tDF
11
AT93C46/56/66
0172USEEPR8/03
Note: For 2.7V devices used in the 4.5V to 5.5V range, please refer to performance va lues in the AC and DC characteristics tab le.
AT93C46 Ordering Information
Order ing Code Package Operation Range
AT93C46-10PI-2.7
AT93C46-10SI-2.7
AT93C46R-10SI-2.7
AT93C46W-10SI-2.7
AT93C46-10TI-2.7
AT93C46U3-10UI-2.7
AT93C46Y1-10YI-2.7
8P3
8S1
8S1
8S2
8A2
8U3-1
8Y1
Industrial
(-40°C to 85°C)
AT93C46-10PI-1.8
AT93C46-10SI-1.8
AT93C46R-10SI-1.8
AT93C46W-10SI-1.8
AT93C46-10TI-1.8
AT93C46U3-10UI-1.8
AT93C46Y1-10YI-1.8
8P3
8S1
8S1
8S2
8A2
8U3-1
8Y1
Industrial
(-40°C to 85°C)
AT93C46-10SJ-2.7
AT93C46-10SJ-1.8 8S1
8S1 Lead-Free/Industrial Temperature
(-40°C to 85°C)
AT93C46-10SE-2.7 8S1 High Grade/Extended Temperature
(-40°C to 125°C)
Package Type
8P3 8-lea d, 0.300" Wide, Plast ic Dual Inline Package (PDIP)
8S1 8-lea d, 0. 150" Wide , Pl astic Gull Wing Sma ll Outl ine (JEDEC SOIC)
8S2 8-lead, 0.200" W ide, Plastic Gull Wing Small Outline (EIAJ SOIC)
8A2 8-lea d, 0.170" Wide, Thin Shrink Small Ou tl ine P ackage (TSSOP)
8U3-1 8-ball, di e Ball Grid Array Package (dBGA2)
8Y1 8-lead, 4.90 mm x 3.00 mm Body, Dual Footprint, Non- leaded, Miniature Arr ay P ackage (MAP)
Options
-2.7 Low-voltage ( 2.7V t o 5.5V)
-1.8 Low-voltage ( 1.8V t o 5.5V)
RRotated Pinout
12 AT93C46/56/66 0172USEEPR–8/03
Note: 1. This device i s not r ecom m ended f or new des igns. Please refer to AT93C56A.
2. For 2.7V devices used in the 4.5V t o 5.5V range, please ref er to performance values in t he AC and DC char acteristics table.
AT93C56(1) Ordering Information
Order ing Code(2) Packa ge Operation Range
AT93C56-10PI-2.7
AT93C56-10SI-2.7
AT93C56W-10SI-2.7
AT93C56-10TI-2.7
AT93C56Y1-10YI-2.7
8P3
8S1
8S2
8A2
8Y1
Industrial
(-40°C to 85°C)
AT93C56-10PI-1.8
AT93C56-10SI-1.8
AT93C56W-10SI-1.8
AT93C56-10TI-1.8
AT93C56Y1-10YI-1.8
8P3
8S1
8S2
8A2
8Y1
Industrial
(-40°C to 85°C)
Package Type
8P3 8-lea d, 0.300" Wide, Plast ic Dual Inline Package (PDIP)
8S1 8-lea d, 0. 150" Wide , Pl astic Gull Wing Sma ll Outl ine (JEDEC SOIC)
8S2 8-lead, 0.200" W ide, Plastic Gull Wing Small Outline (EIAJ SOIC)
8A2 8-lead, 0.170” Wide, Thin Shrink Small Outli ne Package (TSSOP)
8Y1 8-lead, 4.90 mm x 3.00 mm Body, Dual Footprint, Non- leaded, Miniature Arr ay P ackage (MAP)
Options
-2.7 Low-voltage ( 2.7V t o 5.5V)
1.8 Low-voltage ( 1.8V to 5.5V)
13
AT93C46/56/66
0172USEEPR8/03
Notes: 1. This device i s not r ecom m ended f or new des igns. Please refer to AT93C66A.
2. For 2.7V devices used in the 4.5V t o 5.5V range, please ref er to performance values in t he AC and DC char acteristics table.
AT93C66(1) Ordering Information
Order ing Code(2) Pa ckage Operat i on R ange
AT93C66-10PI-2.7
AT93C66-10SI-2.7
AT93C66W-10SI-2.7
AT93C66-10TI-2.7
AT93C66Y1-10YI-2.7
8P3
8S1
8S2
8A2
8Y1
Industrial
(-40°C to 85°C)
AT93C66-10PI-1.8
AT93C66-10SI-1.8
AT93C66W-10SI-1.8
AT93C66-10TI-1.8
AT93C66Y1-10YI-1.8
8P3
8S1
8S2
8A2
8Y1
Industrial
(-40°C to 85°C)
Package Type
8P3 8-lea d, 0.300" Wide, Plast ic Dual Inline Package (PDIP)
8S1 8-lea d, 0. 150" Wide , Pl astic Gull Wing Sma ll Outl ine (JEDEC SOIC)
8S2 8-lead, 0.200" W ide, Plastic Gull Wing Small Outline (EIAJ SOIC)
8A2 8-lea d, 0.170" Wide, Thin Shrink Small Ou tl ine P ackage (TSSOP)
8Y1 8-lead, 4.90 mm x 3.00 mm Body, Dual Footprint, Non- leaded, Miniature Arr ay P ackage (MAP)
Options
-2.7 Low-voltage ( 2.7V t o 5.5V)
-1.8 Low-voltage ( 1.8V t o 5.5V)
14 AT93C46/56/66 0172U–SEEPR–8/03
Packaging Inf ormation
8P3 – PDIP
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
8P3, 8-lead, 0.300" Wide Body, Plastic Dual
In-line Package (PDIP)
01/09/02
8P3 B
D
D1
E
E1
e
L
b2
b
A2 A
1
N
eA
c
b3
4 PLCS
Top View
Side View
End View
COMMON DIMENSIONS
(Unit of Measure = inches)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This drawing is for general information only; refer to JEDEC Drawing MS-001, Variation BA for additional information.
2. Dimensions A and L are measured with the package seated in JEDEC seating plane Gauge GS-3.
3. D, D1 and E1 dimensions do not include mold Flash or protrusions. Mold Flash or protrusions shall not exceed 0.010 inch.
4. E and eA measured with the leads constrained to be perpendicular to datum.
5. Pointed or rounded lead tips are preferred to ease insertion.
6. b2 and b3 maximum dimensions do not include Dambar protrusions. Dambar protrusions shall not exceed 0.010 (0.25 mm).
A 0.210 2
A2 0.115 0.130 0.195
b 0.014 0.018 0.022 5
b2 0.045 0.060 0.070 6
b3 0.030 0.039 0.045 6
c 0.008 0.010 0.014
D 0.355 0.365 0.400 3
D1 0.005 3
E 0.300 0.310 0.325 4
E1 0.240 0.250 0.280 3
e 0.100 BSC
eA 0.300 BSC 4
L 0.115 0.130 0.150 2
15
AT93C46/56/66
0172U–SEEPR–8/03
8S1 – JEDEC SOIC
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
Note:
10/10/01
8S1, 8-lead (0.150" Wide Body), Plastic Gull Wing
Small Outline (JEDEC SOIC) 8S1 A
H
1
2
N
3
Top View
C
E
End View
A
B
L
A2
e
D
Side View COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
This drawing is for general information only. Refer to JEDEC Drawing MS-012 for proper dimensions, tolerances, datums, etc.
A 1.75
B 0.51
C 0.25
D 5.00
E 4.00
e 1.27 BSC
H 6.20
L 1.27
16 AT93C46/56/66 0172U–SEEPR–8/03
8S2 – EIAJ SOIC
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
8S2, 8-lead, 0.209" Body, Plastic Small
Outline Package (EIAJ)
5/2/02
8S2 B
Top View
Side View
End View
H
1
N
C
E
A
b
L
A1
e
D
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This drawing is for general information only; refer to EIAJ Drawing EDR-7320 for additional information.
2. Mismatch of the upper and lower dies and resin burrs aren't included.
3. It is recommended that upper and lower cavities be equal. If they are different, the larger dimension shall be regarded.
4. Determines the true geometric position.
5. Values b,C apply to pb/Sn solder plated terminal. The standard thickness of the solder layer shall be 0.010 +0.010/-0.005 mm.
A 1.78 2.03
A1 0.05 0.33
b 0.35 0.51 5
C 0.18 0.25 5
D 5.13 5.38
E 5.13 5.41 2, 3
H 7.62 8.38
L 0.51 0.89
e 1.27 BSC 4
17
AT93C46/56/66
0172U–SEEPR–8/03
8A2 – TSSO P
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
5/30/02
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
D 2.90 3.00 3.10 2, 5
E 6.40 BSC
E1 4.30 4.40 4.50 3, 5
A 1.20
A2 0.80 1.00 1.05
b 0.19 0.30 4
e 0.65 BSC
L 0.45 0.60 0.75
L1 1.00 REF
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm
(0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the
b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between
protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
8A2 B
Side View
End View
Top View
A2
A
L
L1
D
123
E1
N
b
Pin 1 indicator
this corner
E
e
18 AT93C46/56/66 0172U–SEEPR–8/03
8U3-1 – dBGA2
1150 E. Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906
TITLE DRAWING NO.
R
REV.
PO8U3-1 A
6/24/03
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
8U3-1, 8-ball, 1.50 x 2.00 mm Body, 0.50 mm pitch,
Small Die Ball Grid Array Package (dBGA2)
A 0.71 0.81 0.91
A1 0.10 0.15 0.20
A2 0.40 0.45 0.50
b 0.20 0.25 0.30
D 1.50 BSC
E 2.00 BSC
e 0.50 BSC
e1 0.25 REF
d 1.00 BSC
d1 0.25 REF
1. Dimension 'b' is measured at the maximum solder ball diameter.
This drawing is for general information only.
Bottom View
8 SOLDER BALLS
b
D
E
Top View
PIN 1 BALL PAD CORNER
A
Side View
A2
A1
4
5
PIN 1 BALL PAD CORNER
31
e
2
67
8
d
(e1)
(d1)
1.
19
AT93C46/56/66
0172U–SEEPR–8/03
8Y1 – MAP
A 0.90
A1 0.00 0.05
D 4.70 4.90 5.10
E 2.80 3.00 3.20
D1 0.85 1.00 1.15
E1 0.85 1.00 1.15
b 0.25 0.30 0.35
e 0.65 TYP
L 0.50 0.60 0.70
PIN 1 INDEX AREA
D
E
A
A1 b
876
e
5
L
D1
E1
PIN 1 INDEX AREA
1234
A
Top View End View Bottom View
Side View
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
8Y1, 8-lead (4.90 x 3.00 mm Body) MSOP Array Package
(MAP) Y1 C
8Y1
2/28/03
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN NOM MAX
NOTE
Pr inted o n rec ycled pa per.
0172USEEPR8/03 xM
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