Isolation Capacitor
VCC2VCC1
SDA2
or SCL2
SDA1
or SCL1
GND1 GND2
VREF
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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ISO1540
,
ISO1541
SLLSEB6D JULY 2012REVISED DECEMBER 2016
ISO154x Low-Power Bidirectional I
2
C Isolators
1
1 Features
1 Isolated Bidirectional, I2C Compatible,
Communication
Supports up to 1-MHz Operation
3-V to 5.5-V Supply Range
Open-Drain Outputs With 3.5-mA Side 1 and 35-
mA Side 2 Sink Current Capability
–40°C to +125°C Operating Temperature
±50-kV/µs Transient Immunity (Typical)
HBM ESD Protection of 4 kV on All Pins;
8 kV on Bus Pins
Safety-Related Certifications:
4242-VPK Isolation per DIN V VDE V 0884-10
(VDE V 0884-10): 2006-12
2500-VRMS Isolation for 1 Minute per UL 1577
CSA Component Acceptance Notice 5A, IEC
60950-1 and IEC 61010-1 End Equipment
Standards
CQC Basic Insulation per GB4943.1-2011
2 Applications
Isolated I2C Buses
SMBus and PMBus Interfaces
Open-Drain Networks
Motor Control Systems
Battery Management
I2C Level Shifting
3 Description
The ISO1540 and ISO1541 devices are low-power,
bidirectional isolators that are compatible with I2C
interfaces. These devices have logic input and output
buffers that are separated by Texas Instruments
Capacitive Isolation technology using a silicon dioxide
(SiO2) barrier. When used with isolated power
supplies, these devices block high voltages, isolate
grounds, and prevent noise currents from entering the
local ground and interfering with or damaging
sensitive circuitry.
This isolation technology provides for function,
performance, size, and power consumption
advantages when compared to optocouplers. The
ISO1540 and ISO1541 devices enable a complete
isolated I2C interface to be implemented within a
small form factor.
The ISO1540 has two isolated bidirectional channels
for clock and data lines while the ISO1541 has a
bidirectional data and a unidirectional clock channel.
The ISO1541 is useful in applications that have a
single master while the ISO1540 is suitable for multi-
master applications. For applications where clock
stretching by the slave is possible, the ISO1540
device should be used.
Isolated bidirectional communication is accomplished
within these devices by offsetting the low-level output
voltage on side 1 to a value greater than the high-
level input voltage on side 1, thus preventing an
internal logic latch that otherwise would occur with
standard digital isolators.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
ISO1540
ISO1541 SOIC (8) 4.90 mm × 3.91 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Simplified Schematic
2
ISO1540
,
ISO1541
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 4
6 Specifications......................................................... 5
6.1 Absolute Maximum Ratings ...................................... 5
6.2 ESD Ratings.............................................................. 6
6.3 Recommended Operating Conditions....................... 6
6.4 Thermal Information.................................................. 6
6.5 Power Ratings........................................................... 6
6.6 Insulation Specifications............................................ 7
6.7 Safety-Related Certifications..................................... 8
6.8 Safety Limiting Values .............................................. 8
6.9 Electrical Characteristics........................................... 9
6.10 Supply Current Characteristics ............................. 10
6.11 Timing Requirements............................................ 10
6.12 Switching Characteristics...................................... 11
6.13 Insulation Characteristics Curves ......................... 12
6.14 Typical Characteristics.......................................... 13
7 Parameter Measurement Information ................ 16
8 Detailed Description............................................ 18
8.1 Overview................................................................. 18
8.2 Functional Block Diagrams ..................................... 18
8.3 Feature Description................................................. 19
8.4 Isolator Functional Principle.................................... 19
8.5 Device Functional Modes........................................ 20
9 Application and Implementation ........................ 21
9.1 Application Information............................................ 21
9.2 Typical Application.................................................. 23
10 Power Supply Recommendations ..................... 25
11 Layout................................................................... 25
11.1 Layout Guidelines ................................................. 25
11.2 Layout Example .................................................... 25
12 Device and Documentation Support................. 26
12.1 Documentation Support ........................................ 26
12.2 Related Links ........................................................ 26
12.3 Receiving Notification of Documentation Updates 26
12.4 Community Resources.......................................... 26
12.5 Trademarks........................................................... 26
12.6 Electrostatic Discharge Caution............................ 26
12.7 Glossary................................................................ 26
13 Mechanical, Packaging, and Orderable
Information........................................................... 27
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (June 2015) to Revision D Page
Deleted the Device Comparison Table; see the Features List table for device comparison ................................................ 4
Changed the status of CQC certification from planned to certified ....................................................................................... 8
Changed the Regulatory Information table to Safety-Related Certifications and updated content........................................ 8
Changed formatting of supply current parameters to combine device and sides. Moved parameters to separate table ... 10
Added the Receiving Notification of Documentation Updates section ................................................................................ 26
Changes from Revision B (May 2013) to Revision C Page
Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional
Modes,Application and Implementation section, Power Supply Recommendations section, Layout section, Device
and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1
VDE Standard changed to DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12 .................................................................... 1
Changed minimum air gap (Clearance) parameter, L(I01), to external clearance, CLR, and minimum external
tracking (creepage) parameter, L(I02), to external creepage................................................................................................. 7
Changed values and test conditions in the Insulation Specifications table............................................................................ 7
Changed the descriptions of VDE and CSA information ....................................................................................................... 8
Changes from Revision A (October 2012) to Revision B Page
Change Safety Feature From: (VDE 0884 Part 2) (Pending) To: (VDE 0884 Part 2) (Approved)......................................... 1
Changed, VDE column From: File number: 40016131 (pending) To: File number: 40016131.............................................. 8
3
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,
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Changes from Original (July 2012) to Revision A Page
Changed From: CSA Component Acceptance Notice 5A (Pending) To: CSA Component Acceptance Notice 5A
(Approved).............................................................................................................................................................................. 1
Changed From: IEC 60950-1 and IEC 61010-1 End Equipment Standards (Pending) To: IEC 60950-1 and IEC
61010-1 End Equipment Standards (Approved)..................................................................................................................... 1
Changed Safety-Related Certifications, CSA column From: File number: 220991 (pending) To: File number: 220991....... 8
1
VCC1 8VCC2
2
SDA1 7SDA2
3
SCL1 6SCL2
4
GND1 5GND2
Not to scale
Isolation
Side 2
Side 1
4
ISO1540
,
ISO1541
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5 Pin Configuration and Functions
ISO1540 D Package
8-Pin SOIC
Top View
Pin Functions—ISO1540
PIN I/O DESCRIPTION
NAME NO.
GND1 4 Ground, side 1
GND2 5 Ground, side 2
SCL1 3 I/O Serial clock input / output, side 1
SCL2 6 I/O Serial clock input / output, side 2
SDA1 2 I/O Serial data input / output, side 1
SDA2 7 I/O Serial data input / output, side 2
VCC1 1 Supply voltage, side 1
VCC2 8 Supply voltage, side 2
1
VCC1 8VCC2
2
SDA1 7SDA2
3
SCL1 6SCL2
4
GND1 5GND2
Not to scale
Isolation
Side 2
Side 1
5
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,
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ISO1541 D Package
8-Pin SOIC
Top View
Pin Functions—ISO1541
PIN I/O DESCRIPTION
NAME NO.
GND1 4 Ground, side 1
GND2 5 Ground, side 2
SCL1 3 I Serial clock input, side 1
SCL2 6 O Serial clock output, side 2
SDA1 2 I/O Serial data input / output, side 1
SDA2 7 I/O Serial data input / output, side 2
VCC1 1 Supply voltage, side 1
VCC2 8 Supply voltage, side 2
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values here within are with respect to the local ground pin (GND1 or GND2) and are peak voltage values.
(3) Maximum voltage must not exceed 6 V.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
Voltage VCC1, VCC2 –0.5 6 VSDA1, SCL1 –0.5 VCC1 + 0.5(3)
SDA2, SCL2 –0.5 VCC2 + 0.5(3)
IOOutput current SDA1, SCL1 –20 20 mA
SDA2, SCL2 –100 100
TJ(MAX) Maximum junction temperature 150 °C
Tstg Storage temperature –65 150 °C
6
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(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings VALUE UNIT
V(ESD) Electrostatic discharge
Human body model (HBM), per ANSI/ESDA/JEDEC
JS-001(1) Bus pins ±8000
V
All pins ±4000
Charged-device model (CDM), per JEDEC specification JESD22-
C101(2) ±1500
Machine Model JEDEC JESD22-A115-A, all pins ±200
(1) This represents the maximum frequency with the maximum bus load (C) and the maximum current sink (IO). If the system has less bus
capacitance, then higher frequencies can be achieved.
6.3 Recommended Operating Conditions
MIN MAX UNIT
VCC1, VCC2 Supply voltage 3 5.5 V
VSDA1, VSCL1 Input and output signal voltages, side 1 0 VCC1 V
VSDA2, VSCL2 Input and output signal voltages, side 2 0 VCC2 V
VIL1 Low-level input voltage, side 1 0 0.5 V
VIH1 High-level input voltage, side 1 0.7 × VCC1 VCC1 V
VIL2 Low-level input voltage, side 2 0 0.3 × VCC2 V
VIH2 High-level input voltage, side 2 0.7 × VCC2 VCC2 V
IOL1 Output current, side 1 0.5 3.5 mA
IOL2 Output current, side 2 0.5 35 mA
C1 Capacitive load, side 1 40 pF
C2 Capacitive load, side 2 400 pF
fMAX Operating frequency(1) 1 MHz
TAAmbient temperature –40 125 °C
TJJunction temperature –40 136 °C
TSD Thermal shutdown 139 171 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report (SPRA953).
6.4 Thermal Information
THERMAL METRIC(1) ISO154x
UNITD (SOIC)
8 PINS
RθJA Junction-to-ambient thermal resistance 114.6 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 69.6 °C/W
RθJB Junction-to-board thermal resistance 55.3 °C/W
ψJT Junction-to-top characterization parameter 27.2 °C/W
ψJB Junction-to-board characterization parameter 54.7 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W
6.5 Power Ratings
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PDMaximum power dissipation (both sides) VCC1 = VCC2 = 5.5 V, TJ= 150 °C, C1 =
40 pF, C2 = 400 pF;
Input a 1-MHz 50% duty cycle clock signal
85 mW
PD1 Maximum power dissipation (side-1) 34 mW
PD2 Maximum power dissipation (side-2) 51 mW
7
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,
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(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care
should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on
the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in certain cases.
Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications.
(2) This coupler is suitable for basic electrical insulation only within the maximum operating ratings. Compliance with the safety ratings shall
be ensured by means of suitable protective circuits.
(3) Apparent charge is electrical discharge caused by a partial discharge (pd).
(4) All pins on each side of the barrier tied together creating a two-terminal device
6.6 Insulation Specifications
PARAMETER TEST CONDITIONS VALUE UNIT
GENERAL
CLR External clearance(1) Shortest terminal-to-terminal distance through air >4 mm
CPG External creepage(1) Shortest terminal-to-terminal distance across the
package surface >4 mm
DTI Distance through the insulation Minimum internal gap (internal clearance) 0.014 mm
CTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112 >400 V
Material group II
Overvoltage category Rated mains voltage 150 VRMS I–IV
Rated mains voltage 300 VRMS I–III
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12(2)
VIORM Maximum repetitive peak isolation voltage AC voltage (bipolar) 566 VPK
VIOTM Maximum transient isolation voltage VTEST = VIOTM
t = 60 s (qualification)
t = 1 s (100% production) 4242 VPK
qpd Apparent charge(3)
Method a: After I/O safety test subgroup 2/3, Vini =
VIOTM, tini = 60 s; Vpd(m) = 1.2 × VIORM = 680 VPK, tm
= 10 s <5
pC
Method a: After environmental tests subgroup 1,
Vini = VIOTM, tini = 60 s; Vpd(m) = 1.6 × VIORM = 906
VPK, tm= 10 s <5
Method b1: At routine test (100% production) and
preconditioning (type test) Vini = VIOTM, tini = 1 s;
Vpd(m) = 1.875 × VIORM = 1062 VPK, tm= 1 s <5
CIO Barrier capacitance, input to output(4) VIO = 0.4 sin (2πft), f = 1 MHz ~1 pF
RIO Isolation resistance, input to output(4) VIO = 500 V, TA= 25°C >1012
ΩVIO = 500 V, 100°C TA125°C >1011
VIO = 500 V at TS= 150°C >109
Pollution degree 2
Climatic category 40/125/21
UL 1577
VISO Withstand isolation voltage VTEST = VISO = 2500 VRMS, t = 60 s (qualification);
VTEST = 1.2 × VISO = 3000 VRMS, t = 1 s (100%
production) 2500 VRMS
8
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6.7 Safety-Related Certifications
VDE CSA UL CQC
Certified according to DIN V VDE V
0884-10 (VDE V 0884-10):2006-12
and DIN EN 61010-1
Approved under CSA
Component Acceptance Notice
5A, CSA/IEC 60950-1, and
CSA/IEC 61010-1
Recognized under UL 1577
Component Recognition
Program Certified according to GB4943.1-
2011
Basic Insulation
Maximum Transient Overvoltage,
4242 VPK;
Maximum Repetitive Peak Voltage,
566 VPK
2.8-kVRMS Insulation Rating; 400
VRMS Basic Insulation working
voltage per CSA 60950-1-
07+A1+A2 and IEC 60950-1 2nd
Ed.+A1+A2;
300 VRMS Basic, 150 VRMS
Reinforced Insulation working
voltage per CSA 61010-1-12 and
IEC 61010-1 3rd Ed.,
Single protection, 2500 VRMS Basic Insulation, Altitude 5000
m, Tropical Climate, 250 VRMS
maximum working voltage
Certificate number: 40016131 Master contract number: 220991 File number: E181974 Certificate number:
CQC14001109540
6.8 Safety Limiting Values
Safety limiting intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure of
the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat
the die and damage the isolation barrier, potentially leading to secondary system failures.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ISSafety input, output, or supply
current
RθJA = 114.6°C/W, VI= 5.5 V, TJ= 150°C, TA= 25°C,
see Figure 1 198 mA
RθJA = 114.6°C/W, VI= 3.6 V, TJ= 150°C, TA= 25°C,
see Figure 1 303
TSSafety temperature 150 °C
The safety-limiting constraint is the maximum junction temperature specified in the data sheet. The power
dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines
the junction temperature. The assumed junction-to-air thermal resistance in the Thermal Information table is that
of a device installed on a high-K test board for leaded surface-mount packages. The power is the recommended
maximum input voltage times the current. The junction temperature is then the ambient temperature plus the
power times the junction-to-air thermal resistance.
9
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(1) This parameter does not apply to the ISO1541 SCL1 line as it is unidirectional.
(2) VOIT1 = VOL1 VIHT1. This represents the minimum difference between a Low-Level Output Voltage and a High-Level Input Voltage
Threshold to prevent a permanent latch condition that would otherwise exist with bidirectional communication.
(3) Any VCC voltages, on either side, less than the minimum will ensure device lockout. Both VCC voltages greater than the maximum will
prevent device lockout.
6.9 Electrical Characteristics
over recommended operating conditions, unless otherwise noted
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SIDE 1 (ONLY)
VILT1 Voltage input threshold low, SDA1
and SCL1 500 550 660 mV
VIHT1 Voltage input threshold high, SDA1
and SCL1 540 610 700 mV
VHYST1 Voltage input hysteresis VIHT1 –VILT1 40 60 mV
VOL1 Low-level output voltage, SDA1
and SCL1(1) 0.5 mA (ISDA1 and ISCL1)3.5 mA 650 800 mV
ΔVOIT1 Low-level output voltage to high-
level input voltage threshold
difference, SDA1 and SCL1(1)(2) 0.5 mA (ISDA1 and ISCL1)3.5 mA 50 mV
SIDE 2 (ONLY)
VILT2 Voltage input threshold low, SDA2
and SCL2 0.3 × VCC2 0.4 × VCC2 V
VIHT2 Voltage input threshold high, SDA2
and SCL2 0.4 × VCC2 0.5 × VCC2 V
VHYST2 Voltage input hysteresis VIHT2 VILT2 0.05 × VCC2 V
VOL2 Low-level output voltage, SDA2
and SCL2 0.5 mA (ISDA2 and ISCL2)35 mA 0.4 V
BOTH SIDES
|II|Input leakage currents, SDA1,
SCL1, SDA2, and SCL2 VSDA1, VSCL1 = VCC1;
VSDA2, VSCL2 = VCC2 0.01 10 µA
CIInput capacitance to local ground,
SDA1, SCL1, SDA2, and SCL2 VI= 0.4 × sin(2E6πt) + 2.5 V 7 pF
CMTI Common-mode transient immunity See Figure 21 25 50 kV/µs
VCCUV VCC undervoltage lockout
threshold(3) 2.1 2.5 2.8 V
10
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6.10 Supply Current Characteristics
over recommended operating conditions, unless otherwise noted. For more information, see Figure 19.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
3 V VCC1, VCC2 3.6 V
ICC1 Supply current, side 1
ISO1540
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1, R2 = Open; C1, C2 = Open 2.4 3.6
mA
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 2.5 3.8
ISO1541
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1, R2 = Open; C1, C2 = Open 2.1 3.3
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 2.3 3.6
ICC2 Supply current, side 2 ISO1540 and
ISO1541
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1, R2 = Open; C1, C2 = Open 1.7 2.7 mA
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 1.9 3.1
4.5 V VCC1, VCC2 5.5 V
ICC1 Supply current, side 1
ISO1540
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1,R2 = Open; C1,C2 = Open 3.1 4.7
mA
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 3.1 4.7
ISO1541
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1, R2 = Open; C1, C2 = Open 2.8 4.4
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 2.9 4.5
ICC2 Supply current, side 2 ISO1540 and
ISO1541
VSDA1, VSCL1 = GND1; VSDA2, VSCL2 = GND2;
R1, R2 = Open; C1, C2 = Open 2.3 3.7 mA
VSDA1, VSCL1 = VCC1; VSDA2, VSCL2 = VCC2;
R1, R2 = Open; C1, C2 = Open 2.5 4
6.11 Timing Requirements MIN NOM MAX UNIT
tSP Input noise filter 5 12 ns
tUVLO Time to recover from UVLO 2.7 V to 0.9 V; See Figure 22 30 50 110 µs
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(1) This parameter does not apply to the ISO1541 SCL1 line as it is unidirectional.
6.12 Switching Characteristics
over recommended operating conditions, unless otherwise noted
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
3 V VCC1, VCC2 3.6 V
tf1 Output Signal Fall Time
(SDA1, SCL1) See Figure 19
R1 = 953 Ω,
C1 = 40 pF
0.7 × VCC1 to 0.3 × VCC1 8 17 29 ns
0.9 × VCC1 to 900 mV 16 29 48
tf2 Output Signal Fall Time
(SDA2, SCL2) See Figure 19
R2 = 95.3 Ω,
C2 = 400 pF
0.7 × VCC2 to 0.3 × VCC2 14 23 47 ns
0.9 × VCC2 to 400 mV 35 50 100
tpLH1-2 Low-to-High Propagation
Delay, Side 1 to Side 2
See Figure 19
R1 = 953 Ω,
R2 = 95.3 Ω,
C1, C2 = 10 pF
0.55 V to 0.7 × VCC2 33 65 ns
tPHL1-2 High-to-Low Propagation
Delay, Side 1 to Side 2 0.7 V to 0.4 V 90 181 ns
PWD1-2 Pulse Width Distortion
|tpHL1-2 tpLH1-2|55 123 ns
tPLH2-1(1) Low-to-High Propagation
Delay, Side 2 to Side 1 0.4 × VCC2 to 0.7 × VCC1 47 68 ns
tPHL2-1(1) High-to-Low Propagation
Delay, Side 2 to Side 1 0.4 × VCC2 to 0.9 V 67 109 ns
PWD2-1(1) Pulse Width Distortion
|tpHL2-1 tpLH2-1|20 49 ns
tLOOP1(1) Round-trip propagation
delay on Side 1 See Figure 20;
R1 = 953 Ω, C1 = 40 pF
R2 = 95.3 Ω, C2 = 400 pF 0.4 V to 0.3 × VCC1 100 165 ns
4.5 V VCC1, VCC2 5.5 V
tf1 Output Signal Fall Time
(SDA1, SCL1) See Figure 19
R1 = 1430 Ω,
C1 = 40 pF
0.7 × VCC1 to 0.3 × VCC1 6 11 20 ns
0.9 × VCC1 to 900 mV 13 21 39
tf2 Output Signal Fall Time
(SDA2, SCL2) See Figure 19
R2 = 143 Ω,
C2 = 400 pF
0.7 × VCC2 to 0.3 × VCC2 10 18 35 ns
0.9 × VCC2 to 400 mV 28 41 76
tpLH1-2 Low-to-High Propagation
Delay, Side 1 to Side 2
See Figure 19
R1 = 1430 Ω,
R2 = 143 Ω,
C1,2 = 10 pF
0.55 V to 0.7 × VCC2 31 62 ns
tPHL1-2 High-to-Low Propagation
Delay, Side 1 to Side 2 0.7 V to 0.4 V 70 139 ns
PWD1-2 Pulse Width Distortion
|tpHL1-2 tpLH1-2|38 80 ns
tPLH2-1(1) Low-to-high propagation
delay, side 2 to side 1 0.4 × VCC2 to 0.7 × VCC1 55 80 ns
tPHL2-1(1) High-to-low propagation
delay, Side 2 to side 1 0.4 × VCC2 to 0.9 V 47 85 ns
PWD2-1(1) Pulse Width Distortion
|tpHL2-1 tpLH2-1|8 21 ns
tLOOP1(1) Round-trip propagation
delay on side 1 See Figure 20;
R1 = 1430 Ω, C1 = 40 pF
R2 = 143 Ω, C2 = 400 pF 0.4 V to 0.3 × VCC1 110 180 ns
Ambient Temperature (qC)
Safety Limiting Current (mA)
0 50 100 150 200
0
50
100
150
200
250
300
350 VCC1 = VCC2 = 3.6 V
VCC1 = VCC2 = 5.5 V
12
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6.13 Insulation Characteristics Curves
Figure 1. Thermal Derating Curve for Limiting Current per VDE
Free-Air Temperature (qC)
Fall Time tf2 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
5
10
15
20
25
30
D003
R2 = 95.3 :
R2 = 2.2 k:
Free-Air Temperature (qC)
Fall Time, tf1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
2
4
6
8
10
12
14
16
18
20
D001
R1= 953 :
R1= 2.2 k:
Free-Air Temperature (qC)
Fall Time, tf1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
2
4
6
8
10
12
14
16
18
20
D002
R1 = 1430 :
R1 = 2.2 k:
Output Voltage, V (V)
OL1
0.780
0.740
0.800
0.720
0.680
0.760
0.660
0.640
0.600
0.700
0.620
I = 3.5 mA
OL1
I = 0.5 mA
OL1
−40 −25 −10 5 20 35 50 65 80 95 110 125
Free−Air Temperature (°C)
0 0.3 0.6 0.9
Output Current, I (mA)
OL1
Applied Voltage, V , V (V)
SDA1 SCL1
0.1 0.2 0.4 0.5 0.7 0.8
-0.5
1.0
0.0
2.0
0.5
3.0
1.5
2.5
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6.14 Typical Characteristics
Figure 2. Side 1: Output Low Voltage vs Free-Air
Temperature
TA= 25°C
Figure 3. Side 1: Output Low Current vs SDA1 or SCL1
Applied Voltage
VCC1 = 3.3 V C1 = 40 pF
Fall time measured from 70% to 30% VCC1
Figure 4. Side 1: Output Fall Time vs Free-Air Temperature
VCC1 = 5 V C1 = 40 pF
Fall time measured from 70% to 30% VCC1
Figure 5. Side 1: Output Fall Time vs Free-air Temperature
VCC2 = 3.3 V C2 = 400 pF
Fall time measured from 70% to 30% VCC2
Figure 6. Side 2: Output Fall Time vs Free-Air Temperature
VCC2 = 5 V C2 = 400 pF
Fall time measured from 70% to 30% VCC2
Figure 7. Side 2: Output Fall Time vs Free-Air Temperature
Free-Air Temperature (qC)
Propagation Delay, tPHL2-1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
10
20
30
40
50
60
70
D009
VCC1 and VCC2 = 3.3 V, R1 = 953 :
VCC1 and VCC2 = 5 V, R1 = 1430 :
Free-Air Temperature (qC)
Propagation Delay, tPHL2-1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
10
20
30
40
50
60
70
80
D010
VCC1 and VCC2 = 3.3 V, R1 = 953 :
VCC1 and VCC2 = 5 V, R1 = 1430 :
Free-Air Temperature (qC)
Propagation Delay, tPLH1-2 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
1000
1005
1010
1015
1020
1025
1030
1035
1040
1045
1050
D007
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
Free-Air Temperature (qC)
Propagation Delay, tPHL1-2 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
10
20
30
40
50
60
70
80
90
D008
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
Free-Air Temperature (qC)
Propagation Delay, tPLH1-2 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
5
10
15
20
25
30
35
40
45
D005
VCC1 and VCC2 = 3.3 V, R2 = 95.3 :
VCC1 and VCC2 = 5 V, R2 = 143 :
Free-Air Temperature (qC)
Propagation Delay, tPHL1-2 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
20
40
60
80
100
120
D006
VCC1 and VCC2 = 3.3 V, R2 = 95.3 :
VCC1 and VCC2 = 5 V, R2 = 143 :
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Typical Characteristics (continued)
C2 = 10 pF
Figure 8. tPLH1-2 Propagation Delay vs Free-Air Temperature
C2 = 10 pF
Figure 9. tPHL1-2 Propagation Delay vs Free-Air Temperature
R2 = 2.2 kΩC2 = 400 pF
Figure 10. tPLH1-2 Propagation Delay vs Free-Air
Temperature
R2 = 2.2 kΩC2 = 400 pF
Figure 11. tPHL1-2 Propagation Delay vs Free-Air
Temperature
C1 = 10 pF
Figure 12. tPLH2-1 Propagation Delay vs Free-Air
Temperature
C1 = 10 pF
Figure 13. tPHL2-1 Propagation Delay vs Free-Air
Temperature
Free-Air Temperature (qC)
Common-Mode Transient Immunity (kV/Ps)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
10
20
30
40
50
60
70
D015
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
Free-Air Temperature (qC)
tLOOP1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
0
20
40
60
80
100
120
140
D013
VCC1 and VCC2 = 3.3 V, R1 = 953 :, R2 = 95.3 :
VCC1 and VCC2 = 5 V, R1 = 1430 :, R2 = 143 :
Free-Air Temperature (qC)
tLOOP1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
575
580
585
590
595
600
D014
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
0
10
20
30
40
50
60
70
80
−40 −25 −10 5 20 35 50 65 80 95 110 125
Free-Air Temperature (°C)
Propagation Delay, tPHL2-1 (ns)
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
Free-Air Temperature (qC)
Propagation Delay, tPLH2-1 (ns)
-40 -25 -10 5 20 35 50 65 80 95 110 125
132
134
136
138
140
142
144
146
148
D011
VCC1 and VCC2 = 3.3 V
VCC1 and VCC2 = 5 V
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Typical Characteristics (continued)
R1 = 2.2 kΩC1 = 40 pF
Figure 14. tPLH2-1 Propagation Delay vs Free-Air
Temperature
R1 = 2.2 kΩC1 = 40 pF
Figure 15. tPHL2-1 Propagation Delay vs Free-Air
Temperature
C1 = 40 pF C2 = 400 pF
Figure 16. tLOOP1 vs Free-Air Temperature
C1 = 40 pF C2 = 400 pF
R1 = 2.2 kΩR2 = 2.2 kΩ
Figure 17. tLOOP1 vs Free-Air Temperature
Figure 18. CMTI vs Free-Air Temperature
VCMTI
Input
+
Output
GNDx GNDy
VCCx VCCy
Isolation
2 k2 k
±
GND1 VCC1 R1
VCC1
C1
GND1
SDA1 or
SCL1
Output
Isolation
VCC2
0.4 V
0.3 VCC1
tLOOP1
SDA1
SCL1 (ISO1540 Only)
Copyright © 2016, Texas Instruments Incorporated
SDA1
SCL1 SCL2
SDA2
C1 C1 C2 C2
R1 R1 R2 R2
±
+
±
+ VCC2
VCC1
ISO1540
ISO1541
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7 Parameter Measurement Information
Figure 19. Test Diagram
Figure 20. tLoop1 Setup and Timing Diagram
Figure 21. Common-Mode Transient Immunity Test Circuit
I solatio n
+
Output
-
GNDx GNDy
VCCx
Ry
VCCy
Isola tion
SDAx or
SCLx
+
Output
GNDx GNDy
VCCx
Ry
VCCy
0 V
Side x, Side y VCCx,VCCy Ry
1, 2 3.3 V, 3.3 V 95.3 Ω
2, 1 3.3 V, 3.3 V 953 Ω
or
SDAx or
SCLx
VCCx or
VCCy
Output
2.7 V
0.9 V
tUVLO
VCCy
0 V
VCCx
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Parameter Measurement Information (continued)
Figure 22. tUVLO Test Circuit and Timing Diagrams
SDA2
SCL1 SCL2
GND2GND1
VCC2VCC1
SDA1
VREF
Isolation Capacitor
VREF
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8 Detailed Description
8.1 Overview
The I2C bus is used in a wide range of applications because it is simple to use. The bus consists of a two-wire
communication bus that supports bidirectional data transfer between a master device and several slave devices.
The master, or processor, controls the bus, specifically the serial clock (SCL) line. Data is transferred between
the master and slave through a serial data (SDA) line. This data can be transferred in four speeds: standard
mode (0 to 100 kbps), fast mode (0 to 400 kbps), fast-mode plus (0 to 1 Mbps), and high-speed mode (0 to 3.4
Mbps). The most common speeds are the standard and fast modes.
The I2C bus operates in bidirectional, half-duplex mode, while standard digital isolators are unidirectional devices.
To make efficient use of one technology supporting the other, external circuitry is required that separates the
bidirectional bus into two unidirectional signal paths without introducing significant propagation delay. These
devices have their logic input and output buffers separated by TI's capacitive isolation technology using a silicon
dioxide (SiO2) barrier. When used in conjunction with isolated power supplies, these devices block high voltages,
isolate grounds, and prevent noise currents from entering the local ground and interfering with or damaging
sensitive circuitry.
8.2 Functional Block Diagrams
Figure 23. ISO1540 Block Diagram
VSDA1
VC-out
VILT1 VIHT1 VOL1
40 mV
RPU1 RPU2
VCC1 VCC2
SDA1
GND1 GND2
SDA2
VREF
A
B
D
C
ISO1540
50 mV
Cbus
Cnode
Copyright © 2016, Texas Instruments Incorporated
SDA2
SCL1 SCL2
GND2
GND1
VCC2
VCC1
SDA1
VREF
Isolation Capacitor
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Functional Block Diagrams (continued)
(1) See Safety-Related Certifications for detailed Isolation specifications.
Figure 24. ISO1541 Block Diagram
8.3 Feature Description
The device enables a complete isolated I2C interface to be implemented within a small form factor having the
features listed in Table 1.
Table 1. Features List
PART NUMBER CHANNEL DIRECTION RATED ISOLATION(1) MAXIMUM FREQUENCY
ISO1540 Bidirectional (SCL)
Bidirectional (SDA) 2500 VRMS
4242 VPK 1 MHz
ISO1541 Unidirectional (SCL)
Bidirectional (SDA)
8.4 Isolator Functional Principle
To isolate a bidirectional signal path (SDA or SCL), the ISO1540 internally splits a bidirectional line into two
unidirectional signal lines, each of which is isolated through a single-channel digital isolator. Each channel output
is made open-drain to comply with the open-drain technology of I2C. Side 1 of the ISO1540 connects to a low-
capacitance I2C node, while side 2 is designed for connecting to a fully loaded I2C bus with up to 400 pF of
capacitance.
Figure 25. SDA Channel Design and Voltage Levels at SDA1
VOL1
VIHT1
SDA1
SDA2
SDA2
SDA1
Transmit
Delay
Transmit
Delay
Receive
Delay
VIHT2
50%
50%
30%
30%
Receive
Delay Receive
Delay
VCC1
VCC1
VCC2
VCC2
VCC1 VCC1 VCC2 VCC2
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Isolator Functional Principle (continued)
At first sight, the arrangement of the internal buffers suggests a closed signal loop that is prone to latch-up.
However, this loop is broken by implementing an output buffer (B) whose output low-level is raised by a diode
drop to approximately 0.75 V, and the input buffer (C) that consists of a comparator with defined hysteresis. The
comparator’s upper and lower input thresholds then distinguish between the proper low-potential of 0.4 V
(maximum) driven directly by SDA1 and the buffered output low-level of B.
Figure 26 demonstrate the switching behavior of the I2C isolator, ISO1540, between a master node at SDA1 and
a heavy loaded bus at SDA2.
Figure 26. SDA Channel Timing in Receive and Transmit Directions
8.4.1 Receive Direction (Left Diagram of Figure 26)
When the I2C bus drives SDA2 low, SDA1 follows after a certain delay in the receive path. The output low is the
buffered output of VOL1 = 0.75 V, which is sufficiently low to be detected by Schmitt-trigger inputs with a minimum
input-low voltage of VIL = 0.9 V at 3 V supply levels.
When SDA2 is released, its voltage potential increases towards VCC2 following the time-constant formed by
RPU2 and Cbus. After the receive delay, SDA1 is released and also rises towards VCC1, following the time-
constant RPU1 × Cnode. Because of the significant lower time-constant, SDA1 may reach VCC1 before SDA2
reaches VCC2 potential.
8.4.2 Transmit Direction (Right Diagram of Figure 26)
When a master drives SDA1 low, SDA2 follows after a certain delay in the transmit direction. When SDA2 turns
low it also causes the output of buffer B to turn low but at a higher 0.75 V level. This level cannot be observed
immediately as it is overwritten by the lower low-level of the master.
However, when the master releases SDA1, the voltage potential increases and first must pass the upper input
threshold of the comparator, VIHT1, to release SDA2. SDA1 then increases further until it reaches the buffered
output level of VOL1 = 0.75 V, maintained by the receive path. When comparator C turns high, SDA2 is released
after the delay in transmit direction. It takes another receive delay until B’s output turns high and fully releases
SDA1 to move toward VCC1 potential.
8.5 Device Functional Modes
Table 2 lists the ISO154x functional modes.
(1) H = High Level; L = Low Level; Z = High Impedance or Float; X = Irrelevant; ? = Indeterminate
(2) Invalid input condition as an I2C system requires that a pullup resistor to VCC is connected.
Table 2. Function Table(1)
POWER STATE INPUT OUTPUT
VCC1 or VCC2 < 2.1 V X Z
VCC1 and VCC2 > 2.8 V L L
VCC1 and VCC2 > 2.8 V H Z
VCC1 and VCC2 > 2.8 V Z(2) ?
SDA
SCL
VDD
RPU RPU RPU RPU RPU RPU RPU RPU
C
Master C
Slave
GND GND GND
SDA SCL
GND
SDA SCL SDA SCL SDA SCL
DAC
Slave
ADC
Slave
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
9.1.1 I2C Bus Overview
The inter-integrated circuit (I2C) bus is a single-ended, multi-master, 2-wire bus for efficient inter-IC
communication in half-duplex mode.
I2C uses open-drain technology, requiring two lines, serial data (SDA) and serial clock (SCL), to be connected to
VDD by resistors (see Figure 27). Pulling the line to ground is considered a logic zero while letting the line float is
a logic one. This logic is used as a channel access method. Transitions of logic states must occur while the SCL
pin is low. Transitions while the SCL pin is high indicate START and STOP conditions. Typical supply voltages
are 3.3 V and 5 V, although systems with higher or lower voltages are allowed.
Figure 27. I2C Bus
I2C communication uses a 7-bit address space with 16 reserved addresses, so a theoretical maximum of 112
nodes can communicate on the same bus. In praxis, however, the number of nodes is limited by the specified,
total bus capacitance of 400 pF, which restricts communication distances to a few meters.
The specified signaling rates for the ISO1540 and ISO1541 devices are 100 kbps (standard mode), 400 kbps
(fast mode), 1 Mbps (fast mode plus).
The bus has two roles for nodes: master and slave. A master node issues the clock and slave addresses, and
also initiates and ends data transactions. A slave node receives the clock and addresses and responds to
requests from the master. Figure 28 shows a typical data transfer between master and slave.
From Master to Slave
From Slave to Master
S Slave Address R A DATA A DATA A P
S Slave Address WA DATA A DATA A P
Master Transmitter writing to Slave Receiver
Master Receiver reading from Slave Transmitter
A = acknowledge
A = not acknowledge
S = Start
P = Stop
R = Read
W = Write
1 - 7 1 - 88 9 9 1 - 8 9
SDA
SCL
S P
START
Condition
STOP
condition
7-bit
ADDRESS
8-bit
DATA
8-bit
DATA
R/W ACK /
NACK
ACK ACK
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Application Information (continued)
Figure 28. Timing Diagram of a Complete Data Transfer
The master initiates a transaction by creating a START condition, following by the 7-bit address of the slave it
wishes to communicate with. This is followed by a single read and write (R/W) bit, representing whether the
master wishes to write to 0, or to read from 1 the slave. The master then releases the SDA line to allow the slave
to acknowledge the receipt of data.
The slave responds with an acknowledge bit (ACK) by pulling the SDA pin low during the entire high time of the
9th clock pulse on the SCL signal, after which the master continues in either transmit or receive mode (according
to the R/W bit sent), while the slave continues in the complementary mode (receive or transmit, respectively).
The address and the 8-bit data bytes are sent most significant bit (MSB) first. The START bit is indicated by a
high-to-low transition of SDA while SCL is high. The STOP condition is created by a low-to-high transition of SDA
while SCL is high.
If the master writes to a slave, it repeatedly sends a byte with the slave sending an ACK bit. In this case, the
master is in master-transmit mode and the slave is in slave-receive mode.
If the master reads from a slave, it repeatedly receives a byte from the slave, while acknowledging (ACK) the
receipt of every byte but the last one (see Figure 29). In this situation, the master is in master-receive mode and
the slave is in slave-transmit mode.
The master ends the transmission with a STOP bit, or may send another START bit to maintain bus control for
further transfers.
Figure 29. Transmit or Receive Mode Changes During a Data Transfer
When writing to a slave, a master mainly operates in transmit-mode and only changes to receive-mode when
receiving acknowledgment from the slave.
When reading from a slave, the master starts in transmit-mode and then changes to receive-mode after sending
a READ request (R/W bit = 1) to the slave. The slave continues in the complementary mode until the end of a
transaction.
NOTE
The master ends a reading sequence by not acknowledging (NACK) the last byte
received. This procedure resets the slave state machine and allows the master to send
the STOP command.
VCC1 VCC2
GND1 GND2
8
7
4 5
4
XOUT
XIN
5
6
2
MSP430
G2132
1
2
3
DVss
DVcc
0.1 μF 0.1 μF 0.1 μF
6
SDA
SCL
9
8
10 μF
VS
0.1 μF
MBR0520L
MBR0520L
1:2.2
0.1 μF
3
1
D2
SN6501
D1
Vcc
4,5
2
GND
3.3V
IN
ON GND
OUT
1 5
23
LP2981 -50 10 μF
10 μF
SDA2SDA1
SCL1 SCL2
1.5 1.5 1. 5 1. 5
0.1 μF
8
VDD
GND
AIN0
2
1
9
10
SDA
SCL
4
ADDR
ADS 1115
AIN3
RDY
3
4 Analog
Inputs
7
VIN
GND
VOUT
26
4
REF5040
1μF
22 μF
4
VDD
V A
OUT
V D
OUT
V H
REF
V L
REF
11
10
SDA
SCL
1
DAC8574
8
GND
6
12 3
A2
15
IOVDD
5
4 Analog
Outputs
A3
16
A0
13
9
14
LDAC
A1
0.1 μF
5VISO
5VISO
5VISO
5VISO
SDA
SCL
ISO-BARRIER
1 Ω
Copyright © 2016, Texas Instruments Incorporated
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9.2 Typical Application
In Figure 30, the ultra low-power microcontroller, MSP430G2132, controls the I2C data traffic of configuration
data and conversion results for the analog inputs and outputs. Low-power data converters build the analog
interface to sensors and actuators. The ISO1541 device provides the required isolation between different ground
potentials of the system controller, remote sensor, and actuator circuitry to prevent ground loop currents that
otherwise may falsify the acquired data.
The entire circuit operates from a single 3.3-V supply. A low-power push-pull converter, SN6501, drives a center-
tapped transformer with an output that is rectified and linearly regulated to provide a stable 5-V supply for the
data converter.
Figure 30. Isolated I2C Data Acquisition System
9.2.1 Design Requirements
The recommended power supply voltages (VCC1 and VCC2) must be from 3 V to 5.5 V. A recommended
decoupling capacitor with a value of 0.1 µF is required between both the VCC1 and GND1 pins, and the VCC2
and GND2 pins to support of power supply voltages transient and to ensure reliable operation at all data rates.
9.2.2 Detailed Design Procedure
The power-supply capacitor with a value of 0.1-µF must be placed as close to the power supply pins as possible.
The recommended placement of the capacitors must be 2-mm maximum from input and output power supply
pins (VCC1 and VCC2).
The maximum load permissible on the input lines, SDA1 and SCL1, is 40 pF and on the output lines, SDA2
and SCL2, is 400 pF.
The minimum pullup resistors on the input lines, SDA1 and SCL1 to VCC1 must be selected in such a way that
input current drawn is 3.5 mA. The minimum pullup resistors on the input lines, SDA2 and SCL2, to VCC2 must
be selected in such a way that output current drawn is 35 mA. The maximum pullup resistors on the input lines
(SDA1 and SCL1) to VCC1 and on output lines (SDA1 and SCL1) to VCC2, depends on the load and rise time
requirements on the respective lines.
T = 25 C
VCC1 = 3.6 V
A
o
Time - 50 ns/div
500 mV/div
900 mV
VOL1
GND1
1
ISO1541
SDA2
SCL2
SCL1
GND2
GND1
VCC2
VCC1
SDA1
Isolation Capacitor
4
Side 1 Side 2
2mm
maximum 2 mm
maximum
8
7
6
5
2
3
1
1 k10 F 10 F1 k1 k
1 k
Copyright © 2016, Texas Instruments Incorporated
1
ISO1540
SDA2
SCL2
SCL1
GND2
GND1
VCC2
VCC1
SDA1
Isolation Capacitor
4
Side 1 Side 2
2mm
maximum 2 mm
maximum
8
7
6
5
2
3
1
1 k10 F 10 F1 k1 k
1 k
Copyright © 2016, Texas Instruments Incorporated
24
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,
ISO1541
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Typical Application (continued)
Figure 31. Typical ISO1540 Circuit Hookup
Figure 32. Typical ISO1541 Circuit Hookup
9.2.3 Application Curve
Figure 33. Side 1: Low-to-High Transition
10 mils
10 mils
40 mils FR-4
0r ~ 4.5
Keep this
space free
from planes,
traces, pads,
and vias
Ground plane
Power plane
Low-speed traces
High-speed traces
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10 Power Supply Recommendations
To help ensure reliable operation at data rates and supply voltages, TI recommends connecting a 0.1-µF bypass
capacitor at the input and output supply pins (VCC1 and VCC2). The capacitors should be placed as close to the
supply pins as possible. If only a single, primary-side power supply is available in an application, isolated power
can be generated for the secondary-side with the help of a transformer driver such as TI's SN6501 device. For
such applications, detailed power supply design and transformer selection recommendations are available in
SN6501 Transformer Driver for Isolated Power Supplies. (SLLSEA0).
11 Layout
11.1 Layout Guidelines
A minimum of four layers is required to accomplish a low EMI PCB design (see Figure 34). Layer stacking should
be in the following order (top-to-bottom): high-speed signal layer, ground plane, power plane and low-frequency
signal layer.
Routing the high-speed traces on the top layer avoids the use of vias (and the introduction of their
inductances) and allows for clean interconnects between the isolator and the transmitter and receiver circuits
of the data link.
Placing a solid ground plane next to the high-speed signal layer establishes controlled impedance for
transmission line interconnects and provides an excellent low-inductance path for the return current flow.
Placing the power plane next to the ground plane creates additional high-frequency bypass capacitance of
approximately 100 pF/in2.
Routing the slower speed control signals on the bottom layer allows for greater flexibility as these signal links
usually have margin to tolerate discontinuities such as vias.
If an additional supply voltage plane or signal layer is needed, add a second power or ground plane system to
the stack to keep it symmetrical. This makes the stack mechanically stable and prevents it from warping. Also the
power and ground plane of each power system can be placed closer together, thus increasing the high-frequency
bypass capacitance significantly.
For detailed layout recommendations, see the Digital Isolator Design Guide (SLLA284)
11.1.1 PCB Material
For digital circuit boards operating at less than 150 Mbps, (or rise and fall times greater than 1 ns), and trace
lengths of up to 10 inches, use standard FR-4 UL94V-0 printed circuit board. This PCB is preferred over cheaper
alternatives because of lower dielectric losses at high frequencies, less moisture absorption, greater strength and
stiffness, and the self-extinguishing flammability-characteristics.
11.2 Layout Example
Figure 34. Recommended Layer Stack
26
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation see the following:
Digital Isolator Design Guide (SLLA284)
ISO154xEVM Low-Power Bidirectional I2C Isolators Evaluation Module (SLLU166)
TI Isolation Glossary (SLLA353)
SN6501 Transformer Driver for Isolated Power Supplies. (SLLSEA0)
12.2 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 3. Related Links
PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL
DOCUMENTS TOOLS &
SOFTWARE SUPPORT &
COMMUNITY
ISO1540 Click here Click here Click here Click here Click here
ISO1541 Click here Click here Click here Click here Click here
12.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.4 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.5 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.7 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
27
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13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
PACKAGE OPTION ADDENDUM
www.ti.com 24-Aug-2018
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
ISO1540D ACTIVE SOIC D 8 75 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 IS1540
ISO1540DR ACTIVE SOIC D 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 IS1540
ISO1541D ACTIVE SOIC D 8 75 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 IS1541
ISO1541DR ACTIVE SOIC D 8 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 125 IS1541
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
PACKAGE OPTION ADDENDUM
www.ti.com 24-Aug-2018
Addendum-Page 2
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF ISO1540, ISO1541 :
Automotive: ISO1540-Q1, ISO1541-Q1
NOTE: Qualified Version Definitions:
Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
ISO1540DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
ISO1541DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 21-Nov-2016
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ISO1540DR SOIC D 8 2500 367.0 367.0 38.0
ISO1541DR SOIC D 8 2500 367.0 367.0 38.0
PACKAGE MATERIALS INFORMATION
www.ti.com 21-Nov-2016
Pack Materials-Page 2
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