PIC18F66K80 PIC18F66K80 Family Silicon Errata and Data Sheet Clarification The PIC18F66K80 family devices that you have received conform functionally to the current Device Data Sheet (DS39977D), except for the anomalies described in this document. The silicon issues discussed in the following pages are for silicon revisions with the Device and Revision IDs listed in Table 1. The silicon issues are summarized in Table 2. The errata described in this document will be addressed in future revisions of the PIC18F66K80 silicon. Note: This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated in the last column of Table 2 apply to the current silicon revision (A4). For example, to identify the silicon revision level using MPLAB IDE in conjunction with MPLAB ICD 3 or PICkitTM 3: 1. 2. 3. 4. Using the appropriate interface, connect the device to the MPLAB ICD 3 programmer/ debugger or PICkitTM 3. From the main menu in MPLAB IDE, select Configure>Select Device and then select the target part number in the dialog box. Select the MPLAB hardware tool (Debugger>Select Tool). Perform a "Connect" operation to the device (Debugger>Connect). Depending on the development tool used, the part number and Device Revision ID value appear in the Output window. Note: Data Sheet clarifications and corrections start on page 8, following the discussion of silicon issues. The silicon revision level can be identified using the current version of MPLAB(R) IDE and Microchip's programmers, debuggers and emulation tools, which are available at the Microchip corporate web site (www.microchip.com). TABLE 1: If you are unable to extract the silicon revision level, please contact your local Microchip sales office for assistance. The DEVREV values for the various PIC18F66K80 silicon revisions are shown in Table 1. SILICON DEVREV VALUES Part Number Revision ID for Silicon Revision(2) Device ID(1) A2 A3 A4 PIC18F66K80 60E0 PIC18F65K80 6140 PIC18F46K80 6100 PIC18F45K80 6160 PIC18F26K80 6120 PIC18F25K80 6180 2h 3h 4h PIC18LF66K80 61C0 PIC18LF65K80 6220 PIC18LF46K80 61E0 PIC18LF45K80 6240 PIC18LF26K80 6200 PIC18LF25K80 6260 Note 1: The Device IDs (DEVID and DEVREV) are located at the last two implemented addresses of configuration memory space. They are shown in hexadecimal in the format, "DEVID DEVREV". 2: Refer to the "PIC18F66K80 Flash Programming Specification" (DS39972) for detailed information on Device and Revision IDs for your specific device. 2011 Microchip Technology Inc. DS80519D-page 1 PIC18F66K80 TABLE 2: SILICON ISSUE SUMMARY Module Feature Item Number Affected Revisions(1) Issue Summary A2 A3 A4 X X X X X X X Analog-to-Digital A/D Converter (A/D) Performance 1. The 12-bit A/D performance is outside of data sheet's A/D Converter specifications. X EUSART Synchronous Transmit 2. When using the Synchronous Transmit mode, transmitted data may become corrupted if using the TXxIF bit to determine when to load the TXREGx register. X ECCP Auto-Shutdown 3. The tri-state setting of the auto-shutdown feature in the enhanced PWM will not successfully drive the pin to tri-state. X ECAN CAN Clock Source Selection 4. CLKSEL bit in the CIOCON register is modifiable while the ECAN module is active. X Ultra Low-Power Sleep Entry Sleep 5. Entering Ultra Low-Power Sleep mode by setting RETEN = 0 and SRETEN = 1, will cause the part to not be programmable through ICSPTM. X IPD and IDD Maximum Limit 6. Maximum current limits may be higher than specified in Table 31-2 of the data sheet. X Reset (BOR) Enable/Disable An unexpected Reset may occur if the Brown-out Reset module (BOR) is disabled, and then re-enabled, when the High/Low-Voltage Detection module (HLVD) is not enabled (HLVDCON<4> = 0). X 7. ECAN EWIN 8. The enhanced window address feature, EWIN<4:0>, in the ECANCON register, will not move the BnCON 0 = 01). X X Note 1: Only those issues indicated in the last column apply to the current silicon revision. DS80519D-page 2 2011 Microchip Technology Inc. PIC18F66K80 Silicon Errata Issues Note: The 12-bit A/D issues will be fixed in future revisions of this part. Reduced bit resolution specifications can be derived by dividing, as appropriate. For instance, 10-bit guidance is obtained by dividing the parameters in Table 3 by four. This document summarizes all silicon errata issues from all revisions of silicon, previous as well as current. Only the issues indicated by the shaded column in the following tables apply to the current silicon revision (A4). A/D Offset The A/D may have high offset error, up to a maximum of 25 LSBs; it can be used if the A/D is calibrated for the offset. 1. Module: Analog-to-Digital Converter (A/D) The 12-bit A/D performance is outside of the data sheet's A/D Converter specifications. When used as a 12-bit A/D, the possible issues are high offset error, up to a maximum of 25 LSBs; high DNL error, up to a maximum of +6.0/-4.0 LSBs; and multiple missing codes, up to a maximum of twenty. Users should evaluate the 12-bit A/D performance in their application using the suggested work around below. See Table 3 for guidance specifications. TABLE 3: Param No. Work around Calibrate for offset in Single-Ended mode by connecting A/D +ve input to ground and taking the A/D reading. This will be the offset of the device and can be used to compensate for the subsequent A/D readings on the actual inputs. A/D CONVERTER CHARACTERISTICS Sym Characteristic Min Typ Max Units bit Conditions VREF 5.0V A01 NR Resolution -- -- 12 A03 EIL Integral Linearity Error -- -- 10.0 LSb VREF 5.0V A04 EDL Differential Linearity Error -- -- +6.0/-4.0 LSb VREF 5.0V A06 EOFF Offset Error -- -- 25 LSb VREF 5.0V A07 EGN Gain Error -- -- 15 LSb VREF 5.0V A10 -- Monotonicity(1) A20 VREF Reference Voltage Range (VREFH - VREFL) A21 VREFH Reference Voltage High A22 VREFL Reference Voltage Low A25 VAIN Analog Input Voltage Note 1: VSS VAIN VREF -- 3 -- AVDD - AVSS AVSS + 3.0V -- AVDD + 0.3V V AVSS - 0.3V -- AVDD - 3.0V V VREFL -- VREFH V V The A/D conversion result never decreases with an increase in the input voltage. Affected Silicon Revisions A2 A3 A4 X X X 2011 Microchip Technology Inc. DS80519D-page 3 PIC18F66K80 2. Module: EUSART In Synchronous Transmit mode, data may be corrupted if using the TXxIF bit to determine when to load the TXREGx register. One or more of the intended transmit messages may be incorrect. Work around 4. Module: ECAN The CLKSEL bit in the CIOCON register remains modifiable while the ECAN module is not in Configuration mode. Accidental state changes of this bit will result in immediate bit clock changes that will affect all nodes on the bus. A fixed delay added before loading the TXREGx may not be a reliable work around. When loading the TXREGx, check that the TRMT bit inside of the TXSTAx register is set instead of checking the TXxIF bit. The following code can be used: Work around while(!TXSTAxbits.TRMT); // wait to load TXREGx until TRMT is set Affected Silicon Revisions Affected Silicon Revisions A2 A3 A4 While the ECAN module is in Run mode, do not modify the state of the CLKSEL bit in the CIOCON register unless the CAN module is first changed into Configuration mode. A2 A3 A4 X X 5. Module: Ultra Low-Power Sleep 3. Module: ECCP The tri-state setting of the auto-shutdown feature, in the enhanced PWM, will not successfully drive the pin to tri-state. The pin will remain an output and should not be driven externally. All tri-state settings will be affected. Work around Use one of the other two auto-shutdown states available, as outlined in the data sheet. Affected Silicon Revisions A2 A3 A4 X X X Entering Ultra Low-Power Sleep mode by setting RETEN = 0 and SRETEN = 1, will cause the part to not be programmable through ICSP. This issue occurs when the RETEN fuse bit in CONFIG1L<0> is cleared to `0', the SRETEN bit in the WDTCON register is set to `1' and a SLEEP instruction is executed within the first 350 s of code execution. This happens after a Reset event, causing the part to enter Ultra Low-Power Sleep mode. Work around Use normal Sleep and Low-Power Sleep modes only, or on any Reset, ensure that at least 350 s passes before executing a SLEEP instruction when ULP is enabled. To ensure the Ultra Low-Power Sleep mode is not enabled, the RETEN fuse bit in CONFIG1L<0> should be set to a `1', and the SRETEN bit in the WDTCON register should be cleared to a `0'. The following code can be used: //This will ensure the RETEN fuse is set to 1 #pragma config RETEN = OFF //This will ensure the SRETEN bit is 0 WDTCONbits.SRETEN = 0; If the Ultra Low-Power Sleep mode is needed, then the user must ensure that the minimum time, before the first SLEEP instruction is executed, is greater than 350 s. Affected Silicon Revisions A2 A3 A4 X DS80519D-page 4 2011 Microchip Technology Inc. PIC18F66K80 6. Module: IPD and IDD All IDD maximum limits will equal 2.8 times the value listed in the data sheet. The IPD and IDD limits do not match the data sheet. The IPD values, shown in bold in Section 31.2 "DC Characteristics: PowerDown and Supply Current PIC18F66K80 Family (Industrial/Extended)" (below), reflect the updated silicon maximum limits. Affected Silicon Revisions A2 A3 A4 X . 31.2 DC Characteristics: Power-Down and Supply Current PIC18F66K80 Family (Industrial/Extended) PIC18F66K80 (Industrial/Extended) Param No. Standard Operating Conditions (unless otherwise stated) Operating temperature -40C TA +85C for industrial -40C TA +125C for extended Device Typ Max Units Conditions Power-Down Current (IPD)(1) PIC18LFXXK80 PIC18LFXXK80 PIC18FXXK80 PIC18FXXK80 Legend: Note 1: 2: 3: 4: 5: 0.008 7 A -40C 0.013 7 A +25C 0.035 9 A +60C 0.218 10 A +85C 125C 3 12 A 0.014 8 A -40C 0.034 8 A +25C 0.092 9 A +60C 0.312 10 A +85C 4 16 A 125C 0.2 9 A -40C 0.23 9 A +25C 0.32 10 A +60C 0.51 11 A +85C 5 18 A 125C 0.22 10 A -40C 0.24 10 A +25C 0.34 11 A +60C 0.54 12 A +85C 5 20 A 125C VDD = 1.8V(4) (Sleep mode) Regulator Disabled VDD = 3.3V(4) (Sleep mode) Regulator Disabled VDD = 3.3V (Sleep mode) Regulator Enabled VDD = 5V(5) (Sleep mode) Regulator Enabled Shading of rows is to assist in readability of the table. The power-down current in Sleep mode does not depend on the oscillator type. Power-down current is measured with the part in Sleep mode, with all I/O pins in high-impedance state and tied to VDD or VSS, and all features that add delta current disabled (such as WDT, SOSC oscillator, BOR, etc.). The supply current is mainly a function of operating voltage, frequency and mode. Other factors, such as I/O pin loading and switching rate, oscillator type and circuit, internal code execution pattern and temperature, also have an impact on the current consumption. The test conditions for all IDD measurements in active operation mode are: OSC1 = external square wave, from rail-to-rail; all I/O pins tri-stated, pulled to VDD; MCLR = VDD; WDT enabled/disabled as specified. Standard, low-cost 32 kHz crystals have an operating temperature range of -10C to +70C. Extended temperature crystals are available at a much higher cost. For LF devices, RETEN (CONFIG1L<0>) = 1. For F devices, SRETEN (WDTCON<4>) = 1 and RETEN (CONFIG1L<0>) = 0. 2011 Microchip Technology Inc. DS80519D-page 5 PIC18F66K80 7. Module: Reset (BOR) 8. Module: ECAN An unexpected Reset may occur if the Brownout Reset module (BOR) is disabled, and then re-enabled, when the High/Low-Voltage Detection module (HLVD) is not enabled (HLVDCON<4> = 0). This issue affects BOR modes: BOREN<1:0> = 10 and BOREN<1:0> = 01. In both of these modes, if the BOR module is re-enabled while the device is active, unexpected Resets may be generated. Work around Work around 1. If BOR is required and power consumption is not an issue, use BOREN<1:0> = 11. For BOREN<1:0> = 10 mode, either switch to BOREN<1:0> = 11 mode or enable the HLVD (HLVDCON<4> = 1) prior to entering Sleep. If power consumption is an issue and low power is desired, do not use BOREN<1:0> = 10 mode. Instead, use BOREN<1:0> = 01 and follow the steps below when entering and exiting Sleep. 1. The enhanced window address feature, EWIN<4:0>, in the ECANCON register, will not move the BnCON 0 = 0). WDTCONbits.SBOREN = 0; 2. Enter Sleep mode (if desired). Sleep(); 3. After exiting Sleep mode (if entered), enable the HLVD bit (HLVDCON<4> = 1). 3. HLVDCONbits.HLVDEN = 1; 4. Wait for the internal reference voltage (TIRVST) to stabilize (typically 25 s). 5. Re-enable BOR (RCON<6> = 1). while(!HLVDCONbits.IRVST); by setting SBOREN WDTCONbits.SBOREN = 1; 6. Disable the HLVD (HLVDCON<4> = 0). by clearing HLVDCONbits.HLVDEN = 0; Affected Silicon Revisions HLVDEN 4. Set the ECANCON register EWIN bits to the desired buffer. ECANCONbits.EWIN = Buffer_Selection; Decode the desired buffer to each individual Buffer Control register, BnCON 0, is cleared on 28-pin devices, the MCLR pin will be disabled but input data will not be available on RE3. 10. Module: Timer1/Timer3 Timer1 and Timer3 gate control will not function up to the speed of FOSC when the TxCON is set to the system clock (TxCON<7:6> = 01). Results will always be at the resolution of FOSC/4, although the internal FOSC has been selected as the clock source. Work around Work around None. Use the external clock input pin setting, TxCON<7:6> = 10 and TxCON<3> = 0. Affected Silicon Revisions A2 A3 A4 X X X 2011 Microchip Technology Inc. Affected Silicon Revisions A2 A3 X X A4 DS80519D-page 7 PIC18F66K80 Data Sheet Clarifications The following typographic corrections and clarifications are to be noted for the latest version of the device data sheet (DS39977D): Note: Corrections are shown in bold. Where possible, the original bold text formatting has been removed for clarity. 1. Module: RXFCON Registers Table 6-1 on Page 116 of the Data Sheet should show the following register addresses: E47h-RXFCON1 E46h-RXFCON0 2. Module: RXFCON Registers Table 6-2 on Page 125 of the Data Sheet should show the following register addresses: E47h-RXFCON1 E46h-RXFCON0 DS80519D-page 8 3. Module: Listen Only Mode Page 441, Section 27.3.4 "Listen Only Mode" will be revised to: Listen Only mode provides a means for the PIC18F66K80 family devices to receive all messages, including messages with errors. This mode can be used for bus monitor applications or for detecting the baud rate in `hot plugging' situations. For Auto-Baud Detection, it is necessary that there are at least two other nodes which are communicating with each other. The baud rate can be detected empirically by testing different values until valid messages are received. The Listen Only mode is a silent mode, meaning no messages will be transmitted while in this state, including error flags or Acknowledge signals. In Listen Only mode, both valid and invalid messages will be received regardless of RXMn bit settings. The filters and masks can still be used to allow only particular valid messages to be loaded into the Receive registers, or the filter masks can be set to all zeros to allow a message with any identifier to pass. All invalid messages will be received in this mode, regardless of filters and masks or RXMn Receive Buffer mode bits. The error counters are reset and deactivated in this state. The Listen Only mode is activated by setting the mode request bits in the CANCON register. 2011 Microchip Technology Inc. PIC18F66K80 4. Module: A/D Converter Characteristics The values in Table 31-25 reflect the updated A/D Converter Characteristics. The new information is shown in bold text. TABLE 31-25: A/D CONVERTER CHARACTERISTICS: PIC18F66K80 (INDUSTRIAL/EXTENDED) Param No. Sym Characteristic Min Typ Max Units Conditions 12 bit VREF 5.0V A01 NR Resolution -- -- A03 EIL Integral Linearity Error -- <1 6.0 LSB VREF 5.0V A04 EDL Differential Linearity Error -- <1 +3.0/-1.0 LSB VREF 5.0V A06 EOFF Offset Error -- <1 9.0 LSB VREF 5.0V A07 EGN Gain Error -- <1 8.0 LSB VREF 5.0V 3 -- VDD - VSS A10 A20 -- Monotonicity(1) -- VREF Reference Voltage Range (VREFH - VREFL) -- VSS VAIN VREF V For 12-bit resolution A21 VREFH Reference Voltage High AVSS + 3.0V -- AVDD + 0.3V V For 12-bit resolution A22 VREFL Reference Voltage Low AVSS - 0.3V -- AVDD - 3.0V V For 12-bit resolution A25 VAIN Analog Input Voltage VREFL -- VREFH V A28 AVDD Analog Supply Voltage VDD - 0.3 -- VDD + 0.3 V A29 AVSS Analog Supply Voltage VSS - 0.3 -- VSS + 0.3 V A30 ZAIN Recommended Impedance of Analog Voltage Source -- -- 2.5 k A50 IREF VREF Input Current(2) -- -- -- -- 5 150 A A Note 1: 2: During VAIN acquisition. During A/D conversion cycle. The A/D conversion result never decreases with an increase in the input voltage. VREFH current is from the RA3/AN3/VREF+ pin or VDD, whichever is selected as the VREFH source. VREFL current is from the RA2/AN2/VREF-/CVREF pin or VSS, whichever is selected as the VREFL source. 5. Module: HLVD Note 1 under Register 26-1: HLVDCON, on page 387, should direct to Parameter D420: Note 1: For the electrical specifications, see Parameter D420 in Section 31.0 "Electrical Characteristics". 6. Module: Power-up Timer Period Table 31-11 on page 572 of the data sheet, Parameter 33 TPWRT will be revised to a typical value of 1.0 ms. 2011 Microchip Technology Inc. DS80519D-page 9 PIC18F66K80 APPENDIX A: DOCUMENT REVISION HISTORY Rev A Document (2/2011) Initial release of this document; issued for revision, A2. Includes silicon issues 1 (Analog-to-Digital Converter), 2 (EUSART), 3 (ECCP), 4 (ECAN), 5 (Ultra Low-Power Sleep) and 6 (IPD and IDD). Rev B Document (4/2011) Added silicon issues 7 (Reset - BOR) and 8 (ECAN). Added data sheet clarifications 1, 2 (RXFCON Registers) and 3 (Listen Only Mode). Rev C Document (9/2011) Added Table 3, 10-Bit A/D Converter Characteristics to silicon issue 1 (Analog-to-Digital Converter). Added silicon issues 9 (MCLRE) and 10 (Timer1/Timer3). Added data sheet clarifications 4 (A/D Converter Characteristics) and 5 (HLVD). Rev D Document (12/2011) Added silicon revision A4; includes issues 1 (Analogto-Digital Converter - A/D), 3 (ECCP), 7 (Reset - BOR) issues 9 (MCLRE). Added data sheet clarification 6 (Power-up Timer Period). Updated data sheet revision level to "D". All previous clarifications carried into this revision. DS80519D-page 10 2011 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: * Microchip products meet the specification contained in their particular Microchip Data Sheet. * Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. * There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip's Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. * Microchip is willing to work with the customer who is concerned about the integrity of their code. * Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as "unbreakable." Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip's code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. 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Analog-for-the-Digital Age, Application Maestro, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE, rfLAB, Select Mode, Total Endurance, TSHARC, UniWinDriver, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. (c) 2011, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. ISBN: 978-1-61341-879-6 Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company's quality system processes and procedures are for its PIC(R) MCUs and dsPIC(R) DSCs, KEELOQ(R) code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip's quality system for the design and manufacture of development systems is ISO 9001:2000 certified. 2011 Microchip Technology Inc. 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