REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Changes in accordance with NOR 5962-R059-93.
93-01-06
Michael A. Frye
B
Incorporate revision A NOR. Update drawing to current requirements.
Editorial changes throughout. - drw
06-10-10
Raymond Monnin
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS REV B B B B B B B B B B
OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10
PMIC N/A PREPARED BY
Marcia B. Kelleher
DEFENSE SUPPLY CENTER COLUMBUS
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
D. A. DiCenzo
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
APPROVED BY
Robert P. Evans
MICROCIRCUIT, LINEAR, 4 CHANNEL VIDEO
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
87-09-25
MULTIPLEXER, MONOLITHIC SILICON
AMSC N/A
REVISION LEVEL
B
SIZE
A
CAGE CODE
67268
5962-87618
SHEET
1 OF
10
DSCC FORM 2233
APR 97 5962-E016-07
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-87618 01 V A
Drawing number Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type. The device type identifies the circuit function as follows:
Device type Generic number Circuit function
01 HI524 4 channel wideband and video multiplexer
1.2.2 Case outline. The case outline is as designated in MIL-STD-1835 as follows:
Outline letter Descriptive designator Terminals Package style
V GDIP1-T18 or CDIP2-T18 18 Dual-in-line
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings.
Digital input voltage ......................................................................................... -6 V dc ≤ VAH ≤ +6 V dc
Analog input (VS) or output (VO) maximum voltage.......................................... +VSUPPLY + 2 V dc
Analog input (VS) or output (VO) minimum voltage........................................... -VSUPPLY - 2 V dc
Voltage between supply (V+ - V-) .................................................................... +33 V dc
Supply voltage to pwr gnd (V+ to pwr gnd; pwr gnd to V-) ............................... +16.5 V dc
Power dissipation (PD) ..................................................................................... 1.23 W 1/
Storage temperature range (TS)....................................................................... -65°C to +150°C
Thermal resistance, junction-to-ambient (θJA).................................................. 81°C/W
Thermal resistance, junction-to-case (θJC)....................................................... See MIL-STD-1835
1.4 Recommended operating conditions.
Ambient operating temperature range (TA) ...................................................... -55°C to +125°C
______
1/ Derate 12.3 mW/°C above TA = 75°C.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-
PRF-38535 is required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535, appendix A and herein.
3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.4 Functional diagram. The functional diagram shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in table I.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
V- = -15 V, V+ = +15 V,
VEN = +2.4 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Input leakage current
1/ IIH Measure inputs sequentially,
connect all unused inputs to GND 1, 2, 3 01 1.0 µA
I
IL Measure inputs sequentially,
connect all unused inputs to 5 V 20.0
Leakage current into
source terminal of an +IS(OFF) VS = +10 V, VD = -10 V, VEN = 0.8 V,
all unused inputs = -10 V 1, 2, 3 01 -50 50 nA
“OFF” switch -IS(OFF) VS = -10 V, VD = +10 V, VEN = 0.8 V,
all unused inputs = +10 V -50 50
Leakage current into
drain terminal of an +ID(OFF) VD = +10 V, VS = -10 V, VEN = 0.8 V,
all unused inputs = -10 V 1, 2, 3 01 -50 50 nA
“OFF” switch -ID(OFF) VD = -10 V, VS = +10 V, VEN = 0.8 V,
all unused inputs = +10 V -50 50
Leakage current from
an “ON” in driver into +ID(ON) VD = VS = +10 V,
all unused inputs = -10 V 1, 2, 3 01 -50 50 nA
the switch (drain) -ID(ON) VD = VS = -10 V,
all unused inputs = +10 V -50 50
(+) Supply current I(+)
VEN = 2.4 V, VS = 0 V, (VD open)
Sequence all address combinations,
record highest I(+)
1, 2, 3 01 25 mA
(-) Supply current I(-)
VEN = 2.4 V, VS = 0 V, (VD open)
Sequence all address combinations,
record highest I(-)
1, 2, 3 01 -25 mA
Standby positive
supply current +ISBY V
EN = 0.8 V, VA = 0 V 1, 2, 3 01 25 mA
Standby negative
supply current -ISBY V
EN = 0.8 V, VA = 0 V 1, 2, 3 01 -25 mA
Input low threshold
voltage VAL 1, 2, 3 01 0.8 V
Input high threshold
voltage VAH 1, 2, 3 01 2.4 V
Switch “ON”
resistance RDS V
S = 0 V, ID = 100 µA 1, 2, 3 01 1.5 kΩ
Functional tests See 4.3.1c 7, 8
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
V- = -15 V, V+ = +15 V,
VEN = +2.4 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Break-before-make
time delay 2/ tD RL = 500Ω,
CL = 12.5 pF TA = +25°C 9 01 10 ns
T
A = +125°C 10 2
T
A = -55°C 11 2
Propagation delay
times: address inputs
tON(A),
tOFF(A)
RL = 10 MΩ,
CL = 12.5 pF TA = +25°C 9 01 300 ns
To I/O time T
A = -55°C, +125°C 10, 11 500
Enable to I/O time tON(EN) RL = 500Ω,
CL = 12.5 pF TA = +25°C 9 01 300 ns
T
A = -55°C, +125°C 10, 11 500
t
OFF(EN) T
A = +25°C 9 250
T
A = -55°C, +125°C 10, 11 500
Address capacitance
3/ CA V+ = V- = 0 V
f = 1 MHz TA = +25°C 4 01 7 pF
Output switch
capacitance 3/ COS 4 10
Input switch
capacitance 3/ CIS 4 6
Crosstalk 3/ CT VS = 3 Vp-p,
f = 7 MHz TA = +25°C 4 01 56 dB
Bandwidth (-3 dB) 3/ BW VS = 3 Vp-p TA = +25°C 4 01 6.8 MHz
1/ Input current of one input mode.
2/ Subgroup 11 parameter shall be guaranteed if not tested.
3/ Guaranteed if not tested.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 6
DSCC FORM 2234
APR 97
Device type 01
Case outline V
Terminal
number Terminal symbol
1 +V
2 OUT
3 SIG GND
4 SIG GND
5 IN 4
6 SIG GND
7 IN 3
8 PWR GND
9 A 1
10 A 0
11 EN
12 IN 1
13 SIG GND
14 IN 2
15 SIG GND
16 FB (OUT)
17 -V
18 FB (IN)
FIGURE 1. Terminal connections.
A 1 A 0 EN On
channel
X X L None
L L H 1
L H H 2
H L H 3
H H H 4
Channel 1 is shown
Selected in the diagram
FIGURE 2. Truth table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 7
DSCC FORM 2234
APR 97
FIGURE 3. Functional diagram.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 8
DSCC FORM 2234
APR 97
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 9
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004) 1
Final electrical test parameters
(method 5004) 1*, 2, 3, 7, 9
Group A test requirements
(method 5005) 1, 2, 3, 4, 7, 8, 9, 10, 11
Groups C and D end-point
electrical parameters
(method 5005)
1
* PDA applies to subgroup 1.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroups 7 and 8 shall include verification of the truth table.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-87618
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET 10
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
(614) 692-0547.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by
DSCC-VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 06-10-10
Approved sources of supply for SMD 5962-87618 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised
to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate
of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of
supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8761801VA 3/ HI1-524/883
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source. The last known supplier is listed below.
Vendor CAGE Vendor name
number and address
34371 Harris Semiconductor
P.O. Box 883
Melbourne, FL 32901
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
