MAX333MJP/883B - Maxim Integrated Products, Inc.

SCOPE: QUAD, SPDT, CMOS ANALOG SWITCH

Device Type Generic Number SMD Number

01 MAX333M(x)/883B 5962-93180

Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:

Outline Letter Mil-Std-1835 Case Outline Package Code

SMD Maxim

R JP GDIP1-T20 or CDIP2-T20 20 LEAD CERDIP J20

A bsolute Maximum Ratings

Voltage Referenced to V-

V+ to V- ................................................................................................................................ 44V

V+ to GND ............................................................................................................................ 44V

V- to GND ........................................................................................................................... -44V

VIN, VCOM, VNO, VNC ....................................................................................................... V+ to V-

VNO to VNC ............................................................................................................................ 32V

Current, Any terminal except VCOM, VNO, or VNC ..................................................…....... 30mA

Current, VCOM, VNO, or VNC ............................................................................................... 20mA

Peak Current, VCOM, VNO, or VNC (Pulsed at 1ms, 10% duty cycle max) .......................... 70mA

Lead Temperature (soldering, 10 seconds) .......................................................................... +300°C

Storage Temperature ............................................................................................. -65°C to +150°C

Continuous Power Dissipation 1/ .......................................................….............. TA=+70°C

20 lead CERDIP(derate 11.1mW/°C above +70°C) .................................................. 889mW

Junct ion Temperature TJ ............................................................................…......... +150°C

Thermal Resista nce, J unction to Case, ΘJC:

Case Outline 20 lead CERDIP................................................................... 40°C/W

Thermal Resistance, Junction to Ambient, ΘJA:

Case Outline 20 lead CERDIP................................................................... 90°C/W

Recommended Operating Co ndit ions

Ambient Operating Range (TA) ............................................................ -55°C to +125°C

Positive Supply Voltage (V+) ................................................................................... +15V

Negative Supply Voltage (V-) ................................................................................... -15V

VINL (max) ................................................................................................................ 0.8V

VINH (min) ................................................................................................................ 2.4V

1/ Device mounted with all leads soldered to PC board.

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to ab solute maximum

rating conditions for extended periods may affect device reliability.

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/883B and SMD 5962-93180 Page 2 of 6

TABLE 1. ELECTRICAL TESTS

TEST Symbol

CONDITIONS

-55 °C <=TA<= +125°C

V+=+15V, V-=-15V, GND=0V

VINH=2.4V, VINL=0.8V

Unless otherwise specified

Group A

Subgroup Device

type Limits

Min

Limits

Max

Units

SWITCH

Analog-Signal

Range VANALOG 1,2,3 All -15 15 V

Drain-Source ON

Resistance rDS(ON) ICOM =1mA, VANA=±10V, 1

2,3 All 175

250 Ω

ON Leakage

Current IL(ON) VANA=±14V, VOFF=±14V 1

2All -5

-200 5

200 nA

OFF Leakage

Current IL(OFF) VANA=±14V, VOFF=±14V 1

2All -5

-100 5

100 nA

INPUT

Input Current IIN 1,2,3 All -10 10 µA

SUPPLY

Positive Supply

Current I+ All channels on or off 1

2,3 All -.25

-.50 .25

.50 mA

Negat ive Supply

Current I- All channels on or off 1

2,3 All -.25

-.50 .25

.50 mA

DYNAMIC

Turn-On Time tON 9

10,11 All 500

1000 ns

Turn-Off Time tOFF 9

10,11 All -200 1000

2000 ns

Break-Before-

Make Delay 3/ tOPEN 9

10,11 All 50

5ns

NOTE 2: The algebraic convention whereby the most negative value is a minimum and the most positive value is

a maximum, is used in this table. Negative current shall be defined as conventional current flow out of

a device terminal.

NOTE 3: Guaranteed, but not tested.

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/883B and SMD 5962-93180 Page 3 of 6

ORDERING INFORMATION: SMD Number

MAX333MJP/883B 20 CDIP 5962-9318001MRA

TERMINAL CONNECTIONS:

MAX333MJP/883B

J20

1IN1

2 NO1

3COM1

4NC1

5V-

6 GND

7NC2

8COM2

9 NO2

10 IN2

11 IN3

12 NO3

13 COM3

14 NC3

15 NC

16 V+

17 NC4

18 COM4

19 NO4

20 IN4

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/883B and SMD 5962-93180 Page 4 of 6

QUALITY ASSURAN CE

Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-

Std-883.

Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:

1. Test Condition, A, B, C, or D.

2. TA = +125°C minimum.

3. Interim and final electrical test requirements shall be specified in Table 2.

Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,

C, and D inspection.

Group A inspection:

1. Tests as specified in Table 2.

2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.

Group C and D inspections:

a. End-point electrical parameters shall be specified in Table 1.

b. Steady-state life test, Method 1005 of Mil-Std-883:

1. Test condition A, B, C, D.

2. TA = +125°C, minimum.

3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.

TABLE 2. ELECTRICAL TEST REQUIREMENTS

Mil-Std-883 Test Requirements Subgroups

per Method 5005, Table 1

Interim Electric Parameters

Method 5004 1

Final Electrical Parameters

Method 5005 1*, 2, 3, 9, 10, 11

Group A Test Requirements

Method 5005 1, 2, 3, 9, 10, 11

Group C and D End-Point Electrical Parameters

Method 5005 1

* PDA applies to Subgroup 1 only.

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