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e2v semiconductors SAS 2007
TS68040
Third-Generation 32-bit Microprocessor
Datasheet
0851B–HIREL–06/07
Features
26-42 MIPS Integer Performance
3.5-5.6 MFLOPS Floating-Point-Performance
IEEE® 754-Compatible FPU
Independent Instruction and Data MMUs
4K bytes Physical Instruction Cache and 4K bytes Physical Data Cache Accessed
Simultaneously
32-bit, Nonmultiplexed External Address and Data Buses with Synchronous Interface
User-Object-Code Compatibility with All Earlier TS68000 Microprocessors
Multimaster/Multiprocessor Support via Bus Snooping
Concurrent Integer Unit, FPU, MMU, Bus Controller, and Bus Snooper Maximize
Throughput
4G bytes Direct Addressing Range
Software Support Including Optimizing C Compiler and UNIX® System V Port
IEEE P 1149-1 Test Mode (JTAG)
f = 25 MHz, 33 MHz; VCC = 5V ± 5%; PD = 7W
The Use of the TS88915T Clock Driver is Suggested
Description
The TS68040 is e2v’s third generation of 68000-compatible, high-performance, 32-bit microprocessors. The TS68040 is a
virtual memory microprocessor employing multiple, concurrent execution units and a highly integrated architecture to pro-
vide very high performance in a monolithic HCMOS device. On a single chip, the TS68040 integrates a 68030-compatible
integer unit, an IEEE 754-compatible floating-point unit (FPU), and fully independent instruction and data demand-paged
memory management units (MMUs), including 4K bytes independent instruction and data caches. A high degree of instruc-
tion execution parallelism is achieved through the use of multiple independent execution pipelines, multiple internal buses,
and a full internal Harvard architecture, including separate physical caches for both instruction and data accesses. The
TS68040 also directly supports cache coherency in multimaster applications with dedicated on-chip bus snooping logic.
The TS68040 is user-object-code compatible with previous members of the TS68000 Family and is specifically optimized
to reduce the execution time of compiler-generated code. The 68040 HCMOS technology, provides an ideal balance
between speed, power, and physical device size.
Figure 1-1 on page 2 is a simplified block diagram of the TS68040. Instruction execution is pipelined in both the integer unit
and FPU. Independent data and instruction MMUs control the main caches and the address translation caches (ATCs).
The ATCs speed up logical-to-physical address translations by storing recently used translations. The bus snooper circuit
ensures cache coherency in multimaster and multiprocessing applications.
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Screening
•MIL-STD-883
DESC. Drawing 5962-93143
e2v Standards
1. Block Diagram
Figure 1-1. Simplified Block Diagram
2. Introduction
The TS68040 is an enhanced, 32-bit, HCMOS microprocessor that combines the integer unit processing
capabilities of the TS68030 microprocessor with independent 4K bytes data and instruction caches and
an on-chip FPU. The TS68040 maintains the 32-bit registers available with the entire TS68000 Family as
well as the 32-bit address and data paths, rich instruction set, and versatile addressing modes. Instruc-
tion execution proceeds in parallel with accesses to the internal caches, MMU operations, and bus
controller activity. Additionally, the integer unit is optimized for high-level language environments.
The TS68040 FPU is user-object-code compatible with the TS68882 floating-point coprocessor and con-
forms to the ANSI/IEEE Standard 754 for binary floating-point arithmetic. The FPU has been optimized
to execute the most commonly used subset of the TS68882 instruction set, and includes additional
instruction formats for single and double-precision rounding of results. Floating-point instructions in the
FPU execute concurrently with integer instructions in the integer unit.
INSTRUCTION
CACHE
DATA
CACHE
DATA MEMORY UNIT
INSTRUCTION MEMORY UNIT
INSTRUCTION
ATC
DATA
ATC
INSTRUCTION
FETCH
DECODE
EFFECTIVE
ADDRESS
CALCULATE
EXECUTE
EFFECTIVE
ADDRESS
FETCH
INSTRUCTION
MMU/CACHE/SNOOP
CONTROLLER
BUS
CONTROL
SIGNALS
DATA
BUS
ADDRESS
BUS
DATA
MMU/CACHE/SNOOP
CONTROLLER
OPERAND DATA BUS
INSTRUCTION DATA BUS
B
U
S
C
O
N
T
R
O
L
L
E
R
INSTRUCTION
ADDRESS
DATA
ADDRESS
WRITE
BACK
INTEGER
UNIT
CONVERT
EXECUTE
WRITE
BACK
FLOATING-
POINT
UNIT
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TS68040
The MMUs support multiprocessing, virtual memory systems by translating logical addresses to physical
addresses using translation tables stored in memory. The MMUs store recently used address mappings
in two separate ATCs-on-chip.
When an ATC contains the physical address for a bus cycle requested by the processor, a translation
table search is avoided and the physical address is supplied immediately, incurring no delay for address
translation. Each MMU has two transparent translation registers available that define a one-to-one map-
ping for address space segments ranging in size from 16M bytes to 4G bytes each.
Each MMU provides read-only and supervisor-only protections on a page basis. Also, processes can be
given isolated address spaces by assigning each a unique table structure and updating the root pointer
upon a task swap. Isolated address spaces protect the integrity of independent processes.
The instruction and data caches operate independently from the rest of the machine, storing information
for fast access by the execution units. Each cache resides on its own internal address bus and internal
data bus, allowing simultaneous access to both. The data cache provides write through or copyback
write modes that can be configured on a page-by-page basis.
The TS68040 bus controller supports a high-speed, non multiplexed, synchronous external bus inter-
face, which allows the following transfer sizes: byte, word (2 bytes), long word (4 bytes), and line
(16 bytes). Line accesses are performed using burst transfers for both reads and writes to provide high
data transfer rates.
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3. Pin Assignments
3.1 PGA 179
Figure 3-1. Bottom View
Table 3-1. Power Supply Affectation to PGA Body
GND VCC
PLL S8
Internal Logic C6, C7, C9, C11,C13, K3, K16, L3, M16, R4, R11, R13,
S10, T4, S9, R6, R10
C5, C8, C10, C12, C14, H3, H16, J3, J16, L16, M3, R5,
R12, R8
Output Drivers B2, B4, B6, B8, B10, B13, B15, B17, D2, D17, F2, F17,
H2, H17, L2, L17, N2, N17, Q2, Q17, S2, S15, S17
B5, B9, B14, C2, C17, G2, G17, M2, M17, R2, R17,
S16
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3.2 CQFP 196
Figure 3-2. Pin Assignments
Table 3-2. Power Supply Affectation to CQFP Body
GND VCC
PLL 127
Internal Logic 4, 9, 10, 19, 32, 45, 73, 88, 113, 119, 121, 122, 124,
125, 129, 130, 141, 159, 172
3, 18, 31, 40, 46, 60, 72, 87, 114, 126, 137, 158, 173,
186
Output Drivers
7, 15, 22, 28, 35, 42, 49, 50, 51, 57, 63, 69, 76, 77, 83,
84, 91, 97, 98, 99, 105, 106, 146, 147, 148, 149, 155,
162, 163, 169, 176, 182, 183, 189, 195, 196
12, 25, 38, 54, 66, 80, 94, 102, 152, 166, 179, 192
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4. Signal Description
Figure 3-1 and Table 3-1 describe the signals on the TS68040 and indicate signal functions. The test
signals, TRST, TMS, TCK, TDI, and TDO, comply with subset P-1149.1 of the IEEE testability bus
standard.
Figure 4-1. Functional Signal Groups
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Table 4-1. Signal Index
Signal Name Mnemonic Function
Address Bus A31-A0 32-bit address bus used to address any of 4G bytes
Data Bus D31-D0 32-bit data bus used to transfer up to 32 bits of data per bus transfer
Transfer Type TT1, TT0 Indicates the general transfer type: normal, MOVE 16, alternate logical function
code, and acknowledge
Transfer Modifier TM2, TM0 Indicates supplemental information about the access
Transfer Line Number TLN1, TLN0 Indicates which cache line in a set is being pushed or loaded by the current line
transfer
User Programmable Attributes UPA1, UPA0 User-defined signals, controlled by the corresponding user attribute bits from the
address translation entry
Read Write R/W Identifies the transfer as a read or write
Transfer Size SIZ1, SIZ0 Indicates the data transfer size. These signals, together with A0 and A1, define the
active sections of the data bus
Bus Lock LOCK Indicates a bus transfer is part of a read-modify-write operation, and that the
sequence of transfers should not be interrupted
Bus Lock End LOCKE Indicates the current transfer is the last in a locked sequence of transfer
Cache Inhibit Out CIOUT Indicates the processor will not cache the current bus transfer
Transfer Start TS Indicates the beginning of a bus transfer
Transfer in Progress TIP Asserted for the duration of a bus transfer
Transfer Acknowledge TA Asserted to acknowledge a bus transfer
Transfer Error Acknowledge TEA Indicates an error condition exists for a bus transfer
Transfer Cache Inhibit TCI Indicates the current bus transfer should not be cached
Transfer Burst Inhibit TBI Indicates the slave cannot handle a line burst access
Data Latch Enable DLE Alternate clock input used to latch input data when the processor is operating in
DLE mode
Snoop Control SC1, SC0 Indicates the snooping operation required during an alternate master access
Memory Inhibit MI Inhibits memory devices from responding to an alternate master access during
snooping operations
Bus Request BR Asserted by the processor to request bus mastership
Bus Grant BG Asserted by an arbiter to grant bus mastership to the processor
Bus Busy BB Asserted by the current bus master to indicate it has assumed ownership of the bus
Cache Disable CDIS Dynamically disables the internal caches to assist emulator support
MMU Disable MDIS Disables the translation mechanism of the MMUs
Reset In RSTI Processor reset
Reset Out RSTO Asserted during execution of the RESET instruction to reset external devices
Interrupt Priority Level IPL2-IPL0 Provides an encoded interrupt level to the processor
Interrupt Pending IPEND Indicates an interrupt is pending
Autovector AVEC Used during an interrupt acknowledge transfer to request internal generation of the
vector number
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5. Scope
This drawing describes the specific requirements for the microprocessor TS68040 - 25 MHz and 33
MHz, in compliance with MIL-STD-883 class B or e2v standard screening.
6. Applicable Documents
6.1 MIL-STD-883
1. MIL-STD-883: test methods and procedures for electronics.
2. MIL-I-38535: general specifications for microcircuits.
3. DESC 5962-93143.
7. Requirements
7.1 General
The microcircuits are in accordance with the applicable document and as specified herein.
7.2 Design and Construction
7.2.1 Terminal Connections
See Figure 2-1 and Figure 2-2.
7.2.2 Lead Material and Finish
Lead material and finish shall be as specified in MIL-STD-883 (see enclosed “MIL-STD-883 C and Inter-
nal Standard” on page 46).
Processor Status PST3-PST0 Indicates internal processor status
Bus Clock BCLK Clock input used to derive all bus signal timing
Processor Clock PCLK Clock input used for internal logic timing. The PCLK frequency is exactly 2X the
BCLK frequency
Test Clock TCK Clock signal for the IEEE P1149.1 test access port (TAP)
Test Mode Select TMS Selects the principle operations of the test-support circuitry
Test Data Input TDI Serial data input for the TAP
Test Data Output TDO Serial data output for the TAP
Test Reset TRST Provides an asynchronous reset of the TAP controller
Power Supply VCC Power supply
Ground GND Ground connection
Table 4-1. Signal Index (Continued)
Signal Name Mnemonic Function
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7.2.3 Package
The macro circuits are packaged in hermetically sealed ceramic packages which conform to case out-
lines of MIL-STD-1835-or as follow:
CMGA 10-179-PAK pin grid array, but see “179 pins – PGA” on page 43.
Similar to CQCC1-F196C-U6 ceramic uniform lead chip carrier package with ceramic nonconductive
tie-bar but use e2v’s internal drawing, see “196 pins – Tie Bar CQFP Cavity Up (on request)” on page
44.
Gullwing shape CQFP see “196 pins – Gullwing CQFP cavity up” on page 45.
The precise case outlines are described at the end of the specification (See “Package Mechanical Data”
on page 43.) and into MIL-STD-1835.
7.3 Electrical Characteristics
7.3.1 Absolute Maximum Ratings
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended
operation at the maximum levels may degrade performance and affect reliability.
Note: 1. This device is not tested at TC = +125°C. Testing is performed by setting the junction temperature Tj = +125°C and allowing
the case and ambient temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
Table 7-1. Absolute Maximum Ratings
Symbol Parameter Condition Min Max Unit
VCC Supply Voltage Range -0.3 7.0 V
VIInput Voltage Range -0.3 7.0 V
PDPower Dissipation Large buffers enabled 7.7 W
Small buffers enabled 6.3 W
TCOperating Temperature -55 TJ°C
Tstg Storage Temperature Range -65 +150 °C
TJJunction Temperature(1) +125 °C
Tlead Lead Temperature Max.10 sec soldering +300 °C
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Note: 1. This device is not tested at TC = +125°C. Testing is performed by setting the junction temperature TJ = +125°C and allowing
the case and ambient temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
7.4 Thermal Considerations
7.4.1 General Thermal Considerations
This section is only given as user information.
As microprocessors are becoming more complex and requiring more power, the need to efficiently cool
the device becomes increasingly more important. In the past, the TS68000 Family, has been able to pro-
vide a 0-70°C ambient temperature part for speeds less than 40 MHz. However, the TS68040, which has
a 50 MHz arithmetic logic unit (ALU) speed, is specified with a maximum power dissipation for a particu-
lar mode, a maximum junction temperature, and a thermal resistance from the die junction to the case.
This provides a more accurate method of evaluating the environment, taking into consideration both the
air-flow and ambient temperature available. This also allows a user the information to design a cooling
method which meets both thermal performance requirements and constraints of the board environment.
This section discusses the device characteristics for thermal management, several methods of thermal
management, and an example of one method of cooling the TS68040.
7.4.2 Thermal Device Characteristics
The TS68040 presents some inherent characteristics which should be considered when evaluating a
method of cooling the device. The following paragraphs discuss these die/package and power
considerations.
7.4.3 Die and Package
The TS68040 is being placed in a cavity-down alumina-ceramic 179-pin PGA that has a specified ther-
mal resistance from junction to case of 1°C/W. This package differs from previous TS68000 Family PGA
packages which were cavity up. This cavity-down design allows the die to be attached to the top surface
of the package, which increases the ability of the part to dissipate heat through the package surface or
an attached heat sink. The maximum perimeter that the TS68040 allows for a heat sink on its surface
without interfering with the capacitor pads is 1.48" x 1.48". The specific dimensions and design of the
particular heat sink will need to be determined by the system designer considering both thermal perfor-
mance requirements and size requirements.
Table 7-2. Recommended Conditions of Use
Unless otherwise stated, all voltages are referenced to the reference terminal
Symbol Parameter Min Typ Max Unit
VCC Supply Voltage Range +4.75 +5.25 V
VIL Logic Low Level Input Voltage Range GND
- 0.3 0.8 V
VIH Logic High Level Input Voltage Range +2.0 VCC + 0.3 V
VOH High Level Output Voltage 2.4 V
VOL Low Level Output Voltage 0.5 V
fcClock Frequency -25 MHz Version 25 MHz
-33 MHz Version 33 MHz
TCCase Operating Temperature Range(1) -55 TJmax °C
TJMaximum Operating Junction Temperature +125 °C
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7.4.4 Power Considerations
The TS68040 has a maximum power rating, which varies depending on the operating frequency and the
output buffer mode combination being used. The large buffer output mode dissipates more power than
the small, and the higher frequencies of operation dissipate more power than the lower frequencies. The
following paragraphs discuss trade-offs in using the different output buffer modes, calculation of specific
maximum power dissipation for different modes, and the relationship of thermal resistances and
temperatures.
7.4.5 Output Buffer Mode
The 68040 is capable of resetting to enable for a combination of either large buffers or small buffers on
the outputs of the miscellaneous control signals, data bus, and address bus/transfer attribute pins. The
large buffers offer quicker output times, which allow for an easier logic design. However, they do so by
driving about 11 times as much current as the small buffers (refer to TS68040 Electrical specifications for
current output). The designer should consider whether the quicker timings present enough advantage to
justify the additional consideration to the individual signal terminations, the die power consumption, and
the required cooling for the device. Since the TS68040 can be powered-up in one of eight output buffer
modes upon reset, the actual maximum power consumption for TS68040 rated at a particular maximum
operating frequency is dependent upon the power up mode.
Therefore, the TS68040 is rated at a maximum power dissipation for either the large buffers or small
buffers at a particular frequency (refer to TS68040 Electrical specifications). This allows the possibility of
some of the thermal management to be controlled upon reset. The following equation provides a rough
method to calculate the maximum power consumption for a chosen output buffer mode:
PD = PDSB + (PDLB - PDSB) · (PINSLB/PINSCLB) (1)
where:
PD = Max. power dissipation for output buffer mode
selected
PDSB = Max. power dissipation for small buffer mode
(all outputs)
PDLB = Max. power dissipation for large buffer mode
(all outputs)
PINSLB = Number of pins large buffer mode
PINSCLB = Number of pins capable of the large buffer
mode
Table 6-3 shows the simplified relationship on the maximum power dissipation for eight possible configu-
rations of output buffer modes.
Table 7-3. Maximum Power Dissipation for Output Buffer Mode Configurations
Output Configuration Maximum Power Dissipation
Data Bus
Address Bus and
Transfer Attrib. Misc. Control Signals PD
Small Buffer Small Buffer Small Buffer PDSB
Small Buffer Small Buffer Large Buffer PDSB + (PDLB - PDSB) · 13%
Small Buffer Large Buffer Small Buffer PDSB + (PDLB - PDSB) · 52%
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To calculate the specific power dissipation of a specific design, the termination method of each signal
must be considered. For example, a signal output that is not connected would not dissipate any addi-
tional power if it were configured in the large buffer rather than the small buffer mode.
7.4.6 Relationships Between Thermal Resistances and Temperatures
Since the maximum operating junction temperature has been specified to be 125°C. The maximum case
temperature, TC, in °C can be obtained from:
TC = TJ - PD · ΦJC (2)
where:
TC= Maximum case temperature
TJ= Maximum junction temperature
PD= Maximum power dissipation of the device
ΦJC = Thermal resistance between the junction of the die and the case
In general, the ambient temperature, TA, in °C is a function of the following formula:
TA = TJ - PD · ΦJC - PD · ΦCA (3)
Where the thermal resistance from case to ambient, ΦCA, is the only user-dependent parameter once a
buffer output configuration has been determined. As seen from equation (3), reducing the case to ambi-
ent thermal resistance increases the maximum operating ambient temperature. Therefore, by utilizing
such methods as heat sinks and ambient air cooling to minimize the ΦCA, a higher ambient operating
temperature and/or a lower junction temperature can be achieved.
However, an easier approach to thermal evaluation uses the following formulas:
TA = TJ - PD · ΦJA (4)
or alternatively,
TJ = TA - PD · ΦJA (5)
where:
ΦJA = thermal resistance from the junction to the ambient (ΦJC + ΦCA).
This total thermal resistance of a package, ΦJA, is a combination of its two components, ΦJC and ΦCA.
These components represent the barrier to heat flow from the semiconductor junction to the package
(case) surface (ΦJC) and from the case to the outside ambient (ΦJC). Although ΦJC is device related and
cannot be influenced by the user, ΦCA is user dependent. Thus, good thermal management by the user
can significantly reduce ΦCA achieving either a lower semiconductor junction temperature or a higher
ambient operating temperature.
Small Buffer Large Buffer Large Buffer PDSB + (PDLB - PDSB) · 65%
Large Buffer Small Buffer Small Buffer PDSB + (PDLB - PDSB) · 35%
Large Buffer Small Buffer Large Buffer PDSB + (PDLB - PDSB) · 48%
Large Buffer Large Buffer Small Buffer PDSB + (PDLB - PDSB) · 87%
Large Buffer Large Buffer Large Buffer PDSB + (PDLB - PDSB) · 100%
Table 7-3. Maximum Power Dissipation for Output Buffer Mode Configurations (Continued)
Output Configuration Maximum Power Dissipation
Data Bus
Address Bus and
Transfer Attrib. Misc. Control Signals PD
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7.4.7 Thermal Management Techniques
To attain a reasonable maximum ambient operating temperature, a user must reduce the barrier to heat
flow from the semiconductor junction to the outside ambient (ΦJA). The only way to accomplish this is to
significantly reduce ΦCA by applying such thermal management techniques as heat sinks and ambient
air cooling.
The following paragraphs discuss some results of a thermal study of the TS68040 device without using
any thermal management techniques; using only air-flow cooling, using only a heat sink, and using heat
sink combined with air-flow cooling.
7.4.8 Thermal Characteristics in Still Air
A sample size of three TS68040 packages was tested in free-air cooling with no heat sink. Measure-
ments showed that the average ΦJA was 22.8°C/W with a standard deviation of 0.44°C/W. The test was
performed with 3W of power being dissipated from within the package. The test determined that ΦJA will
decrease slightly for the increasing power dissipation range possible. Therefore, since the variance in
ΦJA within the possible power dissipation range is negligible, it can be assumed for calculation purposes
that ΦJA is valid at all power levels. Using the formulas introduced previously, Table 6-4 shows the
results of a maximum power dissipation of 3 and 5W with no heat sink or air-flow (refer to Table 6-3 to
calculate other power dissipation values).
As seen by looking at the ambient temperature results, most users will want to implement some type of
thermal management to obtain a more reasonable maximum ambient temperature.
7.4.9 Thermal Characteristics in Forced Air
A sample size of three TS68040 packages was tested in forced air cooling in a wind tunnel with no heat
sink. This test was performed with 3W of power being dissipated from within the package. As previously
mentioned, since the variance in ΦJA within the possible power range is negligible, it can be assumed
for calculation purposes that ΦJA is constant at all power levels. Using the previous formulas, Table 6-5
shows the results of the maximum power dissipation at 3 and 5W with air-flow and no heat sink (refer to
Table 6-3 to calculate other power dissipation values).
Table 7-4. Thermal Parameters With No Heat Sink or Air-flow
Defined Parameters Measured Calculated
PDTJΦJC ΦJA ΦCA = ΦJA - ΦJC TC = TJ - PD * ΦJC TA = TJ - PD * ΦJA
3 Watts 125°C 1°C/W 21.8°C/W 20.8°C/W 122°C 59.6°C
5 Watts 125°C 1°C/W 21.8°C/W 20.8°C/W 120°C 16°C
Table 7-5. Thermal Parameters With Forced Air Flow and No Heat Sink
Thermal Mgmt.
Technique Defined Parameters Measured Calculated
Air-flow velocity PDTJΦJC ΦJA ΦCA TCTA
100 LFM 3W 125°C 1°C/W 11.7°C/W 10.7°C/W 122°C 89.9°C
250 LFM 3W 125°C 1°C/W 10°C/W 9°C/W 122°C 95°C
500 LFM 3W 125°C 1°C/W 8.9°C/W 7.9°C/W 122°C 98.3°C
750 LFM 3W 125°C 1°C/W 8.5°C/W 7.5°C/W 122°C 99.5°C
1000 LFM 3W 125°C 1°C/W 8.3°C/W 7.3°C/W 122°C 100.1°C
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By reviewing the maximum ambient operating temperatures, it can be seen that by using the all-small-
buffer configuration of the TS68040 with a relatively small amount of air flow (100 LFM), a 0-70°C ambi-
ent operating temperature can be achieved. However, depending on the output buffer configuration and
available forced-air cooling, additional thermal management techniques may be required.
7.4.10 Thermal Characteristics with a Heat Sink
In choosing a heat sink the designer must consider many factors: heat sink size and composition,
method of attachment, and choice of a wet or dry connection. The following paragraphs discuss the rela-
tionship of these decisions to the thermal performance of the design noticed during experimentation.
The heat sink size is one of the most significant parameters to consider in the selection of a heat sink.
Obviously a larger heat sink will provide better cooling. However, it is less obvious that the most benefit
of the larger heat sink of the pin fin type used in the experimentation would be at still air conditions.
Under forced-air conditions as low as 100 LFM, the difference between the ΦCA becomes very small
(0.4°C/W or less). This difference continues to decrease as the forced air flow increases. The particular
heat sink used in our testing fit the perimeter package surface area available within the capacitor pads
on the TS68040 (1.48" x 1.48") and showed a nice compromise between height and thermal perfor-
mance needs. The heat sink base perimeter area was 1.24" x 1.30" and its height was 0.49". It was a
pin-fin-type (i.e. bed of nails) design composed of Al alloy. The heat sink is shown in Figure 6-1 can be
obtained through Thermalloy Inc. by referencing part number 2338B.
100 LFM 5W 125°C 1°C/W 11.7°C/W 10.7°C/W 120°C 66.5°C
250 LFM 5W 125°C 1°C/W 10°C/W 9°C/W, 120°C 75°C
500 LFM 5W 125°C 1°C/W 8.9°C/W 7.9°C/W 120°C 80.5°C
750 LFM 5W 125°C 1°C/W 8.5°C/W 7.5°C/W 120°C 82.5°C
1000 LFM 5W 125°C 1°C/W 8.3°C/W 7.3°C/W 120°C 83.5°C
Table 7-5. Thermal Parameters With Forced Air Flow and No Heat Sink (Continued)
Thermal Mgmt.
Technique Defined Parameters Measured Calculated
Air-flow velocity PDTJΦJC ΦJA ΦCA TCTA
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Figure 7-1. Heat Sink Example
All pin fin heat sinks tested were made from extrusion Al products. The planar face of the heat sink mat-
ing to the package should have a good degree of planarity; if it has any curvature, the curvature should
be convex at the central region of the heat sink surface to provide intimate physical contact to the PGA
surface. All heat sinks tested met this criteria. Nonplanar, concave curvature the central regions of the
heat sink will result in poor thermal contact to the package. A specification needs to be determined for
the planarity of the surface as part of any heat sink design.
Although there are several ways to attach a heat sink to the package, it was easiest to use a demount-
able heat sink attach called “E-Z attach for PGA packages” developed by Thermalloy (see Figure 6-2).
The heat sink is clamped to the package with the help of a steel spring to a plastic frame (or plastic
shoes Besides the height of the heat sink and plastic frame, no additional height added to the package.
The interface between the ceramic package and the heat sink was evaluated for both dry and wet (i.e.,
thermal grease) interfaces in still air. The thermal grease reduced the ΦCA quite significantly (about 2.5
°C/W) in still air. Therefore, it was used in all other testing done with the heat sink. According to other
testing, attachment with thermal grease provided about the same thermal performance as if a thermal
epoxy were used.
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Figure 7-2. Heat Sink with Attachment
A sample size of one TS68040 package was tested in still air with the heat sink and attachment method
previously described. This test was performed with 3W of power being dissipated from within the pack-
age. Since the variance in ΦJA within the possible power range is negligible, it can be assumed for
calculation purposes that ΦJA is constant at all power levels. Table 6-6 shows the result assuming a max-
imum power dissipation of the part at 3 and 5W (refer to Table 6-3 to calculate other power dissipation
values).
7.4.11 Thermal Characteristics with a Heat Sink and Forced Air
A sample size of three TS68040 packages was tested in forced-air cooling in a wind tunnel with a heat
sink. This test was performed with 3W of power being dissipated from within the package. As mentioned
previously, the variance in ΦJA within the possible power range is negligible; it can be assumed for calcu-
lation purposes that ΦJA is valid at all power levels. Table 6-7 shows the results, assuming a maximum
power dissipation at 3 and 5W with air flow and heat sink thermal management (refer to Table 6-3 to cal-
culate other power dissipation values).
Table 7-6. Thermal Parameters With Heat Sink and No Air Flow
Thermal Mgmt.
Technique Defined Parameters Measured Calculated
Heat Sink PDTJΦJC ΦJA ΦCA TCTA
2338B 3W 125°C 1°C/W 14°C/W 13°C/W 122°C 83°C
2338B 5W 125°C 1°C/W 14°C/W 13°C/W 120°C 55°C
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7.4.12 Thermal Testing Summary
Testing proved that a heat sink in combination with a relatively small amount of air-flow (100 LFM or
less) will easily realize a 0-70°C ambient operating temperature for the TS68040 with almost any config-
uration of the output buffers. A heat sink alone may be capable of providing all necessary cooling,
depending on the particular heat sink height/size restraints, the maximum ambient operating tempera-
ture required, and the output buffer configuration chosen. Also forced air cooling alone may attain a 0-
70°C ambient operating temperature. However this factor is highly dependent on the output buffer con-
figuration chosen and the available forced air for cooling. Figure 6-3 is a summary of the test results of
the relationship between ΦJA and air-flow for the TS68040.
Figure 7-3. Relationship of ΦJA Air-Flow for PGA
Table 7-7. Thermal Parameters with Heat Sink and Air Flow
Thermal Mgmt. Technique Defined Parameters Measured Calculated
Air-flow Heat sink PDTJΦJC ΦJA ΦCA TCTA
100 LFM 2338B 3W 125°C 1°C/W 3.1°C/W 2.1°C/W 122°C 115.7°C
250 LFM 2338B 3W 125°C 1°C/W 2.2°C/W 1.2°C/W 122°C 118.4°C
500 LFM 2338B 3W 125°C 1°C/W 1.7°C/W 0.7°C/W 122°C 119.9°C
750 LFM 2338B 3W 125°C 1°C/W 1.5°C/W 0.5°C/W 122°C 120.5°C
1000 LFM 2338B 3W 125°C 1°C/W 1.4°C/W 0.4°C/W 122°C 120.8°C
100 LFM 2338B 5W 125°C 1°C/W 3.1°C/W 2.1°C/W 120°C 109.5°C
250 LFM 2338B 5W 125°C 1°C/W 2.2°C/W 1.2°C/W 120°C 114°C
500 LFM 2338B 5W 125°C 1°C/W 1.7°C/W 0.7°C/W 120°C 116.5°C
750 LFM 2338B 5W 125°C 1°C/W 1.5°C/W 0.5°C/W 120°C 117.5°C
1000 LFM 2338B 5W 125°C 1°C/W 1.4°C/W 0.4°C/W 120°C 118°C
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7.5 Mechanical and Environment
The microcircuits shall meet all mechanical environmental requirements of either MIL-STD-883 for class
B devices or for e2v standard screening.
7.6 Marking
The document where are defined the marking are identified in the related reference documents. Each
microcircuit are legible and permanently marked with the following information as minimum:
e2v Logo
Manufacturer’s Part Number
Class B Identification
Date-code Of Inspection Lot
ESD Identifier If Available
Country Of Manufacturing
8. Quality Conformance Inspection
8.1 DESC/MIL-STD-883
Is in accordance with MIL-M-38535 and method 5005 of MIL-STD-883. Group A and B inspections are
performed on each production lot. Groups C and D inspection are performed on a periodical basis.
9. Electrical Characteristics
9.1 General Requirements
All static and dynamic electrical characteristics specified for inspection purposes and the relevant mea-
surement conditions are given below:
Table 8-1: Static electrical characteristics for the electrical variants.
Table 8-2: Dynamic electrical characteristics for TS68040 (25 MHz, 33 MHz).
For static characteristics (Table 8-1), test methods refer to IEC 748-2 method number, where existing.
For dynamic characteristics (Table 8-2), test methods refer to clause “Static Characteristics” on page 19
of this specification.
Indication of “min.” or “max.” in the column «test temperature» means minimum or maximum operating
temperature as defined in sub-clause Table 6-2 here above.
Table 7-8. Characteristics Guaranteed
Package Symbol Parameter Value Unit
PGA 179 θJ-A Thermal Resistance Junction-to-ambient See Figure 6-3 °C/W
θJ-C Thermal Resistance Junction-to-case 1 °C/W
CQFP 196 θJ-A Thermal Resistance Junction-to-ambient TBD °C/W
θJ-C Thermal Resistance Junction-to-case 1 °C/W
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9.2 Static Characteristics
Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.
2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not
tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient
temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
3. Capacitance is periodically sampled rather than 100% tested.
4. Power dissipation may vary in between limits depending on the application.
Table 9-1. Electrical Characteristics
-55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified(1)(2)(3)(4)
Symbol Characteristic Min Max Unit
VIH Input High Voltage 2 VCC V
VIL Input Low Voltage GND 0.8 V
VUUndershoot - 0.8 V
Iin
Input Leakage Current
at 0.5/2.4V
AVEC, BCLK BG, CDIS,
IPLn, MDIS, PCLK, RSTI, SCn,
TBI, TCI, TCK, TEA
-20 20 µA
ITSI
Hi-z (Off-state) Leakage Current
at 0.5/2.4V
An, BB, CIOUT, Dn, LOCK,
LOCKE, R/W, SIZn, TA, TDO,
TIP
, TLNn, TMn, TS, TTn, UPAn
-20 20 µA
IIL Signal Low Input Current
VIL = 0.8V
TMS, TDI, TRST -1.1 -0.18 mA
IIH Signal High Input Current
VIH = 2.0V
TMS, TDI, TRST -0.94 -0.16 mA
VOH
Output High Voltage
Larger Buffers - IOH = 35 mA
Small Buffers - IOH = 5 mA
2.4 V
VOL
Output Low Voltage
Larger buffers - IOL = 35 mA
Small buffers - IOL = 5 mA
0.5 V
PD
Power Dissipation (TJ = 125°C)
Larger Buffers Enabled
Small Buffers Enabled
7.7
6.3 W
Cin Capacitance - Note 4
Vin = 0V, f = 1 MHz 25 pF
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9.3 Dynamic Characteristics
Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.
2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not
tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient
temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
3. Specification value at maximum frequency of operation.
4. If not tested, shall be guaranteed to the limits specified.
Figure 9-1. Clock Input Timing
Table 9-2. Clock AC Timing Specifications (see Figure 8-1)
-55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified(1)(2)(3)(4)
Num Characteristic
25 MHz 33 MHz
UnitMinMaxMinMax
Frequency of Operation 20 25 20 33 MHz
1 PCLK Cycle Time 20 25 15 25 ns
2 PCLK Rise Time(4) 1.7 1.7 ns
3 PCLK Fall Time(4) 1.6 1.6 ns
4 PCLK Duty Cycle Measured at 1.5V(4) 47.5 52.5 46.67 53.33 %
4a PCLK Pulse Width High Measured at 1.5V(3)(4) 9.5 10.5 7 8 ns
4b PCLK Pulse Width Low Measured at 1.5V(3)(4) 9.5 10.5 7 8 ns
5 BCLK Cycle Time 40 50 30 60 ns
6, 7 BCLK Rise and Fall Time 4 3 ns
8 BCLK Duty Cycle Measured at 1.5V(4) 40 60 40 60 %
8a BCLK Pulse Width High Measured at 1.5V(4) 16 24 12 18 ns
8b BCLK Pulse Width Low Measured at 1.5V(4) 16 24 12 18 ns
9 PCLK, BCLK Frequency Stability(4) 1000 1000 ppm
10 PCLK to BCLK Skew 9 n/a ns
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Notes: 1. Output timing is specified for a valid signal measured at the pin. Large buffer timing is specified driving a 50 transmission
line with a length characterized by a 2.5 ns one-way propagation delay, terminated through 50 to 2.5V. Large buffer output
impedance is typically 3, resulting in incident wave switching for this environment. Small buffer timing is specified driving an
unterminated 30 transmission line with a length characterized by a 2.5 ns one-way propagation delay. Small buffer output
impedance is typically 30; the small buffer specifications include approximately 5 ns for the signal to propagate the length
of the transmission line and back.
2. All testing to be performed using worst-case test conditions unless otherwise specified.
3. The following pins are active low: AVEC, BG, BS, BR, CDIS, CIOUT, IPEND, IPLO, IPL1, IPL2, LOCK, LOCKE, MDIS, MI,
RST0, RSTI, TA, TBI, TCI, TEA, TIP, TRST, TS and W of R/W.
4. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not
tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient
temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
Table 9-3. Output AC Timing Specifications(1) (Figure 8-2 to Figure 8-8)
These output specifications are only for 25 MHz. They must be scaled for lower operating frequencies. Refer to
TS6804DH/AD for further information. -55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified.(2)(3)(4)
Num Characteristic
25 MHz 33 MHz
Unit
Large Buffer(1) Small Buffer(1) Large Buffer(1) Small Buffer(1)
Min Max Min Max Min Max Min Max
11
BCLK to address CIOUT, LOCK,
LOCKE, R/W, SIZn, TLN, TMn, UPAn
valid(5) 9 21 9 306.50186.5025ns
12 BCLK to output invalid (output hold) 9 9 6.50 6.50 ns
13 BCLK to TS valid 9 21 9 306.50186.5025ns
14 BCLK to TIP valid 9 21 9 306.50186.5025ns
18 BCLK to data-out valid(6) 9 23 9 326.50206.5027ns
19 BCLK to data-out invalid (output hold)(6) 9 9 6.50 6.50 ns
20 BCLK to output low impedance(5)(6) 9 9 6.50 6.50 ns
21 BCLK to data-out high impedance 9 20 9 20 6.50 17 6.50 17 ns
26 BCLK to multiplexed address valid(5) 19 31 19 40 14 26 14 33 ns
27 BCLK to multiplexed address driven(5) 19 19 14 14 ns
28 BCLK to multiplexed address high
impedance(5)(6) 9 18 9 186.50156.5015ns
29 BCLK to multiplexed data driven(6) 19 19 14 20 14 20 ns
30 BCLK to multiplexed data valid(6) 19 33 19 42 14 28 14 35 ns
38
BCLK to address CIOUT, LOCK, LOCKE,
R/W, SIZn, TS, TLNn, TMn, TTn, UPAn
high impedance(5) 9 18 9 186.50156.5015ns
39 BCLK to BB, TA, TIP high impedance 1928192814231423ns
40 BCLK to BR, BB valid 9 21 9 306.50186.5025ns
43 BCLK to MI valid 9 21 9 306.50186.5025ns
48 BCLK to TA valid 9 21 9 306.50186.5025ns
50 BCLK to IPEND, PSTn, RSTO valid 9 21 9 306.50186.5025ns
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5. Timing specifications 11, 20 and 38 for address bus output timing apply when normal bus operation is selected. Specifica-
tions 26, 27 and 28 should be used when the multiplexed bus mode of operation is enabled.
6. Timing specifications 18 and 19 for data bus output timing apply when normal bus operation is selected. Specifications 28
and 29 should be used when the multiplexed bus mode of operation is enabled.
Table 9-4. Input AC Timing Specifications (Figure 8-2 to Figure 8-8)
-55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified(1)(2)(3)(4)
Num Characteristic
25 MHz 33 MHz
UnitMin. Max. Min. Max.
15 Data-in Valid to BCLK (Setup) 5 4 ns
16 BCLK to Data-in Invalid (Hold) 4 4 ns
17 BCLK to Data-in High Impedance (Read Followed By Write) 49 36.5 ns
22a TA Valid to BCLK (Setup) 10 10 ns
22b TEA Valid to BCLK (Setup) 10 10 ns
22c TCI Valid to BCLK (Setup) 10 10 ns
22d TBI Valid to BCLK (Setup) 11 10 ns
23 BCLK to TA, TEA, TCI, TBI Invalid (Hold) 2 2 ns
24 AVEC Valid to BCLK (Setup) 5 5 ns
25 BCLK to AVEC Invalid (Hold) 2 2 ns
31 DLE Width High 8 8 ns
32 Data-in Valid to DLE (Setup) 2 2 ns
33 DLE to Data-in Invalid (Hold) 8 8 ns
34 BCLK to DLE Hold 3 3 ns
35 DLE High to BCLK 16 12 ns
36 Data-in Valid to BCLK (DLE Mode Setup) 5 5 ns
37 BCLK Data-in Invalid (DLE Mode Hold) 4 4 ns
41a BB Valid to BCLK (Setup) 7 7 ns
41b BG Valid to BCLK (Setup) 8 7 ns
41c CDIS, MDIS Valid to BCLK (Setup) 10 8 ns
41d IPLn Valid to BCLK (Setup) 4 3 ns
42 BCLK to BB, BG, CDIS, IPLn, MDIS Invalid (Hold) 2 2 ns
44a Address Valid to BCLK (Setup) 8 7 ns
44b SIZn Valid BCLK (Setup) 12 8 ns
44c TTn Valid to BCLK (Setup) 6 8.5 ns
44d R/W Valid to BCLK (Setup) 6 5 ns
44e SCn Valid to BCLK (Setup) 10 11 ns
45 BCLK to Address SIZn, TTn, R/W, SCn Invalid (Hold) 2 2 ns
46 TS Valid to BCLK (Setup) 5 9 ns
47 BCLK to TS Invalid (Hold) 2 2 ns
49 BCLK to BB High Impedance (68040 Assumes Bus Mastership) 9 9 ns
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Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.
2. The following pins are active low: AVEC, BG, BS, BR, CDIS, CIOUT, IPEND, IPLO, IPL1, IPL2, LOCK, LOCKE, MDIS, MI,
RST0, RSTI, TA, TBI, TCI, TEA, TIP, TRST, TS and W of R/W.
3. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not
tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125°and allowing the case and ambient
temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
4. The levels on CDIS, MDIS, and the IPL2-IPL0 signals enable or disable the multiplexed bus mode, data latch enable mode,
and driver impedance selection respectively.
Figure 9-2. Read/Write Timing
Note: Transfer attribute signals UPAN, SIZN, TTN, TMN, TLNN, R/W, LOCK, LOCKE, CIOUT
51 RSTI Valid to BCLK 5 4 ns
52 BCLK to RSTI Invalid 2 2 ns
53 Mode Select Setup to RSTI Negated(4) 20 20 ns
54 RSTI Negated to Mode Selects Invalid(4) 22ns
Table 9-4. Input AC Timing Specifications (Figure 8-2 to Figure 8-8) (Continued)
-55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified(1)(2)(3)(4)
Num Characteristic
25 MHz 33 MHz
UnitMin. Max. Min. Max.
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Notes: 1. All testing to be performed using worst-case test conditions unless otherwise specified.
2. Maximum operating junction temperature (TJ) = +125°. Minimum case operating temperature (TC) = -55°. This device is not
tested at TC = +125°. Testing is performed by setting the junction temperature TJ = +125° and allowing the case and ambient
temperatures to rise and fall as necessary so as not to exceed the maximum junction temperature.
Table 9-5. JTAG Timing Application (Figure 8-9 to Figure 8-12)
-55°C TC TJmax; 4.75V VCC5.25V unless otherwise specified(1)(2)
Num Characteristic Min Max Unit
TCK Frequency 010MHz
1 TCK Cycle Time 100 ns
2 TCK Clock Pulse Width Measured at 1.5V 40 ns
3 TCK Rise and Fall Times 0 10 ns
4TRST
Setup Time to TCK Falling Edge 40 ns
5TRST
Assert Time 100 ns
6 Boundary Scan Input Data Setup Time 50 ns
7 Boundary Scan Input Data Hold Time 50 ns
8 TCK to Output Data Valid 0 50 ns
9 TCK to Output High Impedance 0 50 ns
10 TMS, TDI Data Setup Time 20 ns
11 TMS, TDI Data Hold Time 5 ns
12 TCK to TDO Data Valid 0 20 ns
13 TCK to TDO High Impedance 0 20 ns
Table 9-6. Boundary Scan Instruction Codes
Bit 2 Bit 1 Bit 0 Instruction Selected Test Data Register Accessed
0 0 0 Extest Boundary Scan
0 0 1 Highz Bypass
0 1 0 Sample/Preload Boundary Scan
0 1 1 DRVCTLT Boundary Scan
1 0 0 Shutdown Bypass
1 0 1 Private Bypass
1 1 0 DRVCTLS Boundary Scan
1 1 1 Bypass Bypass
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9.4 Switching Test Circuit and Waveforms
Figure 9-3. Address and Data Bus Timing — Multiplexed Bus Mode
Figure 9-4. DLE Timing Burst Access
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Figure 9-5. Bus Arbitration Timing
Figure 9-6. Snoop Hit Timing
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Figure 9-7. Snoop Miss Timing
Figure 9-8. Other Signal Timing
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Figure 9-9. Clock Input Timing Diagram
Figure 9-10. TRST Timing Diagram
Figure 9-11. Boundary Scan Timing Diagram
Figure 9-12. Test Access Port Timing Diagram
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10. Functional Description
10.1 Programming Model
The TS68040 integrates the functions of the integer unit, MMU, and FPU. As shown in Figure 9-1, the
registers depicted in the programming model provide access and control for the three units. The regis-
ters are partitioned into two levels of privilege: user and supervisor. User programs, executing in the user
mode, can only use the resources of the user model. System software, executing in the supervisor
mode, has unrestricted access to all processor resources.
The integer portion of the user programming model, consisting of 16, general-purpose, 32-bit registers
and two control registers, is the same as the user programming model of the TS68030. The TS68040
user programming model also incorporates the TS68882 programming model consisting of eight, float-
ing-point, 80-bit data registers, a floating-point control register, a floating-point status register, and a
floating-point instruction address register.
The supervisor programming model is used exclusively by TS68040 system programmers to implement
operating system functions, I/O control, and memory management subsystems. This supervisor/user
distinction in the TS68000 architecture was carefully planned so that all application software can be writ-
ten to execute in the nonprivileged user mode and migrate to the TS68040 from any TS68000 platform
without modification. Since system software is usually modified by system designers when porting to a
new design, the control features are properly placed in the supervisor programming model. For example,
the transparent translation registers of the TS68040 can only be read or written by the supervisor soft-
ware; the programming resources of user application programs are unaffected by the existence of the
transparent translation registers
Registers D0-D7 are data registers containing operands for bit and bit field (1- to 32-bit), byte (8-bit),
word (16-bit), long-word (32-bit), and quad-word (64-bit) operations. Registers A0-A6 and the stack
pointer registers (user, interrupt, and master) are address registers that may be used as software stack
pointers or base address registers. Register A7 is the user stack pointer in user mode, and is either the
interrupt or master stack pointer (A7’ or A7’’) in supervisor mode. In supervisor mode, the active stack
pointer (interrupt or master) is selected based on a bit in the status register (SR). The address registers
may be used for word and long-word operations, and all of the 16 general-purpose registers (D0-D7, A0-
A7 in Figure 9-1) may be used as index registers.
The eight, 80-bit, floating-point data registers (FP0-FP7) are analogous to the integer data registers (D0-
D7) of all TS68000 Family processors. Floating-point data registers always contain extended-precision
numbers. All external operands, regardless of the data format, are converted to extended-precision val-
ues before being used in any floating-point calculation or stored in a floating-point data register.
The program counter (PC) usually contains the address of the instruction being executed by the
TS68040. During instruction execution and exception processing, the processor automatically incre-
ments the contents of the PC or places a new value in the PC, as appropriate. The status register (SR in
the supervisor programming model) contains the condition codes that reflect the results of a previous
operation and can be used for conditional instruction execution in a program. The lower byte of the SR is
accessible in user mode as the condition code register (CCR). Access to the upper byte of the SR is
restricted to the supervisor mode.
As part of exception processing, the vector number of the exception provides an index into the exception
vector table. The base address of the exception vector table is stored in the vector base register (VBR).
The displacement of an exception vector is added to the value in the VBR when the TS68040 accesses
the vector table during exception processing.
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Alternate function code registers, SFC and DFC (source and destination), contain 3-bit function codes.
Function codes can be considered extensions of the 32-bit linear address. Function codes are automati-
cally generated by the processor to select address spaces for data and program accesses at the user
and supervisor modes. The alternate function code registers are used by certain instructions to explicitly
specify the function codes for various operations. The cache control register (CACR) controls enabling of
the on-chip instruction and data caches of the TS68040.
The supervisor root pointer (SRP) and user root pointer (URP) registers point to the root of the address
translation table tree to be used for supervisor mode and user mode accesses. The URP is used if FC2
of the logical address is zero, and the SRP is used if FC2 is one.
The translation control register (TC) enables logical-to-physical address translation and selects either 4K
or 8K page sizes. As shown in Figure 9-1, there are four transparent translation registers - ITT0 and ITT1
for instruction accesses and DTT0 and DTT1 for data accesses. These registers allow portions of the
logical address space to be transparently mapped and accessed without the use of resident descriptors
in an ATC. The MMU status register (MMUSR) contains status information from the execution of a
PTEST instruction. The PTEST instruction searches the translation tables for the logical address as
specified by this instruction’s effective address field and the DFC.
The 32-bit floating-point control register (FPCR) contains an exception enable byte that enables disables
traps for each class of floating-point exceptions and a mode byte that sets the user-selectable modes.
The FPCR can be read or written to by the user and is cleared by a hardware reset or a restore operation
of the null state. When cleared, the FPCR provides the IEEE 754 standard defaults. The floating-point
status register (FPSR) contains a condition code byte, quotient bits, an exception status byte, and an
accrued exception byte. All bits in the FPSR can be read or written by the user. Execution of most float-
ing-point instructions modifies this register.
For the subset of the FPU instructions that generate exception traps, the 32-bit floating-point instruction
address register (FPIAR) is loaded with the logical address of an instruction before the instruction is exe-
cuted. This address can then be used by a floating-point exception handler to locate a floating-point
instruction that has caused an exception. The move floating-point data register (FMOVE) instruction (to
from the FPCR, FPSR, or FPIAR) and the move multiple data registers (FMOVEN) instruction cannot
generate floating-point exceptions; therefore, these instructions do not modify the FPIAR. Thus, the
FMOVE and FMOVEM instructions can be used to read the FPIAR in the trap handler without changing
the previous value.
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Figure 10-1. Programming Model
10.2 Data Types and Addressing Modes
The TS68040 supports the basic data types shown in Table 9-1. Some data types apply only to the inte-
ger unit, some only to the FPU, and some to both the integer unit and the FPU. In addition, the
instruction set supports operations on other data types such as memory addresses.
Note: 1. IU = Integer Unit.
Table 10-1. Data Types
Operand Data Type Size Execution Unit (IU(1), FPU) Notes
Bit 1-bit IU
Bit Field 1-32 bits IU Field of consecutive bits
BCD 32 bits IU Packaged: 2 digits byte
Unpacked: 1 digit byte
Byte Integer 8 bits IU, FPU
Word Integer 16 bits IU, FPU
Long-word Integer 32 bits IU, FPU
Quad-word Integer 64 bits IU Any two data registers
16-byte 128 bits IU Memory-only, aligned 16-byte boundary
Single-precision Real 32 bits FPU 1-bit sign, 8-bit exponent, 23-bit mantissa
Double-precision Real 64 bits FPU 1-bit sign, 11-bit exponent, 52-bit mantissa
Extended-precision Real 80 bits FPU 1-bit sign, 15-bit exponent, 64-bit mantissa
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The three integer data formats that are common to both the integer unit and the FPU (byte, word, and
long word) are the standard twos-complement data formats defined in the TS68000 Family architecture.
Whenever an integer is used in a floating-point operation, the integer is automatically converted by the
FPU to an extended-precision floating-point number before being used. The ability to effectively use inte-
gers in floating-point operations saves user memory because an integer representation of a number
usually requires fewer bits than the equivalent floating-point representation.
Single- and double-precision floating-point data formats are implemented in the FPU as defined by the
IEEE standard. These data formats are the main floating-point formats and should be used for most cal-
culations involving real numbers.
The extended-precision data format is also in conformance with the IEEE standard, but the standard
does not specify this format to the bit level as it does for single- and double-precision. The memory for-
mat for the FPU consists of 96 bits (three long words). Only 80 bits are actually used; the other 16 bits
are reserved for future use and for long-word alignment of the floating-point data structures in memory.
The extended-precision format has a 15-bit exponent, a 64-bit mantissa, and a 1-bit mantissa sign.
Extended-precision numbers are intended for use as temporary variables, intermediate values, or where
extra precision is needed.
The TS68040 addressing modes are shown in Table 9-2. The register indirect addressing modes sup-
port post-increment, predecrement, offset, and indexing, which are particularly useful for handling data
structures common to sophisticated applications and high-level languages. The program counter indirect
mode also has indexing and offset capabilities; this addressing mode is typically required to support
position-independent software. In addition to these addressing modes, the TS68040 provides index siz-
ing and scaling features that enhance software performance. Data formats are supported orthogonally
by all arithmetic operations and by all appropriate addressing modes.
Table 10-2. Addressing Modes
Addressing Modes Syntax
Register Direct
Date Register Direct
Address Register Direct
Dn
An
Register Indirect
Address Register Indirect
Address Register Indirect With Postincrement
Address Register Indirect With Predecrement
Address Register Indirect With Displacement
(An)
(An)
(An)
(d16, An)
Register Indirect With Index
Address Register Indirect With Index (8-bit Displacement)
Address Register Indirect With Index (Base Displacement)
(d8, An, Xn)
(bd, An, Xn)
Memory Indirect
Memory Indirect Postincrement
Memory Indirect Preindexed
([bd, An], Xn, od)
([bd, An, Xn], od)
Program Counter Indirect With Displacement (d16, PC)
Program Counter Indirect With Index
PC Indirect With Index (8-bit Displacement)
PC Indirect With Index (Base Displacement
(d8, PC, Xn)
(bd, PC, Xn)
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Note:
DN = Data register, D0-D7
AN = Address register, A0-A7
d8, d16 = A twos-complement or sign-extended displacement; added as part of the effective address calculation;
size is 8 (d8) or 16 (d16) bits; when omitted, assemblers use a value of zero.
Xn = Address or data register used as an index register; form is Xn, SIZE*SCALE, where SIZE is W or L
(indicates index register size) and SCALE is 1, 2, 4 or 8 (index register os multiplied by SCALE); use of
SIZE and or SCALE is optional.
bd = A twos-complement base displacement; when present, size can be 16 or 32 bits.
od = Outer displacement added as part of effective address calculation after any memory indirection; use is
optional with a size of 16 or 32 bits.
PC = Program counter.
(data) = Immediate value of 8, 16 or 32 bits.
( ) = Effective address.
[ ] = Used as indirect address to long-word address.
Program Counter Memory Indirect
PC Memory Indirect Postindexed
PC Memory Indirect Preindexed
([bd, PC], Xn, od)
([bd, PC, Xn], od)
Absolute
Absolute Short
Absolute Long
xxx.W
xxx.L
Immediate # (data)
Table 10-2. Addressing Modes (Continued)
Addressing Modes Syntax
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Instruction Set Overview
The instruction provided by the TS68040 are listed in Table 9-3 on page 34. The instruction set has been
tailored to support high-level languages and is optimized for those instructions most commonly executed
(however, all instructions listed are fully supported). Many instructions operate on bytes, words, and long
words, and most instructions can use any of the addressing modes of Table 9-2 on page 32.
Table 10-3. Instruction Set Summary
Mnemonic Description
ABCD
ADD
ADDA
ADDI
ADDQ
ADDX
AND
ANDI
ASL, ASR
Add Decimal With Extend
Add
Add Address
Add Immediate
Add Quick
Add With Extend
Logical AND
Logical AND Immediate
Arithmetic Shift Left And Right
Bcc
BCHG
BCLR
BFCHG
BFCLR
BFEXTS
BFEXTU
BFFFO
BFINS
BFSET
BFTST
BKPT
BRA
BSET
BSR
BTST
Branch Conditionally
Test Bit And Change
Test Bit And Clear
Test Bit Field And Change
Test Bit Field And Clear
Signed Bit Field Extract
Unsigned Bit Field Extract
Bit Field Find First One
Bit Field Insert
Test Bit Field And Set
Test Bit Field
Breakpoint
Branch
Test Bit And Set
Branch To Subroutine
Test Bit
CAS
CAS2
CHK
CHK2
CINV(1)
CLR
CMP
CMPA
CMPI
CMPM
CMP2
CPUSH(1)
Compare And Swap Operands
Compare And Swap Dual Operands
Check Register Against Bounds
Check Register Against Upper And Lower Bounds
Invalidate Cache Entries
Clear
Compare
Compare Address
Compare Immediate
Compare Memory To Memory
Compare Register Against Upper And Lower Bounds
Push Then Invalidate Cache Entries
DBCC
DIVS, DIVSL
DIVU, DIVUL
Test Condition, Decrement And Branch
Signed Divide
Unsigned Divide
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EOR
EORI
EXG
EXT, EXTB
Logical Exclusive OR
Logical Exclusive OR Immediate
Exchange Registers
Sign Extend
ILLEGAL Take Illegal Instruction Trap
JMP
JSR
Jump
Jump To Subroutine
LEA
LINK
LSL, LSR
Load Effective Address
Link And Allocate
Logical Shift Left And Right
MOVE
MOVE16(1)
MOVEA
MOVE CCR
MOVE SR
MOVE USP
MOVEC(1)
MOVEM
MOVEP
MOVEQ
MOVES(1)
MULS
MULU
Move
16-byte Block Move
Move Address
Move Condition Code Register
Move Status Register
Move User Stack Pointer
Move Control Register
Move Peripheral
Move Quick
Move Alternate Address Space
Move Multiply
Signed Multiply
Unsigned Multiply
NBCD
NEG
NEGX
NOP
NOT
Negate decimal with extend
Negate
Negate with extend
No operation
Logical complement
OR
ORI
Logical Inclusive OR
Logical Inclusive OR Immediate
PACK
PEA
PFLUSH(1)
PTEST(1)
Pack BCD
Push Effective Address
Flush Entry(ies) In The ATCs
Test A Logical Address
RESET
ROL, ROR
ROXL, ROXR
RTD
RTE
RTR
RTS
Reset External Devices
Rotate Left And Right
Rotate With Extend Left And Right
Return And Deallocate
Return From Exception
Return And Restore Codes
Return From Subroutine
Table 10-3. Instruction Set Summary (Continued)
Mnemonic Description
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Note: 1. TS6840 additions or alterations to the TS68030 and TS68881/TS68882 instructions sets.
Note: 1. TS6840 additions or alterations to the TS68030 and TS68881/TS68882 instructions sets.
The TS68040 floating-point instructions, a commonly used subset of the TS68882 instruction set, are
implemented in hardware. The remaining unimplemented instructions are less frequently used and are
efficiently emulated in software, maintaining compatibility with the TS68881/TS68882 floating-point
coprocessors.
The TS68040 instruction set includes MOVE16, a new user instruction that allows high-speed transfers
of 16-byte blocks between external devices such as memory to memory or coprocessor to memory.
SBCD
Scc
STOP
SUB
SUBA
SUBI
SUBQ
SUBX
SWAP
Substract Decimal With Extend
Set Conditionally
Stop
Subtract
Subtract Address
Subtract Immediate
Subtract Quick
Subtract With Extend
Swap Register Words
TAS
TRAP
TRAPcc
TRAPV
TST
Test Operand And Set
Trap
Trap Conditionally
Trap On Overflow
Trap Operand
UNLK
UNPK
Unlink
Unpack BCD
Table 10-4. Floating-point instructions
Mnemonic Description
FABS(1)
FADD(1)
FBcc
FCMP
FDBcc
FDIV(1)
FMOVE(1)
FMOVEM
FMUL(1)
FNEG(1)
FRESTORE
FSAVE
FScc
FSQRT(1)
FSUB(1)
FTRAPcc
FTST
Floating-point Absolute Value
Floating-point Add
Branch On Floating-point Condition
Floating-point Compare
Floating-point Decrement And Branch
Floating-point Divide
Move Floating-point Register
Move Multiple Floating-point Registers
Floating-point Multiply
Floating-point Negate
Restore Floating-point Internal State
Save Floating-point Internal State
Set According To Floating-point Condition
Floating-point Square Root
Floating-point Substract
Trap On Floating-point Condition
Floating-point Test
Table 10-3. Instruction Set Summary (Continued)
Mnemonic Description
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10.3 Instruction and Data Caches
Studies have shown that typical programs spend much of their execution time in a few main routines or
tight loops. Earlier members of the TS68000 Family took advantage of this locality of reference phenom-
enon to varying degrees. The TS68040 takes further advantage of cache technology with its two,
independent, on-chip, physical address space caches, one for instructions and one for data. The caches
reduce the processor’s external bus activity and increase CPU throughput by lowering the effective
memory access time. For a typical system design, the large caches of the TS68040 yield a very high hit
rate, providing a substantial increase in system performance. Additionally, the caches are automatically
burstfilled from the external bus whenever a cache miss occurs.
The autonomous nature of the caches allows instruction-stream fetches, data-stream fetches, and a
third external access to occur simultaneously with instruction execution. For example, if the TS68040
requires both an instruction-stream access and an external peripheral access and if the instruction is
resident in the on-chip cache, the peripheral access proceeds unimpeded rather than being queued
behind the instruction fetch. If a data operand is also required and if it is resident in the data cache, it can
also be accessed without hindering either the instruction access from its cache or the peripheral access
external to the chip. The parallelism inherent in the TS68040 also allows multiple instructions that do not
require any external accesses to execute concurrently while the processor is performing an external
access for a previous instruction.
10.3.1 Cache Organization
The instruction and data caches are four-way set-associative with 64 sets of four, 16-byte lines for a total
cache storage of 4K bytes each. As shown in Figure 9-2, each 16-byte line contains an address tag and
state information. State information for each entry consists of a valid flag for the entire line in both
instruction and data caches and write status for each long word in the data cache. The write status in the
data cache signifies whether or not the long-word data is dirty (meaning that the data in the cache has
been modified but has not been written back to external memory) for data in copyback pages.
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Figure 10-2. Cache Organization Overview
The caches are accessed by physical addresses from the on-chip MMUs. The translation of the upper
bits of the logical address occurs concurrently with the accesses into the set array in the cache by the
lower address bits. The output of the ATC is compared with the tag field in the cache to determine if one
of the lines in the selected set matches the translated physical address. If the tag matches and the entry
is valid, then the cache has a hit.
If the cache hits and the access is a read, the appropriate long word from the cache line is multiplexed
onto the appropriate internal bus. If the cache hits and the access is a write, the data, regardless of size,
is written to the appropriate portion of the corresponding longword entry in the cache.
When a data cache miss occurs and a previously valid cache line is needed to cache the new line, any
dirty data in the old line will be internally buffered and copied back to memory after the new cache line
has been loaded.
Pushing of dirty data can be forced by the CPUSH instruction.
Cachability of data in each memory page is controlled by two bits in the page descriptor for each page.
Cachable pages may be either write through or copyback, with no write-allocate for misses to write
through pages. Non-cachable pages may also be specified as non-cachable I/O, forcing accesses to
these pages to occur in order of instruction execution.
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10.3.2 Cache Coherency
The TS68040 has the ability to snoop the external bus during accesses by other bus masters to maintain
coherency between the TS68040’s caches and external memory systems. External write cycles are
snooped by both the instruction cache and data cache; whereas, external read cycles are snooped only
by the data cache. In addition, external cycles can be flagged on the bus as snoopable or non snoop-
able. When an external cycle is marked as snoopable, the bus snooper checks the caches for a
coherency conflict based on the state of the corresponding cache line and the type of external cycle.
Although the internal execution units and the bus snooper circuit all have access to the on-chip caches,
the snooper has priority over the execution units to allow the snooper to resolve coherency discrepan-
cies immediately.
10.3.3 Cache Instructions
The TS68040 supports the following instructions for cache maintenance. Both instructions may selec-
tively operate on the data or instruction cache.
CINV: Invalidates a single line, all lines in a physical page, or the entire cache.
CPUSH: Pushes selected dirty data cache lines to memory, then invalidates all selected lines.
10.4 Operand Transfer Mechanisms
The TS68040 external synchronous bus supports multiple masters and overlaps arbitration with data
transfers. The bus is optimized to perform high-speed transfers to and from an external cache or mem-
ory. The data and address buses are each 32 bits wide.
10.4.1 Transfer Types
The TS68040 provides two signals (TT1-TT0) that define four types of bus transfers: normal access,
MOVE16 access, alternate access, and interrupt acknowledge access. Normal accesses identify normal
memory references: MOVE16 accesses are memory accesses by a MOVE16 instruction; and alternate
accesses identify accesses to the undefined address spaces (function code values of 0, 3, 4, 7). The
interrupt acknowledge access is used to fetch an interrupt vector during interrupt exception processing.
10.4.2 Burst Transfer Operation
During burst read write to cache transfers, the values on the address and transfer type signals do not
change; they are the address of the first requested item of the cache line. When the TS68040 request a
burst read transfer of a cache line, the address bus indicates the address of the long word in the line
needed first, but the memory system is expected to provide data in the following order (modulo 4): 0, 1,
2, 3 (long-word offsets). The first address needed may not be from offset 0; nevertheless, all four long
words must be transferred. Burst writes occur in a similar manner.
10.4.3 Bus Snooping
Bus snooping ensures that data in main memory is consistent with data in the on-chip caches. If an alter-
nate bus master is performing a read transfer on the bus and snooping is enabled, and if the snoop logic
determines that the on-chip data cache has dirty data (data valid but not consistent with memory) for this
transfer, the memory is prevented from responding to the read request, and the TS68040 supplies the
data directly to the master. If the alternate master is performing a write transfer on the bus and snooping
is enabled, and if the snooper determines that one of the on-chip caches has a valid line for this request,
then the snooper may either invalidate or update the line as selected by the snoop control signals.
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10.5 Exception Processing
The TS68040 provides the same extensions to the exception stacking process as the TS68030. If the M
bit in the status register is set, the master stack pointer is used for all task-related exceptions. When a
nontask-related exception occurs (i.e., an interrupt), the M bit is cleared, and the interrupt stack pointer is
used. This feature allows a task’s stack area to be carried within a single processor control block, and
new tasks may be initiated by simply reloading the master stack pointer and setting the M bit.
The externally generated exceptions are interrupts, bus errors, and reset conditions. The interrupts are
requests from external devices for processor action; whereas, the bus error and reset signals are used
for access control and processor initialization. The internally generated exceptions come from instruc-
tions, address errors, tracing, or breakpoints. The TRAP, TRAPcc, TRAPVcc, FTRAPcc, CHK, CHK2,
and DIV instructions can all generate exceptions as part of their instruction execution. Tracing behaves
like a very high-priority, internally generated interrupt whenever it is processed. The other internally gen-
erated exceptions are caused by unimplemented floating-point instructions, illegal instructions,
instruction fetches from odd addresses, and privilege violations. Finally, the MMU can generate excep-
tions, for access violations and for when invalid descriptors are encountered during table searches.
Exception processing for the TS68040 occurs on the following sequence:
1. an internal copy is made of the status register,
2. the vector number of the exception is determined,
3. current processor status is saved,
4. the exception vector offset is determined by multiplying the vector number by four.
This offset is then added to the contents of the VBR to determine the memory address of the exception
vector. The instruction at the address given in the exception vector is fetched, and normal instruction
decoding and execution is started.
10.6 Memory Management Units
The full addressing range of the TS68040 is 4G bytes (4,294,967,296 bytes). However, most TS68040
systems implement a much smaller physical memory. Nonetheless, by using virtual memory techniques,
the system can be made to appear to have a full 4G bytes of physical memory available to each user
program. The independent instruction and data MMUs fully support demand paged virtual-memory oper-
ating systems with either 4K or 8K page sizes. In addition to its main function of memory management,
each MMU protects supervisor areas from accesses by user programs and also provides write protection
on a page-by-page basis. For maximum efficiency, each MMU operates in parallel with other processor
activities.
10.6.1 Translation Mechanism
Because logical-to-physical address translation is one of the most frequently executed operations of the
TS68040 MMUs, this task has been optimized. Each MMU initiates address translation by searching for
a descriptor containing the address translation information in the ATC. If the descriptor does not reside in
the ATC, then the MMU performs external bus cycles via the bus controller to search the translation
tables in physical memory. After being located, the page descriptor is loaded into the ATC, and the
address is correctly translated for the access, provided no exception conditions are encountered.
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10.6.2 Address Translation Cache
An integral part of the translation function previously described is the dual cache memory that stores
recently used logical-to-physical address translation information (page descriptors) for instruction and
date accesses. These caches are 64-entry, four-way, set associative. Each ATC compare the logical
address of the incoming access against its entries. If one of the entries matches, there is a hit, and the
ATC sends the physical address to the bus controller, which then starts the external bus cycle (provided
there was no hit in the corresponding cache for the access).
10.6.3 Translation Tables
The translation tables of the TS68040 have a three level tree structure and reside in main memory.
Since only a portion of the complete tree needs to exist at any one time, the tree structure minimizes the
amount of memory necessary to set up the tables for most programs. As shown in Figure 9-1, either the
user root pointer or the supervisor root pointer points to the first level table, depending on the values of
the function code for an access. Table entries at the second level of the tree (pointer tables) contain
pointers to the third level (page tables). Entries in the page tables contain either page descriptors or indi-
rect pointers to page descriptors. The mechanism for performing table search operations uses portions
of the logical address (as indices) at each level of the search. All addresses in the translation table
entries are physical addresses.
Figure 10-3. Translation Table Structure
There are two variations of table searches for both 4K and 8K page sizes: normal searches and indirect
searches. An indirect search differs in that the entry in the third level page table contains a pointer to a
page descriptor rather than the page descriptor itself.
Entries in the translation tables contain control and status information on addition to the physical address
information. Control bits specify write protection, limit access to supervisor only, and determine cachabil-
ity of data in each memory page. Each page descriptor also has two user-programmable bits that appear
on the UPA0 and UPA1 signals during an external access for use as address modifier bits.
A global bit can be set in each page descriptor to prevent flushing of the ATC entry for that page by some
PFLUSH instruction variants, allowing system ATC entries to remain resident during task swaps. If these
special PFLUSH instructions are not used, this bit can be user defined. The MMUs automatically main-
tain access history information for the pages by updating the used (U) and modified (M) status bits.
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10.6.4 MMU Instructions
The MMU instructions supported by the TS68040 are as follows:
PFLUSH: Allows flushing of either selected ATC entries by function code and logical address or the
entire ATCs.
PTEST: Takes an address and function code and searches the translation tables for the corresponding
entry, which is then loaded into the ATC. The results of the search are available in the MMU status reg-
ister and are often useful in determining the cause of a fault.
All of the TS68040 MMU instructions are privileged and can only be executed from the supervisor mode.
10.6.5 Transparent Translation
Four transparent translation registers, two each for instruction and data accesses, have been provided
on the TS68040 MMU to allow portions of the logical address space to be transparently mapped and
accessed without the need for corresponding entries resident in the ATC. Each register can be used to
define a range of logical addresses from 16M bytes to 4G bytes with a base address and a mask. All
addresses within these ranges are not mapped, and are optionally protected against user or supervisor
accesses and write accesses. Logical addresses in these areas become the physical addresses for
memory access. The transparent translation feature allows rapid movement of large blocks of data in
memory or I/O space without disturbing the context of the on-chip ATCs or incurring delays associated
with translation table searches.
11. Preparation For Delivery
11.1 Packaging
Microcircuits are prepared for delivery in accordance with MIL-M-38510 or e2v standard.
11.2 Certificate of Compliance
e2v offers a certificate of compliances with each shipment of parts, affirming the products are in compli-
ance either with MIL-STD-883 or e2v standard and guarantying the parameters not tested at
temperature extremes for the entire temperature range.
12. Handling
MOS devices must be handled with certain precautions to avoid damage due to accumulation of static
charge. Input protection devices have been designed in the chip to minimize the effect of this static
buildup. However, the following handling practices are recommended:
a) Devices should be handled on benches with conductive and grounded surfaces.
b) Ground test equipment, tools and operator.
c) Do not handle devices by the leads.
d) Store devices in conductive foam or carriers.
e) Avoid use of plastic, rubber, or silk in MOS areas.
f) Maintain relative humidity above 50 percent if practical.
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13. Package Mechanical Data
13.1 179 pins – PGA
Dim
Millimeters Inches
Min Max Min Max
A 46.863 47.625 1.845 1.875
B 46.863 47.625 1.845 1.875
C 2.3876 1.875 0.094 0.116
D 4.318 4.826 0.170 0.190
E 1.143 1.4 0.045 0.055
F 1.143 1.4 0.045 0.055
G 2.54 BSC 0.100 BSC
H(1) 0.432 0.483 0.017 0.019
Note: 1. For untinned leads (gold)
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13.2 196 pins – Tie Bar CQFP Cavity Up (on request)
Dim Millimeters Inches
A 3.30 max 0.130 max
B 0.23 +0.05
0.23 -0.038
0.009 +0.002
0.009 -0.015
C 0.635 typ. .025 typ.
D1 33.91 ± 0.25 1.335 ± 0.01
J 0.89 ± 0.13 0.035 ± 0.005
L 63.5 ± 0.51 2.5 ± 0.02
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13.3 196 pins – Gullwing CQFP cavity up
* Reduce pin count shown for clarity, 49 pins per side
Symbol Millimeters Inches
A 4.19 max 0.165 max
A1 0.673 ± 0.2 .0265 ±.008
b0.23 +0.05
0.23 -0.038
.009 +.002
.009 -.0015
c0.127 +0.05 .005 +.002
0.127 -0.025 .005 -.001
D/E 33.91 ±0.25 1.335 ±.01
e .635 BSC .025 BSC
e1 30.48 ±0.13 1.2 ±.005
HD/HE 38.8 ±0.18 1.528 ±.007
L 0.813 ±0.2 .032 ±.008
N 196 196
R 0.55 ±0.25 .022 ±.01
R1 0.23 min .009 min
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14. Ordering Information
14.1 MIL-STD-883 C and Internal Standard
Notes: 1. For availability of the different versions, contact your local e2v sales office.
2. The letter X in the part number designates a "Prototype" product that has not been qualified by e2v. Reliability of a PCX part-
number is not guaranteed and such part-number shall not be used in Flight Hardware. Product changes may still occur while
shipping prototypes.
Table 14-1. Standard Microcircuit Drawing (SMD) Cross-Reference
e2v Orderable
Part-Number
Standard
Microcircuit
Drawing (SMD)
Number Standard Package
Lead-
Finish Temperature
Frequency
(MHz)
TS68040MRB/C25A 5962-9314301MXC MIL-PRF-38535 PGA 179 Gold -55°C/+125°C 25
TS68040MRB/C33A 5962-9314302MXC MIL-PRF-38535 PGA 179 Gold -55°C/+125°C 33
TS68040MR1B/C25A 5962-9314301MXA MIL-PRF-38535 PGA 179 Sn63Pb37 -55°C/+125°C 25
TS68040MR1BC33A 5962-9314302MXA MIL-PRF-38535 PGA 179 Sn63Pb37 -55°C/+125°C 33
TS68040MFTBC25A 5962-9314301MYC MIL-PRF-38535 CQFP 196 Flat+
Tie-Bar Gold -55°C/+125°C 25
TS68040MFTBC33A 5962-9314302MYC MIL-PRF-38535 CQFP 196 Flat+
Tie-Bar Gold -55°C/+125°C 33
TS68040MFB/C25A 5962-9314301MZC MIL-PRF-38535 CQFP 196 Gold -55°C/+125°C 25
TS68040MFB/C33A 5962-9314302MZC MIL-PRF-38535 CQFP 196 Gold -55°C/+125°C 33
TS68040MF1B/C25A 5962-9314301MZA MIL-PRF-38535 CQFP 196 Sn63Pb37 -55°C/+125°C 25
TS68040MF1B/C33A 5962-9314302MZA MIL-PRF-38535 CQFP 196 Sn63Pb37 -55°C/+125°C 33
M: Tc = -55; TJ = +125˚C
V: Tc = -40; TJ = +110˚C
F: CQFP/Gullwing leads
R: PGA
FT: CQFP Flat tie-bar
BC: QML class Q
Blank: Internal standard
1: Hot solder dip(1)
Blank: Gold
TS xx y68040
Part
Identifier
Product
Code(1)
TS(X) 68040
Temperature
Range (1) Screening Level
Lead finish Operating
Frequency
A
Ax x nnn
(1)
Package (1)
Revision
Level
25: 25 MHz
33: 33 MHz
(2)
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15. Document Revision History
Table 14-1 provides a revision history for this hardware specification.
Table 15-1. Document Revision History
Revision
Number Date Substantive Change(s)
B 04/2007 Name change from Atmel to e2v
Ordering information update
A 09/2002 Initial revision
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Table of Contents
Features .................................................................................................... 1
Description ............................................................................................... 1
Screening ................................................................................................. 2
1 Block Diagram........................................................................................... 2
2 Introduction .............................................................................................. 2
3 Pin Assignments ...................................................................................... 4
3.1 PGA 179 ..................................................................................................................4
3.2 CQFP 196 ...............................................................................................................5
4 Signal Description ................................................................................... 6
5 Scope ........................................................................................................ 8
6 Applicable Documents ............................................................................ 8
6.1 MIL-STD-883 ...........................................................................................................8
7 Requirements ........................................................................................... 8
7.1 General ....................................................................................................................8
7.2 Design and Construction .........................................................................................8
7.3 Electrical Characteristics .........................................................................................9
7.4 Thermal Considerations ........................................................................................10
7.5 Mechanical and Environment ................................................................................18
7.6 Marking ..................................................................................................................18
8 Quality Conformance Inspection ......................................................... 18
8.1 DESC/MIL-STD-883 ..............................................................................................18
9 Electrical Characteristics ...................................................................... 18
9.1 General Requirements ..........................................................................................18
9.2 Static Characteristics .............................................................................................19
9.3 Dynamic Characteristics ........................................................................................20
9.4 Switching Test Circuit and Waveforms ..................................................................25
10 Functional Description .......................................................................... 29
10.1 Programming Model ............................................................................................29
10.2 Data Types and Addressing Modes ....................................................................31
10.3 Instruction and Data Caches ...............................................................................37
ii
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10.4 Operand Transfer Mechanisms ...........................................................................39
10.5 Exception Processing ..........................................................................................40
10.6 Memory Management Units ................................................................................40
11 Preparation For Delivery ....................................................................... 42
11.1 Packaging ............................................................................................................42
11.2 Certificate of Compliance ....................................................................................42
12 Handling ................................................................................................. 42
13 Package Mechanical Data ..................................................................... 43
13.1 179 pins – PGA ...................................................................................................43
13.2 196 pins – Tie Bar CQFP Cavity Up (on request) ...............................................44
13.3 196 pins – Gullwing CQFP cavity up ...................................................................45
14 Ordering Information ............................................................................. 46
14.1 MIL-STD-883 C and Internal Standard ................................................................46
15 Document Revision History .................................................................. 47
Table of Contents ...................................................................................... i
Whilst e2v has taken care to ensure the accuracy of the information contained herein it accepts no responsibility for the consequences of any
use thereof and also reserves the right to change the specific ation of goods without notice. e2v accepts no liability beyond that set out in its stan-
dard conditions of sale in respect of infringement of third party patents arising from the use of tubes or other devices in accorda nce w ith inform a-
tion contained herein.
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0851B–HIREL–06/07
e2v semiconductors SAS 2007