MITSUBISHI SEMICONDUCTOR <TRIAC>
BCR08AM
LOW POWER USE
PLANAR PASSIVATION TYPE
Mar. 2002
✽2.Measurment using the gate trigger characteristics measurement circuit.
✽3.Case temperature is measured at the T2 terminal 1.5mm away from the molded case.
✽4.Test conditions of the critical-rate of rise of off-state commutating voltage is shown in the table below.
Symbol
IDRM
VTM
VRGT I
VRGT III
IRGT I
IRGT III
VGD
Rth (j-c)
(dv/dt)c
Test conditions
Tj=125°C, VDRM applied
Tc=25°C, ITM=1.2A, Instantaneous measurement
Tj=25°C, VD=6V, RL=6Ω, RG=330Ω
Tj=25°C, VD=6V, RL=6Ω, RG=330Ω
Tj=125°C, VD=1/2VDRM
Junction to case ✽3
Tj=125°C
Unit
mA
V
V
V
mA
mA
V
°C/W
V/µs
Typ.
—
—
—
—
—
—
—
—
—
ELECTRICAL CHARACTERISTICS
Parameter
Repetitive peak off-state current
On-state voltage
Gate trigger voltage ✽2
Gate trigger current ✽2
Gate non-trigger voltage
Thermal resistance
Critical-rate of rise of off-state
commutating voltage
Limits
Min.
—
—
—
—
—
—
0.1
—
0.5
Max.
1.0
2.0
2.0
2.0
5
5
—
60
—
II
III
II
III
PERFORMANCE CURVES
ON-STATE CURRENT (A)
ON-STATE VOLTAGE (V)
SURGE ON-STATE CURRENT (A)
CONDUCTION TIME
(CYCLES AT 60Hz)
10023 5710
1
4
2
23 5710
2
6
8
10
3
1
5
7
9
0
1.0 1.5 2.0 2.5 3.0 3.5 4.0
101
7
5
3
2
100
7
5
3
2
10–1
Tc = 25°C
MAXIMUM ON-STATE CHARACTERISTICS RATED SURGE ON-STATE CURRENT
Test conditions Commutating voltage and current waveforms
(inductive load)
SUPPLY
VOLTAGE TIME
TIME
TIME
MAIN CURRENT
MAIN
VOLTAGE
(di/dt)c
VD
(dv/dt)c
1. Junction temperature
Tj=125°C
2. Rate of decay of on-state commutating current
(di/dt)c=–0.4A/ms
3. Peak off-state voltage
VD=400V
✽4