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Old Company Name in Catalogs and Other Documents
On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology
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Renesas Electronics document. We appreciate your understanding.
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April 1st, 2010
Renesas Electronics Corporation
Issued by: Renesas Electronics Corporation (http://www.renesas.com)
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Notice
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©1995
DATA SHEET
E.S.D NOISE CLIPPING DIODES
NNCD3.3G to NNCD7.5G, NNCD27G
ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES
(QUARTO TYPE : COMMON ANODE)
5 PIN MINI MOLD
This product series is a diode developed for E.S.D (Electrostatic
Discharge) noise protection. Based on the IEC1000-4-2 test on
electromagnetic interference (EMI), the diode assures an endur-
ance of no less than 30 KV, thus making itself most suitable for
external interface circuit protection.
With four elements mounted in the 5 PIN Mini Mold Package, the
product can cope with high density and automatic packaging.
FEATURES
Based on the electrostatic discharge immunity test (IEC1000-4-
2), the product assures the minimum endurance of 30 KV.
Based on the reference supply of the set, the product achieves
a series over a wide range (11 product name lined up).
With 4 elements mounted (common anode) mounted in the 5 PIN
MINI MOLD package, the product can achieve a high density and
automatic packaging.
APPLICATIONS
External interface circuit E.S.D protection.
Circuits for Waveform clipper, Surge absorber.
MAXIMUM RATINGS (TA = 25 ˚C)
Power Dissipation P 200 mW (Total)
Surge Reverse Power PRSM
85 W (t = 10
µ
s 1 pulse)
Fig. 5
Junction Temperature Tj150 ˚C
Storage Temperature Tstg –55 ˚C to +150 ˚C
Document No. D11645EJ1V1DS00 (1st edition)
Date Published February 1998 N CP(K)
Printed in Japan
PACKAGE DIMENSIONS
(in millimeters)
2.9 ± 0.2
1.9 0.950.95
1.5
2.8 ± 0.2
1
2
3
5
4
0.65
+0.1
–0.15
0.32
+0.1
–0.06
1.1 to 1.4
0.8
0 to 0.1
0.16
+0.1
–0.06
(5 PIN mini MOLD)
(SC-74A)
PIN CONNECTION
54
132
1
2
3
4
5
:
:
:
:
:
K1
A
K2
K3
K4
Cathode 1
Anode (common)
Cathode 2
Cathode 3
Cathode 4
1996
NNCD3.3G to NNCD7.5G, NNCD27G
2
ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) (A-K1, A-K2, A-K3, A-K4)
Breakdown Voltage*Dynamic** Reverse Capacitance E.S.D Voltage
Impedance Leakage
Parameter VBR (V) Zz () IR (
µ
A) Ct (pF) (KV)
MIN. MAX. IT (mA) MAX. IT (mA) MAX. VR (V) TYP.
Test
MIN.
Test
Condition Condition
NNCD3.3G 3.10 3.50 5 130 5 20 1.0 220 30
NNCD3.6G 3.40 3.80 5 130 5 10 1.0 210 30
NNCD3.9G 3.70 4.10 5 130 5 10 1.0 200 30
NNCD4.3G 4.01 4.48 5 130 5 10 1.0 180 30
NNCD4.7G 4.42 4.90 5 130 5 10 1.0 170
VR = 0 V
30
C = 150 pF
NNCD5.1G 4.84 5.37 5 130 5 5 1.5 160 30
R = 330
NNCD5.6G 5.31 5.92 5 80 5 5 2.5 140
f = 1 MHz
30
(IEC1000
NNCD6.2G 5.86 6.53 5 50 5 2 3.0 120 30
-4-2)
NNCD6.8G 6.47 7.14 5 30 5 2 3.5 110 30
NNCD7.5G 7.06 7.84 5 30 5 2 4.0 90 30
NNCD27G 25.10 28.90 2 70 2 2 21 25 30
*Tested with pulse (40 ms)
** Zz is measured at IT give a small A.C. signal.
NNCD3.3G to NNCD7.5G, NNCD27G
3
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
Fig. 1 P - T
A
RATING
250
200
150
100
50
0 25 50 75 100 125 150
T
A
- Ambient Temperature - ˚C
P - Power Dissipation - mW
Fig. 2 I
t
- V
BR
CHARACTERISTICS
(A-K1, A-K2, A-K3, A-K4)
Fig. 3 Z
T
- I
T
CHARACTERISTICS
1 000
100
10
0.1 100
I
T
- On state Current - A
Z
z
-
110
100 m
10 m
1 m
1
100 n
10 n
µ
10
µ
100
µ
0
1 n
V
BR
- Breakdown Voltage - V
12345678910
I
T
- On state Current - A
NNCD6.8G NNCD7.5G
NNCD3.3G
NNCD3.6G
NNCD3.9G
NNCD4.3G
NNCD4.7G
NNCD5.1G
NNCD5.6G
NNCD6.2G
NNCD3.9G
NNCD5.6G
NNCD7.5G
NNCD5.1G
NNCD4.7G
TYP.
1
NNCD3.3G to NNCD7.5G, NNCD27G
4
1 000
100
10
1
0.1
1 m 10 m 100 m 1 10 100
t - Time - Sec
Z
th
- Transient Thermal Impedance - (˚C/W)
Fig. 4 TRANSIENT THERMAL IMPEDANCE
625 ˚C/W
10 000
1 000
100
10
1
1
t
T
- Pulse Width - Sec
P
RSM
- Surge Reverse Power - W
Fig. 5 SURGE REVERSE POWER RATING
µ
10
µ
100
µ
1 m 10 m 100 m
T
A
= 25 ˚C
Non-Repetive
P
RSM
t
T
NNCD [ ] G
NNCD [ ] G
NNCD3.3G to NNCD7.5G, NNCD27G
5
Sample Application Circuits
PC
(CD ROM) Palallel
Interface
Micro
com.
Conecter
Di
Di
*Set
Printer
,
P.D.C
,
T.V Game etc
Imterface Cable
*Set
NNCD3.3G to NNCD7.5G, NNCD27G
6
REFERENCE
Document Name Document No.
NEC semiconductor device reliability/quality control system C11745E
NEC semiconductor device reliability/quality control system MEI-1201
Quality grade on NEC semiconductor devices C11531E
Semiconductor device mounting technology manual C10535E
Guide to quality assurance for semiconductor device MEI-1202
NNCD3.3G to NNCD7.5G, NNCD27G
7
[MEMO]
8
NNCD3.3G to NNCD7.5G, NNCD27G
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96.5