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STP7NC70Z/FP/STP7NC70Z-1
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
GATE-SOURCE ZENERDIODE
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. ∆VBV =αT(25°-T) BVGSO(25°)
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally
be appliedfrom gate to souce.In this respect the 25V Zener voltageis appropiate to achieve an efficient
and cost-effectiveintervention to protect the device’s integrity. These integrated Zener diodes thus avoid
the usage of external components.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
td(on) Turn-on Delay Time
Rise Time
VDD = 350 V, ID= 3.5 A
RG= 4.7ΩVGS = 10V
(see test circuit, Figure 3)
24 ns
tr8ns
Q
g
Total Gate Charge VDD = 560V, ID= 7A,
VGS = 10V
47 66 nC
Qgs Gate-Source Charge 11 nC
Qgd Gate-Drain Charge 19 nC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
tr(Voff) Off-voltage Rise Time VDD = 560V, ID=7A,
R
G=4.7Ω, VGS = 10V
(see test circuit, Figure 5)
11 ns
tfFall Time 10 ns
tcCross-over Time 19 ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
ISD Source-drain Current 6 A
ISDM (2) Source-drain Current (pulsed) 24 A
VSD (1) Forward On Voltage ISD = 6 A, VGS =0 1.6 V
trr Reverse Recovery Time ISD = 7A, di/dt = 100A/µs,
VDD = 50V, Tj= 150°C
(see test circuit, Figure 5)
575 ns
Qrr Reverse Recovery Charge 5.8 µC
IRRM Reverse Recovery Current 20 A
Symbol Parameter Test Conditions Min. Typ. Max. Unit
BVGSO Gate-Source Breakdown
Voltage Igs=±1mA (Open Drain) 25 V
αT Voltage Thermal Coefficient T=25°C Note(3) 1.3 10-4/°C
Rz Dynamic Resistance ID= 50 mA, VGS =0 90 Ω