ATA5577M3330C-DBN - Atmel - Datasheet.Directory

NOTE: This is a summary document.

The complete document is available.

For more information, please contact

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Features

•Contactless Power Supply

•Contactless Read/Write Data Transmission

•Radio Frequency fRF from 100 kHz to 150 kHz

•Basic Mode or Extended Mode

•Compatible with T5557, ATA5567

•Replacement for e5551/T5551 in Most Common Operation Modes

•Configurable for ISO/IEC 11784/785 Compatibility

•Total 363 Bits EEPROM Memory: 11 Blocks (32 Bits + 1 Lock Bit)

•High Q-antenna Tolerance Due to Build in Options

•Adaptable to Different Applications: Access Control, Animal ID and Waste

Management

•On-chip Trimmed Antenna Capacitor

•Pad Options

– ATA5577M1

• 100 µm × 100 µm for Wire Bonding or Flip Chip

– ATA5577M2

• 200 µm × 400 µm for Direct Coil Bonding

1. Description

The ATA5577 is a contactless read/write identification IC (IDIC®) for applications in

the 125-kHz or 134-kHz frequency band. A single coil connected to the chip serves as

the IC’s power supply and bi-directional communication interface. The antenna and

chip together form a transponder or tag.

The on-chip 363-bit EEPROM (11 blocks with 33 bits each) can be read and written

block-wise from a base station (reader).

Data is transmitted from the IDIC (uplink) using load modulation. This is achieved by

damping the RF field with a resistive load between the two terminals Coil 1 and Coil 2.

The IC receives and decodes serial base station commands (downlink), which are

encoded as 100% amplitude modulated (OOK) pulse-interval-encoded bit streams.

A complete datasheet with further technical data is available on request. Please con-

tact your local sales office.

Read/Write LF

RFID IDIC

100 to 150 kHz

ATA5577

Summary

Preliminary

4967DS–RFID–10/08

ATA5577 [Preliminary]

2. Compatibility

The ATA5577 is designed to be compatible with the T5557/ATA5567. The structure of the con-

figuration register is identical. The two modes, Basic mode and Extended mode, are also

available. The ATA5577 is able to replace the e5551/T5551 in most common operation modes.

In all applications, the correct functionality of the replacements must be evaluated and proved.

For further details, refer to Atmel®’s web site for product-relevant application notes.

3. System Block Diagram

Figure 3-1. RFID System Using ATA5577 Tag

4. ATA5577 - Functional Blocks

Figure 4-1. Block Diagram

Data

Reader

Base station

ATA5577

Power

1) Mask option

Transponder

Coil interface

Controller

Memory

(363-bit EEPROM)

Modulator

Option register

Analog front end

Data-rate

generator

Write

decoder

POR

Coil 2

Coil 1

Controller

Test logic HV generator

Input register

Mode register

1) Mask option

4967DS–RFID–10/08

ATA5577 [Preliminary]

4.1 Analog Front End (AFE)

The AFE includes all circuits that are directly connected to the coil terminals. It generates the

IC's power supply and handles the bi-directional data communication with the reader. It consists

of the following blocks:

• Rectifier to generate a DC supply voltage from the AC coil voltage

• Clock extractor

• Switchable load between Coil 1 and Coil 2 for data transmission from the tag to the reader

• Field-gap detector for data transmission from the base station to the tag

• ESD-protection circuitry

4.2 Data-rate Generator

The data rate is binary programmable to operate at any even-numbered data rate between RF/2

and RF/128 or to any of the fixed Basic mode data rates (RF/8, RF/16, RF/32, RF/40, RF/50,

RF/64, RF/100 and RF/128).

4.3 Write Decoder

The write decoder detects the write gaps and verifies the validity of the data stream according to

the Atmel e555x downlink protocol (pulse interval encoding).

4.4 HV Generator

This on-chip charge pump circuit generates the high voltage required to program the EEPROM.

4.5 DC Supply

Power is externally supplied to the IDIC via the two coil connections. The IC rectifies and regu-

lates this RF source and uses it to generate its supply voltage.

4.6 Power-On Reset (POR)

The power-on reset circuit blocks the voltage supply to the IDIC until an acceptable voltage

threshold has been reached.

4.7 Clock Extraction

The clock extraction circuit uses the external RF signal as its internal clock source.

4.8 Controller

The control logic module executes the following functions:

• Load mode register with configuration data from EEPROM block 0 after power-on and during

reading

• Load option register with the settings for the analog front end stored in EEPROM page 1

block 3 after power-on and during reading

• Control all EEPROM memory read/write access and data protection

• Handles the downlink command decoding detecting protocol violations and error conditions

4967DS–RFID–10/08

ATA5577 [Preliminary]

4.9 Mode Register

The mode register maintains a readable shadow copy of the configuration data held in block 0 of

the EEPROM. It is continually refreshed during read mode and (re-)loaded after every POR

event or reset command. On delivery, the mode register is pre-programmed with default values

(see full version of the datasheet).

4.10 Modulator

The modulator encodes the serialized EEPROM data for transmission to a tag reader or base

station. Several types of modulation are available including Manchester, bi-phase, FSK, PSK,

and NRZ.

4.11 Memory

The memory is a 363-bit EEPROM, which is arranged in 11 blocks of 33 bits each. Each block

includes a single Lock bit, which is responsible for write-protecting the associated block. Pro-

gramming takes place on a block basis, so a complete block (including lock bit) can be

programmed with a single command. The memory is subdivided into two page areas. Page 0

contains 8 blocks and page 1 contains 4 blocks. All 33 bits of a block, including the lock bit, are

programmed simultaneously.

Figure 4-2. Memory Map

0 1.........................................................................................32

Page 1

LAnalog front end option set-up Block 3

1 Traceability data Block 2

1 Traceability data Block 1

LPage 0 configuration data Block 0

Page 0

L User data or password Block 7

L User data Block 6

L User data Block 5

L User data Block 4

L User data Block 3

L User data Block 2

L User data Block 1

LConfiguration data Block 0

32 bits

Not transmitted

4967DS–RFID–10/08

ATA5577 [Preliminary]

Block 0 of page 0 contains the mode/configuration data, which is not transmitted during regular

read operations. Addressing block 0 will always affect block 0 of page 0 regardless of the page

selector. Block 7 of page 0 may be used as a write-protection password.

Block 3 of page 1 contains the option register, which is not transmitted during regular-read

operation.

Bit 0 of every block is the lock bit for that block. Once locked, the block (including the lock bit

itself) is not re-programmable via the RF field.

Blocks 1 and 2 of page 1 contain traceability data and are transmitted with the modulation

parameters defined in the configuration register after the opcode “11” is issued by the reader.

The traceability data blocks are programmed and locked by Atmel.

5. Absolute Maximum Ratings

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating

only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this

specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Parameters Symbol Value Unit

Maximum DC current into Coil1/Coil2 Icoil 20 (TBD) mA

Maximum AC current into Coil1/Coil2, f = 125 kHz Icoil p 20 (TBD) mA

Power dissipation (die) (free-air condition, time of

application: 1s) Ptot 100 (TBD) mW

Electrostatic discharge maximum to

ANSI/ESD-STM5.1-2001 standard (HBM) Vmax 2000 (TBD) V

Operating ambient temperature range Tamb –40 to +85 °C

Storage temperature range (data retention

reduced) Tstg –40 to +150 °C

4967DS–RFID–10/08

ATA5577 [Preliminary]

6. Electrical Characteristics

Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified

No. Parameters Test Conditions Symbol Min. Typ. Max. Unit Type*

1 RF frequency range fRF 100 125 150 kHz

2.1

Supply current (without

current consumed by the

external LC tank circuit)

Tamb = 25°C(1)

IDD

1.5 TBD µA T

2.2 Read - full temperature

range 2TBDµA Q

2.3 Programming - full

temperature range 25 TBD µA Q

3.1

Coil voltage (AC supply)

POR threshold (50-mV

hysteresis)

Vcoil pp

TBD 3.6 TBD V Q

3.2 Read mode and write

command(2) 6V

clamp VQ

3.3 Program EEPROM(2) 8V

clamp VQ

4 Start-up time Vcoil pp = 6V tstartup 2.5 TBD ms Q

5.1

Clamp voltage (depends

on settings in option

3-mA current into

Coil1/Coil2

Vpp clamp lo TBD 11 TBD V Q

5.2 Vpp clamp med TBD 13 TBD V Q

5.3 Vpp clamp hi TBD 17 TBD V T

5.4 20-mA current into

Coil1/Coil2 Vpp clamp med TBD 15 TBD V T

6.1

Modulation parameters

(depends on settings in

option register)

3-mA current into

Coil1/Coil2 and

modulation ON

Vpp mod lo TBD 3 TBD V T

6.2 Vpp mod med TBD 5 TBD V Q

6.3 Vpp mod hi TBD 7 TBD V Q

6.4

20 mA current into

Coil1/Coil2 and

modulation ON

Vpp mod med TBD 7.5 TBD V T

6.5 Thermal stability Vmod lo/Tamb –1 mV/°C Q

7.1 Clock detection level

(depends on settings in

option register)

Vcoil pp = 8V

Vclkdet lo TBD 250 TBD mV Q

7.2 Vclkdet med TBD 550 TBD mV T

7.3 Vclkdet hi TBD 800 TBD mV Q

7.4 Gap detection level

(depends on settings in

option register)

Vcoil pp = 8 V

Vgapdet lo TBD 250 TBD mV Q

7.5 Vgapdet med TBD 550 TBD mV T

7.6 Vgapdet hi TBD 850 TBD mV Q

8 Programming time

From last command gap

to re-enter read mode

(64 + 648 internal

clocks)

Tprog 55.76msT

9 Endurance Erase all/Write all(3) ncycle 100000 Cycles Q

*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data

Notes: 1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation

defeat. IDD = (VOUTmax – VCLK)/R

2. Current into Coil1/Coil2 is limited to 10 mA.

3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on

uncut wafer) delivery.

4967DS–RFID–10/08

ATA5577 [Preliminary]

7. Revision History

10.1

Data retention

Top = 55°C(3) tretention 10 20 50 Years Q

10.2 Top = 150°C(3) tretention 96 hrs T

10.3 Top = 250°C(3) tretention 24 hrs Q

11.1

Resonance capacitor Mask option

Vcoil pp = 1V Cr

320 330 340

11.2 242 250 258

11.3 TBD 130 TBD

11.4 TBD 75 TBD

11.5 TBD 10 TBD Q

12.1 Micromodule capacitor

parameters

Capacitance tolerance

Tamb Cr320 330 340 pF T

12.2 Temperature coefficient TBD TBD TBD TBD TBD TBD

6. Electrical Characteristics (Continued)

Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified

No. Parameters Test Conditions Symbol Min. Typ. Max. Unit Type*

*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data

Notes: 1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation

defeat. IDD = (VOUTmax – VCLK)/R

2. Current into Coil1/Coil2 is limited to 10 mA.

3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on

uncut wafer) delivery.

Please note that the following page numbers referred to in this section refer to the specific revision

mentioned, not to this document.

Revision No. History

4967DS-RFID-10/08 • Features on page 1 changed

4967CS-RFID-01/08

• Features on page 1 changed

• Section 2 “Compatibility” on page 2 changed

• Section 4.9 “Mode Register” on page 4 changed

4967BS-RFID-09/07

• Put datasheet in a new template

• Section 4.2 “Data-rate Generator” on page 3 changed

• Figure 4-2 “Memory Map” on page 5 changed

• Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6

changed

4967DS–RFID–10/08

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