SEMICONDUCTOR
11-70
Features
Analog Overvoltage . . . . . . . . . . . . . . . . . . . . . . 70VP-P
No Channel Interaction During Overvoltage
Maximum Power Supply . . . . . . . . . . . . . . . . . . . . . .44V
Fail Safe with Po wer Loss (No Latc h-Up)
Break-Before-Make Switching
Analog Signal Range. . . . . . . . . . . . . . . . . . . . . . . ±15V
Access Time 500ns
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . 7.5mW
Applications
Data Acquisition Systems
Industrial Controls
Telemetry
Ordering Information
Description
The HI-506A, HI-507A, HI-508A and HI-509A are analog
multiplexers with active overvoltage protection. Analog
input le vels may greatly exceed either power supply without
damaging the device or disturbing the signal path of other
channels. Active protection circuitry assures that signal
fidelity is maintained even under fault conditions that would
destroy other multiplexers. Analog inputs can withstand
constant 70VP-P levels with ±15V supplies. Digital inputs
will also sustain continuous faults up to 4V greater than
either supply. In addition, signal sources are protected from
short circuiting should multiplexer supply loss occur. Each
input presents 1k of resistance under this condition.
These features make the HI-506A, HI-507A, HI-508A and
HI-509A ideal for use in systems where the analog inputs
originate from external equipment, or separately powered
circuitry. All devices are fabricated with 44V dielectrically
isolated CMOS technology. The HI-506A is a single 16
channel multiplexer, the HI-507A is an 8-Channel differen-
tial multiplexer, the HI-508A is a single 8 channel multi-
plexer and the HI-509A is a differential 4-Channel
multiplexer. If input overvoltage protection is not needed
the HI-506/507/508/509 multiplexers are recommended.
For further information see Application Notes AN520 and
AN521.
The HI-506A/507A devices are available in a 28 lead Plas-
tic or Ceramic DIP and the HI-508A/509A devices are avail-
able in a 16 lead Plastic or Ceramic DIP package.
The HI-50XA are offered in industrial/commercial and
military grades, additional Hi-Rel screening including 160
hour burn-in is specified by the “8” suffix. For MIL-STD-883
compliant parts, request the HI-546/883, HI-547/883,
HI-548/883 or HI-549/883 data sheets.
PART
NUMBER TEMP. RANGE
(oC) PACKAGE PKG.
NO.
HI1-0506A-2 -55 to 125 28 Ld CERDIP F28.6
HI1-0506A-5 0 to 75 28 Ld CERDIP F28.6
HI1-0506A-8 -55 to 125 + 160
Hour Burn-In 28 Ld CERDIP F28.6
HI3-0506A-5 0 to 75 28 Ld PDIP E28.6
HI1-0507A-8 -55 to 125 + 160
Hour Burn-In 28 Ld CERDIP F28.6
HI3-0507A-5 0 to 75 28 Ld PDIP E28.6
HI1-0508A-7 0 to 75 + 96 Hour
Burn-In 16 Ld CERDIP F16.3
HI1-0508A-8 -55 to 125 + 160
Hour Burn-In 16 Ld CERDIP F16.3
HI3-0508A-5 +0 to 75 16 Ld PDIP E16.3
HI1-0509A-2 -55 to 125 16 Ld CERDIP F16.3
HI1-0509A-5 0 to 75 16 Ld CERDIP F16.3
HI1-0509A-7 0 to 75
+ 96 Hour Burn-In 16 Ld CERDIP F16.3
HI1-0509A-8 -55 to 125 + 160
Hour Burn-In 16 Ld CERDIP F16.3
HI3-0509A-5 0 to 75 16 Ld PDIP E16.3
August 1997
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright © Harris Corporation 1997 File Number 3143.1
HI-506A, HI-507A
HI-508A, HI-509A
16-Channel, 8-Channel, Differential 8-Channel and Differential
4-Channel, CMOS Analog MUXs with Active Overvoltage Protection
11-71
Pinouts
HI1-506A (CERDIP)
HI3-506A (PDIP)
TOP VIEW
HI1-507A (CERDIP)
HI3-507A (PDIP)
TOP VIEW
HI1-508A (CERDIP)
HI3-508A (PDIP)
TOP VIEW
HI1-509A (CERDIP)
HI3-509A (PDIP)
TOP VIEW
+VSUPPLY
NC
NC
IN 16
IN 15
IN 14
IN 13
IN 12
IN 11
IN 10
IN 9
GND
VREF
ADDRESS A3
OUT
IN 8
IN 7
IN 6
IN 5
IN 3
IN 1
ENABLE
ADDRESS A0
ADDRESS A1
ADDRESS A2
-VSUPPLY
IN 4
IN 2
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
+VSUPPLY
OUT B
NC
IN 8B
IN 7B
IN 6B
IN 5B
IN 4B
IN 3B
IN 2B
IN 1B
GND
VREF
NC
OUT A
IN 8A
IN 7A
IN 6A
IN 5A
IN 3A
IN 1A
ENABLE
ADDRESS A0
ADDRESS A1
ADDRESS A2
-VSUPPLY
IN 4A
IN 2A
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
A0
ENABLE
-VSUPPLY
IN 1
IN 2
IN 3
OUT
IN 4
A1
GND
+VSUPPLY
IN 5
IN 6
IN 7
IN 8
A2
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
A0
ENABLE
-VSUPPLY
IN 1A
IN 2A
IN 3A
OUT A
IN 4A
A1
+VSUPPLY
IN 1B
IN 2B
IN 3B
IN 4B
OUT B
GND
HI-506A, HI-507A, HI-508A, HI-509A
11-72
Functional Diagrams
HI-506A HI-507A
HI-508A HI-509A
DECODER/
DRIVER
OUT
IN 1
IN 2
IN 16
PROTECTION A0A1A2A3
EN
DIGITAL INPUT
LEVEL
SHIFT
5V
REF
VREF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
1K
1K
1K
DECODER/
DRIVER
OUT
IN 1A
IN 8A
IN 1B
PROTECTION A0A1A2
EN
DIGITAL INPUT
LEVEL
SHIFT
5V
REF
VREF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
1K
1K
1K
IN 8B
1K
A
OUT
B
DECODER/
DRIVER
OUT
IN 1
IN 2
IN 8
PROTECTION A0A1A2
EN
DIGITAL INPUT
LEVEL
SHIFT
5V
REF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
1K
1K
1K
DECODER/
DRIVER
OUT
IN 1A
IN 4A
IN 1B
PROTECTION A0A1
EN
DIGITAL INPUT
LEVEL
SHIFT
5V
REF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
1K
1K
1K
IN 4B
1K
A
OUT
B
HI-506A, HI-507A, HI-508A, HI-509A
11-73
Schematic Diagrams
ADDRESS INPUT BUFFER AND LEVEL SHIFTER
ADDRESS DECODER
LEVEL SHIFTER
P
N
P
N
N
P
N
P
VREF
ADD
IN
N
P
N
P P
N
P
NN
P
N
P
LEVEL
SHIFTED
ADDRESS
TO
TTL REFERENCE
CIRCUIT
V+
R10
R9
Q1
Q4
D3
GND
OVERVOLTAGE
PROTECTION
D2
R1
200
V-
D1
V+
R2
R3
GND
V+
V-
DECODE
R4
R5 R7
R8
R6
P
N
A0 OR A0
TO N-CHANNEL
DEVICE OF
THE SWITCH
A1 OR A1
A2 OR A2
A3 OR A3
ENABLE
PP PP P P
+V
V-
N
N
N
N
NN
TO P-CHANNEL
DEVICE OF
THE SWITCH
DELETE A3 OR A3INPUT
FOR HI-507A AND HI-509A
HI-506A, HI-507A, HI-508A, HI-509A
11-74
MULTIPLEX SWITCH
Schematic Diagrams
(Continued)
FROM DECODE
N
N
V+
OUT
IN
FROM DECODE
OVERVOLTAGE PROTECTION
P
D6
R11
1K
V-
D7 D4 D5
Q6
N
P
Q5
HI-506A, HI-507A, HI-508A, HI-509A
11-75
Absolute Maximum Ratings Thermal Information
VSUPPLY(+) to VSUPPLY(-) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44V
VSUPPLY(+) to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +22V
VSUPPLY(-) to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +25V
Digital Input Overvoltage
+VEN, +VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +VSUPPLY +4V
-VEN, -VA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -VSUPPLY -4V
or 20mA, Whichever Occurs First
Analog Signal Overvoltage
+VS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +VSUPPLY +20V
-VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -VSUPPLY -20V
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . .20mA
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40mA
Pulsed at 1ms, 10% Duty Cycle (Max)
Operating Conditions
Temperature Ranges
HI-506A/507A/508A/509A-2, -8 . . . . . . . . . . . . . . -55oC to 125oC
HI-506A/507A/508A/509A-5, -7 . . . . . . . . . . . . . . . . 0oC to 75 oC
Thermal Resistance (Typical, Note 1) θJA (oC/W) θJC (oC/W)
28 Ld CERDIP Package
(HI-506A, HI-507A) . . . . . . . . . . . . . 55 18
16 Ld CERDIP Package
(HI-508A, HI-509A) . . . . . . . . . . . . . 85 32
28 Ld PDIP Package
(HI-506A, HI-507A) . . . . . . . . . . . . . 60 N/A
16 Ld PDIP Package
(HI-508A, HI-509A) . . . . . . . . . . . . . 100 N/A
Maximum Junction Temperature
CERDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175oC
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = +4V; VAL (Logic Lev el Lo w) = +0.8V,
Unless Otherwise Specified. For Test Conditions, Consult Performance Curves
PARAMETER TEMP
(oC)
HI-50XA-2, -8 HI-50XA-5, -7
UNITSMIN TYP MAX MIN TYP MAX
SWITCHING CHARACTERISTICS
Access Time, tA (Note 2) 25 - 0.5 - - 0.5 - µs
Full - - 1.0 - - 1.0 µs
Break-Before-Make Delay, tOPEN (Note 2) 25 25 80 - 25 80 - ns
Enable Delay (ON), tON(EN) (Note 2) 25 - 300 500 - 300 - ns
Full - - 1000 - - 1000 ns
Enable Delay (OFF), tOFF(EN) (Note 2) 25 - 300 500 - 300 - ns
Full - - 1000 - - 1000 ns
Settling Time to 0.1%, tS (HI-506A and HI-507A) 25 - 1.2 - - 1.2 - µs
Settling Time to 0.01%, tS (HI-506A and HI-507A) 25 - 3.5 - - 3.5 - µs
Settling Time to 0.1%, tS (HI-508A and HI-509A) 25 - 1.2 - - 1.2 - µs
Settling Time to 0.01%, tS (HI-508A and HI-509A) 25 - 3.5 - - 3.5 - µs
“Off Isolation” (Note 7) 25 50 68 - 50 68 - dB
Channel Input Capacitance, CS(OFF) 25-12- -12-pF
Channel Output Capacitance, CD(OFF) (HI-506A) 25 - 52 - - 52 - pF
Channel Output Capacitance, CD(OFF) (HI-507A) 25 - 30 - - 30 - pF
Channel Output Capacitance, CD(OFF) (HI-508A) 25 - 25 - - 25 - pF
Channel Output Capacitance, CD(OFF) (HI-509A) 25 - 12 - - 12 - pF
Digital Input Capacitance, CA25-10- -10-pF
Input to Output Capacitance, CDS(OFF) 25 - 0.1 - - 0.1 - pF
DIGITAL INPUT CHARACTERISTICS
Input Low Threshold, TTL Drive, VAL (Note 2) Full - - +0.8 - - +0.8 V
Input High Threshold, VAH (Notes 2, 9) Full +4.0 - - +4.0 - - V
HI-506A, HI-507A, HI-508A, HI-509A
11-76
Input Leakage Current (High or Low), IA(Notes 2, 6) Full - - 1.0 - - 1.0 µA
MOS Drive, VAL, HI-506A/HI-507A (Note 10) 25 - - 0.8 - - 0.8 V
MOS Drive, VAH, HI-506A/HI-507A (Note 10) 25 6.0 - - 6.0 - - V
ANALOG CHANNEL CHARACTERISTICS
Analog Signal Range, VS (Note 2) Full -15 - +15 -15 - +15 V
On Resistance, rON, (Notes 2, 3) 25 - 1.2 1.5 - 1.5 1.8 k
Full - 1.5 1.8 - 1.8 2.0 k
Off Input Leakage Current, IS(OFF) (Notes 2, 4) 25 - 0.03 - - 0.03 - nA
Full - - 50 - - 50 nA
Off Output Leakage Current, ID(OFF) (Notes 2, 4) 25 - 0.1 - - 0.1 - nA
HI-506A Full - - 300 - - 300 nA
HI-507A Full - - 200 - - 200 nA
HI-508A Full - - 200 - - 200 nA
HI-509A Full - - 100 - - 100 nA
With Input Overvoltage Applied, ID(OFF) (Note 5) 25 - 4.0 - - 4.0 - nA
Full - - 2.0 - - - µA
On Channel Leakage Current, ID(ON) (Notes 2, 4) 25 - 0.1 - - 0.1 - nA
HI-506A Full - - 300 - - 300 nA
HI-507A Full - - 200 - - 200 nA
HI-508A Full - - 200 - - 200 nA
HI-509A Full - - 100 - - 100 nA
Differential Off Output Leakage Current, IDIFF,
(HI-507A, HI-509A Only) Full - - 50 - - 50 nA
POWER REQUIREMENTS
Current, I+, Pin 1 (Notes 2, 8) Full - 1.5 2.0 - 1.5 2.0 mA
Current, I+, HI-508A/HI-509A (Notes 2, 8) Full - 1.5 2.4 - 1.5 2.0 mA
Current, I-, Pin 27 (Notes 2, 8) Full - 0.02 1.0 - 0.02 1.0 mA
Power Dissipation, PDFull - 7.5 - - 7.5 - mW
NOTES:
2. 100% tested for Dash 8. Leakage currents not tested at -55oC.
3. VOUT = ±10V, IOUT = +100µA.
4. 10nA is the practical lower limit for high speed measurement in the production test environment.
5. Analog Overvoltage = ±33V.
6. Digital input leakage is primarily due to the clamp diodes (see Schematic). Typical leakage is less than 1nA at 25oC.
7. VEN = 0.8V, RL = 1K, CL = 15pF, VS = 7VRMS, f = 100kHz.
8. VEN, VA = 0V or 4V.
9. To drive from DTL/TTL Circuits, 1k pull-up resistors to +5V supply are recommended.
10. VREF = +10V.
Electrical Specifications Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = +4V; VAL (Logic Lev el Lo w) = +0.8V,
Unless Otherwise Specified. For Test Conditions, Consult Performance Curves (Continued)
PARAMETER TEMP
(oC)
HI-50XA-2, -8 HI-50XA-5, -7
UNITSMIN TYP MAX MIN TYP MAX
HI-506A, HI-507A, HI-508A, HI-509A
11-77
T ypical P erformance Curves and T est Circuits
TA = 25oC, VSUPPLY = ±15V, V AH = +4V, V AL = 0.8V, VREF = Open,
Unless Otherwise Specified
FIGURE 1A. TEST CIRCUIT
FIGURE 1B. ON RESISTANCE vs ANALOG INPUT VOLTAGE FIGURE 1C. NORMALIZED ON RESISTANCE vs SUPPLY
VOLTAGE
FIGURE 1. ON RESISTANCE
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE FIGURE 2B. ID(OFF) (NOTE 1)
-100µA
OUTIN
VIN rON = V2
100µA
V2
-10 ANALOG INPUT (V)
ON RESISTANCE (k)
-8 +2 +4 +6 +8 +10-6 -4 -2 0
1.4
1.3
1.2
1.1
1.0
0.9
0.8
TA = 125oC
TA = 25oC
TA = -55oC
0.7
0.6
1.5
1.4
1.3
1.2
1.1
1.0
0.9
0.8
NORMALIZED RESISTANCE
(REFERRED TO VALUE AT ±15V)
±7±8±9±10 ±11 ±12 ±13 ±14 ±15
SUPPLY VOLTAGE (V)
±5±6
125oC TO -55oC
VIN = +5V
100nA
10nA
1nA
100pA
10pA
LEAKAGE CURRENT
25 50 75 100 125
TEMPERATURE (oC)
OFF OUTPUT
CURRENT
ID(OFF)
OFF INPUT
LEAKAGE CURRENT
IS(OFF)
ON LEAKAGE
CURRENT
ID(ON)
ID(OFF)
A
±10V
+0.8V
EN
OUT
10V
±
HI-506A, HI-507A, HI-508A, HI-509A
11-78
FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 1) FIGURE 2D. ID(On) TEST CIRCUIT (NOTE 1)
NOTE:
1. Two measurements per channel: ±10V and +10V. (Two measurements per device for ID(OFF) ±10V and +10V.)
FIGURE 2. LEAKAGE CURRENTS
FIGURE 3A. ANALOG INPUT OVER V OLTAGE CHARA CTERISTICS FIGURE 3B. TEST CIRCUIT
FIGURE 3. OVERVOLTAGE CHARACTERISTICS
FIGURE 4A. ON CHANNEL CURRENT vs VOLTAGE FIGURE 4B. TEST CIRCUIT
FIGURE 4. ON CHANNEL CURRENT
T ypical P erformance Curves and T est Circuits
TA = 25oC, VSUPPLY = ±15V, V AH = +4V, V AL = 0.8V, VREF = Open,
Unless Otherwise Specified (Continued)
10V
±
±10V
+0.8V
EN
A
OUT
IS(OFF)
OUT
ID(ON)
A
±10V ±10V
+2.4V
EN
A0A1
±15 ±18 ±21 ±24 ±27 ±30 ±33 ±36
ANALOG INPUT OVERVOLTAGE (V)
ANALOG INPUT CURRENT (mA)
18
15
12
9
0
6
3
OUTPUT OFF LEAKAGE CURRENT (nA)
5
4
3
2
1
0
ANALOG INPUT
CURRENT (IIN)
OUTPUT OFF LEAKAGE
CURRENT ID(OFF)
6
7
A
±VIN
AIIN ID(OFF)
0±2±4±6±8±10 ±12 ±14
0
±14
±12
±10
±8
±6
±4
±2
VOLTAGE ACROSS SWITCH (V)
SWITCH CURRENT (mA)
-55oC25oC
125oC
A
±VIN
HI-506A, HI-507A, HI-508A, HI-509A
11-79
FIGURE 5A. SUPPLY CURRENT vs TOGGLE FREQUENCY FIGURE 5B. TEST CIRCUIT
FIGURE 5. SUPPLY CURRENTS
FIGURE 6A. ACCESS TIME vs LOGIC LEVEL (HIGH) FIGURE 6B. TEST CIRCUIT
FIGURE 6. ACCESS TIME
Switching Waveforms
FIGURE 7A. FIGURE 7B.
FIGURE 7. ACCESS TIME
T ypical P erformance Curves and T est Circuits
TA = 25oC, VSUPPLY = ±15V, V AH = +4V, V AL = 0.8V, VREF = Open,
Unless Otherwise Specified (Continued)
8
6
4
2
01K TOGGLE FREQUENCY (Hz)
SUPPLY CURRENT (mA)
10K 100K 1M 10M
VSUPPLY = ±10V
VSUPPLY = ±15V
+15V/+10V
+V
-V
IN 1
IN 2
IN 8/IN 16
OUT
A0
EN
A1
10 14
MpF
A3
A2
50
VVA
+4V GND
A
-15V/-10V
A-ISUPPLY
+ISUPPLY
±10V/±5V
THRU
IN 7/IN 15
HI-506A
Similar connection for HI-507A/HI-508A/HI-509A
10V/
±
5V
±
900
700
500
300 3
ACCESS TIME (ns)
LOGIC LEVEL (HIGH) (V)
579 151311
800
600
400
468101214
V
REF = OPEN FOR LOGIC HIGH LEVEL 6V
VREF = LOGIC HIGH FOR LOGIC HIGH LEVELS > 6V ±10V
+15V
+V
-V
IN 1
IN 2 THRU
IN 16
OUT
A0
EN
A1
10 50
kpF
A3
A2
50
VA
+4V GND
-15V
10V
IN 7/IN 15
HI-506A
Similar connection for HI-507A/HI-580A/HI-509A
±
PROBE
VREF
1/2 VAH
VAH = 4.0V
90%
+10V
0V
OUTPUT
-10V
tA
ADDRESS
DRIVE (VA)
200ns/DIV.
VA INPUT
2V/DIV.
OUTPUT A
5V/DIV.
HI-506A, HI-507A, HI-508A, HI-509A
11-80
FIGURE 8A.
FIGURE 8B.
FIGURE 8C.
FIGURE 8. BREAK-BEFORE-MAKE DELAY
IN 1
IN 2 THRU
IN 8/IN 16
OUT
A0
EN
A1
50pF
1k
VOUT
A3
A2
50
VA
+4.0V
GND
IN 7/IN 15
HI-506A
Similar connection for HI-507A/HI-508A/HI-509A
+5V
50% 50%
VAH = 4.0V
0V
OUTPUT
ADDRESS
DRIVE (VA)
tOPEN
1 ON 16 ON
VA INPUT
2V/DIV.
OUTPUT
0.5V/DIV.
100ns/DIV.
FIGURE 9A.
FIGURE 9B.
FIGURE 9C.
FIGURE 9. ENABLE DELAY tON(EN), tOFF(EN)
IN 1
IN 2 THRU
IN 8 /IN 16
OUT
A0
EN
A1
50pF
A3
A2
-VAGND 1k
+10V
IN 7/IN 15
HI-506A
Similar connection for HI-507A//HI-508A/HI-509A
50
VAH = 4.0V
0V
OUTPUT
tOFF(EN)
tON(EN)
90%
50%
50%
90%
IN 1 THRU
IN 16 OFF
OUTPUT
2V/DIV.
1 ON
100ns/DIV.
HI-506A, HI-507A, HI-508A, HI-509A
11-81
Truth Tables
HI-506A
A3A2A1A0EN “ON” CHANNEL
XXXXL None
LLLLH 1
LLLHH 2
LLHLH 3
LLHHH 4
LHLLH 5
LHLHH 6
LHHLH 7
LHHHH 8
HLLLH 9
HLLHH 10
HLHLH 11
HLHHH 12
HHLLH 13
HHLHH 14
HHHLH 15
HHHHH 16
HI-507A
A2A1A0EN “ON” CHANNEL
PAIR
X X X L None
LLLH 1
LLHH 2
LHLH 3
LHHH 4
HLLH 5
HLHH 6
HHLH 7
HHHH 8
HI-508A
A2A1A0EN “ON” CHANNEL
X X X L None
LLLH 1
LLHH 2
LHLH 3
LHHH 4
HLLH 5
HLHH 6
HHLH 7
HHHH 8
HI-509A
A1A0EN “ON” CHANNEL
PAIR
X X L None
LLH 1
LHH 2
HLH 3
HHH 4
HI-506A, HI-507A, HI-508A, HI-509A
11-82
Die Characteristics
DIE DIMENSIONS:
159 mils x 83.9 mils x 19 mils
METALLIZATION:
Type: CuAl
Thickness: 16kű2kÅ
SUBSTRATE POTENTIAL (NOTE):
-VSUPPLY
PASSIVATION:
Silox: 12kű2kÅ
Nitride: 3.5kű1kÅ
WORST CASE CURRENT DENSITY:
1.4 x 105 A/cm2
TRANSISTOR COUNT:
485
PROCESS:
CMOS-DI
NO TE: The substrate appears resistive to the -VSUPPLY terminal, therefore it ma y be left floating (Insulating Die Mount) or it may be mounted
on a conductor at -VSUPPLY potential.
Metallization Mask Layouts
HI-506A HI-507A
IN 9
IN 10
IN 11
IN 12
IN 13
IN 14
IN 15
IN 16
V- (27) +V (1) NC (2)
IN 1
IN 2
IN 3
IN 4
IN 5
IN 6
IN 7
IN 8
EN A0A1A2VREF GND
(18) (17) (16) (15) (13) (12)
(19)
(20)
(21)
(22)
(23)
(24)
(25)
(26) (4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
OUT (28)
A3
(14)
IN 1B
IN 2B
IN 3B
IN 4B
IN 5B
IN 6B
IN 7B
IN 8B
V- (27) +V (1) OUT B(2)
IN 1A
IN 2A
IN 3A
IN 4A
IN 5A
IN 6A
IN 7A
IN 8A
EN A0A1A2NC VREF GND
(18) (17) (16) (15) (14) (13) (12)
(19)
(20)
(21)
(22)
(23)
(24)
(25)
(26) (4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
OUT A (28)
HI-506A, HI-507A, HI-508A, HI-509A
11-83
Die Characteristics
DIE DIMENSIONS:
108 mils x 83 mils
METALLIZATION:
Type: CuAl
Thickness: 16kű2kÅ
SUBSTRATE POTENTIAL (NOTE):
-VSUPPLY
PASSIVATION:
Silox: 12kű2kÅ
Nitride: 3.5kű1kÅ
WORST CASE CURRENT DENSITY:
1.4 x 105 A/cm2
TRANSISTOR COUNT:
253
PROCESS:
CMOS-DI
NO TE: The substrate appears resistive to the -VSUPPLY terminal, therefore it ma y be left floating (Insulating Die Mount) or it may be mounted
on a conductor at -VSUPPLY potential.
Metallization Mask Layouts
HI-508A HI-509A
IN 6 IN 7 IN 8 OUT IN 4 IN 3
IN 1
IN 2
-V
A0
A1
A2EN
IN 5
GND
+V
(11) (10) (9) (8) (7) (6)
(12)
(13)
(14)
(5)
(4)
(3)
(15) (16) (1) (2)
IN 3B IN 4BOUT B OUT A IN 4AIN 3A
IN 1A
IN 2A
-V
A0
A1
GND EN
IN 2B
+V
IN 1B
(11) (10) (9) (8) (7) (6)
(12)
(13)
(14)
(5)
(4)
(3)
(15) (16) (1) (2)
HI-506A, HI-507A, HI-508A, HI-509A