CY74FCT16823T
CY74FCT162823T
3
Electrical Characteristics Over the Operating Rang e
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHInput Hysteresis[6] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
IIH Inpu t HIGH Current VCC=Max., VI=VCC ±1µA
IIL Input LOW Current VCC=Max., VI=GND ±1µA
IOZH High Impedance Output Current
(Three-State Output pins) VCC=Max., VOUT=2.7V ±1µA
IOZL High Impedance Output Current
(Three-State Output pins) VCC=Max., VOUT=0.5V ±1µA
IOS Short Circuit Curre nt[7] VCC=Max., VOUT=GND −80 −140 −200 mA
IOOutput Drive Current[7] VCC=Max., VOUT=2.5V −50 −180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[8] 1µA
Output Drive Characteristics for CY74 FCT16823T
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VOH Output HIGH Voltage VCC=Min., IOH=−3 mA 2.5 3.5 V
VCC=Min., IOH=−15 mA 2.4 3.5
VCC=Min., IOH=−32 mA 2.0 3.0
VOL Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74 FCT162823T
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
IODL Output LOW Voltage[7] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA
IODH Output HIGH Voltage[7] VCC=5V, VIN=VIH or VIL, VOUT=1.5V −60 −115 −150 mA
VOH Output HIGH Voltage VCC=Min., IOH=−24 mA 2.4 3.3 V
VOL Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V
Capacitance[9] (TA = +25°C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.[5] Max. Unit
CIN Input Capacitance VIN = 0V 4.5 6.0 pF
COUT Out put Capacitance VOUT = 0V 5.5 8.0 pF
Notes:
5. Typical v alues are at VCC= 5.0V, TA= +25°C ambient.
6. This input is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed tes t apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational val ues. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any se quence of parameter
tests, IOS tests should be performed last.
8. Tested at +25°C.
9. This parameter is guaranteed but not tested.