GB50MPS17-247
1700 V SiC MPS™ Diode
Copyright © 2018 GeneSiC Semiconductor Inc. All Rights Reserved
The information in this document is subject to change without notice
Published by
GeneSiC Semiconductor, Inc.
43670 Trade Center Place Suite 155
Dulles, VA 20166
Sep 2018 Rev1.1
Page 7 of 7
RoHS Compliance
The levels of RoHS restricted materials in this product are below the maximum concentration values (also
referred to as the threshold limits) permitted for such substances, or are used in an exempted application, in
accordance with EU Directive 2011/65/EC (RoHS2), as implemented November 15, 2017. RoHS Declarations for
this product can be obtained from your GeneSiC representative.
REACh Compliance
REACh substances of high concern (SVHCs) information is available for this product. Since the European
Chemical Agency (ECHA) has published notice of their intent to frequently revise the SVHC listing for the
foreseeable future, please contact a GeneSiC representative to insure you get the most up-to-date REACh SVHC
Declaration. REACh banned substance information (REACh Article 67) is also available upon request.
This product has not been designed or tested for use in, and is not intended for use in, applications implanted into
the human body nor in applications in which failure of the product could lead to death, personal injury or property
damage, including but not limited to equipment used in the operation of nuclear facilities, life-support machines,
cardiac defibrillators or similar emergency medical equipment, aircraft navigation or communication or control
systems, or air traffic control systems.
GeneSiC Semiconductor disclaims all and any warranty and liability arising out of use or application of any
product. No license, express or implied to any intellectual property rights is granted by this document.
Related Links
• Soldering Document: http://www.genesicsemi.com/quality/quality-manual/
• Tin-whisker Report: http://www.genesicsemi.com/quality/compliance/
• Reliability Report: http://www.genesicsemi.com/quality/reliability/