3FN3076.13
December 21, 2005
Absolute Maximum Ratings Thermal Information
Collector to Emitter Voltage (Open Base) . . . . . . . . . . . . . . . . . . 8V
Collector to Base Voltage (Open Emitter) . . . . . . . . . . . . . . . . . 12V
Emitter to Base Voltage (Reverse Bias). . . . . . . . . . . . . . . . . . . 5.5V
Collector Current (100% Duty Cycle) . . . . . . 18.5mA at TJ = 150°C
34mA at TJ = 125°C
37mA at TJ = 110°C
Peak Collector Current (Any Condition). . . . . . . . . . . . . . . . . . 65mA
Operating Information
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . -55°C to 125°C
Thermal Resistance (Typical) θJA (°C/W) θJC (°C/W)
14 Ld SOIC Package (Note 1) . . . . . . . 120 N/A
16 Ld SOIC Package (Note 1) . . . . . . . 115 N/A
QFN Package (Notes 2, 3). . . . . . . . . . 57 10
Maximum Power Dissipation (Any One Transistor) . . . . . . . . 0.15W
Maximum Junction Temperature (Die) . . . . . . . . . . . . . . . . . . . 175°C
Maximum Junction Temperature (Plastic Package) . . . . . . . 150°C
Maximum Storage Temperature Range . . . . . . . . . . -65°C to 150°C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300°C
(SOIC - Lead Tips Only)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
2. For θJC, the “case temp” location is the center of the exposed metal pad on the package underside.
3. θJA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
Electrical Specifications TA = 25°C
PARAMETER TEST CONDITIONS
DIE SOIC, QFN
UNITSMIN TYP MAX MIN TYP MAX
DC NPN CHARACTERISTICS
Collector to Base Breakdown
Voltage, V(BR)CBO
IC = 100µA, IE = 0 12 18 - 12 18 - V
Collector to Emitter Breakdown
Voltage, V(BR)CEO
IC = 100µA, IB = 0 8 12 - 8 12 - V
Collector to Emitter Breakdown
Voltage, V(BR)CES
IC = 100µA, Base Shorted to Emitter 10 20 - 10 20 - V
Emitter to Base Breakdown
Voltage, V(BR)EBO
IE = 10µA, IC = 0 5.5 6 - 5.5 6 - V
Collector-Cutoff-Current, ICEO VCE = 6V, IB = 0 - 2 100 - 2 100 nA
Collector-Cutoff-Current, ICBO VCB = 8V, IE = 0 - 0.1 10 - 0.1 10 nA
Collector to Emitter Saturation
Voltage, VCE(SAT)
IC = 10mA, IB = 1mA - 0.3 0.5 - 0.3 0.5 V
Base to Emitter Voltage, VBE IC = 10mA - 0.85 0.95 - 0.85 0.95 V
DC Forward-Current Transfer
Ratio, hFE
IC = 10mA, VCE = 2V 40 130 - 40 130 -
Early Voltage, VAIC = 1mA, VCE = 3.5V 20 50 - 20 50 - V
Base to Emitter Voltage Drift IC = 10mA - -1.5 - - -1.5 - mV/°C
Collector to Collector Leakage - 1 - - 1 - pA
Electrical Specifications TA = 25°C
PARAMETER TEST CONDITIONS
DIE SOIC, QFN
UNITSMIN TYP MAX MIN TYP MAX
DYNAMIC NPN CHARACTERISTICS
Noise Figure f = 1.0GHz, VCE = 5V,
IC = 5mA, ZS = 50Ω
- 3.5 - - 3.5 - dB
fT Current Gain-Bandwidth
Product
IC = 1mA, VCE = 5V - 5.5 - - 5.5 - GHz
IC = 10mA, VCE = 5V - 8 - - 8 - GHz
HFA3046, HFA3096, HFA3127, HFA3128