July 2006 Rev. 2 1/23
1
M36P0R9060E0
512 Mbit (x16, Multiple Bank, Multi-Level, Burst) Flash memory
64 Mbit (Burst) PSRAM, 1.8V supply, Multi-Chip Package
Feature summary
Multi-Chip Package
1 die of 512 Mbit (32Mb x 16, Multiple
Bank, Multi-Level, Burst) Flash memory
–1 die of 64 Mbit (4Mb x16) PSRAM
Supply voltage
–V
DDF = VCCP = VDDQ = 1.7 to 1.95V
–V
PPF = 9V for fast program
Electronic signature
Manufacturer Code: 20 h
Device Code: 8819
ECOPACK® package
Flash memory
Synchronous / asynchronous read
Synchronous Burst Read mode:
108MHz, 66MHz
Asynchronous Page Read mode
Random Access: 96ns
Programming time
4.2µs typical Word program time using
Buffer Enhanced Factory Program
command
Memory organization
Multiple Bank memory array: 64 Mbit banks
F our Extended Fl ash Arr a y (EFA) Blocks of
64 Kbits
Dual operations
program/erase in one Bank while re ad in
others
No delay between read and write
operations
Security
64 bit unique device number
2112 bit user programmable OTP Cells
100,000 Program/erase cycles per block
Common Flash Interface (CFI)
Block locking
All Blocks locked at power-up
Any combination of Blocks can be locked
with zero latency
–WP
F for Block Lock-Down
Absolute Write Protection with VPPF = VSS
PSRAM
User-selectable operating modes
Asynchronous mo des: Random Read, and
Write, Page Read
Synchronous modes: NOR-Flash, Full
Synchronou s (Bu rs t Rea d and Write)
Asynchronous Random Read
Access time: 70ns
Asynchronous Page Read
Page size: 4, 8 or 16 Words
Subsequent Read withi n Page: 20ns
Burst Read
Fixed length (4, 8, 16 or 32 Words) or
Continuous
Low power cons ump tion
Active current: < 25mA
Standby current: 140µA
Deep Power-Down current: < 10µA
Low-power features
Partial Array Self-Refresh (PASR)
Deep Power-Down (DPD) Mode
Automatic Temperature-compensated Self-
Refresh
TFBGA107 (ZAC)
FBGA
www.st.com
M36P0R9060E0
2/23
Contents
1 Summary description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.1 Address inputs (A0-A24) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.2 Data input/output (DQ0-DQ15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.3 Latch Enable (L) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.4 Clock (K) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.5 Wait (WAIT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.6 Flash Chip Enable input (EF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.7 Flash Output Enable inputs (GF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.8 Flash Write Enable (WF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.9 Flash Write Protect (WPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.10 Flash Reset (RPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.11 PSRAM Chip Enable input (EP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.12 PSRAM Write Enable (WP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.13 PSRAM Output Enable (GP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.14 PSRAM Upper Byte Enable (UBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.15 PSRAM Lower Byte Enable (LBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.16 PSRAM Configuration Register Enable (CRP) . . . . . . . . . . . . . . . . . . . . . 11
2.17 Deep Power-Down input (DPDF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.18 VDDF Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.19 VCCP Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.20 VDDQ Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.21 VPPF Program Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
2.22 VSS Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3 Functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4 Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
5 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
M36P0R9060E0
3/23
6 Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
7 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
8 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
M36P0R9060E0
4/23
List of tables
Table 1. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 2. Main operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Table 3. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 4. Operating and AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Table 5. Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Table 7. Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Table 8. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
M36P0R9060E0
5/23
List of figures
Figure 1. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 2. TFBGA connections (top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Figure 3. Functional block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Figure 4. AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Figure 5. AC measurement load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 6. TFBGA 107 8x11mm - 9x12 active ball array, 0.8mm pitch, package outline . . . . . . . . . . 19
1 Summary description M36P0R9060E0
6/23
1 Summary description
The M36P0R9060E0 combines two memory devices in a Multi-Chip Package:
512-Mbit Multiple Bank Flash memory (the M58PR512J)
64-Mbit PSRAM (the M69KB096AM)
The purpose of this document is to de scribe ho w the tw o me mory components opera te with
respect to each other. It must be read in conjunction with the M58PRxxxJ and
M69KB096AM datashee ts, where all specifications required to ope rate the Flash memory
and PSRAM components ar e fully detailed. These datasheets are available from the
STMicroelectronics website: www.st.com.
Recommended oper at ing cond itions d o not allo w mo re tha n one memory to be active at the
same time.
The memory is offered in a Stacked TFBGA107 package. It is supplied with all the bits
erased (set to ‘1’).
Figure 1. Logic diagram
AI10994
25
A0-A24
EF
DQ0-DQ15
VDDQ
M36P0R9060E0
GF
VSS
16
WF
RPF
WPF
VDDF
DPDF
EP
GP
WP
UBP
LBP
VPPF
VCCP
L
K
CRP
WAIT
M36P0R9060E0 1 Summary description
7/23
Table 1. Signal names
A0-A24(1)
1. A22-A24 are Address Inputs for the Flash memory component only.
Address Inputs
DQ0-DQ15 Common Data Input/Output
VDDQ Common Flash and PSRAM Power Supply for I/O Buffers
VPPF Flash Memor y Optional Supply Voltage for Fast Program & Erase
VDDF Flash Memory Power Supply
VCCP PSRAM Power Supply
VSS Ground
LLatch Enable inpu t
K Burst Clock
WAIT Wait Output
NC Not Connected Internally
DU Do Not Use as Internally Connected
Flash Memory
EFChip Enable input
GFOutput Enable Input
WFWrite Enable input
RPFReset input
WPFWrite Protect input
DPDFDeep Power-Down
PSRAM
EPChip Enable Input
GPOutput Enable Input
WP Write En able Input
CRP Configuration Register Enable Input
UBP Upper Byte Enable Input
LBP Low e r Byte Enable Input
1 Summary description M36P0R9060E0
8/23
Figure 2. TFBGA connections (top view through package)
AI11098B
NC
DQ14
DQ0
A16
WAIT
DQ13
DQ8
HDQ7
D
C
A17
A22
BA21
A
87654321
A5
A3
G
F
E
A1
DU
K
A7
A2
A8
DU
A11
WPA13
DU
9
A4
A12
M
L
K
JDQ15
VSS
NC
DU
NC
DQ6
NC
DU
DQ12
L
NC
DQ4
DQ10
VSS
VPPF
A18 VSS
DQ11
DQ1
A23
A24
NC
A19
NC
DU
DQ9
A14
NC
A20
VDDF
DQ3
DQ5
DQ2
A6
DU DU DU DU
NC NC
DU
NC NC
NC VCCP DPDFVSS
NC
VSS
NC
VSS
VSS
VDDQ
VDDQ
DU
DU
DU
LBP
EPA9
WPFA10 A15
UBPRPFWF
GP
A0
NC EF
GF
VCCP VDDQ CRP
VSS VDDQ VDDF VSS VSS VSS VSS
M36P0R9060E0 2 Signal descriptions
9/23
2 Signal descriptions
See Figure 1., Logic diagr am and Table 1., Signal names, for a brief ov erview of the signals
connected to this device.
2.1 Address inputs (A0-A24)
Addresses A0- A21 are common inputs for the Flash memory and PSRAM components.
Addresses A22 and A24 are inputs for the Flash memory component only. The Address
Inputs select the cells in the Flash memory array to access during Bus Read operations.
During Bus Write operations they control the commands sent to the Command Interface of
the Flash memory’s Program/Erase Controller.
In the PSRAM the Address Inputs select the cells in the memory arra y to access during Bus
read and write operations.
2.2 Data input/output (DQ0-DQ15)
The Data I/O outp ut the data stored at th e selected address during a Bus Read oper ation or
input a command or the data to be programmed during a Bus Write operation.
F or the PSRAM component, the upper Byte Data Inputs/Outputs (DQ8-DQ15) carry the
data to or from the upper part of the selected address when Upper Byte Enable (UBP) is
driven Low. The lower Byte Data Inputs/Outputs (DQ0-DQ7) carry the data to or from the
low er part of the selected address whe n Low er Byte Enab le ( LBP) is driv en Lo w. When both
UBP and LBP are disabled, the Data Inputs/ Outputs are high impedance.
2.3 Latch Enable (L)
The Latch Enable pin is common to the Flash memory and PSRAM components.
For details of how the Latch Enable signal behaves, please refer to the da tasheets of the
respective memory components: M69KB096AM for the PSRAM and M58PRxxxJ for the
Flash memory.
2.4 Clock (K)
The Clock input pin is common to th e Flash memory and PSRAM components.
F or details of how the Cloc k signal be ha v es, pl ease ref er to the datashee ts of the respectiv e
memory components: M69KB096AM for the PSRAM and M58PRxxxJ for the Flash
memory.
2 Signal descriptions M36P0R9060E0
10/23
2.5 Wait (WAIT)
W AIT is an output pin commo n to the Flash memory and PSRAM components . How e v er the
WAIT signal does not beha ve in the same way for the PSRAM and the Flash memory.
For details of how it behaves, please refer to the M6 9KB096AM datasheet for the PSRAM
and to the M58PRxxxJ datasheet for the Flash me mory.
2.6 Flash Chip Enable input (EF)
The Chip Enable input activates the cont rol logic, input buffers, decoders and sense
amplifiers of the Flash memory. When Chip Enable is Low, VIL, an d Reset is High, VIH, the
de vice is in activ e mode . When Chip Enable is at VIH the Flash memo ry are deselected, the
outputs are high impedance and the power consumption is reduced to the standb y level.
It is not allowed to have EF at VIL and EP at VIL at the same time. Only one memory
component can be enabled at a time.
2.7 Flash Output Enable inputs (GF)
The Output Enable inp ut controls the data outputs during Flash memory Bus Read
operations.
2.8 Flash Write Enable (WF)
The Write Enable input controls the Bus Write operation of the Flash memory Command
Interface. The data and address input s are latched on the rising edge of Chip Enable or
Write Enable whichever occurs first.
2.9 Flash Write Protect (WPF)
Write Protect is an input that gives an additional hardware protection for each block. When
Write Protect is Low, VIL, Lock-Down is enabled and the protection status of the Locked-
Down b loc ks cannot be changed. When Write Protect is at High, VIH, Loc k-Do wn is disabled
and the Locked-Down blocks can be locked or unlocked. (See the Lock Status Table in the
M58PRxxxJ datasheet).
2.10 Flash Reset (RPF)
The Reset input provides a hardware reset of the Flash memories. When Reset is at VIL, the
memory is in Reset mode: the outputs are high impedance and the current consumption is
reduced to the Reset Supply Current IDD2. Refer to the M58PRxxxJ datasheet, for the value
of IDD2. After Reset all blocks are in the Locked state and the Configuration Regis te r is
reset. When Reset is at VIH, the device is in normal operation. Exiting Reset mode the
device enters Asynchronous Read mode, but a negative transition of Chip Enable or Latch
Enable is required to ensure valid data outputs.
The Reset pin can be interfaced with 3V logic without any addition al circuitry. It can be tied
to VRPH (refer to the M58PRxxxJ datasheet).
M36P0R9060E0 2 Signal descriptions
11/23
2.11 PSRAM Chip Enable input (EP)
The Chip En able input activ ates the PSRAM whe n driven Lo w (asserted). When deasserted
(VIH), the de vice is disabled, and goes automatically in low-power Standby mode or Deep
Power-down mode, according to the RCR (Ref resh Configuration Register) setting.
2.12 PSRAM Write Enable (WP)
Write Enable, WP
, controls the Bus Write operation of the PSRAM. When asserted (VIL), the
device is in Write mode and Write operations can be performed either to the configuration
registers or to the memory array.
2.13 PSRAM Output Enable (GP)
When held Low, VIL, the Output Enable, GP
, enables the Bus Read operations of the
PSRAM.
2.14 PSRAM Upper Byte Enable (UBP)
The Upper Byte En-able, UBP
, gates the data on the Upper Byte Data Inputs/Outputs (DQ8-
DQ15) to or from the upper part of the selected address during a Write or Read operation.
2.15 PSRAM Lower Byte Enable (LBP)
The Lower Byte Enable, LBP
, gates the data on the Lower Byte Data Inputs/Outputs (DQ0-
DQ7) to or from the lower part of the selected address during a Write or Read operation.
If both LBP and UBP are disabl ed (High), the device will disable the data bus from receiving
or transmitting data. Although the device will seem to be deselected, it remains in an active
mode as long as EP remain s Low.
2.16 PSRAM Configuration Register Enable (CRP)
When this signal is driven High, VIH, bus read or write operations access either the value of
the Refresh Configuration Register ( RCR) or the Bus Configuration Register (BCR)
according to the value of A19.
2 Signal descriptions M36P0R9060E0
12/23
2.17 Deep Power-Down input (DPDF)
The Deep Power-Down input is used to put the device in a Deep Pow er-Down mode.
When the de vice is in Standby mo de and the Enhanced Con figuration Register bit ECR15 is
set, asserting the Deep Power-Down input will cause the memory to enter the Deep Power-
Down mode.
When the de vice is in the Deep P o wer-Do wn mode , the memory cannot be modified and the
data is protected.
The polarity of the DPD pin is determined by ECR14. The Deep Power-Down input is acti ve
Low by default.
2.18 VDDF Supply Voltage
VDDF provides the power supply to the internal core of the Flash memory. It is the main
power supply for all Flash memory operations (Read, Program and Erase).
2.19 VCCP Supply Voltage
The VCCP Supply Voltage is the core supply voltage.
2.20 VDDQ Supply Voltage
VDDQ provides the power su pply for the Flash memory and PSRAM I/O pins. This allows all
Outputs to be powered independently of the Flash memory and PSRAM core po wer
supplies, VDDF and VCCP
.
2.21 VPPF Program Supply Voltage
VPPF is both a control input and a po w er supply pin f or the Flash memory. The two f unctions
are selected by the voltage range applied to the pin.
If VPPF is kept in a low voltage range (0V to VDDQ) VPPF is seen as a control input. In this
case a voltage lower than VPPLK gives an absolute protection against Prog ram or Erase,
while VPPF > VPP1 enables these functions (see the M58PRxxxJ datasheet for the relevant
v al ues). VPPF is only sampled at the beginning of a Program or Erase; a change in its value
after the ope ration has started does not have any effect and Program or Erase operations
continue.
If VPPF is in the range of VPPH it acts as a power supp ly pin. In this condition VPPF must be
stable until the Program/Erase algorithm is completed.
M36P0R9060E0 2 Signal descriptions
13/23
2.22 VSS Ground
VSS is the common ground reference for all voltage measurements in the Flashmemory
(core and I/O Buffers) and PSRAM chip s. It must be connec te d to th e system ground.
Note: Each Flash memory device in a system should have their supply voltage (V DDF) and
the program supply voltage VPPF decoupled with a 0.1µF cer amic capa citor close to th e pin
(high frequency, inherently low inductance capacitors should be as close as possible to the
package). See Figure 5., AC measurement load circuit. The PCB track widths should be
sufficient to carry the required VPPF program and erase currents.
3 Functional description M36P0R9060E0
14/23
3 Functional description
The PSRAM and Flash memory components have separate power supplies but share the
same grounds. They are distinguished by two Chip Enable inputs: EF for the Flash memory
and EP for the PSRAM.
Recommended operating conditions do not allow more than one device to be activ e at a
time. The most common example is a simultaneous read operations on the Flash memory
and the PSRAM which would result in a data bus contention. Therefore it is recommended
to put the other device in the high impedance state when reading the selected device.
Figure 3. Functional block diagram
Ai10995
EP
CRP
GP
WP
A0-A21
64 Mbit
PSRAM
UBP
LBP
WAIT
K
VDDQ
VSS
VCCP
L
512 Mbit
Flash
Memory
EF
GF
VDDF
WF
RPF
WPF
VPPF
A22-A24
DQ0-DQ15
DPDF
M36P0R9060E0 3 Functio nal description
15/23
Table 2. Main operating modes(1)
Operation(2)
(3) EF GFWFLRPFDPDF(4) WAIT
(5) EPCRPGPWPLBP,
UBPA19 A18 A0-A17
A20-
A21
DQ15-
DQ0
Flash Bus
Read VIL VIL VIH VIL(6) VIH de-
asserted(7)
PSRAM must be
disabled.
Flash
Data Out
Flash Bus
Write VIL VIH VIL VIL(6) VIH de-
asserted(7) Flash
Data In
Flash
Address
Latch VIL XV
IH VIL VIH de-
asserted(7) Flash
Data Out
or Hi-Z (8)
Flash Output
Disable VIL VIH VIH XV
IH de-
asserted(7) Hi-Z
Any PSRAM mode is
allowed.
Hi-Z
Flash
Standby VIH XX X V
IH de-
asserted(7) Hi-Z Hi-Z
Flash Reset XXX X V
IL de-
asserted(7) Hi-Z Hi-Z
Flash Deep
Power-Down VIH X X X VIH asserted(9) Hi-Z Hi-Z
PSRAM Read
Flash memory must be disabled
VIL VIL VIL VIH VIL Valid PSRAM
data out
PSRAM Writ e VIL VIL XV
IL VIL Valid PSRAM
data in
PSRAM Read
Configuration
Register VIL VIH VIL VIH VIL
00(RCR)
10(BCR)
X1(DIDR) XPSRAM
data out
PSRAM
Standby
Any Flash memory mode is allowed.
VIH VIL X X X X X X Hi-Z
PSRAM Deep
Power-
Down(10) VIH X X X X X X X Hi-Z
1. X = Don't care
2. In the PSRAM, the Clock signal, K, must remain Low in asynchronous operating mode, and to achieve standby power in
Standby and Deep Power-Down modes.
3. The PSRAM must have been configu red to operate in asynchronous mode by setting BCR15 to ‘1’ (default value).
4. The DPDF signal polarity depends on the value of the ECR14 bit.
5. WAIT signal polarity is configured using the Set Configuration Register command. See the M58PRxxxJ datasheet for
details.
6. LF can be tied to VIH if the valid address has been previously latched
7. ECR15 has to be set to ‘1’ for the Flash memory device to enter Deep Power-Down.
8. Depends on GF
9. If ECR15 is set to '0', the Flash memory device cannot enter the Deep Power-Down mode, even if DPDF is asserted.
10. Bit 4 of the Refresh Configuration Register must be set to ‘0’ and E must be maintained High, VIH, during Deep Power-
Down mode.
4 Maximum rating M36P0R9060E0
16/23
4 Maximum rating
Stressing the device above the rating listed in the Absolute Maximum Ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the Operating sect ions of
this specification is not implied. Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability. Refer also to the STMicroelectronics SURE
Program and other relevant quality documents.
Table 3. Absolute maximum ratings
Symbol Parameter Value Unit
Min Max
TAAmbient Operating Temperature –30 85 °C
TBIAS Temperature Under Bias –30 85 °C
TSTG Storage Temperature –55 125 °C
VIO Input or Output Voltage –0.2 2.45 V
VDDF Flash Memor y Supply Voltage –1.0 3.00 V
VCCP PSRAM Supply Voltage –0.2 2.45 V
VDDQ Input/Output Supply Voltage –0.2 2.45 V
VPPF Flash Memory Program Voltage –1 11.5 V
IOOutput Short Circuit Current 100 mA
tVPPH Time for VPPF at VPPH 100 hours
M36P0R9060E0 5 DC and AC parameters
17/23
5 DC and AC parameters
This section summarizes the operating measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC characteristics Tables that
f ollo w, are deriv ed fr om tests performed under the Measurement Co nditions sum marized in
Table 4., Operating and AC measurement conditions. Designers should check that the
operat ing conditions in their circuit match the operating conditions when relying on the
quoted parameters.
Figure 4. AC measurement I/O waveform
Table 4. Operating and AC measurement conditions
Parameter Flash Memory PSRAM Unit
Min Max Min Max
VDDF Supply Voltage 1.7 1.95 V
VCCPSupply Voltage ––1.71.95V
VDDQ Supply Voltage 1.7 1.95 1.7 1.95 V
VPPF Supply Voltage (Factory environment) 8.5 9.5 V
VPPF Supply Voltage (Application environment) –0.4 VDDQ +0.4 V
Ambient Operati ng Temperature –30 85 –30 85 °C
Load Capacita nce (C L)3030pF
Impedance Output (Z0)50
Output Circuit Protection Resistance (R) 50
Input Rise and Fall Times 3 2 ns
Input Pulse Voltages 0 to VDDQ 0 to VDDQ V
Input and Output Timing Ref. Voltages VDDQ/2 VDDQ/2 V
AI06161
VDDQ
0V
VDDQ/2
5 DC and AC parameters M36P0R9060E0
18/23
Figure 5. AC measurement load circuit
1. VDD means VDDF = VCCP.
Please refer to the M58PRxxxJ and M69KB096AM datasheets for further DC and AC
characteristics values and illustrations.
Tab le 5. Capacitance(1)
1. Sampled only, not 100% tested.
Symbol Parameter Test Condition Min Max Unit
CIN Input Capacitance VIN = 0V 14 pF
COUT Output Capacitance VOUT = 0V 14 pF
AI06162a
VCCQ/2
CL
R
DEVICE
UNDER
TEST Z0
OUT
M36P0R9060E0 6 Package mechanical
19/23
6 Package mechanical
In order to meet environment al requirements, ST offers these devices in ECOPACK®
pac kages. These packages have a Lead-free second level interconnect. The category of
second Level Interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97.
The maximum r atings related to soldering conditions ar e also marked on the inner bo x label.
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
Figure 6. TFBGA 107 8x11mm - 9x12 active ball array, 0.8mm pitch, pac kage outli ne
1. Drawing is not to scale.
E
D
eb
SE
A2
A1
A
BGA-Z85
ddd
FD
D1
E1
e
FE
BALL "B1"
6 Package mechanical M36P0R9060E0
20/23
Tab le 6. Stac ked TFBGA107 8x11mm - 9x 12 active ball arra y, 0.8 mm pitch, pac kage
data
Symbol millimeters inches
Typ Min Max Typ Min Max
A1.200.047
A1 0.20 0.008
A2 0.85 0.033
b 0.35 0.30 0.40 0.014 0.012 0.016
D 8.00 7.90 8.10 0.315 0.311 0.319
D1 6.40 0.252
ddd 0.10 0.004
E 11.00 10.90 11.10 0.433 0.429 0.437
E1 8.80 0.346
e0.80 0.031
FD 0.80 0.031
FE 1.10 0.043
SE 0.40 0.016
M36P0R9060E0 7 Part numbering
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7 Part numbering
Note: De vices are shipped f rom the factory with the memory content bits erased to ’1’. For a list of
available options (Speed, Package, etc.) or for further information on any aspect of this
device, please contact the STMicroelectronics Sales Offi ce nearest to you.
Table 7. Ordering information scheme
Example: M36 P 0 R 9 0 6 0 E 0 ZAC E
Device Type
M36 = Multi-Chip Package (Flash + PSRAM)
Flash 1 Architecture
P = Multi-Level, Multiple Bank, Large Buffer
Flash 2 Architecture
0 = No Die
Operating Voltage
R = VDDF = VCCP = VDDQ = 1.7 to 1.95V
Flash 1 Density
9 = 512 Mbits
Flash 2 Density
0 = No Die
RAM 1 Density
6 = 64 Mbits
RAM 2 Density
0 = No Die
Parameter Blocks Location
E = Even Block Flash Memory Configuration
Pro duct Version
0 = 90nm Flash technology, 96ns speed; 0.11µm PSRAM technology, 70ns speed
Package
ZAC = stac ked TFBGA107 C stacked footprint.
Option
E = ECOPACK Package, Standard packing
F = ECOPACK Package, Tape & Reel packing
8 Revision hist ory M36P0R9060 E 0
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8 Revision history
Tab le 8. Document revision history
Date Revision Changes
28-Nov-2005 1 Initial release.
20-Jul-2006 2
Document status promoted to full Datasheet.
PSRAM part changed. Flash memory component specifications
updated to latest version of M58PRxxxJ datasheet (VPP changed in
Table 3). H9 ball changed to DU in Figure 2: TFBGA connections
(top view through package).
M36P0R9060E0
23/23
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