
2
RF Device Data
Freescale Semiconductor, Inc.
MMRF1305HR5 MMRF1305HSR5
Table 2. Thermal Characteristics
Characteristic Symbol Value (1) Unit
Thermal Resistance, Junction to Case
CW: Case Temperature 81C, 100 W CW, 50 Vdc, IDQ(A+B) = 100 mA, 512 MHz
RJC 0.38 C/W
Thermal Impedance, Junction to Case
Pulse: Case Temperature 73C, 100 W Peak, 100 sec Pulse Width,
20% Duty Cycle, 50 Vdc, IDQ(A+B) = 100 mA, 512 MHz
ZJC 0.12 C/W
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22--A114) 2, passes 2500 V
Machine Model (per EIA/JESD22--A115) B, passes 250 V
Charge Device Model (per JESD22--C101) IV, passes 2000 V
Table 4. Electrical Characteristics (TA=25C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics (2)
Gate--Source Leakage Current
(VGS =5Vdc,V
DS =0Vdc)
IGSS — — 400 nAdc
Drain--Source Breakdown Voltage
(VGS =0Vdc,I
D=50mA)
V(BR)DSS 133 141 —Vdc
Zero Gate Voltage Drain Leakage Current
(VDS =50Vdc,V
GS =0Vdc)
IDSS — — 3 Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS =0Vdc)
IDSS — — 10 Adc
On Characteristics
Gate Threshold Voltage (2)
(VDS =10Vdc,I
D= 170 Adc)
VGS(th) 1.6 2.1 2.6 Vdc
Gate Quiescent Voltage
(VDD =50Vdc,I
D= 100 mAdc, Measured in Functional Test)
VGS(Q) 2.1 2.6 3.1 Vdc
Drain--Source On--Voltage (2)
(VGS =10Vdc,I
D=1Adc)
VDS(on) —0.23 —Vdc
Dynamic Characteristics (2)
Reverse Transfer Capacitance
(VDS =50Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Crss —0.24 —pF
Output Capacitance
(VDS =50Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Coss —23.9 —pF
Input Capacitance
(VDS =50Vdc,V
GS =0Vdc30 mV(rms)ac @ 1 MHz)
Ciss —73.6 —pF
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD =50Vdc,I
DQ(A+B) = 100 mA, Pout = 100 W Peak (20 W Avg.), f = 512 MHz,
200 sec Pulse Width, 20% Duty Cycle
Power Gain Gps 25.0 26.0 27.0 dB
Drain Efficiency D68.0 70.0 — %
Input Return Loss IRL — -- 1 4 -- 9 dB
Load Mismatch/Ruggedness (In Freescale Test Fixture, 50 ohm system, IDQ(A+B) = 100 mA)
Frequency
(MHz)
Signal
Type VSWR
Pout
(W) Test Voltage, VDD Result
512 Pulse
(100 sec, 20% Duty Cycle)
>65:1
at all Phase Angles
130 Peak
(3 dB Overdrive)
50 No Device Degradation
CW 126
(3 dB Overdrive)
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select
Documentation/Application Notes -- AN1955.
2. Each side of device measured separately.